Particle beam microanalysis
Subtitle: fundamentals, methods, and applications
By: E. Fuchs, H. Oppolzer, H. Rehme.
Contributors: Oppolzer, Helmut.; Rehme, Hans.
Publisher: VCH
Published: 1990
Place of publication: Weinheim, F.R.G; New York, NY, USA
Language: eng
Number of pages: 507
Subjects: Materials -- Microscopy.; Electron microscopy -- Industrial applications.
Notes: Includes bibliographical references and index.