Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy
Subtitle: proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, Maryland, October 1-3, 1975
By: edited by K. F. J. Heinrich, D. E. Newbury, and H. Yakowitz ; sponsored by Analytical Chemistry Division, Institute for Materials Research, National Bureau of Standards.
Contributors: Heinrich, Kurt F. J.; Newbury, Dale E.; Yakowitz, Harvey, 1939-
Series: National Bureau of Standards special publication ; 460; NBS special publication ;; 460.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1976
Place of publication: Washington
Language: eng
Number of pages: 164
Subjects: Electron probe microanalysis -- Congresses.; Scanning electron microscopy -- Congresses.; Monte Carlo method -- Congresses.
Notes: Includes bibliographical references.
"CODEN: XNBSAV."