Method to determine the quality of sapphire
By: M.T. Duffy ... [et al.] ; RCA Laboratories ; supported by the Defense Advanced Research Projects Agency.
Contributors: Duffy, M. T.
Series: Semiconductor measurement technology; NBS special publication ;; 400-62; NBS special publication ;; 400-62.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1980
Place of publication: Washington
Language: eng
Number of pages: 61
Subjects: Sapphires -- Surfaces -- Testing.; Specular reflectance -- Measurement.
Notes: Includes bibliographical references.
"Issued August 1980."