Microelectronics failure analysis
Subtitle: desk reference
By: edited by Richard J. Ross
Edition: 6th ed.
Publisher: ASM International
Published: 2011
Place of publication: Materials Park, Ohio
Language: eng
Number of pages: 660
ISBN-13: 9781615037254
Subjects: Semiconductors; Testing; Microelectronics; Handbooks, manuals; Materials; Defects; Electronics; Electronic apparatus and appliances
Notes: Includes bibliographical references and index.

System requirements for accompanying CD-ROM: Windows 95/98/NT/ME/2000/XP ; Macintosh 8/9/Classic.