1998 GaAs Reliability Workshop
Subtitle: proceedings : November 1, 1998, Atlanta, Georgia
By: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.
Contributors: JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.; IEEE Electron Devices Society.
Publisher: IEEE
Published: 1998
Place of publication: [Piscataway, New Jersey
Language: eng
Number of pages: 105
Subjects: Gallium arsenide semiconductors -- Congresses.; Semiconductors -- Reliability -- Congresses.; Semiconductors -- Materials -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references.
"IEEE Catalog Number: 98EX219"--T.p. verso.