High-Resolution Imaging and Spectrometry of Materials
By: edited by Frank Ernst, Manfred Rühle
Contributors: Rühle, Manfred
Series: Springer Series in Materials Science -- 50; Springer Series in Materials Science -- 50
Publisher: Springer Berlin Heidelberg
Published: 2003
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] /
Number of pages: 442
ISBN-13: 9783642075254; 9783662077665
Subjects: Physical organic chemistry; Surfaces (Physics)
Description: This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
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Table of contents: title: Microcharacterisation of Materials; title: Electron Scattering; title: Structure Determination by Quantitative High-Resolution Electron Microscopy; title: Quantitative Analytical Transmission Electron Microscopy; title: Advances in Electron Optics; title: Tomography by Atom Probe Field Ion Microscopy; title: Scanning Tunnelling Microscopy and Spectroscopy, Atomic Force Microscopy; title: Multi-Method High-Resolution Surface Analysis with Slow Electrons; title: From Microcharacterization to Macroscopic Property: A Pathway Discussed on Metal/Ceramic Composites; title: Microstructural Characterization of Materials: An Assessment.