Proceedings
By: ATE West, Automated Testing for Electronics Manufacturing Conference, January 10-13, 1983, Anaheim Convention Center, Anaheim, CA ; sponsored by Electronics test.
Publisher: Morgan-Grampian Pub. Co.
Published: 1983
Place of publication: New York, NY (2 Park Ave., New York 10016)
Language: eng
Number of pages: 300
Subjects: Electronic apparatus and appliances -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Other titles: Electronics test.
Notes: Includes bibliographical references.