Operational risk management
Subtitle: a practical approach to intelligent data analysis
By: edited by Ron S. Kenett, Yossi Raanan
Publisher: John Wiley & Sons
Published: 2010
Place of publication: Chichester; [Hoboken]
Language: eng
Number of pages: 336
ISBN-13: 9780470747483
Subjects: Risk management; Quality control; Information technology; Process control
Notes: Includes bibliographical references and index.