Defect oriented testing for CMOS analog and digital circuits
By: by Manoj Sachdev.
Series: Frontiers in electronic testing
Publisher: Kluwer Academic
Published: 1998
Place of publication: Boston
Language: eng
Number of pages: 308
Subjects: Metal oxide semiconductors, Complementary -- Testing.; Metal oxide semiconductors, Complementary -- Defects.; Linear integrated circuits -- Testing.; Digital integrated circuits -- Testing.
Notes: Includes bibliographical references and index.