Latchup in CMOS technology
Subtitle: the problem and its cure
By: by Ronald R. Troutman.
Series: The Kluwer international series in engineering and computer science.
Publisher: Kluwer Academic Publishers
Published: 1986
Place of publication: Boston
Language: eng
Number of pages: 242
Subjects: Metal oxide semiconductors, Complementary -- Defects.; Metal oxide semiconductors, Complementary -- Reliability.
Notes: Bibliography: p. [217]-225.
Includes index.