Scanning Probe Microscopy : Characterization, Nanofabrication and Device Application of Functional Materials : Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy
Subtitle: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
Publisher: Springer London, Limited
Published: 2005
Language: eng
ISBN-13: 9781402030192
Subjects: Scanning probe microscopy