Dependence of resolution on specimen thickness in thermionic scanning transmission electron microscopy
By: by Donald McGillivray
Contributors: University of Alberta. Dept. of Physics
Published: 1977
Language: eng
Number of pages: 113
Subjects: Electron microscopy; Scanning electron microscopy; Thin films
Other titles: Resolution in thermionic S.T.E.M.
Notes: In partial fulfillment of the requirements for the degree of Master of Science. Department of Physics.

Spine title: Resolution in thermionic S.T.E.M.

Thesis (M.Sc.)--University of Alberta, 1977.