Proceedings
Subtitle: Board and system test track
By: International Test Conference 2003 ; [30 September-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA ; sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: International Test Conference; IEEE
Published: 2003
Place of publication: Washington, D.C; Piscataway, N.J
Language: eng
Number of pages: 216
Subjects: Integrated circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.; Computer storage devices -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Semiconductor storage devices -- Congresses.
Genres: Congresses.
Other titles: ITC International Test Conference 2003; Board and systems test track
Notes: Also available via the World Wide Web.
Includes bibliographical references and author index.
Selection of papers from the proceedings of the conference.
At head of title: ITC International Test Conference 2003
Conference number inferred.
"IEEE Catalog Number 03CH37494"--T.p. verso.