Scanning tunneling spectroscopy
By: edited by Wolf-Dieter Schneider
Series: Journal of electron spectroscopy and related phenomena -- v. 109, nos. 1/2
Publisher: Elsevier
Published: 2000
Place of publication: Amsterdam, The Netherlands
Language: eng
Number of pages: 222
Subjects: Scanning tunneling microscopy; Scanning probe microscopy; Tunneling spectroscopy
Notes: "Special issue."

Includes bibliographical references.