X-Ray Nanoimaging:Instruments and Methods
Subtitle: 28-29 August 2013, San Diego, California, United States
By: Barry Lai, editor ; sponsored and published by SPIE
Contributors: Lai, Barry; SPIE (Society)
Series: Proceedings of SPIE -- volume 8851
Publisher: SPIE
Published: 2013
Place of publication: Bellingham, Washington, USA
Language: eng
ISBN-13: 9780819497017
Subjects: X-ray microscopy; Congresses
Notes: Includes bibliographical references and index.