Metrology of optoelectronic systems
Subtitle: 21-22 May 1987, Orlando, Florida
By: Edward M. Granger, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville ... [et al.].
Contributors: Granger, Edward M.; Society of Photo-optical Instrumentation Engineers.; University of Alabama in Huntsville. Center for Applied Optics.
Series: Proceedings of SPIE--the International Society for Optical Engineering ;; v. 776
Publisher: SPIE
Published: 1987
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 123
Subjects: Optoelectronic devices -- Measurement -- Congresses.; Optical measurements -- Congresses.
Notes: Includes bibliographies and index.