Mathematical modeling, estimation, and imaging
Subtitle: 31 July-1 August 2000, San Diego, USA
By: David C. Wilson ... [et al.], chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organization, SIAM--Society for Industrial and Applied Mathematics.
Contributors: Wilson, David C., 1942-; Society of Photo-optical Instrumentation Engineers.; Society for Industrial and Applied Mathematics.
Series: SPIE proceedings series ;
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 244
Subjects: Image processing -- Mathematics -- Congresses.; Image processing -- Industrial applications -- Congresses.; Diagnostic imaging -- Mathematics -- Congresses.; Optical pattern recognition -- Mathematical models -- Congresses.; Computer vision -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.