International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Subtitle: [proceedings] 11-13 May, 1995, Kiev, Ukraine
By: Sergey V. Svechnikov, Mikhail Ya. Valakh, chairs/editors ; organized by SPIE Ukraine Chapter ... [et al.] ; sponsored by International Association of the Academies of Sciences ... [et al.] ; published by SPIE--the International Society for Optical Engineering.
Contributors: Svechnikov, Sergeĭ Vasilʹevich.; Valakh, M. I͡A︡.; SPIE Ukraine Chapter.; International Association of the Academies of Sciences.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2648; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2648.
Publisher: SPIE
Published: 1995
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 768
Subjects: Electronics -- Materials -- Optical properties -- Congresses.; Electronics -- Materials -- Testing -- Congresses.; Optoelectronics -- Materials -- Optical properties -- Congresses.; Microelectronics -- Materials -- Optical properties -- Congresses.; Quantum electronics -- Materials -- Optical properties -- Congresses.
Other titles: Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics
Notes: Includes bibliographic references and author index.