Tolerating failures of continuous-valued sensors
By: Keith Marzullo.
Contributors: Ames Research Center.
Series: NASA CR -- 187028.; Technical report. Cornell University. Dept. of Computer Science -- 90-1156.; NASA contractor report -- NASA CR-187028.
Publisher: Cornell University, Dept. of Computer Science; NASA Ames Research Center; For sale by the National Technical Information Service
Published: 1990
Place of publication: Ithaca, N.Y; [Moffett Field, Calif; Springfield, Va
Language: eng
Format: Microform
Subjects: Process control.; Fault-tolerant computing.; Computer programming.; Computerized simulation.; Distributed processng.; Failure analysis.; Fault tolerance.; Process control (Industry)
Notes: Also available via Internet from the NASA Technical Report Server web site. Address as of 9/8/05: http://ntrs.nasa.gov/archive/nasa/casi.ntrs.nasa.gov/19900018719%5F1990018719.pdf ; current access is available via PURL.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1990]. 1 microfiche.