Symposium i Anvendt Statistik, Teknometri og Biometri
By: red., Agnar Høskuldsson, Knut Conradsen, Jon Stene.
Contributors: Høskuldsson, Agnar.; Conradsen, Knut.; Stene, Jon.
Publisher: NEUCC, Det regionale Edb-center ved Danmarks Tekniske Højskole
Published: 1979
Place of publication: [Lyngby] [Bygn. 305,2800]
Language: dan
Number of pages: 273
Subjects: Engineering -- Statistical methods -- Congresses.; Biometry -- Congresses.
Notes: Includes bibliographical references.
Danish, English, or Swedish.