Advances in surface and thin film diffraction
Subtitle: symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.
By: editors, Ting C. Huang, Philip I. Cohen, David J. Eaglesham.
Contributors: Huang, Ting C.; Cohen, Philip I.; Eaglesham, David J.; Materials Research Society.
Series: Materials Research Society symposium proceedings,; v. 208; Materials Research Society symposia proceedings ;; v. 208.
Publisher: Materials Research Society
Published: 1991
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 367
Subjects: Thin films -- Surfaces -- Congresses.; Thin films -- Optical properties -- Congresses.; Diffraction -- Congresses.
Notes: Includes bibliographical references and indexes.