Secondary ion mass spectrometry in the earth sciences
Subtitle: gleaning the big picture from a small spot
By: edited by Mostafa Fayek
Series: Short course series -- v. 41
Publisher: Mineralogical Association of Canada
Published: 2009
Place of publication: Toronto
Language: eng
Number of pages: 150
ISBN-13: 9780921294504
Subjects: Secondary ion mass spectrometry
Notes: "Short course sponsored by the Mineralogical association of Canada and delivered at the 2009 joint assembly of the AGU, GAC< MAC< CGU< and IAH, Toronto, Ontario, 22-23 May, 2009."

Includes bibliographical references.