Screen cage ion plating (SCIP) and scratch testing of polycrystaline aluminum oxide
By: Talivaldis Spalvins, Harold E. Sliney,and Daniel L. Deadmore.
Contributors: Sliney, Harold E.; Deadmore, Daniel L.; Lewis Research Center.
Series: NASA technical memorandum -- 105404.
Publisher: National Aeronautics and Space Administration, Lewis Research Center; National Technical Information Service, distributor
Published: 1992
Place of publication: [Cleveland, Ohio]; [Springfield, Va
Language: eng
Format: Microform
Notes: Also available via Internet from the NASA Technical Report Server web site. Address as of 8/2/05: http://ntrs.nasa.gov/archive/nasa/casi.ntrs.nasa.gov/19920013035%5F1992013035.pdf ; current access is available via PURL.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1992]. 1 microfiche.