Characterization of particles
Subtitle: proceedings of the particle analysis session of the 13th annual conference of the Microbeam Analysis Society held at Ann Arbor, Michigan, June 22, 1978
By: Kurt F. J. Heinrich, editor, Center for Analytical Chemistry, National Measurement Laboratory, National Bureau of Standards
Contributors: Heinrich, Kurt F. J; Microbeam Analysis Society; Center for Analytical Chemistry (U.S.)
Series: NBS special publication -- 533
Publisher: Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1980
Place of publication: Washington]
Language: eng
Number of pages: 223
Subjects: Microbial differentiation; Electron metallography; Electron microscopes
Notes: Issued Apr. 1980

CODEN:XNBSAV

Includes bibliographical references