Applied logistic regression
By: David W. Hosmer, Jr., Stanley Lemeshow.
Contributors: Lemeshow, Stanley.
Series: Wiley series in probability and mathematical statistics.
Publisher: Wiley
Published: 1989
Place of publication: New York
Language: eng
Number of pages: 307
Subjects: Regression analysis
Notes: Includes bibliographical references (p. 291-300) and index.
"A Wiley-Interscience publication."