Dielectric measurements using a reentrant cavity
Subtitle: mode-matching analysis
By: James Baker-Jarvis, Bill F. Riddle
Contributors: Riddle, Bill F; National Institute of Standards and Technology (U.S.)
Series: NIST technical note -- 1384
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1996
Place of publication: Boulder, Colo
Language: eng
Format: Microform
Number of pages: 13
Subjects: Dielectric measurements
Notes: Shipping list no.: 98-0938-M

Paper version no longer available for sale by the Supt. of Docs

"November 1996."

Includes bibliographical references (p. 12-13)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative