Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
By: Victor A. Carreno, G. Choi and R. K. Iyer.
Contributors: Choi, G.; Iyer, R. K.; Langley Research Center
Publisher: Langley Research Center
Published: 1990
Place of publication: Hampton, Va
Number of pages: 10
Subjects: Avionics; Control system; Errors
Notes: Includes bibliographical references: p. 6.