Nanometer technology designs
Subtitle: high-quality delay tests
By: Mohammad Tehranipoor, Nisar Ahmed
Contributors: Ahmed, Nisar
Publisher: Springer
Published: 2008
Place of publication: New York, NY
Language: eng
Number of pages: 281
ISBN-13: 9780387764863
Subjects: Very large scale integration; Nanotechnology; Testing; Integrated circuits
Notes: Includes bibliographical references and index.