A study of charged particles/radiation damage to VLSI device materials
Subtitle: final report.
Contributors: United States. National Aeronautics and Space Administration.
Series: NASA-CR -- 172036.; NASA contractor report -- NASA CR-172036.
Publisher: College of Engineering, Prairie View A&M University
Published: 1988
Place of publication: Prairie View, Tex
Language: eng
Format: Microform
Subjects: Electronics.
Other titles: Study of charged particles radiation damage to VSLI device materials.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1988. 2 microfiches.