1999 IEEE International Integrated Reliability Workshop final report
Subtitle: Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: IEEE Electron Devices Society; IEEE Reliability Society
Published: 1999
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 188
Subjects: Integrated circuits -- Reliability -- Congresses.; Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references.
"IEEE Catalog No. 98TH8460."