Trace analysis of semiconductor materials.
Series: International series of monographs on analytical chemistry,; v. 11; International series of monographs on analytical chemistry ;; v. 11.
Publisher: Pergamon Press; [distributed in the Western Hemisphere by Macmillan, New York]
Published: 1964
Place of publication: Oxford; New York
Language: eng
Number of pages: 282
Subjects: Semiconductors.; Trace analysis.
Notes: Includes bibliographies.