Advances in Imaging and Electron Physics, Volume 109 (Advances in Imaging and Electron Physics)
Contributors: Peter W. Hawkes (Editor); Benjamin Kazan (Series Editor); Tom Mulvey (Series Editor)
Publisher: Academic Press
Published: September 17, 1999
Language: eng
Format: Hardcover
Number of pages: 453
ISBN-13: 9780120147519
Subjects: Applied optics; Microscopy; Electronic Engineering (General); Technology; Technology & Industrial Arts; Science/Mathematics; Electromagnetism; Engineering - Electrical & Electronic; Optics; Technology / Engineering / Electrical; Imaging Systems
First sentence: The rapid advances in semiconductor technology during the last few decades are closely related to the success in achieving significant increase in semi-conductor material purity (Sze, 1983).