Fotometrii︠a︡ i ee metrologicheskoe obespechenie
Subtitle: XIV nauchno-tekhnicheskai︠a︡ konferent︠s︡ii︠a︡ : tezisy dokladov.
Publisher: VNII optiko-fizicheskikh izmereniĭ
Published: 2000
Place of publication: Moskva
Language: rus
Number of pages: 183
Subjects: Technical scien; Conferences/proceedings
Notes: Russian; Cyrillic alphabet.