High-speed inspection architectures, barcoding, and character recognition
Subtitle: 5-7 November 1990, Boston, Massachusetts
By: Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering.
Contributors: Chen, Michael J. W.; Society of Photo-optical Instrumentation Engineers.; Symposium on Advances in Intelligent Systems (1990 : Boston, Mass.); OE/Boston '90 (1990)
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 1384; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1384.
Publisher: SPIE
Published: 1991
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 355
Subjects: Quality control -- Optical methods -- Automation -- Congresses.; Computer vision -- Congresses.; Automatic test equipment -- Industrial applications -- Congresses.; Optical character recognition devices -- Industrial applications -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.
"Part of a four-conference program on Machine Vision System Integration held at SPIE's Symposium on Advances in Intelligent Systems, a part of OE/Boston '90, 4-9 November 1990, in Boston, Massachusetts"--P. viii.