High resolution X-ray diffractometry and topography
By: D. Keith Bowen and Brian K. Tanner.
Contributors: Tanner, B. K.
Publisher: Taylor & Francis; CRC
Published: 1998
Place of publication: London; Bristol, PA
Language: eng
Number of pages: 252
Subjects: X-ray crystallography.; X-rays -- Diffraction.; Crystals.
Notes: Includes bibliographical references and index.