Digital systems testing and testable design
By: Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
Contributors: Breuer, Melvin A.; Friedman, Arthur D.
Edition: Revised printing.
Publisher: IEEE Press
Published: 1990
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 652
Subjects: Digital integrated circuits -- Testing.; Digital integrated circuits -- Design and construction.; Circuitos integrados
Notes: "This is the IEEE revised printing of the book previously published by W. H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--verso.

Includes bibliographical references and index.