Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Subtitle: IPFA 2007
By: edited by Souvik Mahapatra, M.K. Radhakrishnan ; organised by IEEE ED/SSC Chapter, Bangalore, India ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Chapter, Singapore and IEEE ED/AP Chapter, Bombay.
Contributors: Mahapatra, Souvik.; Radhakrishnan, M. K.; IEEE ED/SSC Chapter, Bangalore.; IEEE Electron Devices Society.; IEEE Reliability/CPMT/ED Singapore Chapter.; IEEE ED/AP Chapter, Bombay.
Publisher: IEEE
Published: 2007
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 309
Subjects: Integrated circuits -- Defects -- Congresses; Integrated circuits -- Testing -- Congresses; Integrated circuits -- Reliability -- Congresses
Genres: Congresses.
Notes: "11 to 13 July 2007 JN Tata Auditorium, Indian Institute of Science, Bangalore, India"--Cover.

"IEEE catalog number 07TH8945."--T.p. verso.

Accompanied by: IPFA 2007 final programme.

Includes bibliographical references and author index.