Effect of Disorder and Defects in Ion-Implanted Semiconductors
Subtitle: Optical and Photothermal Characterization, Volume 46 (Semiconductors and Semimetals)
Contributors: Constantinos Christofides (Editor); Gerard Ghibaudo (Editor); Robert K. Willardson (Series Editor); Eicke R. Weber (Series Editor)
Publisher: Academic Press
Published: May 22, 1997
Language: eng
Number of pages: 316
ISBN-13: 9780127521466
First sentence: These days a renaissance of the technique of ellipsometry can be witnessed.