A programmable reverse-bias safe operating area transistor tester
By: D.W. Berning.
Contributors: National Institute of Standards and Technology (U.S.)
Series: NIST special publication -- 400-87; Semiconductor measurement technology; NIST special publication -- 400-87.; Semiconductor measurement technology
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology; Order from National Technical Information Service]
Published: 1990
Place of publication: Gaithersburg, MD; [Springfield, VA
Language: eng
Format: Microform
Number of pages: 54
Subjects: Transistors -- Testing.
Other titles: Programmable reverse bias safe operating area transistor tester.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 92-1526-M.

Paper version no longer for sale by the Supt. of Docs.

"August 1990."

"CODEN: NSPUE2"--T.p. verso.

Includes bibliographical references (p. 54).

Final.

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative.