Proceedings
Subtitle: ATFA-77, Advanced Techniques in Failure Analysis, 27-29 September 1977, Airport Marriott Hotel, Los Angeles, California USA
By: sponsored by The Institute of Electrical and Electronics Engineers, (IEEE) Los Angeles Council/Region 6, Los Angeles, The International Metallographic Society.
Contributors: Institute of Electrical and Electronics Engineers.; Institute of Electrical and Electronics Engineers. Los Angeles Council.; International Metallographic Society.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1977
Place of publication: New York
Language: eng
Number of pages: 345
Subjects: Semiconductors -- Defects -- Congresses.; Semiconductors -- Testing -- Congresses.
Other titles: Advanced techniques in failure analysis.; ATFA-77
Notes: "IEEE Catalog no. 77CH1248-4REG6."

Includes bibliographical references.