A test strategy for high resolution image scanners
By: by Armin W.Gruen, with contributions from Philip N.Slater.
Contributors: Slater, Philip N.
Series: Reports / Department of Geodetic Science and Surveying, Ohio State University -- no.350
Publisher: Ohio State University, Department of Geodetic Science and Surveying
Published: 1983
Place of publication: Columbus, Ohio
Language: eng
Number of pages: 55