Two- and three-dimensional vision systems for inspection, control, and metrology II
Subtitle: 26-27 October 2004, Philadelphia, Pennsylvania, USA
By: Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; technical cosponsor, IEICE Communications Society (Japan) ; in cooperation with IEICE Electronics Society (Japan).
Publisher: SPIE
Published: 2005
Place of publication: Bellingham, WA
Language: eng
Number of pages: 188