Electronics reliability and measurement technology
Subtitle: nondestructive evaluation
By: edited by Joseph S. Heyman.
Contributors: Heyman, Joseph S.; Electronics Reliability and Measurement Technology Workshop (1986 : NASA Langley Research Center)
Publisher: Noyes Data Corp.
Published: 1988
Place of publication: Park Ridge, N.J., U.S.A
Language: eng
Number of pages: 128
Subjects: Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Reliability -- Congresses.; Nondestructive testing -- Congresses.
Genres: Congresses.
Notes: Includes bibliographies and index.
"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--P. vii.