Scanning Probe Microscopy
Subtitle: Atomic Force Microscopy and Scanning Tunneling Microscopy
Publisher: Voigtlaender Bert; Springer
Published: Feb 25, 2015
Format: hardcover
Number of pages: 382
ISBN-13: 9783662452394
Notes: Source title: Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology)