IEEE International Workshop on Iddq Testing: November 5-6, 1997, Washington, D.C. 
Subtitle: Digest of Papers
Publisher: Institute of Electrical & Electronics Enginee
Published: November 1997
Language: eng
Format: Paperback
Number of pages: 119
ISBN-13: 9780818681233
Subjects: General Theory of Computing; Storage media & peripherals; Digital Computer Hardware; Computers; Technology & Industrial Arts; Science/Mathematics; General; Logic Design; Computer Engineering; Congresses; Iddq testing; Metal oxide semiconductors, Co; Metal oxide semiconductors, Complementary; Testing