Proceedings
By: International Test Conference 1994.
Contributors: Institute of Electrical and Electronics Engineers.
Publisher: The Conference; Can be ordered from IEEE Service Center
Published: 1994
Place of publication: Altoona, PA; Piscataway, N.J
Language: eng
Number of pages: 1033
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.
Other titles: TEST, the next 25 years.
Notes: Includes bibliographical references and index.
Cover title: TEST, the next 25 years.
Spine title: IEEE International Test Conference 1994.
"IEEE catalog number 94CH34835"--T.p. verso.