Fault-tolerance through reconfiguration of VLSI and WSI arrays
By: R. Negrini, M.G. Sami, R. Stefanelli.
Contributors: Sami, Mariagiovanna.; Stefanelli, Renato.
Series: MIT Press series in computer systems
Publisher: MIT Press
Published: 1989
Place of publication: Cambridge, Mass
Language: eng
Number of pages: 301
Subjects: Integrated circuits -- Fault tolerance.; Integrated circuits -- Very large scale integration.; Integrated circuits -- Wafer-scale integration.
Other titles: Fault tolerance through reconfiguration in VLSI and WSI arrays.
Notes: Includes bibliographies and indexes.
Cover title: Fault tolerance through reconfiguration in VLSI and WSI arrays.