Machine vision applications in industrial inspection XII
Subtitle: 21-22 January, 2004, San Jose, California, USA
By: Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
Contributors: Price, Jeffery Ray, 1970-; Mériaudeau, Fabrice.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE,; v. 5303; Proceedings, Electronic Imaging Science and Technology; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5303.
Publisher: SPIE
Published: 2004
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 204
Subjects: Engineering inspection -- Automation -- Congresses; Computer vision -- Industrial applications -- Congresses; Quality control -- Optical methods -- Automation -- Congresses; Mensuration -- Congresses
Genres: Congresses.
Other titles: Proceedings of electronic imaging science and technology; Electronic imaging science and technology
Notes: Includes bibliographical references and index.