Electronics reliability and measurement technology
Subtitle: proceedings of a conference sponsored by the NASA Langley Research Center, Hampton, Virginia, U.S. Air Force Space Division, Los Angeles, California, the National Security Industrial Association, Washington, D.C. and the Aerospace Industry Association, Washington, D.C., and held at Langley Research Center, June 3-5, 1986
By: edited by Joseph S. Heyman.
Contributors: Langley Research Center
Publisher: Langley Research Center
Published: 1987
Place of publication: Hampton, Va
Number of pages: 139
Subjects: Electronics; Reliability
Notes: Includes bibliographical references.