Interferometry XV
Subtitle: Techniques and analysis : 2-4 August 2010, San Diego, California, United States
By: Catherine E. Towers, Joanna Schmit, Katherine Creath, editors ; sponsored and published by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 7790; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7790.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819482860
Subjects: Industrial applications; Interferometry; Congresses; Metrology; Measurement
Other titles: Interferometry 15; Interferometry fifteen
Notes: Includes bibliographical references and index.