Fizicheskie aspekty nadezhnosti, metody i sredstva diagnostirovaniia integralnykh skhem: Mezhdunarodnaia nauchno-tekhnicheskaia konferentsiia, 19-20 maia 1993 g. 
Subtitle: tezisy dokladov
Publisher: Voronezhskii politekhn. in-t
Published: 1993
Language: rus
Format: Unknown Binding
Number of pages: 103
ISBN-13: 9785230044673
Subjects: Congresses; Integrated circuits; Reliability