Comprehensive compact noise modeling of nanoscale CMOS devices
By: by Jonghwan Lee
Published: 2003
Language: eng
Number of pages: 207
Subjects: Complementary Metal oxide semiconductors; Electronic circuits; Noise; Metal oxide semiconductor field-effect transistors
Notes: Printout.

Vita.

Thesis (Ph. D.)--University of Florida, 2003.

Includes bibliographical references.

Adviser: G. Bosman.