Failure-free integrated circuit packages
Subtitle: systematic elimination of failures through reliability engineering, failure analysis, and material improvements
By: Charles Cohn, Charles A. Harper, editors
Contributors: Cohn, Charles; Harper, Charles A
Series: McGraw-Hill professional engineering
Publisher: McGraw-Hill
Published: 2005
Place of publication: New York
Language: eng
Number of pages: 363
Subjects: Integrated circuits; Integrated circuits -- Reliability; Reliability (Engineering)
Notes: Includes bibliographical references and index