Advances in thin film thermocouple durability under high temperature and pressure testing conditions
By: Lisa C. Martin and Gustave C. Fralick, Keith F. Taylor.
Contributors: Fralick, Gustave C.; Taylor, Keith F.; Lewis Research Center.
Series: NASA/TM -- 1999-208812.; NASA technical memorandum -- 208812.
Publisher: National Aeronautics and Space Administration, Lewis Research Center; National Technical Information Service, distributor
Published: 1999
Place of publication: [Cleveland, Ohio]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Thermocouples.; Thin films.; Photolithography.; Durability.
Notes: Shipping list no.: 99-0471-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1999] 1 microfiche.