Microscopy of Semiconducting Materials 2001
Publisher: Taylor & Francis
Published: February 1, 2002
Language: eng
Format: Hardcover
Number of pages: 610
ISBN-13: 9780750308182
Subjects: Electronics - General; Microscopes & Microscopy; Semi-conductors & super-conductors; Technology / Material Science; Material Science; Technology; Technology & Industrial Arts; Science/Mathematics
First sentence: ABSTRACT: Recent developments in Schottky field emission scanning transmission electron microscopes now provide the ability to map changes in structure, composition and bonding that occur at materials interfaces and defects on the fundamental atomic scale.