Scanning-electron-microscopy observations and mechanical characteristics of ion-beam-sputtered surgical implant aloys
By: Albert J. Weigand, M. Lise Meyer, and Jerri S. Ling.
Contributors: Meyer, M Lise.; Ling, Jerri S.; United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum ; NASA TM X-3553; NASA technical memorandum -- X-3553.
Publisher: National Aeronautics and Space Administration, Scientific and Technical Information Office; for sale by the National Technical Information Service
Published: 1977
Place of publication: Washington; Springfield, Va
Language: eng
Number of pages: 31
Subjects: Sputtering (Physics); Biomedical engineering.
Notes: Issued Aug. 1977.

Bibliography: p. 9.