Error analysis and calibration uncertainty of capacitance standards at NIST
By: Y. May Chang.
Contributors: National Institute of Standards and Technology (U.S.)
Series: NIST special publication -- 250-52.; NIST special publication
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 2000
Place of publication: Gaithersburg, MD; [Washington, DC
Language: eng
Format: Microform
Subjects: Capacitance meters -- Calibration.; Electric capacity -- Standards -- United States.
Notes: Shipping list no.: 2000-0465-M.

"January 2000."

Includes bibliographical references (p. 38-39).

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2000 2 microfiches : negative.