Advanced microscopy techniques III
Subtitle: 15-16 May 2013, Munich, Germany
By: Emmanuel Beaurepaire, Peter T. C. So, editors ; sponsored by the Optical Society (United States), SPIE ; with support from Air Force Office of Scientific Research (United States), ThorLabs (United Kingdom) ; student award sponsors Toptica Photonics AG (Germany), Zeiss (United States)
Contributors: Beaurepaire, Emmanuel, editor; So, Peter T. C., editor; Optical Society of America; SPIE (Society); European Conference on Biomedical Optics (2013 : Munich, Germany)
Series: Progress in biomedical optics and imaging -- vol. 14, no. 47; Proc. of OSA Biomedical Optics--SPIE -- volume 8797; Progress in biomedical optics and imaging -- v. 14, no. 47.; Proceedings of SPIE--the International Society for Optical Engineering -- v. 8797.
Publisher: SPIE
Published: 2013
Place of publication: Bellingham, Washington
Language: eng
ISBN-13: 9780819496461
Subjects: Electron Microscopy; Congresses; Methods; Optics and Photonics
Notes: Includes bibliographical references and author index.