Application of a new goodness-of-fit plot procedure to SAT and TOEFL item type data 1,2,3
By: Daniel R. Eignor, Marna Golub-Smith, Marilyn S. Wingersky
Contributors: Golub-Smith, Marna; Wingersky, Marilyn S.
Series: ETS research report -- 86-47; Research report (Educational Testing Service) -- RR-86-47
Publisher: Educational Testing Service
Published: 1986
Place of publication: Princeton, N.J
Language: eng
Number of pages: 28
Subjects: SAT (Educational test); Test of English as a Foreign Language
Notes: Includes bibliographical references (p. 27-28).