Nonlinear transistor model parameter extraction techniques
By: edited by Christian Fager, David E. Root, Matthias Rudolph
Series: Cambridge RF and microwave engineering series
Publisher: Cambridge University Press
Published: 2011
Place of publication: Cambridge; New York
Language: eng
ISBN-13: 9780521762106
Subjects: Mathematical models; Electronic circuit design; Transistors
Notes: Includes bibliographical references and index.