Proceedings
Subtitle: thirty-first annual meeting, Electron Microscopy Society of America, New Orleans, Louisiana, August 14, 15, 16, and 17, 1973
By: edited by Claude J. Arceneaux.
Contributors: Arceneaux, Claude J.
Publisher: Claitor
Published: 1973
Place of publication: Baton Rouge, LA
Language: eng
Number of pages: 709
Subjects: Electron microscopes -- Congresses.
Genres: Congresses.
Notes: Bibliogr.

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