1997 IEEE International Integrated Reliability Workshop Final Report
Subtitle: Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
Publisher: Institute of Electrical & Electronics Enginee
Published: December 1997
Language: eng
Format: Paperback
Number of pages: 161
ISBN-13: 9780780342057
Subjects: Electronics engineering; Reliability engineering; Wafer-scale integration; Microelectronics; Electronic Measurements; Technology; Technology & Industrial Arts; Science/Mathematics; Reliability; Electronics - Circuits - General; Electronics - Microelectronics; Engineering - Electrical & Electronic; Congresses; Integrated circuits