Proceedings, International Test Conference 1998.
Publisher: International Test Conference
Published: 1998
Place of publication: Washington, DC
Language: eng
Number of pages: 1179
Subjects: Integrated circuits -- Testing -- Congresses.; Microprocessors -- Testing -- Congresses.; Embedded computer systems -- Testing -- Congresses.
Genres: Congresses.
Other titles: 1998 IEEE International Test Conference; International Test Conference 1998
Notes: Includes bibliographical references and index.