1994 International Integrated Reliability Workshop final report
Subtitle: Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: IEEE Electron Devices Society; IEEE Reliability Society
Published: 1994
Place of publication: [New York]
Language: eng
Number of pages: 155
Subjects: Integrated circuits -- Reliability -- Congresses.; Integrated circuits -- Wafer scale integration -- Reliability -- Congresses.
Other titles: Final report, 1994 International Integrated Reliability Workshop
Notes: Includes bibliographical references.
"IEEE Catalogue No. 94TH0654-4."