Forensic psychology and psychiatry
By: edited by Fred Wright, Charles Bahn, and Robert W. Rieber.
Contributors: Wright, Fred.; Bahn, Charles.; Rieber, R. W.; New York Academy of Sciences.; National Institute of Law Enforcement and Criminal Justice.
Series: Annals of the New York Academy of Sciences ; v. 347; Annals of the New York Academy of Sciences ;; v. 347.
Publisher: New York Academy of Sciences
Published: 1980
Place of publication: New York, N.Y
Language: eng
Number of pages: 364
Subjects: Forensic psychology -- Congresses.; Forensic psychiatry -- Congresses.; Forensic psychiatry -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references.
Papers from a symposium held on September 26-28, 1979 by the New York Academy of Sciences and cosponsored by the United States Dept. of Justice, National Institute of Law Enforcement and Criminal Justice.