Sensors, cameras, and systems for industrial/scientific applications X
Subtitle: 20-22 January 2009, San Jose, California, USA
By: Erik Bodegom,  Valérie Nguyen, editors ; sponsored and published  by IS&T--the Society for Imaging Science and Technology [and] SPIE
Contributors: SPIE (Society); IS & T--the Society for Imaging Science and Technology
Series: Proceedings of Electronic Imaging Science and Technology; Proceedings of SPIE -- v. 7249; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7249.
Publisher: SPIE
Published: 2009
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819474995
Subjects: MOS complémentaires; Détecteurs; Applications industrielles; Circuits à couplage de charge; Scientific applications; Detectors; Industrial applications; Congrès; Complementary Metal oxide semiconductors; Charge coupled devices; Congresses; Applications scientifiques
Notes: Includes bibliographical references and author index.