1997 IEEE International Integrated Reliability Workshop final report
Subtitle: Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: IEEE Electron Devices Society; IEEE Reliability Society
Published: 1997
Place of publication: Piscataway, New Jersey
Language: eng
Number of pages: 161
Subjects: Integrated circuits -- Reliability -- Congresses.; Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.
Notes: Includes bibliographical references.
"IEEE Catalog No. 97TH8319"--verso of T.p.