Testing and diagnosis of VLSI and ULSI
By: edited by Fabrizio Lombardi and Mariagiovanna Sami.
Contributors: Lombardi, Fabrizio, 1955-; Sami, Mariagiovanna.; North Atlantic Treaty Organization. Scientific Affairs Division.
Series: NATO ASI series. Series E, Applied sciences ;; vol. 151; NATO ASI series.; no. 151.
Publisher: Kluwer Academic Publishers
Published: 1988
Place of publication: Dordrecht, Netherlands; Boston
Language: eng
Number of pages: 533
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.; Integrated circuits -- Ultra large scale integration -- Testing -- Congresses.
Notes: Includes bibliographies and index.
"Proceedings of the NATO Advanced Study Institute on Testing and Diagnosis of VLSI and ULSI, Como, Italy, June 22-July 3, 1987"--T.p. verso.
"Published in cooperation with NATO Scientific Affairs Division."