Advances in X-ray analysis.
By: edited by Camden R-Hubbard... [et al.]
Contributors: Hubbard, Camden R.; University of Denver. Research Institute.; JCPDS-International Centre for Diffraction Data.; Conference on Applications of X-Ray Analysis, (31st : 1982 : Denver)
Publisher: Plenum Press
Published: 1983
Place of publication: New York; London
Language: eng
Notes: Proceedings of the Thirty first Annual Conference on Applications of X-Ray Analysis held inDenver, August 1-6, 1982.