Electronics reliability and measurement technology
By: edited by Joseph S. Heyman.
Contributors: Heyman, Joseph S.; Langley Research Center.
Series: NASA conference publication ;; 2472
Publisher: National Aeronautics and Space Administration, Scientific and Technical Information Office
Published: 1987
Place of publication: Washington, D.C
Language: eng
Number of pages: 139
Subjects: Semiconductors -- Reliability -- Measurement -- Congresses.; Electronic apparatus and appliances -- Reliability -- Measurement -- Congresses.
Notes: Includes bibliographies.
"Proceedings of a conference sponsored by the NASA Langley Research Center Hampton, Virginia, United States Air Force Space Division, Los Angeles, California, the National Security Industrial Association, Washington, D.C., and the Aerospace Industry Association, Washington, D.C., and held at Langley Research Center Hampton, Virginia, June 3-5, 1986."