Noise temperature measurements on wafer
By: J. Randa
Series: NIST technical note -- 1390
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1997
Place of publication: Boulder, Colo
Language: eng
Format: [microform] /
Number of pages: 57
Subjects: Electronic noise; Measurement
Notes: Shipping list no.: 98-0579-M.

Paper version no longer available for sale by the Supt. of Docs.

"March 1997."

Includes bibliographical references (p. 33-36).