Microelectronic test patterns
Subtitle: an overview
By: [by] Martin G. Buehler.
Contributors: United States. Defense Advanced Research Projects Agency.; United States. Defense Nuclear Agency.; United States. National Bureau of Standards.
Series: Semiconductor measurement technology; NBS special publication 400-6; NBS special publication ;; 400-6.
Publisher: National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]
Published: 1974
Place of publication: [Washington]
Language: eng
Number of pages: 19
Subjects: Integrated circuits -- Testing.; Electronic apparatus and appliances -- Testing.
Notes: Bibliography: p. 11.
"Jointly sponsored by the Defense Advanced Research Projects Agency, the Defense Nuclear Agency, and the National Bureau of Standards."