ICMTS 1998
Subtitle: proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
By: sponsored by the IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1998
Place of publication: [New York]
Language: eng
Number of pages: 240
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.; Electronic apparatus and appliances -- Testing -- Congresses.
Notes: Includes bibliographical references and index.
"IEEE catalog number: 98CH36157"--T.p. verso.