A test mode approach to fault detection in sequential circuits
By: by J. Rettig
Series: Report (University of Illinois at Urbana-Champaign. Dept. of Computer Science) -- no. 326; Report (University of Illinois at Urbana-Champaign. Dept. of Computer Science) -- no. 326
Publisher: Dept. of Computer Science, University of Illinois
Published: 1969
Place of publication: Urbana
Language: eng
Number of pages: 44
Subjects: Sequential analysis
Notes: "C00-1469-0117."

Thesis (M.S.)--University of Illinois.

Bibliography: p. 44.