Modeling Nanoscale Imaging in Electron Microscopy
By: edited by Thomas Vogt, Wolfgang Dahmen, Peter Binev
Contributors: Dahmen, Wolfgang; Binev, Peter; SpringerLink (Online service)
Series: Nanostructure Science and Technology
Publisher: Springer US
Published: 2012
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
ISBN-13: 9781461421917
Subjects: Materials science; Measurement Science and Instrumentation; Characterization and Evaluation of Materials; Analytic Chemistry; Surfaces (Physics); Analytical biochemistry; Nanotechnology; Chemistry; Theoretical and Computational Chemistry