Yield and reliability in microwave circuit and system design
By: Michael D. Meehan and John Purviance.
Contributors: Purviance, John.
Series: Artech House microwave library
Publisher: Artech House
Published: 1993
Place of publication: Boston
Language: eng
Number of pages: 276
Subjects: Microwave integrated circuits -- Design and construction -- Statistical methods.; Engineering design -- Statistical methods.; Computer-aided design.
Notes: Includes bibliographical references and index.