Reliability of high temperature electronics
By: Aris Chistou.
Edition: 1st ed.
Publisher: Center for Reliability Engineering, University of Maryland
Published: 1996
Place of publication: College Park, Md
Language: eng
Number of pages: 444
Subjects: Integrated circuits -- Reliability.; Semiconductors -- Thermal properties.; Transistors -- Reliability.; Microwave integrated circuits -- Reliability.
Notes: Includes bibliographical references and index.