Microprocessor board testability
Subtitle: a comprehensive set of design guidelines to enhance the testability of LSI printed circuit boards
By: by Jon Turino with David Mei.
Contributors: Mei, David.; Logical Solutions, inc.
Publisher: Logical Solutions, inc.
Published: 1980
Place of publication: Campbell, CA
Language: eng
Number of pages: 110
Subjects: Printed circuits -- Design and construction.; Printed circuits -- Testing.; Integrated circuits -- Large scale integration.