Recent developments in thin film research
Subtitle: epitaxial growth and nanostructures, electron microscopy, and x-ray diffraction : proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997
By: [G. Ritter ... et al., editors].
Contributors: Ritter, G.; Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures (1997 : Strasbourg, France)
Series: European Materials Research Society symposia proceedings ;; v. 69
Publisher: Elsevier
Published: 1997
Place of publication: Amsterdam; New York
Language: eng
Number of pages: 279
Subjects: Thin films -- Congresses.; Epitaxy -- Congresses.; Nanostructured materials -- Congresses.; Electron microscopy -- Congresses.; X-rays -- Diffraction -- Congresses.
Genres: Congresses.
Other titles: Epitaxial thin film growth and nanostructures; Recent developments in electron microscopy and X-ray diffraction of thin film structures
Notes: Includes bibliographical references and indexes.
"Reprinted from Thin solid films, vol. 318 (1-2) and Thin solid films, vol. 319 (1-2)"--T.p. verso.