MTDT 2009
Subtitle: 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan
Contributors: IEEE Computer Society
Publisher: IEEE Computer Society
Published: 2009
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 95
ISBN-13: 9780769537979
Subjects: Semiconductor storage devices; Testing; Congresses; Random access memory
Other titles: Memory Technology, Design, and Testing; Proceedings of the IEEE Workshop on Memory Technology, Design, and Testing
Notes: "IEEE Computer Society order number P3797"--T.p. verso.

MTDT 2009 is the 17th conference based on numbering of previous conferences.

Includes bibliographical references and index.