Investigation of interface properties and hot carrier degradation effects in silicon-on-insulator materials and devices
By: by Yun-Shan Chang
Published: 1995
Language: eng
Number of pages: 161
Subjects: Metal oxide semiconductor field-effect transistors; Silicon-on insulator technology
Notes: Typescript.

Vita.

Thesis (Ph. D.)--University of Florida, 1995.

Includes bibliographical references (leaves 145-153).

Adviser: S. Li