Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
By: by Weronika Walkosz
Contributors: SpringerLink (Online service)
Series: Springer Theses
Publisher: Springer Science+Business Media, LLC
Published: 2011
Place of publication: New York, NY
Language: eng
Format: [electronic resource] /
ISBN-13: 9781441978165; 9781441978172
Subjects: Physical organic chemistry; Materials; Microreactors