Testing for the 80's
Subtitle: digest of papers, 1980 Test Conference, November 11, 12, 13, 1980
By: sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.
Contributors: IEEE Computer Society. Test Technology Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: Institute of Electrical and Electronics Engineers; available from IEEE Computer Society Publications Office
Published: 1980
Place of publication: New York, N.Y; Long Beach, Calif
Language: eng
Number of pages: 507
Subjects: Integrated circuits -- Testing -- Congresses.
Notes: Includes bibliographical references and index.
"80CH1608-9."