Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits
Subtitle: Ipfa 2001 (IEEE Conference Proceedings)
Publisher: Ieee
Published: December 2001
Language: eng
Format: Paperback
Number of pages: 262
ISBN-13: 9780780366756
Subjects: Circuits & components; Reliability Engineering; Technology; Science/Mathematics; Electronics - Circuits - Integrated; Quality Control; Congresses; Defects; Integrated Circuits; Testing