Stress and Strain in Epitaxy
Subtitle: Theoretical Concepts, Measurements and Applications
Contributors: Hanbu cken, M.
Publisher: Elsevier
Published: 2001
Place of publication: Burlington
Language: eng
Format: [electronic resource] :
Number of pages: 333
ISBN-13: 9780080541860
Subjects: Epitaxy; Congresses. Strains and stresses; Congresses; Strains and stresses
Description: This book contains keynote lectures which have been delivered at the 3rd Porquerolles' School on Surface Science, SIR2000 (Surfaces-Interfaces-Relaxation). The aim of this school was to review the main concepts necessary to understand the role of interfacial stress, strain and relaxation in crystal growth by heteroepitaxy. By bringing together scientists from various fields (physics, chemistry, materials science and engineering) which daily use complementary methodological approaches (experiment, theory, modelization), the school allowed to offer 11 multidisciplinary courses. This book address.
Notes: Description based on print version record.
Table of contents: title: Front Cover; Stress and Strain in Epitaxy: theoretical concepts, measurements and applications; Copyright Page; Foreword; Organizers and Sponsors; Contents; Chapter 1. Introduction; Chapter 2. Some elastic effects in crystal growth; Chapter 3. Introduction to the atomic structure of surfaces: a theoretical point of view; Chapter 4. Dislocations and stress relaxation in heteroepitaxial films; Chapter 5. An atomistic approach for stress relaxation in materials; Chapter 6. Ab initio study of the structural stability of thin films.; title: Chapter 7. Stress, strain and chemical reactivity: a theoretical analysisChapter 8. Strain measurements in ultra-thin films using RHEED and X-ray techniques; Chapter 9. Measurements of displacement and strain by high-resolution transmission electron microscopy; Chapter 10. Stress measurements of atomic layers and at surfaces; Chapter 11. STM spectroscopy on semiconductors; Chapter 12. Spatially resolved surface spectroscopy; Subject Index.