In the matter of certain probe card assemblies, components thereof and certain tested DRAM an NAND flash memory devices and products containing same
Subtitle: investigation no. 337-TA-621
Series: Publication -- 4149; USITC publication -- 4149.
Publisher: U.S. International Trade Commission
Published: 2010
Place of publication: Washington, DC
Language: eng
Format: [electronic resource] :
Number of pages: 243
Subjects: Semiconductor storage devices; Flash memories (Computers); Computer storage devices; Patent infringement
Other titles: Probe card assemblies, components thereof and certain tested DRAM an NAND flash memory devices and products containing same
Notes: Title from title screen (viewed on Nov. 17, 2011).

"June 2010."

Includes bibliographical references.