Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California
By: [edited by Tom Wik, Adit Singh, and Rochit Rajsuman] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid-State Circuits Society.
Contributors: Wit, Tom.; Singh, Adit.; Rajsuman, Rochit.; IEEE Computer Society.; IEEE Computer Society. Technical Committee on VLSI.; IEEE Computer Society. Technical Council on Test Technology.; IEEE Solid-State Circuits Society.
Publisher: IEEE Computer Society
Published: 2003
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 95
Subjects: Semiconductor storage devices -- Testing -- Congresses.; Random access memory -- Congresses.
Genres: Congresses.
Other titles: MTDT 2003
Notes: Includes bibliographical references and author index.
"IEEE Computer Society Order Number PR02004"--T.p. verso.
" ... the eleventh annual IEEE International Workshop ..."--P. vii.
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