Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
By: editors, D.K. Schroder, J.L. Benton, P. Rai-Choudhury.
Contributors: Schroder, Dieter K.; Benton, J. L.; Rai-Choudhury, P.
Series: Proceedings / Electrochemical Society ;; v. 94-33; Proceedings (Electrochemical Society) ;; v. 94-33.
Publisher: Electrochemical Society
Published: 1994
Place of publication: Pennington, NJ
Language: eng
Number of pages: 387
Subjects: Semiconductors -- Testing -- Congresses.
Other titles: Diagnostic techniques for semiconductor materials and devices
Notes: Includes bibliographical references and indexes.