X-ray microscopy II
Subtitle: proceedings of the 2nd International Symposium, Brookhaven, NY, August 31-September 3, 1987
By: D. Sayre ... [et al.] (eds.).
Contributors: Sayre, David.; International Symposium on X-ray Microscopy (2nd : 1987 : Brookhaven National Laboratory)
Series: Springer series in optical sciences ;; v. 56
Publisher: Springer-Verlag
Published: 1988
Place of publication: Berlin; New York
Language: eng
Number of pages: 454
Subjects: X-ray microscopy -- Congresses.
Other titles: X-ray microscopy two.
Notes: Includes bibliographies and indexes.
Based on papers presented at the International Symposium on X-ray Microscopy held at Brookhaven National Laboratory.