Fusion neutron damage to a charge coupled device camera
By: Christopher D. Amaden
Publisher: Naval Postgraduate School; Available from National Technical Information Service
Published: 1997
Place of publication: Monterey, Calif; Springfield, Va
Language: eng
Number of pages: 40
Description: A charge coupled device (CCD) camera's performance has been degraded by damage produced by 14      MeV neutrons (n) from the Rotating Target Neutron Source. High energy neutrons produce atomic      dislocation in doped silicon electronics. This thesis explores changes in Dark Current (J), Charge Transfer      Inefficiency (CTI), and Contrast Transfer Function (CTF) as measures of neutron damage. The camera was      irradiated to a fluence, Phi, of 6.60 x 10 (exp 12) n/ cm2. The camera temperature was lowered from room      temperature to 267 K at a fluence of 4.7 x 10 (exp 11) n/cm2 to preclude saturation of the camera picture.      With temperature compensations, J increased linearly with Phi. Four data points for J, CTF (ideal of 1.0),      and CTI (ideal of 0.0) are given. Neutron irradiation significantly degraded the CCD camera performance;      however, operating the camera at lower temperatures significantly reduces the effects. Damage thresholds      for fluences greater than 6.60 x 10 (exp 12) n/cm2 and for all temperatures can be extrapolated from the      results of this work.
Notes: Thesis advisors, William B. Maier, II., Xavier K. Maruyama.

Thesis (M.S. in Physics) Naval Postgraduate School, Sept. 1997.

Includes bibliographical references (p. 37-38).

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dk/dk cc:9116 03/25/98.