2009 International Conference on Optical Instruments and Technology
Subtitle: optoelectronic measurement technology and systems : 19-22 October 2009, Shanghai, China
By: Shenghua Ye, Guangjun Zhang, Jun Ni, editors ; sponsored by CIS--China Instrument and Control Society, COS--the Chinese Optical Society [and] SPIE ; cooperating organizations, Optoelectronic-Mechanic Technology and System Integration Chapter, CIS (China) ... [et al.].
Contributors: Ye, Shenghua, 1934-; Zhang, Guangjun; Ni, Jun, 1968-; Zhongguo yi qi yi biao xue hui. Guang ji dian ji shu yu xi tong ji cheng fen hui; SPIE (Society)
Series: Proceedings of SPIE -- v. 7511; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7511.
Publisher: SPIE
Published: 2009
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819478979
Subjects: Industrial applications; Optical measurements; Congresses; Optical instruments; Optoelectronic devices
Other titles: Optoelectronic measurement technology and systems; International Conference on Optical Instruments and Technology
Notes: Includes bibliographical references and author index.