Noise diode stability measurements using a 4.3 GHz laboratory radiometer
By: M.J. Scherner and R.W. Lawrence.
Contributors: Lawrence, R. W.; Langley Research Center.
Series: NASA technical memorandum -- 112865.
Publisher: National Aeronautics and Space Administration, Langley Research Center; National Technical Information Service, distributor
Published: 1997
Place of publication: Hampton, Va; [Springfield, Va
Language: eng
Format: Microform
Subjects: Noise measurement.; Diodes.; Stability.; Synthetic apertures.; Statistical analysis.; Temperature measurement.; Brightness temperature.; Noise temperature.; Microwave radiometers.
Notes: Shipping list no.: 99-0141-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1997] 1 microfiche.