Proceedings
Subtitle: 1997 GaAs Reliability Workshop : October 12, 1997, Anaheim, California
By: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Device Society of the Institute of Electrical and Electronics Engineers, Inc.
Contributors: JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.; IEEE Electron Devices Society.
Publisher: IEEE
Published: 1997
Place of publication: [Arlington, VA
Language: eng
Number of pages: 116
Subjects: Gallium arsenide semiconductors -- Reliability -- Congresses.; Bipolar transistors -- Reliability -- Congresses.; Accelerated life testing -- Congresses.
Notes: Includes bibliographical references.
"IEEE catalog number: 97TH8340"--Cover p. [2].