Electromigration Inside Logic Cells
Subtitle: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Publisher: Springer
Published: Nov 30, 2016
Format: hardcover
Number of pages: 118
ISBN-13: 9783319488981
Notes: Source title: Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS