Machine vision applications in industrial inspection XV
Subtitle: 29-30 January, 2007, San Jose, California, USA
By: Fabrice Meriaudeau, Kurt S. Niel, editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
Contributors: Mériaudeau, Fabrice.; Niel, Kurt S.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE -- v. 6503; Proceedings of Electronic Imaging Science and Technology; Proceedings of SPIE--the International Society for Optical Engineering -- v. 6503.
Publisher: SPIE
Published: 2007
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819466167
Subjects: Engineering inspection -- Automation -- Congresses; Computer vision -- Industrial applications -- Congresses; Quality control -- Optical methods -- Automation -- Congresses; Measurement -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and author index.