An empirical study of the effects of incorporating fault exposure potential estimates into a test data adequacy criterion
By: Wei Chen ... [et al.].
Contributors: Chen, Wei, 1977-; Oregon State University. Dept. of Computer Science.
Series: Technical report -- 00-60-04.; Technical report (Oregon State University. Dept. of Computer Science) -- 00-60-04.
Publisher: Oregon State University, Dept. of Computer Science
Published: 2000
Place of publication: [Corvallis, OR]
Language: eng
Number of pages: 10
Subjects: Software failures.; Computer software -- Testing.
Notes: Caption title.

"March, 2000"

Includes bibliographical references (p. 10).