Accuracy in trace analysis
Subtitle: sampling, sample handling, analysis
By: Philip D. LaFleur, editor
Contributors: LaFleur, Philip D.; United States. National Bureau of Standards.
Series: NBS special publication ; 422; NBS special publication -- 422.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards, : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1975
Place of publication: Washington
Language: eng
Number of pages: 1304
Subjects: Trace elements -- Analysis -- Congresses.
Genres: Congresses.
Notes: CODEN: XNBSAV

Includes bibliographies