Breakdown phenomena in semiconductors and semiconductor devices
By: Michael Levinshtein, Juha Kostamovaara, Sergey Vainshtein.
Contributors: Kostamovaara, Juha.; Vainshtein, Sergey.
Series: Selected topics in electronics and systems -- v. 36
Publisher: World Scientific
Published: 2005
Place of publication: Singapore; Hackensack, N.J
Language: eng
Number of pages: 208
Subjects: Semiconductors.; Breakdown (Electricity); High voltages.
Notes: Includes bibliographical references (p. 185-194) and indexes.