Reliability physics 1987
Subtitle: 25th annual proceedings, San Diego, California, April 7, 8, 9, 1987
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers
Published: 1987
Place of publication: New York, N.Y
Language: eng
Format: Microform
Number of pages: 279
Subjects: Electronic apparatus and appliances -- Reliability -- Congresses.; Electronic apparatus and appliances -- Testing -- Congresses.
Genres: Congresses.
Notes: "IEEE catalog no. 87CM2888-7."

Includes bibliographies.

Microfiche. 3 microfiches ; 11 x 15 cm.