X-ray measurements of stresses and defects in EFG and large grained polycrystalline silicon ribbons.
Contributors: Wagner, C. N. J.; United States. Dept. of Energy.
Series: DOE/JPL ; 954851-1
Publisher: Dept. of Energy; for sale by the National Technical Information Service
Published: 1978
Place of publication: [Washington]; Springfield, Va
Language: eng
Subjects: Silicon -- Defects -- Measurement.; Residual stresses.
Notes: Author: C. N. J. Wagner.

Contract no. NAS-7-100-954851.
Table of contents: First quarterly report.