Design for AT-Speed Test, Diagnosis and Measurement (FRONTIERS IN ELECTRONIC TESTING Volume 15) (Frontiers in Electronic Testing)
Edition: 1st edition
Publisher: Springer
Published: September 1, 1999
Language: eng
Format: Hardcover
Number of pages: 264
ISBN-13: 9780792386698
Subjects: Electronic devices & materials; Telecommunications; General; Electronic Apparatus And Devices; Technology; Technology & Industrial Arts; Science/Mathematics; Integrated Circuits; Engineering - Electrical & Electronic; Technology / Electronics / Circuits / General; Testing; Electronic apparatus and appliances; Electronics - Circuits - Integrated; Electronics - General; Electronic apparatus and appli
First sentence: With recent advances in semiconductor process technology, companies that design and manufacture leading-edge products are quickly moving toward very deep submicron (VDSM) integrated circuit (IC) technology.