Istfa 2004
Subtitle: Proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Ce
Publisher: ASM International
Published: January 2004
Language: eng
Format: Paperback
Number of pages: 697
ISBN-13: 9780871708076
Subjects: Electronics - General; Circuits & components; Materials science; Technology & Industrial Arts