The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling
By: Marek-Jerzy Pindera, Jacob Aboudi, Steven M. Arnold.
Contributors: Aboudi, Jacob, 1935-; Arnold, S. M.; NASA Glenn Research Center.
Series: NASA/TM -- 2000-209770.; NASA technical memorandum -- 209770.
Publisher: National Aeronautics and Space Administration, Glenn Research Center; Available from NASA Center for Aerospace Information; National Technical Information Service [distributor
Published: 1999
Place of publication: Cleveland, Ohio; Hanover, MD; Springfield, VA
Language: eng
Format: Microform
Subjects: Interfaces.; Oxide films.; Thickness.; Surface roughness.; Temperature effects.; Stress distribution.; Film thickness.
Notes: Shipping list no.: 2000-0596-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2000] 1 microfiche.