Testing, Packaging, Reliability and Applications of Semiconductor Lasers IV (Proceedings of Spie--the International Society for Optical Engineering, V. 3626)
Contributors: Mahmoud Fallahi (Editor); Kurt J. Linden (Editor); S. C. Wang (Editor)
Publisher: SPIE-International Society for Optical Engine
Published: April 1999
Language: eng
Format: Paperback
Number of pages: 262
ISBN-13: 9780819430960
Subjects: Laser technology; Semi-conductors & super-conductors; Lasers & Photonics; Technology & Industrial Arts; Congresses; Semiconductor lasers; Science/Mathematics