Tutorial test generation for VLSI chips
By: [edited by] Vishwani D. Agrawal and Sharad C. Seth.
Contributors: Agrawal, Vishwani D., 1943-; Seth, Sharad C.; IEEE Computer Society.
Publisher: Computer Society Press; Order from Computer Society
Published: 1988
Place of publication: Washington, D.C; Los Angeles, CA
Language: eng
Number of pages: 401
Subjects: Integrated circuits -- Very large scale integration -- Testing.; Automatic test equipment.
Other titles: Test generation for VLSI chips.
Notes: Bibliography: p. 333-394.
"Computer Society order number 786."
"IEEE catalog number EH0278-2."
Includes index.