Recent advances in X-ray characterization of materials
By: edited by P. Kreshna.
Contributors: Krishna, P.
Edition: 1st ed.
Series: Progress in crystal growth and characterization,; v. <18   >
Publisher: Pergamon Press
Published: 1900
Place of publication: Oxford; New York
Language: eng
Number of pages: 278
Subjects: X-ray crystallography.
Notes: Includes bibliographical references.