Contamination control in trace element analysis
By: Morris Zief, James W. Mitchell.
Contributors: Mitchell, James W., joint author.
Series: Chemical analysis ;; v. 47
Publisher: Wiley
Published: 1976
Place of publication: New York
Language: eng
Number of pages: 262
Subjects: Trace elements -- Analysis.; Contamination (Technology)
Notes: Includes bibliographical references and index.
"A Wiley-Interscience publication."