Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide
By: Y. Harada, N. Kurata, G. Furuno.
Contributors: Kurata, N.; Furuno, G.; United States. National Aeronautics and Space Administration.
Series: NASA technical translation -- NASA TT-20332.; NASA technical translation -- 20332.
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1988
Place of publication: Washington, DC; [Springfield, Va
Language: eng
Format: Microform
Subjects: Silicon carbide.; Atomic emission spectroscopy.; Decomposition (Chemistry)
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1988] 1 microfiche.