Data-driven methods for fault detection and diagnosis in chemical processes
By: Evan Russell, Leo H. Chiang and Richard D. Braatz.
Contributors: Chiang, Leo H., 1975-; Braatz, Richard D., 1966-
Series: Advances in industrial control
Publisher: Springer
Published: 2000
Place of publication: London; New York
Language: eng
Number of pages: 192
Subjects: Chemical process control; Fault location (Engineering); Chemical process control; Chemical process control -- Data processing
Notes: Includes bibliographical references (p. [175]-187) and index.