Defect recognition and image processing in III-V compounds, II
Subtitle: proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27-29, 1987
By: edited by Eicke R. Weber.
Contributors: Weber, Eicke R.
Series: Materials science monographs ;; 44
Publisher: Elsevier
Published: 1987
Place of publication: Amsterdam; New York
Language: eng
Number of pages: 320
Subjects: Semiconductors -- Defects -- Congresses.; Gallium arsenide -- Congresses.; Image processing -- Congresses.
Notes: Includes bibliographies and index.