Stress Induced Phenomena in Metallization
Subtitle: Sixth International Workshop on Stress Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001 ... Phenomena Metallizat.)
Contributors: Shefford P. Baker (Editor); Matti A. Korhonen (Editor); Eduard Arzt (Editor); Paul S. Ho (Editor)
Edition: 1 edition
Publisher: American Institute of Physics
Published: April 9, 2002
Language: eng
Format: Hardcover
Number of pages: 250
ISBN-13: 9780735400580
Subjects: Circuits & components; General Theory of Computing; Stress & fracture; Semiconductor Physics; Science; Science/Mathematics; Astronomy - General; General; Physics; Computer chip manufacturing and quality control; Technology / Optics; development of integrated circuits; microelectromechanical devices; research in reliability problems of electronic devices; Electricity; Congresses; Defects; Electrodiffusion; Integrated circuits; Thin film devices