Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics, and Analysis
Subtitle: 8-11 October 1996, Enschede, The Netherlands
By: edited by Guido Groeseneken ... [et al.].
Contributors: Groeseneken, Guido.
Publisher: Pergamon
Published: 1996
Place of publication: [Oxford; New York]
Language: eng
Number of pages: 343
Subjects: Electronic apparatus and appliances -- Reliability -- Congresses.
Other titles: Reliability of electron devices, failure physics, and analysis; ESREF 96
Notes: Includes bibliographical references and index.
Pages also numbered 1603-1946.
"IEEE catalog number 96TH8196"--T.p. verso.
"Published as a special issue of the journal Microelectronics and reliability, Vol. 36, no. 11/12 (1996)"--T.p. verso.