Electronics reliability and measurement technology
Subtitle: proceedings of a conference
By: sponsored by the NASA Langley Research Center ... [et al.], and held at Langley Research Center, Hampton, Virginia, June 3-5, 1986 ; edited by Joseph S. Heyman
Series: NASA conference publication -- 2472
Publisher: National Aeronautics and Space Administration, Scientific and Technical Information Office; For sale by the National Technical Information Service
Published: 1987
Place of publication: Washington, D.C; Springfield, Va
Language: eng
Number of pages: 139
Subjects: Electronics; Congresses; Electronic industries; Quality control; Reliability (Engineering)
Notes: Includes bibliographical references.