Investigation of PTFE transfer films by infrared emission spectroscopy and phase-locked ellipsometry
By: James L. Lauer and Bruce G. Bunting and William R. Jones, Jr.
Contributors: Bunting, Bruce G.; Jones, William R., 1940-; United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum -- 89844.
Publisher: National Aeronautics and Space Administration; For sale by the National Technical Information Service
Published: 1987
Place of publication: [Washington, D.C.]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Infrared spectroscopy.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1987. 1 microfiche.