A versatile high-voltage bias supply for extended range MIS c(v) and G(v) measurements
By: [by] Paul Kuczer, Harvey O. Hook and Alvin M. Goodman.
Contributors: Hook, Harvey O.; Goodman, Alvin M.
Series: Semiconductor measurement technology; Special publications -- 400-41.
Publisher: National Bureau of Standards
Published: 1977
Place of publication: Washington, D.C
Language: eng