Applications of x-ray topographic methods to materials science
By: edited by Sigmund Weissmann, Françoise Balibar, and Jean-François Petroff.
Contributors: Weissmann, Sigmund.; Balibar, Françoise.; Petroff, Jean-François.; Centre national de la recherche scientifique (France); National Science Foundation (U.S.)
Publisher: Plenum Press
Published: 1984
Place of publication: New York
Language: eng
Number of pages: 536
Subjects: Radiography, Industrial -- Congresses.; X-rays -- Industrial applications -- Congresses.
Notes: Includes bibliographies and index.
"Based on the proceedings of the France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science, held August 7-10, 1983, in Snowmass Village, Colorado, which was sponsored jointly by CNRS and NSF"--T.p. verso.