Nonlinear image processing and pattern analysis XII
Subtitle: 22-23 January 2001, San Jose, [California] USA
By: Edward R. Dougherty, Jaakko T. Astola, chairs/editors ; sponsored by IS&T--The Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering.
Contributors: Dougherty, Edward R.; Astola, Jaakko.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 4304; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4304.
Publisher: SPIE
Published: 2001
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 328
Subjects: Image processing -- Digital techniques -- Congresses.; Digital filters (Mathematics) -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and author index.