Secondary Ion Mass Spectrometry Sims-II
Subtitle: Proceedings of the Second International Conference, Stanford University, Stanford, California, USA, August 17
Contributors: C. a. Evans Jr (Editor); R. a. Powell (Editor); A. Benninghoven (Editor)
Publisher: Springer; Springer Science+Business Media
Published: February 1980
Language: eng
Format: Hardcover
Number of pages: 298
ISBN-13: 9780387098432
Subjects: Physics; Science