Měření integrovaných obvodů
Subtitle: [určeno také pro stud. odb. škol]
By: Tomáš Gucký.
Edition: 1. vyd.
Series: Polovodičová technika ; 18
Publisher: SNTL
Published: 1977
Place of publication: Praha
Language: cze
Number of pages: 347
Subjects: Integrated circuits -- Testing.; Electronic measurements.
Notes: Bibliography: p. 340-344.
Part of illustrative matter inserted.
Includes index.