2004 IEEE International Workshop on Current & Defect Based Testing (Dbt 2004), April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA ...
Publisher: Institute of Electrical & Electronics Enginee
Published: January 2004
Language: eng
Format: Hardcover
Number of pages: 470
ISBN-13: 9780780386518
Subjects: Logic Design; Computers - General Information