Semiconductor material and device characterization
By: Dieter K. Schroder.
Edition: 3rd ed.
Publisher: IEEE Press; Wiley; Wiley-Interscience; Wiley-IEEE Press
Published: 2006
Place of publication: [Piscataway, NJ]; Hoboken, N.J
Language: eng
Number of pages: 779
Subjects: Semiconductors.; Semiconductors -- Testing.
Notes: "Wiley-Interscience."

Includes bibliographical references and index.