Laser-enhanced ionization spectrometry and its principles
Subtitle: a powerful tool for ultra-sensitive trace element analysis
By: by Ove Axner
Contributors: Chalmers tekniska högskola. Department of Physics
Series: Doktorsavhandlingar vid Chalmers tekniska högskola -- ny ser., nr. 607
Publisher: Dept. of Physics, Chalmers University of Technology
Published: 1987
Place of publication: Göteborg, Sweden
Language: eng
Number of pages: 183
Notes: doctoral Chalmers University of Technology 1987