Failure analysis of integrated circuits
Subtitle: tools and techniques
By: edited by Lawrence C. Wagner.
Contributors: Wagner, Lawrence C.
Publisher: Kluwer Academic Publishers
Published: 1999
Place of publication: Boston, Mass
Language: eng
Number of pages: 255
Subjects: Semiconductors -- Failures; Integrated circuits -- Testing; Integrated circuits -- Reliability
Notes: Includes bibliographical references and index.
"SECS 494"--P. [4] of cover.