Practical Scanning Electron Microscopy
Subtitle: Electron and Ion Microprobe Analysis
By: edited by Joseph I. Goldstein, Harvey Yakowitz
Contributors: Yakowitz, Harvey
Publisher: Springer US
Published: 1975
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] :
ISBN-13: 9781461344247; 9781461344223
Subjects: Surfaces (Physics)
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