Measuring the performance and intelligence of systems
Subtitle: proceedings of the 2000 PerMIS Workshop, August 14-16, 2000
By: edited by A.M. Meystel, E.R. Messina ; co-sponsored by: National Institute of Standards and Technology ... [et al.]
Contributors: Meystel, A.; Messina, E. R; National Institute of Standards and Technology (U.S.)
Series: NIST special publication -- 970
Publisher: The Institute; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 2001
Place of publication: Gaithersburg, Md; Washington, DC
Language: eng
Format: Microform
Number of pages: 658
Subjects: Intelligent control systems -- Congresses; Artificial intelligence -- Congresses
Genres: Congresses
Notes: "September 2001."

Shipping list no.: 2002-0120-M

Includes bibliographical references and index

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002 7 microfiches : negative