Microelectronic failure analysis
Subtitle: desk reference : 2002 supplement
By: Prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee
Publisher: ASM International
Published: 2002
Place of publication: Materials Park, OH
Language: eng
Number of pages: 210
Subjects: Electronics; Materials; Testing; Handbooks, manuals; Microelectronics; Defects; Electronic apparatus and appliances; Semiconductors
Notes: Includes bibliographical references and indexes.