New technology challenges metrology
By: Judson C. French.
Contributors: United States. National Bureau of Standards.; Center for Electronics and Electrical Engineering (U.S.); Interamerican Metrology Conference (1979 : Buenos Aires, Argentina)
Series: NBS special publication ;; 611
Publisher: U.S. Department of Commerce, National Bureau of Standards; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1981
Place of publication: Washington, D.C
Language: eng
Number of pages: 87
Subjects: Mensuration -- Technological innovations
Notes: "Presented at the Interamerican Metrology Conference, marking the formal establishment of the Interamerican Metrology System, held in Buenos Aires, Argentina, September 4-7, 1979."
"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
"Issued July 1981."
S/N 003-003-02341-8