Microcircuit device reliability digital detailed data
By: prepared by Mark R. Klein under contract to Rome Air DevelopmentCenter, Griffiss Air Force Base, New York.
Contributors: Reliability Analysis Center.; Rome Air Development Center.
Publisher: Reliability Analysis Center
Published: 1976
Place of publication: New York
Language: eng
Number of pages: 225
Notes: At head of title: Reliability Analysis Center. MDR-4.