Electron Beam Ion Sources And Traps And Their Applications
Subtitle: 8th International Symposium (AIP Conference Proceedings)
Edition: 1 edition
Publisher: Springer
Published: 2001
Language: eng
Format: Hardcover
Number of pages: 314
ISBN-13: 9780735400115
Subjects: Optics (light); Science; Science/Mathematics; Engineering - Electrical & Electronic; Nuclear Physics; Solid State Physics; Electricity; Congresses; Electron beams; Ion sources