Advances in X-Ray Analysis
Subtitle: Volume 36
By: edited by John V. Gilfrich, Camden R. Hubbard, Ron Jenkins, Deane K. Smith, Ting C. Huang, Michael R. James, Gerald R. Lachance, Paul K. Predecki
Contributors: Hubbard, Camden R.; Jenkins, Ron; Smith, Deane K.; Huang, Ting C.; James, Michael R.; Lachance, Gerald R.; Predecki, Paul K.
Publisher: Springer US; Imprint; Springer
Published: 1993
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] :
Number of pages: 710
ISBN-13: 9781461529729