X-ray multilayers for diffractometers, monochromators, and spectrometers
Subtitle: 17-19 August 1988, San Diego, California
By: Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.].
Contributors: Christensen, Finn E., 1954-; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 984; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 984.
Publisher: The Society
Published: 1988
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 271
Subjects: Thin films, Multilayered -- Congresses.; X-rays -- Congresses.; Monochromator -- Surfaces -- Congresses.; Spectrometer -- Surfaces -- Congresses.; X-ray diffractometer -- Surfaces -- Congresses.
Notes: Includes bibliographies and index.