Hybrid circuit data
By: prepared by Timothy E. Turner, under contract to Rome Air Development Center, Griffiss Air Force Base, N.Y.
Contributors: Rome Air Development Center.; Reliability Analysis Center (U.S.)
Series: Microcircuit device reliability ;; MDR-5
Publisher: Reliability Analysis Center, Rome Air Development Center
Published: 1977
Place of publication: Griffiss Air Force Base, N.Y
Language: eng
Number of pages: 407
Subjects: Hybrid integrated circuits -- Reliability.
Notes: At head of title: Reliability Analysis Center, a DoD information analysis center.
"Winter 76-77."
Chiefly tables.
"Catalog no. MDR-5."
"Contract/grant no.: F 30602-76-C-0192."
"Supersedes Hybrid microcircuit reliability data prepared by IIT Research Institute.