An investigation of bulk stacking faults in silicon using photocapacitance transient spectroscopy
By: by Hemendra G. Godbole.
Published: 1989
Language: eng
Number of pages: 45
Subjects: Spectrum analysis.; Semiconductors -- Defects.; Semiconductors -- Testing -- Optical methods.
Notes: Typescript (photocopy).

Thesis (M.S.)--Oregon State University, 1989.

Includes bibliographical references.