Elektro-optischer Test hochintegrierter CMOS-Schaltungen
By: Joachim Fritz.
Series: Mikroelektronik ;; Bd. 7; Mikroelektronik (Heidelberg, Germany) ;; Bd. 7.
Publisher: Hüthig
Published: 1990
Place of publication: Heidelberg
Language: ger
Number of pages: 228
Subjects: Metal oxide semiconductors, Complementary -- Testing.
Notes: Includes bibliographical references and index.
Originally presented as the author's thesis (doctoral--Universität Duisburg, 1990) under the title: Untersuchung und Einsatz elektro-optischer Effekte zum Test hochintegrierter CMOS-Schaltungen.