Defect recognition and image processing in III-V compounds
Subtitle: proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985
By: edited by J.P. Fillard.
Contributors: Fillard, J. P.
Series: Materials science monographs ;; 31
Publisher: Elsevier
Published: 1985
Place of publication: Amsterdam; New York
Language: eng
Number of pages: 306
Subjects: Semiconductors -- Defects -- Congresses.; Gallium arsenide semiconductors -- Congresses.; Image processing -- Congresses.
Notes: Includes bibliographies and index.