Secondary ion mass spectrometry
Subtitle: basic concepts, instrumental aspects, applications, and trends
By: A. Benninghoven, F.G. Rüdenauer, H.W. Werner.
Contributors: Rüdenauer, F. G.; Werner, H. W.
Series: Chemical analysis ;; v. 86
Publisher: J. Wiley
Published: 1987
Place of publication: New York
Language: eng
Number of pages: 1227
Subjects: Secondary ion mass spectrometry.
Notes: Bibliography: p. 1125-1216.
"A Wiley-Interscience publication."
Includes index.