Optical testing and metrology III
Subtitle: recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California
By: C.P. Grover, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.
Contributors: Grover, C. P.; Society of Photo-optical Instrumentation Engineers.; International Symposium on Optical and Optoelectronic Applied Sciences and Engineering (1990 : San Diego, Calif.)
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 1332; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1332.
Publisher: SPIE; Society of Photo Optical
Published: 1990
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 886
Subjects: Mensuration -- Congresses; Optical measurements -- Congresses
Other titles: Optical testing and metrology 3.; Optical testing and metrology three.; Recent advances in industrial optical inspection.
Notes: Includes bibliographical references and index.
"Part of a six-conference program on Optical Design and Fabrication held at SPIE's International Symposium on Optical and Optoelectronic Applied Science and Engineering, 8-13 July 1990, San Diego, California"--P. x.