New frontiers in testing
Subtitle: International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC
By: sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: Computer Society Press of the IEEE
Published: 1988
Place of publication: Washington, D.C
Language: eng
Number of pages: 1005
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Notes: Includes bibliographies and index.
"Computer Society order number 870."
"IEEE catalog number 88CH2610-4."