The Test access port and boundary-scan architecture
By: [edited by] Colin M. Maunder, Rodham E. Tulloss.
Contributors: Maunder, Colin M.; Tulloss, Rodham E.
Series: IEEE Computer Society Press tutorial
Publisher: IEEE Computer Society Press; Brand: Ieee Computer Society; IEEE Computer Society
Published: 1991
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 372
Subjects: Electronic circuits -- Testing -- Data processing.; Computer architecture.; Boundary scan testing.
Notes: Includes bibliographical references and index.