VAST, IEEE Symposium on Visual Analytics Science and Technology, 2007
Subtitle: proceedings, Sacramento, California, USA, October 30-November 1, 2007
By: edited by William Ribarsky, John Dill
Contributors: Ribarsky, William; Dill, John, 1939-; IEEE Computer Society. Technical Committee on Visualization and Graphics
Publisher: IEEE
Published: 2007
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 246
ISBN-13: 9781424416592
Subjects: Congresses; Digital computer simulation; Computer graphics; Visual analytics; Information visualization
Notes: "Sponsored by IEEE Computer Society Visualization and Graphics Technical Committee."

Includes bibliographical references and index.