Microelectronic yield, reliability, and advanced packaging
Subtitle: 28-30 November 2000, Singapore
By: Cher Ming Tan ... [et al.], chairs/editors ; sponsored by Nanyang Technological University (Singapore) [and] SPIE--the International Society for Optical Engineering ; cooperating organizations, Institute of Physics (Singapore) ... [et al.].
Contributors: Tan, Cher Ming, 1959-; Society of Photo-optical Instrumentation Engineers.; Nanyang Technological University.; Institute of Physics, Singapore.
Series: SPIE proceedings series ;; v. 4229; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4229.
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 222
Subjects: Microelectromechanical systems -- Reliability -- Congresses.; Microelectronic packaging -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.