Learning from good and bad data
By: by Philip D. Laird.
Series: The Kluwer international series in engineering and computer science ;; 47.; Knowledge representation, learning, and expert systems; Kluwer international series in engineering and computer science ;; SECS 47.; Kluwer international series in engineering and computer science.
Publisher: Kluwer Academic Publishers
Published: 1988
Place of publication: Boston
Language: eng
Number of pages: 211
Subjects: Machine learning.; Artificial intelligence.; Computers.; System identification.
Notes: Bibliography: p. 201-207.
Includes index.