Functional test generation of digital LSI/VLSI systems using machine symbolic execution technique
By: by Tonysheng Lin.
Series: Ph. D. theses (State University of New York at Binghamton) -- no. 785
Published: 1985
Language: eng
Number of pages: 309
Subjects: Integrated circuits -- Large scale integration.; Integrated circuits -- Very large scale integration.
Notes: Typescript.

Thesis (Ph. D.)--State University of New York at Binghamton, Watson School of Engineering, Applied Science, and Technology, 1985.

Bibliography: leaves 220-225.