2000 IEEE International Workshop on Defect Based Testing
Subtitle: April 30, 2000, Montreal, Canada : proceedings
By: sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon.
Contributors: Malaiya, Yashwant K.; Sachdev, Manoj.; Menon, Sankaran M.; IEEE Computer Society. Test Technology Technical Committee.; IEEE VLSI Test Symposium (2000 : Montréal, Québec)
Publisher: IEEE Computer Society
Published: 2000
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 82
Subjects: Integrated circuits -- Defects -- Congresses.; Iddq testing -- Congresses.; Metal oxide semiconductors, Complementary -- Congresses.
Genres: Congresses.
Other titles: Digest of papers, IEEE International Workshop on Defect Based Testing, DBT 2000
Notes: Includes bibliographical references and index.
"IEEE Catalog Number PR00637"--Cover p. [4].