Advances in Imaging and Electron Physics, Volume 140 (Advances in Imaging and Electron Physics) (Advances in Imaging and Electron Physics)
Publisher: Academic Press
Published: May 26, 2006
Language: eng
Format: Hardcover
Number of pages: 336
ISBN-13: 9780120147823
Subjects: Electronics & Communications Engineering; Science; Engineering - Mechanical; Technology; Science/Mathematics; Electron Microscopes & Microscopy; Engineering - Electrical & Electronic; Mathematical Physics; Technology / Material Science; Electronics - Microelectronics; Material Science
First sentence: Pattern recognition algorithms and statistical classifiers, such as neural networks or support vector machines (SVMs), can deal with real-life noisy data in an efficient way, so that they can be successfully applied in several different domains.