Atom Probe Tomography
Subtitle: Analysis at the Atomic Level
Edition: 1 edition
Publisher: Springer
Published: July 31, 2000
Language: eng
Format: Hardcover
Number of pages: 250
ISBN-13: 9780306464157
Subjects: Materials science; Microscopy; Engineering Instruments; Microscopy In Biology; Technology; Technology & Industrial Arts; Science/Mathematics; Material Science; Microscopes & Microscopy; Scanning Systems; Technology / Material Science; Mensuration; Atom-probe field ion microscop; Atom-probe field ion microscopy; Tomography
First sentence: One of the dreams in the characterization of materials is to be able to identify and determine the positions of all the atoms in a material with atomic precision.