Version 2.0 of the TXYZ thermal analysis program, TXYZ20
By: John Albers.
Contributors: National Institute of Standards and Technology (U.S.)
Series: Semiconductor measurement technology; NIST special publication -- 400-89.; Semiconductor measurement technology; NIST special publication -- 400-89.
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1992
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 29
Subjects: Semiconductors -- Thermal properties.; Thermal analysis -- Computer programs.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 92-2593-M.

Paper version no longer for sale by the Supt. of Docs.

"June 1992."

Includes bibliographical references (p. 18).

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative.