Infrared imaging systems
Subtitle: design, analysis, modeling, and testing : 16-18 April 1990, Orlando, Florida
By: Gerald C. Holst, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organization, CREOL/University of Central Florida.
Contributors: Holst, Gerald C.; Society of Photo-optical Instrumentation Engineers.; CREOL (Research center); SPIE Technical Symposium on Optical Engineering and Photonics in Aerospace Sensing (1990 : Orlando, Fla.)
Series: Proceedings / SPIE--the International Society for Optical Engineering -- v. 1309; Proceedings of SPIE--the International Society for Optical Engineering -- v. 1309.
Publisher: The Society
Published: 1990
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 313
Subjects: Infrared imaging -- Congresses.
Genres: Congresses.
Notes: "Part of two-conference program on Electro-Optic Analysis and Testing held at the SPIE Technical Symposium on Optical Engineering and Photonics in Aerospace Sensing, 16-20 April 1990, in Orlando, Florida."

Includes bibliographical references and index.