Next generation HALT and HASS
Subtitle: robust design of electronics and systems
By: by Kirk Gray, John James Paschkewitz
Contributors: Paschkewitz, John James, author
Publisher: John Wiley & Sons
Published: 2016
Place of publication: Chichester, UK; Hoboken, NJ
Language: eng
ISBN-13: 9781118700235
Subjects: Testing; Accelerated life testing; Electronic systems; Design and construction
Notes: Includes bibliographical references and index.
Table of contents: title: Basis and limitations of typical current reliability methods & metrics; title: The need for reliability assurance metrics to change; title: Challenges to advancing electronics reliability engineering; title: A new deterministic reliability development paradigm; title: Common understanding of HALT approach is critical for success; title: The fundamentals of HALT; title: Highly accelerated stress screening (HALT) and audits (HASA); title: HALT benefits for software/firmware performance and reliability; title: Quantitative accelerated life test; title: Failure analysis and corrective action; title: Additional applications of HALT methods.