Industrial applications of holographic nondestructive testing
Subtitle: May 3-5, 1982, Brussels
By: J. Ebbeni, chairman/editor ; sponsored by SPIE--the International Society for Optical Engineering ; with the support of Association belge pour l'étude, l'essai et l'emploi des matériaux (ABEM) ... [et al.].
Contributors: Ebbeni, J.; Society of Photo-optical Instrumentation Engineers.; Association belge pour l'étude, l'essai et l'emploi des matériaux.
Series: Proceedings / SPIE ;; v. 349; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 349.
Publisher: SPIE--the International Society for Optical Engineering
Published: 1982
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 199
Subjects: Holographic testing -- Congresses.
Notes: Includes bibliographical references and indexes.