ICMTS 1989
Subtitle: proceedings of the 1989 International Conference on Microelectronic Test Structures, Edinburgh, Scotland, 13-14th March 1989
By: sponsored by the IEEE Electron Devices Society in cooperation with the IEE.
Contributors: IEEE Electron Devices Society.; Institution of Electrical Engineers.
Publisher: IEEE
Published: 1989
Place of publication: New York, NY
Language: eng
Number of pages: 265
Subjects: Integrated circuits -- Testing -- Congresses.
Other titles: Proceedings of the 1989 International Conference on Microelectronic Test Structures.
Notes: "89CH2693-O."

Includes bibliographical references.