NBS/RADC workshop, moisture measurement technology for hermetic semiconductor devices, II
Subtitle: proceedings of the NBS/RADC workshop held at the National Bureau of Standards, Gaithersburg, MD, November 5-7, 1980
By: Elaine C. Cohen and Stanley Ruthberg, editors.
Contributors: Ruthberg, Stanley.; Cohen, Elaine C.; Center for Electronics and Electrical Engineering (U.S.). Semiconductor Materials and Processes Division.; Rome Air Development Center.
Series: NBS special publication ;; 400-72; Semiconductor measurement technology
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; [Order from Supt. of Docs., U.S. G.P.O.]
Published: 1982
Place of publication: Washington, D.C
Language: eng
Number of pages: 294
Subjects: Semiconductors -- Testing -- Congresses.; Moisture -- Measurement -- Congresses.
Notes: Includes bibliographical references.
"Semiconductor Materials and Processes Division, Center for Electronic and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
"This activity was sponsored by Rome Air Development Center ... and National Bureau of Standards."
"Issued April 1982."
S/N 003-003-02402-3
Item 247 (microfiche)