Total reflection X-ray fluorescence analysis
By: Reinhold Klockenkämper.
Series: Chemical analysis -- v.140; A Wiley-Interscience publication
Publisher: Wiley
Published: 1997
Place of publication: New York; Chichester
Language: eng
Number of pages: 245
Subjects: X-ray spectroscopy.; Fluorescence spectroscopy.
Description: This is the first book dedicated to this powerful and highly efficient analytical tool. Written by a leading expert with three decades of specialization in X-ray spectral analysis, it features a remarkably readable treatment complete with hundreds of illustrations, equations, and references.

Using only a minimum of mathematics, the author focuses on practical applications of TXRF in a variety of disciplines, including geology, biology, material and environmental sciences, medicine, forensics, and art history.

Total-Reflection X-Ray Fluorescence Analysis helps professionals evaluate the suitability of this method to their specific needs, pinpoint new applications, and gain insight into the future of TXRF. It is an excellent text for graduate students and a useful guide for scientists and technicians in a wide range of fields.
Notes: Includes bibliographical references and index.