ICMTS 2004
Subtitle: proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan
By: sponsored by the IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society
Publisher: IEEE
Published: 2004
Place of publication: Piscataway, New Jersey
Language: eng
Number of pages: 313
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.; Electronic apparatus and appliances -- Testing -- Congresses.
Genres: Congresses.
Other titles: Microelectronic test structures; 2004 International Conference on Microelectronic Test Structures
Notes: "IEEE Catalog Number: 04CH37516"--T.p. verso.

Includes bibliographic references and author index.

Also available via the World Wide Web.