System diagnosis and prognosis: security and condition monitoring issues III
Subtitle: 21 April, 2003, Orlando, Florida, USA
By: Peter K. Willett, Thiagalingam Kirubarajan, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Willett, Peter; Kirubarajan, Thiagalingam.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series -- v. 5107; Proceedings of SPIE--the International Society for Optical Engineering -- v. 5107.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 174
Subjects: Automatic test equipment -- Congresses.; Medical technology -- Congresses.; Electronic systems -- Testing -- Congresses.; System failures (Engineering) -- Congresses.
Genres: Congresses.
Other titles: Component and system diagnostics, prognostics, and health management.
Notes: Previous conferences entitled: Component and systems diagnostics, prognostics, and health management.

Includes bibliographical references and author index.