System-on-chip test architectures
Subtitle: nanometer design for testability
By: edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Contributors: Wang, Laung-Terng; Stroud, Charles E; Touba, Nur A
Series: The Morgan Kaufmann series in systems on silicon
Publisher: Morgan Kaufmann Publishers
Published: 2008
Place of publication: Amsterdam; Boston
Language: eng
Number of pages: 856
ISBN-13: 9780123739735
Subjects: Systems on a chip -- Testing; Integrated circuits -- Very large scale integration -- Testing; Integrated circuits -- Very large scale integration -- Design
Notes: Includes bibliographical references and index