X-ray spectrometry in electron beam instruments
By: edited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury.
Contributors: Williams, David B. 1949-; Goldstein, Joseph, 1939-; Newbury, Dale E.
Publisher: Plenum Press
Published: 1995
Place of publication: New York
Language: eng
Number of pages: 372
Subjects: Electron beams -- Instruments; X-ray spectroscopy; Electron probe microanalysis
Notes: Includes bibliographical references and index.