Analysis of microelectronic materials and devices
By: edited by M. Grasserbauer and H.W. Werner.
Contributors: Grasserbauer, M. 1945-; Werner, H. W.
Publisher: Wiley
Published: 1991
Place of publication: Chichester; New York
Language: eng
Number of pages: 934
Subjects: Microelectronics -- Materials -- Testing.; Microstructure.; Microelectronics -- Testing.
Notes: Includes bibliographical references and index.