Simplified data reduction methods for the ECT test for mode III interlaminar fracture toughness
By: Jian Li, T. Kevin O'Brien.
Contributors: O'Brien, T. Kevin.; Langley Research Center.
Series: NASA technical memorandum -- 110176.
Publisher: National Aeronautics and Space Administration, Langley Research Center; National Technical Information Service, distributor
Published: 1995
Place of publication: Hampton, Va; [Springfield, Va
Language: eng
Format: Microform
Subjects: Characterization.; Composite materials.; Data reduction.; Delaminating.; Fracture mechanics.; Modulus of elasticity.; Shear strength.; Strain energy release rate.; Toughness.; Transverse loads.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 96-0033-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.