Physical aspects of electron microscopy and microbeam analysis
By: edited by Benjamin M. Siegel and D. R. Beaman.
Contributors: Beaman, Donald Robert, joint author.; Electron Microscopy Society of America.; Microbeam Analysis Society.
Publisher: Wiley
Published: 1975
Place of publication: New York
Language: eng
Number of pages: 474
Subjects: Electron microscopy.; Microprobe analysis.; Microchemistry.
Notes: Includes bibliographical references and index.
Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973.
"A Wiley biomedical-health publication."