Randomness testing of the advanced encryption standard finalist candidates
By: Juan Soto, Lawrence Bassham
Contributors: Bassham, Lawrence E; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6483
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 2000
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 14
Subjects: Data encryption (Computer science)
Notes: Shipping list no.: 2000-0794-M

"April 2000."

Includes bibliographical references (p. 10)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [2000] 1 microfiche : negative