A bibliography on methods for the measurement of inhomogeneities in semiconductors, 1953-1967
By: [by] Harry A. Schafft and Susan Gayle Needham.
Contributors: Needham, Susan Gayle, joint author.
Series: NBS technical note 445; NBS technical note ;; 445.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; for sale by the Supt. of Docs., Govt. Print. Off., Washington
Published: 1968
Place of publication: [Gaithersburg, Md.]
Language: eng
Number of pages: 45
Subjects: Semiconductors -- Bibliography.
Notes: "Supported by the Rome Air Development Center, U.S. Air Force, under contract no. F30602-67-C-0105."