Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
By: edited by J.L. Benton, G.N. Maracas, P. Rai-Choudhury ; [sponsored by the] Electronics and Dielectric Science and Technology divisions.
Contributors: Benton, J. L.; Maracas, George Nicolas, 1955-; Rai-Choudhury, P.; Electrochemical Society. Electronics Division.; Electrochemical Society. Dielectric Science and Technology Division.; Electrochemical Society. Meeting
Series: Proceedings ;; v. 92-2; Proceedings (Electrochemical Society) ;; v. 92-2.
Publisher: Electrochemical Society
Published: 1992
Place of publication: Pennington, NJ
Language: eng
Number of pages: 280
Subjects: Semiconductors -- Testing -- Congresses.
Notes: Includes bibliographical references and indexes.
Papers presented at a symposium held Oct. 16-17, 1991, during the 180th Electrochemical Society Meeting in Phoenix, Ariz.