Nadezhnostʹ tverdykh integralʹnykh skhem
By: I.E. Efimov, I.G. Kalʹman, V.I. Martynov.
Contributors: Kalʹman, I. G.; Martynov, V. I.
Edition: Izd. 2-e, ispr. i dop.
Publisher: Izd-vo standartov
Published: 1979
Place of publication: Moskva
Language: rus
Number of pages: 216
Subjects: Integrated circuits -- Reliability.; Semiconductors -- Reliability.
Notes: Bibliography: p. 210-215.