Fault detection in sequential circuits
By: by V. F. Berka and W. A. Davis
Contributors: Davis, W. A.; University of Alberta. Dept. of Computing Science
Series: Technical report -- TR 75-4; Technical report (University of Alberta. Department of Computing Science) -- 75-4.
Publisher: Dept. of Computing Science, University of Alberta
Published: 1975
Place of publication: Edmonton
Language: eng
Number of pages: 139
Subjects: Testing; Sequential machine theory; Electric fault location; Data processing; Digital integrated circuits
Notes: Bibliography: leaves 131-133.