Materials Reliability in Microelectronics II
Subtitle: Symposium Held April 27-May 1, 1992, San Francisco, California, U.S.A. (Materials Research Society Symposium Proceedings)
Contributors: John R. Lloyd (Editor)
Publisher: Materials Research Society
Published: August 1992
Language: eng
Format: Hardcover
Number of pages: 327
ISBN-13: 9781558991606
Subjects: Reliability Engineering; Testing; Microelectronics; Electronic Engineering (Specific Aspects); Technology & Industrial Arts; Science/Mathematics; Reliability; Electronics - General; Electrodiffusion; Congresses; Materials