Noise and information in nanoelectronics, sensors, and standards
Subtitle: 2-4 June 2003, Santa Fe, New Mexico, USA
By: Laszlo B. Kish ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] TAMU Telecommunications Task Force (USA) ; published by SPIE--the International Society for Optical Engineering.
Contributors: Kish, Laszlo B.; Society of Photo-optical Instrumentation Engineers; Texas A & M University. Dept. of Electrical Engineering. Telecommunications Task Force.
Series: SPIE proceedings series ;; v. 5115; Proceedings of SPIE--the International Society for Optical Engineering.; v. 5115.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 430
Subjects: Electronic noise -- Congresses.; Electronic noise -- Standards -- Congresses.; Quantum electronics -- Congresses.; Nanotechnology -- Congresses.; Information technology. -- Congresses.; Detectors. -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and author index.