Reliability and hot-electron effects in analog and mixed-mode circuits
By: by David Ying Ge.
Published: 1993
Language: eng
Number of pages: 66
Subjects: Hot carriers.; Integrated circuits -- Reliability.; Metal oxide semiconductor field-effect transistors.; Differential amplifiers.
Notes: Typescript (photography)

Thesis (M.S.)--Oregon State University, 1993.

Includes bibliographical references (leaves 51-53)