Computed electron micrographs and defect identification.
By: By A. K. Head, P. Humble, L. M. Clarebrough, a.o.
Contributors: Head, A. K.
Series: Defects in crystalline solids,; v. 7
Publisher: North-Holland Pub. Co.
Published: 1973
Place of publication: Amsterdam
Language: eng
Number of pages: 400
Subjects: Metals -- Defects -- Data processing.; Electron microscopy -- Data processing.
Notes: Bibliography: p. [387]-389.