Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Subtitle: 9-13 September 2002, Novosibirsk, Russia
By: Yuri V. Chugui ... [et al.], chairs/editors ; co-organized by TDI SIE--Technological Design Institute of Scientific Instrument Engineering (Russia), ILP--Institute of Laser Physics (Russia) ; sponsored by SPIE--The International Society for Optical Engineering ... [et al.]
Contributors: Chugui, Yuri V.; Institut lazernoĭ fiziki SO RAN; TDI SIE--Technological Design Institute of Scientific Instrument Engineering (Russia); Society of Photo-optical Instrumentation Engineers
Series: SPIE proceedings series -- v. 4900; Proceedings of SPIE--the International Society for Optical Engineering -- v. 4900
Publisher: SPIE, International Society for Optical Engineering
Published: 2002
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 1332
Subjects: Lasers; Congresses; Industrial applications; Metrology
Other titles: 7th International Symposium on Laser Metrology
Notes: Includes bibliographical references and index.