X-Ray Microscopy and Spectromicroscopy
Subtitle: Status Report from the Fifth International Conference, Wurzburg, August 19-23, 1996
Contributors: Jurgen Thieme (Editor); Gunter Schmahl (Editor); Dietbert Rudolph (Editor); Eberhard Umbach (Editor)
Publisher: Springer-Verlag Telos
Published: November 15, 1998
Language: eng
Format: Hardcover
Number of pages: 1
ISBN-13: 9783540639985
Subjects: Applied optics; Microscopy; Optics (light); Radiology; X-ray microscopy; Optics; Microscopy In Biology; X-Ray Spectroscopy; Science; Science/Mathematics; Physics; Microscopes & Microscopy; Congresses