Characterization of organic thin films
By: editor, Abraham Ulman ; managing editor, Lee E. Fitzpatrick.
Contributors: Ulman, Abraham, 1946-
Series: Materials characterization series
Publisher: Butterworth-Heinemann; Manning
Published: 1995
Place of publication: Boston; Greenwich
Language: eng
Number of pages: 276
Subjects: Organic thin films.
Description: Analytical tools for the study of organic thin films have seen dramatic developments in the last decade. Using such tools it has become possible to obtain structural information at the molecular level and thus to relate materials structure to materials properties.

Characterization of Organic Thin Films will help materials scientists, physicists, chemists, and biologists develop a fundamental understanding of structure-properties relationships which in turn makes possible molecular engineering of advanced materials and opens new opportunities in molecular manufacturing. This volume begins with introductory chapters on Langmuir-Blodgett and self-assembled films, and continues with the discussion of their properties as studied by different analytical techniques.

Both their surface/interfacial and bulk properties as studied by different analytical techniques, Both their surface/interfacial and bulk properties are covered.
Notes: Includes bibliographical references and index.