Reliability of gallium arsenide MMICs
By: edited by Aris Christou.
Contributors: Christou, A.
Series: Design and measurement in electronic engineering
Publisher: Wiley; Brand: Wiley
Published: 1992
Place of publication: Chichester; New York
Language: eng
Number of pages: 457
Subjects: Microwave integrated circuits -- Reliability.; Microwave integrated circuits -- Testing.; Gallium arsenide semiconductors -- Reliability.; Gallium arsenide semiconductors -- Testing.
Notes: Includes bibliographical references and index.