Surface characterization and testing II
Subtitle: 10-11 August 1989, San Diego, California
By: John E. Greivenkamp, Matt Young, chairs/editors.
Contributors: Greivenkamp, John E.; Young, Matt, 1941-; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 1164; Proceedings of SPIE-the International Society for Optical Engineering ;; v. 1164.
Publisher: SPIE--the International Society for Optical Engineering
Published: 1989
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 271
Subjects: Surfaces (Technology) -- Testing -- Congresses.; Surfaces (Technology) -- Optical properties -- Congresses.
Notes: Includes bibliographical references and index.
"Sponsored by SPIE--the International Society for Optical Engineering."