Scanning imaging technology
Subtitle: 2-3 April, 1987, The Hague, The Netherlands
By: Tony Wilson, Ludwig Balk, chairs/editors ; organized by ANRT--Association national de la recherche technique, SPIE--the International Society for Optical Engineering ; cooperating sponsors Comité Belge d'optique ... [et al.].
Contributors: Wilson, Tony.; Balk, Ludwig.; Association nationale de la recherche technique.; Society of Photo-optical Instrumentation Engineers.; Comité belge d'optique.
Series: Proceedings / SPIE ;; v. 809; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 267.
Publisher: SPIE
Published: 1987
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 174
Subjects: Scanning electron microscopy -- Congresses.
Notes: Includes bibliographies and index.