High-resolution X-ray scattering from thin films and multilayers
By: Václav Holý, Ullrich Pietsch, Tilo Baumbach.
Contributors: Pietsch, Ullrich, 1952-; Baumbach, Tilo, 1961-
Series: Springer tracts in modern physics,; v. 149; Springer tracts in modern physics ;; 149.
Publisher: Springer
Published: 1999
Place of publication: Berlin; New York
Language: eng
Number of pages: 256
Subjects: Thin films -- Optical properties.; Thin films, Multilayered -- Optical properties.; X-rays -- Scattering.; X-rays -- Diffraction.
Notes: Includes bibliographical references and index.