Proceedings ATFA-78
Subtitle: Advanced Techniques in Failure Analysis, 6-9 Nov., 1978, Airport Marriott Hotel, Los Angeles, Calif., USA
By: sponsored by The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Los Angeles Council, Region 6.
Contributors: Institute of Electrical and Electronics Engineers. Region 6.
Publisher: Los Angeles Council, IEEE
Published: 1978
Place of publication: Los Angeles, Calif
Language: eng
Number of pages: 200
Subjects: Solid state electronics -- Testing -- Congresses.; Electronic circuits -- Testing -- Congresses.
Genres: Congresses.
Other titles: ATFA-78 : Advanced Techniques in Failure Analysis.
Notes: Cover title: ATFA-78 : Advanced techniques in failure analysis.

"IEEE catalog no. 78CH1407-6 REG 6."

Includes bibliographical references and index.