Testing, reliability, and applications of optoelectronic devices
Subtitle: 24-26 January, 2001, San Jose, [California] USA
By: Aland K. Chin ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Chin, Aland K.
Series: SPIE proceedings series ;; v. 4285; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4285.
Publisher: SPIE
Published: 2001
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 246
Subjects: Optoelectronic devices -- Testing -- Congresses.; Optoelectronic devices -- Reliability -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and author index.