Spatially resolved characterization of local phenomena in materials and nanostructures
Subtitle: symposium held December 2-6, 2002, Boston, Massachusetts, U.S.A.
By: editors, Javier Piqueras ... [et al.].
Contributors: Piqueras, Javier.; Materials Research Society.
Series: Materials Research Society symposium proceedings ;; v. 738; Materials Research Society symposia proceedings ;; v. 738.
Publisher: Materials Research Society
Published: 2003
Place of publication: Warrendale, Pa
Language: eng
Number of pages: 425
Subjects: Nanostructured materials -- Congresses.; Semiconductors -- Characterization -- Congresses.; Scanning probe microscopy -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and indexes.