High performance memory testing
Subtitle: design principles, fault modeling, and self-test
By: R. Dean Adams
Contributors: Knovel (Firm)
Series: Frontiers in electronic testing; Frontiers in electronic testing
Publisher: Kluwer Academic
Published: 2003
Place of publication: Boston
Language: eng
Number of pages: 246
ISBN-13: 9781601193445
Copyright date: 2003
Subjects: Semiconductor storage devices; Testing; Computer storage devices
Notes: Includes bibliographical references (p. [229]-239) and index.

Electronic reproduction. Norwich, N.Y. : Knovel, 2007. System requirements: Adobe Acrobat Reader. Available via the World Wide Web. Access restricted to users at licensed institutions. Includes interactive index.