Ionizing radiation effects in MOS devices and circuits
By: edited by T.P. Ma and Paul V. Dressendorfer.
Contributors: Ma, T. P.; Dressendorfer, Paul V.
Publisher: Wiley
Published: 1989
Place of publication: New York
Language: eng
Number of pages: 587
Subjects: Metal oxide semiconductors -- Effect of radiation on.
Notes: Includes bibliographical references.
"A Wiley-Interscience publication."