Pattern recognition in practice II
Subtitle: proceedings of an international workshop held in Amsterdam, June 19-21, 1985
By: edited by Edzard S. Gelsema and Laveen N. Kanal.
Contributors: Gelsema, Edzard S., 1937-; Kanal, Laveen N.
Publisher: North-Holland; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co.
Published: 1986
Place of publication: Amsterdam; New York; New York, N.Y., U.S.A
Language: eng
Number of pages: 571
Subjects: Pattern perception -- Congresses.; Image processing -- Congresses.; Depth perception -- Congresses.
Notes: Includes bibliographies and indexes.