Point Defects in Semiconductors and Insulators
Contributors: Hans-Joachim Queisser (Editor)
Edition: 1 edition
Publisher: Springer; Springer-Verlag
Published: April 10, 2003
Language: eng
Format: Hardcover
Number of pages: 490
ISBN-13: 9783540426950
Subjects: Semi-conductors & super-conductors; Semiconductors; Material Science; Technology & Industrial Arts; Electronics - Semiconductors; Technology; Science/Mathematics; Nuclear magnetic resonance spectroscopy; Methodology; Engineering - General; General; Physics; Density Functional Theory (DFT); Electrical Detection of EPR and ENDOR (EDEPR/EDENDOR); Electron Nuclear Double Resonance (ENDOR); Electron Paramagnetic Resonance (EPR); Medical : General; Optically Detected EPR and ENDOR (ODEPR/ODENDOR); Science : Physics; Testing; Defects; Nuclear magnetic resonance spe
First sentence: In the next section of this chapter, the term ''structure of point defects in solids" will be defined.