Workshop record
Subtitle: 1992 IEEE Radiation Effects Data Workshop.
Contributors: IEEE Nuclear and Plasma Sciences Society.; IEEE Nuclear and Space Radiation Effects Conference (1992 : New Orleans, La.)
Publisher: Institute of Electrical and Electronics Engineers
Published: 1992
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 87
Subjects: Integrated circuits -- Effect of radiation on -- Congresses.; Metal oxide semiconductors, Complementary -- Effect of radiation on -- Congresses.
Notes: Includes bibliographical references and index.
At head of title on cover: IEEE Nuclear and Plasma Sciences Society, the Institute of Electrical and Electronics Engineers, Inc.
"Held in conjunction with the IEEE Nuclear and Space Radiation Effects Conference, Hyatt Regency Hotel, July 14, 1992, New Orleans, louisiana, USA"--Cover.
"IEEE catalog number: 92TH0507-4"--T.p. verso.