Scanning probe microscopy
By: editors, Nikodem Tomczak, Kuan Eng Johnson Goh
Contributors: ebrary, Inc
Publisher: World Scientific Pub. Co.
Published: 2011
Place of publication: Singapore; Hackensack, N.J
Language: eng
Format: [electronic resource] /
Number of pages: 261
ISBN-13: 9789814324762; 9789814324779
Subjects: Nanoelectronics; Scanning probe microscopy
Notes: Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.