Proceedings of the Third International Symposium on Defects in Silicon
By: editors, T. Abe ... [et al.].
Contributors: Abe, T.; Electrochemical Society. Electronics Division.; Electrochemical Society. Meeting
Series: Proceedings ;; v. 99-1; Proceedings (Electrochemical Society) ;; v. 99-1.
Publisher: Electrochemical Society
Published: 1999
Place of publication: Pennington, NJ
Language: eng
Number of pages: 530
Subjects: Silicon -- Defects -- Congresses.; Semiconductors -- Defects -- Congresses.
Genres: Congresses.
Other titles: Defects in silicon; Defects in silicon III
Notes: Includes bibliographical references and indexes.
"Electronics Divisions."
Papers presented during the 195th Meeting of the Electrochemical Society, May 2-7, 1999, in Seattle, Wash.