Rapid reliability assessment of VLSICs
By: A.P. Dorey ... [et al.].
Contributors: Dorey, A. P.
Publisher: Plenum Press
Published: 1990
Place of publication: New York
Language: eng
Number of pages: 202
Subjects: Integrated circuits -- Very large scale integration -- Testing.; Integrated circuits -- Very large scale integration -- Reliability.
Notes: Includes bibliographical references and index.