Electrical Overstress/Electrostatic Discharge Symposium proceedings 1980
Subtitle: San Diego, California, September 9-11, 1980
By: sponsored by IIT Research Institute.
Contributors: IIT Research Institute.; Reliability Analysis Center (U.S.)
Publisher: Reliability Analysis Center
Published: 1981
Place of publication: Griffiss AFB, N.Y
Language: eng
Number of pages: 247
Subjects: Electronic apparatus and appliances -- Protection -- Congresses; Electric discharges -- Congresses; Electrostatics -- Congresses
Notes: "EOS-2".

On spine: EOD/ESD Symposium proceedings.

Includes bibliographical references.