Advances in X-Ray Analysis
Subtitle: Volume 32
By: edited by Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Ting C. Huang, Paul K. Predecki
Contributors: Gilfrich, John V.; Jenkins, Ron; Huang, Ting C.; Predecki, Paul K.
Publisher: Springer US; Imprint: Springer
Published: 1989
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] :
Number of pages: 681
ISBN-13: 9781475791105
Subjects: Physics, general; Physics