Automatic inspection and novel instrumentation
Subtitle: 25-26 June 1997, Singapore
By: Anthony Tung-Shuen Ho, Sreenivas Rao, Lee Ming Cheng, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, [and] Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter ... [et al.] ; cooperating organizations, Nanyang Technological University (Singapore) ... [et al.].
Contributors: Ho, Anthony Tung-Shuen.; Rao, Sreenivas.; Cheng, Lee Ming.; Society of Photo-optical Instrumentation Engineers.; Society of Photo-optical Instrumentation Engineers. Singapore Chapter.; Institute of Physics, Singapore.
Series: SPIE proceedings series ;; v. 3185; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3185.
Publisher: SPIE
Published: 1997
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 170
Subjects: Engineering inspection -- Automation -- Congresses.; Quality control -- Optical methods -- Congresses.; Optical detectors -- Industrial applications -- Congresses.; Imaging systems -- Industrial applications -- Congresses.
Notes: Includes bibliographical references and index.