Optical test and measurement technology and equipment
Subtitle: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 19-21 November 2008, Chengdu, China
By: Yudong Zhang ... [et al.], editors ; sponsored by COS--the Chinese Optical Society (China) [and] IOE--the Institute of Optics and Electronics, CAS (China) ; technical cosponsor, SPIE ; cosponsoring organizations, State Key Laboratory of Optical Technology for Microfabrication (China) [and] SOS--Sichuan Optical Society (China) ; cooperating organization, Committee of Optical Manufacturing Technology, COS (China) ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy of Sciences (China) [and] National Natural Science Foundation of China (China)
Contributors: Zhang, Yudong; Zhongguo guang xue xue hui; Zhongguo ke xue yuan. Institute of Optics and Electronics; SPIE (Society); State Key Laboratory of Optical Technology for Microfabrication (China); Sichuan Optical Society; Zhongguo guang xue xue hui. Committee of Optical Manufacturing Technology; Guo jia zi ran ke xue ji jin wei yuan hui (China); China. Guo jia ke xue ji shu bu; Zhongguo ke xue yuan
Series: Proceedings of SPIE -- v. 7283; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7283.
Publisher: SPIE
Published: 2009
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819475435
Subjects: Congresses; Optical materials; Measurement; Testing; Optical measurements
Notes: Includes bibliographical references and author index.