1997 GaAs Reliability Workshop
Subtitle: proceedings : October 12, 1997, Anaheim, California
By: sponsorred by, JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.
Contributors: IEEE Electron Devices Society.; Joint Electron Device Engineering Council. JC-14.7 Committee on GaAs Reliability and Quality Standards.
Publisher: IEEE
Published: 1997
Place of publication: [Piscataway, New Jersey
Language: eng
Number of pages: 116
Subjects: Gallium arsenide semiconductors -- Congresses.; Semiconductors -- Reliability -- Congresses.
Notes: IEEE Catalog Number: 97TH8340

Includes bibliographical references.