2010 Symposium on Design Test Integration and Packaging of MEMS/MOEMS (DTIP 2010)
Subtitle: Seville, Spain, 5-7 May 2010
By: Editors, Bernard Courtois and 5 others
Contributors: Courtois, Bernard, editor
Publisher: IEEE
Published: 2010
Place of publication: Piscataway, NJ]
Language: eng
Number of pages: 396
ISBN-13: 9781424466368
Subjects: Microelectromechanical systems; Congresses
Other titles: DTIP 2010
Notes: "IEEE Catalog Number: CFP10DTI-PRT"--Title page.

Includes bibliographical references and index.