Semiconductor measurement technology
Subtitle: spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974
By: James R. Ehrstein, editor.
Contributors: Ehrstein, James R.; American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics.; United States. National Bureau of Standards.
Series: NBS special publication -- 400-10
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1974
Place of publication: Washington
Language: eng
Number of pages: 281
Subjects: Semiconductors -- Testing -- Congresses.; Electric resistance -- Congresses.
Other titles: Spreading Resistance Symposium
Notes: "Under the sponsorship of Committee F-1 of the American Society for Testing and Materials and the National Bureau of Standards."

Bibliography: p. 279-281.