Testing, Reliability, And Application Of Micro-And Nano-Material Systems III (Proceedings of Spie)
Contributors: Robert E. Geer (Editor); Norbert Meyendor (Editor); George Y. Baaklini (Editor); Bernd Michel (Editor)
Publisher: SPIE-International Society for Optical Engine
Published: May 30, 2005
Language: eng
Format: Paperback
Number of pages: 168
ISBN-13: 9780819457479
Subjects: Nanotechnology; Technology; Technology & Industrial Arts; Science/Mathematics; Electricity; Material Science; Congresses; Electrooptical devices; Materials; Nanostructured materials; Photonics; Testing