Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films
By: A. W. Czanderna, SERI, H. Helbig, Clarkson College of Technology, E. T. Prince, Clarkson College of Technology
Contributors: Helbig, H., joint author; Prince, Eric T., joint author; United States. Dept. of Energy. Division of Solar Energy; Solar Energy Research Institute; Clarkson College of Technology
Series: SERI/TP ; 31-064
Publisher: Dept. of Energy, Division of Solar Technology
Published: 1978
Place of publication: [Washington]
Language: eng
Number of pages: 14
Subjects: Thin films -- Optical properties -- Measurement; Specular reflectance -- Measurement; Mass (Physics) -- Measurement
Notes: Contract EG-77-C-01-4042

Issued Nov. 1978

Includes bibliographical references