Electronic parts reliability data
Subtitle: a compendium of commercial and military device field failure rates, 1997
By: prepared by William Denson ... [et al.].
Contributors: Denson, William K.; Reliability Analysis Center (U.S.)
Publisher: Reliability Analysis Center
Published: 1996
Place of publication: Rome, NY
Language: eng
Subjects: Electronic apparatus and appliances -- Reliability.; Reliability (Engineering)
Notes: "EPRD-97."