2001 IEEE International Integrated Reliability Workshop
Subtitle: final report : Stanford Sierra Camp, Lake Tahoe, California, October 15-18, 2001
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: IEEE Society
Published: 2001
Place of publication: New York
Language: eng
Number of pages: 106
Subjects: Integrated circuits -- Reliability -- Congresses; Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses
Genres: Congresses.
Other titles: Integrated Reliablilty Workshop final report, 2001, 2001 IEEE International.
Notes: "IEEE catalog number 01TH8580."

Includes bibliographical references.

Also available via the World Wide Web with additional title: Integrated Reliablilty Workshop final report, 2001, 2001 IEEE International.