Surface topographical changes measured by phase-locked interferometry
By: James L. Lauer and Simon S. Fung ; prepared for Lewis Research Center.
Contributors: Fung, Simon S.; United States. National Aeronautics and Space Administration. Scientific and Technical Information Office.; Lewis Research Center.; Rensselaer Polytechnic Institute.
Series: NASA contractor report -- NASA CR-3757.
Publisher: National Aeronautics and Space Administration, Scientific and Technical Information Office; For sale by the National Technical Information Service]
Published: 1984
Place of publication: Washington, D.C; [Springfield, Va
Language: eng
Number of pages: 96
Subjects: Tribology.; Interferometers.
Notes: "Rensselaer Polytechnic Institute."

Distributed to depository libraries in microfiche.

"January 1984"--Cover.

STAR category 74.

Includes bibliographical references.

NAG3-222.