Research perspectives and case studies in system test and diagnosis
By: by John W. Sheppard and William R. Simpson.
Contributors: Simpson, William Randolph, 1946-
Series: Frontiers in electronic testing
Publisher: Kluwer Aacdemic Publishers
Published: 1998
Place of publication: Boston
Language: eng
Number of pages: 232
Subjects: Electronic apparatus and appliances -- Testing; Electric fault location; Systems engineering
Notes: Includes bibliographical references and index.
Based on a workshop held in Alexandria, Virginia in April 1998.