Bridging faults and IDDQ testing
By: [edited] by Yashwant K. Malaiya and Rochit Rajsuman.
Contributors: Malaiya, Yashwant K.; Rajsuman, Rochit.; IEEE Computer Society. Test Technology Technical Committee.
Series: IEEE Computer Society Press technology series
Publisher: IEEE Computer Society Press
Published: 1992
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 128
Subjects: Metal oxide semiconductors, Complementary -- Testing -- Data processing.; Iddq testing.
Notes: Includes bibliographical reference (p. 122-127).
"Sponsored by the IEEE Compter Society Technical Committee on Test Technology."