Proceedings of the symposia on reliability of semiconductor devices/interconnections and dielectric breakdown, and laser process for microelectronic applications
By: edited by Hazara S. Rathore, G.S. Mathad, Du B. Nguyen.
Contributors: Mathad, G. S.; Nguyen, Du B.; Electrochemical Society. Dielectric Science and Technology Division.; Electrochemical Society. Electronics Division.
Series: Proceedings ;; v. 92-4; Proceedings (Electrochemical Society) ;; 92-4.
Publisher: Electrochemical Society
Published: 1992
Place of publication: Pennington, NJ
Language: eng
Number of pages: 330
Subjects: Semiconductors -- Reliability -- Congresses.; Dielectric devices -- Reliability -- Congresses.; Lasers -- Industrial applications -- Congresses.
Other titles: Reliability of semiconductor devices/interconnections and dielectric breakdown and laser process for microelectronic applications.
Notes: Includes bibliographical references and indexes.
"Dielectric Science & Technology and Electronics Divisions."
Spine title: Reliability of semiconductor devices/interconnections and dielectric breakdown and laser processes for microelectronic applications.