2nd European Congress on Optics Applied to Metrology (METROP): Presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November ... Instrumentation Engineers ; v. 210)
Publisher: Society of Photo-optical Instrumentation Engineers
Published: 1980
Language: eng
Format: Unknown Binding
Number of pages: 228
ISBN-13: 9780892522385
Subjects: Holographic interferometry; Speckle metrology; Optical measurements; Congresses