Fundamentals of novel oxide/semiconductor interfaces
Subtitle: symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A
By: editors, C.R. Abernathy ... [et al.].
Contributors: Abernathy, C. R.; Materials Research Society. Meeting; Symposium on Fundamentals of Novel/Oxide Semiconductor Interfaces (2003 : Boston, Mass.)
Series: Materials Research Society symposium proceedings ;; v. 786; Materials Research Society symposia proceedings ;; v. 786.
Publisher: Materials Research Society
Published: 2004
Place of publication: Warrendale, Pa
Language: eng
Number of pages: 408
Subjects: Semiconductors -- Junctions -- Congresses.; Metal oxide semiconductors -- Junctions -- Congresses.; Dielectric devices -- Congresses.; Integrated circuits -- Congresses.; Integrated circuits -- Materials -- Congresses.
Genres: Congresses.
Other titles: Novel oxide/semiconductor interfaces
Notes: Includes bibliographical references and indexes.
"This proceedings volume is the record from Symposium E, 'Fundamentals of Novel/Oxide Semiconductor Interfaces,' held December 1-4 at the 2003 MRS Fall Meeting in Boston, Massachusetts ..."--P. xiii.