Proceedings: 1997 GaAs Reliability Workshop 
Subtitle: October 12, 1997, Anaheim, California
Publisher: IEEE
Published: 1998
Language: eng
Format: Unknown Binding
Number of pages: 116
ISBN-13: 9780790800646
Subjects: Congresses; Bipolar transistors; Accelerated life testing; Gallium arsenide semiconductors; Reliability