Industrial optical sensors for metrology and inspection
Subtitle: 31 October-1 November 1994, Boston, Massachusetts
By: Kevin G. Harding, H. Philip Stahl, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Harding, Kevin G.; Stahl, H. Philip.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2349; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2349.
Publisher: SPIE
Published: 1995
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 272
Subjects: Engineering inspection -- Congresses.; Optical detectors -- Industrial applications -- Congresses.; Optical measurements -- Congresses.; Interferometry -- Industrial applications -- Congresses.; Quality control -- Optical methods -- Congresses.
Notes: Includes bibliographical references and author index.