Defect and Fault-Tolerance in Vlsi Systems 2001
Subtitle: 2001 International Symposium
Publisher: Ieee
Published: October 2001
Language: eng
Format: Paperback
Number of pages: 420
ISBN-13: 9780769512037
Subjects: Circuits & components; General Theory of Computing; Software Quality Control; Very-Large-Scale Integration (Vlsi); Technology; Computer Books: General; Electronics - Circuits - VLSI; Programming - Software Development