2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada 
Subtitle: Proceedings
Publisher: Institute of Electrical & Electronics Enginee
Published: August 2000
Language: eng
Format: Paperback
Number of pages: 85
ISBN-13: 9780769506371
Subjects: Electronics engineering; Systems analysis & design; Systems management; Integrated circuits; Congresses; Digital Computer Hardware; Metal oxide semiconductors, Complementary; Computers; Technology & Industrial Arts; Iddq testing; Computer Books: General; General; Defects; Metal oxide semiconductors, Co; Computer Engineering