EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Subtitle: Volume 1: Instrumentation and Methods
By: edited by Martina Luysberg, Karsten Tillmann, Thomas Weirich
Contributors: Tillmann, Karsten; Weirich, Thomas E.; SpringerLink (Online service)
Publisher: Springer-Verlag Berlin Heidelberg
Published: 2008
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] :
ISBN-13: 9783540851547; 9783540851561
Subjects: Physics