ESD
Subtitle: failure mechanisms and models
By: Steven H. Voldman.
Publisher: J. Wiley
Published: 2009
Place of publication: Chichester, West Sussex, U.K; Hoboken, N.J
Language: eng
ISBN-13: 9780470511374
Subjects: Semiconductors -- Failures; Integrated circuits -- Protection; Integrated circuits -- Testing; Integrated circuits -- Reliability; Electric discharges; Electrostatics
Other titles: Electrostatic discharge
Notes: Includes bibliographical references and index.