Defectrecognition in semiconductors before and after processing
Subtitle: proceedings of the Fourth International Conference, 18-22 March 1991, Wilmslow, UK
By: [edited by M.R. Brozel and D.J. Stirland].
Contributors: Brozel, M. R.; Stirland, D. J.
Series: Semiconductor science and technology -- vol.7, no.1A
Publisher: IOP Publishing
Published: 1992
Place of publication: Bristol
Language: eng
Notes: Previous conferences entitled "Defect recognition and image processing in III-V compounds".