Techniques of electron microscopy, diffraction, and microprobe analysis.
By: Presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963.
Contributors: American Society for Testing and Materials. Committee E-4 on Metallography.
Series: ASTM special technical publication -- no. 372.; ASTM special technical publication -- 372.
Publisher: American Society for Testing and Materials
Published: 1965
Place of publication: Philadelphia
Language: eng
Number of pages: 89
Subjects: Metallography -- Congresses.; Electron microscopes -- Congresses.
Notes: Sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography.

Includes bibliographical references.