Stress-induced phenomena in metallization
Subtitle: eighth International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany, 12-14 September 2005
By: editors, Ehrenfried Zschech ... [et al.].
Contributors: Zschech, Ehrenfried.
Series: AIP conference proceedings -- v. 817; AIP conference proceedings -- no. 817.
Publisher: American Institute of Physics
Published: 2006
Place of publication: Melville, N.Y
Language: eng
Number of pages: 372
Subjects: Integrated circuits -- Defects -- Congresses; Metal-metal bonds -- Congresses; Semiconductors -- Defects -- Congresses
Genres: Congresses.
Other titles: Stress induced phenomena in metallization; 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany, 12-14 September 2005
Notes: Includes bibliographical references and indexes.

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