Nondestructive Characterization of Materials IV (The Language of Science)
Contributors: J.F. Bussière (Editor); Robert E. Green (Editor); C.O. Ruud (Editor)
Edition: 1 edition
Publisher: Springer
Published: February 29, 1992
Language: eng
Format: Hardcover
Number of pages: 528
ISBN-13: 9780306440472
Subjects: Materials science; Non-Destructive Testing Of Materials; Technology; Science; Science/Mathematics; Material Science; Nanostructures; Technology / Material Science; Congresses; Materials; Nondestructive testing; Testing
First sentence: Thin film characterization by X-Ray methods is often difficult because of the problems of preferred crystal orientations and residual stresses.