Polarization analysis, measurement, and remote sensing III
Subtitle: 2-4 August 2000, San Diego, USA
By: David B. Chenault ... [et al.], chairs/editors ; sponsored ... by SPIE--The International Society for Optical Engineering ; cooperating organization, the Remote Sensing Society.
Contributors: Chenault, David B.; Society of Photo-optical Instrumentation Engineers.; Remote Sensing Society
Series: SPIE proceedings series,; v. 4133; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4133.
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 302
Subjects: Polarimetry -- Congresses.; Remote sensing -- Congresses.; Electrooptics -- Congresses.
Genres: Congresses.
Other titles: Polarization analysis and measurement.
Notes: Includes bibliographic references and index.
Previous conferences entitled: Polarization analysis and measurement.