Boundary-scan interconnect diagnosis
By: by José T. de Sousa and Peter Y.K. Cheung.
Contributors: Cheung, Peter Y. K.
Series: Frontiers in electronic testing
Publisher: Kluwer Academic
Published: 2001
Place of publication: Boston
Language: eng
Number of pages: 168
Subjects: Boundary scan testing; Electronic apparatus and appliances -- Testing; Electronic packaging; Electric contacts -- Testing
Notes: Includes bibliographical references (p. 145-150) and index.