Testability concepts for digital ICs
Subtitle: the macro test approach
By: by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen.
Contributors: Bennetts, R. G.; Thijssen, A. P.
Series: Frontiers in electronic testing
Publisher: Kluwer Academic Publishers
Published: 1995
Place of publication: Dordrecht; Boston
Language: eng
Number of pages: 212
Subjects: Digital integrated circuits -- Testing; Automatic test equipment
Notes: Includes bibliographical references (p. 197-205).