Electron Microscopy 1990
Subtitle: proceedings of the XIIth International Congress for Electron Microscopy : held in Seattle 12-18 August 1990 : 48th Annual Meeting of the Electron Microscopy Society of America and 25th Annual Meeting of the Microbeam Analysis Society
By: editors L.D. Peachey, D.B. Williams. Vol.4, Material sciences.
Contributors: Peachey, L. D.; Williams, David B., 1949-; Electron Microscopy Society of America. Annual Meeting,; Microbeam Analysis Society of America. Annual Meeting,
Publisher: San Francisco Press
Published: 1990
Place of publication: San Francisco, Calif
Language: eng
Number of pages: 1130