Proceedings International Test Conference 2003
Subtitle: [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA
By: sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: International Test Conference; IEEE
Published: 2003
Place of publication: Washington, D.C; Piscataway, N.J
Language: eng
Number of pages: 1334
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Telecommunication -- Congresses.; Radio frequency -- Congresses.
Genres: Congresses.
Other titles: ITC International Test Conference 2003
Notes: Also available via the World Wide Web.
Includes bibliographical references and author index.
At head of title: ITC International Test Conference 2003
Conference number inferred.
"IEEE Catalog Number 03CH37494"--T.p. verso.