Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Subtitle: February 2-4, 1993, Four Seasons Hotel, Austin, TX, USA.
Contributors: IEEE Components, Hybrids, and Manufacturing Technology Society.
Publisher: IEEE; Additional copies from IEEE Service Center
Published: 1993
Place of publication: New York, NY, U.S.A. (345 E. 47th St., New York, NY 10017 U.S.A.); Piscataway, NJ
Language: eng
Number of pages: 214
Subjects: Semiconductors -- Thermal properties -- Congresses; Semiconductors -- Cooling -- Congresses
Genres: Congresses.
Other titles: 9th Annual IEEE Semiconductor Thermal Measurement and Management Symposium.; SEMI-THERM 1993.; Semiconductor Thermal Measurement and Management Symposium, 1993, SEMI-THERM IX, Ninth Annual IEEE.
Notes: Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society.

"IEEE catalog number 93CH3226-8"--T.p. verso.

"1993 cumulative bibliography of articles on semiconductor thermal and temperature testing" / compiled by Bernard Siegal: p. 194-211.

Includes bibliographical references.

Also available via the World Wide Web with additional title: Semiconductor Thermal Measurement and Management Symposium, 1993, SEMI-THERM IX, Ninth Annual IEEE.