Characterization of thin films and solid surfaces using proton-induced X-ray emission
By: by Bruce D. Sartwell and Arthur B. Campbell, III.
Contributors: Campbell, Arthur Byron, 1924- joint author.
Series: Report of investigations - Bureau of Mines ;; 8455; Report of investigations (United States. Bureau of Mines) ;; 8455.
Publisher: U.S. Dept. of the Interior, Bureau of Mines
Published: 1980
Place of publication: [Washington]
Language: eng
Number of pages: 22
Subjects: Thin films -- Effect of radiation on.; Solids -- Surfaces.; Proton-induced X-ray emission.
Notes: Bibliography: p. 21-22.