A spectrophotometric method for the determination of traces of tantalum in silicon
By: by K. Bhattacharya, D. V. Jayawant, and T. K. S. Murthy.
Contributors: Jayawant, D. V., joint author.; Murthy, T. K. S., joint author.; India. Atomic Energy Commission.
Publisher: Bhabha Atomic Research Centre
Published: 1970
Place of publication: Bombay
Language: eng
Subjects: Tantalum -- Analysis.; Silicon -- Analysis.; Spectrophotometry.
Notes: "References": p. 6.
At head of title: Govt. of India. Atomic Energy Commission.
"B.A.R.C. 511."