Calculations of critical misfit and thickness
Subtitle: an overview
By: Jan H. Van Der Merwe, W.A. Jesser.
Contributors: Jesser, W. A.; United States. National Aeronautics and Space Administration.
Series: NASA contractor report -- NASA CR-182995.
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1989
Place of publication: [Washington, DC; Springfield, Va
Language: eng
Format: Microform
Subjects: Crystal dislocations.; Epitaxy.; Mathematical models.; Thickness.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1989] 1 microfiche.