Particle characterization in technology
By: editor, John Keith Beddow.
Contributors: Beddow, John K.
Series: CRC series on fine particle science and technology; Uniscience series on fine particle science and technology
Publisher: CRC Press; Brand: CRC Press
Published: 1984
Place of publication: Boca Raton, Fla
Language: eng
Number of pages: 264
Subjects: Particles.; Bulk solids.; Particle size determination.
Notes: Includes bibliographies and indexes.
Table of contents: title: v. 1. Applications and microanalysis; title: v. 2. Morphological analysis.