Thin Film Analysis by X-Ray Scattering
Publisher: Wiley-VCH
Published: February 6, 2006
Language: eng
Format: Hardcover
Number of pages: 378
ISBN-13: 9783527310524
Subjects: States of matter; Technology & Industrial Arts; Technology; Science/Mathematics; Material Science; Technology / Material Science; Thin films; X-ray spectroscopy
First sentence: Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation.