Fast risetime reverse bias pulse failures in SiC PN junction diodes
By: Philip G. Nuedeck, Christian Fazi, James D. Parsons.
Contributors: Fazi, Christian.; Parsons, James D.; United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum -- 107256.
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1996
Place of publication: [Washington, DC]; [Springfield, Va
Language: eng
Format: Microform
Subjects: P-N junctions.; Semiconductors (Materials); Silicon carbides.; High temperature environments.; Bias.; Doped crystals.; Energy gaps (Solid state)
Notes: Shipping list no.: 98-0769-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1997] 1 microfiche.