Angewandte Oberflächenanalyse
Subtitle: mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie
By: M. Grasserbauer, H.J. Dudek, M.F. Ebel.
Contributors: Dudek, H. J.; Ebel, M. F.
Publisher: Springer-Verlag
Published: 1986
Place of publication: Berlin; New York
Language: ger
Number of pages: 300
Subjects: Surface chemistry.; Secondary ion mass spectrometry.; X-ray spectroscopy.
Notes: Includes bibliographies and index.