Design, Analysis and Test of Logic Circuits Under Uncertainty
By: by Smita Krishnaswamy, Igor L. Markov, John P. Hayes
Contributors: Markov, Igor L. (Igor Leonidovich), 1973-; Hayes, John P. (John Patrick), 1944-; SpringerLink (Online service)
Series: Lecture Notes in Electrical Engineering -- 115
Publisher: Springer Netherlands; Imprint: Springer
Published: 2013
Place of publication: Dordrecht
Language: eng
Format: [electronic resource] /
ISBN-13: 9789048196449
Subjects: Systems engineering; Circuits and Systems; Performance and Reliability; Algebra; Computer input-output equipment; Symbolic and Algebraic Manipulation; Computers; Logic design; Engineering; Computer science; Data processing; Arithmetic and Logic Structures; Operating systems (Computers)