1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto
By: sponsored by IEEE Electron Devices Society and in cooperation with Japan Society of Applied Physics ... [et al.].
Contributors: IEEE Electron Devices Society.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1997
Place of publication: [New York]
Language: eng
Number of pages: 124
Subjects: Semiconductors -- Characterization -- Statistical methods -- Congresses.; Semiconductors -- Measurement -- Congresses.
Notes: Includes bibliographical references.
"IEEE cat. no. 97TH8246."