Proceedings of the Veterans Administration Second Electron Microscopy Conference, May 13-14, 1975, Chicago, Ill.
By: sponsored by The Pathology Service, Veterans Administration.
Contributors: United States. Veterans Administration.
Series: IB ; 11-53; Information bulletin (United States. Veterans Administration) -- IB 11-53.
Publisher: U.S. Veterans Administration, Pathology Service
Published: 1976
Place of publication: Washington
Language: eng
Number of pages: 87
Subjects: Electron microscopy -- United States -- Congresses.
Notes: Cover title.

This program is cosponsored by the American Society of Clinical Pathologist.