Two- and three-dimensional vision systems for inspection, control, and metrology
Subtitle: 29-30 October 2003, Providence, Rhode Island, USA
By: Bruce G. Batchelor, Heinz Hügli, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Contributors: Batchelor, Bruce G.; Hügli, Heinz.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 5265; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5265.
Publisher: SPIE
Published: 2004
Place of publication: Bellingham, Wash. USA
Language: eng
Number of pages: 214
Subjects: Computer vision -- Congresses.; Imaging systems -- Congresses.; Three-dimensional display systems -- Congresses.; Optical pattern recognition systems -- Congresses.; Quality control -- Optical methods -- Congresses.; Optical measurements -- Congresses.; Metrology -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and author index.