Secondary ion mass spectrometry
Subtitle: proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974
By: edited by K. F. J. Heinrich and D. E. Newbury. --
Contributors: Heinrich, Kurt F. J.; Newbury, Dale E.
Series: National Bureau of Standards special publication ; 427; NBS special publication -- 427.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1975
Place of publication: Washington
Language: eng
Number of pages: 227
Subjects: Secondary ion mass spectrometry -- Congresses.; Microprobe analysis -- Congresses.
Genres: Congresses.
Notes: "CODEN: XNBSAV."

Includes bibliographical references and index.