Advanced measurement and test
Subtitle: selected, peer reviewed papers from the 2011 2nd International Conference on Advanced Measurement and Test (AMT 2011), June 24-26, 2011, Nanchang, China
By: edited by Riza Esa, Yanwen Wu
Contributors: Esa, Riza; Wu, Yanwen
Series: Advanced materials research -- volumes 301-303
Publisher: Trans Tech Publications Ltd.
Published: 2011
Place of publication: Durnten-Zurich, Switzerland
Language: eng
Number of pages: 1821
ISBN-13: 9783037851975
Copyright date: 2011
Subjects: Engineering instruments; Equipment and supplies; Materials; Congresses; Measurement; Testing
Other titles: AMT 2011
Notes: Includes bibliographical references and index.