1996 International Integrated Reliability Workshop final report
Subtitle: Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 1996
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: IEEE Electron Devices Society; IEEE Reliability Society
Published: 1996
Place of publication: [New York]
Language: eng
Number of pages: 175
Subjects: Integrated circuits -- Reliability -- Congresses.; Integrated circuits -- Wafer scale integration -- Reliability -- Congresses.
Notes: Includes bibliographic references.
"IEEE Catalog No. 96TH8215."