Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites
By: David G. Seiler ... [et al.].
Contributors: Seiler, David G.; National Institute of Standards and Technology (U.S.)
Series: Semiconductor measurement technology; NIST special publication -- 400-94.; Semiconductor measurement technology; NIST special publication -- 400-94.
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1994
Place of publication: Gaithersburg, MD; Washington, DC
Language: eng
Format: Microform
Subjects: Infrared detectors -- United States.; Meteorological satellites -- United States.; Geostationary satellites.; TIROS satellites.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 94-0562-M.

"April 1994."

Includes bibliographical references.

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1994] 3 microfiches : negative.

s 1994 dcu n b.