Electron beam imaging of non-crystalline materials
Subtitle: proceedings of a one-day meeting of the Electron Microscopy and Analysis Group of the Institute of Physics, 3 February 1988, London
By: editor, K. Knowles.
Contributors: Knowles, K.; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
Series: IOP short meetings series -- no. 11.
Publisher: IOP Pub.
Published: 1988
Place of publication: Bristol, U.K
Language: eng
Number of pages: 122
Subjects: Amorphous substances -- Congresses.; Electron microscopy -- Congresses.; Electron beams -- Congresses.
Genres: Congresses.
Notes: Includes bibliographies.