Probabilistic models for some intelligence and attainment tests
By: Georg Rasch ; with a foreword and afterword by Benjamin D. Wright.
Edition: Expanded ed.
Publisher: University of Chicago Press
Published: 1980
Place of publication: Chicago
Language: eng
Number of pages: 199
Subjects: Intelligence tests; Ability -- Testing; Educational tests and measurements; Psychology -- Mathematical models
Notes: Bibliography: p. 197-199.