Nuclear-fragmentation studies for microelectronic applications
By: Duc M. Ngo, John W. (John William) Wilson, Warren W. Buck and Thomas N. Fogarty.
Contributors: Buck, Warren W.; Fogarty, Thomas N.; Wilson, John W.; Langley Research Center
Publisher: Langley Research Center
Published: 1989
Place of publication: Hampton, Va
Number of pages: 20
Subjects: Nuclear fragmentation
Notes: Bibliographical references: p.7-8.