Emerging nanotechnologies
Subtitle: test, defect tolerance, and reliability
By: Mohammad Tehranipoor, editor
Series: Frontiers in electronic testing -- 37; Frontiers in electronic testing -- 37.
Publisher: Springer Verlag
Published: 2008
Place of publication: New York
Language: eng
Number of pages: 405
ISBN-13: 9780387747460; 9780387747477
Subjects: Nanotechnology; Microtechnology
Notes: Includes bibliographical references and index.