Hot carrier degradation of sub-micron n-channel MOSFETs subject to static stress
By: by Payman G. Aminzadeh.
Published: 1993
Language: eng
Number of pages: 56
Subjects: Metal oxide semiconductor field-effect transistors.; Hot carriers.
Notes: Typescript (photocopy)

Thesis (M.S.)--Oregon State University, 1994.

Includes bibliographical references (leaves 53-56)