The critical-path method
By: [by] L.R. Shaffer, J.B. Ritter [and] W.L. Meyer.
Contributors: Ritter, J. B., joint author.; Meyer, W. L., joint author.
Publisher: McGraw-Hill
Published: 1965
Place of publication: New York
Language: eng
Number of pages: 212
Subjects: Critical path analysis
Notes: Bibliography: p. 191-193.