Quality productivity profit
Subtitle: digest of papers : 1982 International Test Conference, November 15-18, 1982
By: presented by the Test Technology Committee, the International Test Formation [i.e. Foundation] ; sponsored by IEEE Computer Society, IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Committee.; International Test Foundation.; IEEE Computer Society.; IEEE Computer Society. Philadelphia Section.
Publisher: IEEE Computer Society Press
Published: 1982
Place of publication: Silver Spring, MD (1109 Spring St., Suite 300)
Language: eng
Number of pages: 672
Subjects: Integrated circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.