In-situ characterization of thin film growth
By: edited by Gertjan Koster and Guus Rijnders
Series: Woodhead Publishing in materials; Woodhead Publishing in materials
Publisher: Woodhead Publishing
Published: 2011
Place of publication: Cambridge; Philadelphia, PA
Language: eng
Number of pages: 282
ISBN-13: 9781845699345
Subjects: Crystal growth; Thin films; Analysis
Notes: Includes bibliographical references and index.