Optical characterization techniques for semiconductor technology
Subtitle: April 1-2, 1981, San Jose, California
By: D.E. Aspnes, S. So, R.F. Potter, editors.
Contributors: Aspnes, D. E.; So, S.; Potter, Roy F.
Series: Proceedings of the Society of Photo-optical Instrumentation Engineers ;; v. 276
Publisher: Society of Photo-optical Instrumentation Engineers
Published: 1981
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 262
Subjects: Semiconductors -- Testing -- Optical methods -- Congresses.
Notes: Includes bibliographical references and indexes.