Improved analysis of DNA short tandem repeats with time-of-flight mass spectrometry
By: John M. Butler and Christopher H. Becker.
Contributors: Becker, Christopher H.
Publisher: U.S. Dept. of Justice, Office of Justice Programs, National Institute of Justice
Published: 2001
Place of publication: Washington, D.C
Language: eng
Number of pages: 75
Subjects: Forensic genetics -- Methodology.; Genetic markers.; Time-of-flight mass spectrometry.; DNA -- Analysis.
Notes: "Science and technology research report."

"October 2001."

"NCJ 188292."

Includes bibliographical references (p. 73-74).