Physical aspects of microscopic characterization of materials
Subtitle: proceedings of the 5th Pfefferkorn Conference, held October 2 to 7, 1986, at Brueggen, West Germany
By: edited by J. Kirschner, K. Murata, J.A. Venables; managing editor, Sudha A. Bhatt.
Contributors: Bhatt, Sudha A.; Kirschner, J. 1945-; Murata, K.; Venables, J. A.
Series: Scanning microscopy supplement -- 1 (1987); Scanning microscopy -- 1
Publisher: Scanning Electron Microscopy, Inc.
Published: 1987
Place of publication: AMF O'Hare, IL
Language: eng
Number of pages: 253
Subjects: Electron beams -- Congresses.; Electrons -- Scattering -- Congresses.; Microchemistry -- Congresses.; Scanning electron microscopes -- Congresses.; Solids -- Congresses.
Notes: Issued as "Scanning microscopy, supplement 1, 1987."

Includes bibliographical references and indexes.