Comprehensive test pattern and approach for characterizing SOS technology
By: W. E. Ham ; supported by the Defense Advanced Research Projects Agency.
Contributors: United States. Defense Advanced Research Projects Agency.
Series: Semiconductor measurement technology; NBS special publication ; 400-56; NBS special publication ;; 400-56.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1980
Place of publication: [Washington, D.C.]
Language: eng
Number of pages: 361
Subjects: Integrated circuits -- Testing.; Integrated circuits -- Large scale integration.
Notes: Includes bibliographical references.