Assuring the integrity of multilayer substrates prior to assembly
By: Roger L. Cadenhead, chairman, Multilayer Testing Technology Committee, North Texas Chapter of ISHM.
Contributors: International Society for Hybrid Microelectronics. Multilayer Testing Technology Committee.
Series: ISHM technical monograph series -- 6984-001
Publisher: International Society for Hybrid Microelectronics
Published: 1984
Place of publication: Silver Spring, Md
Language: eng
Number of pages: 70
Subjects: Thick films -- Testing.; Thick-film circuits.
Notes: Bibliography: p. 43-70.