IEEE Computer Society Conference on Pattern Recognition and Image Processing
Subtitle: proceedings, June 6-8, 1977, Rensselaer Polytechnic Institute, Troy, New York.
Contributors: IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis Committee.
Publisher: The Society
Published: 1977
Place of publication: Long Beach, Calif
Language: eng
Number of pages: 399
Subjects: Pattern perception -- Congresses.; Image processing -- Congresses.; Optical character recognition devices -- Congresses.
Genres: Congresses.
Notes: Sponsored by the Machine Intelligence and Pattern Analysis Committee of the IEEE Computer Society.

"77CH1208-9C."

Includes bibliographical references.