International Test Conference 1993
Subtitle: proceedings.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers.
Publisher: International Test Conference
Published: 1993
Place of publication: Altoona, PA
Language: eng
Number of pages: 1065
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.
Other titles: 1993 IEEE International Test Conference.; Proceedings: International Test Conference 1993.
Notes: "IEEE catalog number 93CH3356-3."

"IEEE Computer Society Press Order Number 4192-02."

On cover and spine: 1993 IEEE International Test Conference.

Includes bibliographical references.