The IEE Seminar and Exhibition on MEMS Sensor Technologies, 25 April 2005
Contributors: Institution of Electrical Engineers; IEE Measurement, Sensors, Instrumentation and NDT Professional Network
Publisher: Institution of Electrical Engineers
Published: 2005
Place of publication: London
Language: eng
ISBN-13: 9780863415234
Subjects: Sensor networks; Congresses; Microtechnology
Notes: Conference organised by the IEE Measurement, Sensors, Instrumentation and NDT Professional Network.