Infrared imaging systems
Subtitle: design, analysis, modeling, and testing XX : 14-16 April 2009, Orlando Florida, United States
By: Gerald C. Holst, editor ; sponsored and published by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 7300; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7300.
Publisher: SPIE
Published: 2009
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819475664
Notes: Includes bibliographical references and author index.