An investigation of correlation between pilot scanning behavior and workload using stepwise regression analysis
By: Marvin C. Waller ; Langley Research Center, Hampton, Va.
Contributors: Langley Research Center.; United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum ; NASA TM X-3344; NASA technical memorandum -- X-3344.
Publisher: U.S. National Aeronautics and Space Administration; for sale by the National Technical Information Service
Published: 1976
Place of publication: Washington; Springfield, Va
Language: eng
Number of pages: 20
Subjects: Pilots and pilotage.; Instrument landing systems.
Notes: Cover title.

Bibliography: p. 20.