Microelectronic reliability.
Contributors: Hakim, Edward B.; Pollino, Emiliano.
Series: The Artech House materials science library
Publisher: Artech House
Published: 1989
Place of publication: Norwood, MA
Language: eng
Subjects: Semiconductors -- Reliability.
Other titles: Affidabilità dei componenti elettronici a semiconduttore. English. 1989.
Notes: Includes bibliographies and indexes.
Vol. 2. translation of: L'affidabilità dei componenti elettronici a semiconduttore.
Table of contents: title: v. 1. Reliability, test and diagnostics [edited by] Edward B. Hakim; title: v. 2. Integrity assessment and assurance / [edited by] Emiliano Pollino.