Dielectric breakdown in a simplified parallel model
By: Howland A. Fowler ... [et al.].
Contributors: Fowler, Howland A.; Information Technology Laboratory (National Institute of Standards and Technology). Scalable Parallel Systems and Applications Group.
Series: NISTIR -- 6174.
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1998
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 33
Subjects: Breakdown (Electricity) -- Computer simulation.
Notes: "High Performance Systems and Services Division, Scalable Parallel Systems and Applications Group"--Cover.

Shipping list no.: 98-1005-M.

"June 1998."

Includes bibliographical references (p. 18-20).

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative.