Output measurement in science and technology
Subtitle: essays in honor of Yvan Fabian
By: edited by Christopher Freeman.
Contributors: Fabian, Yvan.; Freeman, Christopher.
Publisher: North-Holland; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co.
Published: 1987
Place of publication: Amsterdam; New York; New York, NY, U.S.A
Language: eng
Number of pages: 181
Subjects: Fabian, Yvan; Research -- Measurement -- Statistical methods; Research, Industrial -- Measurement -- Statistical methods
Notes: Includes bibliographies and indexes.
"These papers were first published as a special issue of Research policy, volume 16, numbers 2-4, August 1987, pp. 55-228"--T.p. verso.