Proceedings International Test Conference 2002
By: [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: International Test Conference; IEEE
Published: 2002
Place of publication: Washington, D.C; Piscataway, New Jersey
Language: eng
Number of pages: 1250
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Telecommunication -- Congresses.; Radio frequency -- Congresses.
Genres: Congresses.
Other titles: ITC :; ITC : International Test Conference 2000
Notes: Also available via the World Wide Web.
Includes bibliographic references and author index.
Conference number inferred.
"IEEE Catalog Number 02CH37382"--verso of T.p.