Electrical impact of SiC structural crystal defects on high electric field devices
By: Philip G. Neudeck.
Contributors: NASA Glenn Research Center.
Series: [NASA technical memorandum] -- NASA/TM-1999-209647.; NASA technical memorandum -- 209647.
Publisher: National Aeronautics and Space Administration, Glenn Research Center; National Technical Information Service, distributor
Published: 1999
Place of publication: [Cleveland, Ohio]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Crystal defects.; Silicon.; Electric fields.; Electrical properties.; Switching.
Notes: Shipping list no.: 2000-0603-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2000] 1 microfiche.