A reverse-bias safe operating area transistor tester
By: David W. Berning, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.
Contributors: Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division.
Series: Semiconductor measurement technology; NBS special publication ; 400-54; NBS special publication -- 400-54.
Publisher: Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1979
Place of publication: Washington
Language: eng
Number of pages: 37
Subjects: Transistors -- Testing.
Notes: Issued Mar. 1979.

CODEN: XNBSAV.

Bibliography: p. 14.