ITC
Subtitle: International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA
By: sponsored by IEEE Computer Society Test Technology Technical Council, and IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: International Test Conference; IEEE
Published: 2001
Place of publication: Washington, D.C; Piscataway, New Jersey
Language: eng
Number of pages: 1201
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Telecommunication -- Congresses.; Radio frequency -- Congresses.
Genres: Congresses.
Other titles: 2001 IEEE International Test Conference
Notes: Also available via the World Wide Web.
Includes bibliographic references and author index.
Conference number inferred.
Cover title.
"IEEE Catalog Number 01CH37260"--verso of T.p.