Surveillance and assessment technologies for law enforcement
Subtitle: 19-20 November 1996, Boston, Massachusetts
By: A. Trent DePersia, Suzan Yeager, Steve Ortiz, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.].
Contributors: DePersia, A. Trent.; Yeager, Suzan.; Ortiz, Steve.; National Institute of Standards and Technology (U.S.); National Institute of Justice (U.S.); Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2935; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2935.
Publisher: SPIE
Published: 1997
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 190
Subjects: Law enforcement -- Optical equipment -- Congresses.; Law enforcement -- Technological innovations -- Congresses.; Electronics in criminal investigation -- Congresses.; Identification -- Congresses.; Electronic surveillance -- Congresses.
Notes: Includes bibliographic references and author index.