Machine vision applications in industrial inspection X
Subtitle: 21-22 January 2002, San Jose, [California] USA
By: Martin A. Hunt, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering.
Contributors: Hunt, Martin A. 1963-; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 4664; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4664.
Publisher: SPIE
Published: 2002
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 208
Subjects: Engineering inspection -- Automation -- Congresses; Computer vision -- Industrial applications -- Congresses; Quality control -- Optical methods -- Automation -- Congresses; Mensuration -- Congresses
Genres: Congresses.
Notes: Includes bibliographic references and author index.