Standards for electronic imaging systems
Subtitle: proceedings of a conference held 28 February-1 March, 1991, San Jose, California
By: Michael Nier, Marilyn E. Courtot, editors ; sponsored by SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology ; cooperating organization, Center for Imaging Science/RochesterInstitute of Technology.
Contributors: Nier, Michael.; Courtot, Marilyn E.; Society of Photo-optical Instrumentation Engineers.; IS & T--the Society for Imaging Science and Technology.; Rochester Institute of Technology. Center for Imaging Science.
Series: Critical reviews of optical science and technology ;; v. CR37
Publisher: SPIE Optical Engineering Press
Published: 1991
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 246
Subjects: Imaging systems -- Standards -- Congresses.; Image processing -- Standards -- Congresses.
Notes: Includes bibliographical references and index.