Photoinduced defects in semiconductors
By: David Redfield and Richard H. Bube.
Contributors: Bube, Richard H., 1927-
Series: Cambridge studies in semiconductor physics and microelectronic engineering ;; 4
Publisher: Cambridge University Press
Published: 1996
Place of publication: Cambridge; New York
Language: eng
Number of pages: 217
Subjects: Semiconductors -- Defects.; Photochemistry.
Notes: Includes bibliographical references (p. 201-214) and index.