2001 6th International Workshop on Statistical Methodology
Subtitle: IWSM : June 10, 2001/Kyoto
By: technical co-sponsored by IEEE Electron Devices Society ... [et al.].
Contributors: IEEE Electron Devices Society.
Publisher: IEEE
Published: 2001
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 67
Subjects: Semiconductors -- Characterization -- Statistical methods -- Congresses.; Semiconductors -- Measurement -- Congresses.
Genres: Congresses.
Notes: Also available via the World Wide Web.
Includes bibliographic references.
"IEEE Cat. No. 01TH8550"--T.p.