Electron microscopy and analysis
By: P.J. Goodhew and F.J. Humphreys.
Contributors: Humphreys, F. J.
Edition: 2nd ed.
Publisher: Taylor & Francis
Published: 1988
Place of publication: London; New York
Language: eng
Number of pages: 232
Subjects: Electron microscopy.
Notes: Bibliography: p. [222]-223.
Includes index.