NMOS test chip for a course in semiconductor parameter measurements
By: K.P. Roenker and L.W. Linholm
Contributors: Linholm, Loren W; United States. National Bureau of Standards
Series: NBSIR -- 84-2822
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; Order from National Technical Information Service
Published: 1984
Place of publication: Washington, DC; [Springfield, VA
Language: eng
Number of pages: 44
Subjects: Integrated circuits; Semiconductors
Notes: Distributed to depository libraries in microfiche

"April 1984."

Includes bibliographical references