Materials Reliability in Microelectronics #8
Subtitle: Symposium Held April 13-16, 1998, San Francisco, California, U.S.A. (Materials Research Society Symposium Proceedings Volume 516)
Contributors: John C. Bravman (Editor); T. N. Marieb (Editor); John R. Lloyd (Editor); Matt A. Korhonen (Editor)
Publisher: Materials Research Society
Published: December 1998
Language: eng
Format: Hardcover
Number of pages: 365
ISBN-13: 9781558994225
Subjects: Technology; Electronics - General; Technology & Industrial Arts; Science/Mathematics; Electronics - Microelectronics