ICMTS 93
Subtitle: proceedings of the 1993 International Conference on Microelectronic Test Structures, March 22-25, 1993, Sitges, Barcelona, Spain
By: sponsored by the IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: IEEE
Published: 1992
Place of publication: New York, N.Y
Language: eng
Number of pages: 297
Subjects: Integrated circuits -- Testing -- Congresses.; Miniature electronic equipment -- Testing -- Congresses.
Other titles: Proceedings of the 1993 International Conference on Microelectronic Test Structures.; 1993 IEEE International Conference on Microelectronic Test Structures.
Notes: "IEEE Catalog Number 93CH3220-1".

On cover and spine: 1993 IEEE International Conference on Microelectronic Test Structures".

Includes bibliographical references.