Ellipsometry in the measurement of surfaces and thin films. Proceedings of symposium held at National Bureau of Standards, Washington, D.C. on September 5-6, 1963
By: ed. by E. Passaglia, R.R. Stromberg and J. Kruger
Contributors: Passaglia, E.; Stromberg, R. R.; Kruger, J.
Series: National Bureau of Standards miscellaneous publications -- 256; PB 285882
Publisher: United States. Department of Commerce. national Bureau of Standards
Published: 1964
Place of publication: Washington D.C
Language: eng
Format: Microform
Notes: Microfiche copy by N.T.I.S.