Integration of test with design and manufacturing
Subtitle: International Test Conference, 1987 : proceedings, September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C.
By: sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE Computer Society Press
Published: 1987
Place of publication: Washington, D.C
Language: eng
Number of pages: 1151
Subjects: Integrated circuits -- Testing -- Congresses; Semiconductors -- Testing -- Congresses
Other titles: International Test Conference 1987, proceedings.; 1987 IEEE International Test Conference.
Notes: On cover and spine: 1987 IEEE International Test Conference.

Includes bibliographies and index.