Proceedings of the 16th International Conference on Defects in Semiconductors
Subtitle: ICDS 16 : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
By: edited by Gordon Davies, Gary G. DeLeo and Michael Stavola.
Contributors: Davies, Gordon.; DeLeo, Gary Gerard.; Stavola, Michael.
Series: Materials science forum -- v. 83-87.
Publisher: Trans Tech Publications
Published: 1992
Place of publication: Zürich, Switzerland; Brookfield, VT
Language: eng
Number of pages: 1604
Subjects: Semiconductors -- Defects -- Congresses.
Other titles: ICDS 16.; Defects in semiconductors 16.
Notes: Includes bibliographical references and index.