Process control and sensors for manufacturing
Subtitle: 31 March-1 April 1998, San Antonio, Texas
By: Richard H. Bossi, David M. Pepper, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, NIST--National Institute of Standards and Technology ... [et al.].
Contributors: Bossi, R. H.; Pepper, David M.; Society of Photo-optical Instrumentation Engineers.; National Institute of Standards and Technology (U.S)
Series: SPIE proceedings series ;; v. 3399; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3399.
Publisher: SPIE
Published: 1998
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 250
Subjects: Process control -- Automation -- Congresses.; Detectors -- Industrial applications -- Congresses.; Quality control -- Congresses.
Notes: Includes bibliographical references and index.