Electron and ion microscopy and microanalysis
Subtitle: principles and applications
By: Lawrence E. Murr.
Series: Optical engineering ;; v. 1; Optical engineering (Marcel Dekker, Inc.) ;; v. 1.
Publisher: Marcel Dekker
Published: 1982
Place of publication: New York
Language: eng
Number of pages: 793
Subjects: Electron microscopy.; Field ion microscopy.; Microprobe analysis.
Notes: Includes bibliographical references and indexes.