EMI/EMC metrology challenges for industry
Subtitle: a workshop on measurements, standards, calibrations, and accreditation
By: Chalmers M. Butler ... [et al.]
Contributors: Butler, Chalmers M; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 5068
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1997
Place of publication: Boulder, Colo
Language: eng
Format: Microform
Number of pages: 55
Subjects: Electromagnetic interference -- Congresses; Electromagnetic compatibility -- Congresses
Notes: Shipping list no.: 98-0569-M

"November 1997."

Includes bibliographical references (p. 19)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative