Particle-induced X-ray emission spectrometry (PIXE)
By: edited by Sven A.E. Johansson, John L. Campbell, Klas G. Malmqvist.
Contributors: Johansson, Sven A. E., 1923-; Campbell, John L.; Malmqvist, Klas G.
Series: Chemical analysis ;; v. 133
Publisher: Wiley
Published: 1995
Place of publication: New York
Language: eng
Number of pages: 451
Subjects: Proton-induced X-ray emission.
Description: Long proven as an analytical tool of uncommon accuracy and utility, particle-induced X-ray emission has enjoyed a solid, if narrow, reputation in the area of chemical analysis. Capable of detecting elemental concentrations down to parts per million, PIXE is now a standard component of the analytical arsenal of the nuclear physics laboratory. Yet in wider avenues of chemical research, PIXE technology is still relatively new and untested.

An inside look at the nuts and bolts of PIXE from specialists who've refined the technique in biomedicine, atmospheric science, geology, and art and archaeology, this comprehensive introduction to PIXE reveals its conceptual foundation and unique methodology as well as its, as yet, enormous untapped potential as a primary analytical tool.

Particle-Induced X-Ray Emission Spectrometry (PIXE) offers professionals and students a practical, user-based look at the many facets and current uses of PIXE for multielemental analysis while providing a stimulus for creative, insightful investigation.

Beginning with a brief history of PIXE, the book then introduces the reader to the conceptual basics central to understanding and using PIXE. It details the hardware and methodology that make up PIXE, examining its instrumentation, characteristics of x-ray spectroscopy, standardization of quantitative analysis, the accuracy of PIXE analysis, and its limits of detection.

Concluding with a detailed comparative analysis of PIXE with other current analytical methods, the book then provides a fascinating glimpse into the future prospects of PIXE. A must reference for the professional and novice in search of the basic hardware and methods behind the current state of the science, Particle-Induced X-Ray Emission Spectrometry (PIXE) is a premier guide to exploring the analytical possibilities open to this unique technology.
Notes: Includes bibliographical references and index.
"A Wiley-Interscience publication."