Termodinamicheskie osnovy diagnostiki i nadezhnosti mikroėlektronnykh ustroĭstv
By: V.L. Vorobʹev.
Publisher: "Nauka"
Published: 1989
Place of publication: Moskva
Language: rus
Number of pages: 159
Subjects: Integrated circuits -- Testing.; Thermodynamics.
Notes: Includes bibliographical references (p. 155-[157]).