Design & test techniques for VLSI & WSI circuits
By: edited by R.E. Massara.
Contributors: Massara, R. E., 1947-; Institution of Electrical Engineers.
Series: IEE computing series ;; 15
Publisher: P. Peregrinus on behalf of the Institution of Electrical Engineers
Published: 1989
Place of publication: London, U.K
Language: eng
Number of pages: 315
Subjects: Integrated circuits -- Very large scale integration -- Design and construction.; Integrated circuits -- Very large scale integration -- Testing.; Integrated circuits -- Wafer-scale integration -- Design and construction.; Integrated circuits -- Wafer-scale integration -- Testing.
Other titles: Design and test techniques for VLSI & WSI circuits.
Notes: Includes bibliographical references and index.