Third International Conference on the Economics of Design, Test, and Manufacturing
Subtitle: proceedings, May 16-17, 1994, Austin, Texas
By: sponsored by IEEE Computer Society Technical Committee on Test Technology ; edited by Tony Ambler, Magdy Abadir.
Contributors: Ambler, Tony.; Abadir, M.; IEEE Computer Society. Test Technology Technical Committee.
Publisher: IEEE Computer Society Press
Published: 1994
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 163
Subjects: Electronic circuits -- Costs -- Congresses.; Electronic circuit design -- Decision making -- Congresses.; Electronic circuits -- Testing -- Costs -- Congresses.
Other titles: Economics of design, test, and manufacturing
Notes: Includes bibliographical references and index.
"IEEE catalog number 94TH0701-3"--T.p. verso.