Testing Static Random Access Memories
Subtitle: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing)
Edition: 1 edition
Publisher: Springer
Published: March 31, 2004
Language: eng
Format: Hardcover
Number of pages: 240
ISBN-13: 9781402077524
Subjects: Semi-conductors & super-conductors; Technology & Industrial Arts; Random access memory; Technology; Science/Mathematics; Testing; Electronics - Semiconductors; Engineering - Electrical & Electronic; Technology / Electronics / Circuits / General; Electronics - General
First sentence: Ultra large scale integrated (ULSI) circuits are an integral part of any modern electronic system.