Software quality lessons from medical device failure data
By: Dolores R. Wallace, D. Richard Kuhn
Contributors: Kuhn, D. Richard; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6407
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1999
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 22
Subjects: Software failures; Software failures -- Prevention; Computer software -- Quality control; Medical instruments and apparatus -- Data processing
Notes: Shipping list no.: 2000-0148-M

"November 1999."

Includes bibliographical references (p. 21-22)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O, [1999] 1 microfiche : negative.