Imaging techniques for testing and inspection
Subtitle: seminar-in-depth, February, 1972, Los Angeles, California
By: Editors: John C. Urbach, Harold Berger [and] Robert Aprahamian.
Contributors: Urbach, John C.; Berger, Harold.; Aprahamian, R.; Society of Photo-optical Instrumentation Engineers.; American Society for Nondestructive Testing.; American Society for Testing and Materials.
Series: Proceedings of the Society of Photo-optical Instrumentation Engineers -- v. 29.
Publisher: Society of Photo-optical Instrumentation Engineers
Published: 1977
Place of publication: [Redondo Beach, Calif
Language: eng
Format: Microform
Number of pages: 150
Subjects: Non-destructive testing -- Congresses.; Imaging systems -- Congresses.
Notes: "SPIE co-sponsors: The American Society fo Nondestructive Testing, The American Society for Testing and Materials."

Includes bibliographical references.

Microfilm. Ann Arbor, Mich. : University Microfilms International, 1977. 1 microfilm reel ; 35 mm.