Matching properties of deep sub-micron MOS transistors
By: by Jeroen A. Croon, Willy Sansen and Herman E. Maes.
Contributors: Sansen, Willy M. C.; Maes, H. E.
Series: The Kluwer international series in engineering and computer science,; 851
Publisher: Springer
Published: 2005
Place of publication: New York
Language: eng
Number of pages: 206
Subjects: Metal oxide semiconductor field-effect transistors
Notes: Includes bibliographical references (p. [193]-203).