Semiconductor measurement technology: Spreading Resistance Symposium
Subtitle: proceedings of a Symposium held at the National Bureau of Standards... June 13-14, 1974
By: James R. Ehrstein, editor.
Contributors: Ehrstein, James R.; National Bureau of Standards.; American Society for Testing and Materials.
Series: NBS special publication -- 400-10; STP -- 572.
Publisher: U.S.G.P.O.
Published: 1974
Place of publication: Washington
Language: eng
Notes: Under the Sponsorship of Committee F-1 of the American Society for Testing and Materials, and the National Bureau of Standards.