Are all patent examiners equal?
Subtitle: the impact of characteristics on patent statistics and litigation outcomes
By: Iain M. Cockburn, Samuel Kortum, Scott Stern.
Contributors: Kortum, Samuel.; Stern, Scott, 1969-; National Bureau of Economic Research.
Series: NBER working paper series -- no. 8980; Working paper series (National Bureau of Economic Research) -- working paper no. 8980.
Publisher: National Bureau of Economic Research
Published: 2002
Place of publication: Cambridge, MA
Language: eng
Number of pages: 34
Subjects: United States. -- Patent and Trademark Office; Technological innovations -- United states.; Patent law and legislation -- United States.; Intellectual property -- United States.
Notes: "June 2002."

JEL no. O3, K3, L3.

Includes bibliographical references (p. 26).

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Electronic version available via the Internet at the NBER World Wide Web site.