Sistemy tekhnologicheskogo obespechenii͡a︡ kachestva komponentov mikroėlektronnoĭ apparatury
By: V.E. Vlasov, V.P. Zakharov, A.I. Korobov ; pod redakt͡s︡ieĭ A.I. Korobova.
Contributors: Zakharov, V. P.; Korobov, A. I.
Edition: Proizvodstvennoe izd.
Publisher: "Radio i svi͡a︡zʹ"
Published: 1987
Place of publication: Moskva
Language: rus
Number of pages: 156
Subjects: Microelectronics -- Quality control.
Notes: Bibliography: p. 153-156.