1997 IEEE International Conference on Microelectronics Test Structures Proceedings
Subtitle: March 17-20, 199Y, Monterey, California
Contributors: IEEE Industry Applications Society (Editor)
Publisher: Institute of Electrical & Electronics Enginee
Published: April 1997
Language: eng
Format: Paperback
Number of pages: 225
ISBN-13: 9780780332430
Subjects: Electronic devices & materials; Engineering measurement & calibration; Electronic Measurements; Microelectronics; Technology & Engineering; Technology & Industrial Arts; Science/Mathematics; Electricity; Engineering - Electrical & Electronic; Electronics - Microelectronics