Scanning Electron Microscopy and X-ray Microanalysis
Edition: 3rd ed. 2003. Corr. 2nd printing edition
Publisher: Springer
Published: February 2003
Language: eng
Format: Hardcover
Number of pages: 689
ISBN-13: 9780306472923
Subjects: Materials science; Microscopy; Electron Microscopy; Electron Microscopy In Biology; Science; Science/Mathematics; Electron Microscopes & Microscopy; Engineering - Electrical & Electronic; Research & Methodology; Technology / Material Science; Microscopes & Microscopy; Scanning electron microscopy; X-ray microanalysis
First sentence: The scanning electron microscope (SEM) permits the observation and characterization of heterogeneous organic and inorganic materials on a nanometer (nm) to micrometer (m) scale.