A simple method of obtaining concentration depth-profiles from X-ray diffraction
By: by K.E. Wiedemann, J. Unnam.
Contributors: Unnam, Jalaiah.; United States. National Aeronautics and Space Administration.
Series: NASA contractor report -- NASA CR-176262.; TMS paper selection -- paper no. F84-15.
Publisher: Metallurgical Society of AIME; National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1984
Place of publication: Warrendale, PA; [Washington, DC; Springfield, Va
Language: eng
Format: Microform
Subjects: Convolution integrals.; Depth measurement.; Diffraction patterns.; Luminous intensity.; X ray diffraction.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1986] 1 microfiche.