Scanning Probe Microscopy
Subtitle: The Lab on a Tip
By: by Ernst Meyer, Hans Josef Hug, Roland Bennewitz
Contributors: Hug, Hans Josef; Bennewitz, Roland
Series: Advanced Texts in Physics; Advanced Texts in Physics
Publisher: Springer Berlin Heidelberg
Published: 2004
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] :
Number of pages: 210
ISBN-13: 9783642077371; 9783662098011
Subjects: Nanotechnology; Surfaces (Physics)
Description: Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
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Mode of access: World Wide Web.
Table of contents: title: Introduction to Scanning Probe Microscopy; title: Introduction to Scanning Tunneling Microscopy; title: Force Microscopy; title: Magnetic Force Microscopy and Related Techniques; title: Other Members of the SPM Family; title: Introduction to Artifacts in SPM; title: Future Aspects of SPM.