Electron beam ion sources and traps and their applications
Subtitle: 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000
By: editor, Krsto Prelec.
Contributors: Prelec, Krsto.
Series: AIP conference proceedings -- v. 572.; AIP conference proceedings -- no. 572.
Publisher: American Institute of Physics
Published: 2001
Place of publication: Melville, N.Y
Language: eng
Number of pages: 304
Subjects: Ion sources -- Congresses; Electron beams -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and index.