Analysis of particulate matter using time-of-flight secondary ion mass spectrometry (TOF-SIMS).
Published: 2004
Language: eng
Number of pages: 76
Description: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to study particulate matter of environmental relevance. Aerosols with known chemical composition were produced using a vibrating orifice aerosol generator (VOAG). The characteristic patterns of the particles were obtained through the use of mass-resolved secondary ion images and mass spectra. The evaluation of several filters was conducted and mixed cellulose filters were selected as the appropriate substrate to sample aerosols. The size and morphology of particles was determined by scanning electron microscopy (SEM). Principal component analysis (PCA) was applied to differentiate chemically distinct areas produced by the aerosol particles and the background and found to improve the extraction of the essential chemical information from the enormous amount of data generated by ToF-SIMS imaging.
Notes: Adviser:  Greg J. Evans.

Thesis (M.A.Sc.)--University of Toronto, 2004.

Electronic version licensed for access by U. of T. users.

Source: Masters Abstracts International, Volume: 43-03, page: 0907.

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