Proceedings
Subtitle: first Asian Test Symposium (ATS '92), November 26-27, 1992, Hiroshima, Japan
By: sponsored by The IEEE Computer Society Test Technology Technical Committee, in cooperation with Special Interest Group on Design Automation, Information Processing Society of Japan ; Technical Group on Fault Tolerant Systems IEICI ; Japan Society for the Promotion of Science, 132nd Committee (Electron and Ion Beam Science and Technology).
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Jōhō Shori Gakkai (Japan). Special Interest Group on Design Automation.; Denshi Jōhō Tsūshin Gakkai (Japan). Technical Group on Fault Tolerant Systems.; Nihon Gakujutsu Shinkōkai (Japan). 132nd Committee (Electron and Ion Beam Science and Technology).
Publisher: IEEE Computer Society Press
Published: 1992
Place of publication: Los Alamitos, CA; Tokyo
Language: eng
Number of pages: 259
Subjects: Electronic digital computers -- Testing -- Congresses.; Electronic digital computers -- Reliability -- Congresses.; Testing -- Congresses.
Other titles: First Asian Test Symposium.
Notes: "IEEE catalog number 92TH0458-0."

Includes bibliographical references.