Optical pattern recognition
Subtitle: proceedings of a conference held 4 November 1991, San Jose, California
By: sponsored by SPIE--the International Society for Optical Engineering ; Joseph L. Horner, Bahram Javidi, editors.
Contributors: Horner, Joseph L.; Javidi, Bahram.; Society of Photo-optical Instrumentation Engineers.
Series: Critical reviews of optical science and technology -- v. CR40.; Critical reviews of optical science and technology -- v. CR40.
Publisher: SPIE Optical Engineering Press
Published: 1992
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 266
Subjects: Optical pattern recognition -- Congresses.
Genres: Congresses.
Notes: "A publication of SPIE--the International Society for Optical Engineering."

Includes bibliographical references.