Speckle metrology
By: edited by Rajpal S. Sirohi.
Contributors: Sirohi, R. S.
Series: Optical engineering ;; 38; Optical engineering (Marcel Dekker, Inc.) ;; v. 38.
Publisher: Marcel Dekker
Published: 1993
Place of publication: New York
Language: eng
Number of pages: 551
Subjects: Nondestructive testing.; Speckle metrology.
Notes: Includes bibliographical references and index.