Scanned probe microscopy
Subtitle: Santa Barbara, CA, 1991
By: H. Kumar Wickramasinghe, editor.
Contributors: Wickramasinghe, H. Kumar.; American Institute of Physics.
Series: AIP conference proceedings ;; 241; AIP conference proceedings ;; no. 241.
Publisher: American Institute of Physics; American Inst. of Physics
Published: 1992
Place of publication: New York
Language: eng
Number of pages: 563
Subjects: Scanning probe microscopy -- Congresses.; Scanning tunneling microscopy -- Congresses.
Notes: Includes bibliographical references and index.