Proceedings
By: International Test Conference 1996.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: The Conference
Published: 1996
Place of publication: Altoona, PA
Language: eng
Number of pages: 951
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Integrated circuits -- Fault tolerance -- Congresses.
Other titles: Test and design validity
Notes: Includes bibliographical references and index.
"Sponsored by IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section"--Cover.
"October 20-25, 1996 ... Washington, D.C., USA"--Cover.
"IEEE catalog number 96CH35976"--T.p. verso.