Integration of test with design and manufacturing
Subtitle: proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C.
By: sponsored by the IEEE Computer Society, IEEE Philadelphia Section.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: Computer Society Press of the IEEE; Order from Computer Society of the IEEE
Published: 1987
Place of publication: Washington, D.C; Los Angeles, CA
Language: eng
Number of pages: 1151
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Notes: Includes bibliographies and index.
"IEEE catalog no. 87CH2347-2."
"Computer Society order no. 789."