Scanning electron microscopy 1971
Subtitle: proceedings of the: part 1 (April 27-29, 1971) Fourth Annual Scanning Electron Microscope Symposium and part 2 (April 30, 1971) Workshop on Forensic Applications of the Scanning Electron Microscope
By: edited by Om Johari and Irene Corvin.
Contributors: Johari, Om.; Corvin, Irene.; IIT Research Institute.; Workshop on Forensic Applications of the Scanning Electron Microscope (1971 : Chicago)
Publisher: I.I.T. Research Institute
Published: 1971
Place of publication: Chicago
Language: eng
Number of pages: 618
Notes: Part 1 sponsored by the Illinois Institute of Technology Research Institute; part 2 sponsored by the National Institute of Law Enforcement and Criminal Justice.