Transition fault test generation in LSSD environment
By: by Kamran Zarrineh.
Series: Master's theses (State University of New York at Binghamton) -- no. 2060
Published: 1994
Language: eng
Number of pages: 124
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Data processing.; Fault-tolerant computing.
Other titles: LSSD environment.
Notes: Thesis (M.S.) -- State University of New York at Binghamton, Watson School of Engineering and Applied Science, 1994.

Includes bibliographical references.