Strukturelle und elektronische Eigenschaften amorpher Silizium-Suboxide
By: Rainer Janssen
Edition: 1. Aufl.
Series: Selected topics of semiconductor physics and technology -- vol. 31
Publisher: Walter Schottky Institut, Technische Universität München
Published: 2000
Place of publication: München
Language: ger
Number of pages: 275
Other titles: Eigenschaften amorpher Silizium-Suboxide