Developments in X-ray tomography II
Subtitle: 22-23 July, 1999, Denver, Colorado
By: Ulrich Bonse, chair/editor ; sponsored and published by SPIE--The International Society for Optical Engineering.
Contributors: Bonse, U.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 3772; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3772.
Publisher: SPIE
Published: 1999
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 340
Subjects: Tomography -- Congresses.; X-rays -- Congresses.; Diagnostic imaging -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and author index.