14th IEEE VLSI Test Symposium
Subtitle: April 28-May 1, 1996, Princeton, New Jersey
By: sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE Computer Society Press
Published: 1996
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 510
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Other titles: Proceedings; Fourteenth IEEE VLSI Test Symposium
Notes: "IEEE Computer Society Press order number PR07304"--T.p. verso.

"IEEE Order Plan number 96TB100043"--T.p. verso.

Includes  bibliographical references and index.