Noise as a tool for studying materials
Subtitle: 2-4 June, 2003, Santa Fe, New Mexico, USA
By: Michael B. Weissman, Nathan E. Israeloff, A. Shulim Kogan, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering.
Contributors: Weissman, Michael B.; Israeloff, Nathan E. 1961-; Kogan, A. Shulim.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 5112; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5112.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 346
Subjects: Random noise theory -- Congresses.; Electronic noise -- Congresses.; Materials -- Testing -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and author index.