Machine vision applications in industrial inspection II
Subtitle: 8-9 February 1994, San Jose, California
By: Benjamin M. Dawson, Stephen S. Wilson, Frederick Y. Wu, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
Contributors: Dawson, Benjamin M.; Wilson, Stephen S.; Wu, Frederick Y.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2183.; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2183.
Publisher: SPIE
Published: 1994
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 336
Subjects: Quality control -- Optical methods -- Automation -- Congresses.; Computer vision -- Congresses.
Notes: Includes bibliographical references and index.