Semiconductor device measurements.
By: Significant contributions by John Tomlin, Lee Miles [and] Ed Smith.
Contributors: Tektronix, Inc.
Edition: [1st ed.
Series: Measurement concepts
Publisher: Tekronix
Published: 1969
Place of publication: Beaverton, Or.]
Language: eng
Number of pages: 156
Subjects: Semiconductors.; Electronic measurements.
Notes: Includes index.