EMF risk sssessment
Subtitle: exposure assessment and compliance testing in complex environments
By: Sven Küln
Edition: 1st ed.
Series: Series in microelectronics -- v. 205
Publisher: Hartung-Gorre
Published: 2010
Place of publication: Konstanz
Language: eng
Number of pages: 240
ISBN-13: 9783866283091
Notes: Originally presented as the author's thesis (doctoral)--ETH Zürich No. 18637.

Includes bibliographical references (p. 209-237).

Text in English, with summaries in English and German.