Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass
By: Albert J. Juhasz, Roy C. Tew, and Gene E. Schwarze.
Contributors: Tew, Roy C.; Schwarze, Gene E.; Lewis Research Center.
Series: [NASA technical memorandum] -- NASA/TM-1998-208826.; NASA technical memorandum -- 208826.
Publisher: National Aeronautics and Space Administration, Lewis Research Center; National Technical Information Service, distributor
Published: 1998
Place of publication: [Cleveland, Ohio]; Springfield, VA
Language: eng
Format: Microform
Subjects: Operating temperature.; Radiation hardening.; Silicon carbides.; Spacecraft power supplies.; Heat radiators.; Radiation effects.
Notes: Shipping list no.: 99-0559-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1999] 1 microfiche.