Scanning microscopy 2009
Subtitle: 4-7 May 2009, Monterey, California, United States
By: Michael T. Postek ... [et al.], editors ; sponsored by SPIE ; technical cosponsor, NIST--National Institute of Standards and Technology (United States)
Contributors: SPIE (Society); National Institute of Standards and Technology (U.S.)
Series: Proceedings of SPIE -- v. 7378; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7378.
Publisher: SPIE
Published: 2009
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819476548
Notes: Includes bibliographical references and author index.