Surface charaterization by LEED, RHEED, REM, STM, and holography
Subtitle: proceedings of the U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography, Kona, Hawaii, 16-19 March 1993
By: edited by: P.I. Cohen, A. Ichimiya.
Contributors: Cohen, P. I.; Ichimiya, A.
Series: Surface science -- vol.298 (2-3)
Publisher: North-Holland
Published: 1993
Place of publication: Amsterdam
Language: eng