ARPA/NBS workshop III
Subtitle: test patterns for integrated circuits
By: Harry A. Schafft, editor.
Series: Semiconductor measurement technology; NBS special publication ; 400-15; NBS special publication ;; 400-15.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1976
Place of publication: Washington
Language: eng
Number of pages: 46
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic industries -- Quality control -- Congresses.; Automatic data collection systems -- Congresses.
Notes: Includes bibliographical references.
Consists of synopses of talks and discussions presented at the workshop held Sept. 6, 1974 in Scottsdale, Ariz.