A probabilistic analysis of test response compaction
By: Slawomir Pilarski and Tiko Kameda.
Contributors: Kameda, Tiko.
Publisher: IEEE Computer Society Press
Published: 1995
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 95
Subjects: Electronic circuits -- Testing.; Fault-tolerant computing.; Probabilities.
Notes: Includes bibliographical references (p. 89-94).