Measurement of the thickness and refractive index of evaporated dielectric films.
Publisher: Waltman
Published: 1968
Place of publication: Delft
Language: eng
Number of pages: 80
Subjects: Dielectrics -- Optical properties.; Thin films -- Optical properties.
Notes: Bibliography: p. 77-78.
Proefschrift--Delft.
Stellingen: [4] p. inserted.
Summary in Dutch.