ICMTS 93
Subtitle: proceedings of the 1993 International Conference on Microelectronic Test Structures : March 22-25, 1993, Sitges, Barcelona, Spain
By: sponsored by the IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: IEEE; IEEE Service Center [distributor]
Published: 1993
Place of publication: New York; Piscataway, NJ
Language: eng
Number of pages: 298
Subjects: Integrated circuits -- Testing -- Congresses; Microelectronics -- Congresses
Genres: Congresses.
Other titles: Proceedings of the 1993 International Conference on Microelectronic Test Structures.; 1993 IEEE International Conference on Microelectronic Test Structures.; Microelectronic Test Structures, 1993, ICMTS 1993, Proceedings of the 1993 International Conference on.
Notes: "93CH3220-1."

Includes bibliographical references and index.

Also available via the World Wide Web with additional title: Microelectronic Test Structures, 1993, ICMTS 1993, Proceedings of the 1993 International Conference on.