An artificial intelligence approach to test generation
By: by Narinder Singh.
Series: The Kluwer international series in engineering and computer science ;; SECS 19
Publisher: Kluwer Academic Publishers
Published: 1987
Place of publication: Boston
Language: eng
Number of pages: 193
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Data processing.; Expert systems (Computer science); Artificial intelligence.
Notes: Bibliography: p. [189]-193.