Integrating photogrammetric techniques with scene analysis and machine vision III
Subtitle: 21-23 April, 1997, Orlando, Florida
By: David M. McKeown, Jr., J. Chris McGlone, Olivier Jamet, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, International Society for Photogrammetry and Remote Sensing.
Contributors: McKeown, David M.; McGlone, J. Chris.; Jamet, Olivier.; Society of Photo-optical Instrumentation Engineers.; International Society for Photogrammetry and Remote Sensing.
Series: Proceedings / SPIE--the International Society for optical Engineering ;; v. 3072; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3072.
Publisher: SPIE
Published: 1997
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 338
Subjects: Computer vision -- Congresses.; Photogrammetry -- Congresses.; Cartography -- Congresses.
Notes: Includes bibliographic references and author index.