Secondary Ion Mass Spectrometry SIMS IV
Subtitle: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983
By: edited by A. Benninghoven, J. Okano, R. Shimizu, H. W. Werner
Contributors: Okano, J.; Shimizu, R.; Werner, H. W.
Series: Springer Series in Chemical Physics -- 36; Springer Series in Chemical Physics -- 36
Publisher: Springer Berlin Heidelberg
Published: 1984
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] :
ISBN-13: 9783642822582; 9783642822568
Subjects: Physical organic chemistry; Chemistry
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