Measurement needs for emerging technologies
Subtitle: 60th ARFTG conference digest : fall 2002 : December 5th & 6th, 2002, Washington, D.C.
By: Automatic RF Techniques Group.
Contributors: Automatic RF Techniques Group.
Publisher: IEEE
Published: 2002
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 178
Subjects: Microwaves -- Measurement -- Congresses.; Radio frequency -- Congresses.; Electronic measurements -- Congresses.; Microelectronics -- Congresses.
Genres: Congresses.
Other titles: ARFTG Conference digest, Fall 2002, 60th.
Notes: Includes bibliographical references.
"IEEE Catalog Number: 02EX739"--T.p. verso.
Also available via the World Wide Web with additional title: ARFTG Conference digest, Fall 2002, 60th.