Scanning Electron Microscopy
Subtitle: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
Publisher: Springer
Published: January 1986
Language: eng
Number of pages: 480
ISBN-13: 9780387135304
First sentence: Unlike transmission electron microscopy (TEM) described in the counterpart to this book [1.1], scanning electron microscopy (SEM) can image and analyse bulk specimens [1.2-28].