Sensors, cameras, and systems for industrial/scientific applications XI
Subtitle: 19-21 January 2010, San Jose, California, United States
By: Erik Bodegom, Valérie Nguyen, editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology, [and] SPIE
Contributors: IS & T--the Society for Imaging Science and Technology; SPIE (Society); Electronic Imaging Science and Technology Symposium (2010 : San Jose, Calif.)
Series: Proceedings IS&T/SPIE Electronic Imaging Science and Technology -- v. 7536; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7536.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819479297
Subjects: Complementary Metal oxide semiconductors; Charge coupled devices; Congresses; Scientific applications; Detectors; Industrial applications
Notes: Includes bibliographical references and author index.