Machine vision and three-dimensional imaging systems for inspection and metrology II
Subtitle: 29-30 October 2001, Boston, [Massachusetts] USA
By: Kevin G. Harding, John W.V. Miller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Harding, Kevin G.; Miller, John W. V.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 4567; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4567.
Publisher: SPIE
Published: 2002
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 236
Subjects: Computer vision -- Congresses.; Computer vision -- Industrial applications -- Congresses.; Three-dimensional display systems -- Congresses.; Quality control -- Optical methods -- Congresses.; Metrology -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and author index.