Efficient test methodologies for high-speed serial links
By: Dongwoo Hong, Kwang-Ting Cheng
Contributors: Cheng, Kwang-Ting, 1961-
Series: Lecture notes in electrical engineering -- 51; Lecture notes in electrical engineering -- v. 51.
Publisher: Springer
Published: 2010
Place of publication: Dordrecht; New York
Language: eng
Number of pages: 98
ISBN-13: 9789048134427; 9789048134434
Subjects: Very high speed integrated circuits; Testing
Notes: Includes bibliographical references (p. 95-98).