1998 IEEE International Reliability Physics Symposium
Subtitle: proceedings : 36th annual : Reno, Nevada, March 31, April 1, 2, 1998
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: IEEE
Published: 1998
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 421
Subjects: Electronic apparatus and appliances -- Reliability -- Congresses.; Electronic apparatus and appliances -- Testing -- Congresses.; Integrated circuits -- Reliability -- Congresses.; Integrated circuits -- Testing -- Congresses.
Genres: Congresses.
Other titles: IEEE International Reliability Physics proceedings.; 1998 IEEE Annual International Reliability Physics.; Reliability Physics Symposium proceedings, 1998, 36th Annual, 1998 IEEE International.
Notes: "IEEE Catalog No. 98CH36173."

Includes bibliographical references.

Also available via the World Wide Web with additional title: Reliability Physics Symposium proceedings, 1998, 36th Annual, 1998 IEEE International.