Semiconductor characterization techniques
Subtitle: proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices
By: edited by Peter A. Barnes, George A. Rozgonyi, assistant editors, C. L. Anderson ... [et al. ; sponsored by] Elecronics Division.
Contributors: Barnes, Peter A.; Rozgonyi, George A.; Electrochemical Society. Electronics Division.
Series: Proceedings - The Electrochemical Society ; v. 78-3; Proceedings (Electrochemical Society) ;; v. 78-3.
Publisher: Electrochemical Society
Published: 1978
Place of publication: Princeton, N.J
Language: eng
Number of pages: 532
Subjects: Semiconductors -- Testing -- Congresses.
Notes: Includes bibliographical references and indexes.