New horizons in testing
Subtitle: latent trait test theory and computerized adaptive testing
By: edited by David J. Weiss ; contributors, R. Darrell Bock ... [et al.].
Contributors: Weiss, David J.; Bock, R. Darrell.; United States. Office of Naval Research.; Computerized Adaptive Testing Conference (1979 : Wayzata, Minn.)
Publisher: Academic Press
Published: 1983
Place of publication: New York
Language: eng
Number of pages: 345
Subjects: Psychological tests -- Congresses.; Computer adaptive testing.
Notes: Includes bibliographies and indexes.
Derived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al.