Image matching and analysis
Subtitle: 22-24 October 2001, Wuhan, China
By: Bir Bhanu, Jun Shen, Tianxu Zhang, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III (France) ... [et al.] ; supported by National Natural Science Foundation of China [and] Ministry of Education of China.
Contributors: Bhanu, Bir.; Shen, J.; Zhang, T.; Society of Photo-optical Instrumentation Engineers.; Hua zhong gong xue yuan.; Université de Bordeaux III.; Guo jia zi ran ke xue ji jin wei yuan hui (China); China. Jiao yu bu.
Series: SPIE proceedings series,; v. 4552; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4552.
Publisher: SPIE
Published: 2001
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 342
Subjects: Image processing -- Digital techniques -- Congresses; Pattern recognition systems -- Congresses; Image analysis -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and index.
"Second SPIE International Symposium on Multispectral Image Processing and Pattern Recognition"--P. xi.
Addendum tipped in.