CMOS circuit design, layout, and simulation
By: R. Jacob Baker, Harry W. Li, and David E. Boyce.
Contributors: Li, Harry W., 1960-; Boyce, David E., 1940-
Series: IEEE Press series on microelectronic systems
Publisher: IEEE Press
Published: 1997
Place of publication: New York
Language: eng
Number of pages: 902
Subjects: Metal oxide semiconductors, Complementary -- Design and construction.; Integrated circuits -- Design and construction.; Metal oxide semiconductor field-effect transistors.
Notes: Includes bibliographical references and index.