Scaling effects on metal-oxide-semiconductor device characteristics
Publisher: Gainesville, FL
Published: 1997
Language: eng
Number of pages: 147
Subjects: Metal oxide semiconductors.
Description: <a href="http://uf.catalog.fcla.edu/uf.jsp?st=UF028638920&ix=pm&I=0&V=D&pm=1" rel="nofollow">http://uf.catalog.fcla.edu/uf.jsp?st=UF028638920&ix=pm&I=0&V=D&pm=1</a>