Probability of detection of internal voids in structural ceramics using microfocus radiography
By: George Y. Baaklini and Don J. Roth.
Contributors: Roth, Don J.; Lewis Research Center.
Series: NASA technical memorandum -- 87164.
Publisher: National Aeronautics and Space Administration, Lewis Research Center
Published: 1985
Place of publication: [Cleveland, Ohio
Language: eng
Format: Microform
Subjects: Silicon carbide.; Silicon nitride.; Ceramic materials.; Ceramics.; Radiography.; Sintering.; Statistical analysis.; Voids.
Notes: Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1986. 1 microfiche.