Advanced scanning electron microscopy and X-ray microanalysis
By: Dale E. Newbury ... [et al.].
Contributors: Newbury, Dale E.
Publisher: Plenum Press
Published: 1986
Place of publication: New York
Language: eng
Number of pages: 454
Subjects: Scanning electron microscopy.; X-ray microanalysis.; Electron Probe Microanalysis.; Microscopy, Electron, Scanning.
Notes: Bibliography: p. 435-448.
Includes index.