Measurement of carrier lifetime in semiconductors
Subtitle: an annotated bibliography covering the period 1949-1967
By: [by] W. Murray Bullis.
Series: National Bureau of Standards. NBS technical note 465; NBS technical note ;; 465.
Publisher: U.S. National Bureau of Standards; for sale by the Supt of Docs., U.S. Govt. Print. Off.
Published: 1968
Place of publication: Washington
Language: eng
Number of pages: 62
Subjects: Semiconductors -- Bibliography.