Störstellen in Galliumnitrid-basierenden Transistoren
By: Mike Jean Wolter.
Series: Schriften des Forschungszentrums Jülich. Reihe Informationstechnik ;; Bd. 7=; Information technology ;; v. 7; Schriften des Forschungszentrums Jülich.; Bd. 7.
Publisher: Forschungszentrum Jülich, Zentralbibliothek
Published: 2004
Place of publication: Jülich
Language: ger
Number of pages: 132
Subjects: Modulation-doped field-effect transistors -- Defects.; Semiconductors -- Defects.; Electric insulators and insulation -- Defects.; Gallium nitride -- Electric properties.
Other titles: Influence of the layer properties on the electrical and optoelectrical behavior of AlGaN/GaN HEMT transistors
Notes: Abstract in English.
Includes bibliographical references.
At head of title: Forschungszentrum Jülich GmbH, Institut für Schichten und Grenzflächen, Institut 1: Halbleiterschichten und -bauelemente.