Strength of Si wafers with microcracks
Subtitle: a theoretical model
By: Przemyslaw (Peter) Rupnowski and Bhushan Sopori
Contributors: United States. Department of Energy; United States. Department of Energy. Office of Scientific and Technical Information; IEEE Photovoltaic Specialists Conference (33rd : 2008 : San Diego, Calif.); National Renewable Energy Laboratory (U.S.)
Series: NREL/PO -- 520-43306; NREL/PO -- 520-43306.
Publisher: United States. Dept. of Energy; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy
Published: 2008
Place of publication: Washington, D.C; Oak Ridge, Tenn
Language: eng
Format: [electronic resource] :
Subjects: Semiconductor wafers; Research; Photovoltaic cells
Notes: Title from title screen (viewed on July 9, 2012).

"Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California."

"This work was supported by the U.S. Department of Energy under Contract No. DE-AC36-99GO10337 with the National Renewable Energy Laboratory."

"NREL is operated by Midwest Research Institute, Batelle."