Applied scanning probe methods IX
Subtitle: characterization
By: [edited by] Bharat Bhushan, Harald Fuchs, Masahiko Tomitori.
Contributors: Bhushan, Bharat, 1949-; Fuchs, H.; Tomitori, M.
Series: Nanoscience and technology
Publisher: Springer
Published: 2008
Place of publication: Berlin; New York
Language: eng
Number of pages: 387
ISBN-13: 9783540740827
Subjects: Materials -- Microscopy; Scanning probe microscopy; Scanning probe microscopy -- Industrial applications
Other titles: Applied scanning probe methods 9; Applied scanning probe methods nine
Notes: Includes bibliographical references and index.