2010 2nd International Conference on Reliability, Safety & Hazard (ICRESH-2010)
Subtitle: (risk-based technology and physics-of-failure methods)
By: editors, P.V. Varde [and 3 others]
Contributors: Varde, P. V., editor
Publisher: IEEE
Published: 2010
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 651
ISBN-13: 9781424483426
Copyright date: 2010
Subjects: Industrial safety; Reliability (Engineering); Congresses
Other titles: ICRESH-2010
Notes: "IEEE Catalog Number: CFP1082K-PRT"--Title page verso.

Includes bibliographical references and author index.