Digest of papers
Subtitle: 1992 IEEE VLSLI Test Conference 10th anniversary, April 7-9, 1992, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA : design, test, and appliction--ASICs and systems-on-a-chip
By: sponsored by the IEEE Computer Society, Test Technology Technical Committee, and IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1992
Place of publication: [New York]
Language: eng
Number of pages: 344
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Other titles: Design, test, and application--ASICs and systems-on-a-chip.
Notes: "IEEE catalog number 92TH0437-4"--T.p. verso.

Includes bibliographical references.