Scanning force microscopy
Subtitle: with applications to electric, magnetic, and atomic forces
By: Dror Sarid.
Edition: Rev. ed.
Series: Oxford series in optical and imaging sciences ;; 5
Publisher: Oxford University Press
Published: 1994
Place of publication: New York
Language: eng
Number of pages: 263
Subjects: Scanning force microscopy.; Surfaces (Physics)
Notes: Includes bibliographical references (p. 233-259) and index.