Seventh Annual IEEE Semiconductor Thermal Measurement and Management Symposium, February 12-14, 1991, Sunburst Resort Hotel, Scottsdale, AZ, USA
By: guest editor, Robert Simons.
Contributors: Simons, Robert; Siegal, Bernard.; Institute of Electrical and Electronics Engineers.; IEEE Components, Hybrids, and Manufacturing Technology Society.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1991
Place of publication: New York, NY
Language: eng
Number of pages: 176
Subjects: Semiconductors -- Thermal properties -- Congresses; Semiconductors -- Cooling -- Congresses; Electronic circuits -- Temperature compensation -- Congresses
Other titles: 1991 IEEE 7th Annual Semiconductor Thermal Measurement & Management Symposium.; 7th Annual IEEE Semiconductor Thermal Measurement and Management Symposium.
Notes: Sponsored by the Components, Hybrids, & Manufacturing Technology Society.

Cover title: 1991 IEEE 7th Annual Semiconductor Thermal Measurement & Management Symposium.

"Formerly the IEEE Semiconductor Thermal and Temperature Measurement Symposium."-- T.p. verso.

Includes bibliographical references.

"Cumulative bibliography of articles on semiconductor thermal and temperature testing, 1991, compiled by Bernard Siegal": p. 151-174.