Hot-carrier circuit reliability simulation
By: Paul G.Y. Tsui ... [et al.].
Contributors: Tsui, Paul G. Y.
Publisher: Addison-Wesley
Published: 1992
Place of publication: Reading, Mass
Language: eng
Number of pages: 20
Subjects: Semiconductors -- Reliability -- Computer simulation.
Notes: Includes bibliographical references (p. 16-18) and index.