Proceedings of the 1st European Test Conference, Paris, April 12-14, 1989.
Contributors: Société des électriciens et des électroniciens.; IEEE Computer Society.; Institute of Electrical and Electronics Engineers.
Publisher: IEEE Computer Society Press
Published: 1989
Place of publication: Washington, D.C
Language: eng
Number of pages: 417
Subjects: Integrated circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Notes: Includes bibliographies and index.
"[Sponsored by] Société des électriciens et des électroniciens, IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc."
"IEEE Computer Society order number 1937."
"IEEE catalog number 89CH2696-3."