Electron microfractography
Subtitle: a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials.
Contributors: American society for Testing and Materials. Subcommittee II on Fractography.
Series: ASTM special technical publication 453; ASTM special technical publication ;; 453.
Publisher: American Society for Testing and Materials
Published: 1969
Place of publication: Philadelphia
Language: eng
Number of pages: 235
Subjects: Fractography -- Congresses.; Electron microscopy -- Congresses.
Notes: Includes bibliographies.
"Sponsored by Subcommittee II on Fractography of ASTM Committee E-24 on Fracture Testing of Metals."