1994 ACM SIGMETRICS Conference on Measurement and Modeling of Computer Systems
Subtitle: proceedings, May 16-20, 1994, Vanderbilt University, Nashville, Tennessee, USA.
Contributors: ACM-Sigmetrics.
Series: Performance evaluation review -- v. 22, no. 1 (May 1994)
Publisher: Association for Computing Machinery
Published: 1994
Place of publication: New York, N.Y
Language: eng
Number of pages: 294
Subjects: Electronic digital computers -- Evaluation -- Congresses; Computer simulation -- Congresses
Genres: Congresses.
Notes: "Special issue."

"ACM order number 488940"--T.p. verso.

Includes bibliographical references and index.