Expert system technology applied to the testing of complex digital electronic architectures
Subtitle: TEXAS : a synergistic test strategy planning and functional test pattern generation methodology applicable to the design, development and testing of complex digital electronic circuits.
Contributors: Brunel University. Department of Electrical Engineering and Electronics.
Publisher: Brunel University
Published: 1989
Place of publication: Uxbridge
Language: eng
Number of pages: 346
Notes: BLL no. DX86338.

Thesis (Ph.D.) - Brunel University.