Rationale and procedures for development of a NASA primary metrology laboratory for large optics
By: T.V. Vorburger, C.J. Evans, and W.T. Estler
Contributors: Evans, C. J; Estler, W. T; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6710
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 2001
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 42
Subjects: United States. -- National Aeronautics and Space Administration; Optical instruments -- Testing
Notes: "March 2001."

Shipping list no.: 2001-0361-M

Includes bibliographical references (p. 25-29)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [2001] 1 microfiche : negative.