Defects in SiO₂ and related dielectrics
Subtitle: science and technology
By: edited by G. Pacchioni, L. Skuja, D.L. Griscom.
Contributors: Pacchioni, G. 1954-; Skuja, L.; Griscom, David L.; NATO Advanced Study Institute on Defects in SiOb2s and Related Dielectrics: Science and Technology( 2000 : Erice, Italy)
Series: NATO science series -- vol. 2; NATO science series -- vol. 2
Publisher: Kluwer Academic Publishers
Published: 2000
Place of publication: Dordrecht, Netherlands; Boston, MA
Language: eng
Number of pages: 624
Subjects: Silica -- Electric properties -- Congresses.; Crystals -- Defects -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.