Knowledge based systems for test and diagnosis
Subtitle: proceedings of the IFIP WG 10.5 International Workshop on Knowledge Based Systems for Test and Diagnosis, Grenoble, France, 27-29 September, 1988
By: edited by G. Saucier, A. Ambler, M.A. Breuer.
Contributors: Saucier, Gabrièle.; Ambler, Tony.; Breuer, Melvin A.
Publisher: North-Holland
Published: 1989
Place of publication: Amsterdam; New York
Language: eng
Number of pages: 257
Subjects: Expert systems (Computer science) -- Congresses.; Testing -- Data processing -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references.