Advanced tomographic imaging methods for the analysis of materials
Subtitle: symposium held November 28-30, 1990, Boston, Massachusetts, U.S.A.
By: editors, Jerome L. Ackerman, William A. Ellingson.
Contributors: Ackerman, Jerome L.; Ellingson, W. A.; Materials Research Society.
Series: Materials Research Society symposium proceedings,; v. 217; Materials Research Society symposia proceedings ;; v. 217.
Publisher: Materials Research Society
Published: 1991
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 218
Subjects: Nondestructive testing -- Congresses.; Tomography -- Congresses.; Magnetic resonance imaging -- Congresses.; X-ray microscopy -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and indexes.