Nanometer Variation-Tolerant SRAM
Subtitle: Circuits and Statistical Design for Yield
By: by Mohamed H. Abu-Rahma, Mohab Anis
Contributors: Anis, Mohab; SpringerLink (Online service)
Publisher: Springer New York; Imprint: Springer
Published: 2013
Place of publication: New York, NY
Language: eng
Format: [electronic resource] :
ISBN-13: 9781461417491
Subjects: Systems engineering; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Computer-aided design; Circuits and Systems