Some reliability aspects of IGBT modules for high-power applications
By: Mauro Ciappa
Edition: 1. Aufl.
Series: Series in microelectronics -- v. 111
Publisher: Hartung-Gorre
Published: 2001
Place of publication: Konstanz
Language: eng
Number of pages: 178
Subjects: Insulated gate bipolar transistors; Reliability
Notes: Originally presented as the author's thesis (Swiss Federal Institute of Technology), Diss. ETH No. 13790.

Includes bibliographical references (p. 167-175).

Summary in Italian.