Analysis of dimensional metrology standards
By: John Evans ... [et al.]
Contributors: Evans, John M. 1942-; Manufacturing Engineering Laboratory (U.S.); National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6847
Publisher: U.S. Dept. of Commerce, Technology Administration, Manufacturing Engineering Laboratory, National Institute of Standards and Technology
Published: 2001
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 71
Subjects: Metrology -- Standards; Metrology -- Computer-aided design; Engineering design -- Computer programs
Description: "This paper is an analysis of documentary standards related to dimensional metrology information, with recommendations regarding standards development"--P. 1
Notes: "December 19, 2001."

Shipping list no.: 2002-0326-M

Includes bibliographical references (p. 71)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002. 1 microfiche : negative.