Programmable, automated transistor test system
By: Long V. Truong and Gale R. Sundburg.
Contributors: Sundburg, Gale R.; United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch.
Series: NASA technical paper -- 2554.
Publisher: National Aeronautics and Space Administration, Scientific and Technical Information Branch; For sale by the National Technical Information Service
Published: 1986
Place of publication: [Washington, D.C.]; Springfield, Va
Language: eng
Format: Microform
Subjects: Bipolar transistors -- Testing -- Computer programs.; Metal oxide semiconductors -- Testing -- Computer programs.; Transistors -- Testing -- Computer programs.; Bipolar transistors.; Field effect transistors.; Performance tests.; Software engineering.
Notes: Microfiche. [Washington, D.C. : National Aeronautics and Space Administration,] 1986. 1 microfiche.