CSIR
Subtitle: a two-dimensional finite element charge-sheet model of MOSFET's including radiation-induced interface and oxide charge
By: C.L. Wilson and J.L. Blue ; prepared for Defense Nuclear Agency
Contributors: Blue, J. L; United States. Defense Nuclear Agency; United States. National Bureau of Standards
Series: NBSIR -- 84-2874 R
Publisher: U.S. Dept. of Commerce, National Bureau of Standards
Published: 1984
Place of publication: Washington, DC
Language: eng
Number of pages: 46
Subjects: Transistors -- Effect of radiation on -- Mathematical models
Notes: Distributed to depository libraries in microfiche

"May 1984."

Includes bibliographical references

X99QAXVX, work unit 00076