Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites
By: David G. Seiler ... [et al.].
Contributors: Seiler, David G.; National Institute of Standards and Technology (U.S.)
Series: Semiconductor measurement technology; NIST special publication ;; 400-94
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1994
Place of publication: Gaithersburg, MD; Washington, DC
Language: eng
Subjects: GOES (Meteorological satellite); TIROS satellites.; Space vehicles -- Optical equipment.; Infrared detectors.
Notes: Includes bibliographical references.
"April 1994."