Using path parity for "collapsing" stuck-open fault-lists and designing stuck-open testable circuits
By: Sreejit Chakravarty.
Series: Technical report (State University of New York at Buffalo. Dept. of Computer Science) -- 90-09
Publisher: State University of New York at Buffalo, Dept. of Computer Science
Published: 1990
Place of publication: Buffalo, N.Y
Language: eng
Format: Microform
Number of pages: 21
Subjects: Electronic circuits -- Testing.
Notes: "May 1990."

Includes bibliographical references.

Checklist of official publications of the State of New York, 1990.

Microfiche. Albany, N.Y. : New York State Library, filmed by AMTEK Corporation, 1994. 1 microfiche.