Mathematical models for systems reliability
By: Benjamin Epstein and Ishay Weissman.
Contributors: Weissman, Ishay, 1940-
Publisher: Taylor & Francis
Published: 2008
Place of publication: Boca Raton
Language: eng
ISBN-13: 9781420080827
Subjects: Reliability (Engineering) -- Mathematics; System failures (Engineering) -- Mathematical models
Notes: "A CRC title."

Includes bibliographical references and index.