IDDQ testing of VLSI circuits
By: edited by Ravi K. Gulati and Charles F. Hawkins.
Contributors: Gulati, Ravi K.; Hawkins, Charles F.
Series: Frontiers in electronic testing
Publisher: Kluwer Academic Publishers
Published: 1993
Place of publication: Boston
Language: eng
Number of pages: 120
Subjects: Integrated circuits -- Very large scale integration -- Testing; Metal oxide semiconductors, Complementary -- Testing; Iddq testing
Notes: Includes bibliographical references and index.
"A Special issue of Journal of electronic testing: theory and applications."
"Reprinted from Journal of electronic testing: theory and applications, vol. 3, no. 4."
DDQ is subscript in IDDQ in title; testing method also known as quiescent current testing.