Flat panel display technology and display metrology II
Subtitle: 22-23 January 2001, San Jose, [California] USA
By: Edward F. Kelley, Tolis Voutsas, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering.
Contributors: Kelley, Edward F.; Voutsas, Tolis; Society of Photo-optical Instrumentation Engineers.; IS & T--the Society for Imaging Science and Technology.
Series: SPIE proceedings series ;; v. 4295; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4295.
Publisher: SPIE
Published: 2001
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 290
Subjects: Information display systems -- Congresses.; Optical measurements -- Congresses.; Liquid crystal displays -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.