Semiconductor device measurements.
Contributors: Tektronix, Inc.
Edition: 1st ed.
Series: Measurement concepts; Measurement concepts
Publisher: Tekronix
Published: 1968
Place of publication: [Beaverton, Or
Language: eng
Number of pages: 156
Subjects: Semiconductors.; Electronic measurements.
Notes: By John Mulvey, significant contributions by John Tomlin, Lee Miles and Ed Smith.

Errata slip inserted.