Reliability growth during a development testing program
By: by Richard E. Barlow and E.M. Scheuer.
Contributors: Scheuer, Ernest M. 1930-.
Series: Research memorandum ; RM-4317-1; Research memorandum (Rand Corporation) -- RM-4317-1..
Published: 1965
Place of publication: Santa Monica, Calif. : Rand Corporation
Language: eng
Number of pages: 17
Subjects: Reliability (Engineering)