Suppression of premature dielectric breakdown for high-voltage capacitance measurements
By: by Alvin M Goodman jointlysupported by the Defense Advanced Research Projects Agency and the National Bureau of Standards.
Contributors: Defense Advanced Research Projects Agency.; National Bureau of Standards.
Series: Semiconductormeasurement technology; Special publication -- 400-37.
Publisher: National Bureau of Standards
Published: 1977
Place of publication: Washington
Language: eng