Latch-up and radiation integrated circuit -- LURIC
Subtitle: a test chip for CMOS latch-up investigation
By: Donald B. Estreich, Computer-Aided Design Division 2113, Sandia Laboratories ; prepared by Sandia Laboratories for the United States Department of Energy.
Contributors: United States. Dept. of Energy.; Sandia Laboratories.; Sandia Laboratories. Computer-Aided Design Division 2113.
Series: SAND ; 78-1540; SAND (Series) (Albuquerque, N.M.) -- 78-1540.
Publisher: Dept. of Energy, Sandia Laboratories; for sale by the National Technical Information Service]
Published: 1978
Place of publication: Albuquerque, N.M; [Springfield, Va
Language: eng
Number of pages: 74
Subjects: Integrated circuits -- Testing.
Notes: Contract AT(29-1)-789.

Nov. 1978.

Includes bibliographical references.