Backscattered scanning electron microscopy and image analysis of sediments and sedimentary rocks
By: David H. Krinsley ... [et al.].
Contributors: Krinsley, David H. 1927-
Publisher: Cambridge University Press
Published: 1998
Place of publication: Cambridge, U.K; New York
Language: eng
Number of pages: 193
Subjects: Rocks, Sedimentary -- Analysis.; Sediments (Geology) -- Analysis.; Scanning electron microscopy.
Notes: Includes bibliographical references (p. 173-190) and index.