Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
Subtitle: April 18-21, 2007, Kraków, Poland
By: sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Silesian University of Technology ; editors, P. Girard ... [et al.].
Contributors: Girard, Patrick, Ph. D.; IEEE Computer Society. Technical Council on Test Technology.; Politechnika Śląska im. W. Pstrowskiego.
Publisher: IEEE
Published: 2007
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 434
Subjects: Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Design -- Congresses.
Genres: Congresses.
Other titles: 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
Notes: "IEEE catalog number: 06EX1759"--T.p. verso.

Includes bibliographical references and index.