Stochastic modeling of crack initiation and short-crack growth under creep and creep-fatigue conditions
By: Takayuki Kitamura, Louis J. Ghosn, and Ryuichi Ohtani.
Contributors: Ghosn, Louis J.; Ohtani, Ryuichi, 1938-; United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum -- 101358.
Publisher: NASA; For sale by the National Technical Information Service
Published: 1989
Place of publication: [Washington, D.C.]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Crack initiation.; Crack propagation.; Creep analysis.; Creep strength.; Fatigue life.; Models.; Stochastic processes.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1989] 1 microfiche.