Characterization of defects in materials
Subtitle: symposium held December 1-2, 1986, Boston, Massachusetts, USA
By: editors, Richard W. Siegel, Julia R. Weertman, Robert Sinclair.
Contributors: Siegel, R. W.; Sinclair, Robert.; Weertman, Julia R.
Series: Materials Research Society symposia proceedings ;; v. 82
Publisher: Materials Research Society
Published: 1987
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 532
Subjects: Materials -- Defects -- Congresses.; Crystals -- Defects -- Congresses.
Notes: Includes bibliographies and indexes.