2005 IEEE International Integrated Reliability Workshop final report
Subtitle: Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
Contributors: IEEE Electron Devices Society; IEEE Reliability Society
Publisher: IEEE Electron Devices Society; IEEE Reliability Society
Published: 2005
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 182
Subjects: Integrated circuits; Congresses; Reliability; Wafer-scale integration
Other titles: IIRW 2005; Integrated reliability workshop; 2005 IIRW final report
Notes: At head of title: IEEE.

"IEEE Catalog No.: 05TH8799"--T.p. verso.

Includes bibliographical references.

Also issued online.