Impact of Electron and Scanning Probe Microscopy on Materials
Contributors: David G. Rickerby (Editor); Giovanni Valdrè (Editor); Ugo Valdrè (Editor)
Edition: 1 edition
Publisher: Springer
Published: December 31, 1899
Language: eng
Format: Paperback
Number of pages: 516
ISBN-13: 9780792359401
Subjects: Non-destructive testing; Physics; Chemistry - Physical & Theoretical; Science; Technology & Industrial Arts; Science/Mathematics; Chemistry - Inorganic; Engineering - Electrical & Electronic; Material Science; Technology / Material Science
First sentence: We live, work and play in a world of materials.