Speckle metrology 2003
Subtitle: proceedings : 18-20 June, 2003, Trondheim, Norway
By: editors, Kay Gastinger, Ole Johan Løkberg, Svein Winther ; sponsored and organized by SINTEF (Norway), NTNU--Norwegian University of Science and Technology (Norway) ; cooperating organizations, SPIE--the International Society for Optical Engineering, EOS--European Optical Society.
Contributors: Gastinger, Kay.; Løkberg, Ole Johan.; Winther, Svein.; SINTEF-gruppen (Norway); Norges teknisk-naturvitenskapelige universitet.; Society of Photo-optical Instrumentation Engineers.; European Optical Society.
Series: SPIE,; v. 4933; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4933.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 390
Subjects: Speckle -- Congresses.; Speckle metrology -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and author index.