MTDT 2004
Subtitle: records of the 2004  International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA
By: edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
Contributors: Rajsuman, Rochit.; Wik, T.; IEEE Computer Society.; IEEE Computer Society. Technical Committee on VLSI.; IEEE Computer Society. Technical Council on Test Technology.; IEEE Solid-State Circuits Society.
Publisher: IEEE Computer Society
Published: 2004
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 121
Subjects: Semiconductor storage devices -- Testing -- Congresses.; Random access memory -- Congresses.
Genres: Congresses.
Other titles: Memory technology, design and testing; Records of the 2004 IEEE International Workshop on Memory Technology, Design and Testing
Notes: Includes bibliographical references and author index.
"IEEE Computer Society Order Number P2193"--T.p. verso.
Workshop number from Web site.