Sensors and controls for intelligent machining, agile manufacturing, and mechatronics
Subtitle: 4-5 November 1998, Boston, Massachusetts
By: Patrick F. Muir, Peter E. Orban, chairs/editors ; sponsored by SPIE--The International Society for Optical Engineering ; endorsed by SME--The Society of Manufacturing Engineers.
Contributors: Muir, Patrick F.; Orban, Peter E.; Society of Photo-optical Instrumentation Engineers.; Society of Manufacturing Engineers.
Series: SPIE proceedings series ;; v. 3518; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3518.
Publisher: SPIE
Published: 1998
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 312
Subjects: Process control -- Automation -- Congresses.; Intelligent control systems -- Congresses.; Optical detectors -- Industrial applications -- Congresses.; Mechatronics -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.