Characterization of epitaxial semiconductor films
By: edited by Henry Kressel.
Contributors: Kressel, Henry.
Series: Methods and phenomena, their applications in science and technology ;; v. 2
Publisher: Elsevier Scientific Pub. Co.
Published: 1976
Place of publication: Amsterdam; New York
Language: eng
Number of pages: 216
Subjects: Thin films.; Epitaxy.; Semiconductors.
Notes: Includes bibliographical references.
"Published as a special issue of Thin solid films, vol. 31, issues 1 and 2."