Digest of papers
Subtitle: 'The state of the art: from device testing to reconfigurable systems' FTC/3 International Symposium on Fault-Tolerant Computing, June 20, 21, 22 Palo Alto, Calif.
By: sponsored by the Technical Committee on Fault-Tolerant Computing of the IEEE Computer Society (et al.).
Contributors: Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Fault-Tolerant Computing.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1973
Place of publication: New York
Language: eng