IEEE International Workshop on IDDQ Testing
Subtitle: digest of papers, November 5-6, 1997, Washington, D.C.
By: edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.
Contributors: Jayasumana, Anura P.; IEEE Computer Society. Technical Test Technology Committee.
Publisher: IEEE Computer Society Press
Published: 1997
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 119
Subjects: Iddq testing -- Congresses.; Metal oxide semiconductors, Complementary -- Testing -- Congresses.
Other titles: IDDQ testing
Notes: Includes bibliographic references and index.
"IEEE Computer Society order number PR08123"--T.p. verso.
"IEEE order plan catalog number 97TB100169"--T.p. verso.