Lightmetry 2002
Subtitle: metrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland
By: Maksymilian Pluta, Mariusz Szyjer, chairs/editors ; Ewa Powichrowska, co-editor ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland) ; published by Spie--the International Society for Optical Engineering.
Contributors: Pluta, Maksymilian.; Szyjer, Mariusz.; Powichrowska, Ewa.; Society of Photo-optical Instrumentation Engineers.; Society of Photo-optical Instrumentation Engineers. Poland Chapter.; Institute of Applied Optics (Poland); Komitet Badań Naukowych (Poland)
Series: SPIE Poland Chapter proceedings ;; 68; SPIE proceedings series,; v. 5064; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5064.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 338
Subjects: Light -- Congresses; Polarization (Light) -- Congresses; Optical measurements -- Congresses; Optical detectors -- Congresses; Mensuration -- Congresses
Genres: Congresses.
Other titles: Metrology and testing techniques using light; Lightmetry : metrology, spectroscopy, and testing techniques using light.
Notes: Includes bibliographical references and author index.
Previous conference entitled: Lightmetry : metrology, spectroscopy, and testing techniques using light.