Atom Probe Microscopy
By: by Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
Contributors: Moody, Michael P.; Cairney, Julie M.; Ringer, Simon P.; SpringerLink (Online service)
Series: Springer Series in Materials Science -- 160
Publisher: Springer New York; Imprint: Springer
Published: 2012
Place of publication: New York, NY
Language: eng
Format: [electronic resource] /
ISBN-13: 9781461434368
Subjects: Materials science; Characterization and Evaluation of Materials; Spectroscopy and Microscopy; Nanochemistry; Surfaces (Physics); Nanoscale Science and Technology; Nanotechnology