Electron beam microanalysis
By: by D. R. Beaman and J. A. Isasi.
Contributors: Isasi, J. A.
Series: ASTM special technical publication 506
Publisher: American Society for Testing and Materials
Published: 1972
Place of publication: Philadelphia
Language: eng
Number of pages: 79
Subjects: Microchemistry.; Probes (Electronic instruments); Electron microscope.
Notes: Bibliography, p. 75-(80).