Optical system alignment, tolerancing, and verification IV
Subtitle: 1-2 August 2010, San Diego, California, United States
By: José Sasián, Richard N. Youngworth, editors ; sponsored ... by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 7793; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7793.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819482891
Subjects: Tolerance (Engineering); Optical tooling; Congresses; Optical instruments; Design and construction
Notes: Includes bibliographical references.