ARPA/NBS workshop II
Subtitle: hermeticity testing for integrated circuits : [synopses]
By: Harry A. Schafft.
Series: Semiconductor measurement technology; NBS Special publication ; 400-9; NBS special publication ;; 400-9.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs. U.S. Govt. Print. Off.
Published: 1974
Place of publication: Washington
Language: eng
Number of pages: 36
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.; Sealing (Technology) -- Congresses.