Test, measurement, and characterization of high speed digital components and systems
Subtitle: 59th ARFTG Conference digest : Spring 2002, June 7th, 2002, Seattle, Washington, Automatic RF Techniques Group.
Publisher: IEEE
Published: 2002
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 153
Subjects: Microwaves -- Congresses.; Radio frequency -- Congresses.
Genres: Congresses.
Other titles: 59th ARFTG Conference digest
Notes: "IEEE Catalog Number: 02EX503"--T.p. verso.

Includes bibliographical references.

Also available via the World Wide Web with additional title: ARFTG Conference digest, spring 2002, 59th.