Topical Meeting on Lasers in Materials Diagnostics
Subtitle: summaries of papers presented at the Laser in Materials Diagnostics Topical Meeting, February 11-12, 1987, Albuquerque, New Mexico
By: sponsored by the Lasers and Electro-Optics Society of IEEE, Optical Society of America.
Contributors: Lasers and Electro-optics Society (Institute of Electrical and Electronics Engineers); Optical Society of America.
Edition: Postconference ed.
Series: Technical digest series ;; 1987, v. 7; Technical digest series (Optical Society of America) ;; 1987, v. 7.
Publisher: Optical Society of America
Published: 1987
Place of publication: Washington, D.C
Language: eng
Number of pages: 128
Subjects: Semiconductors -- Testing.; Lasers -- Industrial applications.
Other titles: Lasers in material diagnostics.
Notes: Includes bibliographies.
Cover title: Lasers in material diagnostics.
"IEEE catalog number 87CH2389-5"--Verso t.p.