Self-testing VLSI design
By: V.N. Yarmolik, I.V. Kachan.
Contributors: Kachan, I. V.
Publisher: Elsevier
Published: 1993
Place of publication: Amsterdam; New York
Language: eng
Number of pages: 345
Subjects: Integrated circuits -- Very large scale integration -- Testing.; Integrated circuits -- Very large scale integration -- Design.
Notes: Includes bibliographical references (p. 329-341) and index.