Digital Noise Monitoring of Defect Origin (Lecture Notes Electrical Engineering)
Edition: 1 edition
Publisher: Springer
Published: July 25, 2007
Language: eng
Format: Hardcover
Number of pages: 223
ISBN-13: 9780387717531
Subjects: Applied mathematics; Electrical engineering; Technology & Engineering; Technology & Industrial Arts; Science/Mathematics; Applied; Electricity; Engineering - Electrical & Electronic; Mathematics : Applied; Technology / Electricity; Technology / Engineering / Electrical; Engineering (General)