NIST measurement assurance program for capacitance standards at 1 kHz
By: Y. May Chang
Contributors: National Institute of Standards and Technology (U.S.)
Series: NIST technical note -- 1417
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1996
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 19
Subjects: Capacitance meters -- Calibration; Electric capacity -- Standards -- United States
Notes: Distributed to depository libraries in microfiche

Shipping list no.: 98-0003-M

Paper version no longer available for sale by the Supt. of Docs

"March 1996."

Includes bibliographical references (p. 10)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1997] 1 microfiche : negative

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