Adaptive Bayes'sche Stichprobensysteme für die Gut-Schlecht-Prüfung
By: Ulrich Rendtel, Hans-Joachim Lenz.
Contributors: Lenz, Hans-Joachim.
Series: Arbeiten zur angewandten Statistik,; Bd. 33; Arbeiten zur angewandten Statistik ;; Heft 33.
Publisher: Physica-Verlag
Published: 1990
Place of publication: Heidelberg
Language: ger
Number of pages: 231
Subjects: Acceptance sampling.
Notes: Includes bibliographical references (p. [229]-231).