Metrology for information technology (IT)
By: MEL/ITL Task Group on Metrology for Information Technology (IT)
Contributors: National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6025
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1997
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 28
Subjects: Information technology -- Measurement; Information technology -- Standards; Information technology -- Testing
Notes: Distributed to depository libraries in microfiche

Shipping list no.: 98-0195-M

"May 1997."

Includes bibliographical references (p. 22-24)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 1997 1 microfiche : negative

s 1997 dcu n b