2008 International Conference on Simulation of Semiconductor Processes and Devices
Subtitle: SISPAD 2008 : September 9-11, 2008, Yumoto Fujiya Hotel, Hakone, Japan
By: co-sponsored by Japan Society of Applied Physics ... [et al.] in cooperation with The Institute of Electronics, Information and Communication Engineers, IEEE EDS Japan Chapter, IEEE EDS Kansai Chapter.
Contributors: Ōyō Butsuri Gakkai.; Denshi Jōhō Tsūshin Gakkai (Japan); IEEE Electron Devices Society. Japan Chapter.; IEEE Electron Devices Society. Kansai Chapter.
Publisher: IEEE Xplore
Published: 2008
Place of publication: [Piscataway, N.J.]
Language: eng
Format: Electronic resource
Number of pages: 387
ISBN-13: 9781424417537
Subjects: Semiconductors -- Mathematical models -- Congresses; Computer-aided design -- Congresses
Genres: Congresses
Other titles: SISPAD 2008; Simulation of Semiconductor Processes and Devices, 2008, SISPAD 2008, International Conference on
Notes: Title from PDF t.p. (viewd on Nov. 24, 2008).

"IEEE Catalog Number: CFP08SSD-PRT"--PDF copyright p.

Includes bibliographical references and index.

Electronic text (abstracts in HTML; articles in PDF).

System requirements: Adobe Acrobat Reader.

Mode of access: Internet.