Istfa 2001
Subtitle: Proceedings of the 27th International Symposium for Testing and Failure Analysis, November 11-15, Santa Clara, California
Edition: Har/Cdr edition
Publisher: Asm Intl
Published: November 2001
Language: eng
Format: Hardcover
Number of pages: 550
ISBN-13: 9780871707468
Subjects: Electronics engineering; Materials science; Metals technology / metallurgy; Electronics - Microelectronics; Technology; Science/Mathematics