Analyse von Si Oberflächen durch Rutherford-Rückstreuung
By: Hans Harald Hubbes.
Series: Wissenschaftliche Reihe ;; Bd. 18; Wissenschaftliche Reihe (Bielefeld, Germany) ;; Bd. 18.
Publisher: B. Kleine
Published: 1983
Place of publication: Bielefeld
Language: ger
Number of pages: 176
Subjects: Surfaces (Physics) -- Effect of radiation on.; Silicon -- Surfaces -- Analysis.; X-rays -- Scattering.; Surface chemistry.
Notes: Includes bibliographies.