Application of a bayesian network to integrated circuit tester diagnosis
By: by Daniel Richard Mittelstadt.
Published: 1993
Language: eng
Number of pages: 149
Subjects: Integrated circuits -- Verification.; Artificial intelligence.; Testing-machines -- Valuation.
Notes: Typescript (photocopy)

Thesis (M.S.)--Oregon State University, 1994.

Includes bibliographical references (leaves 88-89)