Electron microscopy and analysis
By: Peter J. Goodhew, John Humphreys, Richard Beanland.
Contributors: Beanland, R.; Humphreys, F. J.
Edition: 3rd ed.
Publisher: Taylor & Francis
Published: 2001
Place of publication: London; New York
Language: eng
Number of pages: 251
Subjects: Electron microscopy.
Notes: Includes bibliographical references and index.