Two- and three-dimensional methods for inspection and metrology IV
Subtitle: 1-3 October, 2006, Boston, Massachusetts, USA
By: Peisen S. Huang, chair/editor ; sponsored and published by by SPIE--the International Society for Optical Engineering.
Contributors: Huang, Peisen S.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE -- v. 6382; Proceedings of SPIE--the International Society for Optical Engineering -- v. 6382.
Publisher: SPIE
Published: 2006
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819464804
Subjects: Computer vision -- Congresses; Imaging systems -- Congresses; Three-dimensional display systems -- Congresses; Quality control -- Optical methods -- Congresses; Optical measurements -- Congresses; Metrology -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and author index.