Reliability and degradation
Subtitle: semiconductor devices and circuits
By: edited by M.J. Howes, D.V. Morgan.
Contributors: Howes, M. J.; Morgan, D. V.
Series: The Wiley series in solid state devices and circuits
Publisher: J. Wiley
Published: 1981
Place of publication: Chichester; New York
Language: eng
Number of pages: 444
Subjects: Semiconductors -- Reliability.
Notes: Includes bibliographical references and index.