Measurement of transistor scattering parameters
By: George J. Rogers and David E. Sawyer, Ramon L. Jesch.
Contributors: Sawyer, David E., joint author.; Jesch, Ramon L., joint author.
Series: Semiconductor measurement technology; NBS special publication ; 400-5; NBS special publication ;; 400-5.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1975
Place of publication: [Washington]
Language: eng
Number of pages: 48
Subjects: Transistors -- Testing.; Electronic measurements.
Notes: Includes bibliographical references.
"Jointly sponsored by the National Bureau of Standards and the Air Force Weapons Laboratory."