A measurement method for determining the optical and electro-optical properties of a thin film
By: by Donald R. Larson.
Contributors: United States. National Bureau of Standards.
Series: NBSIR -- 81-1652.; NBSIR -- 1652.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards
Published: 1982
Place of publication: Boulder, Colo
Language: eng
Format: Microform
Number of pages: 60
Subjects: Thin films -- Electric properties -- Measurement.; Thin films -- Optical properties -- Measurement.
Notes: "December 1981."

Includes bibliographical references.

Microfiche. [Washington, D.C.] : U.S. G.P.O., [1982]. 1 microfiche.

UPDATED ON OCLC.