Testing for EMC compliance
Subtitle: approaches and techniques
By: Mark I. Montrose, Edward M. Nakauchi
Contributors: Nakauchi, Edward M; IEEE Electromagnetic Compatibility Society
Publisher: IEEE Press/Wiley-Interscience
Published: 2004
Place of publication: Hoboken, NJ
Language: eng
Number of pages: 460
Subjects: Electromagnetic compatibility; Electromagnetic interference
Notes: "IEEE Electromagnetic Compatibility Society, sponsor."

Includes bibliographical references (p. 447-451) and index