Performance and reliability of semiconductor devices
Subtitle: symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A.
By: editors, Michael Mastro ... [et al.].
Contributors: Mastro, Michael, 1949-; Materials Research Society; Materials Research Society. Meeting
Series: Materials Research Society symposium proceedings -- v. 1108; Materials Research Society symposia proceedings -- v. 1108.
Publisher: Materials Research Society
Published: 2009
Place of publication: Warrendale, Pa
Language: eng
Number of pages: 259
ISBN-13: 9781605110806
Subjects: Semiconductors; Reliability; Congresses; Defects
Notes: "Symposium A, 'Performance and Reliability of Semiconductor Devices', was held ... at the 2008 MRS Fall Meeting in Boston"--Pref.

Includes bibliographical references and indexes.