Hyperfine and ion beam interaction studies of Sn, Te, I and Sm impurities in silicon
By: Gerardus Johannes Kemerink
Contributors: Rijksuniversiteit te Groningen
Publisher: [s.n.]
Published: 1981
Place of publication: [s.l.]
Language: eng
Number of pages: 231
Notes: Thesis (doctoral)--Rijksuniversiteit te Groningen, 1981.

Met lit. opg. - Samenvatting in het Nederlands.