Study of electron beam effects on surfaces using X-ray photoelectron spectroscopy (XPS) and secondaryion mass spectroscopy (SIMS)
By: [by] M. Gettings and J.P. Coad.
Contributors: Coad, J P.; Atomic Energy Research Establishment. Materials Development Divsion.
Publisher: Atomic Energy Research Establishment
Published: 1976
Place of publication: Harwell
Language: eng