Optical systems degradation, contamination and stray light: effects, measurements, and control : 2-5 August, 2004, Denver, Colorado, USA
By: Philip T.C. Chen, John C. Fleming, Michael G. Dittman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Publisher: SPIE
Published: 2004
Place of publication: Bellingham, WA
Language: eng
Number of pages: 274