Techniques innovantes pour la caractérisation optique microstructurale de couches minces
By: coordonné par André Ayral et Vincent Rouessac.
Contributors: Ayral, André, 1960-; Rouessac, Vincent.
Series: Collection "Sciences et techniques de l'ingénieur"
Publisher: CNRS
Published: 2006
Place of publication: Paris
Language: fre
Number of pages: 181
Subjects: Ellipsometry -- Congresses.; Reflectance spectroscopy -- Congresses.; Thin films -- Congresses.
Genres: Congresses.
Notes: Proceedings of a conference organized by Institut européene des membranes and held in Montpellier, April 5-6, 2005

Includes bibliographical references and index.

In French with table of contents in English.