Quantitative x-ray spectrometry
By: Ron Jenkins, R.W. Gould, Dale Gedcke.
Contributors: Gould, Robert William.; Gedcke, Dale, 1939-
Edition: 2nd ed.
Series: Practical spectroscopy ;; v. 20
Publisher: M. Dekker
Published: 1995
Place of publication: New York
Language: eng
Number of pages: 484
Subjects: X-ray spectroscopy.
Description: This thoroughly revised and updated Second Edition of an incomparable hands-on reference covers every important aspect of x-ray spectrometry - from basic principles to the selection of instrument parameters and sample preparation.

With over 1100 equations, figures, tables and bibliographic citations, Quantitative X-ray Spectrometry, Second Edition is an invaluable resource for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists, and graduate-level and continuing-education students in these disciplines.
Notes: Includes bibliographical references and index.