2003 GaAs Reliability Workshop
Subtitle: proceedings : November 9, 2003, San Diego, California
By: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.
Contributors: JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.; IEEE Electron Devices Society.; IEEE Xplore (Online service)
Publisher: JEDEC; IEEE
Published: 2003
Place of publication: Arlington, Va; Piscataway, N.J
Language: eng
Format: Electronic resource
Number of pages: 156
ISBN-13: 9780790801049
Subjects: Gallium arsenide semiconductors -- Congresses; Semiconductors -- Reliability -- Congresses; Semiconductors -- Materials -- Congresses
Genres: Congresses.
Other titles: GaAs Reliability Workshop.
Notes: "IEEE Catalog Number: 03TH8723"--T.p. verso.

Includes bibliographical references.

Electronic reproduction. New York, N.Y. : IEEE, 2004. System requirements: Adobe Acrobat Reader. Mode of access: World Wide Web. Made available through IEEE Xplore under title: GaAs Reliability Workshop, 2003, Proceedings.