ATFA-78
Subtitle: advanced techniques in failure analysis, 6-9 November 1978, Airport Marriott Hotel, Los Angeles, California USA : proceedings
By: sponsored by the Institute of Electrical and Electronics Engineers, Inc., (IEEE) Los Angeles Council, Region 6.
Contributors: Institute of Electrical and Electronics Engineers.; Institute of Electrical and Electronics Engineers. Los Angeles Council.
Publisher: IEEE
Published: 1978
Place of publication: [New York, N.Y.]
Language: eng
Number of pages: 200
Subjects: Electronic apparatus and appliances -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.
Other titles: A.F.T.A.-78.
Notes: Includes bibliographies and index.
Cover title.
"IEEE catalog no. 78CH1407-6 Reg. 6."