Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Subtitle: IPFA 2004 : [July 5-8, 2004, Taiwan]
By: edited by Steve S. Chung ... [et al.] ; organised by IEEE ED Taipei Chapter ... [et al.] ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Singapore Chapter.
Contributors: Chung, Steve S.; IEEE Electron Devices Society. Taipei Chapter.; IEEE Electron Devices Society.; IEEE Reliability/CPMT/ED Singapore Chapter.
Publisher: IEEE
Published: 2004
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 326
Subjects: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Reliability -- Congresses.
Genres: Congresses.
Other titles: Physical & failure analysis of integrated circuits; IPFA 2004 proceedings; 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits 2004
Notes: Includes bibliographical references and author index.
"IEEE Catalog Number 04TH8743"--T.p. verso.