VLSI Design and Test
Subtitle: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Publisher: Springer
Published: Jan 26, 2018
Format: paperback
Number of pages: 815
ISBN-13: 9789811074691
Notes: Source title: VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science)