Proceedings of the ninth Asian Test Symposium
Subtitle: (ATS 2000) : December 4-6, 2000 Taipei, Taiwan
By: sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC) ; co-sponsored by National Cheng-Kung University.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Guo li Chenggong da xue.
Publisher: IEEE Computer Society
Published: 2000
Place of publication: Los Alamitos, California
Language: eng
Number of pages: 495
Subjects: Electronic circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Fault-tolerant computing -- Congresses.
Genres: Congresses.
Other titles: ATS 2000; Ninth Asian Test Symposium
Notes: "IEEE Computer Society Order Number PR00887"--verso of T.p.

Includes bibliographical references and index.