Effects of processing variations and endurance stress on the MNOS nonvolatile memory device
By: by Aloysius Anscrutha Marino De Almeida
Published: 1986
Language: eng
Number of pages: 139
Subjects: Computer storage devices; Semiconductor storage devices; Metal insulator semiconductors; Metal oxide semiconductors
Notes: Typescript.

Vita.

Thesis (Ph. D.)--University of Florida, 1986.

Bibliography: leaves 123-131.