Tutorial
Subtitle: LSI testing
By: [edited by] Warren G. Gee.
Contributors: Fee, Warren G.; IEEE Computer Society.; Compcon, San Francisco, 1977.
Edition: 2d ed.
Publisher: IEEE Computer Society
Published: 1978
Place of publication: Long Beach, Calif
Language: eng
Number of pages: 173
Subjects: Integrated circuits -- Testing; Microprocessors -- Testing; Computer storage devices -- Testing; Integrated circuits -- Large scale integration
Other titles: LSI testing.
Notes: Includes bibliographical references.
"Initially presented at Compcon 77, spring, San Francisco, California."