An interpretation of the Guide to the expression of uncertainty in measurement
By: Raghu Kacker
Contributors: National Institute of Standards and Technology (U.S.)
Series: NIST special publication -- 500-244; Information technology; NIST special publication
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For Sale by the Supt. of Docs., U.S. G.P.O.
Published: 2000
Place of publication: Gaithersburg, MD; Washington, DC
Language: eng
Format: Microform
Number of pages: 16
Subjects: Uncertainty (Information theory); Measurement; Probabilities
Notes: "May 2000."

Shipping list no.: 2002-0120-M

Includes bibliographical references (p. 15)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002 1 microfiche : negative