Integrated Circuit Defect-Sensitivity:
Subtitle: Theory and Computational Models (The International Series in Engineering and Computer Science)
Edition: 1 edition
Publisher: Springer
Published: December 31, 1992
Language: eng
Format: Hardcover
Number of pages: 192
ISBN-13: 9780792393061
Subjects: Circuits & components; Electronic devices & materials; Science/Mathematics; Very-Large-Scale Integration (Vlsi); Technology; Technology & Industrial Arts; Very large scale integration; Electronics - Circuits - General; Engineering - Electrical & Electronic; Technology / Engineering / Electrical; Computer-aided design; Defects; Integrated circuits; Mathematical models