Critical review and technology assessments '91-'92.
Contributors: Reliability Analysis Center (U.S.)
Publisher: Reliability Analysis Center
Published: 1992
Place of publication: Rome, NY (P.O. Box 4700, Rome 13440-8200)
Language: eng
Subjects: Microelectronics -- Reliability.; Gallium arsenide semiconductors -- Reliability.; Microelectronic packaging -- Reliability.; Multichip modules (Microelectronics) -- Testing.
Notes: Includes bibliographical references.
Table of contents: title: Contents: Assessment of gallium arsenide device quality and reliability; title: Plastic microcircuit packages; title: Qualified manufacturer's list; title: Reliability and maintainability software tools, 1991; title: Testability design and assessment tools.