An Artificial Intelligence Approach to Test Generation
By: by Narinder Singh
Series: The Kluwer International Series in Engineering and Computer Science, Knowledge Representation, Learning and Expert Systems -- 19; Kluwer international series in engineering and computer science -- 19.
Publisher: Springer US
Published: 1987
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
Number of pages: 212
ISBN-13: 9781461291831; 9781461319795
Subjects: Systems engineering; Engineering; Computer-aided design; Computer engineering; Artificial intelligence
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