ITC
Subtitle: International Test Conference 2000 : proceedings International Test Conference 2000 : [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]
By: sponsored by IEEE Computer Society Test Technology Technical Council, and IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: International Test Conference; IEEE
Published: 2000
Place of publication: Washington, D.C; Piscataway, New Jersey
Language: eng
Number of pages: 1158
Subjects: Electronic digital computers -- Circuits -- Testing -- Congresses.; Integrated circuits -- Testing -- Congresses.; Radio frequency -- Congresses.; Telecommunication -- Congresses.
Genres: Congresses.
Other titles: 2000 IEEE International Test Conference; Proceedings International Test Conference 2000
Notes: Cover title.

"IEEE Catalog Number 00CH37159"--verso of T.p.

Includes bibliographical references and author index.