Microscopy of semiconducting materials 1991
Subtitle: proceedings of the Institute of Physics conference held at Oxford University, 25-28 March 1991
By: edited by A.G. Cullis and N.J. Long.
Contributors: Cullis, A. G.; Long, N. J.; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.; Royal Microscopical Society (Great Britain); Materials Research Society.
Series: Institute of Physics conference series ;; no. 117
Publisher: Institute of Physics
Published: 1991
Place of publication: Bristol; Philadelphia
Language: eng
Number of pages: 801
Subjects: Semiconductors -- Congresses.; Electron microscopy -- Congresses.; Materials -- Microscopy -- Congresses.; Epitaxy -- Congresses.; Silicon crystals -- Congresses.
Notes: Includes bibliographical references and index.
Sponsored by the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society, and the Materials Research Society.