Failure analysis case histories 1992
By: editors, Greg Spawn, Richard D. Skinner.
Contributors: Spawn, Greg.; Skinner, Richard D,; Integrated Circuit Engineering Corporation.
Publisher: Integrated Circuit Engineering Corp.
Published: 1993
Place of publication: Scottsdale, AZ
Language: eng
Subjects: Integrated circuits -- Defects -- Case studies.; Electronic packaging -- Defects -- Case studies.