The role of bearing and scan mechanism life testing in flight qualification of the MODIS instrument
By: Steven G. VanDyk ... [et al.] ; prepared for the 35th Aerospace Mechanisms Symposium ; cosponsored by the Lockheed Martin Missiles and Space and the Aerospace Mechanisms Symposium Committee, Mountain View, California, May 9-11, 2001.
Contributors: VanDyk, Steven G.; Lockheed Martin Missiles & Space (Firm); NASA Glenn Research Center.; Aerospace Mechanisms Symposium (35th : 2001 : Mountain View, Calif.)
Series: [NASA technical memorandum] -- NASA/TM-2001-210896.; NASA technical memorandum -- 210896.
Publisher: National Aeronautics and Space Administration, Glenn Research Center; Available from NASA Center for Aerospace Information
Published: 2001
Place of publication: [Cleveland, Ohio]; Hanover, MD
Language: eng
Format: Microform
Subjects: Accelerated life tests.; Degradation.; Flight tests.; Imaging techniques.; Qualifications.; Life (Durability)
Notes: Shipping list no.: 2002-0157-M.

Also available via Internet from the NASA web site. Address as of 10/2/02: http://gltrs.grc.nasa.gov/reports/2001/TM-2001-210896.pdf ; current access is available via PURL.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2001?] 1 microfiche.