Advances in X-Ray Analysis
Subtitle: Volume 33
By: edited by Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Paul K. Predecki
Contributors: Gilfrich, John V.; Huang, Ting C.; Jenkins, Ron; Predecki, Paul K.
Publisher: Springer US
Published: 1990
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] :
Number of pages: 704
ISBN-13: 9781461399988; 9781461399964
Subjects: Physics
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