The electrical characterization of semiconductors
Subtitle: measurement of minority carrier properties
By: J.W. Orton and P. Blood
Contributors: Blood, Peter
Series: Techniques of physics -- 13; Techniques of physics -- 13
Publisher: Academic Press
Published: 1990
Place of publication: London; San Diego, CA
Language: eng
Number of pages: 291
Subjects: Semiconductors -- Materials -- Measurement; Semiconductors -- Diffusion; Semiconductors -- Recombination; Semiconductors -- Impurity distribution; Semiconductors -- Defects
Notes: Includes bibliographical references (p. [279]-286) and index