Advanced characterization techniques for optical, semiconductor, and data storage components
Subtitle: 9-11 July 2002, Seattle, Washington, USA
By: Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.].
Contributors: Duparré, Angela.; Singh, Bhanwar.; Society of Photo-optical Instrumentation Engineers.; Boeing Company.
Series: SPIE proceedings series,; v. 4779; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4779.
Publisher: SPIE
Published: 2002
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 192
Subjects: Optical materials -- Congresses.; Semiconductors -- Characterization -- Congresses.; Information storage and retrieval systems -- Congresses.; Metrology -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and author index.