Imaging techniques for testing and inspection
Subtitle: seminar-in-depth, February 1972, Los Angeles, California
By: editors : John C. Urbach, Harold Berger, Robert Aprahamian ; SPIE co-sponsors : the American Society for Nondestructive Testing, the American Society for Testing and Materials.
Contributors: Urbach, John C.; Berger, Harold.; Aprahamian, Robert.; SPIE.; American Society for NondestructiveTesting.; American Society for Testing and Materials.
Series: Proceedings of the Society of Photo-optical Instrumentation Engineers -- vol.29
Publisher: Society of Photo-optical Instrumentation Engineers
Published: 1972
Place of publication: Redondo Beach, Calif
Language: eng
Notes: At head of title : SPIE.