Optoelectronic measurement technology and applications
Subtitle: 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China
By: Shenghua Ye, Guangjun Zhang, Jun Ni, editors ; sponsored by CIS--China Instrument and Control Society [and] SPIE ; cooperating organizations, Optoelectronic-Mechanic Technology and System Integration Chapter, CIS (China) ... [et al.] ; supporting organizations, China Association for Science and Technology ... [et al.].
Contributors: Ye, Shenghua; Zhang, Guangjun; Ni, Jun; Zhongguo yi qi yi biao xue hui. Optoelectronic-Mechanic Technology and System Integration Chapter; SPIE (Society); Zhongguo ke xue ji shu xie hui
Series: Proceedings of SPIE -- v. 7160; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7160.
Publisher: SPIE
Published: 2009
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819474049
Other titles: 2008 International Conference on Optical Instruments and Technology
Notes: Includes bibliographical references and author index.