Design and testing guides for the CMOS and lateral bipolar-on-SOI test library
By: Janet C. Marshall and Mona E. Zaghloul.
Contributors: Zaghloul, M. E.; National Institute of Standards and Technology (U.S.)
Series: Semiconductor measurement technology; NIST special publication -- 400-93.; Semiconductor measurement technology; NIST special publication -- 400-93.
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1994
Place of publication: Gaithersburg, MD; Washington
Language: eng
Format: Microform
Number of pages: 132
Subjects: Silicon-on-insulator technology -- Testing.; Metal oxide semiconductors, Complementary -- Testing.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 94-0625-M.

"March 1994."

Includes bibliographical references (p. 17-18).

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1994] 2 microfiches : negative.

s 1994 dcu n b.