Quantitative X-ray diffractometry
By: Lev S. Zevin, Giora Kimmel ; edited by Inez Mureinik.
Contributors: Kimmel, Giora.; Mureinik, Inez.
Publisher: Springer
Published: 1995
Place of publication: New York
Language: eng
Number of pages: 372
Subjects: X-rays -- Diffraction.; X-rays -- Diffraction -- Industrial applications.
Notes: Includes bibliographical references (p. 355-364) and index.