System voltage potential-induced degradation mechanisms in PV modules and methods for test
Subtitle: preprint
By: Peter Hacke ... [et al.].
Contributors: National Renewable Energy Laboratory (U.S.); IEEE Photovoltaic Specialists Conference (37th : 2011 : Seattle, Wash.)
Series: NREL/CP -- 5200-50716; Conference paper (National Renewable Energy Laboratory (U.S.)) -- NREL/CP-5200-50716.
Publisher: National Renewable Energy Laboratory
Published: 2011
Place of publication: Golden, CO]
Language: eng
Format: [electronic resource] :
Subjects: Photovoltaic power generation; Equipment and supplies; Service life; Photovoltaic power systems; Reliability; Testing
Other titles: System voltage potential induced degradation mechanisms in PV modules and methods for test
Notes: Title from title screen (viewed on Aug. 10, 2011).

"July 2011."

"Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011."

Includes bibliographical references (p. 6-7).

DE-AC36-08GO28308