VLSI testing
By: edited by T.W. Williams.
Contributors: Williams, T. W., 1943-
Series: Advances in CAD for VLSI ;; v. 5
Publisher: North-Holland; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co.
Published: 1986
Place of publication: Amsterdam; New York; New York, N.Y., U.S.A
Language: eng
Number of pages: 275
Subjects: Integrated circuits -- Very large scale integration -- Testing.
Notes: Includes bibliographies.