Advances in X-Ray Analysis
Subtitle: Volume 33 (Advances in X-Ray Analysis)
Contributors: Charles S. Barrett (Editor); John V. Gilfrich (Editor); Ting C. Huang (Editor); Ron Jenkins (Editor)
Edition: 1 edition
Publisher: Springer
Published: June 1, 1990
Language: eng
Format: Hardcover
Number of pages: 724
ISBN-13: 9780306436154
Subjects: Chemical spectroscopy, spectrochemistry; Materials science; Mechanical Properties Of Materials; Structural Properties Of Materials; Science; Science/Mathematics; Science / Physics; Physics