Risk Methodologies for Technological Legacies (Nato Science Series: IV: Earth and Environmental Sciences)
Contributors: James G. Droppo (Adapter); Dennis Bley (Editor); Vitaly A. Eremenko (Editor)
Edition: 1 edition
Publisher: Springer
Published: April 1, 2003
Language: eng
Format: Paperback
Number of pages: 400
ISBN-13: 9781402012587
Subjects: Risk assessment; Risk assessment & analysis for business; The Environment; Science/Mathematics; Environmental Science; Technology; Environmental Studies; Engineering - Industrial; Science / Environmental Science; History
First sentence: No decision maker should be placed in the position in which Prof. Legasov found himself, facing catastrophic consequences and great uncertainty.