Electronic derating for optimum performance
By: prepared by Reliability Analysis Center ; [author, Bruce Dudley]
Contributors: Reliability Analysis Center (U.S.)
Publisher: Reliability Analysis Center
Published: 2000
Place of publication: [Rome, NY]
Language: eng
Number of pages: 202
Subjects: Electronic apparatus and appliances; Reliability; Design and construction; Semiconductors
Notes: "Under contract to: Defense Supply Center Columbus, DSCC-PLI."

"Ordering no.: D-RATE."

Includes index.