Advances in Imaging and Electron Physics, Volume 101 (Advances in Imaging and Electron Physics)
Contributors: Peter W. Hawkes (Editor); Tom Mulvey (Series Editor); Benjamin Kazan (Series Editor)
Publisher: Academic Press
Published: September 8, 1997
Language: eng
Format: Hardcover
Number of pages: 244
ISBN-13: 9780120147434
Subjects: Applied optics; Electronic devices & materials; Optics (light); Particle & high-energy physics; Electronic Engineering (General); Electrons; Technology; Medical / Nursing; Science/Mathematics; General; Life Sciences - Zoology - General; Material Science; Technology / Material Science; Engineering - Electrical & Electronic
First sentence: Although transmission electron microscopy (TEM) became a routine tool for the physical metallurgist in the 1960s and the theory of image formation from crystalline materials was well established by then, it was not until the 1970s that the TEM was adopted to any great extent by workers in the earth sciences.