IWSM
Subtitle: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
By: [sponsored by] IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: IEEE; Widerkehr and Associates
Published: 1998
Place of publication: Piscataway, New Jersey; Gaithersburg, Maryland
Language: eng
Number of pages: 121
Subjects: Semiconductors -- Characterization -- Statistical methods -- Congresses.; Semiconductors -- Measurement -- Congresses.
Genres: Congresses.
Other titles: Workshop on statistical metrology; Statistical metrology
Notes: Includes bibliographical references.
"IEEE Catalog Number 98EX113"--verso of T.p.