X-ray fluorescence spectrometry (XRF) in geoarchaeology
By: M. Steven Shackley, editor
Publisher: Springer
Published: 2011
Place of publication: New York
Language: eng
Number of pages: 231
ISBN-13: 9781441968852; 9781441968869
Subjects: Methodology; X-ray spectroscopy in archaeology; Archaeological geology; Archaeology
Notes: Includes bibliographical references and index.
Table of contents: title: X-Ray fluorescence spectrometry in twenty-first century archaeology / M. Steven Shackley; title: An introduction to X-Ray fluorescence (XRF) analysis in archaeology / M. Steven Shackley; title: Factors affecting the energy-dispersive X-Ray fluorescence (EDXRF) analysis of archaeological obsidian / M. Kathleen Davis, Thomas L. Jackson, M. Steven Shackley, Timothy Teague, Joachim H. Hampel; title: Non-destructive EDXRF analyses of archaeological basalts / Steven P. Lundblad, Peter R. Mills, Arian Drake-Raue, Scott Kekuewa Kikiloi; title: Non-destructive applications of wavelength XRF in obsidian studies / Annamaria De Francesco, M. Bocci, G.M. Crisci; title: Portable XRF of archaeological artifacts : current research, potentials and limitations / Ioannis Liritzis, Nikolaos Zacharias; title: Elemental analysis of fine-grained basalt sources from the Samoan island of Tutuila : applications of energy dispersive X-Ray Fluorescence (EDXRF) and instrumental neutron activation analysis (INAA) toward an intra-island provenance study / Phillip R. Johnson; title: Comparison and contrast between XRF and NAA : used for characterization of obsidian sources in central Mexico / Michael D. Glascock; title: Is there a future for XRF in twenty-first century archaeology? / Rosemary A. Joyce.