Proceedings of the 1990 International Conference on Microelectronic Test Structures, March 5-7, 1990, San Diego, California
By: sponsored by the IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1990
Place of publication: [New York, N.Y.]
Language: eng
Number of pages: 224
Subjects: Electronic apparatus and appliances -- Congresses; Miniature electronic equipment -- Testing -- Congresses; Reliability (Engineering) -- Congresses
Other titles: ICMTS 1990; 1990 IEEE Int'l Conf. on Microelectronic Test Structures; 1990 IEEE International Conference on Microelectronic Test Structures.
Notes: At head of title: ICMTS 1990.

"90CH2797-9."

On cover and spine: 1990 IEEE Int'l Conf. on Microelectronic Test Structures.

Includes bibliographical references and index.