Analog and mixed-signal boundary-scan
Subtitle: a guide to the IEEE 1149.4 test standard
By: edited by Adam Osseiran.
Contributors: Osseiran, Adam.
Series: Frontiers in electronic testing
Publisher: Kluwer Academic Publishers
Published: 1999
Place of publication: Boston
Language: eng
Number of pages: 155
Subjects: Printed circuits -- Testing -- Standards; Boundary scan testing; Mixed signal circuits -- Testing; Electronic digital computers -- Circuits -- Design and construction; Boundary scan testing; Mixed signal circuits -- Testing; Printed circuits -- Testing -- Standards; Electronic digital computers -- Circuits -- Design and construction
Notes: Includes bibliographical references and index.