Optical measurement and nondestructive testing
Subtitle: techniques and applications : 8-10 November 2000, Beijing, China
By: FeiJun Song ... [et al.], chairs/editors ; sponsored by COEMA--China Optics & Optoelectronic Manufacturer's Association, CPS--Chinese Physical Society, [and] SPIE--the International Society for Optical Engineering.
Contributors: Song, FeiJun.; China Optics & Optoelectronic Manufacturers Association.; Zhongguo wu li xue hui.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 4221; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4221.
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 468
Subjects: Optical measurements -- Congresses.; Optoelectronic devices -- Industrial applications -- Congresses.; Nondestructive testing -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.