Symposium on Advances in Electron Metallography and Electron Probe Microanalysis.
By: Sponsored by Subcommittee XI on Electron Microstructure of ASTM Committee E-4 on Electron Metallography, held at Atlantic City, N.J., June 28, 1960, and June 26, 1961.
Contributors: American Society for Testing Materials. Committee E-4 on Electron Metallography.
Series: ASTM special technical publication -- no. 317.; ASTM special technical publication -- 317.
Publisher: American Society for Testing and Materials
Published: 1962
Place of publication: Philadelphia
Language: eng
Number of pages: 207
Subjects: Metallography.; Electron microscopes.
Notes: Includes bibliographies.