Machine vision applications in industrial inspection VIII
Subtitle: 24-26 January 2000, San Jose, California
By: Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
Contributors: Tobin, Kenneth W.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series,; v. 3966; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3966.
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 396
Subjects: Engineering inspection -- Automation -- Congresses; Computer vision -- Industrial applications -- Congresses; Quality control -- Optical methods -- Automation -- Congresses; Mensuration -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and index.