Logic-timing Simulation And the Degradation Delay Model
Publisher: Imperial College Press; World Scientific Publishing Co Pte Ltd
Published: February 14, 2006
Language: eng
Format: Hardcover
Number of pages: 267
ISBN-13: 9781860945892
Subjects: Computer modelling & simulation; Technology & Industrial Arts; Engineering - Electrical & Electronic; Technology; Science/Mathematics; Computer Engineering; Integrated circuits; Metal oxide semiconductors, Complementary; Timing circuits; Very large scale integration
First sentence: The design process of VLSI integrated circuits has different options and many stages.