Charge loss modeling for EPROMs with ONO interpoly dielectric
By: Martin R. Herrmann
Contributors: Eidgenössische Technische Hochschule Zürich
Published: 1994
Language: eng
Subjects: Dielectric loss; Charge transfer; Microelectronics; Computer storage devices
Notes: Abstract in English and German.

Thesis (doctoral)--Eidgenössische Technische Hochschule Zürich, 1994.