Data acquisition and analysis system for the ion microprobe mass analyzer
By: D. M. Darby, S. S. Cristy, Instrumentation and Characterization Department, Y-12 Development Division.
Contributors: Cristy, S. S.; United States. Dept. of Energy.; Oak Ridge Y-12 Plant.; Oak Ridge Y-12 Plant. Instrumentation and Characterization Dept.
Series: Y ; 2137
Publisher: Dept. of Energy, Oak Ridge Y-12 Plant; for sale by the National Technical Information Service]
Published: 1979
Place of publication: Oak Ridge, Tenn; [Springfield, Va
Language: eng
Number of pages: 53
Subjects: Operating systems (Computers); Computer programs.; Electron probe microanalysis.
Notes: Prepared for the Department of Energy under US Government contract W-7405-eng-26.

Feb. 1979.

Includes bibliographical references.