X-ray optics and X-ray microanalysis
Subtitle: 3rd International Symposium, Stanford University, Stanford, California, August,1962
By: edited by H.H. Pattee, V.E. Cosslett, Arne Engström.
Contributors: Pattee, Howard H.; Cosslett, V. E.; Engström, Arne.
Publisher: Academic Press
Published: 1963
Place of publication: New York; London
Language: eng
Number of pages: 622
Notes: Previous symposium entitled 'Proceedings of the 2nd International Symposium on X-ray Microscopy and X-ray Microanalysis, Stockholm,1960.