2000 IEEE International Integrated Reliability Workshop final report
Subtitle: Stanford Sierra Camp, Lake Tahoe, California, October 23-26, 2000
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: IEEE Electron Devices Society; IEEE Reliability Society
Published: 2000
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 199
Subjects: Integrated circuits -- Reliability -- Congresses.; Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.
Genres: Congresses.
Other titles: Integrated reliability workshop; 2000 IRW final report
Notes: "IEEE Catalog No. 00TH8515"--T.p. verso.

Includes bibliographical references.