Impact of Electron and Scanning Probe Microscopy on Materials Research (NATO Science Series E:)
Contributors: David G. Rickerby (Editor); Giovanni Valdrè (Editor); Ugo Valdrè (Editor)
Edition: 1 edition
Publisher: Springer
Published: October 31, 1999
Language: eng
Format: Hardcover
Number of pages: 516
ISBN-13: 9780792359395
Subjects: Non-destructive testing; Science; Materials; Technology & Industrial Arts; Electron Microscopy; Scanning probe microscopy; Science/Mathematics; Physics; Microscopes & Microscopy; Chemistry - Inorganic; Engineering - Electrical & Electronic; Material Science; Technology / Material Science; Microscopy
First sentence: We live, work and play in a world of materials.