Atom probe microanalysis
Subtitle: principles and applications to materials problems
By: M.K. Miller, G.D.W. Smith.
Contributors: Smith, G. D. W.
Publisher: Materials Research Society
Published: 1989
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 278
Subjects: Crystallography.; Atom-probe field ion microscopy.
Notes: Includes bibliographical references and index.