Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Subtitle: IPFA 2003 : [scheduled, 7 to 11 July, 2003, Singapore]
By: edited by Philip Ho ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in cooperation with Centre for IC Failure Analysis & Reliability, National University of Singapore.
Contributors: Ho, Philip.; IEEE Reliability/CPMT/ED Singapore Chapter.; IEEE Electron Devices Society; IEEE Reliability Society.; National University of Singapore. Centre for IC Failure Analysis and Reliability.
Publisher: IEEE
Published: 2003
Place of publication: Piscataway, New Jersey
Language: eng
Number of pages: 220
Subjects: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing -- Congresses.
Genres: Congresses.
Other titles: IPFA 2003; Physical & failure analysis of integrated circuits
Notes: Also available via the World Wide Web.
Includes bibliographic references and author index.
"IEEE Catalog Number 03TH8662"--T.p. verso.