Proceedings
By: International Test Conference 1997.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: The Conference
Published: 1997
Place of publication: Washington, D.C
Language: eng
Number of pages: 1054
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.
Notes: Includes bibliographical references and index.
"Sponsored by IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section"--Cover.
"November 1-6, 1997 ... Washington, D.C., USA"--Cover
"IEEE catalog number 97CH36126"--T.p. verso.