Reliable application of optoelectronic devices
By: prepared by Reliability Analysis Center under contract to Air Force Research Laboratory-Information Directorate
Contributors: Air Force Research Laboratory (Wright-Patterson Air Force Base, Ohio). Information Directorate
Publisher: The Center
Published: 1998
Place of publication: Rome, N.Y
Language: eng
Number of pages: 120
Subjects: Semiconductors; Optoelectronic devices
Notes: Includes bibliographical references (p. 117-120)