Lightmetry
Subtitle: metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland
By: Maksymilian Pluta, editor ; Mariusz Szyjer, Ewa Powichrowska, coeditors ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland).
Contributors: Pluta, Maksymilian.; Szyjer, Mariusz.; Powichrowska, Ewa.; Society of Photo-optical Instrumentation Engineers.; Society of Photo-optical Instrumentation Engineers. Poland Chapter.; Institute of Applied Optics (Poland); Komitet Badań Naukowych (Poland)
Series: SPIE Poland Chapter proceedings ;; 58; SPIE proceedings series,; v. 4517; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4517.
Publisher: SPIE
Published: 2001
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 302
Subjects: Light -- Congresses; Polarization (Light) -- Congresses; Optical measurements -- Congresses; Optical detectors -- Congresses; Mensuration -- Congresses
Genres: Congresses.
Other titles: Metrology, spectroscopy, and testing techniques using light
Notes: Includes bibliographical references and index.