Statistical regression with measurement error
By: Chi-Lun Cheng and John W. Van Ness.
Contributors: Van Ness, John W.
Series: Kendall's library of statistics ;; 6
Publisher: Arnold; Oxford University Press
Published: 1999
Place of publication: London; New York
Language: eng
Number of pages: 262
Subjects: Regression analysis.
Notes: Includes bibliographical references (p. [241]-252) and indexes.