Optoelectronic metrology
Subtitle: 28-30 September, 1998, Łańcut, Poland
By: Jan Owsik, Tomasz Wie̜cek, editors ; Wojciech Skrzeczanowski, Ewa Burdziakowska, co-editors ; organized by Institute of Optoelectronics, Military University of Technology, Warsaw (Poland), Central Office of Measures, Warsaw (Poland), [and] Foundation for Industrial and Environmental Science, Rzeszów (Poland) ; sponsored by Committee of Scientific Research (Poland) [and] SPIE Poland Chapter.
Contributors: Owsik, Jan.; Więcek, Tomasz.; Institute of Optoelectronics (Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego); Poland. Central Office of Measures.; Foundation for Industrial and Environmental Science (Rzeszów, Poland); Komitet Badań Naukowych (Poland); Society of Photo-optical Instrumentation Engineers.; Society of Photo-optical Instrumentation Engineers. Poland Chapter.
Series: SPIE Poland Chapter proceedings ;; 52; Proceedings of SPIE ;; v. 4018; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4018.
Publisher: SPIE
Published: 1998
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 152
Subjects: Optoelectronics -- Congresses.; Laser beams -- Measurement -- Congresses.; Optical measurements -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and author index.