Electron Backscatter Diffraction in Materials Science
By: edited by Adam J. Schwartz, Mukul Kumar, Brent L. Adams
Contributors: Kumar, Mukul, editor; Adams, B. L. (Brent L.), editor; SpringerLink (Online service)
Published: 2000
Language: eng
Format: [electronic resource] /
Number of pages: 339
ISBN-13: 9781475732054
Subjects: Materials science; Characterization and Evaluation of Materials; Physical organic chemistry; Surfaces (Physics); Physical and theoretical Chemistry; Biochemistry; Animal Anatomy / Morphology / Histology; Geochemistry; Morphology (Animals); Biochemistry, general
Description: Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale. This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures. Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique.
Table of contents: title: 1 The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy; title: 2 Theoretical Framework for Electron Backscatter Diffraction; title: 3 Representations of Texture in Orientation Space; title: 4 Rodrigues-Frank Representations of Crystallographic Texture; title: 5 Fundamentals of Automated EBSD; title: 6 Studies on the Accuracy of Electron Backscatter Diffraction Measurements; title: 7 Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope; title: 8 Three-Dimensional Orientation Imaging; title: 9 Automated Electron Backscatter Diffraction: Present State and Prospects; title: 10 EBSD: Buying a System; title: 11 Hardware and Software Optimization for Orientation Mapping and Phase Identification; title: 12 An Automated EBSD Acquistion and Processing System; title: 13 Advanced Software Capabilities for Automated EBSD; title: 14 Strategies for Analyzing EBSD Datasets; title: 15 Structure-Property Relations: EBSD-Based Material-Sensitive Design; title: 16 Use of EBSD Data in Mesoscale Numerical Analyses; title: 17 Characterization of Deformed Microstructures; title: 18 Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum And Zirconium; title: 19 Measuring Strains Using Electron Backscatter Diffraction; title: 20 Mapping Residual Plastic Strain in Materials Using Electron Backscatter Diffraction; title: 21 EBSD Contra Tem Characterization of a Deformed Aluminum Single Crystal; title: 22 Continuous Recrystallization and Grain Boundaries in a Superplastic Aluminum Alloy; title: 23 Analysis of Facets and Other Surfaces Using Electron Backscatter Diffraction; title: 24 EBSD of Ceramic Materials; title: 25 Grain Boundary Character Based Design of Polycrystalline High Temperature Superconducting Wires.