International Test Conference 1990
Subtitle: Changing the Philosophy of Tests (International Test Conference//Proceedings)
Publisher: Ieee Computer Society
Published: June 1990
Language: eng
Format: Hardcover
Number of pages: 1083
ISBN-13: 9780818690648
Subjects: Circuits & components; Automatic test equipment; Circuits; Congresses; Electronic digital computers; Integrated circuits; Testing; Science/Mathematics