Surface and interface study of PdCr/SiC schottky diode gas sensor annealed at 425C̊
By: Liang-Yu Chen ... [et al.].
Contributors: Lewis Research Center.
Series: [NASA technical memorandum] -- NASA/TM-1998-107429.; NASA technical memorandum -- 107429.
Publisher: National Aeronautics and Space Administration, Lewis Research Center; National Technical Information Service, distributor
Published: 1998
Place of publication: [Cleveland, Ohio]; Springfield, Va
Language: eng
Format: Microform
Subjects: Hydrogen.; Hydrocarbons.; Sensors.; Annealing.; Metal films.
Notes: Shipping list no.: 99-0384-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1998] 1 microfiche.