Electronic component testing
By: edited by W. F. Waller.
Contributors: Waller, William F.
Series: Electronic engineering series; Macmillan engineering evaluations : student editions
Publisher: Macmillan
Published: 1972
Place of publication: London
Language: eng
Number of pages: 91
Subjects: Electronic apparatus and appliances -- Testing.; Semiconductors -- Testing.; Integrated circuits -- Testing.
Notes: Includes bibliographies.