An analysis of aliasing in built-in self test procedure
Contributors: Yang, Chyan
Publisher: Naval Postgraduate School; Available from the National Technical Information Service
Published: 1991
Place of publication: Monterey, Calif; Springfield, Va
Language: eng
Number of pages: 71
Notes: Thesis advisor, Chyan Yang.

AD-A246 905.

Thesis (M.S. in Electrical Engineering) Naval Postgraduate School, June 1991.

Includes bibliographical references.