1999 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft '99): November 1-3, 1999 Albuquerque, New Mexico
Subtitle: Proceedings
Publisher: Institute of Electrical & Electronics Enginee
Published: January 1999
Language: eng
Format: Paperback
Number of pages: 375
ISBN-13: 9780769503257
Subjects: Systems management; Electronic Measurements; Very-Large-Scale Integration (Vlsi); Technology & Engineering; Computers - General Information; Science/Mathematics; General; Electronics - Circuits - VLSI; Engineering - Electrical & Electronic