IEEE standard test access port and boundary-scan architecture
By: Sponser, Test Technology Technical Committee of the IEEE Computer Society.
Contributors: IEEE Standards Board.; IEEE Computer Society. Test Technology Technical Committee.
Series: IEEE Std -- 1149.1-1990.; IEEE Std -- 1149.1a-1993.; IEEE std -- 1149.1-1990.; IEEE std -- 1149.1a-1993.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1993
Place of publication: New York, N.Y
Language: eng
Subjects: Integrated circuits -- Testing -- Standards.
Notes: "IEEE Std 1149.1 Approved February 15, 1990, IEEE Standards Board."

"IEEE Std 1149.1a Approved June 17, 1993, IEEE Standards Board."

"October 21, 1993"--Cover.

"SH16626"--Cover.

"IEEE Std 1149.1-1990 (Includes IEEE Std 1149.1a-1993)"--Cover.