International Test Conference, 1991
Subtitle: proceedings.
Contributors: Institute of Electrical and Electronics Engineers.
Publisher: The Conference
Published: 1991
Place of publication: Altoona, PA
Language: eng
Number of pages: 1135
Subjects: Integrated circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Other titles: 1991 IEEE International Test Conference.; IEEE International Test Conference.
Notes: Includes bibliographical references and index.
"1991 IEEE International Test Conference"--Cover.
Twenty-second meeting held in Nashville, Tenn.
"IEEE catalog number 91CH3032-0"--T. p. verso.