Detectors and associated signal processing
Subtitle: 1-2 October 2003, St. Etienne, France
By: Jean-Pierre Chatard, Peter N.J. Dennis, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, EOS--European Optical Society, GIFO--Groupement des Industries Française d'Optique, [and] SFO--Société Française d'Optique.
Contributors: Chatard, Jean-Pierre.; Dennis, P. N. J.; Society of Photo-optical Instrumentation Engineers.; European Optical Society.; Groupement des industries française d'optique.; Société française d'optique.
Series: SPIE proceedings series,; v. 5251; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5251.
Publisher: SPIE
Published: 2004
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 334
Subjects: Infrared detectors -- Technological innovations -- Congresses.; Optical detectors -- Technological innovations -- Congresses.; Silicon diodes -- Technological innovations -- Congresses.; Infrared imaging -- Congresses.; Signal processing -- Congresses.; Thermography -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.