Continuum and lattice theories of influence of electromechanical coupling on capacitance of thin dielectric films
Contributors: United States. Office of Naval Research; United States. Army Electronics Command
Series: Columbia University. Dept. of Civil Engineering and Engineering Mechanics. Technical report -- no. 13
Publisher: Department of Civil Engineering and Engineering Mechanics, Columbia University
Published: 1969
Place of publication: New York
Language: eng
Number of pages: 22
Subjects: Continuum mechanics; Crystal lattices; Thin films; Electrostatics
Notes: Sponsored by Office of Naval Research and U.S. Army Electronics Command, Electronic Components Laboratory.