Progress in measurement and testing
Subtitle: selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
By: edited by Yanwen Wu
Contributors: Wu, Yanwen
Series: Advanced materials research -- v. 108-111; Advanced materials research -- v. 108/111.
Publisher: Trans-Tech Publications
Published: 2010
Place of publication: Stafa-Zurich; Enfield, NH
Language: eng
Number of pages: 1542
ISBN-13: 9780878492695
Subjects: Industrial design; Materials science; Testing; Congresses; Materials
Notes: Includes bibliographical references and index.