Defects and properties of semiconductors
Subtitle: defect engineering
By: edited by J. Chikawa, K. Sumino, and K. Wada.
Contributors: Chikawa, J. 1930-; Sumino, K. 1931-; Wada, K. 1950-; Society of Non-Traditional Technology (Japan); Symposium on "Defects and Qualities of Semiconductors" (1984 : Tokyo, Japan)
Series: Advances in solid state technology ;; 3
Publisher: KTK Scientific; D. Reidel; Distributed in the U.S.A. and Canada by Kluwer Academic
Published: 1987
Place of publication: Tokyo; Dordrecht; Boston; Norwell, MA, U.S.A
Language: eng
Number of pages: 261
Subjects: Semiconductors -- Defects -- Congresses.
Notes: Includes bibliographies and index.
"Papers presented at the Symposium on "Defects and Qualities of Semiconductors" which was held in Tokyo on May 17-18, 1984 under the sponsorship of the Society of Non-Traditional Technology"--Pref.