Electrical Overstress/Electrostatic Discharge Symposium proceedings 1982
Subtitle: Orlando, Florida, September 21-23, 1982
By: sponsored by IIT Research Institute.
Contributors: IIT Research Institute.; Reliability Analysis Center (U.S.)
Publisher: Reliability Analysis Center
Published: 1983
Place of publication: Griffiss AFB, N.Y
Language: eng
Number of pages: 217
Subjects: Electronic apparatus and appliances -- Protection -- Congresses; Electric discharges -- Congresses; Electrostatics -- Congresses
Notes: "EOS-4".

On spine: EOD/ESD Symposium proceedings.

Includes bibliographies.