LSI & boards
Subtitle: digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey
By: sponsored by IEEE Computer Society, Test Technology Committee and the Philadelphia Section of the IEEE.
Contributors: IEEE Computer Society. Test Technology Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: Institute of Electrical and Electronics Engineers; available from IEEE Computer Society Publications Office
Published: 1978
Place of publication: New York; Long Beach, Calif
Language: eng
Number of pages: 301
Subjects: Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Large scale integration -- Congresses.; Printed circuits -- Testing -- Congresses.
Notes: Includes bibliographical references.