Structural, syntactic, and statistical pattern recognition
Subtitle: joint IAPR international workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010 : proceedings
By: Edwin R. Hancock ... [et al.] (eds.).
Contributors: Hancock, Edwin R.; International Association for Pattern Recognition; International Workshop on Statistical Techniques in Pattern Recognition (8th : 2010 : Çeşme, Turkey)
Series: Lecture notes in computer science -- 6218; LNCS sublibrary: SL 6-image processing, computer vision, pattern recognition, and graphics; Lecture notes in computer science -- 6218.; LNCS sublibrary
Publisher: Springer
Published: 2010
Place of publication: Berlin; New York
Language: eng
Number of pages: 758
ISBN-13: 9783642149795
Subjects: Mustererkennung; Congresses; Pattern recognition systems
Notes: Includes bibliographical references and index.

Also issued online.