ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993
Subtitle: proceedings
By: sponsored by the IEEE Computer Society in cooperation with EUREL.
Contributors: IEEE Computer Society.; Convention of National Societies of Electrical Engineers of Europe.
Publisher: IEEE Computer Society Press
Published: 1993
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 548
Subjects: Integrated circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.