Oxide reliability
Subtitle: a summary of silicon oxide wearout, breakdown, and reliability
By: editor, D.J. Dumin.
Contributors: Dumin, D. J.
Series: Selected topics in electronics and systems -- v. 23
Publisher: World Scientific
Published: 2002
Place of publication: [River Edge, NJ]
Language: eng
Number of pages: 270
Subjects: Metal oxide semiconductors -- Reliability.; Silicon oxide -- Deterioration.
Notes: Includes bibliographical references.