Dislocations and interfaces in semiconductors
By: edited by Krishna Rajan, J. Narayan, Dieter G. Ast.
Contributors: Rajan, Krishna.; Narayan, J.; Ast, D. G.; Metallurgical Society (U.S.). Meeting; TMS Electronic Device Materials Committee.
Publisher: Metallurgical Society
Published: 1988
Place of publication: Warrendale, Pa
Language: eng
Number of pages: 199
Subjects: Semiconductors -- Defects -- Congresses.
Notes: Includes bibliographical references and indexes.
"Proceedings of a symposium 'Dislocations and Interfaces in Semiconductors' sponsored by the Electronic Device Materials Committee of TMS, held at the 1988 TMS Annual Meeting, Phoenix, Arizona, January 25-26, 1988."