Multi-chip module test strategies
By: edited by Yervant Zorian.
Contributors: Zorian, Yervant.
Series: Frontiers in electronic testing
Publisher: Kluwer
Published: 1997
Place of publication: Boston
Language: eng
Number of pages: 166
Subjects: Multichip modules (Microelectronics) -- Testing
Other titles: Journal of electronic testing.
Notes: Includes bibliographical references and index.
"Reprinted from a special issue of Journal of electronic testing: theory and applications, vol. 10, nos. 1 & 2, April 1997."