Health monitoring and smart nondestructive evaluation of structural and biological systems V
Subtitle: 27 February-1 March 2006, San Diego, California, USA
By: Tribikram Kundu, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering. ; cosponsored by ASME--American Society of Mechanical Engineers (USA) ; cooperating organizations, Intelligent Materials Forum (Japan), Jet Propulsion Laboratory (USA), [and] National Science Foundation (USA).
Contributors: Kundu, T.; Intelligent Materials Forum (Mitō Kagaku Gijutsu Kyōkai); American Society of Mechanical Engineers.; Jet Propulsion Laboratory (U.S.); National Science Foundation (U.S.); Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE -- 6177; Proceedings of SPIE--the International Society for Optical Engineering -- v. 6177.
Publisher: SPIE
Published: 2006
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819462305
Subjects: Nondestructive testing -- Congresses; Structural analysis (Engineering) -- Congresses; Detectors -- Congresses; Imaging systems in medicine -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and author index.