Pattern recognition and artificial intelligence
Subtitle: conference record, Joint Workshop on Pattern Recognition and Artificial Intelligence, held at Hyannis, Massachusetts, June 1-3, 1976
By: sponsored by IEEE Computer Society ; [edited by C.H. Chen].
Contributors: Chen, C. H. 1937-; Institute of Electrical and Electronics Engineers.
Publisher: IEEE Computer Society; IEEE Service Center
Published: 1976
Place of publication: Long Beach, Calif; Piscataway, N.J
Language: eng
Number of pages: 182
Subjects: Artificial intelligence -- Congresses.; Pattern recognition systems -- Congresses.
Genres: Congresses.
Notes: "76CH1169-2 C"

Includes bibliographical references.