Long-term prediction test procedure for most ICs, based on linear response theory
Subtitle: final report
By: by V. Litovchenko and I. Ivakhnenko.
Contributors: Ivakhnenko, I.; United States. National Aeronautics and Space Administration.
Series: NASA contractor report -- NASA CR-185843.
Publisher: Vitreous State Laboratory, Catholic University of America; [National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1991
Place of publication: Washington, D.C; Springfield, Va
Language: eng
Format: Microform
Subjects: Integrated circuits -- Testing.; Radiation.
Other titles: Long term prediction test procedure for most ICs, based on linear response theory.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 92-0167-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1991] 1 microfiche.