Semiconductor measurement technology
Subtitle: Permanent Damage Effects Of Nuclear Radiation On The X Band Performance Of Silicon Schottky Barrier Microwave Mixer Diodes
Publisher: Washington : U.S. Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : For sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1976
Place of publication: Washington, D.C., USA
Language: eng