2000 5th International Workshop on Statistical Metrology
Subtitle: IWSM : June 11, 2000/Hawaii
By: [sponsored by the IEEE Electron Devices Society].
Contributors: IEEE Electron Devices Society.
Publisher: IEEE
Published: 2000
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 83
Subjects: Semiconductors -- Characterization -- Statistical methods -- Congresses.; Semiconductors -- Measurement -- Congresses.
Genres: Congresses.
Other titles: Statistical metrology; IWSM; 5th International Workshop on Statistical Metrology
Notes: "IEEE cat. no. 00TH8489"--T.p.

Includes bibliographical references.