Electronic characterization of defects in narrow gap semiconductors
Subtitle: semi-annual report, November 25, 1992 to June 28, 1993
By: James D. Patterson.
Contributors: United States. National Aeronautics and Space Administration.
Series: [NASA contractor report] -- NASA CR-193568.
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1993
Place of publication: [Washington, DC; Springfield, Va
Language: eng
Format: Microform
Subjects: Semiconductors -- Defects.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 93-1291-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1993] 1 microfiche.