2000 IEEE International Reliability Physics Symposium
Subtitle: proceedings : 38th annual : San Jose, California, April 10-13, 2000
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: IEEE
Published: 2000
Place of publication: Piscataway, New Jersey
Language: eng
Number of pages: 456
Subjects: Electronic apparatus and appliances -- Reliability -- Congresses.
Genres: Congresses.
Other titles: Reliability physics.; Reliability Physics Symposium, 2000, proceedings, 38th Annual 2000 IEEE International.
Notes: "IEEE Catalog No. 00CH37059"-- cover and verso of t.p.

Includes bibliographical references.

Also available via the World Wide Web with additional title: Reliability Physics Symposium, 2000, proceedings, 38th Annual 2000 IEEE International.