Particle Size Measurements
Subtitle: Fundamentals, Practice, Quality
By: by Henk G. Merkus ; edited by Brian Scarlett, Maria Bellantone
Contributors: Bellantone, Maria; Scarlett, Brian; SpringerLink (Online service)
Series: Particle Technology Series -- 17
Publisher: Springer Netherlands; Springer
Published: 2009
Place of publication: Dordrecht
Language: eng
Format: [electronic resource] :
Number of pages: 548
ISBN-13: 9781402090158; 9781402090165
Subjects: System safety; Industrial engineering; Materials; Surfaces (Physics); Weights and measures; Nanotechnology