Method to determine the quality of sapphire
By: M. T. Duffy, RCA Laboratories ... [et al.]
Contributors: Duffy, M. T; RCA Laboratories
Series: Semiconductor measurement technology; NBS special publication ; 400-62; NBS special publication -- 400-62
Publisher: Dept. of Commerce, National Bureau of Standards: for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1980
Place of publication: Washington
Language: eng
Number of pages: 61
Subjects: Sapphires -- Testing
Notes: Issued Aug. 1980

Includes bibliographical references