Tamped impulse simulation with an electrically exploded etched copper mesh
By: Michael J. Forrestal, Mathias J. Sagartz, William K. Tucker, Simulation Technology Department, Sandia Laboratories
Contributors: Sagartz, Mathias J., joint author; Tucker, William K., joint author; United States. Defense Nuclear Agency; Air Force Weapons Laboratory. Environment and Effects Branch; Sandia Laboratories; Sandia Laboratories. Simulation Technology Dept
Series: SAND ; 79-0132
Publisher: Dept. of Energy, (Office of the Assistant Secretary for Defense Programs), Sandia Laboratories; for sale by the National Technical Information Service
Published: 1979
Place of publication: Albuquerque, N.M; Springfield, Va
Language: eng
Number of pages: 20
Subjects: Nuclear explosions
Notes: Prepared by Sandia Laboratories for the United States Department of Energy under contract AT(29-1)-789

Prepared for the Environment and Effects Branch, Applied Physics Division, Air Force Weapons Laboratory. Work sponsored by the Defense Nuclear Agency under Subtask code N99QAXAX888 and Work Unit #7

Feb. 1979

Includes bibliographical references