Modelling of leakage currents induced by extended defects in extra-functionality devices
By: Artur Scheinemann
Edition: First edition.
Series: Series in microelectronics -- volume 224
Publisher: Hartung-Gorre Verlag
Published: 2014
Place of publication: Konstanz
Language: eng
Number of pages: 123
ISBN-13: 9783866285040
Subjects: Semiconductors; Defects; Analysis; Deep level transient spectroscopy
Notes: "Reprint of Diss. ETH No. 21739"--Title page verso.

Includes bibliographical references (pages 113-121).

Text in English, with an abstract also in German.