Proceedings of the 22nd International Conference on Defects in Semiconductors
Subtitle: ICDS-22 held in Aarhus, Denmark, 28 July - 1 August 2003
By: guest editors, K. Bonde Nielsen, A. Nylandsted Larsen, G. Weyer.
Contributors: Bonde Nielsen, K.; Nylandsted Larsen, A.; Weyer, G.
Series: Physica -- v. 340-342.
Publisher: Elsevier
Published: 2003
Place of publication: Amsterdam
Language: eng
Number of pages: 1181
Subjects: Semiconductors -- Defects -- Congresses.
Genres: Congresses.
Other titles: 22nd International Conference on Defects in Semiconductors.; Twenty-second International Conference on Defects in Semiconductors.; International Conference on Defects in Semiconductors.; ICDS-22.
Notes: Includes bibliographical references and indexes.