Sensors and controls for advanced manufacturing
Subtitle: 14-15 October 1997, Pittsburgh, Pennsylvania
By: Bartholomew O. Nnaji, Anbo Wang, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, NIST--National Institute of Standards and Technology, CIMS--Coalition for Intelligent Manufacturing Systems, [and] A-CIMS--Academic Coalition for Intelligent Manufacturing Systems.
Contributors: Nnaji, Bartholomew O., 1956-; Wang, Anbo.; Society of Photo-optical Instrumentation Engineers.; National Institute of Standards and Technology (U.S.); Coalition for Intelligent Manufacturing Systems.; Academic Coalition for Intelligent Manufacturing Systems.
Series: SPIE proceedings series ;; v. 3201; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3201.
Publisher: SPIE
Published: 1997
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 214
Subjects: Process control -- Automation -- Congresses.; Optical detectors -- Industrial applications -- Congresses.; Intelligent control systems -- Congresses.; Manufacturing processes -- Automatic control -- Congresses.
Notes: Includes bibliographical references and index.