The applicability of x-ray diffraction methods of stress measurement to naval structures with an investigation of the stress distribution in a stiffened plate
By: by Melvin W. Brown and William S. Riley
Contributors: Riley, William Steven
Publisher: Massachusetts Institute of Technology
Published: 1949
Language: eng
Subjects: Naval architecture
Notes: Thesis (NE)--Massachusetts Institute of Technology, 1949.

Bibliography: p. 61-62.