Characterization of High Tc Materials and Devices by Electron Microscopy
Contributors: Nigel D. Browning (Editor); Stephen J. Pennycook (Editor)
Publisher: Cambridge University Press
Published: July 24, 2000
Language: eng
Format: Hardcover
Number of pages: 406
ISBN-13: 9780521554909
Subjects: Condensed matter physics (liquids & solids); Electricity, magnetism & electromagnetism; Materials science; Optics; Electronics - General; Science; Technology & Industrial Arts; Technique; Science/Mathematics; Physics; Electron Microscopes & Microscopy; Material Science; Superconductors & Superconductivity; Science / Physics; Electron Microscopy; High temperature superconducto; High temperature superconductors
First sentence: High-resolution transmission electron microscopy (HRTEM) has been widely and effectively used for analyzing crystal structures and lattice imperfections in various kinds of advanced materials on an atomic scale.