Practical scanning electron microscopy
Subtitle: electron and ion microprobe analysis, edited by Joseph I. Goldstein and Harvey Yakowitz; forword by T.E. Everhart.
Contributors: Yakowitz, H., jt. author
Publisher: Plenum Press
Published: 1977
Place of publication: New York
Language: eng
Number of pages: 582
Subjects: Scanning electron microscope; Microprobe analysis
Notes: Includes bibliographical references and index.