Sovremennye tendent͡sii v tekhnike spektroskopii
By: otvetstvennyĭ redaktor S.G. Rautian
Contributors: Institut avtomatiki i ėlektrometrii (Akademii͡a nauk SSSR); Novosibirskiĭ institut inzhenerov geodezii, aėrofotosʺemki i kartografii
Publisher: Izd-vo "Nauka," Sibirskoe otd-nie
Published: 1982
Place of publication: Novosibirsk
Language: rus
Number of pages: 211
Subjects: Spectrum analysis; Optoacoustic spectroscopy
Notes: At head of title: Akademii͡a nauk SSSR. Sibirskoe otdelenie. Institut avtomatiki i ėlektrometrii. Ministerstvo vysshego i srednego spet͡sialʹnogo obrazovanii͡a RSFSR. Novosibirskiĭ institut inzhenerov geodezii, aġerofotosʺemki i kartografii.

Includes bibliographical references.