Yield Simulation for Integrated Circuits
By: by Duncan Moore Henry Walker
Series: The Springer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing -- 33; Springer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing -- 33.
Publisher: Springer US
Published: 1987
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
Number of pages: 209
ISBN-13: 9781441952011; 9781475719314
Subjects: Computer engineering; Computer-aided design; Computer science
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