Structural, Syntactic, and Statistical Pattern Recognition
Subtitle: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, ... (Lecture Notes in Computer Science)
Contributors: Dit-Yan Yeung (Editor); James T. Kwok (Editor); Ana Fred (Editor); Fabio Roli (Editor); Dick de Ridder (Editor)
Edition: 1 edition
Publisher: Springer
Published: September 15, 2006
Language: eng
Format: Paperback
Number of pages: 939
ISBN-13: 9783540372363
Subjects: Pattern recognition; Computers - General Information; Discrete Mathematics; Mathematics; Science/Mathematics; Artificial Intelligence - General; Computer Vision; Computers / Computer Vision; bayesian networks; biometrics; character recognition; classification; clustering; document analysis; feature extraction; graph-based methods; graphical pattern recognition; image analysis; object recognition