A reverse-bias safe operating area transistor tester
By: David W. Berning.
Series: Semiconductor measurement technology; NBS special publication ; 400-54; NBS special publication ;; 400-54.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1979
Place of publication: Washington
Language: eng
Number of pages: 37
Subjects: Transistors -- Testing -- Equipment and supplies.
Notes: Bibliography: p. 14.