Rapid Reliability Assessment of VLSICs
By: by A. P. Dorey, B. K. Jones, A. M. D. Richardson, Y. Z. Xu
Contributors: Jones, B. K.; Richardson, A. M. D.; Xu, Y. Z.
Publisher: Springer US
Published: 1990
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
Number of pages: 212
ISBN-13: 9781461278795; 9781461305873
Subjects: Engineering; Computer engineering; Optical materials
Notes: Online full text is restricted to subscribers.

Also available in print.

Mode of access: World Wide Web.