Polarization analysis and measurement II
Subtitle: 25-27 July 1994, San Diego, California
By: Dennis H. Goldstein, David B. Chenault, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Goldstein, Dennis H.; Chenault, David B.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series -- v. 2265; Proceedings of SPIE--the International Society for Optical Engineering -- v. 2265.
Publisher: SPIE--the International Society for Optical Engineering
Published: 1994
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 482
Subjects: Polarimetry -- Congresses.
Notes: Includes bibliographical references and index.