Secondary ion mass spectrometry, SIMS X
Subtitle: proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995
By: editors A. Benninghoven, B. Hagenhoff, H.W. Werner.
Contributors: Benninghoven, A.; Hagenhoff, B.; Werner, H. W.
Publisher: Wiley
Published: 1997
Place of publication: Chichester
Language: eng
Number of pages: 1057
Subjects: Secondary ion mass spectrometry -- Congresses.
Other titles: SIMS X; Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X)