Applied scanning probe methods VIII
Subtitle: scanning probe microscopy techniques
By: [edited by] Bharat Bhushan, Harald Fuchs, Masahiko Tomitori.
Contributors: Bhushan, Bharat, 1949-; Fuchs, H.; Tomitori, M.
Series: Nanoscience and technology
Publisher: Springer
Published: 2008
Place of publication: Berlin; New York
Language: eng
Number of pages: 465
ISBN-13: 9783540740797
Subjects: Scanning probe microscopy; Scanning probe microscopy -- Industrial applications; Materials -- Microscopy
Notes: Includes bibliographical references and index.