Semiconductor device reliability
By: edited by A. Christou and B.A. Unger.
Contributors: Christou, A.; Unger, B. A.
Series: NATO ASI series. Series E: Applied sciences ;; vol. 175; NATO ASI series.; no. 175.
Publisher: Kluwer Academic Publishers
Published: 1990
Place of publication: Dordrecht; Boston
Language: eng
Number of pages: 575
Subjects: Semiconductors -- Reliability -- Congresses
Notes: Includes bibliographical references.
"Proceedings of the NATO Advanced Research Workshop on Semiconductor Device Reliability, Heraklio, Crete, Greece, June 4-9, 1989"--T.p. verso.
"Published in cooperation with NATO Scientific Affairs Division."