Reliable application of capacitors
By: prepared by Reliability Analysis Center ; under contract to Rome Laboratory ; [authors, William K. Denson, Henry Domingos].
Contributors: Domingos, Henry.; Reliability Analysis Center (U.S.); Rome Laboratory (Griffiss Air Force Base, N.Y.)
Publisher: The Center
Published: 1996
Place of publication: Rome, NY (201 Mill St., Rome 13440-6916)
Language: eng
Subjects: Capacitors.; Electronic circuit design.; Reliability (Engineering)
Notes: Includes bibliographical references.
"Ordering no.: CAP."