Semiconductor reliability.
Contributors: Shwop, John E., ed.; Von Alven, William H., ed.; United States. Advisory Group on Electron Tubes.; Aerospace Industries Association of America.; Conference on Reliability of Semiconductor Devices (1961 : New York, N.Y.); Conference on Reliability Assurance Techniques for Semiconductor Specifications (1961 : Washington, D.C.)
Publisher: Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York
Published: 1961
Place of publication: Elizabeth, N.J
Language: eng
Subjects: Semiconductors -- Reliability -- Congresses.
Notes: Includes bibliographies.
Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan.
Vol. 2: Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, Washington, D.C., sponsored by Aerospace Industries Association [and others] Edited by William H. Von Alven.