Machine vision applications in industrial inspection XIII
Subtitle: 17-18 January 2005, San Jose, California, USA
By: Jeffery R. Price, Fabrice Meriaudeau, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
Contributors: Price, Jeffery Ray, 1970-; Mériaudeau, Fabrice.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of Electronic Imaging Science and Technology.; SPIE,; vol. 5679; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5679.
Publisher: SPIE; IS&T
Published: 2005
Place of publication: Bellingham, Wash; Springfield, Va
Language: eng
Number of pages: 302
Subjects: Engineering inspection -- Automation -- Congresses; Computer vision -- Industrial applications -- Congresses; Quality control -- Automation -- Congresses; Mensuration -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and author index.