Some properties of the Kaplan-Meier estimator and a method to find system reliability
By: by Dali Luo.
Published: 1992
Language: eng
Number of pages: 56
Subjects: Reliability (Engineering); Missing observations (Statistics)
Notes: Typescript.

Thesis (Ph. D.)--Washington State University, 1992.

Includes bibliographical references (leaves 52-56).

WSU:Another copy on microfilm, no. 7078.

WSU:"Department of Pure and Applied Mathematics."