1998 IEEE International Workshop on IDDQ Testing
Subtitle: proceedings : November 12-13, 1998, San Jose, California
By: edited by Yashwant K. Malaiya and Sankaran M. Menon ; sponsored by IEEE Computer Society Technical Committee on Test Technology.
Contributors: Malaiya, Yashwant K.; Menon, Sankaran M.; IEEE Computer Society. Technical Test Technology Committee.
Publisher: IEEE Computer Society Press
Published: 1998
Place of publication: Los Alamitos, California
Language: eng
Number of pages: 82
Subjects: Iddq testing -- Congresses.; Metal oxide semiconductors, Complementary -- Testing -- Congresses.
Other titles: IDDQ testing
Notes: Includes bibliographical references and index.
"IEEE Computer Society Order Number PR09191"--verso of T.p.
"IEEE Order Plan Catalog Number 98EX232"--verso of T.p.