Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF'99)
Contributors: N. Labat (Editor); A. Touboul (Editor)
Edition: CD-Rom edition
Publisher: Pergamon Pr
Published: October 1, 1999
Language: eng
Format: CD-ROM
ISBN-13: 9780080434209
Subjects: Electronics engineering; Science/Mathematics