Defect recognition and image processing in semiconductors and devices
Subtitle: proceedings of the fifth international conference, Santander, Spain, 6-10 September 1993
By: edited by J. Jiménez.
Contributors: Jiménez, J.; International Symposium on Defect Recognition and Image Processing in III-V Compounds (5th : 1993 : Santander, Spain)
Series: Institute of Physics conference series ;; no. 135
Publisher: Institute of Physics Pub.
Published: 1994
Place of publication: Bristol; Philadelphia
Language: eng
Number of pages: 417
Subjects: Semiconductors -- Defects -- Congresses.; Image processing -- Congresses.
Notes: Includes bibliographical references and indexes.
DRIP conference proceedings.