Three-dimensional X-ray diffraction microscopy
Subtitle: mapping polycrystals and their dynamics
By: Henning F. Poulsen.
Series: Springer tracts in modern physics,; v. 205; Springer tracts in modern physics ;; 205.
Publisher: Springer
Published: 2004
Place of publication: Berlin; New York
Language: eng
Number of pages: 154
Subjects: X-ray microscopy; X-rays -- Diffraction; Magnetic resonance microscopy
Description: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
Notes: Includes bibliographical references and index.