Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT  Workshop on Designing for Yield, 1-3 July 1987, Oxford
Publisher: Taylor & Francis; Adam Hilger
Published: January 1, 1988
Language: eng
Format: Hardcover
Number of pages: 304
ISBN-13: 9780852743980
Subjects: Circuits & components; General Theory of Computing; Very-Large-Scale Integration (Vlsi); Congresses; Design and construction; Integrated circuits; Very large scale integration; Computer Books: Operating Systems