Piece recognition and image processing
Subtitle: 30 June 1988, Dearborn, Michigan
By: Wayne Wiitanen, chair/editor ; cosponsored by ESD, the Engineering Society, SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.].
Contributors: Wiitanen, Wayne.; Engineering Society of Detroit.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE--the International Society for Optical Engineering ;; v. 956
Publisher: SPIE
Published: 1988
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 132
Subjects: Optical pattern recognition -- Congresses.; Image processing -- Congresses.
Notes: Includes bibliographies and index.
Papers presented at the meeting held on June 30, 1988.