11th Asian Test Symposium (ATS'02)
Subtitle: proceedings of the 11th Asian Test Symposium : 18-20 November, 2002, Guam, USA
By: sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Denshi Jōhō Tsūshin Gakkai (Japan). Technical Group on Dependable Computing.; Special Interest Group on System LSI Design Methodology (Japan)
Publisher: IEEE Computer Society
Published: 2002
Place of publication: Los Alamitos, California
Language: eng
Number of pages: 437
Subjects: Electronic digital computers -- Circuits -- Testing -- Congresses; Electronic circuits -- Testing -- Congresses; Fault-tolerant computing -- Congresses
Genres: Congresses.
Other titles: ATS'02
Notes: Also available via the World Wide Web.
Includes bibliographic references and author index.
"IEEE Computer Society Order Number PR01825"--T.p. verso.