Evaluation of advanced semiconductor materials by electron microscopy
By: edited by David Cherns.
Contributors: Cherns, David.; North Atlantic Treaty Organization. Scientific Affairs Division.; Special Program on Condensed Systems of Low Dimensionality (NATO)
Series: NATO ASI series. Series B, Physics ;; vol. 203; NATO ASI series.; v. 203.
Publisher: Plenum Press
Published: 1989
Place of publication: New York
Language: eng
Number of pages: 412
Subjects: Semiconductors -- Surfaces -- Congresses.; Electron microscopy -- Technique -- Congresses.; Electrons -- Diffraction -- Congresses.
Notes: Includes bibliographical references.
"Proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12-17, 1988, in Bristol, United Kingdom"--Verso t.p.
"Held within the program of activities of the NATO Special Program on Condensed Systems of Low Dimensionality, running from 1983 to 1988 as part of the activities of the NATO Science Committee"--P. [v].
"Published in cooperation with NATO Scientific Affairs Division."