Electron microscopy 1990
Subtitle: proceedings of the XIIth International Congress on Electron Microscopy, held in Seattle, Washington, USA, 12-18 August 1990
By: editors, L.D. Peachey, D.B. Williams
Contributors: Peachey, L. D.; Williams, D. B.; Electron Microscopy Society of America; Microbeam Analysis Society
Publisher: San Francisco Press
Published: 1990
Place of publication: San Francisco
Language: eng
Subjects: Electron microscopy; Congresses; High-voltage electron microscopes
Notes: 48th annual meeting of the Electron Microscopy Society of America and 25th annual meeting of the Microbeam Analysis Society.

Includes bibliographical references and indexes.
Table of contents: title: v. 1. Imaging sciences.; title: v. 2. Analytical sciences .; title: v. 3. Biological sciences.; title: v. 4. Materials sciences.