Scanning probe microscopies II
Subtitle: 18-19 January 1993, Los Angeles, California
By: Clayton C. Williams, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Williams, Clayton C.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 1855; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1855.
Publisher: SPIE
Published: 1993
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 220
Subjects: Scanning probe microscopy -- Congresses.
Other titles: Scanning probe microscopies two.; Scanning probe microscopies 2.
Notes: Includes bibliographical references and index.