12th IEEE VLSI Test Symposium
Subtitle: April 25-28, 1994, Cherry Hill, New Jersey : proceedings
By: sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE Computer Society Press
Published: 1994
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 466
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Other titles: Twelfth IEEE VLSI Test Symposium.
Notes: Includes  bibliographical references and index.