Identification of Defects in Semiconductors, Volume 51B (Semiconductors and Semimetals)
Contributors: Michael Stavola (Editor); Robert K. Willardson (Series Editor); Eicke R. Weber (Series Editor)
Publisher: Academic Press
Published: October 20, 1998
Language: eng
Format: Hardcover
Number of pages: 434
ISBN-13: 9780127521657
Subjects: Condensed matter physics (liquids & solids); Electricity, magnetism & electromagnetism; Particle & high-energy physics; Semi-conductors & super-conductors; Electric Conductivity; Semiconductors; Technology; Technology & Industrial Arts; Science/Mathematics; Engineering - Electrical & Electronic; Material Science; Optics; Technology / Optics; Electricity; Electronics - Semiconductors; Quality Control
First sentence: Luminescence and optical absorption provide powerful methods of obtaining microscopic data on defects in semiconductor materials-when they work.