Measuring market risk with value at risk
By: Pietro Penza, Vipul Bansal.
Contributors: Bansal, Vipul K.
Series: Wiley series in financial engineering
Publisher: John Wiley
Published: 2001
Place of publication: New York
Language: eng
Number of pages: 302
Subjects: Financial futures.; Risk management.
Notes: Includes bibliographical references and index.