Crystal structure of thin oxide films grown on Zr-Nb alloys studied by RHEED
By: by D. Khatamian and S.D. Lalonde.
Contributors: Lalonde, S. D.; Atomic Energy of Canada Limited.; Chalk River Laboratories. Reactor Materials Research Branch.
Series: AECL -- 11275; AECL research (Series) -- 11275
Publisher: Reactor Materials Research Branch, Chalk River Laboratories
Published: 1996
Place of publication: Chalk River, Ont
Language: eng
Number of pages: 13
Subjects: Oxide coating.; Reflection high energy electron diffraction.; Thin films.
Other titles: Structure cristalline de fines pellicules d'oxyde formées sur des alliages Zr-Nb étudiés par la technique RHEED
Notes: "June 1996."--Cover.

At head of cover title: AECL = EACL.

"COG-95-77-1."

"CC2-11275E"

Includes bibliographical references (p. 5-6).

Abstract in English and French.