Time and frequency metrology II
Subtitle: 5 August 2009, San Diego, California, United States
By: Tetsuya Ido, Derryck T. Reid, editors ; sponsored and published by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 7431; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7431.
Publisher: SPIE
Published: 2009
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819477217
Other titles: Time and frequency metrology 2; Time and frequency metrology two
Notes: Includes bibliographical references and author index.