ARPA/NBS workshop I: measurement problems in integrated circuit processing and assembly
By: [by] Harry A. Schafft.
Series: Semiconductor measurement technology; NBS Special publication ;; 400-3; NBS special publication ;; 400-3.
Publisher: U.S. National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]
Published: 1974
Place of publication: [Washington]
Language: eng
Number of pages: 18
Subjects: Integrated circuits -- Congresses.; Semiconductors -- Congresses.; Electronic measurements -- Congresses.
Notes: "A United States Department of Commerce publication."
"CODEN: XNBSAV."