Anisotropic friction, deformation, and fracture of single-crystal silicon carbide at room temperature
By: Kazuhisa Miyoshi and Donald H. Buckley.
Contributors: Buckley, Donald H.; United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch.; Lewis Research Center.
Series: NASA technical paper -- 1525.
Publisher: National Aeronautics and Space Administration, Scientific and Technical Information Branch; For sale by the National Technical Information Service]
Published: 1979
Place of publication: Washington, D.C; [Springfield, Va
Language: eng
Number of pages: 21
Subjects: Friction -- Testing.; Silicon carbide -- Testing.
Notes: "Lewis Research Center."

"August 1979"--Cover.

Subject category 27.

[Item 830-H-15 (microfiche); AEF/GB/MKL]

Includes bibliographical references.