Scientific detection of fakery in art
Subtitle: 29-30 January 1998, San Jose, California
By: Walter McCrone, Duane R. Chartier, Richard J Weiss, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
Contributors: McCrone, Walter C.; Chartier, Duane R.; Weiss, Richard J. 1923-; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series,; v. 3315; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3315.
Publisher: The Society
Published: 1998
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 106
Subjects: Art -- Forgeries -- Congresses.; Art -- Expertising -- Congresses.; Art and science -- Congresses.
Notes: Includes bibliographical references and index.