Study of Degradation Products and Degradation Pathways of ECD and Its Drug Product, ECD Kit
Contributors: Chang-Yung Su, author; Jian-Hua Zhao, author; Lee-Chung Men, author; Lie-Hang Shen, author; Shang-Yu Shen, author; Yi-Chih Hsia, author; Yu-Yung Lin, author
Publisher: INTECH Open Access Publisher
Published: 2011
Language: eng
ISBN-13: 9789533076836
Notes: En.