Purity control of semiconductors by the method of capacitance transient spectroscopy
By: L.S. Berman.
Publisher: "Electronic Integral Systems"
Published: 1995
Place of publication: St. Petersburg
Language: eng
Number of pages: 113
Subjects: Semiconductors -- Quality control.; Semiconductors -- Impurity distribution.; Semiconductors -- Spectra.
Notes: Translation from the Russian language.