Fault covering problems in reconfigurable VLSI systems
By: by Ran Libeskind-Hadas ... [et al.].
Contributors: Libeskind-Hadas, Ran.
Series: The Kluwer international series in engineering and computer science ;; SECS 172.; VLSI, computer architecture, and digital signal processing; Kluwer international series in engineering and computer science ;; SECS 172.; Kluwer international series in engineering and computer science.
Publisher: Kluwer
Published: 1992
Place of publication: Boston
Language: eng
Number of pages: 130
Subjects: Integrated circuits -- Very large scale integration -- Design and construction -- Data processing; Integrated circuits -- Wafer-scale integration -- Design and construction -- Data processing; Integrated circuits -- Fault tolerance
Notes: Includes bibliographical references (p. 119-127) and index.