Proceedings of the International Symposium for Testing and Failure Analysis, 1990
Subtitle: The Failure Analysis Forum for Microelectronics and Advanced Materi
Contributors: R. Flutie (Editor); R. J. Kar (Editor)
Publisher: ASM International
Published: December 1990
Language: eng
Format: Paperback
Number of pages: 525
ISBN-13: 9780871704023
Subjects: Metallurgy; Technology & Industrial Arts