Transactions of the JSNDI
Edition: 1 edition
Publisher: Routledge
Published: January 1, 1991
Language: eng
Format: Hardcover
Number of pages: 136
ISBN-13: 9782881247934
Subjects: Non-destructive testing; Non-Destructive Testing Of Materials; Science/Mathematics; Japan; Nanostructures
First sentence: The rotating analyser method in ellipsometry is the most intelligent way to measure parameters related to polarization, phase difference and amplitude ratio of light components.