SIGMETRICS 2005
Subtitle: International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada
By: sponsored by ACM Sigmetrics
Contributors: ACM-Sigmetrics
Series: Performance evaluation review -- v. 33, no. 1 (June 2005); Performance evaluation review -- v. 33, no. 1
Publisher: Association for Computing Machinery
Published: 2005
Place of publication: New York, N.Y
Language: eng
Number of pages: 415
Subjects: Computer networks; Evaluation; Congresses; Electronic digital computers
Other titles: International Conference on Measurement and Modeling of Computer Systems; Proceedings, ACM SIGMETRICS 2005; SIGMETRICS '05
Notes: "Special issue."

"ACM order number 488040"--T.p. verso.

Includes bibliographical references and author index.

Also issued online via the ACM Digital Library with title: Proceedings of the 2005 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems.