Digitally modulated bit error rate measurement system for microwave component evaluation
By: Mary Jo W. Shalkhauser and James M. Budinger.
Contributors: Budinger, James M.; United States. National Aeronautics and Space Administration. Scientific and Technical Information Division.
Series: NASA technical paper -- 2912.
Publisher: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division; For sale by the National Technical Information Service]
Published: 1989
Place of publication: [Washington, D.C.]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Launch complexes (Astronautics) -- United States.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1989. 1 microfiche.