Annual Reliability and Maintainability Symposium, 2003 Proceedings: Tampa Florida, Usa:27-30 January 2003 (International Reliability Physics Symposium Proceedings)
Publisher: Ieee
Published: May 2003
Language: eng
Format: Paperback
Number of pages: 640
ISBN-13: 9780780377172
Subjects: Computer Programming; Reliability engineering; Reference; Technology; Science/Mathematics