X-ray diffraction at elevated temperatures
Subtitle: a method for in situ process analysis
By: D.D.L. Chung ... [et al.].
Contributors: Chung, Deborah D. L.
Publisher: VCH
Published: 1993
Place of publication: New York
Language: eng
Number of pages: 268
Subjects: X-rays -- Diffraction.; X-rays -- Industrial applications.
Notes: Includes bibliographical references and index.