A comparison of radiation damage in linear ICs from Cobalt-60 gamma rays and 2.2-MeV electrons
By: Michael K. Gauthier, Donald K. Nichols.
Contributors: Nichols, Donald K.; Jet Propulsion Laboratory (U.S.)
Series: JPL publication -- 83-78.; NASA CR -- 173474.; NASA contractor report -- NASA CR-173474.
Publisher: National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology
Published: 1983
Place of publication: Pasadena, Calif
Language: eng
Format: Microform
Subjects: Integrated circuits -- Effect of radiation on.; Amplifiers.; Cobalt 60.; Compton effect.; Data processing.; Gamma rays.; Radiation damage.
Notes: Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1984. 1 microfiche.