Scanning electron microscopy / 1986
Subtitle: an international journal of scanning electron microscopy, related techniques, and applications
By: guest editors R.P. Becker, L.L. Levenson, G.M. Roomans
Contributors: Scanning Electron Microscopy, Inc
Publisher: Scanning Electron Microscopy
Published: 1986
Place of publication: Chicago, Ill
Language: eng
Number of pages: 1732
Subjects: Scanning electron microscopes; Microscopes électroniques à balayage
Notes: Sur la couverture: SEM/1985.