Advanced characterization techniques for optics, semiconductors, and nanotechnologies
Subtitle: 3-5 August 2003, San Diego, California, USA
By: Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Contributors: Duparré, Angela.; Singh, Bhanwar.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series,; v. 5188; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5188.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 402
Subjects: Optoelectronics -- Congresses.; Optoelectronic devices -- Congresses.; Optical measurements -- Congresses.; Semiconductors -- Characterization -- Congresses.; Thin films -- Optical properties -- Congresses.; Nanotechnology -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.