Applied Crystallography
Subtitle: Wisla, Poland, 4-7 September 2000 (Proceedings of the XVIII Conference)
Publisher: World Scientific Publishing Company
Published: May 2001
Language: eng
Format: Hardcover
Number of pages: 500
ISBN-13: 9789810246136
Subjects: Crystallography; Materials science; Science; Congresses; Science/Mathematics; Applied Sciences; Material Science
First sentence: X-ray diffraction-line-broadening analysis is traditionally used to characterize nanocrystalline materials, i.e. powders with domain (crystallite) size at a nanometre scale over which diffraction is coherent.