Test patterns NBS-28 and NBS-28A
Subtitle: random fault interconnect step coverage and other structures
By: Michael A. Mitchell, Loren W. Linholm sponsored by Naval Air Systems Command, Air Force Wright Aeronautical Laboratories.
Contributors: Linholm, Loren W.; United States. National Bureau of Standards.; Air Force Wright Aeronautical Laboratories.; United States. National Engineering Laboratory. Center for Electronics and Electrical Engineering.
Series: Semiconductor measurement technology; NBS special publication ;; 400-65
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1981
Place of publication: Washington, D.C
Language: eng
Number of pages: 49
Subjects: Integrated circuits -- Testing.; Electronic apparatus and appliances -- Testing.
Notes: Includes bibliographical references.
"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
Issued March 1981."
S/N 003-003-02297-7