Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics
Subtitle: report for period: October 1984-September 1986
By: M.G. Buehler ... [et al.].
Contributors: Jet Propulsion Laboratory (U.S.)
Series: NASA contractor report -- NASA CR-185954.
Publisher: National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology; National Technical Information Service, distributor
Published: 1989
Place of publication: Pasadena, Calif; [Springfield, Va
Language: eng
Format: Microform
Subjects: Application specific integrated circuits.; Chips (Electronics).; Circuit reliability.; Failure analysis.; Large scale integration.; Quality control.; Radiation hardening.; Reliability analysis.; Very large scale integration.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, DC : National Aeronautics and Space Administration, 1990] 3 microfiches.