Optical fabrication, testing, and metrology III
Subtitle: 2-4 September 2008, Glasgow, United Kingdom
By: Angela Duparré, Roland Geyl, editors ; sponsored by SPIE Europe ; cosponsored by Scottish Optoelectronic Association (United Kingdom) ; cooperating organisations, EFDS--Europäische Forschungsgesellschaft Dünne Schichten e.V. (Germany), [and three others]
Contributors: SPIE Europe; Scottish Optoelectronics Association; Europäische Forschungsgesellschaft Dünne Schichten
Series: Proceedings of SPIE -- volume 7102
Publisher: SPIE
Published: 2008
Place of publication: Bellingham, Washington
Language: eng
ISBN-13: 9780819473325
Subjects: Optical instruments; Congresses; Design and construction; Testing; Optical materials; Metrology
Notes: Includes bibliographical references and author index.