Defect recognition in semiconductors before and after processing
Subtitle: proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991
By: edited by M.R. Brozel, D.J. Stirland.
Contributors: Brozel, M. R.; Stirland, D. J.
Publisher: Adam Hilger
Published: 1992
Place of publication: Bristol, England; Philadelphia
Language: eng
Number of pages: 310
Subjects: Semiconductors -- Defects -- Congresses.; Photoluminescence -- Congresses.; Gallium arsenide semiconductors -- Congresses.
Notes: Includes bibliographical references.