Test structure implementation document
Subtitle: DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs)
By: C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory
Contributors: United States. Defense Advanced Research Projects Agency; Wright Laboratory (Wright-Patterson Air Force Base, Ohio); National Institute of Standards and Technology (U.S.)
Series: NIST special publication; Semiconductor measurement technology
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1995
Place of publication: Gaithersburg, MD; Washington
Language: eng
Format: Microform
Number of pages: 88
Subjects: Microwave integrated circuits -- Design -- Data processing; Gallium arsenide semiconductors -- Design -- Data processing; Computer-aided design
Notes: Distributed to depository libraries in microfiche

Shipping list no.: 96-0273-M

"September 1995."

Includes bibliographical references (p. 14)

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1996] 2 microfiches : negative