IWSM
Subtitle: 1999 4th International Workshop on Statistical Metrology : June 12, 1999, Kyoto
By: technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI Symposium, the Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, nformation and Communication Engineers.
Contributors: IEEE Electron Devices Society.
Publisher: IEEE
Published: 1999
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 65
Subjects: Semiconductors -- Characterization -- Statistical methods -- Congresses.; Semiconductors -- Measurement -- Congresses.
Genres: Congresses.
Other titles: 1999 4th International Workshop on Statistical Metrology; 4th International Workshop on Statistical Metrology; Statistical metrology
Notes: "IEEE Catalog Number 99TH8391"--T.p. verso.

Includes bibliographical references.