Transient-induced latchup in CMOS integrated circuits
By: Morris Ker , Sheng-Fu Hsu.
Contributors: Hsu, Sheng-Fu.
Publisher: Wiley
Published: 2009
Place of publication: Singapore; Hoboken, NJ
Language: eng
ISBN-13: 9780470824078
Subjects: Metal oxide semiconductors, Complementary -- Defects; Metal oxide semiconductors, Complementary -- Reliability
Notes: Includes bibliographical references and index.