Advances in Imaging and Electron Physics, Volume 110 (Advances in Imaging and Electron Physics)
Contributors: Peter W. Hawkes (Editor); Benjamin Kazan (Series Editor); Tom Mulvey (Series Editor)
Publisher: Academic Press
Published: September 8, 1999
Language: eng
Format: Hardcover
Number of pages: 178
ISBN-13: 9780120147526
Subjects: Applied optics; Microscopy; Electronic Engineering (General); Technology; Science; Science/Mathematics; Engineering - Electrical & Electronic; Physics; Technology / Engineering / Electrical; Imaging Systems
First sentence: Optical imaging techniques for the submicrometer range are important for the surface analysis of thin films, macromolecular systems, and optical information storage.