Ion beam surface layer analysis
Subtitle: proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation.
By: Edited by: James W. Mayer and James F. Ziegler.
Contributors: Mayer, James W., 1930- ed.; Ziegler, J. F. ed.; National Science Foundation (U.S.); International Business Machines Corporation.
Publisher: Elsevier Sequoia S.A.
Published: 1974
Place of publication: Lausanne
Language: eng
Number of pages: 463
Subjects: Thin films -- Congresses.
Notes: Includes bibliographical references.
"These proceedings were originally published in Thin solid films."