Characterization of High Tc Materials and Devices by Electron Microscopy
Contributors: Nigel D. Browning (Editor); Stephen J. Pennycook (Editor)
Edition: New Ed edition
Publisher: Cambridge University Press
Published: November 23, 2006
Language: eng
Format: Paperback
Number of pages: 406
ISBN-13: 9780521031707
Subjects: Condensed matter physics (liquids & solids); Materials science; Physics; Science; Technology & Industrial Arts; Science/Mathematics; Electron Microscopes & Microscopy; Material Science; Superconductors & Superconductivity; High temperature superconductors High tempera; Science / Physics; Science-Electron Microscopes & Microscopy; Technology / Material Science; Technology-Superconductors & Superconductivity; Electronics - General; Electron microscopy; High temperature superconductors; Technique
First sentence: High-resolution transmission electron microscopy (HRTEM) has been widely and effectively used for analyzing crystal structures and lattice imperfections in various kinds of advanced materials on an atomic scale.