Yield simulation for integrated circuits
By: by Duncan Moore Henry Walker.
Series: The Kluwer international series in engineering and computer science ;; SECS 33.; VLSI, computer architecture, and digital signal processing; Kluwer international series in engineering and computer science ;; SECS 33.; Kluwer international series in engineering and computer science.
Publisher: Kluwer Academic Publishers
Published: 1987
Place of publication: Boston
Language: eng
Number of pages: 209
Subjects: Integrated circuits -- Very large scale integration -- Design and construction -- Mathematical models.; Integrated circuits -- Very large scale integration -- Design and construction -- Data processing.; Integrated circuits -- Very large scale integration -- Defects -- Mathematical models.; Integrated circuits -- Very large scale integration -- Defects -- Data processing.; Monte Carlo method.
Notes: Bibliography: p. [189]-206.
Based on author's thesis (Ph. D.).
Includes index.