Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII)
By: edited by V. Swaminathan...[et al.].
Contributors: Swaminathan, V.; Electrochemical Society. Electronics Division.; Electrochemical Society. Dielectric Science and Technology Division.; State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII) (22nd : 1995: Reno, Nevada)
Series: Proceedings ;; v. 95-6; Proceedings (Electrochemical Society) ;; v. 95-6.
Publisher: Electrochemical Society
Published: 1995
Place of publication: Pennington, NJ
Language: eng
Number of pages: 378
Subjects: Compound semiconductors -- Design and construction -- Congresses.; Semiconductor wafers -- Congresses.
Notes: Includes bibliographical references and indexes.
Held at the Spring Meeting of The Electrochemical Society, Inc. May 21-26, 1995, Reno, Nevada.
"Electronics and Dielectric Science and Technology Divisions."