Thermal resistance measurements
By: Frank F. Oettinger and David L. Blackburn.
Contributors: Blackburn, David L.
Series: NIST special publication ;; 400-86; Semiconductor measurement technology
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1990
Place of publication: Gaithersburg, MD; Washington, DC
Language: eng
Number of pages: 72
Subjects: Power transistors -- Thermal properties.; Integrated circuits -- Testing.; Temperature measurements.
Notes: Includes bibliographical references (p. 68-72).
"July 1990."