2007 International Symposium on VLSI Design, Automation & Test (VLSI-DAT)
Subtitle: April 25-27, 2007, Hsinchu, Taiwan
By: Industrial Technology Research Institute, IEEE.
Contributors: Gong ye ji shu yan jiu yuan.; Institute of Electrical and Electronics Engineers.
Publisher: ITRI; IEEE
Published: 2007
Place of publication: Hsinchu, Taiwan; Piscataway, N.J
Language: eng
Number of pages: 286
Subjects: Integrated circuits -- Very large scale integration -- Congresses
Genres: Congresses.
Other titles: International Symposium on VLSI Design, Automation & Test (VLSI-TSA)
Notes: "IEEE catalog number: 07TH8910."

Includes bibliographical references.