Selected papers on analog fault diagnosis
By: edited by Ruey-Wen Liu.
Contributors: Liu, Ruey-Wen, 1930-
Series: Advances in circuits and systems
Publisher: IEEE Press
Published: 1987
Place of publication: New York
Language: eng
Number of pages: 143
Subjects: Analog electronic systems -- Testing.; Electric fault location.
Other titles: Analog fault diagnosis.
Notes: Includes bibliographies and index.
Spine title: Analog fault diagnosis.
"IEEE order number: PPO213-9"--T.p. verso.