On the next generation of reliability analysis tools
By: Philip S. Babcock IV, Frank Leong, and Eli Gai.
Contributors: Leong, Frank.; Gai, Eli.; Langley Research Center.
Series: NASA contractor report -- 178380.; NASA contractor report -- NASA CR-178380.
Publisher: National Aeronautics and Space Administration, Langley Research Center; For sale by the National Technical Information Service
Published: 1988
Place of publication: Hampton, Va; [Springfield, Va
Language: eng
Format: Microform
Subjects: Mathematical models.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1988. 1 microfiche.