Exploring scanning probe microscopy with mathematica
By: Dror Sarid
Edition: 2nd completely rev. and enl. ed.
Publisher: Wiley-VCH
Published: 2007
Place of publication: Weinheim
Language: eng
Format: [electronic resource] /
Number of pages: 310
ISBN-13: 9783527609871
Subjects: SCIENCE; Scanning probe microscopy; Electron Microscopes & Microscopy; Data processing; Mathematica (Computer file)
Description: This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the.
Notes: Previous ed.: Chichester : John Wiley, 1997.

Includes bibliographical references and index.

Description based on print version record.
Table of contents: title: Exploring Scanning Probe Microscopy with MATHEMATICA; Contents; Preface; 1 Introduction; 2 Uniform Cantilevers; 3 Cantilever Conversion Tables; 4 V-Shaped Cantilevers; 5 Tip-Sample Adhesion; 6 Tip-Sample Force Curve; 7 Free Vibrations; 8 Noncontact Mode; 9 Tapping Mode; 10 Metal-Insulator-Metal Tunneling; 11 Fowler-Nordheim Tunneling; 12 Scanning Tunneling Spectroscopy; 13 Coulomb Blockade; 14 Density of States; 15 Electrostatics; 16 Near-Field Optics; 17 Constriction and Boundary Resistance; 18 Scanning Thermal Conductivity Microscopy; 19 Kelvin Probe Force Microscopy.