Damage to VUV, EUV, and x-ray optics III
Subtitle: 18-19 April 2011, Prague, Czech Republic
By: Libor Juha, Saša Bajt, Richard A. London, editors ; sponsored and published by SPIE ; cooperating organizations, ELI Beamlines, HiPER
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 8077; Proceedings of SPIE--the International Society for Optical Engineering -- v. 8077.
Publisher: SPIE
Published: 2011
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819486677
Subjects: Congresses; Optical materials; Far ultraviolet radiation; Deterioration; X-ray optics
Notes: Includes bibliographical references and author index.