Sideslip-induced static pressure errors in flight-test measurements
By: Edwin K. Parks, Ralph E. Bach, Jr., Duc Tran.
Contributors: Bach, Ralph E.; Trà̂n, Đćư.; Ames Research Center.
Series: NASA technical memorandum -- 102846
Publisher: National Aeronautics and Space Administration, Ames Research Center; For sale by the National Technical Information Service
Published: 1990
Place of publication: Moffett Field, Calif; [Springfield, Va
Language: eng
Format: Microform
Subjects: Aeronautical instruments.; Airplanes -- Flight testing.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1990] 1 microfiche.