International Test Conference 2004
Subtitle: proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
By: sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: International Test Conference; IEEE
Published: 2004
Place of publication: Washington, D.C; Piscataway, N.J
Language: eng
Number of pages: 1459
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Telecommunication -- Congresses.; Radio frequency -- Congresses.
Genres: Congresses.
Other titles: ITC International Test Conference 2004
Notes: Cover title.

"Conference 35 Years"--cover.

"IEEE Catalog Number 04CH37586"--T.p. verso.

Includes bibliographical references and author index.

Also available via the World Wide Web.