Machine vision applications in industrial inspection III
Subtitle: 8-9 February 1995, San Jose, California
By: Frederick Y. Wu, Stephen S. Wilson,  chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
Contributors: Wu, Frederick Y.; Wilson, Stephen S.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2423; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2423.
Publisher: SPIE
Published: 1995
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 378
Subjects: Quality control -- Optical methods -- Automation -- Congresses.; Computer vision -- Congresses.; Engineering inspection -- Congresses.
Notes: Includes bibliographical references and index.