Applications of electronic imaging
Subtitle: 17-19 January 1989, Los Angeles, California
By: John C. Urbach, editor ; cosponsored by SPSE--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.].
Contributors: Urbach, John C.; SPSE--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: Critical reviews of optical science and technology; SPIE ;; v. 1082; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1082.
Publisher: SPIE
Published: 1989
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 199
Subjects: Image processing -- Congresses.; Imaging systems -- Congresses.
Notes: Includes bibliographical references.