Rentgenodifrakt͡s︡ionnai͡a︡ diagnostika submikronnykh sloev
By: A.M. Afanasʹev, P.A. Aleksandrov, R.M. Imamov.
Contributors: Aleksandrov, P. A.; Imamov, R. M.
Publisher: "Nauka," Glav. red. fiziko-matematicheskoĭ lit-ry; "Nauka," Glav. red. fiziko-matematicheskoĭ lit-ry
Published: 1989
Place of publication: Moskva
Language: rus
Number of pages: 151
Subjects: Semiconductors -- Testing; X-Ray diffraction
Other titles: X-ray diffraction diagnostic of submicron layers.
Notes: Includes bibliographical references (p. 146-151).
"Nauchnoe izdanie"--Verso t.p.
Title on p. [152]: X-ray diffraction diagnostic of submicron layers.
Summary in English.