Test and evaluation of infrared detectors and arrays
Subtitle: 27-29 March, 1989, Orlando, Florida
By: Forney M. Hoke, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.].
Contributors: Hoke, Forney M.; Society of Photo-optical Instrumentation Engineers.; New Mexico State University. Applied Optics Laboratory.
Series: Proceedings of SPIE--the International Society for Optical Engineering -- v. 1108
Publisher: SPIE--the International Society for Optical Engineering
Published: 1989
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 306
Subjects: Infrared detectors -- Testing -- Congresses.; Array processors -- Testing -- Congresses.; Infrared technology -- Congresses.
Notes: Includes bibliographies and index.