Computer simulation of electron microscope diffraction and images
Subtitle: proceedings of a topical symposium on computer simulation of electron microscope diffraction and images
By: sponsored by the ASM/MSD Computer Simulation Committee, held at the TMS Annual Meeting in Las Vegas, Nevada, February 28-March 3, 1989 ; edited by William Krakow, Michael O'Keefe.
Contributors: Krakow, William.; O'Keefe, Michael; ASM/MSD Computer Simulation Committee.; Minerals, Metals and Materials Society. Meeting
Publisher: TMS
Published: 1989
Place of publication: Warrendale, Pa
Language: eng
Number of pages: 275
Subjects: Electron microscopy -- Computer simulation -- Congresses.; Electrons -- Diffraction -- Computer simulation -- Congresses.
Notes: Includes bibliographical references and indexes.