Memory & LSI
Subtitle: digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: Institute of Electrical and Electronics Engineers; available from IEEE Computer Society Publications Office
Published: 1974
Place of publication: New York; Long Beach, Calif
Language: eng
Number of pages: 261
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductor storage devices -- Testing -- Congresses.; Integrated circuits -- Large scale integration -- Congresses.
Notes: Includes bibliographical references.
"74CH0909-2C."