Polarization analysis and measurement
Subtitle: 19-21 July 1992, San Diego, California
By: Dennis H. Goldstein, Russell A. Chipman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Goldstein Dennis H.; Chipman, Russell A.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society of Optical Engineering ;; v. 1746; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1746.
Publisher: SPIE
Published: 1992
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 413
Subjects: Polarimetry -- Congresses.
Notes: Includes bibliographical references and index.