Small aperture analysis of the dual TEM cell and an investigation of test object scattering in a single TEM cell
By: P.F. Wilson, M.T. Ma
Contributors: Ma, Mark T; United States. National Bureau of Standards
Series: NBS technical note -- 1076
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; For sale by Supt. of Docs., U.S. G.P.O.
Published: 1984
Place of publication: Washington, D.C
Language: eng
Number of pages: 55
Subjects: Electromagnetic fields; Perturbation (Quantum dynamics); Scattering (Physics)
Notes: Distributed to depository libraries in microfiche

"Issued October 1983."

Bibliography: p. 24-29