International Conference on Advanced Phase Measurement Methods in Optics and Imaging, Monte Verità, Ascona, Switzerland, 16-21 May 2010
By: editors Pramod K. Rastogi, Erwin Hack ; sponsoring organizations, Swiss National Science Foundation, [and] Centro Stefano Franscini
Contributors: Rastogi, P. K. (Pramod K.); Hack, Erwin; Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung; Centro Stefano Franscini
Series: AIP conference proceedings -- 1236; AIP conference proceedings -- no. 1236.
Publisher: American Institute of Physics
Published: 2010
Place of publication: Melville, N.Y
Language: eng
Number of pages: 494
ISBN-13: 9780735407831
Subjects: Physical optics; Congresses; Image analysis; Optical measurements
Other titles: Advanced phase measurement methods in optics and imaging; Phase measurement methods in optics and imaging
Notes: Includes bibliographical references and index.
Table of contents: title: Keynote presentations; title: Speckle fields and DSPI; title: Wavepropagation and holography; title: Phase retrieval by wavelet and fourier methods; title: White light and spectral interferometry; title: Phase in THZ physics; title: Phase sensitive x-ray; title: Wavefront manipulation and measurement; title: Phase sensitive microsopy; title: Fibre based methods; title: Phase retrieval by novel mathematical methods; title: Fringe projection : real time shape measurement; title: Fringe projection : multiple grid methods; title: High-resolution measurements; title: Static and dynamic phase unwrapping.