Electron backscatter diffraction in materials science
By: edited by Adam J. Schwartz, Mukul Kumar, and Brent L. Adams.
Contributors: Schwartz, Adam J.; Kumar, Mukul.; Adams, B. L.
Publisher: Kluwer Academic
Published: 2000
Place of publication: New York
Language: eng
Number of pages: 339
Subjects: Materials -- Microscopy; Scanning electron microscopy; Crystallography
Notes: Includes bibliographical references and index.