Measuring the performance and intelligence of systems
Subtitle: proceedings of the 2002 PerMIS Workshop, August 13-15, 2002
By: edited by E.R. Messina, A.M. Meystel
Contributors: Messina, E. R.; Meystel, A.; National Institute of Standards and Technology (U.S.)
Series: NIST special publication -- 990
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 2002
Place of publication: Gaithersburg, Md; Washington, D.C
Language: eng
Format: Microform
Number of pages: 467
Subjects: Intelligent control systems -- Congresses; Artificial intelligence -- Congresses
Genres: Congresses
Notes: Co-sponsored by National Institute of Standards and Technology ... [et al.]

"Issued September 2002."

Shipping list no.: 2003-0384-M

Includes bibliographical references

Also available via Internet from the NIST web site. Address as of 8/20/03: http://www.isd.mel.nist.gov/research%5Fareas/research%5Fengineering/Performance%5FMetrics/PerMIS%5F2002%5FProceedings/index.htm; current access is available via PURL

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2003. 5 microfiches : negative.