2002 IEEE International Integrated Reliability Workshop
Subtitle: final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: IEEE Society
Published: 2002
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 214
Subjects: Integrated circuits -- Reliability -- Congresses.; Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.
Genres: Congresses.
Notes: Also available via the World Wide Web.
Includes bibliographical references.
"IEEE Catalog Number 02TH8634."