The development of intelligence in children
By: by Alfred Binet and Theodore Simon ; with marginal notes by Lewis M. Terman ; new preface ... by Lloyd M. Dunn
Contributors: Simon, Théodore, 1873-; Terman, Lewis M. (Lewis Madison), 1877-1956
Edition: Limited ed.
Publisher: Williams Printing Co.
Published: 1980
Place of publication: Nashville, Tenn
Language: eng
Number of pages: 336
Subjects: Binet-Simon Test; Intelligence tests; Children with mental disabilities; Psychological testing
Notes: Reprint. Originally published: Baltimore : Williams & Wilkins, 1916. (Publications of the Training School at Vineland, New Jersey, Dept. of Research ; no. 11)

Limited to 3000 numbered copies.

"Bibliography on Binet-Simon tests": p. [337].

Includes bibliographical references and index.