Integrated circuit failure analysis
Subtitle: a guide to preparation techniques
By: Friedrich Beck ; translated by Stephen S. Wilson.
Series: Wiley series in quality and reliability engineering
Publisher: Wiley
Published: 1998
Place of publication: Chichester; New York
Language: eng
Number of pages: 173
Subjects: Semiconductors -- Failures.; Semiconductors -- Testing.
Notes: Includes bibliographical references and index.