Innovations in deep level transient spectroscopy
By: by Peter David DeVries.
Published: 1988
Language: eng
Number of pages: 148
Subjects: Electron energy loss spectroscopy.; Emission spectroscopy.; Semiconductors -- Defects.
Notes: Typescript.

Thesis (M.S.)--Washington State University, 1988.

Bibliography: leaves 107-110.

WSU:"Department of Electrical and Computer Engineering."