Signal measurement and estimation techniques for micro and nanotechnology
By: Cédric Clévy, Micky Rakotondrabe, Nicolas Chaillet, editors
Publisher: Springer Verlag
Published: 2011
Place of publication: New York
Language: eng
Number of pages: 242
ISBN-13: 9781441999450; 9781441999467
Subjects: Nanotechnology; Microtechnology; Information measurement
Notes: Includes bibliographical references and index.