Proceedings
Subtitle: 20th IEEE VLSI Test Symposium : (VTS 2002) : 28 April - 2 May 2002, Monterey, California
By: sponsored by IEEE Computer Society Test Technology Technical Council.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers.
Publisher: IEEE Computer Society
Published: 2002
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 452
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses
Genres: Congresses.
Other titles: VTS 2002.; VLSI Test Symposium, 2002, (VTS 2002), proceedings 20th IEEE.
Notes: "IEEE Computer Society Order Number PRO1570"--T.p. verso.

Includes bibliographical references and index.

Also available via the World Wide Web with additional title: VLSI Test Symposium, 2002, (VTS 2002), proceedings 20th IEEE.