15th IEEE VLSI Test Symposium
Subtitle: April 27-May 1, 1997, Monterey, California : proceedings
By: sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE Computer Society Press
Published: 1997
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 466
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Other titles: Fifthteenth IEEE VLSI Test Symposium; VLSI Test Symposium; VTS97
Notes: "IEEE Computer Society Press order number PR07810--T.p. verso.

"IEEE Plan order number 97TB100125"--T.p. verso.

Includes  bibliographical references and index.