Laser metrology and inspection
Subtitle: 14-15 June 1999, Munich, Germany
By: Hans J. Tiziani, Pramod K. Rastogi, chairs/editors ; sponsored by EOS--European Optical Society ... [et al.].
Contributors: Tiziani, Hans J.; Rastogi, P. K.; European Optical Society.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings EurOpt series; SPIE proceedings series -- v. 3823; Proceedings of SPIE--the International Society for Optical Engineering -- v. 3823.
Publisher: SPIE
Published: 1999
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 298
Subjects: Optical measurements -- Congresses; Optical detectors -- Industrial applications -- Congresses; Lasers -- Industrial applications -- Congresses; Measurement -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and author index.