Instabilities in MOS devices
By: J. R. Davis.
Series: Electrocomponent science monographs ;; v. 12
Publisher: Gordon and Breach Science Publishers; Routledge
Published: 1981
Place of publication: New York
Language: eng
Number of pages: 175
Subjects: Metal oxide semiconductors.
Notes: Includes bibliographical refererences (p. 151-175) and index.