Two- and three-dimensional vision systems for inspection, control, and metrology II
Subtitle: 26-27 October, 2004, Philadelphia, Pennsylvania, USA
By: Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; technical cosponsor, IEICE Communications Society (Japan) ; in cooperation with IEICE Electronics Society (Japan).
Contributors: Harding, Kevin G.; Society of Photo-optical Instrumentation Engineers.; Denshi Jōhō Tsūshin Gakkai (Japan). Tsūshin Sosaieti.; Denshi Jōhō Tsūshin Gakkai (Japan). Erekutoronikusu Sosaieti.
Series: SPIE proceedings series ;; v. 5606; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5606.
Publisher: SPIE
Published: 2004
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 188
Subjects: Computer vision -- Congresses.; Imaging systems -- Congresses.; Three-dimensional display systems -- Congresses.; Quality control -- Optical methods -- Congresses.; Optical measurements -- Congresses.; Metrology -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and author index.