Advances in X-Ray Analysis
Contributors: C.S. Barrett (Editor); John V. Gilfrich (Editor); Ting C. Huang (Editor); Ron Jenkins (Editor); G.J. McCarthy (Editor); Paul K. Predecki (Editor); R. Ryon (Editor); Deane K. Smith (Editor)
Edition: 1 edition
Publisher: Springer; Plenum; Plenum Press
Published: October 31, 1992
Language: eng
Format: Hardcover
Number of pages: 1334
ISBN-13: 9780306442490
Subjects: Chemical spectroscopy, spectrochemistry; Mechanical Properties Of Materials; Structural Properties Of Materials; Science; Science/Mathematics; Chemistry - Analytic; Engineering - Electrical & Electronic; Material Science; Science / Chemistry / Analytic; Chemistry - Industrial & Technical