1995 Proceedings
Subtitle: Seventh Annual IEEE International Conference on Wafer Scale Integration, San Francisco, California, USA (International Conference on Wafer Scale Integration//Proceedings)
Contributors: Stuart Tweksbury (Editor); Glenn Chapman (Editor)
Publisher: Institute of Electrical & Electronics Enginee
Published: January 1995
Language: eng
Format: Hardcover
Number of pages: 400
ISBN-13: 9780780324664
Subjects: Circuits & components; Integrated Circuits; Science/Mathematics