Sixth annual IEEE Semiconductor Thermal and Temperature Measurement Symposium, February 6-8, 1990, Sunburst Resort Hotel, Scottsdale, AZ, USA.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1990
Place of publication: New York, N.Y
Language: eng
Number of pages: 146
Subjects: Semiconductors -- Thermal properties -- Congresses.; Semiconductors -- Thermal properties -- Bibliography.
Other titles: 1990 IEEE 6th Annual Semiconductor Thermal & Temperature Measurement Symposium.
Notes: "Cumulative bibliography of articles on semiconductor thermal and temperature testing--1990": p. 120-142.

On cover and spine: 1990 IEEE 6th Annual Semiconductor Thermal & Temperature Measurement Symposium.

Includes bibliographical references.