Proceedings of the 18th International Conference on Defects in Semiconductors
Subtitle: Sendai, Japan, July 23-38, 1995
By: ICDS-18 ; edited by Masashi Suezawa and Hiroshi Katayama-Yoshida.
Contributors: Suezawa, Masashi.; Katayama-Yoshida, Hiroshi.
Series: Materials science forum -- v. 196-201.
Publisher: Trans Tech Publications
Published: 1995
Place of publication: Zurich-Uetikon, Switzerland; Lebanon, NH
Language: eng
Subjects: Semiconductors -- Defects -- Congresses.
Other titles: Defects in semiconductors.
Notes: Includes bibliographical references and indexes.