Thermal resistance measurements on power transistors
By: Sherwin Rubin and Frank F. Oettinger.
Contributors: Oettinger, Frank F., joint author.
Series: Semiconductor measurement technology; NBS special publication ; 400-14; NBS special publication ;; 400-14.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by Supt. of Docs., U.S. Govt. Print. Off.
Published: 1979
Place of publication: Washington
Language: eng
Number of pages: 62
Subjects: Power transistors -- Thermal properties.; Semiconductors -- Junctions.