Reliability physics 1974
Subtitle: 12th annual proceedings, Las Vegas, Nevada, April 2-4, 1974
By: sponsored by the IEEE Electron Devices Group and the IEEE Reliability Group
Contributors: IEEE Reliability Group; Institute of Electrical and Electronics Engineers. Electron Devices Group
Publisher: Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers
Published: 1974
Place of publication: New York
Language: eng
Number of pages: 320
Subjects: Electronic apparatus and appliances; Testing; Congresses; Reliability
Notes: "IEEE catalog no. 74CH0839-1 PHY."

Includes bibliographical references.