Design to test
Subtitle: a definitive guide for the improvement of productivity in electronics manufacturing
By: by Jon Turino and H. Frank Binnendyk.
Contributors: Binnendyk, H. Frank.
Publisher: Logical Solutions
Published: 1982
Place of publication: Campbell, Calif., USA (96 Shereen Pl., Campbell 95008)
Language: eng
Number of pages: 227
Subjects: Integrated circuits -- Testing.
Notes: Bibliography: p. 225.