IEEE standard for in-system configuration of programmable devices
By: sponsor Test Technology Technical Committee of the IEEE Computer Society.
Contributors: Institute of Electrical and Electronics Engineers.; IEEE Computer Society. Test Technology Technical Committee.; IEEE Standards Association.; IEEE Standards Board.
Series: IEEE Std -- 1532-2001.; IEEE std -- 1532-2001.
Publisher: Institute of Electrical and Electronics Engineers
Published: 2001
Place of publication: New York
Language: eng
Number of pages: 130
Subjects: Programmable logic devices -- Standards
Description: "The communication protocol described by IEEE Std 1149.1 (Standard Test Access Port and Boundary-Scan Architecture) has been adopted by this standard for providing standardized programming access and methodology for programmable integrated circuit devices. Devices that implement this standard shall first be compliant with IEEE 1149.1 used for testing purposes. A device, or set of devices, implementing this standard may be programmed (written), read back, erased, and verified, singly or concurrently, with a standardized set of resources. Sample implementation and application details (which are not part of this standard) are included for illustrative purposes."
Notes: "IEEE Std 1532-2001 (Revision of IEEE Std 1532-2000)".

"Approved 6 December 2001 IEEE-SA Standards Board".

"28 December 2001"--Cover.

Includes bibliographical references.

Also available via the World Wide Web with additional title: IEEE Std 1532-2001.