Optical measurement systems for industrial inspection III
Subtitle: 23-26 June 2003, Munich, Germany
By: Wolfgang Osten, Katherine Creath, Malgorzata Kujawinska, chairs/editors.
Contributors: Osten, Wolfgang.; Creath, Katherine.; Kujawińska, Małgorzata.; Society of Photo-optical Instrumentation Engineers.; European Optical Society.; Wissenschaftliche Gesellschaft Lasertechnik.
Series: SPIE proceedings series,; v. 5144; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5144.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 896
Subjects: Quality control -- Optical methods -- Congresses.; Optical instruments -- Industrial applications -- Congresses.; Optical detectors -- Industrial applications -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.
At head of title: proceedings of SPIE, SPIE--the Society for Optical Engineering.
"Sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)."