Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Edition: 1 edition
Publisher: PERGAMON PRESS
Published: October 1, 2000
Language: eng
Format: Paperback
Number of pages: 550
ISBN-13: 9780080439136
Subjects: Electrical engineering; Electronics - Microelectronics; Quality Control; Microelectronics; Reliability Engineering; Technology; Science/Mathematics