X-ray microscopy
Subtitle: proceedings of the international symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983
By: editors, G. Schmahl and D. Rudolph.
Contributors: Schmahl, G. 1936-; Rudolph, D. 1935-
Series: Springer series in optical sciences ;; v. 43
Publisher: Springer-Verlag
Published: 1984
Place of publication: Berlin; New York
Language: eng
Number of pages: 345
Subjects: X-ray microscopy -- Congresses.
Notes: Includes bibliographical references.