1994 International Integrated Reliability Workshop Final Report
Subtitle: Stanford Sierra Camp Lake Tahoe, California October 16-19, 1994
Publisher: IEEE Electron Devices Society
Published: December 1995
Language: eng
Format: Paperback
Number of pages: 155
ISBN-13: 9780780319080
Subjects: Circuits & components; Reliability Engineering; Technology & Industrial Arts; Computer Books: General; Wafer scale integration; Electronics - Semiconductors; Congresses; Integrated Circuits; Reliability