Digest of papers
Subtitle: Eleventh Annual 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey
By: sponsored by the IEEE Computer Society, Technical Committee - Test Technology and the Philadelphia Section of the IEEE ; with special thanks to Texas A&M University for their support.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE Computer Society Press
Published: 1993
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 365
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Other titles: Eleventh Annual 1993 IEEE VLSI Test Symposium.; Eleventh IEEE VLSI Test Symposium.; Design, test and application--systems on silicon.; 11th IEEE VLSI Test Symposium.
Notes: "IEEE Computer Society Press Order Number 3830-02."

"IEEE Catalog Number 93TH0537-1."

Includes bibliographical references.