Quantitative characterization of micro-topography
Subtitle: a bibliography of industrial surface metrology
By: by Richard J. Pike and Tom R. Thomas
Contributors: Thomas, Tom R; Geological Survey (U.S.)
Series: Open-file report -- 98-768; U.S. Geological Survey open-file report -- 98-768
Publisher: U.S. Dept. of the Interior, U.S. Geological Survey
Published: 1998
Place of publication: Menlo Park, CA
Language: eng
Format: Microform
Number of pages: 145
Subjects: Surfaces (Technology) -- Measurement -- Bibliography; Geomorphology; Earth -- Surface -- Measurement
Other titles: Quantitative characterization of micro topography
Notes: Cover title

"Provides 4800 literature citations on the quantification of micro- and nano-topographic surfaces and a brief introduction to the field of industrial surface metrology."

Shipping list no.: 2000-0015-M

Microfiche. [Denver, Colo. : U.S. Geological Survey, 1999?] 2 microfiches : negative