Ellipsometry in the measurement of surfaces and thin films
Subtitle: symposium proceedings.
Contributors: Passaglia, Elio, ed.; Stromberg, Robert R., ed.; Kruger, Jerome, ed.
Publisher: U.S. National Bureau of Standards
Published: 1964
Place of publication: Washington
Language: eng
Number of pages: 359
Subjects: Polarization (Light); Surfaces (Technology); Thin films.
Notes: Includes bibliographies.
Edited by E. Passaglia, R.R. Strombery, and J. Kruger.