First European Conference on Optics Applied to Metrology, Oct. 26-28, 1977, Strasbourg, France, [papers]
By: Editors: Michel Grosman, Patrick Meyrueis
Series: SPIE -- v. 136; Proceedings of the Society of Photo-optical Instrumentation Engineers -- v. 136
Publisher: Society of Photo-Optical Instrumentation Engineers
Published: 1978
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 376
Subjects: Optical measurements; Congresses; Weights and measures
Other titles: Optics applied to metrology.
Notes: Organized by European Photonics Association, Comite international d'optique, The Society of Photo-Optical Instrumentation Engineers; with the assistance of Université Louis Pasteur and others.

Includes bibliographical references and index.