On-line testing
By: edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan.
Contributors: Nicolaidis, Michael.; Zorian, Yervant.; Pradan, Dhiraj K.
Publisher: Kluwer Academic Publishers
Published: 1998
Place of publication: Boston
Language: eng
Number of pages: 159
Subjects: Electronic circuits -- Testing -- Data processing; Online data processing; Electronic circuit design; Error-correcting codes (Information theory)
Other titles: Journal of electronic testing. Special issue.
Notes: Includes bibliographical references and index.
"Reprinted from a special issue of Journal of el4ctronic testing, theory and applications, volume 12, nos. 1 & 2, February/March 1998."