ITC
Subtitle: International Test Conference : proceedings : October 18-23, 1998, Marriott Wardman Park Hotel, Washington, D.C., USA
By: sponsored by IEEE Computer Society Test Technology Technical Committee, and IEEE Philadelphia Section.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: International Test Conference; IEEE
Published: 1998
Place of publication: Washington, DC; Piscataway New Jersey
Language: eng
Number of pages: 1179
Subjects: Integrated circuits -- Testing -- Congresses; Electronic digital computers -- Circuits -- Testing -- Congresses; Telecommunication -- Congresses; Radio frequency -- Congresses; Microprocessors -- Testing -- Congresses; Embedded computer systems -- Testing -- Congresses
Genres: Congresses.
Other titles: 1998 IEEE International Test Conference
Notes: Cover title.

"IEEE Catalog Number 98CH36270"--verso of T.p.

Includes bibliographical references and author index.