Highly charged ions
Subtitle: publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland
By: editors, John D. Gillaspy ... [et al.]
Contributors: Gillaspy, John; National Institute of Standards and Technology (U.S.)
Series: NIST special publication -- 972
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.; National Institute of Standards and Technology, Atomic Physics Division, Physics Laboratory
Published: 2002
Place of publication: Gaithersburg, MD; Washington, DC
Language: eng
Format: Microform
Number of pages: 304
Subjects: Physics Laboratory (U.S.). -- Atomic Physics Division -- Research; Trapped ions; Electron beams; Electron-ion collisions; Ion bombardment; Plasma radiation
Notes: "July 2002."

Shipping list no.: 2003-0272-M

Includes bibliographical references

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2003. 4 microfiches : negative.