Test load verification through strain data analysis
By: V. Verderaime and F. Harrington.
Contributors: Harrington, F.; George C. Marshall Space Flight Center.
Series: NASA technical paper -- 3558.
Publisher: National Aeronautics and Space Administration, Marshall Space Flight Center; National Technical Information Service, distributor
Published: 1995
Place of publication: MSFC, Ala; [Springfield, Va
Language: eng
Format: Microform
Subjects: Compression loads.; Criteria.; Elastic bending.; Fracturing.; Inelastic stress.; Polycrystals.; Proving.; Safety factors.; Static tests.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 95-0744-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.