Integrating photogrammetric techniques with scene analysis and machine vision
Subtitle: 14-15 April 1993, Orlando, Florida
By: Eamon B. Barrett, David M. McKeown, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Barrett, Eamon B.; McKeown, David M.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for optical Engineering ;; v. 1944; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1944.
Publisher: SPIE
Published: 1993
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 286
Subjects: Computer vision -- Congresses.; Photogrammetry -- Congresses.; Cartography -- Congresses.
Notes: Includes bibliographical references and index.