Hierarchical modeling for VLSI circuit testing
By: by Debashis Bhattacharya, John P. Hayes.
Contributors: Hayes, John P. 1944-
Series: The Kluwer international series in engineering and computer science.
Publisher: Kluwer Academic Publishers
Published: 1990
Place of publication: Boston
Language: eng
Number of pages: 159
Subjects: Integrated circuits -- Very large scale integration -- Testing.; Integrated circuits -- Very large scale integration -- Computer simulation.
Notes: Includes bibliographical references (p. [149]-155).