2001 IEEE International Integrated Reliability Workshop Final Report
Subtitle: Stanford Sierra Camp, Lake Tahoe, California, October 15-18, 2001
Publisher: Inst Elect & Electronic Engineers
Published: January 2002
Language: eng
Format: Paperback
Number of pages: 106
ISBN-13: 9780780371675
Subjects: Industrial Chemistry & Manufacturing Technologies; Reliability Engineering; Technology & Engineering; Software - Reference; Science/Mathematics; Electronics - Circuits - General; Engineering - Electrical & Electronic; Electronics - Circuits - Integrated; Quality Control; Congresses; Integrated Circuits; Reliability; Wafer-scale integration