2000 IEEE International Integrated Reliability Workshop Final Report
Subtitle: Stanford Sierra Camp Lake Tahoe, California October 23-26, 2000
Publisher: Institute of Electrical & Electronics Enginee
Published: January 2001
Language: eng
Format: Paperback
Number of pages: 199
ISBN-13: 9780780363922
Subjects: Electronic devices & materials; Reliability Engineering; Technology; Technology & Industrial Arts; Science/Mathematics; Electronics - Circuits - General; Quality Control; Congresses; Integrated circuits; Reliability; Wafer-scale integration