Microcantilevers for atomic force microscope data storage
By: by Benjamin W. Chui.
Series: Microsystems ;; v. 2; Microsystems (Series) ;; v. 2.
Publisher: Kluwer Academic Publishers
Published: 1998
Place of publication: Boston, Mass
Language: eng
Number of pages: 148
Subjects: Optical storage devices; Scanning electron microscopes
Description: Microcantilevers for Atomic Force Microscope Data Storage describes a research collaboration between IBM Almaden and Stanford University in which a new mass data storage technology was evaluated. This technology is based on the use of heated cantilevers to form submicron indentations on a polycarbonate surface, and piezoresistive cantilevers to read those indentations.

The primary audience is industrial and academic workers in the microelectromechanical systems (MEMS) area. It will also be of interest to researchers in the data storage industry who are investigating future storage technologies.
Notes: Includes bibliographical references (p. [129]-142) and index.