Applications of optical metrology--techniques and measurements II
Subtitle: [proceedings] April 7-8, 1983, Arlington, Virginia
By: John J. Lee, Jr., chairman/editor.
Contributors: Lee, John J., 1956-; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE--the International Society for Optical Engineering ;; v. 416
Publisher: SPIE--International Society for Optical Engineering
Published: 1983
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 214
Subjects: Optical measurements -- Congresses.
Notes: Includes bibliographical references and index.