Identification of Defects in Semiconductors, Volume 51A (Semiconductors and Semimetals)
Contributors: Michael Stavola (Editor); Robert K. Willardson (Series Editor); Eicke R. Weber (Series Editor)
Publisher: Academic Press
Published: May 26, 1998
Language: eng
Format: Hardcover
Number of pages: 376
ISBN-13: 9780127521596
Subjects: Circuits & components; Electricity, magnetism & electromagnetism; Physics; Electric Conductivity; Science; Technology & Industrial Arts; Science/Mathematics; Engineering - Electrical & Electronic; Optics; Science-Physics; Semimetals; Technology / Engineering / Electrical; Technology / Optics; Technology-Optics; Electromagnetism
First sentence: In an EPR experiment, the sample is placed in a magnetic field and transitions are induced between the Zeeman levels of the defect.