Segmented testing
By: John P. Robinson.
Contributors: Langley Research Center.; University of Iowa. Electrical and Computer Engineering.
Series: NASA-CR -- 173188.; NASA contractor report -- NASA CR-173188.
Publisher: National Aeronautics and Space Administration
Published: 1984
Place of publication: [Washington, D.C.?
Language: eng
Format: Microform
Subjects: Fault-tolerant computing.; Electronic instruments -- United States -- Testing -- Mathematical models.
Notes: Caption title.

"Supported by NASA Langley Research Center under NAG-195"--P. [i]

"Electrical and Computer Engineering, University of Iowa.

"N84-16855"--Microfiche header.

Includes bibliographical references.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration, 1984]. 1 microfiche ; 11 x 15 cm.