Microprobe characterization of optoelectronic materials
By: edited by Juan Jiménez.
Contributors: Jiménez, J.
Series: Optoelectronic properties of semiconductors and superlattices -- v. 17
Publisher: Taylor & Francis
Published: 2003
Place of publication: New York; London
Language: eng
Number of pages: 715
Subjects: Semiconductors -- Optical properties.; Microprobe analysis.
Description: "This book is an ideal reference for post-graduate and experienced researcher engineers involved in the development of infrared lasers, photodetectors, thermoelectric elements, as well as for crystal growers and optoelectronic device makers."--BOOK JACKET.
Notes: Includes bibliographical references and index.