Defect and fault tolerance in VLSI systems
By: edited by Israel Koren.
Contributors: Koran, Israel.; International Workshop on Defect and Fault Tolerance in VLSI Systems.
Publisher: Plenum Press
Published: 1989
Place of publication: New York
Language: eng
Subjects: Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Fault-tolerant computing -- Congresses.
Notes: Proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems.

Vol. 2 edited by C.H. Stapper, V.K. Jain, and G. Saucier.

Includes bibliographies and index.

LIBRARY HAS: v.1-2.