Testing's impact on design & technology
Subtitle: International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986
By: sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE Computer Society Press
Published: 1986
Place of publication: Washington, D.C
Language: eng
Number of pages: 1009
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.
Notes: Includes bibliographies and index.
"IEEE catalog no. 86CH2339-0."