A look at techniques for the dimensional calibration of standard microscopic particles
By: Dennis A. Swyt.
Series: Standard reference materials; NBS special publication ; 260-85
Publisher: U.S. Dept. of Commerce, National Bureau of Standards
Published: 1983
Place of publication: Washington, DC
Language: eng
Number of pages: 136
Subjects: Electron microscopy.; Particle size determination.; Calibration.
Notes: Includes bibliographical references (p. 86-98).
"Issued September 1983."