Proceedings of technical papers
By: 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT), April 27-29, 2005, Ambassador Hotel Hsinchu, Taiwan ; [sponsored by] Industrial Technology Research Institute, IEEE, [and] TSIA.
Contributors: Gong ye ji shu yan jiu yuan.; Institute of Electrical and Electronics Engineers.; Taiwan Semiconductor Industry Association.
Publisher: ERSO/ITRI
Published: 2005
Place of publication: Hsinchu, Taiwan
Language: eng
Number of pages: 348
Subjects: Integrated circuits -- Very large scale integration -- Congresses.
Genres: Congresses.
Other titles: VLSI design, automation & test
Notes: "IEEECatalog number : 05TH8803."

Includes bibliographical references.