Proceedings, 9th IEEE International On-Line Testing Symposium
Subtitle: IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece
By: edited by C. Metra ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council.
Contributors: Metra, C.; IEEE Computer Society. Technical Council on Test Technology.
Publisher: IEEE Computer Society
Published: 2003
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 229
Subjects: Electronic circuits -- Testing -- Data processing -- Congresses.; Error-correcting codes (Information theory) -- Congresses.
Genres: Congresses.
Other titles: 9th IEEE International On-Line Testing Symposium; IOLTS 2003
Notes: Issues for 2007- cataloged as serial in LC.

Includes bibliographical references and index.