Short wavelength microscopy
By: edited by Donald F. Parsons.
Contributors: Parsons, Donald F.; New York Academy of Sciences.
Series: Annals of the New York Academy of Sciences ; v. 306; Annals of the New York Academy of Sciences ;; v. 306.
Publisher: New York Academy of Sciences
Published: 1978
Place of publication: New York
Language: eng
Number of pages: 339
Subjects: Electron microscopy -- Congresses.; Scattering (Physics) -- Congresses.; Microscopy -- Congresses.
Notes: Includes bibliographical references.
Papers presented at a workshop held by the New York Academy of Sciences, February 23-25, 1977.