Biotic Stress and Yield Loss
Contributors: Robert K.D. Peterson (Editor); Leon G. Higley (Editor)
Publisher: CRC
Published: December 28, 2000
Language: eng
Format: Hardcover
Number of pages: 261
ISBN-13: 9780849311451
Subjects: Insects (entomology); Technology & Industrial Arts; Ecology; Pest Control In Field Crops; Technology; Science/Mathematics; Life Sciences - Zoology - Entomology; Agriculture - Agronomy; Science / Entomology; Agriculture - General; Agricultural pests; Crop losses; Crops
First sentence: The observation that insects, weeds, and plant pathogens reduce crop yield undoubtedly predates recorded history.