Transmission Electron Microscopy
Subtitle: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
Edition: 3RD edition
Publisher: Springer-Verlag
Published: September 1993
Language: eng
Format: Paperback
Number of pages: 545
ISBN-13: 9780387568492
Subjects: Electron Microscopy; Transmission electron microsco; Transmission electron microscopy; Science/Mathematics
First sentence: In a conventional transmission electron microscope (CTEM, or TEM for short) (Fig. 1.1), a thin specimen is irradiated with an electron beam of uniform current density.