X-ray and EUV/FUV spectroscopy and polarimetry
Subtitle: 11-12 July, 1995, San Diego, California
By: Silvano Fineschi, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Fineschi, Silvano.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 2517; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2517.
Publisher: SPIE
Published: 1995
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 284
Subjects: X-ray spectroscopy -- Congresses.; Ultraviolet spectroscopy -- Congresses.; Astronomical spectroscopy -- Congresses.; Polarimetry -- Congresses.
Notes: Includes bibliographic references and author index.