Prognozirovanie nadezhnosti mikroėlektronnoĭ apparatury na osnove BIS
By: G.A. Keĭdzhi͡an.
Edition: Nauch. izd.
Publisher: "Radio i svi͡azʹ"
Published: 1987
Place of publication: Moskva
Language: rus
Number of pages: 150
Subjects: Integrated circuits -- Large scale integration -- Reliability.
Notes: Bibliography: p. 148-[149]