Microprobe Characterization of Optoelectronic Materials (Optoelectronic Properties of Semiconductors and Superlattices)
Edition: 1 edition
Publisher: CRC
Published: November 15, 2002
Language: eng
Format: Hardcover
Number of pages: 715
ISBN-13: 9781560329411
Subjects: Electricity, magnetism & electromagnetism; Fibre optics; Materials science; Semi-conductors & super-conductors; Quantum Theory; Microscopes & Microscopy; Science; Technology & Industrial Arts; Science/Mathematics; Semiconductors; Electricity; Material Science; Optics; Technology / Material Science; Microprobe analysis; Optical properties
First sentence: Photoluminescence imaging (PLI) was introduced about fifteen years ago as an innovative tool to characterize GaAs wafers.