Testing and Reliable Design of CMOS Circuits
By: by Niraj K. Jha, Sandip Kundu
Contributors: Kundu, Sandip
Series: The Kluwer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing -- 88; Kluwer international series in engineering and computer science -- 88.
Publisher: Springer US
Published: 1990
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
Number of pages: 256
ISBN-13: 9781461288183; 9781461315254
Subjects: Computer engineering; Computer-aided design; Computer science
Notes: Online full text is restricted to subscribers.

Also available in print.

Mode of access: World Wide Web.