Method to determine the quality of sapphire
By: M.T. Duffy... [et al.] ; supported by the Defense Advanced Research Projects Agency.
Contributors: Duffy, M. T.; National Bureau of Standards.; Defense Advanced Research Projects Agency.
Series: Semiconductor measurement technology; NBS special publication -- 400-62
Publisher: National Bureau of Standards
Published: 1980
Place of publication: Washington, D.C
Language: eng