Scanning tunneling microscopy
By: edited by H. Neddermeyer.
Contributors: Neddermeyer, H.
Series: Perspectives in condensed matter physics ;; v. 6
Publisher: Kluwer Academic Publishers
Published: 1993
Place of publication: Dordrecht; Boston
Language: eng
Number of pages: 266
Subjects: Scanning tunneling microscopy.
Description: This volume is devoted to the rapidly growing field of scanning tunneling microscopy and spectroscopy (STM). Originally developed by G. Binning, H. Rohrer and their coworkers at the IBM Research Institute R(uuml)schlikon, Switzerland, for applications in surface physics, the method is becoming interesting for other disciplines as well, e.g. materials sciences, biology, chemistry, and chemical physics, electrical engineering, etc. The papers collected in this volume cover the theory of STM, instrumental problems and important applications in the physics of clean and metal-covered semiconductors, clean metal, alloy and other compound surfces, adsorption on metals, electrochemicalprocesses and biological applications.
Notes: Includes bibliographical references and index.
A collection of reprints of articles originally published in various journals.