Twenty First Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Subtitle: proceedings 2005 : San Jose, CA, USA, March 15-17, 2005
By: IEEE Components, Packaging, and Manufacturing Technology Society, National Institute of Standards and Technology.
Contributors: Components, Packaging & Manufacturing Technology Society.; National Institute of Standards and Technology (U.S.); IEEE Xplore (Online service)
Publisher: IEEE
Published: 2005
Place of publication: Piscataway, N.J
Language: eng
Format: Electronic resource
Number of pages: 360
Subjects: Semiconductors -- Thermal properties -- Congresses; Semiconductors -- Cooling -- Congresses
Genres: Congresses.
Other titles: Semiconductor Thermal Measurement and Management Symposium.; SEMI-THERM 21.; Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE.
Notes: " ... SEMI-THERM 21 ... "p. iii.

Cover title.

"IEEE Catalog Number 05CH37651 Softbound Edition ; 05CH37651C CD-ROM Edition"--P. ii.

Includes bibliographical references.

Electronic reproduction. New York, N.Y. : IEEE, 2005. System requirements: Adobe Acrobat Reader. Mode of access: World Wide Web. Made available through IEEE Xplore under title: Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE.