Conference record
Subtitle: Autotestcon '96 : test technology and commercialization, September 16-19, 1996, Dayton, Ohio
By: sponsored by The Institute of Electrical & Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society.
Contributors: Institute of Electrical and Electronics Engineers.; IEEE Aerospace and Electronic Systems Society.; IEEE Instrumentation and Measurement Society.
Publisher: Institute of Electrical and Electronics Engineers; IEEE Service Center
Published: 1996
Place of publication: [New York, N.Y.]; Piscataway, N.J
Language: eng
Number of pages: 488
Subjects: Systems engineering -- Congresses.
Other titles: Test technology and commercialization
Notes: Includes bibliographical references and index.
"IEEE catalog number: 96CH35955"--T.p. verso.