Stereology and morphometry in electron microscopy
Subtitle: problems and solutions
By: edited by Albrecht Reith, Terry M. Mayhew ; with a foreword by Ewaed R. Weibel.
Contributors: Reith, Albrecht.; Mayhew, Terry M.
Series: An Ultrastructural pathology publication series,
Publisher: Hemisphere Pub. Corp.
Published: 1988
Place of publication: New York
Language: eng
Number of pages: 215
Subjects: Electron microscopy -- Technique.; Stereology.
Notes: Bibliography: p. 211-212.
Includes index.