The Georgia Tech high sensitivity microwave measurement system
By: David R. Deboer and Paul G. Steffes.
Contributors: Steffes, Paul G.; United States. National Aeronautics and Space Administration.
Series: [NASA contractor report] -- CR-205257.; NASA contractor report -- NASA CR-205257.
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1996
Place of publication: [Washington, DC; Springfield, Va
Language: eng
Format: Microform
Subjects: Microwaves.; Planets.; Refractivity.; Planetary atmospheres.; Measuring instruments.; Absorptivity.
Notes: Shipping list no.: 98-0949-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1997] 1 microfiche.