Machine vision applications in industrial inspection VII
Subtitle: 25-26 January 1999, San Jose, California
By: Kenneth W. Tobin, Ning S. Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
Contributors: Tobin, Kenneth W.; Chang, Ning-San.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 3652; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3652.
Publisher: SPIE
Published: 1999
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 262
Subjects: Engineering inspection -- Automation -- Congresses.; Computer vision -- Industrial applications -- Congresses.; Quality control -- Optical methods -- Automation -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.