VLSI testing
Subtitle: digital and mixed analogue/digital techniques
By: Stanley L. Hurst.
Series: IEE circuits, devices and systems series -- 9.; IEE circuits and systems series -- 9.
Publisher: Institution of Electrical Engineers
Published: 1998
Place of publication: London
Language: eng
Number of pages: 532
Subjects: Integrated circuits -- Very large scale integration -- Testing.
Notes: Includes bibliographical references and index.