Machine vision systems integration
Subtitle: proceedings of a conference held 6-7 November 1990, Boston, Massachusetts
By: Bruce G. Batchelor, Frederick M. Waltz, editors ; sponsored by SPIE--The International Society for Optical Engineering.
Contributors: Batchelor, Bruce G.; Waltz, Frederick M.; Society of Photo-optical Instrumentation Engineers.
Series: Critical reviews of optical science and technology ;; v. CR36
Publisher: SPIE Optical Engineering Press
Published: 1991
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 176
Subjects: Quality control -- Optical methods -- Automation -- Congresses.; Computer vision -- Industrial applications -- Congresses.; Engineering inspection -- Automation -- Congresses.
Notes: Includes bibliographical references and index.