Safe operating area limits for power transistors
By: David L. Blackburn.
Series: Semiconductor measurement technology; NBS special publication ; 400-44; NBS special publication ;; 400-44.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1977
Place of publication: Washington
Language: eng
Number of pages: 14
Subjects: Power transistors -- Testing.
Notes: Includes bibliographical references.