1997 IEEE International Reliability Physics symposium proceedings
Subtitle: 35th annual, Denver, Colorado, April 8, 9, 10, 1997
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1997
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 384
Subjects: Electronic apparatus and appliances -- Reliability -- Congresses.
Genres: Congresses.
Other titles: 1997 IEEE Annual International Reliability Physics.; IEEE International Reliability Physics proceedings.; Reliability Physics Symposium, 1997, 35th annual proceedings, IEEE International.
Notes: "IEEE catalog no. 97CH35983."

Includes bibliographical references.

Also available via the World Wide Web with additional title: Reliability Physics Symposium, 1997, 35th annual proceedings, IEEE International.