Statistical modeling for computer-aided design of MOS VLSI circuits
By: Christopher Michael, Mohammed Ismail.
Contributors: Ismail, Mohammed.
Series: The Kluwer international series in engineering and computer science ;; SECS 211.; Analog circuits and signal processing; Kluwer international series in engineering and computer science ;; SECS 211.; Kluwer international series in engineering and computer science.
Publisher: Kluwer Academic Publishers
Published: 1993
Place of publication: Boston
Language: eng
Number of pages: 190
Subjects: Metal oxide semiconductors -- Computer-aided design -- Statistical methods; Metal oxide semiconductors -- Mathematical models; Integrated circuits -- Very large scale integration -- Computer-aided design; Integrated circuits -- Very large scale integration -- Mathematical models
Notes: Includes bibliographical references (p. [179]-187) and index.