Optical inspection and testing
Subtitle: proceedings of a conference held 17-18 November 1992, Boston, Massachusetts
By: sponsored by SPIE--The International Society for Optical Engineering ; James D. Trolinger, editor.
Contributors: Trolinger, Jim.; Society of Photo-optical Instrumentation Engineers.
Series: Critical reviews of optical science and technology ;; v. CR46
Publisher: SPIE Optical Engineering Press
Published: 1993
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 276
Subjects: Optical detectors -- Industrial applications -- Congresses.; Quality control -- Optical methods -- Congresses.
Notes: Includes bibliographical references.