Reliability and degradation of III-V optical devices
By: Osamu Ueda.
Publisher: Artech House
Published: 1996
Place of publication: Boston
Language: eng
Number of pages: 353
Subjects: Gallium arsenide semiconductors -- Reliability.; Semiconductors -- Failures.; Light emitting diodes -- Reliability.; Crystals -- Defects.
Other titles: Reliability and degradation of  3-5 optical devices; Reliability and degradation of  three-five optical devices
Notes: Includes bibliographical references and index.