Applied Scanning Probe Methods I (NanoScience and Technology)
Contributors: Bharat Bhushan (Editor); Harald Fuchs (Editor); Sumio Hosaka (Editor)
Edition: 1 edition
Publisher: Springer
Published: March 5, 2004
Language: eng
Format: Hardcover
Number of pages: 476
ISBN-13: 9783540005278
Subjects: Instruments & instrumentation engineering; Materials science; Microscopy; Physics; Materials; Science; Science/Mathematics; Scanning probe microscopy; Engineering - Mechanical; Nanostructures; Material Science; Nanoscience; Physical Chemistry; Technology / Nanotechnology