Reliability, quality control, and risk assessment
Subtitle: IASTED International Conference, Washington, D.C., USA, October 3-4, 1994
By: editors, H. Pham and M.H. Hamza.
Contributors: Pham, Hoan.; Hamza, M. H.; International Association of Science and Technology for Development.; IEEE Reliability Society.
Publisher: IASTED; ACTA Press
Published: 1994
Place of publication: Anaheim, CA
Language: eng
Number of pages: 135
Subjects: Quality control -- Congresses.; Reliability (Engineering) -- Congresses.; Risk assessment -- Congresses.
Notes: Includes bibliographical references and index.
"Sponsor, the International Association of Science and Technology for Development-IASTED with the cooperation of the IEEE Reliability Society"--P. [2] of cover.