High-resolution transmission electron microscopy and associated techniques
By: editors, Peter R. Buseck, John M. Cowley, Leroy Eyring.
Contributors: Buseck, Peter.; Cowley, J. M. 1923-; Eyring, LeRoy.
Publisher: Oxford University Press
Published: 1988
Place of publication: New York
Language: eng
Number of pages: 645
Subjects: Transmission electron microscopy.
Notes: Includes bibliographies and index.