Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF'99)
Contributors: N. Labat (Editor); A. Touboul (Editor)
Edition: Pap/Cdr edition
Publisher: Pergamon Press
Published: October 1, 1999
Language: eng
Format: Paperback
Number of pages: 492
ISBN-13: 9780080434216
Subjects: Electronics engineering; Electricity; Science/Mathematics