Selected reprints on logic design for testability
By: compiled by Constantin C. Timoc.
Contributors: Timoc, Constantin C.
Publisher: IEEE Computer Society Press; Order from IEEE Computer Society
Published: 1984
Place of publication: Silver Spring, MD; Los Angeles, CA
Language: eng
Number of pages: 315
Subjects: Logic circuits -- Testing.
Notes: Includes bibliographies.
"IEEE catalog number EH0215-4."
"IEEE Computer Society order number 573."