Scanning probe microscopy
Subtitle: electrical and electromechanical phenomena at the nanoscale
By: Sergei Kalinin, Alexei Gruverman, editors.
Contributors: Kalinin, S. V.; Gruverman, A.
Publisher: Springer
Published: 2007
Place of publication: New York
Language: eng
Number of pages: 980
ISBN-13: 9780387286679
Subjects: Scanning probe microscopy; Nanoelectronics
Other titles: Electrical and electromechanical phenomena at the nanoscale
Notes: Includes bibliographical references and index.