Defects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II: Mathematics, Physics and Chemistry, Volume 2) (NATO Science Series II: Mathematics, Physics and Chemistry)
Contributors: Gianfranco Pacchioni (Editor); Linards Skuja (Editor); David L. Griscom (Editor)
Edition: 1 edition
Publisher: Springer
Published: November 2000
Language: eng
Format: Paperback
Number of pages: 632
ISBN-13: 9780792366867
Subjects: Electricity, magnetism & electromagnetism; Materials science; Technology & Industrial Arts; Material Science; Technology; Science/Mathematics; Engineering; Physics; Technology / Material Science; Engineering - Electrical & Electronic