Atom-probe field ion microscopy and its applications
By: Toshio Sakurai, A. Sakai, H.W. Pickering.
Contributors: Sakai, A.; Pickering, H. W.
Series: Advances in electronics and electron physics.; 20
Publisher: Academic Press
Published: 1989
Place of publication: Boston
Language: eng
Number of pages: 299
Subjects: Atom-probe field ion microscopy.
Notes: Includes bibliographical references (p. 275-292) and indexes.