Automated optical inspection for industry
Subtitle: 6-7 November 1996, Beijing, China
By: Frederick Y. Wu, Shenghua Ye, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.].
Contributors: Wu, Frederick Y.; Ye, Shenghua, 1934-; Society of Photo-optical Instrumentation Engineers.; Zhongguo guang xue xue hui.; Guo jia zi ran ke xue ji jin wei yuan hui (China)
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2899; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2899.
Publisher: SPIE
Published: 1996
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 716
Subjects: Engineering inspection -- Automation -- Congresses.; Quality control -- Optical methods -- Automation -- Congresses.; Optical detectors -- Industrial applications -- Congresses.; Optical measurements -- Congresses.
Notes: Includes bibliographical references and index.