Trace characterization, chemical and physical
By: W.Wayne Meinke and Bourdon H. Scribner, editors.
Contributors: Meinke, W. Wayne.; Scribner, Bourdon F.; United States. Department of Commerce.; National Bureau of Standards. Institute for Material Research.
Series: Monograph / National Bureau of Standards -- 100
Publisher: U.S.Govt.Printing Office
Published: 1967
Place of publication: Washington D.C
Language: eng
Notes: At head of title:United States Department of Commerce.

Proceedings ofthe symposium "Trace characterization, chemical and physical", the first annual symposium of the Institute for Materials Research, held October 3-7, 1966.