Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Subtitle: January 28-30, 1997, Four Seasons Hotel, Austin, TX, USA.
Contributors: IEEE Components, Hybrids, and Manufacturing Technology Society.
Publisher: Institute of Electrical and Electronics Engineers; IEEE Service Center
Published: 1997
Place of publication: [New York]; Piscataway, NJ
Language: eng
Number of pages: 291
Subjects: Semiconductors -- Thermal properties -- Congresses; Semiconductors -- Cooling -- Congresses
Genres: Congresses.
Other titles: 1997 IEEE 13th Annual Semiconductor Thermal Measurement and Management Symposium; Semiconductor Thermal Measurement and Management Symposium
Notes: "IEEE catalog number 97CH36031"--T.p. verso.

Includes bibliographical references.