Electrothermal Analysis of VLSI Systems
Edition: 1 edition
Publisher: Springer
Published: June 30, 2000
Language: eng
Format: Hardcover
Number of pages: 240
ISBN-13: 9780792378617
Subjects: Electronics engineering; General Theory of Computing; Very-Large-Scale Integration (Vlsi); Technology; Technology & Industrial Arts; Science/Mathematics; Electronics - Circuits - VLSI; Mathematical Analysis; Mechanics - Dynamics - Thermodynamics; Technology / Electronics / Circuits / General; Applied; Data processing; Integrated circuits; Mathematical Models; Semiconductors; Thermal analysis; Thermal properties; Very large scale integration
First sentence: When the chip integration level increases and the device feature size decreases, the die yield goes down in most cases.