18th IEEE VLSI Test Symposium
Subtitle: proceedings : 30 April-4 May 2000, Montréal, Québec, Canada
By: sponsored by the IEEE Computer Society Test Technology Technical Council.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers.
Publisher: IEEE
Published: 2000
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 478
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Genres: Congresses.
Other titles: VLSI Test Symposium; VTS 00; Eighteenth IEEE VLSI Test Symposium
Notes: "IEEE Computer Society order number PR00613"--T.p. verso.

Includes bibliographical references and index.