Positive charge generation and hole trapping centers in sub-100 A  oxide
By: Yi Lu
Published: 1994
Language: eng
Number of pages: 129
Subjects: Failures; Semiconductors; Integrated circuits; Deterioration
Notes: Typescript.

Vita.

Thesis (Ph. D.) -- University of Florida, 1994.

Includes bibliographical references (leaves 118-128).

Adviser: C. Sah