Reliability, Packaging, Testing and Characterization of Mems / Moems 5 (Proceedings of Spie)
Contributors: Danelle M. Tanner (Editor); Rajeshuni Ramesham (Editor)
Publisher: SPIE-International Society for Optical Engine
Published: January 21, 2006
Language: eng
Format: Hardcover
Number of pages: 1
ISBN-13: 9780819461537
Subjects: Electronics engineering; Technology; Technology & Industrial Arts; Science/Mathematics; Electronics - General; Electronics - Semiconductors; Nanotechnology