Identification of Defects in Semiconductors, Volume 51A (Semiconductors and Semimetals)
Contributors: Michael Stavola (Editor); Robert K. Willardson (Series Editor); Eicke R. Weber (Series Editor)
Publisher: Academic Press
Published: May 26, 1998
Language: eng
Number of pages: 376
ISBN-13: 9780127521596
First sentence: In an EPR experiment, the sample is placed in a magnetic field and transitions are induced between the Zeeman levels of the defect.