1998 IEEE International Integrated Reliability Workshop final report
Subtitle: Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: IEEE Electron Devices Society; IEEE Reliability Society
Published: 1998
Place of publication: Piscataway, New Jersey
Language: eng
Number of pages: 140
Subjects: Integrated circuits -- Reliability -- Congresses.; Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references.
"IEEE Catalog No. 98TH8363"--verso of T.p.