Optical pattern recognition XIX
Subtitle: 17-18 March 2008, Orlando, Florida, USA
By: David P. Casasent, Tien-Hsin Chao, editors ; sponsored and published by SPIE
Contributors: Society of Photo-optical Instrumentation Engineers
Series: Proceedings of SPIE -- v. 6977; Proceedings of SPIE--the International Society for Optical Engineering -- v. 6977.
Publisher: SPIE
Published: 2008
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819471680
Subjects: Optical pattern recognition; Congresses
Other titles: Optical pattern recognition nineteen; Optical pattern recognition 19
Notes: Includes bibliographical references and index.