Defect recognition and imageprocessing in III-V compounds III
Subtitle: proceedings of the third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP III), Tokyo, Japan, 22-25 September 1989
By: edited by T. Ogawa.
Contributors: Ogawa, T.
Series: Journal of crystal growth -- vol. 103
Publisher: North-Holland
Published: 1990
Place of publication: Amsterdam
Language: eng