International Symposium on Nondestructive Characterization of MA
Edition: 1 edition
Publisher: Routledge
Published: January 1992
Language: eng
Format: Paperback
Number of pages: 1037
ISBN-13: 9782881248474
First sentence: Line-focus-beam (LFB) acoustic microscopy with high measurement accuracy, applicable to quantitative characterization of electronic device materials, has been developed and this paper is a brief review of the method and system.