Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
By: edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, Singapore.
Contributors: Ong, Soon Huat.; Radhakrishnan, M. K.; IEEE Singapore Section. Reliability/CPMT/EDA Chapter.; IEEE Electron Devices Society.; National University of Singapore. Centre for IC Failure Analysis and Reliability.; Institute of Microelectronics.; Magnetics Technology Centre.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1995
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 230
Subjects: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing -- Congresses.
Other titles: 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Notes: Includes bibliographical references and index.
"IPFA '95 proceedings"--Cover.
"IEEE catalog no. 95TH8113"--Cover.
"27 November - 1 December 1995, Shangri-La Hotel, Singapore"--Cover.