NASA flight electronics environmental stress screening survey
By: compiled by Edward J. Marian.
Contributors: Jet Propulsion Laboratory (U.S.)
Series: JPL publication -- 83-76.; NASA CR -- 173472.; NASA contractor report -- NASA CR-173472.
Publisher: National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology
Published: 1983
Place of publication: Pasadena, Calif
Language: eng
Format: Microform
Subjects: Electronics -- Effect of environment on.; Component reliability.; Electronic equipment tests.; Environmental tests.; Spacecraft electronic equipment.; Thermal cycling tests.; Vibration tests.
Notes: Also available via Internet from the NTRS web site. Address as of 11/01/07: http://ntrs.nasa.gov/archive/nasa/casi.ntrs.nasa.gov/19840013934%5F1984013934.pdf  ; current access is available via PURL.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1984. 1 microfiche.