Uses of Auger and x-ray photoelectron spectroscopy in the study of adhesion and friction
By: Kazuhisa Miyoshi.
Contributors: United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum -- 103266
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1990
Place of publication: [Washington, DC]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Adhesion.; Auger spectroscopy.; Friction.; Photoelectron spectroscopy.; Surface properties.; X ray spectroscopy.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1991] 1 microfiche.