Advanced Tomographic Imaging Methods for the Analysis of Materials
Subtitle: Symposium Held November 28-30, 1990, Boston, Massachusetts, U.S.A. (Materials Research Society Symposium Proceedings)
Contributors: William A. Ellingson (Editor)
Publisher: Materials Research Society
Published: September 1991
Language: eng
Format: Hardcover
Number of pages: 218
ISBN-13: 9781558991095
Subjects: Tomography; Science; Non-Destructive Testing Of Materials; Science/Mathematics; X-ray microscopy; Nanostructures; Magnetic resonance imaging; Congresses; Nondestructive testing