Determining nanoscale physical properties of materials by microscopy and spectroscopy
Subtitle: symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A.
By: editors, Mehmet Sarikaya, H. Kumar Wickramasinghe, Michael Isaacson.
Contributors: Sarikaya, Mehmet.; Wickramasinghe, H. Kumar.; Isaacson, Michael
Series: Materials Research Society symposium proceedings,; v. 332; Materials Research Society symposia proceedings ;; v. 332.
Publisher: Materials Research Society
Published: 1994
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 622
Subjects: Nanostructures -- Analysis -- Congresses.; Microscopy -- Technique -- Congresses.; Spectrum analysis -- Congresses.
Notes: Includes bibliographical references and indexes.