Power-aware testing and test strategies for low power devices
By: Patrick Girard, Nicola Nicolici, Xiaoqing Wen, editors
Publisher: Springer
Published: 2010
Place of publication: New York
Language: eng
Number of pages: 363
ISBN-13: 9781441909275
Subjects: Testing; Power supply; Low voltage integrated circuits
Notes: Includes bibliographical references and index.