Safety and structural integrity 2006
By: edited by Young-Jin Kim.
Contributors: Kim, Young-Jin, 1950-
Series: Diffusion and defect data -- v. 120
Publisher: Trans Tech Publications Ltd.
Published: 2007
Place of publication: Switzerland
Language: eng
Number of pages: 300
ISBN-13: 9783908451297
Subjects: Structural analysis (Engineering) -- Congresses; Structural engineering -- Research -- Congresses; Structural stability -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and indexes.