Digital hardware testing
Subtitle: transistor-level fault modeling and testing
By: Rochit Rajsuman.
Series: Artech House telecommunications library
Publisher: Artech House
Published: 1992
Place of publication: Boston
Language: eng
Number of pages: 317
Subjects: Electronic digital computers -- Circuits -- Testing -- Data processing.; Integrated circuits -- Very large scale integration -- Testing -- Data processing.; Electric fault location.
Notes: Includes bibliographical references and index.
"Annotated bibliography": p. 303-310.