X-ray microscopy and X-ray microanalysis
Subtitle: proceedings. Edited by A. Engström, V. Cosslett [and] H. Pattee
Publisher: Elsevier
Published: 1960
Place of publication: Amsterdam, New York
Language: eng; ger; fre
Number of pages: 542
Subjects: Microradiography; Congresses; Microscopy; Optics and Photonics; X-ray microscopy
Notes: 1st meeting called Symposium on X-ray Microscopy and Microradiography; 3d meeting called International Symposium on X-ray Optics and X-ray Microanalysis.

Text in English, French, or German.

Includes bibliographical references.