Atomic force microscopy/scanning tunneling microscopy 2
By: edited by Samuel H. Cohen and Marcia L. Lightbody.
Contributors: Cohen, Samuel H.; Lightbody, Marcia L.; U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium (2nd : 1994 : Natick, Mass.)
Publisher: Plenum Press
Published: 1997
Place of publication: New York
Language: eng
Number of pages: 250
Subjects: Atomic force microscopy; Scanning tunneling microscopy
Notes: Includes bibliographical references and index.
"Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso.