EUV, x-ray, and gamma-ray instrumentation for astronomy and atomic physics
Subtitle: 7-11 August 1989, San Diego, California
By: Charles J. Hailey, Oswald H. W. Siegmund, chairs/editors.
Contributors: Hailey, Charles J.; Siegmund, Oswald H. W.; Society of Photo-optical Instrumentation Engineers.; New Mexico State University. Applied Optics Laboratory.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 1159; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1159.
Publisher: SPIE
Published: 1989
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 680
Subjects: Astronomical instruments -- Congresses.; Nuclear counters -- Congresses.; X-ray spectroscopy -- Congresses.; Gamma ray spectrometry -- Congresses.; Ultraviolet spectrometry -- Congresses.; Astronautics in astronomy -- Congresses.
Notes: Includes bibliographical references and index.
Sponsored by SPIE--the International Society for Optical Engineering; cooperating organizations, Applied Optics Laboratory, New Mexico State University, and others.