Selected papers on interference, interferometry, and interferometric metrology
By: editors, P. Hariharan, Daniel Malacara.
Contributors: Hariharan, P.; Malacara, Daniel, 1937-
Series: SPIE milestone series ;; v. MS 110
Publisher: SPIE Optical Engineering Press
Published: 1995
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 701
Other titles: Interference, interferometry, and interferometric metrology
Notes: Includes bibliographical references and indexes.