Boundary-scan test
Subtitle: a practical approach
By: by Harry Bleeker, Peter van den Eijnden, and Frans de Jong.
Contributors: Eijnden, Peter van den.; Jong, Frans de.
Publisher: Kluwer Academic Publishers
Published: 1993
Place of publication: Dordrecht; Boston
Language: eng
Number of pages: 225
Subjects: Boundary scan testing; Printed circuits -- Design and construction
Notes: Includes bibliographical references (p. 219-222) and index.