Electrical behaviour of defects at a thermally oxidized silicon surface
By: by M. V. Whelan.
Series: Philips research reports. Supplements,; 1970 no. 6
Publisher: The Netherlands, Philips Research Laboratories
Published: 1970
Place of publication: [Eindhoven
Language: eng
Number of pages: 93
Subjects: Silicon crystals -- Electric properties.; Silica.; Crystals -- Defects.
Notes: Includes bibliographical references.
Thesis--Technological University, Eindhoven.