Proceedings
Subtitle: First Asian Test Symposium (Ats'92 November 26-27, 1992, Hiroshima, Japan)
Publisher: IEEE Computer Society Press
Published: November 1992
Language: eng
Format: Paperback
Number of pages: 272
ISBN-13: 9780818629853
Subjects: Circuits & components; Computer architecture & logic design; Computer Systems; Software Testing; Computers - General Information; Science/Mathematics; General; Circuits; Congresses; Electronic circuits; Electronic digital computers; Fault-tolerant computing; Testing