Machine vision applications in industrial inspection
Subtitle: 3-4 February 1993, San Jose, California
By: Frederick Y. Wu, Benjamin M. Dawson, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
Contributors: Wu, Frederick Y.; Dawson, Benjamin M.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 1907; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1907.
Publisher: SPIE
Published: 1993
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 272
Subjects: Quality control -- Optical methods -- Automation -- Congresses.; Computer vision -- Industrial applications -- Congresses.
Notes: Includes bibliographical references and index.