Process Measurement Assurance Program for U.S. State metrology laboratories
By: Jerry L. Everhart, Georgia L. Harris
Contributors: Harris, Georgia L; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6176
Publisher: U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1998
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 12
Subjects: Measurement -- Standards; Electronic measurements -- Standards; Testing laboratories -- Standards
Notes: Shipping list no.: 98-1024-M

"June 1998."

Includes bibliographical references (p. 11-12)

Microfiche. [Washington, D.C.] : Supt. of Docs, U.S. G.P.O., [1998] 1 microfiche : negative