Polarization measurement, analysis, and applications V
Subtitle: 8-9 July 2002, Seattle, [Washington] USA
By: Dennis H. Goldstein, David B. Chenault, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.].
Contributors: Goldstein, Dennis H.; Chenault, David B.; Society of Photo-optical Instrumentation Engineers.; Boeing Company.
Series: SPIE proceedings series,; v. 4819; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4819.
Publisher: SPIE
Published: 2002
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 206
Subjects: Polarimetry -- Congresses.; Polarization (Light) -- Measurement -- Congresses.; Optical instruments -- Design and construction -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and author index.