Analyzing the option effects of difficult TOEFL items with low biserials
Subtitle: methods developed for use by test assemblers
By: Marilyn M. Hicks
Contributors: Educational Testing Service
Series: Research report -- RR-88-15; Research report (Educational Testing Service) -- RR-88-15
Publisher: Educational Testing Service
Published: 1988
Place of publication: Princeton, N.J
Language: eng
Number of pages: 33
Subjects: English language; Study and teaching; Foreign speakers; Examinations
Notes: "March 1988"--Cover.

Includes bibliographical references (p. 29).