Secure testing of VLSI cryptographic equipment
By: Heinz Bonnenberg.
Edition: 1. Aufl.
Series: Series in microelectronics,; v. 25
Publisher: Hartung-Gorre
Published: 1993
Place of publication: Konstanz
Language: eng
Number of pages: 123
Subjects: Integrated circuits -- Very large scale integration -- Testing.; Cryptography.
Notes: Includes bibliographical references (p. 107-112).