Polarization analysis and applications to device technology
Subtitle: International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan
By: Toru Yoshizawa, Hideshi Yokota, editors ; sponsored by SPIE Japan Chapter ... [et al.] ; published by SPIE--The International Society  for Optical Engineering.
Contributors: Yoshizawa, Tōru, 1939-; Yokota, Hideshi, 1936-; Society of Photo-optical Instrumentation Engineers. Japan Chapter.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2873; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2873.
Publisher: SPIE
Published: 1996
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 350
Subjects: Electrooptical devices -- Congresses.; Polarizers (Light) -- Congresses.; Optoelectronic devices -- Congresses.; Polarimetry -- Congresses.; Electrooptics -- Congresses.; Refraction, Double -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.