Lock-in Thermography
Subtitle: Basics and Use for Evaluating Electronic Devices and Materials
Publisher: Springer
Published: Nov 06, 2012
Format: paperback
Number of pages: 268
ISBN-13: 9783642264788
Notes: Source title: Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)