Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing
Subtitle: August 7-8, 2000, San Jose, California
By: edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
Contributors: Rajsuman, Rochit.; Wik, T.; IEEE Computer Society.; IEEE Computer Society. Technical Committee on VLSI.; IEEE Computer Society. Technical Council on Test Technology.; IEEE Solid-State Circuits Society.
Publisher: IEEE Computer Society
Published: 2000
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 131
Subjects: Semiconductor storage devices -- Testing -- Congresses.; Random access memory -- Congresses.
Genres: Congresses.
Other titles: Records of the IEEE International Workshop on Memory Technology, Design and Testing 2000; Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.
Notes: Includes bibliographical references and author index.
"IEEE Computer Society Order Number PR00689"--T.p. verso.
"This is the 8th year of this exciting event"--P. viii.
Also available via the World Wide Web with additional title: Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.