Large scale integration digital testing
Subtitle: annotated bibliography, 1969-1978
By: Thomas F. Leedy ; Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards
Contributors: Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division
Series: NBS technical note ; 1102; NBS technical note -- 1102
Publisher: Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1979
Place of publication: Washington
Language: eng
Number of pages: 40
Subjects: Semiconductors -- Testing -- Bibliography; Integrated circuits -- Testing -- Bibliography
Notes: Issued Aug. 1979

CODEN: NBTNAE