EXAFS spectroscopy, techniques and applications
By: edited by B.K. Teo and D.C. Joy.
Contributors: Teo, B. K.; Joy, David C., 1943-; Materials Research Society.
Publisher: Plenum Press; Plenum; Brand: Springer
Published: 1981
Place of publication: New York
Language: eng
Number of pages: 275
Subjects: X-ray spectroscopy.; Absorption spectra.; Extended x-ray absorption fine structure.
Notes: Includes bibliographical references and index.
Based on proceedings of a symposium held at the meeting of the Materials Research Society, Nov. 26-30, 1979, in Boston.