Radiation effects in semiconductors
By: edited by Krzysztof Iniewski
Series: Devices, circuits, and systems; Devices, circuits, and systems
Publisher: CRC Press
Published: 2011
Place of publication: Boca Raton
Language: eng
Number of pages: 415
ISBN-13: 9781439826942
Subjects: Effect of radiation on; Semiconductors; Photon emission
Notes: Includes bibliographical references and index.
Table of contents: title: Radiation damage in silicon / Gianluigi Casse; title: Radiation-tolerant CMOS single-photon imagers for multiradiation detection / Edoardo Charbon ... [et al.]; title: Effects of hydrogen on the radiation response on field-oxide field-effect transistors and high-k dielectrics / Xing J. Zhou, Daniel M. Fleetwood, and Ronald D. Schrimpf; title: Novel total dose and heavy-ion charge collection phenomena in a new SiGe HBT on thin-film SOI technology / Grégory Avenier ... [et al.]; title: Radiation-hard voltage and current references in standard CMOS technologies / Vladimir Gromov and Anne-Johan Annema; title: Nanocrystal memories : an evolutionary approach to flash memory scaling and a class of radiation-tolerant devices / Cosimo Gerardi ... [et al.]; title: Radiation hardened by design SRAM strategies for TID and SEE mitigation / Lawrence T. Clark; title: A complete guide to multiple upsets in SRAMs processed in decananometric CMOS technologies / Gilles Gasiot and Phillippe Roche; title: Real-time soft error rate characterization of advanced SRAMs / Jean-Luc Autran ... [et al.]; title: Fault tolerance techniques and reliability modeling for SRAM-based FPGAs / Keith S. Morgan ... [et al.]; title: Assuring robust triple modular redundancy protected circuits in SRAM-based FPGAs / Michael Caffrey ... [et al.]; title: SEU/SET tolerant phase-locked loops / Robert L. Shuler, Jr.; title: Autonomous detection and characterization of radiation-induced transients in semiconductor integrated circuits / Balaji Narasimham ... [et al.]; title: Soft errors in digital circuits : overview and protection techniques for digital filters / Pedro reviriego Vasallo and Juan Antonio Maestro; title: Fault-injection techniques for dependability analysis : an overview / Massimo Violante.