Secondary ion mass spectrometry
Subtitle: SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985
By: editors, A. Benninghoven ... [et al.].
Contributors: Benninghoven, A.
Series: Springer series in chemical physics -- 44.; Springer series in chemical physics -- v. 44.
Publisher: Springer-Verlag
Published: 1986
Place of publication: Berlin; New York
Language: eng
Number of pages: 561
Subjects: Secondary ion mass spectrometry -- Congresses.
Notes: Includes bibliographies and index.