Advances in imaging and electron physics
By: edited by Peter W. Hawkes
Publisher: Elsevier/Academic Press
Published: 2007
Place of publication: Amsterdam; Boston
Language: eng
Format: [electronic resource] /
ISBN-13: 9780080488127
Subjects: Electricity; SCIENCE; Electron microscopes; Microscopy; Physics; Electrons; Image processing; Electromagnetism
Description: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Notes: Title from PDF title page (viewed Sep. 9, 2007).
Table of contents: title: Front cover; Advances in Imaging and Electron Physics; Copyright page; Contents; Contributors; Preface; Future Contributions; Chapter 1. Spiral Phase Microscopy; Color Insert; Chapter 2. LULU Theory, Idempotent Stack Filters, and the Mathematics of Vision of Marr; Chapter 3. Bayesian Information Geometry: Application to Prior Selection on Statistical Manifolds; Index.