Emissivity measurements in thin metallized membrane reflectors used for microwave radiometer sensors
By: L.C. Schroeder ... [et al.].
Contributors: Schroeder, Lyle C.; Langley Research Center.
Series: NASA technical memorandum -- 110179.
Publisher: National Aeronautics and Space Administration, Langley Research Center; National Technical Information Service, distributor
Published: 1995
Place of publication: Hampton, Va; [Springfield, Va
Language: eng
Format: Microform
Subjects: Approximation.; Electromagnetic wave transmission.; Emissivity.; Inflatable structures.; Kapton (Trademark); Materials tests.; Membrane structures.; Metal films.; Microwave radiometers.; Radar reflectors.; Thin films.; Transmission loss.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 96-0033-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.