Object detection, classification, and tracking technologies
Subtitle: 22-24 October 2001, Wuhan, China
By: Jun Shen, Sharatchandra Pankanti, Runsheng Wang, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III (France) ... [et al.] ; supported by National Natural Science Foundation of China [and] Ministry of Education of China.
Contributors: Shen, Jun.; Pankanti, Sharath.; Wang, Runsheng.; Society of Photo-optical Instrumentation Engineers.; Hua zhong gong xue yuan.; Université de Bordeaux III.; Guo jia zi ran ke xue ji jin wei yuan hui (China); China. Jiao yu bu.
Series: SPIE proceedings series ;; v. 4554; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4554.
Publisher: SPIE
Published: 2001
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 298
Subjects: Optical pattern recognition -- Congresses.; Pattern recognition systems -- Congresses.; Automatic tracking -- Congresses.; Image processing -- Congresses.; Detectors -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.