Visual analytics for homeland defense and security
Subtitle: 14 April 2009, Orlando, Florida, United States
By: William J. Tolone, William Ribarsky, editors ; sponsored and published by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 7346; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7346.
Publisher: SPIE
Published: 2009
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819476128
Subjects: National security; Congresses; Technological innovations; Visual analytics; Information visualization
Notes: Includes bibliographical references and author index.