Advances in x-ray diffractometry and x-ray spectrography
Subtitle: a volume of fifteen selected reprints from Philips Laboratories, Irvington-on-Hudson, New York, U.S.A.
By: edited by William Parrish.
Contributors: Parrish, William, 1914-; Philips Natuurkundig Laboratorium.
Series: P.L. contributions -- no. 188
Publisher: Centrex Publishing Co.
Published: 1962
Place of publication: Eindhoven
Language: eng
Number of pages: 233
Subjects: X-ray diffractometer; Radiography