Advances in X-Ray Analysis : Volume 17
Subtitle: Proceedings Of The Twenty-Second Annual Conference On Applications Of X-Ray Analysis Held In Denver, August 22-24, 1973
Publisher: Springer
Published: May 28, 2013
Format: paperback
Number of pages: 610
ISBN-13: 9781461399773
Notes: Source title: Advances in X-Ray Analysis: Volume 17: Proceedings Of The Twenty-Second Annual Conference On Applications Of X-Ray Analysis Held In Denver, August 22-24, 1973