Heavy ion induced single event phenomena (SEP) data for semiconductor devices form engineering testing
By: Donald K. Nichols ... [et al.].
Contributors: Nichols, Donald K.; Jet Propulsion Laboratory (U.S.)
Series: NASA contractor report -- NASA CR-184864.
Publisher: National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology; National Technical Information Service, distributor
Published: 1988
Place of publication: Pasadena, Calif; [Springfield, Va
Language: eng
Format: Microform
Subjects: Irradiation.; Latch-up.; Linear energy transfer (LET); Performance tests.; Semiconductor devices.; Single event upsets.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1989] 1 microfiche.