Selected papers on scanning probe microscopes
Subtitle: design and applications
By: Yves Martin, editor.
Contributors: Martin, Yves, 1959-
Series: SPIE milestone series ;; v. MS 107
Publisher: SPIE Optical Engineering Press
Published: 1995
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 478
Subjects: Scanning probe microscopy.; Scanning tunneling microscopy.; Atomic force microscopy.
Other titles: Scanning probe microscopes.
Notes: Includes bibliographical references and indexes.