Secondary Ion Mass Spectrometry
Subtitle: SIMS X
Contributors: A. Benninghoven (Editor); B. Hagenhoff (Editor); H. W. Werner (Editor)
Publisher: John Wiley & Sons Ltd (Import)
Published: May 1997
Language: eng
Format: Paperback
Number of pages: 1084
ISBN-13: 9780471958970
Subjects: Mass spectrometry; Physical chemistry; Spectrochemistry; Science; Science/Mathematics; Spectrum Analysis; Chemistry - Analytic