Beam injection assessment of defects in semiconductors, 2nd International Workshop, Meudon-Bellevue, France, 15-18 July 1991.
Series: Journal de physique IV -- vol. 1(C6)
Publisher: Les Éditions de Physique
Published: 1991
Place of publication: Les Ulis
Language: eng
Notes: Supplement to the Journal dePhysique III, no. 12.