Digital systems testing and testable design
By: Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
Contributors: Breuer, Melvin A.; Friedman, Arthur D.
Edition: Rev. print.
Publisher: IEEE Press
Published: 1994
Place of publication: New York
Language: eng
Number of pages: 652
Subjects: Digital integrated circuits -- Testing.; Digital integrated circuits -- Design and construction.
Notes: Includes bibliographical references and index.