Measuring the performance and intelligence of systems
Subtitle: proceedings of the 2000 PerMIS Workshop, August 14-16, 2000
By: edited by A.M. Meystel, E.R. Messina ; cosponsored by National Institute of Standards and Technology ... [et al.].
Contributors: Meystel, A. (Alex); Messina, E. R. (Elena R.); National Institute of Standards and Technology (U.S.)
Series: NIST special publication -- 970
Publisher: U.S. Dept. of Commerce, National Insitute of Standards and Technology
Published: 2001
Place of publication: Gaithersburg, MD
Language: eng
Number of pages: 658
Subjects: Expert systems (Computer science); Computer systems; Evaluation
Notes: Includes bibliographical references and index.