Memory technology, design and testing
Subtitle: proceedings : International Workshop on Memory Technology, Design, and Testing
By: sponsored by IEEE Computer Society ... [et al.] ; edited by D. Lepejian ... [et al.].
Contributors: Lepejian, D.; IEEE Computer Society.
Publisher: IEEE Computer Society Press
Published: 1998
Place of publication: Los Alamitos, California
Language: eng
Number of pages: 131
Subjects: Semiconductor storage devices -- Testing -- Congresses.; Random access memory -- Congresses.
Genres: Congresses.
Other titles: MTDT'98; Records of the IEEE International Workshop on Memory Technology, Design and Testing; Proceedings, International Workshop on Memory Technology, Design and Testing
Notes: "IEEE Computer Society Order Number PR08494 ; IEEE Order Plan Catalog Number 98TB100236"--T.p. verso.

Includes bibliographical references and author index.