Discover the new world of test and design
Subtitle: International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA
By: sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: The Conference; Can be ordered from IEEE Service Center
Published: 1992
Place of publication: Altoona, PA; Piscataway, NJ
Language: eng
Number of pages: 1012
Subjects: Integrated circuits -- Testing -- Congresses; Automatic test equipment -- Congresses
Genres: Congresses.
Notes: Includes bibliographical refrences and index.
Cover title.
"IEEE catalog number 92-CH3191-4"--P. ii.
"IEEE Computer Society Press order number 3167"--P. ii.