A survey of design-analysis integration issues
By: Gregory M. Mocko, Steven J. Fenves.
Contributors: Fenves, Steven J.; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6996.
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 2003
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 47
Subjects: New products -- Data processing.; Engineering design -- Data processing.; Computer-aided design.
Notes: "May 2003."

Shipping list no.: 2003-0414-M.

Includes bibliographical references (p. 43-47).

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2003. 1 microfiche : negative.