Developments in integrated circuit testing
By: D.M. Miller, editor.
Contributors: Miller, D. M.
Series: Perspectives in computing ;; vol. 18; Perspectives in computing (Boston, Mass.) ;; vol. 18.
Publisher: Academic Press
Published: 1987
Place of publication: London; San Diego
Language: eng
Number of pages: 440
Subjects: Integrated circuits -- Testing.
Notes: Includes bibliographical references (p. [407]-431).