Fizicheskie aspekty nadezhnosti, metody i sredstva diagnostirovanii͡a integralʹnykh skhem
Subtitle: mezhdunarodnai͡a nauchno-tekhnicheskai͡a konferent͡sii͡a, 19-20 mai͡a 1993 g. : tezisy dokladov
By: [redakt͡sionnai͡a kollegii͡a, V.M. Ievlev ... et al.].
Contributors: Ievlev, V. M.; Nauchno-tekhnicheskoe obshchestvo radiotekhniki, ėlektroniki i svi͡azi im. A.S. Popova. Voronezhskoe otdelenie.
Publisher: Voronezhskiĭ politekhn. in-t
Published: 1993
Place of publication: Voronezh
Language: rus
Number of pages: 103
Subjects: Integrated circuits -- Reliability -- Congresses.
Notes: At head of title: Voronezhskoe otdelenie Nauchno-tekhnicheskogo obshchestva radiotekhniki, ėlektroniki i svi͡azi im. A.S. Popova ...