2007 IEEE International Conference on Microelectronic Test Structures
Subtitle: ICMTS :  conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan
By: [sponsored by the IEEE Electron Devices Society].
Contributors: IEEE Electron Devices Society.; IEEE Xplore (Online service)
Publisher: IEEE
Published: 2007
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 275
ISBN-13: 9781424407811; 9781424407804
Subjects: Integrated circuits -- Testing -- Congresses; Semiconductors -- Testing -- Congresses; Electronic apparatus and appliances -- Testing -- Congresses
Genres: Congresses.
Other titles: Microelectronic Test Structures, 2007, ICMTS '07, IEEE International Conference on.; ICMTS 2007.
Notes: "IEEE catalog number: 07CH37856".

"... International Conference on Microelectronic Test Structures (ICMTS 2007) ... is the 20th anniversary of the ICMTS"--P. ii.

Includes bibliographical references and index.

Access restricted to subscribers.

Electronic reproduction. New York, N.Y. : IEEE, [2007]. System requirements: Adobe Acrobat Reader. Mode of access: World Wide Web. Made available through IEEE Xplore under title: Microelectronic Test Structures, 2007, ICMTS '07, IEEE International Conference on.