MOS1
Subtitle: a program for two-dimensional analysis of Si MOSFETs
By: Charles L. Wilson and James L. Blue.
Contributors: Blue, J. L.
Series: NBS special publication -- 400-77.; Semiconductor measurement technology
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; for sale by the Superintendent of Documents, U.S. G.P.O.
Published: 1985
Place of publication: Gaithersburg, Md; Washington, D.C
Language: eng
Format: Microform
Number of pages: 55
Subjects: Metal oxide semiconductors -- Testing.
Notes: Microfiche. Washington, D.C. : U.S. G.P.O., 1985. 1 microfiche ; 11 x 15 cm.