Proceedings, 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Subtitle: October 25-27, 2000, Yamanashi, Japan
By: sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test TechnologyTechnical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE, Japan.
Contributors: IEEE Computer Society.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Technical Council on Test Technology.
Publisher: IEEE Computer Society Press
Published: 2000
Place of publication: Los Alamitos
Language: eng
Number of pages: 422
Subjects: Integrated circuits -- Very large scale integration -- Design and construction -- Congresses; Fault-tolerant computing -- Congresses
Genres: Congresses.
Other titles: 2000 proceedings: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems; IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems; 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems; Defect and fault tolerance in VLSI systems; DFT 2000
Notes: "IEEE Computer Society Press order number PR00719--T.p. verso.

"DFT 2000"--Half title.

Includes bibliographical references and index.