Interferometric metrology
Subtitle: 20-21, August 1987, San Diego, California
By: sponsored by SPIE, the International Society for Optical Engineering, cooperating organizations: Applied Optics Laboratory, New Mexico State University [and others]; N.A. Massie, editor
Contributors: Society of Photo-optical Instrumentation Engineers; Massie, N. A.
Series: SPIE -- v. 816; Critical reviews of optical science and technology; Proceedings of SPIE--the International Society for Optical Engineering -- v. 816
Publisher: SPIE--the International Society for Optical Engineering
Published: 1988
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 239
Copyright date: 1988
Subjects: Optical measurements; Congresses; Speckle metrology
Notes: Includes index.