Integrating photogrammetric techniques with scene analysis and machine vision II
Subtitle: 19-21 April 1995, Orlando, Florida
By: David M. McKeown, Ian J. Dowman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: McKeown, David M.; Dowman, Ian J.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for optical Engineering ;; v. 2486; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2486.
Publisher: SPIE
Published: 1995
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 300
Subjects: Computer vision -- Congresses.; Photogrammetry -- Congresses.; Cartography -- Congresses.
Notes: Includes bibliographic references and index.