Just enough die-level functional test
Subtitle: optimizing IC test via machine learning and decision theory
By: by Tony R. Fountain.
Published: 1998
Language: eng
Number of pages: 141
Subjects: Statistical decision.; Decision making -- Mathematical models.
Notes: Typescript (photocopy).

Thesis (Ph. D.)--Oregon State University, 1999.

Includes bibliographical references (leaves 135-141).