11th annual proceedings reliability physics 1973, Las Vegas, Nevada, April 3-5,1973
By: sponsored by the IEEE Electron Devices Group and the IEEE Reliability Group.
Contributors: Institute of Electrical and Electronics Engineers. Electron Devices Group.; Institute of Electrical and Electronics Engineers. Reliability Group.
Publisher: I.E.E.E.
Published: 1973
Place of publication: New York
Language: eng