The development of intelligence in children
By: by Alfred Binet and Theodore Simon ; with marginal notes by Lewis M. Terman ; new preface ... by Lloyd M. Dunn
Contributors: Simon, Théodore, 1873-; Terman, Lewis Madison, 1877-1956
Edition: Limited ed.
Series: Publications of the Training School at Vineland, New Jersey, Dept. of Research -- no. 11.
Publisher: Williams Print. Co.
Published: 1980
Place of publication: Nashville, Tenn
Language: eng
Number of pages: 336
Subjects: Binet-Simon Test.; Child psychology.; Intelligence tests.; Children with mental disabilities -- Psychological testing.; Intelligence Tests.; Mental Retardation.; Infant.; Child.; Binet-Simon, Échelle de.; Enfants -- Psychologie.; Enfants handicapés mentaux.
Description: This reprint presents Alfred Binet and Theodore Simon theories on child development and the classic Binet-Simon Test. The text is annotated and critiqued by Lewis M. Terman.
Notes: Reprint. Originally published: Baltimore : Williams & Wilkins, 1916. (Publications of the Training School at Vineland, New Jersey, Dept. of Research ; no. 11).

"Bibliography on Binet-Simon tests": p. [337].

Includes bibliographical references and index.