Advances in Imaging and Electron Physics, Volume 144
Publisher: Elsevier
Published: 2006
Place of publication: Burlington
Language: eng
Format: [electronic resource]
Number of pages: 345
ISBN-13: 9780080465364; 9781280707490
Description: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Notes: Description based on print version record.
Table of contents: title: Front cover; Title page; Copyright page; Contents; Contributors; Preface; Future Contributions; Recent Progress in High Frequency Electron Cyclotron Resonance Ion Sources; Introduction; I. Fundamental Aspects of ECRIS; II. Wave Coupling in an ECRIS; III. VUV Diagnostics of ECRIS Plasmas; IV. Magnetic Confinement; V. Design of Various Electron Cyclotron Resonance Ion Sources; VI. Industrial Applications; VII. Conclusion; References; Fixed Points of Lattice Transforms and Lattice Associative Memories; I. Introduction; II. Pertinent Basic Properties of Lattices.; title: III. Matrices and Lattice-Ordered GroupsIV. Lattice Dependence and Independence; V. Lattice Associative Memories; VI. Lattice Dependence and Fixed Points; VII. Convex Sets and Polytopes in Rn; VIII. Linear Subspaces and Orientation in Rn; IX. The Shape of F(X); X. Remarks Concerning the Dimensionality of F(X); XI. Strong Lattice Independence; XII. Pattern Reconstruction from Noisy Inputs; XIII. Kernel Vectors; XIV. Associative Memories Based on Dendritic Com.