Electron beam microanalysis
By: by D. R. Beaman and J. A. Isasi.
Contributors: Isasi, J. A., joint author.
Series: ASTM special technical publication 506; ASTM special technical publication ;; 506.
Publisher: American Society for Testing and Materials
Published: 1972
Place of publication: Philadelphia
Language: eng
Number of pages: 79
Subjects: Microchemistry.; Electron probe microanalysis.; Electron microscopy.
Notes: Bibliography: p. 75-[80]