X-Ray Spectrometry in Electron Beam Instruments
By: edited by David B. Williams, Joseph I. Goldstein, Dale E. Newbury
Contributors: Goldstein, Joseph I.; Newbury, Dale E.
Publisher: Springer US; Imprint; Springer
Published: 1995
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
Number of pages: 390
ISBN-13: 9781461518259
Description: This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.