A measurement method for determining the optical and electro-optical properties of a thin film
By: by Donald R. Larson
Contributors: United States. National Bureau of Standards
Series: NBSIR -- 81-1652
Publisher: U.S. Dept. of Commerce, National Bureau of Standards
Published: 1982
Place of publication: Boulder, Colo
Language: eng
Number of pages: 60
Subjects: Thin films -- Electric properties -- Measurement; Thin films -- Optical properties -- Measurement
Notes: Distributed to depository libraries in microfiche

"December 1981."

Includes bibliographical references