Testing and testable design of high-density random-access memories
By: by Pinaki Mazumder and Kanad Chakraborty.
Contributors: Chakraborty, Kanad.
Series: Frontiers in electronic testing
Publisher: Kluwer Academic
Published: 1996
Place of publication: Boston, Mass
Language: eng
Number of pages: 386
Subjects: Random access memory -- Testing.
Notes: Includes bibliographical references (p. [367]-381) and index.