Universal test fixture for monolithic mm-wave integrated circuits calibrated with an augmented TRD algorithm
By: Robert R. Romanofsky and Kurt A. Shalkhauser.
Contributors: Shalkhauser, Kurt A.; United States. National Aeronautics and Space Administration. Scientific and Technical Information Division.
Series: NASA technical paper -- 2875.
Publisher: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division; For sale by the National Technical Information Service]
Published: 1989
Place of publication: [Washington, D.C.]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Integrated circuits.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1989. 1 microfiche ; 11 x 15 cm.