ISTFA '97
Subtitle: proceedings of the 23rd International Symposium for Testing and Failure Analysis, 27-31 October 1997, Santa Clara Convention Center, Santa Clara, California
By: manager of book production, Grace M. Davidson ; sponsored by ASM International.
Contributors: ASM International.
Publisher: ASM International
Published: 1997
Place of publication: Materials Park, Ohio
Language: eng
Number of pages: 346
Subjects: Electronic apparatus and appliances -- Testing -- Congresses.; Electronics -- Materials -- Testing -- Congresses.; Materials -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.
Other titles: 23rd International Symposium for Testing and Failure Analysis
Notes: "SAN: 204-7586".

Includes bibliographical references.