Autotestcon '78
Subtitle: International Automatic Testing Conference : conference record
By: sponsored by the Institute of Electrical and Electronic Engineers ... [et al.].
Contributors: Institute of Electrical and Electronics Engineers.
Publisher: IEEE
Published: 1978
Place of publication: New York
Language: eng
Number of pages: 405
Subjects: Automatic test equipment -- Congresses.
Notes: "78CH1416-7 AES."

Includes bibliographical references.