Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Contributors: John Thong (Editor); M. K. Radhakrishnan (Editor)
Publisher: IEEE Standards Office
Published: December 1999
Language: eng
Format: Paperback
Number of pages: 209
ISBN-13: 9780780351875
Subjects: Circuits & components; Electronic devices & materials; Electronics - Circuits - General; Electronics - Circuits - Integrated; Quality Control; Integrated Circuits; Reliability Engineering; Technology; Technology & Industrial Arts; Science/Mathematics