Correlations of capacitance-voltage hysteresis with thin-film CdTe solar cell performance during accelerated lifetime testing
By: David Albin and Joseph del Cueto
Contributors: Cueto, J. A. del; National Renewable Energy Laboratory (U.S.); International Reliability Physics Symposium (2010 : Garden Grove, Calif.)
Series: NREL/CP -- 5200-47761; Conference paper (National Renewable Energy Laboratory (U.S.)) -- NREL/CP-5200-47761.
Publisher: National Renewable Energy Laboratory
Published: 2011
Place of publication: Golden, CO]
Language: eng
Format: [electronic resource] /
Subjects: Photovoltaic cells; Research; Solar cells; Testing; Thin films; Hysteresis
Other titles: Correlations of capacitance voltage hysteresis with thin film cadmium telluride solar cell performance
Description: In this paper we present the correlation of CdTe solar cell performance with capacitance-voltage hysteresis, defined presently as the difference in capacitance measured at zero-volt bias when collecting such data with different premeasurement bias conditions. These correlations were obtained on CdTe cells stressed under conditions of 1-sun illumination, open-circuit bias, and an acceleration temperature of approximately 100 degrees C.
Notes: Title from title screen (viewed March 21, 2011).

"March 2011."

"Presented at the 2010 IEEE International Reliability Physics Symposium (IRPS), Garden Grove, California, May 2-6, 2010."

Includes bibliographical references (p. 5).

DE-AC36-08GO28308 PVA9.2450

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