Development of a testing methodology to predict optical disk life expectancy values
By: Fernando L. Podio.
Contributors: National Institute of Standards and Technology (U.S.)
Series: NIST special publication -- 500-200. -- Computer systems technology; NIST special publication -- 500-200.; NIST special publication
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; Order from National Technical Information Service]
Published: 1991
Place of publication: Gaithersburg, MD; [Springfield, VA
Language: eng
Format: Microform
Number of pages: 84
Subjects: Optical disks -- Testing.; Service life (Engineering)
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 92-2116-M.

Paper version no longer for sale by the Supt. of Docs.

"December 1991."

Includes bibliographical references (p. 83-84).

Final.

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 2 microfiches : negative.

Sponsored by U.S. National Archives and Records Administration.