Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Subtitle: IPFA 2006
By: edited by Gan Chee Lip ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with Centre for IC Failure Analysis & Reliability (CICFAR), National University of Singapore.
Contributors: Gan, Chee Lip.; IEEE Reliability/CPMT/ED Singapore Chapter.; IEEE Electron Devices Society.
Publisher: IEEE
Published: 2006
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 363
Subjects: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Reliability -- Congresses.
Genres: Congresses.
Notes: "IEEE Catalog Number 06TH8872"--T.p. verso.

Includes bibliographical references and index.