ATFA-77
Subtitle: advanced techniques in failure analysis : [proceedings]
By: /[sponsored by Institute of Electrical and Electronics Engineers, inc. ... et al.].
Contributors: Institute of Electrical and Electronics Engineers.
Publisher: IEEE
Published: 1977
Place of publication: [New York]
Language: eng
Number of pages: 345
Subjects: Electronic apparatus and appliances -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.
Other titles: Advanced techniques in failure analysis.
Notes: Includes bibliographical references and index.