Atomic-scale imaging of surfaces and interfaces
Subtitle: symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.
By: editors, David K. Biegelsen, David J. Smith, S.Y. Tong.
Contributors: Biegelsen, D. K.; Smith, David J., 1948-; Tong, S. Y.
Series: Materials Research Society symposium proceedings ;; v. 295; Materials Research Society symposia proceedings ;; v. 295.
Publisher: Materials Research Society
Published: 1993
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 288
Subjects: Surfaces (Technology) -- Congresses.; Scanning electron microscopy -- Congresses.; Atomic structure -- Congresses.
Notes: Includes bibliographical references and index.