Advances and applications in the metallography and characterization of materials and microelectronic components
Subtitle: proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society
By: edited by D.W. Stevens ... [et al.].
Contributors: Stevens, D. W.
Series: Microstructural science ;; v. 23
Publisher: International Metallographic Society; ASM International
Published: 1996
Place of publication: Columbus, Ohio; Materials Park, Ohio
Language: eng
Number of pages: 318
Subjects: Metallography -- Congresses.; Metallography -- Industrial applications -- Congresses.; Microelectronics -- Materials -- Microscopy -- Congresses.
Notes: Includes bibliographical references.
Meeting held in Albuquerque, New Mexico, July 23-26, 1995.