Semiconductor measurement technology
Subtitle: permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes
By: James M. Kenney.
Series: NBS special publication ; 400-7; NBS special publication ;; 400-7.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards
Published: 1976
Place of publication: Washington
Language: eng
Number of pages: 26
Subjects: Diodes, Schottky-barrier -- Effect of radiation on.; Mixing circuits.; Microwave measurements.