CRRES micro-electronics package flight data analysis
By: E. G. Stassinopoulos, G. J. Brucker and C. A. Stauffer.
Contributors: Brucker, G. J.; Stauffer, C. A.; Goddard Space Flight Center
Publisher: Goddard Space Flight Center
Published: 1993
Place of publication: Greenbelt, Md
Number of pages: 66
Subjects: Electronic equipment tests; Radiation effects
Notes: Includes bibliographical references; p. 26.