Process control and diagnostics
Subtitle: 18-19 September 2000, Santa Clara, USA
By: Michael L. Miller, Kaihan A. Ashtiani, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, SolidState Technology, the Electrochemical Society, [and] AVS--American Vacuum Society (USA).
Contributors: Miller, Michael L.; Ashtiani, Kaihan A.; Society of Photo-optical Instrumentation Engineers.; Solid State Technology (Organization); Electrochemical Society.; American Vacuum Society.
Series: SPIE proceedings series ;
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 374
Subjects: Process control -- Congresses.; Manufacturing processes -- Quality control -- Congresses.; Optical detectors -- Industrial applications -- Congresses.; Lasers -- Industrial applications -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.