Applications of electron microfractography to materials research.
Contributors: American Society for Testing and Materials. Subcommittee II on Fractography.
Series: ASTM special technical publication 493
Publisher: American Society for Testing and Materials
Published: 1971
Place of publication: Philadelphia
Language: eng
Number of pages: 96
Subjects: Fractography -- Congresses; Electron microscopy -- Congresses
Notes: Includes bibliographical references.
"Presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970."
Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals.