Materials Reliability in Microelectronics VI (Materials Research Society Symposium Proceedings)
Contributors: W. F. Filter (Editor); J. J. Clement (Editor); A. S. Oates (Editor); R. Rosenberg (Editor); P. M. Lenahan (Editor)
Publisher: Materials Research Society
Published: March 1999
Language: eng
Format: Hardcover
Number of pages: 583
ISBN-13: 9781558993310
Subjects: Electronics - Microelectronics; Technology; Technology & Industrial Arts; Science/Mathematics