New trends in ion beam processing of materials and beam induced nanometric phenomena
Subtitle: proceedings of Symposium I on New Trends in Ion Beam Processing of Materials, and proceedings of Symposium K on Nanometric Phenomena Induced by Laser, Ion, and Cluster Beams of the 1996 E-MRS Spring Conference, Strasbourg, France, June 4-7, 1996
By: [F. Priolo ... et al., editors].
Contributors: Priolo, F.; Symposium K on Nanometric Phenomena Induced by Laser, Ion, and Cluster Beams (1996 : Strasbourg, France)
Series: European Materials Research Society symposia proceedings ;; v. 65
Publisher: Elsevier
Published: 1997
Place of publication: Amsterdam; New York
Language: eng
Number of pages: 609
Subjects: Materials -- Effect of radiation on -- Congresses.; Ion bombardment -- Congresses.; Nanostructured materials -- Congresses.; Silicon -- Effect of radiation on -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and indexes.
"Reprinted from Beam interactions with materials and atoms. Nuclear instruments & methods in physics research-section B. NIM-B 120 (Symposium I0, NIM-B 122 (3) (Symposium K)"--T.p. verso.