2006 IEEE International Test Conference
Subtitle: Santa Clara, CA : 22-27 October 2006
Contributors: Institute of Electrical and Electronics Engineers. Philadelphia Section
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Published: 2006
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 1098
Subjects: Integrated circuits; Congresses; Testing; Electronic digital computers; Circuits; Telecommunication; Radio frequency
Notes: "IEEE Catalog Number 06CH37787."

Includes bibliographical references and index.