17th IEEE VLSI Test Symposium
Subtitle: proceedings : April 25-29, 1999, Dana Point, California
By: sponsored by IEEE Computer Society Test Technology Technical Council.
Contributors: IEEE Computer Society; IEEE Computer Society. Test Technology Technical Council.
Publisher: IEEE Computer Society
Published: 1999
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 480
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Genres: Congresses.
Other titles: Seventeenth IEEE VLSI Test Symposium
Notes: "IEEE Computer Society Order Number PR00146"--T.p. verso.

"IEEE Order Plan Catalog Number PR00146"--T.p. verso.

Includes bibliographical references and index.