Surface topographical changes measured by phase-locked interferometry
By: James L. Lauer and Simon S. Fung ; prepared for Lewis Research Center
Contributors: Fung, Simon S; United States. National Aeronautics and Space Administration. Scientific and Technical Information Office; Lewis Research Center; Rensselaer Polytechnic Institute
Series: NASA contractor report -- 3757
Publisher: National Aeronautics and Space Administration, Scientific and Technical Information Office; For sale by the National Technical Information Service]
Published: 1984
Place of publication: Washington, D.C; [Springfield, Va
Language: eng
Number of pages: 96
Subjects: Tribology; Interferometers
Notes: "Rensselaer Polytechnic Institute."

Distributed to depository libraries in microfiche

"January 1984"--Cover

STAR category 74

Includes bibliographical references

NAG3-222