X-ray microscopy 2002
Subtitle: 7th International Conference on X-Ray Microscopy, ESRF, Grenoble, France, July 28-August 2, 2002
By: edited by J. Susini, D. Joyeux, F. Polack.
Contributors: Susini, J.; Joyeux, D.; Polack, F.
Series: Journal de physique.; v. 104
Publisher: EDP Sciences
Published: 2003
Place of publication: Les Ulis, France
Language: eng
Number of pages: 667
Subjects: X-ray microscopy -- Congresses.
Genres: Congresses.
Other titles: 7th International Conference on X-Ray Microscopy
Notes: Includes bibliographical references and indexes.