Microscopic identification of electronic defects in semiconductors
Subtitle: symposium held April 15-18, 1985, San Francisco, California, U.S.A.
By: editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
Contributors: Johnson, Noble M.; Bishop, Stephen G.; Watkins, George D.; Materials Research Society.
Series: Materials Research Society symposia proceedings,; v. 46
Publisher: Materials Research Society
Published: 1985
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 604
Subjects: Semiconductors -- Defects -- Congresses.; Semiconductors -- Microscopy -- Congresses.
Notes: Includes bibliographies and indexes.