Narrow bandgap semiconducting silicides
Subtitle: intrinsic infrared detectors on a silicon chip : final report
By: principal investigator, John E. Mahan.
Contributors: United States. National Aeronautics and Space Administration.
Series: NASA contractor report -- NASA CR-190882.
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1990
Place of publication: [Washington, DC; Springfield, Va
Language: eng
Format: Microform
Subjects: Diffraction patterns.; Electron diffraction.; Epitaxy.; Silicides.; Silicon.; Thin films.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 93-0371-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1993] 1 microfiche.