The IEEE International Workshop on Defect and Fault Tolerance in Vlsi Systems: Proceedings 
Subtitle: November 13-15, 1995 Lafayette, Louisiana
Publisher: IEEE Computer Society Press
Published: November 1995
Language: eng
Format: Hardcover
Number of pages: 305
ISBN-13: 9780818671074
Subjects: Electronics & Communications Engineering; Artificial Intelligence - General; Computer Architecture; Very-Large-Scale Integration (Vlsi); Computers - General Information; Science/Mathematics