X-ray and image analysis in electron microscopy
By: John J. Friel.
Edition: 2nd ed.
Publisher: Princeton Gamma-Tech
Published: 2004
Place of publication: Rocky Hill, NJ
Language: eng
Number of pages: 113
Subjects: Electron microscopy.; X-ray microanalysis.; Image processing -- Digital techniques.
Notes: Includes bibliographical references (p. 105-107) and index.