Examining the submicron world
By: edited by Ralph Feder, J. Wm. McGowan and Douglas M. Shinozaki.
Contributors: Feder, Ralph.; McGowan, J. William 1931-; Shinozaki, Douglas M.
Series: NATO ASI series.; v. 137
Publisher: Plenum Press
Published: 1986
Place of publication: New York
Language: eng
Number of pages: 372
Subjects: Electron microscopy -- Congresses.; X-ray microscopy -- Congresses.; Ultrastructure (Biology) -- Congresses.
Notes: Includes bibliographies and index.
"Proceedings of a NATO Advanced Study Institute on Improved Methods for Examining the Submicron World, held July 28-August 11, 1984, in Nova Scotia"--T.p. verso.