Proceedings of the Symposium on Reliability of Metals in Electronics
By: edited by Hazara S. Rathore.
Contributors: Rathore, Hazara S.; Electrochemical Society. Dielectric Science and Technology Division.; Electrochemical Society. Electronics Division.; Electrochemical Society. Meeting.
Series: Proceedings / Electrochemical Society ;; v. 95-3; Proceedings (Electrochemical Society) ;; v. 95-3.
Publisher: Electrochemical Society
Published: 1995
Place of publication: Pennington, NJ
Language: eng
Number of pages: 245
Subjects: Thin film devices -- Reliability -- Congresses.; Metallic films -- Electric properties -- Congresses.; Breakdown (Electricity) -- Congresses.; Electrodiffusion -- Congresses.
Notes: Includes bibliographical references and indexes.
Held during the Spring Meeting of the Electrochemical Society, May 21 to 26 1995 in Reno, Nevada.
"Sponsored by the Dielectric Science and Technology and the Electronics Divisions"--Preface.