Assessing fault model and test quality
By: by Kenneth M. Butler and M. Ray Mercer.
Contributors: Mercer, Melvin Ray.
Series: The Kluwer international series in engineering and computer science ;; SECS 157.; VLSI, computer architecture, and digital signal processing; Kluwer international series in engineering and computer science ;; SECS 157.; Kluwer international series in engineering and computer science.
Publisher: Kluwer Academic
Published: 1992
Place of publication: Boston
Language: eng
Number of pages: 132
Subjects: Digital integrated circuits -- Testing.; Integrated circuits -- Fault tolerance.
Notes: Includes bibliographical references (p. [109]-125) and index.