Defects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II: Mathematics, Physics and Chemistry, Volume 2) (NATO Science Series II: Mathematics, Physics and Chemistry)
Contributors: Gianfranco Pacchioni (Editor); Linards Skuja (Editor); David L. Griscom (Editor)
Edition: 1 edition
Publisher: Springer
Published: November 2000
Language: eng
Format: Hardcover
Number of pages: 632
ISBN-13: 9780792366850
Subjects: Electricity, magnetism & electromagnetism; Materials science; Science; Defects; Silica; Crystallography; Electrochemistry; Material Science; Science/Mathematics; General; Electric properties; Technology / Material Science; Chemistry - Physical & Theoretical; Congresses; Crystals
First sentence: Whereas, for crystalline materials, the concept of a defect is easy to define, the same is not true for amorphous solids, due to the statistical fluctuations which are an inherent feature of their structure.