Dynamic test/analysis correlation using reduced analytical models
By: Paul E. McGowan, A. Filippo Angelucci, and Mehzad Javeed.
Contributors: Angelucci, A. Filippo.; Javeed, Mehzad.; Langley Research Center.
Series: NASA technical memorandum -- 107671.
Publisher: National Aeronautics and Space Administration, Langley Research Center; For sale by the National Technical Information Service
Published: 1992
Place of publication: Hampton, Va; [Springfield, Va
Language: eng
Format: Microform
Subjects: Structural design.
Other titles: Dynamic test analysis correlation using ....
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 93-0304-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1992. 1 microfiche.