Characterization of very high speed semiconductor devices and integrated circuits
By: Ravi Jain, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, the Metallurgical Society.
Contributors: Jain, Ravi.; Society of Photo-optical Instrumentation Engineers.; Metallurgical Society (U.S.)
Series: Critical reviews of optical science and technology; SPIE ;; v. 795; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 795.
Publisher: SPIE
Published: 1987
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 359
Subjects: Very high speed integrated circuits -- Congresses.; Semiconductors -- Congresses.
Notes: Includes bibliographies and index.
Papers from a conference held Mar. 23-25, 1987, at Bay Point, Fla.