Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
By: edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI.
Contributors: Rajsuman, Rochit.; IEEE Computer Society. Test Technology Technical Committee.; IEEE Computer Society. Technical Committee on VLSI.
Publisher: IEEE Computer Society Press
Published: 1994
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 141
Subjects: Semiconductor storage devices -- Testing -- Congresses; Random access memory -- Congresses
Notes: Includes bibliographical references and index.
"IEEE catalog number 94TH0656-9"--T.p. verso.