IEEE Standard Test Access Port and Boundary-Scan Architecture
Subtitle: Includes Supplement (Includes Ieee Std 1149.1a-1993, Ieee Standard Test Access Port and Boundary-Scan Architecture)
Publisher: Institute of Electrical & Electronics Enginee
Published: October 1993
Language: eng
Format: Paperback
Number of pages: 176
ISBN-13: 9781559373500
Subjects: Electronics & Communications Engineering; General; Computers - General Information