A technique for measuring vertically and horizontally polarized microwave brightness temperatures using electronic polarization-basis rotation
By: submitted by Albin J. Gasiewski.
Contributors: United States. National Aeronautics and Space Administration.
Series: NASA-CR -- 190207.; NASA contractor report -- NASA CR-190207.
Publisher: National Aeronautics and Space Administration; National Technical Information Service [distributor]
Published: 1992
Place of publication: [Washington, DC]; [Springfield, Va.?
Language: eng
Format: Microform
Subjects: Microwave measurements.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 92-2276-M.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1992. 1 microfiche.