Proceedings of the Symposium on the Degradation of Electronic Devices Due to Device Operation as Well as Crystalline and Process-Induced Defects
By: edited by H.J. Queisser ... [et al.] ; [sponsored by] Electronics and Dielectric Science and Technology Divisions.
Contributors: Queisser, Hans J., 1931-; Electrochemical Society. Electronics Division.; Electrochemical Society. Dielectric Science and Technology Division.
Series: Proceedings ;; v. 94-1; Proceedings (Electrochemical Society) ;; v. 94-1.
Publisher: Electrochemical Society
Published: 1994
Place of publication: Pennington, NJ
Language: eng
Number of pages: 319
Subjects: Electronic apparatus and appliances -- Deterioration -- Congresses.; Electronics -- Materials -- Deterioration -- Congresses.
Other titles: Degradation of electronic devices due to device operation as well as crystalline and process-induced defects.
Notes: Includes bibliographical references and indexes.
Held October 11-13, 1993 at the Sheraton New Orleans Hotel in New Orleans, La.
Spine title: The degradation of electronic devices due to device operation as well as crystalline and process-induced defects.