Built-in test for VLSI
Subtitle: pseudorandom techniques
By: Paul H. Bardell, William H. McAnney, Jacob Savir.
Contributors: McAnney, William H.; Savir, Jacob.
Publisher: Wiley; Wiley-Interscience
Published: 1987
Place of publication: New York
Language: eng
Number of pages: 354
Subjects: Integrated circuits -- Very large scale integration -- Testing.
Notes: Bibliography: p. 339-345.
"A Wiley-Interscience publication."
Includes index.