Fourth IEEE International Symposium on Electronic Design, Test and Applications  : proceedings : [Delta]'08 : 23-25 January 2008, SAR, China
By: editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology ; with industrial co-sponsorship Celoxica Ltd., UK, Solomon Sytech Limited, HK, National Instruments, HK ; in cooperation with Chinese University of Hong Kong.
Contributors: Osseiran, Adam.; IEEE Computer Society. Technical Council on Test Technology.; National Instruments.; IEEE Hong Kong Section Electron Devices Society.; Hong Kong University of Science and Technology.; Chinese University of Hong Kong.
Publisher: IEEE Computer Society
Published: 2008
Place of publication: Los Alamitos, Calif
Language: eng
ISBN-13: 9780769531106
Subjects: Electronics -- Design -- Congresses; Electronics -- Testing -- Congresses
Genres: Congresses.
Other titles: International Workshop on Electronic Design, Test and Applications; DELTA 2008
Notes: In the title, Delta is represented by the Greek letter.

"IEEE Computer Society Order Number P3110."--T.p. verso.

Includes bibliographical references and author index.