Evaluation of Pd-Cr wires for strain gage application
By: Jih-Fen Lei, L.C. Greer III and L.G. Oberle.
Contributors: Greer, L. C.; Oberle, Lawrence G.; United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum -- 106857
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1995
Place of publication: [Washington, DC]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Chromium compounds.; Electrical resistance.; Palladium compounds.; Strain gages.; Strain measurement.; Wire.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 95-0487-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.