Development of failure-rate models for semiconductor optoelectronic devices
By: Donald B. Ellingham, Jr., William M. Schreyer, Wolfgang W. Gaertner.
Contributors: Schreyer, William M.; Gaertner, Wolfgang W.; United States. Federal Aviation Administration. Systems Research and Development Service.
Series: Report - Federal Aviation Administration, Systems Research and Development Service ; FAA-RD-76-134
Publisher: Dept. of Transportation, Federal Aviation Administration, Systems Research and Development Service; for sale by the National Technical Information Service
Published: 1976
Place of publication: Washington; Springfield, Va
Language: eng
Number of pages: 176
Subjects: Optoelectronic devices.
Notes: Prepared by U.S. Air Force, Rome Air Development Center, under contract DOT/FA 72WAI-356.

Final report; July 1976.