Structural and chemical analysis of materials
Subtitle: X-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy
By: J.P. Eberhart ; translated by J.P. Eberhart.
Publisher: Wiley
Published: 1991
Place of publication: Chichester, West Sussex, England; New York
Language: eng
Number of pages: 545
Subjects: Materials -- Microscopy.; Microstructure.
Notes: Includes bibliographical references (p. [533]-538) and index.