The Stanford revision and extension of the Binet-Simon scale for measuring intelligence
By: by Lewis M. Terman, Grace Lyman, George Ordahl ... [and others]
Series: Educational psychology monographs -- no. 18
Publisher: Warwick & York, inc.
Published: 1917
Place of publication: Baltimore
Language: eng
Number of pages: 179
Subjects: Educational tests and measurements.; Intelligence tests.; Psychological tests.; Child development.; Child psychology.
Other titles: Binet-Simon scale.