Applied logistic regression
By: David W. Hosmer, Stanley Lemeshow.
Contributors: Lemeshow, Stanley.
Edition: 2nd ed.
Series: Wiley series in probability and statistics.
Publisher: Wiley
Published: 2000
Place of publication: New York
Language: eng
Number of pages: 373
Subjects: Regression analysis.
Notes: Includes bibliographical references (p. 352-365) and index.
"A Wiley-Interscience publication."