Characterization of Microstructures by Analytical Electron Microscopy (AEM)
By: by Yonghua Rong
Publisher: Springer Berlin Heidelberg
Published: 2012
Place of publication: Berlin, Heidelberg
Language: eng
ISBN-13: 9783642201196
Subjects: Materials science; Surfaces (Physics); Characterization and Evaluation of Materials; Condensed Matter Physics; Optics, Optoelectronics, Plasmonics and Optical Devices