Conformance test architecture and test suite for ANSI/NIST-ITL 1-2007
By: Fernando L. Podio, Dylan Yaga, Christofer J. McGinnis
Contributors: Yaga, Dylan; McGinnis, Christofer J.; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 7791
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology
Published: 2011
Place of publication: Gaithersburg, MD
Language: eng
Format: [electronic resource] /
Number of pages: 70
Subjects: Biometric identification; Computer programs; Standards; Data processing; Internetworking (Telecommunication)
Notes: Title from PDF title screen (viewed Sept. 26, 2012).

"June 2011."

Includes bibliographical references.