Proceedings
By: IEEE Workshop on Qualitive Vision, June 14, 1993, New York, New York ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.
Contributors: IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.
Publisher: IEEE Computer Society Press
Published: 1993
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 151
Subjects: Computer vision -- Congresses.; Optical pattern recognition -- Congresses.
Other titles: Qualitative vision.
Notes: Includes bibliographical references and index.
"IEEE catalog number 93TH0521-5"--T.p. verso.