Description de l'interface Si-SiO2 par des mesures de la capacité mos en très basses frequences
By: René Castagne
Published: 1970
Language: eng
Number of pages: 194
Other titles: Description of the SiO2-Si interface properties by means of very low frequency mos capacitance measurements.
Notes: "Article principal"

Thesis (doctoral)-- Faculté des sciences d'Orsay, 1970.

Text in English.