Testing in the 1980's
Subtitle: digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981
By: sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.
Contributors: IEEE Computer Society. Test Technology Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: The Society
Published: 1981
Place of publication: Los Angeles, CA (P.O. Box 80452, Los Angeles 90080)
Language: eng
Number of pages: 568
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.
"IEEE catalog no. 81CH1693-1."
"IEEE Computer Society catalog no. 375."