International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Subtitle: 13-15 May 1997, Kiev, Ukraine
By: Sergei V. Svechnikov, Mikhail Ya. Valakh, chairs/editors ; organized by SPIE Ukraine Chapter ... [et al.] ; sponsored by Physical Society of Ukraine, Relcom (Ukraine), [and] Dynamic Ltd. Company (Ukraine).
Contributors: Svechnikov, Sergeĭ Vasilʹevich.; Valakh, M. I͡A︡.; SPIE Ukraine Chapter.; Ukrainian Physical Society.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 3359; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3359.
Publisher: SPIE
Published: 1998
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 564
Subjects: Electronics -- Materials -- Optical properties -- Congresses.; Electronics -- Materials -- Testing -- Congresses.; Optoelectronics -- Materials -- Optical properties -- Congresses.; Microelectronics -- Materials -- Optical properties -- Congresses.; Quantum electronics -- Materials -- Optical properties -- Congresses.
Other titles: Optical diagnosis of materials and devices for opto-, micro-, and quantum electronics
Notes: Includes bibliographical references and index.