Instruments for optics and optoelectronic inspection and control
Subtitle: 8-10 November 2000, Beijing, China
By: Guang Hui Wei, Sheng Liu, chairs/editors ; sponsored by COEMA--China Optics & Optoelectronic Manufacturer's Association, Chinese Physical Society, [and] SPIE--the International Society for Optical Engineering.
Contributors: Wei, Guang Hui.; Liu, S. 1963-; China Optics & Optoelectronic Manufacturers Association.; Zhongguo wu li xue hui.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 4223; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4223.
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 268
Subjects: Integrated optics -- Congresses.; Optoelectronic devices -- Industrial applications -- Congresses.; Detectors -- Industrial applications -- Congresses.; Quality control -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.