Semiconductor material and device characterization
By: by Dieter K. Schroder.
Publisher: John Wiley
Published: 2005
Place of publication: Hoboken, N.J
Language: eng
ISBN-13: 9780471739067
Subjects: Semiconductors.; Semiconductors -- Testing.
Notes: Includes bibliographical references and index.
"A Wiley-Interscience Publication."