International Test Conference 1992
Subtitle: proceedings.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers.
Publisher: IEEE Service Center
Published: 1992
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 1012
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.
Other titles: 1992 IEEE International Test Conference.
Notes: On cover and spine: 1992 IEEE International Test Conference.

"IEEE Catalog Number 92-CH3191-4."

"IEEE Computer Society Press Order Number 3167".

Includes bibliographical references.