INSTANT--IGBT network simulation and transient ANalysis tool
By: A.R. Hefner, Jr.
Contributors: National Institute of Standards and Technology (U.S.)
Series: NIST special publication ;; 400-88; Semiconductor measurement technology
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1992
Place of publication: Gaithersburg, MD; Washington, DC
Language: eng
Number of pages: 151
Subjects: Insulated gate bipolar transistors.; Electronic circuit design -- Computer programs.; Power semiconductors -- Design -- Data processing.
Notes: Includes bibliographical references.
"June 1992."