CMOS SRAM circuit design and parametric test in nano-scaled technologies
Subtitle: process-aware SRAM design and test
By: Andrei Pavlov, Manoj Sachdev.
Contributors: Sachdev, Manoj.
Series: Frontiers in electronic testing -- 40
Publisher: Springer
Published: 2008
Place of publication: [Dordrecht]
Language: eng
Number of pages: 193
ISBN-13: 9781402083624; 9781402083631
Subjects: Metal oxide semiconductors, Complementary -- Design; Random access memory; Nanoelectronics
Notes: Includes bibliographical references and index.