Semiconductor Interfaces
Subtitle: Formation and Properties
By: edited by Guy Lay, Jacques Derrien, Nino Boccara
Contributors: Derrien, J. (Jacques); Boccara, Nino
Series: Springer Proceedings in Physics -- 22; Springer proceedings in physics -- 22.
Publisher: Springer Berlin Heidelberg
Published: 1987
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] :
Number of pages: 389
ISBN-13: 9783642729690; 9783642729676
Subjects: Physical organic chemistry; Surfaces (Physics); Crystallography; Physics; Electronics; Optical materials
Description: The trend towards miniaturization of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role upon semiconductor interfaces. Great advances have recently been made in the production of new thin-film materials and in the characterization of their interfacial properties down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures given by specialists at the International Winter School on "Semiconductor Interfaces: Formation and Properties", which was held at the Centre de Physique des Houches from 24 February to 6 March, 1987. The following topics are particularly emphasised: - Interface formation, including molecular beam epitaxy, the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. - Characterization down to the atomic scale using techniques such as STM, HRTEM, SEXAFS and SEELFS. - Specific physical properties of the interfaces and their prospective device applications.
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Table of contents: title: Contents: Introduction; title: Experimental Study of the Formation of Semiconductor Interfaces; title: Structural Characterization of the Interfaces; title: Electronic Properties of Interfaces; title: Optical and Vibrational Properties of Interfaces; title: Interfaces: Present Status and Perspectives; title: Index of Contributors.