Surface Analysis Methods in Materials Science
By: edited by D. John O'Connor, Brett A. Sexton, Roger St. C. Smart
Contributors: Sexton, Brett A.; Smart, Roger St. C.
Series: Springer Series in Surface Sciences -- 23; Springer Series in Surface Sciences -- 23
Publisher: Springer Berlin Heidelberg
Published: 1992
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] /
Number of pages: 453
ISBN-13: 9783662027691; 9783662027677
Subjects: Surfaces (Physics)
Description: This comprehensive and up-to-date guide to the use of surface analysis methods in materials science consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing fourteen surface methods and a separate section on applications. Each chapter is written by a specialist in the field. The surface methods described include SAM, XPS, SIMS and other ion beam methods, LEED/RHEED, RBS and NRA, FTIR, SEM, STM, UPS and magnetic methods. Among the areas of application discussed are adsorption, catalysis, coated steel surfaces, inorganic surfaces, semiconductor devices, thin film solar cells and high temperature oxidation. This detailed exposition will enable researchers to select and exploit the appropriate surface method for a given application.
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