Defect and fault tolerance in VLSI systems
Subtitle: proceedings : 1998 IEEE International Symposium on Defect and  Fault Tolerance in VLSI Systems :  November 2-4, 1998, Austin, Texas
By: sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committtee.
Contributors: IEEE Computer Society.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Technical Council on Test Technology.
Publisher: IEEE Computer Society Press
Published: 1998
Place of publication: Los Alamitos, California
Language: eng
Number of pages: 355
Subjects: Integrated circuits -- Very large scale integration -- Design and construction -- Congresses; Fault-tolerant computing -- Congresses
Genres: Congresses.
Notes: "[IEEE Computer Society Press Order Number] PR8832"--verso of T.p.

"IEEE Catalog Number 98EX223"--verso of T.p..

Includes bibliographical references and author index.