Proceedings of the 21st International Conference on Defects in Semiconductors
Subtitle: ICDS-21 held in Giessen, Germany, 16-20 July 2001
By: guest editor, Detlev M. Hofmann.
Contributors: Hofmann, Detlev M.
Series: Physica -- v. 308-310.
Publisher: Elsevier
Published: 2001
Place of publication: Amsterdam
Language: eng
Number of pages: 1241
Subjects: Semiconductors -- Defects -- Congresses.
Genres: Congresses.
Other titles: 21st International Conference on Defects in Semiconductors.; Twenty-first International Conference on Defects in Semiconductors.; International Conference on Defects in Semiconductors.; ICDS-21.; Defects in semiconductors.
Notes: Includes bibliographical references and indexes.