Two- and Three-dimensional Methods for Inspection and Metrology (SPIE Conference Proceedings)
Edition: Ill edition
Publisher: SPIE-International Society for Optical Engine
Published: December 5, 2005
Language: eng
Format: Paperback
Number of pages: 300
ISBN-13: 9780819460240
Subjects: Applied optics; Production engineering; Business & Economics; Technology & Industrial Arts; Business/Economics; Technical & Manufacturing Industries & Trades; Computer Vision; Optics; Quality Control