Memory & LSI
Subtitle: digest of papers
By: 1976 Semiconductor Test Symposium, October 19-21, 1976, held at Cherry Hill, New Jersey ; sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: Institute of Electrical and Electronics Engineers; available from IEEE Computer Society Publications Office
Published: 1976
Place of publication: New York; Long Beach, Calif
Language: eng
Number of pages: 105
Subjects: Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Large scale integration -- Congresses.; Semiconductor storage devices -- Testing -- Congresses.; Microprocessors -- Testing -- Congresses.
Notes: Includes bibliographical references.
"76CH 1179-1C."