1997 2nd International Workshop on Statistical Metrology
Publisher: Institute of Electrical & Electronics Enginee
Published: January 1998
Language: eng
Format: Hardcover
Number of pages: 124
ISBN-13: 9780780337374
Subjects: Mathematics for scientists & engineers; Semiconductors; Electronic Measurements; Weights And Measures; Technology; Science/Mathematics; Statistical methods; Congresses; Engineering - Electrical & Electronic; Characterization; Measurement