Advanced Techniques in Failure Analysis Symposium
Subtitle: proceedings.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1976
Place of publication: Los Angeles
Language: eng
Number of pages: 116
Subjects: Electronic apparatus and appliances -- Testing -- Congresses.
Genres: Congresses.
Notes: "IEEE catalog no.: 76CH1092-6REG6."

Includes bibliographies.