Testing's changing role
Subtitle: International Test Conference, 1983 : proceedings, October 18-20, 1983
By: sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE Computer Society Press
Published: 1983
Place of publication: Silver Spring, MD
Language: eng
Number of pages: 806
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Other titles: International Test Conference 1983 proceedings.
Notes: Includes bibliographical references and index.
Spine title: International Test Conference 1983 proceedings.
"IEEE catalog no. 83CH1933-1."
"Computer Society order no. 502."