Electron and ion microscopy and microanalysis
Subtitle: principles and applications
By: Lawrence E. Murr.
Edition: 2nd ed., rev. and expanded.
Series: Optical engineering ;; 29; Optical engineering (Marcel Dekker, Inc.) ;; v. 29.
Publisher: M. Dekker; CRC Press
Published: 1991
Place of publication: New York
Language: eng
Number of pages: 837
Subjects: Electron microscopy.; Field ion microscopy.; Microprobe analysis.
Notes: Includes bibliographical references and indexes.