P-polarized reflectance spectroscopy
Subtitle: a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions
By: Nikolaus Dietz and Klaus J. Bachmann.
Contributors: Bachmann, Klaus J.; United States. National Aeronautics and Space Administration.
Series: NASA contractor report -- NASA CR-199715.
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1995
Place of publication: [Washington, D.C; Springfield, Va
Language: eng
Format: Microform
Subjects: Dielectric properties.; Epitaxy.; Film thickness.; Fine structure.; Laser applications.; Light scattering.; Spectral reflectance.; Spectroscopy.; Surface layers.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 96-0197-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.