Diffraction and imaging techniques in material science
By: editors, S. Amelinckx, R. Gevers, J. Van Landuyt.
Contributors: Amelinckx, S.; Gevers, R.; Landuyt, J. van.; International Summer Course on Material Science (1969 : Antwerp, Belgium).
Edition: 2d, rev. ed.
Publisher: North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland
Published: 1978
Place of publication: Amsterdam; New York
Language: eng
Number of pages: 847
Subjects: Electron microscopy -- Congresses.; Electrons -- Diffraction -- Congresses.; Imaging systems -- Congresses.
Notes: Includes bibliographical references and index.
Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.
Table of contents: title: v. 1. Electron microscopy.; title: v. 2. Imaging and diffraction techniques.