Noncontact Atomic Force Microscopy
By: edited by S. Morita, R. Wiesendanger, E. Meyer
Contributors: Wiesendanger, R.; Meyer, E.
Series: NanoScience and Technology, 1434-4904; Nanoscience and technology
Publisher: Springer Berlin Heidelberg; Imprint; Springer
Published: 2002
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] /
Number of pages: 439
ISBN-13: 9783642560194
Description: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Table of contents: title: Introduction; title: Principles of NC-AFM; title: Semiconductor Surfaces; title: Bias Dependence of NC-AFM Images and Tunneling Current Variations on Semiconductors; title: Alkali Halides; title: Atomic Resolution Imaging on Fluorides; title: Atomically Resolved Imaging of a NiO(001) Surface; title: Atomic Structure, Order and Disorder of High-Temperature Reconstructed alpha-Al2O3(0001); title: NC-AFM Imaging of Surface Reconstructions and Metal Growth on Oxides; title: Atoms and Molecules on TiO2(110) and CeO2(111) Surfaces-. NC-AFM Imaging of Adsorbed Molecules; title: Organic Molecular Films; title: Single-Molecule Analysis; title: Low-Temperature Measurements: Principles, Instrumentation, and Application; title: Theory of NC-AFM; title: Chemical Interaction in NC-AFM on Semiconductor Surfaces; title: Contrast Mechanisms on Insulating Surfaces; title: Analysis of Microscopy and Spectroscopy Experiments; title: Theory of Energy Dissipation into Surface Vibrations; title: Measurement of Dissipation Induced by Tip-Sample Interactions.