Semiconductor memories
Subtitle: technology, testing, and reliability
By: Ashok K. Sharma.
Contributors: IEEE Solid-State Circuits Council.
Publisher: IEEE Press; Institute of Electrical and Electronics Engineers
Published: 1997
Place of publication: Piscataway, N.J; New York
Language: eng
Number of pages: 462
Subjects: Semiconductor storage devices.
Notes: Includes bibliographical references and index.
"IEEE order number: PC3491"--P. [4] cover.
"IEEE Solid-State Circuits Council, sponsor."