Hot-carrier effects in MOS devices
By: Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada.
Contributors: Yang, C. Y.-W. 1948-; Miura-Hamada, Akemi.
Publisher: Academic Press
Published: 1995
Place of publication: San Diego
Language: eng
Number of pages: 312
Subjects: Metal oxide semiconductors.; Hot carriers.
Notes: Includes bibliographical references (p. 187-301) and index.