Advances in Scanning Probe Microscopy (Advances in Materials Research)
Contributors: T. Sakurai (Editor); Y. Watanabe (Editor)
Edition: 1 edition
Publisher: Springer
Published: April 26, 2000
Language: eng
Format: Hardcover
Number of pages: 341
ISBN-13: 9783540667186
Subjects: Materials science; Microscopy; Semi-conductors & super-conductors; Scanning probe microscopy; Microscopy In Biology; Science; Science/Mathematics; Solid State Physics; Electronics - Semiconductors; Microscopes & Microscopy; Fullerenes; Scanning Tunnelling Microscopy; Semiconductor surfaces; Technology / Material Science; electronic properties; surface analysis; Material Science; Physics