1999 4th International Workshop on Statistical Metrology
By: technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI symposium, The Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, Information and Communication Engineers.
Contributors: IEEE Electron Devices Society.
Publisher: Purchased from: IEEE Service Center Single Publication Sales Unit
Published: 1999
Place of publication: Piscataway, NJ, USA
Language: eng
Number of pages: 65
Subjects: Semiconductors -- Characterization -- Statistical methods -- Congresses.; Semiconductors -- Measurement -- Congresses.
Genres: Congresses.
Other titles: 4th International Workshop on Statistical Metrology
Notes: Includes bibliographical references.
"IWSM."
"IEEE cat. no. 99TH8391."