Point Defects in Semiconductors II
Subtitle: Experimental Aspects
By: by Jacques Bourgoin, Michel Lannoo
Contributors: Lannoo, Michel
Series: Springer Series in Solid-State Sciences -- 35; Springer series in solid-state sciences -- 35.
Publisher: Springer Berlin Heidelberg
Published: 1983
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] :
Number of pages: 295
ISBN-13: 9783642818349; 9783642818325
Subjects: Crystallography; Physics
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