Opto-Ireland 2002
Subtitle: optical metrology, imaging, and machine vision : 5-6 September 2002, Galway, Ireland
By: Andrew Shearer ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by Irish Machine Vision and Image Processing ; cooperating organizations, Enterprise Ireland ... [et al.].
Contributors: Shearer, Andrew.; Society of Photo-optical Instrumentation Engineers.; Enterprise Ireland.; Irish Machine Vision and Image Processing Conference.
Series: SPIE proceedings series,; v. 4877; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4877.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 282
Subjects: Computer vision -- Congresses.; Optical measurements -- Congresses.; Image processing -- Congresses.
Genres: Congresses.
Other titles: Optical metrology, imaging, and machine vision
Notes: Includes bibliographical references and index.