Sixth International Workshop on Microprocessor Test and Verification
Subtitle: common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005
By: sponsored by IEEE Computer Society Test Technology Technical Council (TTTC).
Contributors: IEEE Computer Society. Technical Council on Test Technology.; IEEE Xplore (Online service)
Publisher: IEEE Computer Society
Published: 2005
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 143
ISBN-13: 9780769526270
Subjects: Microprocessors -- Testing -- Congresses; Integrated circuits -- Testing -- Congresses; Integrated circuits -- Verification -- Congresses; Systems on a chip -- Testing -- Congresses
Genres: Congresses
Other titles: MTV 2005; Microprocessor Test and Verification
Notes: "IEEE Computer Society Order Number P2627"--T.p. verso.

Includes bibliographical references and index.