High stakes testing
Subtitle: new challenges and opportunities for school psychology
By: Louis J. Kruger, David Shriberg.
Contributors: Kruger, Louis J.; Shriberg, David.
Publisher: Haworth Press; Routledge
Published: 2007
Place of publication: New York
Language: eng
Number of pages: 175
ISBN-13: 9780789035219; 9780789035394
Subjects: School psychology -- United States; Educational tests and measurements -- United States
Notes: "Co-published simultaneously as Journal of Applied School Psychology, Volume 23, Number 2, 2007."

Includes bibliographical references and index.