critical-path method
By: L. R. Shaffer, J. B. Ritter, W. L. Meyer.
Contributors: Ritter, J. B.; Meyer, W. L.
Publisher: McGraw-Hill
Published: 1965
Place of publication: New York
Language: eng
Number of pages: 216
Subjects: Critical path analysis
Notes: Includes bibliographical references (p. 191-193) and index.