Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films
By: A. W. Czanderna, SERI, H. Helbig, Clarkson College of Technology, E. T. Prince, Clarkson College of Technology.
Contributors: Helbig, H.; Prince, Eric T.; United States. Dept. of Energy. Division of Solar Energy.; Solar Energy Research Institute.; Clarkson College of Technology.
Series: SERI/TP ; 31-064; SERI/TP -- 31-064.
Publisher: Dept. of Energy, Divison of Solar Technology
Published: 1978
Place of publication: [Washington]
Language: eng
Number of pages: 14
Subjects: Thin films -- Optical properties -- Measurement.; Specular reflectance -- Measurement.; Mass (Physics) -- Measurement.
Notes: Contract EG-77-C-01-4042.

Issued Nov. 1978.

Includes bibliographical references.