IEEE standard test access port and boundary-scan architecture
By: Sponsor, Test Technology Standards Committee of the IEEE Computer Society.
Contributors: IEEE Computer Society. Test Technology Standards Committee.; Institute of Electrical and Electronics Engineers.; IEEE Standards Board.; IEEE Standards Association.
Series: IEEE Std -- 1149.1-2001.; IEEE std -- 1149.1-2001.
Publisher: Institute of Electrical and Electronics Engineers
Published: 2001
Place of publication: New York
Language: eng
Number of pages: 200
Subjects: Integrated circuits -- Testing -- Standards; Boundary scan testing -- Standards
Description: "Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set  of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that slows rigorous description of the component-specific aspects of such testability features."
Notes: "IEEE Std 1149.1-2001 (Revision of IEEE Std 1149.1-1990)".

"Approved 14 June 2001, IEEE-SA Standards Board".

"23 July 2001"--Cover.

Includes bibliographical references (p. 6).