X-ray topography
By: David R. Black, Gabrielle G. Long
Contributors: Long, Gabrielle G.; National Institute of Standards and Technology (U.S.)
Series: NIST recommended practice guide; Special publication -- 960-10; NIST recommended practice guide; NIST special publication -- 960-10.
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 2004
Place of publication: Gaithersburg, Md.]
Language: eng
Format: [electronic resource] /
Number of pages: 46
Subjects: X-rays; Diffraction; X-ray crystallography
Notes: Title from title screen (viewed on Nov. 2, 2011).

"April 2004."

Includes bibliographical references (p. 43-46).