Boundary-scan interconnect diagnosis
By: José T. de Sousa, Peter Y.K. Cheung
Contributors: Cheung, Peter Y. K.
Series: Frontiers in electronic testing -- 18; Frontiers in electronic testing -- 18.
Publisher: Kluwer Academic Publishers
Published: 2001
Place of publication: Boston
Language: eng
Format: [electronic resource] /
Number of pages: 168
ISBN-13: 9780306479755
Subjects: Electric contacts; TECHNOLOGY & ENGINEERING; Testing; Microelectronics; Electronic packaging; Electronic apparatus and appliances; Digital; Electronics; Boundary scan testing
Notes: Includes bibliographical references (p. 145-150) and index.

Description based on print version record.