Formal equivalence checking and design debugging
By: by Shi-Yu Huang and Kwang-Ting (Tim) Cheng.
Contributors: Cheng, Kwang-Ting, 1961-
Series: Frontiers in electronic testing
Publisher: Kluwer Academic Publishers
Published: 1998
Place of publication: Boston
Language: eng
Number of pages: 229
Subjects: Integrated circuits -- Verification; Electronic circuit design -- Data processing; Application specific integrated circuits -- Design and construction
Notes: Includes bibliographical references (p. [211-222) and index.