Quality aspects in spatial data mining
By: editors, Alfred Stein, Wenzhong Shi, Wietske Bijker.
Contributors: Stein, Alfred.; Shi, Wenzhong.; Bijker, Wietske, 1965-
Publisher: Chapman & Hall/CRC
Published: 2008
Place of publication: Boca Raton, FL
Language: eng
ISBN-13: 9781420069266
Subjects: Geographic information systems; Spatial analysis (Statistics)
Notes: Includes bibliographical references and index.