European Test Symposium
Subtitle: ETS 2005 : proceedings : 22-25 May, 2005, [Reval Hotel Olümpia] Tallin, Estonia.
Contributors: IEEE Computer Society. Technical Council on Test Technology.
Publisher: IEEE Computer Society Press
Published: 2005
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 230
Subjects: Integrated circuits -- Testing -- Congresses.
Genres: Congresses.
Other titles: ETS 2005
Notes: Includes bibliographical references and author index.
"10th ed. of the IEEE European Test Symposium" -- viii p.
"IEEE Computer Society Order Number P2341"--T.p. verso.