The physics of SiO₂ and its interfaces
Subtitle: proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978
By: editor, Sokrates T. Pantelides.
Contributors: Pantelides, Sokrates T.
Publisher: Pergamon Press
Published: 1978
Place of publication: New York
Language: eng
Number of pages: 488
Subjects: Silica -- Congresses.; Surfaces (Physics) -- Congresses.; Surface chemistry -- Congresses.
Notes: Includes bibliographical references and index.