Acoustic Scanning Probe Microscopy
By: edited by Francesco Marinello, Daniele Passeri, Enrico Savio
Contributors: Passeri, Daniele; Savio, Enrico; SpringerLink (Online service)
Series: NanoScience and Technology
Publisher: Springer Berlin Heidelberg; Imprint: Springer
Published: 2013
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] /
Number of pages: 494
ISBN-13: 9783642274947
Subjects: Sound; Nanotechnology and Microengineering; Photonics Laser Technology; Characterization and Evaluation of Materials; Surfaces (Physics); Thin Films Surfaces and Interfaces; Hearing; Engineering; Nanotechnology; Physics
Description: The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.
Table of contents: title: From the contents: Overview of acoustic techniques; title: Contact dynamics modelling; title: Cantilever dynamics: theoretical modeling; title: Finite elements modelling; title: AFAM calibration; title: Enhanced sensitivity; title: UAFM; title: Holography calibration; title: UFM; title: Friction/lateral techniques; title: Harmonix; title: Scanning microdeformation microscopy (SMM); title: Tip wear; title: Comparison with other techniques; title: Applications polymer; title: Thin films.