IEEE standard test access port and boundary-scan architecture
By: Test Technology Technical Committee of the IEEE Computer Society.
Contributors: IEEE Standards Board.; IEEE Computer Society. Test Technology Technical Committee.
Series: IEEE std -- 1149.1-1990.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1990
Place of publication: New York, N.Y., USA
Language: eng
Subjects: Integrated circuits -- Testing -- Standards
Notes: "IEEE std 1149.1-1990."

"Approved February 15, 1990, IEEE Standards Board."

Also available via the World Wide Web with additional title: IEEE Std 1149.1-1990.