An automated photovoltaic system for the measurement of resistivity variations in high-resistivity circular silicon slices
By: David L. Blackburn, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.
Contributors: Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division.; United States. Division of Electric Energy Systems.
Series: Semiconductor measurement technology; NBS special publication ; 400-52; NBS special publication -- 400-52.
Publisher: Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1979
Place of publication: Washington
Language: eng
Number of pages: 35
Subjects: Photoconductivity.; Semiconductors -- Quality control -- Data processing.
Notes: This activity was supported by the Dept. of Energy, Division of Electric Energy Systems.

Issued Nov. 1979.

CODEN:XNBSAV.

Includes bibliographical references.