EOS/ESD technology abstracts, summer 1982
By: prepared by William K. Denson, John P. Farrell.
Contributors: Farrell, John P. 1960-
Series: Technical reliability studies ;; TRS-3A; Technical reliability study ;; TRS-3A.
Publisher: Reliability Analysis Center
Published: 1982
Place of publication: Griffiss AFB, NY
Language: eng
Number of pages: 287
Subjects: Electronic apparatus and appliances -- Reliability -- Abstracts.; Electric discharges -- Abstracts.
Other titles: E.O.S./E.S.D. technology abstracts, summer 1982.
Notes: Includes indexes.