Characterization of cadmium-zinc telluride crystals grown by 'contactless' PVT using synchrotron white beam topography
By: W. Palosz ... [et al.].
Contributors: Palosz, W.; United States. National Aeronautics and Space Administration.
Series: NASA/TM -- 207869.; NASA technical memorandum -- 207869.
Publisher: Elsevier; National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1997
Place of publication: [New York]; [Washington, DC; Springfield, Va
Language: eng
Format: Microform
Subjects: Crystal growth.; Cadmium tellurides.; Zinc tellurides.; Topography.; Crystal defects.; Edge dislocations.; Characterization.; Laue method.
Other titles: Characterization of cadmium zinc telluride crystals grown by 'contactless' PVT using synchrotron white beam topography.
Notes: Shipping list no.: 99-0384-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1998] 1 microfiche.