ICMTS 92
Subtitle: proceedings of the 1992 International Conference on Microelectronic Test Structures : March 16-19, 1992, San Diego, California
By: sponsored by the IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1991
Place of publication: New York, N.Y
Language: eng
Number of pages: 214
Subjects: Integrated circuits -- Testing -- Congresses.; Miniature electronic equipment -- Testing -- Congresses.
Other titles: Proceedings of the 1992 International Conference on Microelectronic Test Structures.; 1992 IEEE International Conference on Microelectronic Test Structures.
Notes: "IEEE Catalog Number: 92CH3102-1."

On cover and spine: 1992 IEEE International Conference on Microelectronic Test Structures.

Includes bibliographical references.