Machine vision applications in industrial inspection XIV
Subtitle: 16-17 January, 2006, San Jose, California, USA
By: Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
Contributors: Mériaudeau, Fabrice.; Niel, Kurt S.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE -- vol. 6070; Proceedings of SPIE--the International Society for Optical Engineering -- v. 6070.
Publisher: SPIE; IS&T
Published: 2006
Place of publication: Bellingham, Wash; Springfield, Va
Language: eng
Subjects: Engineering inspection -- Automation -- Congresses; Computer vision -- Industrial applications -- Congresses; Quality control -- Optical methods -- Automation -- Congresses; Mensuration -- Congresses
Genres: Congresses.
Other titles: Electronic imaging science and technology
Notes: At head of title: Proceedings of electronic imaging science and technology.

Includes bibliographical references and author index.