Advances in X-ray diffractometry and X-ray spectrography
Subtitle: a volume of of fifteen selected reprints from Philips Laboratories, Irvington-on-Hudson, New York, U.S.A.
By: edited by William Parrish.
Contributors: Parrish, William.
Series: P.L. contribution -- no.188
Publisher: Centrex Publishing Co.; Cleaver-Hume
Published: 1962
Place of publication: Eindhoven
Language: eng
Number of pages: 233