X-ray microscopy and spectromicroscopy
Subtitle: statue report from the fifth international conference, Würzburg, August 19-23, 1996
By: Jürgen Thieme ... [et al.], (eds.).
Contributors: Thieme, Jürgen.; International Conference of X-Ray Microscopy and Spectromicroscopy (1996 : Würzburg, Germany)
Publisher: Springer
Published: 1998
Place of publication: Berlin; New York
Language: eng
Subjects: X-ray microscopy -- Congresses.
Notes: Based on presentation to the International Conference of X-Ray Microscopy and Spectromicroscopy, XRM 96, which took place in Würzburg, August 19-23, 1996.
System requirements for accompanying computer disc: Windows 3.1; Windows 95; Windows NT; Macintosh.