Forensic evidence analysis and crime scene investigation
Subtitle: 20-21 November 1996, Boston, Massachusetts
By: John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.].
Contributors: Hicks, John, 1945-; De Forest, Peter R.; Baylor, Vivian M.; National Institute of Standards and Technology (U.S.); National Institute of Justice (U.S.); Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2941; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2941.
Publisher: SPIE
Published: 1997
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 148
Subjects: Electronics in criminal investigation -- Congresses.; Crime scene searches -- Congresses.; Forensic sciences -- Congresses.; Law enforcement -- Optical equipment -- Congresses.
Notes: Includes bibliographic references and author index.