Recombination lifetime measurements in silicon
By: Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors.
Contributors: Gupta, D. C.; Bacher, Fred R., 1955-; Hughes, William M., 1948-
Publisher: ASTM
Published: 1998
Place of publication: West Conshohocken, PA
Language: eng
Number of pages: 392
Subjects: Semiconductors -- Testing -- Congresses.; Service life (Engineering) -- Forecasting -- Congresses.; Electronic measurements -- Congresses.
Notes: Includes bibliographical references and indexes.
Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997.
"STP 1340."