Graphical solution for the helium leak detector and radioisotope methods of hermetic test
Subtitle: master graphs and instructions
By: Stanley Ruthberg.
Contributors: Center for Electronics and Electrical Engineering (U.S.)
Series: Semiconductor measurement technology; NBS special publication ;; 400-73
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1982
Place of publication: Washington, D.C
Language: eng
Number of pages: 36
Subjects: Semiconductors -- Testing.; Leak detectors.
Notes: Includes bibliographical references.
"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
"Issued November 1982."
S/N 003-003-02453-8
Item 247 (microfiche)