Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1990
Subtitle: Lake Buena Vista, Florida, September 11-13, 1990
By: sponsored by the EOS/ESD Association in cooperation with IEEE.
Contributors: IIT Research Institute.; Reliability Analysis Center (U.S.)
Publisher: EOS/ESD Association
Published: 1990
Place of publication: Rome, NY
Language: eng
Number of pages: 297
Subjects: Electronic apparatus and appliances -- Protection -- Congresses; Electric discharges -- Congresses; Electrostatics -- Congresses
Other titles: EOS/ESD Symposium proceedings
Notes: "EOS-12."

On spine: EOS/ESD Symposium proceedings.

Includes bibliographical references.