Model checkers in software testing
By: Paul E. Black, Paul Ammann, Wei Ding
Contributors: Ammann, Paul E.; Ding, Wei, 1967 Sept. 14-; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6777
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 2002
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 40
Subjects: Computer software -- Testing; Computer systems -- Verification
Notes: Shipping list no.: 2002-0256-M

"February 1, 2002."

Includes bibliographical references (p. 38-40)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002 1 microfiche : negative