Noise in devices and circuits
Subtitle: 2-4 June, 2003, Santa Fe, New Mexico, USA
By: M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation ; published by SPIE--the International Society for Optical Engineering.
Contributors: Deen, M. Jamal.; Çelik-Butler, Zeynep.; Levinshtein, Michael E.; Society of Photo-optical Instrumentation Engineers.; National Semiconductor Corporation.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 5113; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5113.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 516
Subjects: Electronic circuits -- Noise -- Congresses.; Electronic noise -- Congresses.; Electric circuits -- Noise -- Congresses.; Electric noise -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and author index.