Elemental and interplanar spacing index for phase identification by electron or x-ray diffraction
By: editors, Vicky L. Himes ... [et al.].
Contributors: Himes, Vicky Lynn, 1953-; National Institute of Standards and Technology (U.S.); JCPDS--International Centre for Diffraction Data.
Publisher: U.S. Department of Commerce, National Institute of Standards and Technology; JCPDS-International Centre for Diffraction Data; Order from JCPDS--International Centre for Diffraction Data
Published: 1989
Place of publication: [Washington, D.C.?]; Swarthmore, Pa., U.S.A; Swarthmore, Pa., U.S.A
Language: eng
Number of pages: 866
Subjects: X-rays -- Diffraction -- Indexes.; Electrons -- Diffraction -- Indexes.; Mineralogy -- Indexes.; Crystallography -- Indexes.
Other titles: Spacing index for phase identification by electron or x-ray diffraction.
Notes: Spine title: Elemental and interplanar spacing index.
Pages 861-866 blank for notes.