Electrothermal analysis of VLSI systems
By: Yi-Kan Cheng ... [et al.].
Contributors: Cheng, Yi-Kan, 1968-
Publisher: Kluwer Academic Publishers
Published: 2000
Place of publication: Boston
Language: eng
Number of pages: 210
Subjects: Integrated circuits -- Very large scale integration -- Mathematical models; Semiconductors -- Thermal properties -- Mathematical models; Thermal analysis -- Data processing; Metal oxide semiconductors -- Mathematical models; Metal oxide semiconductors, Complementary -- Mathematical models
Notes: Includes bibliographical references and index.