Selected papers on speckle metrology
By: Rajpal S. Sirohi, editor.
Contributors: Sirohi, R. S.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE milestone series ;; v. MS 35
Publisher: SPIE Optical Engineering Press
Published: 1991
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 668
Subjects: Speckle metrology.; Holographic interferometry.
Other titles: Speckle metrology.
Notes: Includes bibliographical references and indexes.
"A publication of SPIE--the International Society for Optical Engineering."