Analog signal generation for built-in-self-test of mixed-signal integrated circuits
By: by Gordon W. Roberts, Albert K. Lu.
Contributors: Lu, Albert K., 1969-
Series: The Kluwer international series in engineering and computer science ;; SECS 312.; Analog circuits and signal processing; Kluwer international series in engineering and computer science ;; SECS 312.; Kluwer international series in engineering and computer science.
Publisher: Kluwer Academic Publishers
Published: 1995
Place of publication: Boston
Language: eng
Number of pages: 122
Subjects: Signal generators -- Design and construction; Integrated circuits -- Design and construction; Integrated circuits -- Testing; Signal processing -- Digital techniques; Mixed signal circuits -- Design and construction
Notes: Includes bibliographical references (p. 117-119) and index.