2003 IEEE International Reliability Physics Symposium
Subtitle: proceedings : 41st annual : Dallas, Texas, March 30-April 4, 2003
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: IEEE
Published: 2003
Place of publication: Piscataway, N.J
Number of pages: 645
ISBN-13: 9780780376496
Subjects: Electronic apparatus and appliances -- Reliability -- Congresses.
Genres: Congresses.
Other titles: Reliability Physics Symposium proceedings, 2003, 41st annual, 2003 IEEE International.