Structural pattern analysis
By: editors, Roger Mohr, Theo Pavlidis, Alberto Sanfeliu.
Contributors: Mohr, Roger.; Pavlidis, Theodosios.; Sanfeliu, Alberto; IAPR Technical Committee on Syntactical and Structural Pattern Recognition.
Series: World Scientific series in computer science ;; v. 19
Publisher: World Scientific
Published: 1989
Place of publication: Singapore; New Jersey
Language: eng
Number of pages: 260
Subjects: Pattern recognition systems -- Congresses.
Notes: Includes bibliographical references.
"A selection of papers presented at the workshop organized by the IAPR Technical Committee on Syntactical and Structural Pattern Recognition (Pont-à-Mousson, 1988)"