Electromigration and electronic device degradation
By: edited by Aris Christou.
Contributors: Christou, A.
Publisher: Wiley
Published: 1994
Place of publication: New York
Language: eng
Number of pages: 343
Subjects: Integrated circuits -- Deterioration.; Semiconductors -- Failures.; Electrodiffusion.
Other titles: Electromigration & electronic device degradation.
Notes: Includes bibliographical references and index.
Spine title: Electromigration & electronic device degradation.