SAR image analysis, modeling, and techniques X
Subtitle: 21-23 September 2010, Toulouse, France
By: Claudia Notarnicola, editors ; sponsored by SPIE ; cooperating organisations, European Association of Remote Sensing Companies (Belgium) ... [et al.].
Contributors: SPIE (Society); European Association of Remote Sensing Companies
Series: Proceedings of SPIE -- v. 7829; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7829.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819483461
Subjects: Synthetic aperture radar; Congresses; Remote sensing; Image quality; Infrared imaging; Interferometry
Other titles: Synthetic aperture radar image analysis, modeling, and techniques X
Notes: Includes bibliographical references and index.