Time and frequency metrology III
Subtitle: 24-25 August 2011, San Diego, California, United States
By: Tetsuya Ido, Thomas R. Schibli ; sponsored and published by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 8132
Publisher: SPIE
Published: 2011
Place of publication: Bellingham, Washington
Language: eng
ISBN-13: 9780819487421
Subjects: Time measurements; Congresses; Metrology; Measurement
Other titles: Time and frequency metrology 3; Time and frequency metrology three
Notes: Includes bibliographical references and author index.