INSTANT-IGBT network simulation and transient ANalysis tool
By: A.R. Hefner, Jr
Contributors: National Institute of Standards and Technology (U.S.)
Series: Semiconductor measurement technology; NIST special publication -- 400-88; Semiconductor measurement technology; NIST special publication -- 400-88
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1992
Place of publication: Gaithersburg, MD; Washington, DC
Language: eng
Format: Microform
Subjects: Bipolar transistors; Electronic circuit design -- Computer programs
Notes: Distributed to depository libraries in microfiche

Shipping list no.: 93-0007-M

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 2 microfiches : negative