Manufacturing Yield Evaluation of Vlsi/Wsi Systems
Publisher: Institute of Electrical & Electronics Enginee
Published: December 1995
Language: eng
Format: Paperback
Number of pages: 437
ISBN-13: 9780818662928
Subjects: Circuits & components; Computer architecture & logic design; General Theory of Computing; Reliability Engineering; Very-Large-Scale Integration (Vlsi); Technology; Computers - General Information; Science/Mathematics; Logic Design; Programming - General; Electronics - Circuits - VLSI; Data processing; Design and construction; Integrated circuits; Reliability; Very large scale integration; Wafer-scale integration