Suppression of premature dielectric breakdown for high-voltage capacitance measurements
By: Alvin M. Goodman ; jointly supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards.
Series: Semiconductor measurement technology; NBS special publication ; 400-37; NBS special publication ;; 400-37.
Publisher: The Bureau : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1977
Place of publication: Washington
Language: eng
Number of pages: 21
Subjects: Capacitors -- Testing.; Metal insulator semiconductors -- Testing.; Breakdown (Electricity); High voltages.
Notes: Includes bibliographical references.