The three faces of test
Subtitle: design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984
By: sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE Computer Society Press
Published: 1984
Place of publication: Silver Spring, MD
Language: eng
Number of pages: 886
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.
Other titles: International Test Conference 1984 proceedings.; 3 faces of test.
Notes: Includes bibliographical references and index.
Spine title: International Test Conference 1984 proceedings.
"IEEE catalog no. 84CH2084-2."
"Computer Society order no. 548."