25th anniversary compendium of papers from International Test Conference
By: edited by Paul H. Bardell ... [et al.].
Contributors: Institute of Electrical and Electronics Engineers.; IEEE Computer Society.; IEEE Computer Society. Philadelphia Chapter.
Publisher: IEEE Computer Society Press
Published: 1994
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 794
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.
Other titles: Compendium of papers from International Test Conference.; Twenty-fifth anniversary compendium of papers from International Test Conference.
Notes: Includes bibliographical references and index.
Spine title: Compendium of papers from International Test Conference.
At head of title: 1970-1994.
"IEEE catalog number EH04085 ; IEEE Computer Society Press order number 6617-01"--T.p. verso.