Optoelectronic materials and devices for detector, imager, display, and energy conversion technology
Subtitle: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2010, Dalian, China
By: Yadong Jiang, Bernard Kippelen, Junsheng Yu, editors
Contributors: Jiang, Yadong; Kippelen, Bernard; Yu, Junsheng; Zhongguo guang xue xue hui; Society of Photo-optical Instrumentation Engineers; Zhongguo ke xue yuan. Guang dian ji shu yan jiu suo; China. Guo jia ke xue ji shu bu; Fraunhofer Institute for Applied Optics and Precision Engineering
Series: Proceedings of SPIE -- v. 7658; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7658.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, WA
Language: eng
ISBN-13: 9780819480880
Subjects: Optoelectronics; Optoelectronic devices; Materials; Congresses; Imaging systems
Other titles: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies; Fifth International Symposium on Advanced Optical Manufacturing and Testing Technologies; International Symposium on Advanced Optical Manufacturing and Testing Technologies
Notes: Sponsored by COS--Chinese Optical Society (China) [and] IOE--the Institute of Optics and Electronics, CAS (China) ; supporting organizations, Ministry of Science and Technology of China ... [et al.]. ; cooperating organizations, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany) ... [et al.] ; supporting organization, National Natural Science Foundation (China) ; cosponsor and published by SPIE--the International Society for Optical Engineering.

Includes bibliographical references and index.