Advanced sensor technologies for nondestructive evaluation and structural health monitoring II
Subtitle: 1-2 March 2006, San Diego, California, USA
By: Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by ASME--American Society of Mechanical Engineers (USA) ; cooperating organizations, Intelligent Materials Forum (Japan), Jet Propulsion Laboratory (USA), [and] National Science Foundation (USA).
Contributors: Meyendorf, Norbert.; Baaklini, George Y.; Michel, Bernd, 1949-; Society of Photo-optical Instrumentation Engineers.; Intelligent Materials Forum (Mitō Kagaku Gijutsu Kyōkai); American Society of Mechanical Engineers.; Jet Propulsion Laboratory (U.S.); National Science Foundation (U.S.)
Series: Proceedings of SPIE -- 6179; Proceedings of SPIE--the International Society for Optical Engineering -- v. 6179.
Publisher: SPIE
Published: 2006
Place of publication: Bellingham, Wash
Language: eng
Subjects: Structural analysis (Engineering) -- Congresses; Structural health monitoring -- Congresses; Detectors -- Congresses; Automatic data collection systems -- Congresses; Nondestructive testing -- Congresses
Genres: Congresses
Notes: Includes bibliographical references and index.