Optical fabrication, testing and metrology III
Subtitle: 2-4 September 2008. Glasgow, United Kingdom
By: Angela Duparré, Roland Geyl, /editors ; sponsored by SPIE Europe
Contributors: SPIE Europe; Society of Photo-optical Instrumentation Engineers
Series: Proceedings of SPIE -- v. 7102; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7102
Publisher: SPIE
Published: 2008
Place of publication: Bellingham, Wash
Language: eng
Subjects: Optical instruments; Design and construction; Congresses; Testing; Optical materials; Metrology
Other titles: Optical fabrication, testing and metrology three; Optical fabrication, testing and metrology 3
Notes: Includes bibliographical references and author index.