2009 27th IEEE VLSI Test Symposium
Subtitle: proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009
By: [sponsored by] IEEE Computer Society
Contributors: IEEE Computer Society. Test Technology Technical Committee; Institute of Electrical and Electronics Engineers
Publisher: IEEE Computer Society
Published: 2009
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 341
ISBN-13: 9780769535982
Other titles: 27th IEEE VLSI Test Symposium; VLSI Test Symposium; VTS2009
Notes: "IEEE Computer Society Order Number P3598"--T.p. verso.

"BMS part no. CFP09029-PRT"--T.p. verso.

Includes bibliographical references and author index.