Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers
By: by N.K. Sahoo ... [et al.].
Contributors: Sahoo, N. K.; Bhabha Atomic Research Centre.
Series: BARC external ;; BARC/2001/E/032
Publisher: Bhabha Atomic Research Centre
Published: 2001
Place of publication: Mumbai
Language: eng
Format: Microform
Number of pages: 45
Subjects: Thin films -- Optical properties.; Thin films, Multilayered.
Notes: Microfiche. New Delhi : Library of Congress Office ; Washington, D.C. : Library of Congress Photoduplication Service, 2004. 1 microfiche. Master microform held by: DLC.
Includes bibliographical references (p. 45).
At head of title: Government of India, Atomic Energy Commission.