Electrical Overstress/Electrostatic Discharge Symposium proceedings 1983
Subtitle: Las Vegas, Nevada, September 27, 28, 29, 1983
By: sponsored by IIT Research Institute.
Contributors: IIT Research Institute.; Reliability Analysis Center (U.S.)
Publisher: Reliability Analysis Center
Published: 1984
Place of publication: Griffiss AFB, N.Y
Language: eng
Number of pages: 217
Subjects: Electronic apparatus and appliances -- Protection -- Congresses.; Electric discharges -- Congresses.; Electrostatics -- Congresses.
Notes: "EOS-5".

On spine: EOD/ESD Symposium proceedings.

Includes bibliographical references.