Measurement and modeling of silicon heterostructure devices
By: edited by John D. Cressler.
Contributors: Cressler, John D.
Publisher: CRC Press
Published: 2008
Place of publication: Boca Raton, FL
Language: eng
ISBN-13: 9781420066920
Subjects: Bipolar transistors -- Mathematical models; Bipolar transistors; Heterostructures; Integrated circuits -- Design and construction
Notes: Includes bibliographical references and index.