Convergent-beam electron diffraction
By: by Michiyoshi Tanaka, Masami Terauchi
Contributors: Terauchi, Masami; Kaneyama, Toshikatsu
Publisher: JEOL Ltd.
Published: 1985
Place of publication: Tokyo, Japan
Language: eng
Subjects: Electron microscopy; Electrons; Diffraction; Crystallography
Notes: Vol. 2 has Kaneyama Toshikatsu as co-author.

Includes bibliographical references.