Failure analysis of electronic parts
Subtitle: laboratory methods
By: prepared by Goddard Space Flight Center ; edited by Robert J. Anstead and Ethan Goldberg.
Contributors: Anstead, Robert J.; Goldberg, Ethan.
Series: NASA ; SP-6508; NASA SP ;; 6508.
Publisher: Scientific and Technical Information Office, National Aeronautics and Space Administration; for sale by the National Technical Information Service
Published: 1975
Place of publication: Washington; Springfield, Va
Language: eng
Number of pages: 79
Subjects: Electronic apparatus and appliances -- Testing.