Measurement and effects of surface defects and quality of polish
Subtitle: January 21-22, 1985, Los Angeles, California
By: cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors.
Contributors: Baker, L. R.; Bennett, Harold Earl, 1929-; Sira Limited.
Series: Proceedings of SPIE--the International Society for Optical Engineering ;; v. 525
Publisher: SPIE--the International Society for Optical Engineering
Published: 1985
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 198
Subjects: Lenses -- Defects -- Congresses.
Notes: Includes bibliographies and index.