Physics of SiO2 and Its Interfaces
Subtitle: Proceedings of the International Topical Conference on the Physics of SiO2 and Its Interfaces Held at the IBM Thomas J. Waston Research Center, Yorktown Heights, New York, March 22-24 1978
Publisher: Elsevier Science & Technology Books
Published: 2013
Language: eng
ISBN-13: 9781483139005