Advanced measurement and test
Subtitle: selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
By: edited by Yanwen Wu
Contributors: Wu, Yanwen
Series: Key engineering materials -- v. 439-440; Key engineering materials -- v. 439-440.
Publisher: Trans Tech Publications, Ltd.
Published: 2010
Place of publication: Stafa-Zurich, Switzerland; Enfield, NH
Language: eng
Number of pages: 1643
ISBN-13: 9780878492718
Subjects: Electronic measurements; Testing; Congresses; Electric measurements; Materials
Other titles: International Conference on Advanced Measurement and Test; AMT 2010
Notes: Includes bibliographical references and indexes.