Interferometry--surface characterization and testing
Subtitle: 24 July 1992, San Diego, California
By: Katherine Creath, John E. Greivenkamp, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Creath, Katherine.; Greivenkamp, John E.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 1776; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1776.
Publisher: SPIE
Published: 1992
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 183
Subjects: Surfaces (Technology) -- Testing -- Congresses.; Surfaces (Technology) -- Optical properties -- Congresses.; Interferometry -- Congresses.
Notes: Includes bibliographical references and index.