13th IEEE VLSI Test Symposium
Subtitle: April 30-May 3, 1995, Princeton,  New Jersey : proceedings
By: sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE Computer Society Press
Published: 1995
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 493
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Other titles: Thirteenth IEEE VLSI Test Symposium
Notes: Includes  bibliographical references and index.