2000 IEEE International Reliability Physics Symposium Proceedings
Subtitle: 38th Annual San Jose, California April 10-13, 2000 (International Reliability Physics Symposium Proceedings)
Edition: 38 edition
Publisher: Institute of Electrical & Electronics Enginee
Published: June 2000
Language: eng
Format: Paperback
ISBN-13: 9780780358607
Subjects: Circuits & components; Electronic devices & materials; Reliability Engineering; Electronic Apparatus And Devices; Technology; Technology & Industrial Arts; Science/Mathematics; General; Physics; Electronics - Circuits - General