Noise temperature measurements on wafer
By: J. Randa.
Series: NIST technical note ;; 1390
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1997
Place of publication: Boulder, Colo; Washington
Language: eng
Number of pages: 57
Subjects: Semiconductor wafers -- Testing.; Current noise (Electricity); Electronic noise -- Measurement.; Impedance matching.
Notes: Includes bibliographical references (p. 33-36).
"March 1997."