Dosimetry at interfaces
Subtitle: theoretical analysis and measurements by means of thermoluminescent LiF at plane interfaces between a low Z-material and Al, Cu, Sn or Pb irradiated with 100 to 200 kV roetgen radiation.
Series: Acta radiologica supplementum -- no. 332.; Acta radiologica supplementum -- 332.
Publisher: [Acta Radiologica]
Published: 1973
Place of publication: Stockholm
Language: eng
Number of pages: 64
Subjects: Radiation -- Dosage.
Notes: Bibliography: p. 61-64.