IEEE Recommended Practice for Latchup Test Methods for Cmos and Bicmos Integrated-Circuit Process Characterization
Publisher: Institute of Electrical & Electronics Enginee
Published: December 1991
Language: eng
Format: Paperback
Number of pages: 36
ISBN-13: 9781559371520
Subjects: Circuits & components; Technology: General Issues; General; Integrated Circuits; Standards; Computers - General Information; Science/Mathematics