VLSI system test
Subtitle: cost versus quality
By: 1990 IEEE VLSI Test Symposium, April 10-11, 1990, Bally's Park Place Casino Hotel, Atlantic City, NJ.
Contributors: Institute of Electrical and Electronics Engineers. Philadelphia Section.; IEEE Computer Society. Test Technology Committee.
Publisher: IEEE Philadelphia Section; IEEE Computer Society, Test Technology Committee
Published: 1990
Place of publication: [United States]
Language: eng
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references.