International conference on image processing and pattern recognition in industrial engineering
Subtitle: 7-8 August 2010, Xi'an, China
By: Zhengyu Du, Bin Liu, editors
Contributors: Du, Zhengyu; Liu, Bin; Shanxi da xue; Information Technology & Industrial Engineering Research Center (Hong Kong, China); SPIE (Society)
Series: Proceedings of SPIE -- v.7820; Proceedings of SPIE--the International Society for Optical Engineering -- v.7820.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819483294
Subjects: Congresses; Pattern recognition systems; Remote sensing; Industrial engineering; Imaging systems; Image processing
Other titles: Image processing and pattern recognition in industrial engineering
Notes: Includes bibliographical references and index.

Issued in parts.