Beam Injection Assessment of Microstructures in Semiconductors
Subtitle: Biams 2000 (Solid State Phenomena)
Contributors: Hajime Tomokage (Editor); Takashi Sekiguchi (Editor)
Publisher: Scitec Pubns
Published: July 2001
Language: eng
Format: Paperback
Number of pages: 522
ISBN-13: 9783908450610
Subjects: Technology; Science/Mathematics; Electronics - Semiconductors; Condensed matter physics (liquids & solids); Materials science; Semi-conductors & super-conductors