Application of surface complexation models for radionuclide adsorption
Subtitle: sensitivity analysis of model input parameters
By: prepared by K.F. Hayes ... [et al.].
Contributors: Hayes, Kim F., 1953-; U.S. Nuclear Regulatory Commission. Division of Low-Level Waste Management and Decommissioning.; Stanford University. Dept. of Civil Engineering.
Publisher: Division of Low-Level Waste Management and Decommissioning, Office of Nuclear Material Safety and Safeguards, U.S. Nuclear Regulatory Commission
Published: 1990
Place of publication: Washington, D.C
Language: eng
Format: Microform
Number of pages: 44
Subjects: Surface chemistry -- Mathematical models.; Adsorption -- Mathematical models.; Radioisotopes -- Migration -- Mathematical models.
Notes: "Department of Civil Engineering, Stanford University."

Distributed to depository libraries in microfiche.

Shipping list no.: 92-1453-M.

Paper version no longer for sale by the Supt. of Docs.

"Date published: April 1990."

"NUREG/CR-5547."

"PNL-7239."

Includes bibliographical references.

Technical.

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1991] 1 microfiche : negative.

FIN B2483-6.