Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania
By: edited by Avinash C. Kak, Katsushi Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.
Contributors: Kak, Avinash C.; Ikeuchi, Katsushi.; IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.
Publisher: IEEE Computer Society Press
Published: 1994
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 307
Subjects: Computer vision -- Congresses.; Computer-aided design -- Congresses.
Notes: Includes bibliographical references and author index.
"IEEE Catalog Number 94TH0595-9."