Proceedings
By: ATE East, Automated Testing for Electronics Manufacturing Conference, June 13-16, 1983, John B. Hynes Veterans' Auditorium & Boston-Sheraton Hotel, Boston, MA ; sponsored by Electronics test.
Publisher: Morgan-Grampian Pub. Co.
Published: 1983
Place of publication: New York, NY (2 Park Ave., New York 10016)
Language: eng
Number of pages: 235
Subjects: Automatic test equipment -- Congresses.
Genres: Congresses.
Other titles: Electronics test.
Notes: Includes bibliographical references.