Physical mechanisms, device models, and lifetime projections of hot-carrier effects in CMOS transistors
By: by Nam Hwang.
Published: 1993
Language: eng
Number of pages: 174
Subjects: Metal oxide semiconductors, Complementary.; Hot carriers.
Notes: Typescript (photocopy)

Thesis (Ph.D.)--Oregon State University, 1994.

Includes bibliographical references (leaves 128-139)