Probability of detection of defects in coatings with electronic shearography
By: S.S. Russell ... [et al.].
Contributors: Russell, S. S.; George C. Marshall Space Flight Center.
Series: NASA technical memorandum -- 108493.
Publisher: National Aeronautics and Space Administration, Marshall Space Flight Center; National Technical Information Service, distributor
Published: 1995
Place of publication: MSFC, Ala; [Springfield, Va
Language: eng
Format: Microform
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 96-0058-M.