Statistical Metrology, 1998 3rd Workshop
Publisher: Institute of Electrical & Electronics Enginee
Published: July 1998
Language: eng
Format: Paperback
Number of pages: 121
ISBN-13: 9780780343382
Subjects: Engineering measurement & calibration; Mathematics for scientists & engineers; Technology & Industrial Arts; Engineering Statistics; Very-Large-Scale Integration (Vlsi); Technology; Science/Mathematics; Electronics - Semiconductors; Mensuration; Reference; Characterization; Congresses; Measurement; Semiconductors; Statistical methods