Advanced sensor technologies for nondestructive evaluation and structural health monitoring
Subtitle: 8-10 March 2005, San Diego, California, USA
By: Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Meyendorf, Norbert.; Baaklini, George Y.; Michel, Bernd, 1949-; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE -- v. 5770; Proceedings of SPIE--the International Society for Optical Engineering -- v. 5770.
Publisher: SPIE
Published: 2005
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 214
Subjects: Structural analysis (Engineering) -- Congresses; Structural health monitoring -- Congresses; Detectors -- Congresses; Automatic data collection systems -- Congresses; Nondestructive testing -- Congresses
Genres: Congresses
Notes: Includes bibliographical references and index.