Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001
Subtitle: [9-13 July, 2001, the Westin Stamford & Westin Plaza, Singapore]
By: edited by Wilson Tan ... [et al.] ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter ... [et al.].
Contributors: Tan, Wilson.; IEEE Singapore Section. Reliability/CPMT/EDA Chapter.
Publisher: IEEE
Published: 2001
Place of publication: Piscataway, New Jersey
Language: eng
Number of pages: 262
Subjects: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing -- Congresses.
Genres: Congresses.
Other titles: Physical & failure analysis of integrated circuites; 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits; IPFA 2001
Notes: "IPFA 2001 Proceedings"--Cover.

"IEEE Catalog Number 01TH8548"--verso of T.p.

Includes bibliographic references and author index.

Also available via the World Wide Web.