ICMTS 1991
Subtitle: proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan
By: sponsored by the IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1991
Place of publication: New York, NY
Language: eng
Number of pages: 264
Subjects: Integrated circuits -- Testing -- Congresses.; Miniature electronic equipment -- Testing -- Congresses.
Other titles: Proceedings of the 1991 International Conference on Microelectronic Test Structures.; 1991 IEEE International Conference on Microelectronic Test Structures.
Notes: "91CH2907-4."

On spine and cover: 1991 IEEE International Conference on Microelectronic Test Structures.

Includes bibliographical references and index.