Model reduction by trimming for a class of semi-Markov reliability models and the corresponding error bound
By: Allan L. White and Daniel L. Palumbo.
Contributors: United States. National Aeronautics and Space Administration. Scientific and Technical Information Division.
Series: NASA technical paper -- 3089.
Publisher: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division; For sale by the National Technical Information Service]
Published: 1991
Place of publication: [Washington, DC]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Markov processes.; Reliability (Engineering)
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 92-181-M.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1991. 1 microfiche.