A novel approach for correlating capacitance data with performance during thin-film device stress studies
Subtitle: preprint
By: R.L. Graham and D.S. Albin, National Renewable Energy Laboratory, [and] L.A. Clark, Primestar Solar
Contributors: Albin, David S.; Clark, Laura A.; National Renewable Energy Laboratory (U.S.); Primestar Solar (Firm); SPIE Optics and Photonics Conference (2011 : San Diego, Calif.)
Series: NREL/CP -- 5200-52392; Conference paper (National Renewable Energy Laboratory (U.S.)) -- NREL/CP-5200-52392.
Publisher: National Renewable Energy Laboratory
Published: 2011
Place of publication: Golden, CO
Language: eng
Format: [electronic resource] :
Subjects: Photovoltaic cells; Research; Electric capacity; Thin films; Performance; Data mining; Computer programs
Notes: Title from title screen (viewed September 19, 2011).

"August 2011."

"Presented at the SPIE Optics + Photonics 2011, San Diego, California, August 21-25, 2011."

Includes bibliographical references (p. 8).

Sponsored by National Renewable Energy Laboratory DE-AC36-08GO28308