Soft X-ray microscopy
Subtitle: 19-21 July 1992, San Diego, California
By: Chris J. Jacobsen, James E. Trebes, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Jacobsen, Chris J.; Trebes, James E.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 1741; Proceedings of SPIE--the International Society of Optical Engineering ;; v. 1741.
Publisher: SPIE
Published: 1993
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 412
Subjects: X-ray microscopy -- Congresses; Grenz rays -- Congresses
Notes: Includes bibliographical references and index.