X-ray optics and microanalysis
Subtitle: proceedings of the 20th international congress, Karlsruhe, Germany, 15-18 September 2009
By: editors, Melissa A. Denecke, Clive T. Walker ; sponsoring organizations, Research Center Karlsruhe (FZK)-Program NUCLEAR ... [et al.].
Contributors: Denecke, Melissa A.; Walker, Clive T.
Series: AIP conference proceedings -- 1221; AIP conference proceedings -- no. 1221.
Publisher: American Institute of Physics
Published: 2010
Place of publication: Melville, N.Y
Language: eng
Number of pages: 214
ISBN-13: 9780735407640
Subjects: Materials; Congresses; X-ray microanalysis; X-ray microscopes; Microscopy; X-ray optics
Other titles: 20th International Congress on X-ray Optics and Microanalysis; ICXOM20
Notes: "All papers have been peer reviewed."

"This book contains peer-reviewed proceeding contributions to the 20th International Congress on X-ray Optics and Microanalysis, ICXOM20, held in Karlsruhe, Germany, from the 15th to the 18th of September 2009"--P. ix.

Includes bibliographical references and index.
Table of contents: title: Advances in instrumentation, detection, and methodology; title: X-ray optics monochromators and multilayers, focusing optics; title: Quantitative and multivariate analysis; title: Imaging techniques and image processing; title: Applications of nano-, micro-, and surface analysis techniques.