Defect Recognition and Image Processing in Semiconductors 1997
Subtitle: Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, ... (Institute of Physics Conference Series)
Publisher: Taylor & Francis
Published: January 1, 1998
Language: eng
Format: Hardcover
Number of pages: 524
ISBN-13: 9780750305006
Subjects: Condensed matter physics (liquids & solids); Materials science; Semi-conductors & super-conductors; Technology; Reliability Engineering; Semiconductors; Science; Solid State Physics; Science/Mathematics; Science / Solid State Physics; Congresses; Electronics - Semiconductors; Defects; Image processing