Yield and variability optimization of integrated circuits
By: J.C. Zhang, M.A. Styblinski.
Contributors: Styblinski, M. A., 1942-
Publisher: Kluwer Academic Publishers
Published: 1995
Place of publication: Boston
Language: eng
Number of pages: 234
Subjects: Integrated circuits -- Design and construction -- Statistical methods; Integrated circuits -- Reliability; Integrated circuits -- Defects
Notes: Includes bibliographical references (p. 221-231) and index.