A 25-kV bias-isolation unit for 1-MHz capacitance and conductance measurements
By: Alvin M. Goodman.
Series: Semiconductor measurement technology; NBS special publication ; 400-40; NBS special publication ;; 400-40.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1977
Place of publication: Washington
Language: eng
Number of pages: 49
Subjects: Semiconductors -- Testing.; Electric capacity.; Electric conductivity.; Electric meters.
Notes: Includes bibliographical references.