Time and frequency metrology
Subtitle: 29-30 August 2007, San Diego, California, USA
By: R. Jason Jones, editor ; sponsored and published by SPIE.
Contributors: Jones, R. Jason.; SPIE (Society).
Series: Proceedings of SPIE -- v. 6673; Proceedings of SPIE--the International Society for Optical Engineering -- v. 6673.
Publisher: SPIE
Published: 2007
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819468215
Subjects: Time measurements -- Congresses; Measurement -- Congresses; Metrology
Genres: Congresses.
Notes: Includes bibliographical references and index.