Testability of product data management interfaces
By: David Flater, KC Morris.
Contributors: Morris, K. C.; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6429.
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1999
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 20
Subjects: CAD/CAM systems -- Specifications -- United States.; CAD/CAM systems -- United States -- Testing.; Computer interfaces -- Specifications -- United States.; Computer interfaces -- United States -- Testing.
Notes: Shipping list no.: 2000-0425-M.

"November 1999."

Includes bibliographical references (p. 18-20).

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [2000] 1 microfiches : negative.