Waveguide spectroscopy of thin films
By: Alexander V. Khomchenko
Edition: 1st ed.
Series: Thin films and nanostructures -- v. 33; Thin films and nanostructures -- v. 33.
Publisher: Elsevier
Published: 2005
Place of publication: Amsterdam
Language: eng
Format: [electronic resource] /
Number of pages: 220
ISBN-13: 9780080457895
Subjects: Propriétés optiques; Optical properties; SCIENCE; Spectra; Thin films; Spectre; Couches minces; Condensed Matter; Physics
Description: Considering measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, this book presents methods of study of the linear and nonlinear optical properties of thin films. It is aimed at specialists in the fields of integrated and thin film optics and for graduates in related specialties.
Notes: Includes bibliographical references (p. 207-217) and index.

Description based on print version record.
Table of contents: title: Cover; Thin Films and Nanostructures; Dedication; Contents; Waveguide Spectroscopy of Thin Films; Foreword; Acknowledgments; Introduction; Interaction of Light with Matter; Spectroscopy of Optical Guided Modes; New Applications of the m-Line Technique for Studying Thin-Film Structures; Spatial Fourier Spectroscopy of Guided Modes: Measuring Thin-Film Parameters; Characterization of Thin Films by Prism Coupling of Leaky Modes; Measurements of Absorption Spectra of Thin Films; Applications of the Waveguide Spectroscopy Techniques in Sensor Systems