Proceedings
Subtitle: Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy.
Contributors: IEEE Computer Society.
Publisher: Conference Pub. Services; IEEE Computer Society
Published: 2008
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 205
ISBN-13: 9780769531502
Subjects: Integrated circuits -- Testing -- Congresses
Genres: Congresses
Other titles: 13th IEEE European Test Symposium; Proceedings of the 13th IEEE European Test Symposium; Thirteenth IEEE European Test Symposium; ETS 2008; European Test Symposium
Notes: "IEEE Computer Society Order Number P3150"--t.p. verso.

"ISSN 1530-1877."

Includes bibliographical references and index.