Optical devices and diagnostics in materials science
Subtitle: 1-4 August 2000, San Diego, USA
By: David L. Andrews ... [et al.] ; sponsored ... by SPIE--the International Society for Optical Engineering.
Contributors: Andrews, David L.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 4098; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4098.
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 314
Subjects: Nanostructured materials -- Testing -- Congresses.; Optical materials -- Testing -- Congresses.; Optoelectronic devices -- Congresses.; Light -- Scattering -- Congresses.; Near-field microscopy -- Industrial applications -- Congresses.; Raman spectroscopy -- Industrial applications -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.