Flaw imaging and ultrasonic techniques for characterizing sintered silicon carbide
By: George Y. Baaklini and Phillip B. Abel.
Contributors: Abel, Phillip Benjamin.; United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum -- 100177.
Publisher: National Aeronautics and Space Administration; For sale by the National Technical Information Service
Published: 1987
Place of publication: [Washington, DC]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Quality assurance -- United States.; Non-destructive testing.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1988. 1 microfiche ; 11 x 15 cm.