Correlations in characteristic data of concentrator photovoltaics
By: Cassi Sweet, Nick Bosco, Sarah Kurtz
Contributors: Bosco, Nick; Kurtz, S. R.; Photovoltaic Module Reliability Workshop; National Renewable Energy Laboratory (U.S.); United States. Department of Energy. Office of Scientific and Technical Information
Series: NREL/PO -- 5200-51246; NREL/PO -- 5200-51246.
Publisher: U.S. Dept. of Energy; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy
Published: 2011
Place of publication: Washington, D.C; Oak Ridge, Tenn
Language: eng
Format: [electronic resource] /
Subjects: Solar energy; Congresses; Photovoltaic power generation
Description: This study is motivated by a reported 1-2% infant mortality rate in concentrator photovoltaic cell assemblies. Approximately 650 bare III-V multi-junction PV cells were initially characterized via electroluminescence imaging and both light and dark current-voltage responses were recorded. The cells were then packaged into receivers and their IV response again evaluated both before and after an outdoor high concentration exposure of at least four hours above 750 DNI. Correlations exist between the initial dark IV characteristic and artifacts found in the EL image. Initial results also suggest that artifacts observed in the bare cell may serve as an indicator for early on-sun degradation, though may not be able to predict the infant mortality population.
Notes: Title from PDF caption title screen (NREL, viewed Apr. 28, 2011).

Published through the Information Bridge: DOE Scientific and Technical Information.

"February 2011"--P. [1].

"Presented at the 2011 Photovoltaic Module Reliability Workshop, 16-17 February 2011, Golden, Colorado."