IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes
Subtitle: (MVIEW'99) : proceedings : June 26, 1999, Fort Collins, Colorado
By: sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.
Contributors: IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.
Publisher: IEEE Computer Society
Published: 1999
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 89
Subjects: Image processing -- Congresses.
Genres: Congresses.
Other titles: Proceedings, IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes; MVIEW'99; 1999 IEEE Workshop on Multi-View Modeling and Analysis of Visual Scenes
Notes: "IEEE Computer Society Order Number PRO0110"--T.p. verso.

Includes bibliographic references and index.