ISTFA 2003 Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California
Edition: Pap/Cdr edition
Publisher: Asm Intl
Published: January 2003
Language: eng
Format: Paperback
Number of pages: 518
ISBN-13: 9780871707888
Subjects: Circuits & components; Materials science; Metals technology / metallurgy; Electronics - Microelectronics; Engineering - Electrical & Electronic; Technology; Science/Mathematics