Thermal resistance measurements
By: Frank F. Oettinger and David L. Blackburn.
Contributors: Blackburn, David L.; National Institute of Standards and Technology (U.S.)
Series: NIST special publication -- 400-86.; Semiconductor measurement technology
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology; Order from National Technical Information Service]
Published: 1990
Place of publication: Gaithersburg, MD; [Springfield, VA
Language: eng
Format: Microform
Number of pages: 72
Subjects: Power transistors -- Thermal properties.; Integrated circuits -- Testing.; Temperature measurements.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 92-1876-M.

Paper version no longer for sale by the Supt. of Docs.

"July 1990."

Includes bibliographical references (p. 68-72).

Final.

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative.