DBT 2004
Subtitle: 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA
By: edited by Sankaran Menon ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Committee.
Contributors: Menon, Sankaran M.; IEEE Computer Society. Test Technology Technical Committee.; IEEE VLSI Test Symposium (2004 : Napa, Calif.)
Publisher: IEEE
Published: 2004
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 112
Subjects: Metal oxide semiconductors, Complementary -- Congresses.; Integrated circuits -- Defects -- Congresses.; Iddq testing -- Congresses.
Genres: Congresses.
Other titles: VDSM chips and the need for defect based test; Current & defect based testing; Current and Defect Based Testing, 2004, DBT 2004, proceedings, 2004 IEEE International Workshop on.
Notes: Includes bibliographical references and author index.
2000 workshop as: IEEE International Workshop on Defect Based Testing.
" ... held in conjunctionwith the VLSI Test Symposium (VTS2004), in Napa, CA. The theme of this year's workshop "VDSM Chips and the Need for Defect Based Test ..."--P. v.
"IEEE Catalog Number 04EX1004"--Cover.
Also issued online with additional title: Current and Defect Based Testing, 2004, DBT 2004, proceedings, 2004 IEEE International Workshop on.