A statistical test suite for random and pseudorandom number generators for cryptographic applications
By: Andrew Rukhin ... [et al.].
Contributors: Rukhin, Andrew L.; National Institute of Standards and Technology (U.S.)
Series: NIST special publication -- 800-22. -- Computer security; NIST special publication -- 800-22.; NIST special publication
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 2000
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 153
Subjects: Random number generators; Statistical hypothesis testing; Computer security; Data encryption (Computer science)
Notes: "October 2000."

Shipping list no.: 2001-0121-M.

Includes bibliographical references (p. 151-152).

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [2000] 2 microfiches : negative.