A class of high-resolution explicit and implicit shock-capturing methods
By: H.C. Yee.
Contributors: Ames Research Center.
Series: NASA technical memorandum -- 101088.; Von Karman Institute for Fluid Dynamics lecture series -- 1989-04.; Lecture series (Von Karman Institute for Fluid Dynamics) -- 1989-4.
Publisher: National Aeronautics and Space Administration, Ames Research Center; For sale by the National Technical Information Service
Published: 1989
Place of publication: Moffett Field, Calif; [Springfield, Va
Language: eng
Format: Microform
Subjects: Shock (Mechanics); Fluid dynamic measurements.
Other titles: Class of high resolution explicit and implicit shock-capturing methods.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1989. 3 microfiches.