Applications of X-Ray Topographic Methods to Materials Science
Edition: 1 edition
Publisher: Springer
Published: December 1, 1984
Language: eng
Format: Hardcover
Number of pages: 536
ISBN-13: 9780306418389
Subjects: Testing Of Materials; Technology; Science; Science/Mathematics; Material Science; Nanostructures; Technology / Material Science; Congresses; Industrial applications; Radiography, Industrial; X-rays