Optical measurement systems for industrial inspection VII
Subtitle: 23-26 May 2011, Munich, Germany
By: Peter H. Lehmann, Wolfgang Osten, Kay Gastinger, editors ; sponsored and published by SPIE
Contributors: SPIE (Society); European Association of Remote Sensing Companies
Series: Proceedings of SPIE -- v. 8082; Proceedings of SPIE--the International Society for Optical Engineering -- v. 8082.
Publisher: SPIE
Published: 2011
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819486783
Subjects: Optical methods; Quality control; Congresses; Optical detectors; Optical instruments; Industrial applications
Other titles: Optical measurement systems for industrial inspection 7; Optical measurement systems for industrial inspection seven
Notes: Includes bibliographical references and index.