Thinning methodologies for pattern recognition
By: edited by C.Y. Suen, P.S.P. Wang.
Contributors: Suen, Ching Y.; Wang, Patrick S-P.
Series: Series in machine perception and artificial intelligence ;; vol. 8
Publisher: World Scientific
Published: 1994
Place of publication: Singapore; River Edge, NJ
Language: eng
Number of pages: 344
Subjects: Image processing -- Digital techniques.; Optical pattern recognition.; Pattern recognition systems.; Parallel processing (Electronic computers); Algorithms.
Notes: Includes bibliographical references.