Comparison of currents predicted by NASCAP/LEO model simulations with elementary Langmuir-type bare probe models for an insulated cable containing a single pinhole
By: Joel T. Galofaro.
Contributors: United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum -- 102486.
Publisher: NASA; For sale by the National Technical Information Service
Published: 1990
Place of publication: [Washington, D.C.]; [Springfield, Va
Language: eng
Format: Microform
Number of pages: 37
Subjects: Space vehicles -- Electric equipment -- Defects -- Computer simulation.; Electric cable sheathing -- Defects -- Computer simulation.; Aerospace environments.; Defects.; Electric potential.; Insulation.; Pinholes.; Plasma sheaths.; Simulation.; Spacecraft charging.
Notes: Cover title.

Distributed to depository libraries in microfiche.

"July 1990."

Includes bibliographical references (p. 11-12).

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration, 1990] 1 microfiche : negative.

506-41-3K.