Analiz nadezhnosti mikroėlektronnykh sistem pri avtomatizirovannom proektirovanii
By: V.N. Bri͡unin, M.Kh. Bulatov.
Contributors: Bulatov, M. Kh.
Publisher: "Radio i svi͡azʹ"
Published: 1984
Place of publication: Moskva
Language: rus
Number of pages: 214
Subjects: Microelectronics -- Reliability.
Notes: Bibliography: p. 210-[213]