Fifth International Symposium on Instrumentation Science and Technology
Subtitle: 15-18 September 2008, Shenyang, China
By: Jiubin Tan, Xianfang Wen ; sponsored by ICMI--International Committee on Measurements and Instrumentation .. [et al.] ; organized by ICMI--International Committee on Measurements and Instrumentation ; co-organized by Shenyang University of Technology (China) ; cooperating organization [and] published by SPIE
Contributors: Tan, J. (Jiubin); Wen, Xianfang; International Committee on Measurements and Instrumentation; Shenyang gong ye da xue; SPIE (Society)
Series: Proceedings of SPIE -- 7133; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7133
Publisher: SPIE
Published: 2009
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819473677
Subjects: Electronic measurements; Congresses; Electronic instruments; Measurements
Other titles: International Symposium on Instrumentation Science and Technology
Notes: Includes bibliographical references and index.