Built-in-Self-Test and Digital Self-Calibration for RF SoCs
By: by Sleiman Bou-Sleiman, Mohammed Ismail
Contributors: Ismail, Mohammed; SpringerLink (Online service)
Series: SpringerBriefs in Electrical and Computer Engineering
Publisher: Springer Science+Business Media, LLC
Published: 2012
Place of publication: New York, NY
Language: eng
Format: [electronic resource] /
ISBN-13: 9781441995476; 9781441995483
Subjects: Systems engineering; Engineering