Stigmatically focusing partial pressure analyzer with dual chamber ion source
By: Klaus F. Rasskopf.
Contributors: United States. National Aeronautics and Space Administration.
Series: NASA technical translation -- NASA TT-20059.; NASA technical translation -- 20059.
Publisher: National Aeronautics and Space Administration
Published: 1987
Place of publication: Washington, DC
Language: eng
Format: Microform
Subjects: Ion sources.; Aeronautical instruments.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1987. 1 microfiche.