High Resolution Electron Microscopy of Defects in Materials
Subtitle: Symposium Held April 16-18, 1990, San Francisco, California, U.S.A. (Materials Research Society Symposium Proceedings)
Contributors: Ulrich Dahmen (Editor)
Publisher: Materials Research Society
Published: August 1990
Language: eng
Format: Hardcover
Number of pages: 391
ISBN-13: 9781558990722
Subjects: Non-Destructive Testing Of Materials; Materials; Science/Mathematics; Microscopy; Congresses; Defects; High resolution electron micro; High resolution electron microscopy