2nd European Congress on Optics Applied to Metrology (METROP)
Subtitle: presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France
By: editors, Michel Grosmann, Patrick Meyrueis ; organized by European Photonics Association in collaboration with the Society of Photo-optical Instrumentation Engineers.
Contributors: Grosmann, Michel.; Meyrueis, Patrick.; European Photonics Association.; Society of Photo-optical Instrumentation Engineers.; Optics, Photonics, and Iconics Engineering Meeting (1979 : Strasbourg, France)
Series: Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 210; Proceedings of the Society of Photo-optical Instrumentation Engineers ;; v. 210.
Publisher: Society of Photo-optical Instrumentation Engineers
Published: 1980
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 228
Subjects: Optical measurements -- Congresses.; Holographic interferometry -- Congresses.; Speckle metrology -- Congresses.
Notes: Includes bibliographical references and indexes.