Advances in X-Ray Analysis
Contributors: John V. Gilfrich (Editor); C.C. Goldsmith (Editor); Ting C. Huang (Editor); Ron Jenkins (Editor); I. Cev Noyan (Editor)
Edition: 1 edition
Publisher: Springer; Kluwer Academic Publishers
Published: September 30, 1994
Language: eng
Format: Hardcover
Number of pages: 778
ISBN-13: 9780306449017
Subjects: Analytical chemistry; Mechanical Properties Of Materials; Structural Properties Of Materials; Science; Technology & Industrial Arts; Science/Mathematics; Chemistry - Analytic; Chemistry - Physical & Theoretical; General; Material Science; Science / Chemistry / Analytic