ATFA-78
Subtitle: advanced techniques in failure analysis, proceedings, 6-9 November 1978, Airport Marriott Hotel, Los Angeles, California, USA
By: sponsored by the Institute of Electrical and Electronics Engineers, inc., IEEE Los Angeles Council, Region 6, Los Angeles
Publisher: Institute of Electrical and Electronics Engineers
Published: 1978
Place of publication: New York
Language: eng
Number of pages: 200
Subjects: Electronic apparatus and appliances; Testing; Congresses; Semiconductors
Other titles: Advanced techniques in failure analysis.
Notes: "IEEE Catalog No. 78CH1407-6 REG 6."

Includes bibliographical references and index.