X-ray characterization of materials
By: Eric Lifshin (ed.).
Contributors: Lifshin, Eric.
Publisher: Wiley-VCH
Published: 1999
Place of publication: Weinheim; New York
Language: eng
Number of pages: 261
Subjects: Materials -- Analysis.; Surfaces (Technology) -- Analysis.; X-rays -- Industrial applications.
Notes: Includes bibliographical references and index.
Table of contents: title: X-ray diffraction -- Robert L. Snyder; title: Application of synchrotron X-radiation to problems in materials science -- Andrea R. Gerson ... [et al.]; title: X-ray fluorescence analysis -- Ronald Jenkins; title: Small-angle scattering of x-rays and neutrons -- Claudine E. Williams, Roland P. May, and André Guinier.