Automated inspection and high speed vision architectures
Subtitle: 3-4 November, 1987, Cambridge, Massachusetts
By: Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University ... [et al.].
Contributors: Chen, Michael J. W.; Ahlers, R.-J.; Society of Photo-optical Instrumentation Engineers.; IEEE Industrial Electronics Society.; Keisoku Jidō Seigyo Gakkai (Japan)
Series: Proceedings of SPIE--the International Society for Optical Engineering ;; v. 849
Publisher: SPIE--the International Society for Optical Engineering
Published: 1988
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 274
Subjects: Quality control -- Optical methods -- Automation -- Congresses.; Computer vision -- Congresses.
Notes: Includes bibliographies and index.