Optical metrology for industrialization of optical information processing
By: David Casasent, C.L. Wilson
Contributors: Wilson, C. L. 1942-; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6060
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1997
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 12
Subjects: Optical data processing; Optical pattern recognition; Information storage and retrieval systems
Notes: Shipping list no.: 98-0569-M

"September, 1997."

Includes bibliographical references (p. 11-12)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative

s 1998 dcu n b