Interferometry XV
Subtitle: Applications : 2 and 4-5 August 2010, San Diego, California, United States
By: Cosme Furlong, Christophe Gorecki, Erik L. Novak, editors
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 7791; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7791.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819482877
Subjects: Industrial applications; Interferometry; Congresses; Metrology; Measurement
Other titles: Interferometry 15; Interferometry fifteen
Notes: Includes bibliographical references and index.