method of determining the emission and susceptibility levels of electrically small objects using a TEM cell
By: Ippalapalli Sreenivasiah, David C. Chang, Mark T. Ma
Contributors: Chang, David C; Ma, Mark T; United States. National Bureau of Standards; University of Colorado, Boulder. Electromagnetics Laboratory; Center for Electronics and Electrical Engineering (U.S.). Electromagnetic Fields Division
Series: NBS technical note -- 1040
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1981
Place of publication: Washington, D.C
Language: eng
Number of pages: 45
Subjects: Magnetic dipoles; Electromagnetic fields; Electric waves
Notes: "Electromagnetics Laboratory, Department of Electrical Engineering, University of Colorado."

"Electromagnetic Fields Division, National Engineering Laboratory, National Bureau of Standards."

"Issued April 1981."

Includes bibliographical references