Nondestructive evaluation for process control in manufacturing
Subtitle: 3-5 December 1996, Scottsdale, Arizona
By: Richard Bossi, Tom Moran, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by Federal Highway Administration ... [et al.] ; cooperating organizations, U.S. Department of Energy ... [et al.].
Contributors: Bossi, R. H.; Moran, Tom.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2948; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2948.
Publisher: SPIE--The International Society for Optical Engineering
Published: 1996
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 302
Subjects: Process control -- Congresses.; Nondestructive testing -- Congresses.; Detectors -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.