Atomic-Scale Imaging of Surfaces and Interfaces
Subtitle: Symposium Held November 30-December 2, 1992, Boston, Massachusetts, U.S.A. (Materials Research Society Symposium Proceedings)
Contributors: S. Y. Tong (Editor)
Publisher: Materials Research Society
Published: May 1993
Language: eng
Format: Hardcover
Number of pages: 288
ISBN-13: 9781558991903
Subjects: Surfaces (Technology); Scanning electron microscopy; Physical Properties Of Materials; Technology; Science/Mathematics; Atomic structure; Reference; Congresses