A Cephalometric analysis of hereditary patterns
By: by Emanuel Bernstein, and Seymour C. Conarck
Contributors: Conarck, Seymour C.
Published: 1954
Language: eng
Number of pages: 16
Subjects: Academic Dissertations as Topic; Cephalometry
Notes: Tables.

Thesis (Orthodontics Certificate) -- Columbia University School of Dental and Oral Surgery -- New York, 1954.

Bibliography: p. 16.