Defect and fault tolerance in VLSI systems
Subtitle: (proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems, held October 6-7, 1988, inSpringfield, Massachusetts)
By: edited by Israel Koren. Vol.1.
Contributors: Koren, Israel.
Publisher: Plenum
Published: 1989
Language: eng
Number of pages: 362
Subjects: Electronic digital computers -- Circuits.; Integrated circuits -- Very large scale integration.