Microelectronic failure analysis
Subtitle: desk reference
By: Thomas W. Lee, editor, Seshu V. Pabbisetty, editor.
Contributors: Lee, Thomas W.; Pabbisetty, Seshu V.
Edition: 3rd ed.
Publisher: ASM International
Published: 1997
Place of publication: Materials Park, OH
Language: eng
Number of pages: 404
Subjects: Electronics -- Materials -- Testing -- Handbooks, manuals, etc.; Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc.; Microelectronics -- Materials -- Defects -- Handbooks, manuals, etc.; Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc.; Semiconductors -- Defects -- Handbooks, manuals, etc.
Genres: Handbooks, manuals, etc.
Notes: Includes bibliographical references and index.