Machine vision applications, architectures, and systems integration VI
Subtitle: 15-16 October 1997, Pittsburgh, Pennsylvania
By: Susan Snell Soloman, Bruce G. Batchelor, John W.V. Miller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers ; cooperating organizations, NIST--National Institute of Standards and Technology, CIMS--Coalition for Intelligent Manufacturing Systems, [and] A-CIMS--Academic Coalition for Intelligent Manufacturing Systems.
Contributors: Batchelor, Bruce G.; Solomon, Susan Snell.; Miller, John W. V.; Society of Photo-optical Instrumentation Engineers.; Machine Vision Association of SME.; National Institute of Standards and Technology (U.S.); Coalition for Intelligent Manufacturing Systems.; Academic Coalition for Intelligent Manufacturing Systems.
Series: SPIE proceedings series ;; v. 3205; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3205.
Publisher: SPIE
Published: 1997
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 296
Subjects: Computer vision -- Congresses.; Computer vision -- Industrial applications -- Congresses.
Notes: Includes bibliographic references and index.