Proceedings
Subtitle: International Test Conference, 1994.
Contributors: Institute of Electrical and Electronics Engineers. Philadelphia Section.; IEEE Computer Society. Test Technology Technical Committee.
Publisher: The Conference
Published: 1994
Place of publication: Altoona, PA
Language: eng
Number of pages: 1033
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.
Other titles: Proceedings International Test Conference, 1994.; IEEE International Test Conference, 1994.; TEST, The Next 25 Years.
Notes: Cover title: TEST, The Next 25 Years.

Spine title, IEEE International Test Conference, 1994.

"IEEE catalog number 94CH34835, IEEE Computer Society Press order number 6802-02"--T.p. verso.

Includes bibliographical references and index.