Defects--recognition, imaging and physics in semiconductors 1999
Subtitle: proceedings of the eighth International Conference on Defects--Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999
By: edited by T. Ogawa, M. Tajima.
Contributors: Ogawa, Tomoya, 1930-; Tajima, M.
Series: Journal of crystal growth -- v. 210, no. 1-3.
Publisher: Elsevier
Published: 2000
Place of publication: Amsterdam, the Netherlands
Language: eng
Number of pages: 420
Subjects: Semiconductors -- Defects -- Congresses.; Image processing -- Congresses.
Genres: Congresses.
Other titles: Recognition, imaging and physics in semiconductors.; Proceedings of the eighth International Conference on Defects--Recognition, Imaging and Physics in Semiconductors.
Notes: Includes bibliographical references.