Automation in electronic test equipment.
By: Edited by David M. Goodman.
Contributors: New York University. School of Engineering and Science. Research Division.; New York University. Bureau of Conferences and Institutes.
Publisher: Distributed by New York University Press]
Published: 1966
Place of publication: [New York
Language: eng
Subjects: Automatic test equipment.; Airplanes -- Testing.; Guided missiles -- Testing.
Notes: "Originally prepared for two successive design courses given in summers of 1960 and 1961 by the Research Division, College of Engineering, and the Bureau of Conferences and Institutes, New York University."