Test and diagnosis of analogue, mixed-signal and RF integrated circuits
Subtitle: the system on chip approach
By: edited by Yichuang Sun
Contributors: Knovel (Firm); Institution of Engineering and Technology
Series: Circuits, devices and systems series -- 19
Publisher: Institution of Engineering and Technology
Published: 2008
Place of publication: London
Language: eng
Format: [electronic resource] :
ISBN-13: 9781615833153
Subjects: Linear integrated circuits; Testing; Mixed signal circuits; Radio frequency integrated circuits
Notes: Includes bibliographical references and index.

Electronic reproduction. Norwich, N.Y. : Knovel, 2010. HTML/PDF. Mode of access: Intranet. Electronic access restricted to users at licensed institutions.