Process Variations and Probabilistic Integrated Circuit Design
By: edited by Manfred Dietrich, Joachim Haase
Contributors: Haase, Joachim; SpringerLink (Online service)
Publisher: Springer Science+Business Media, LLC
Published: 2012
Place of publication: New York, NY
Language: eng
Format: [electronic resource] /
ISBN-13: 9781441966209; 9781441966216
Subjects: Systems engineering; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Computer-aided design; Circuits and Systems