Applied Scanning Probe Methods III
Subtitle: Characterization (NanoScience and Technology)
Contributors: Bharat Bhushan (Editor); Harald Fuchs (Editor)
Edition: 1 edition
Publisher: Springer
Published: April 11, 2006
Language: eng
Format: Hardcover
Number of pages: 378
ISBN-13: 9783540269090
Subjects: Microscopy; Science/Mathematics; Nanotechnology; Science; Technology & Industrial Arts; Chemistry - Analytic; Physics; Material Science; Nanoscience; Physical Chemistry; Technology / Nanotechnology; Chemistry - Physical & Theoretical; Scanning probe microscopy