Preparation and certification of SRM's for calibration of spreading resistance probes
By: James R. Ehrstein.
Contributors: United States. National Bureau of Standards.
Series: NBS special publication ;; 260-93
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; For sale by the Supt. of Docs., U.S. G.P.O
Published: 1985
Place of publication: [Gaithersburg, MD]; Washington, D.C
Language: eng
Number of pages: 30
Subjects: National Standard Reference Data System (U.S.); Electric resistance, Spreading -- Standards.; Silicon -- Electric properties -- Measurement.
Notes: Bibliography: p. 21.
Final.
Distributed to depository libraries in microfiche.
"Issued January 1985."
S/N 003-003-2633-6
Item 247 (microfiche)