Protocol test systems
Subtitle: proceedings of the IFIP TC 6 Second International Workshop on Protocol Test Systems, organized by GMD-FOKUS and IBM-ENC, Berlin, F.R.G., 3-6 October 1989
By: edited by Jan de Meer, Lothar Mackert, Wolfgang Effelsberg.
Contributors: Meer, Jan de.; Mackert, Lothar.; Effelsberg, Wolfgang.; International Federation for Information Processing. Technical Committee.
Publisher: North-Holland; Distributors for the U.S. and Canada, Elsevier Pub. Co.
Published: 1990
Place of publication: Amsterdam; New York; New York, N.Y
Language: eng
Number of pages: 371
Subjects: Computer network protocols -- Testing -- Congresses.
Notes: Includes bibliographical references.