Accelerated testing and on-sun failure of CPV die-attach
By: Nick Bosco and Sarah Kurtz ; IEEE, ASTR ; IEEE Components, Packaging, and Manufacturing Technology Society
Contributors: Kurtz, S. R.; Workshop on Accelerated Stress Testing & Reliability; Components, Packaging & Manufacturing Technology Society; National Renewable Energy Laboratory (U.S.)
Series: NREL/PR -- 5200-49243; NREL/PR -- 5200-49243.
Publisher: National Renewable Energy Laboratory
Published: 2010
Place of publication: Golden, CO
Language: eng
Format: [electronic resource] /
Number of pages: 22
Subjects: Solar energy; Congresses; Technological innovations; Solar cells; Research
Other titles: Accelerated testing and on sun failure of CPV die attach
Notes: Title from PDF title screen (NREL, viewed Apr. 11, 2011).

"Presented at the 2010 Workshop on Accelerated Stress Testing and Reliability, 8-9 October 2010, Denver, Colorado."