Process imaging for automatic control
Subtitle: 5-6 November 2000, Boston, USA
By: Hugh McCann, David M. Scott, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organization, the Virtual Centre for Industrial Process Tomography/VCIPT (UK).
Contributors: McCann, Hugh.; Scott, David M.; Society of Photo-optical Instrumentation Engineers.; Virtual Centre for Industrial Process Tomography.
Series: SPIE proceedings series ;
Publisher: SPIE
Published: 2001
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 310
Subjects: Tomography -- Industrial applications -- Congresses.; Image processing -- Industrial applications -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.
Errata p. and additional paper tipped in.