A specification-based coverage metric to evaluate test sets
By: Paul E. Ammann, Paul E. Black
Contributors: Black, Paul E; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6403
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1999
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 27
Subjects: Software measurement; Computer software -- Testing -- Evaluation
Other titles: Specification based coverage metric to evaluate test sets
Notes: Shipping list no.: 2000-0148-M

"October 1999."

Includes bibliographical references (p. 21-24)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1999] 1 microfiche : negative.