Rough Surface Scattering and Contamination
Subtitle: 21-23 July 1999, Denver, Colorado (Proceedings of Spie--the International Society for Optical Engineering, V. 3784.)
Contributors: Philip T. Chen (Editor); Zu-Han Gu (Editor); Alexei A. Maradudin (Editor)
Publisher: Society of Photo Optical; SPIE
Published: October 1999
Language: eng
Format: Paperback
Number of pages: 404
ISBN-13: 9780819432704
Subjects: Applied optics; Optics; Technology; Congresses; Measurement; Scattering (Physics); Surface contamination; Surface roughness; Science/Mathematics