Sixth International Conference on Quality Control by Artificial Vision
Subtitle: 19-22 May 2003, Gatlinberg, Tennessee, USA
By: Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle ... [et al.] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA).
Contributors: Tobin, Kenneth W.; Meriaudeau, Fabrice.; UT-Battelle, LLC.; IEEE Signal Processing Society.; Society of Photo-optical Instrumentation Engineers.; Machine Vision Association of SME.
Series: SPIE,; v. 5132; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5132.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 594
Subjects: Quality control -- Optical methods -- Congresses.; Computer vision -- Industrial applications -- Congresses.; Imaging systems -- Quality control -- Congresses.; Pattern recognition systems -- Quality control -- Congresses.; Optical detectors -- Congresses.
Genres: Congresses.
Other titles: 6th International Conference on Quality Control by Artificial Vision; International Conference on Quality Control by Artificial Vision; Quality control by artificial vision
Notes: Includes bibliographical references and index.