Proceedings of the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Publisher: Pergamon
Published: October 1, 2002
Language: eng
Format: Hardcover
Number of pages: 596
ISBN-13: 9780080441825
Subjects: Electronic devices & materials; Technology / Electronics / Microelectronics; Electronics - Microelectronics; Technology; Technology & Industrial Arts; Science/Mathematics