Material Characterization Using Ion Beams
By: edited by J. P. Thomas, A. Cachard
Contributors: Cachard, A.
Series: NATO Advanced Study Institutes Series, Series B: Physics, 0258-1221 -- 28; NATO advanced study institutes series -- 28.
Publisher: Springer US; Imprint: Springer
Published: 1978
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
Number of pages: 517
ISBN-13: 9781468408560
Subjects: Physics