ISTFA 2001
Subtitle: proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS
Contributors: ASM International.; Electronic Device Failure Analysis Society.
Publisher: ASM International
Published: 2001
Place of publication: Materials Park, Ohio
Language: eng
Number of pages: 485
Subjects: Electronic apparatus and appliances -- Testing -- Congresses.; Electronics -- Materials -- Testing -- Congresses.
Genres: Congresses.
Other titles: Proceedings of the 27th International Symposium or Testing and Failure Analysis; Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis
Notes: Sponsored by EDFAS, ISTFA.

Includes bibliographical references and index.