Psychometrics for educational debates
By: edited by Leo J. Th. van der Kamp, Willem F. Langerak, and Dato N. M. de Gruijter.
Contributors: Kamp, Leo J. Th. van der.; Langerak, Willem F.; Gruijter, Dato N. de.
Publisher: Wiley
Published: 1980
Place of publication: Chichester; New York
Language: eng
Number of pages: 337
Subjects: Educational tests and measurements -- Congresses.
Notes: Includes bibliographies and indexes.
"Proceedings of the Third International Symposium on Educational Testing, held in Leyden, The Netherlands, June 27-30, 1977."