Elastic and inelastic scattering in electron diffraction and imaging
By: Zhong Lin Wang.
Series: The language of science
Publisher: Plenum Press; Springer
Published: 1995
Place of publication: New York
Language: eng
Number of pages: 448
Subjects: Scattering (Physics); Electrons -- Diffraction; Imaging systems; Electron microscopy
Notes: Includes bibliographical references (p. 433-441) and index.