Defect and microstructure analysis by diffraction
By: Robert L. Snyder, Jaroslav Fiala, and Hans J. Bunge.
Contributors: Fiala, Jaroslav.; Bunge, H.-J.
Series: International Union of Crystallography monographs on crystallography ;; 10
Publisher: Oxford University Press
Published: 1999
Place of publication: Oxford; New York
Language: eng
Number of pages: 785
Subjects: Crystals -- Defects -- Analysis.; Diffraction.; X-ray crystallography.
Notes: Includes bibliographical references and index.