Image processing and pattern recognition in remote sensing, 25-27 October 2002, Hangzhou, China
By: Stephen G. Ungar, Shiyi Mao, Yoshifumi Yasuoka, chairs/editors.
Series: Proceedings of SPIE -- v.4898.
Publisher: SPIE Intl Soc Optical
Published: 2003
Place of publication: United States
Language: eng
Number of pages: 328