Neural models and algorithms for digital testing
By: by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell.
Contributors: Agrawal, Vishwani D., 1943-; Bushnell, Michael L. 1950-
Series: The Kluwer international series in engineering and computer science ;; SECS 140.; VLSI, computer architecture, and digital signal processing; Kluwer international series in engineering and computer science ;; SECS 140.; Kluwer international series in engineering and computer science.
Publisher: Kluwer Academic Publishers
Published: 1991
Place of publication: Boston
Language: eng
Number of pages: 184
Subjects: Logic circuits -- Testing.; Automatic test equipment.; Digital integrated circuits -- Testing -- Data processing.
Notes: Includes bibliographical references and index.