Single-photon imaging
By: Peter Seitz, Albert J.P. Theuwissen, editors
Series: Springer series in optical sciences -- 160; Springer series in optical sciences -- v. 160.
Publisher: Springer
Published: 2011
Place of publication: Heidelberg; New York
Language: eng
Number of pages: 351
ISBN-13: 9783642184420; 9783642184437
Subjects: Photonics; Imaging systems; Photon detectors
Notes: Includes bibliographical references and index.
Table of contents: title: Fundamentals of noise in optoelectronics / Peter Seitz; title: Image sensor technology / R. Daniel McGrath; title: Hybrid avalanche photodiode array imaging / Hiroaki Aihara; title: Electron bombarded semiconductor image sensors / Verle Aebi and Kenneth Costello; title: Single -photon imaging using electron multiplication in vacuum / Gert Nützel; title: Electron-multiplying charge coupled devices : EMCCDs / Mark Stanford Robbins; title: Monolithic single-photon avalanche diodes : SPADs / Edoardo Charbon and Matthew W. Fishburn; title: Single photon CMOS imaging through noise minimizaion / Boyd Fowler; title: Architectures for low-noise CMOS electronic imaging / Shoji Kawahito; title: Low-noise electronic imaging with double-gate FETs and charge-modulation devices / Yoshiyuki Matsunaga; title: Energy-sensitive single-photon x-ray and particle imaging / Christian Lotto; title: Single-photon detectors for time-of-flight range imaging / David Stoppa and Andrea Simoni; title: Single-photon imaging for astronomy and aerospace applications / Pierre Magnan; title: Exploiting molecular biology by time-resolved fluorescence imaging / Francis Müller and Christof Fattinger.