A computer-controlled tensile stage for in-situ X-ray measurements
By: L.E. Levine, R.J. Fields
Contributors: Fields, R. J; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 5867
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1997
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 10
Subjects: Metals -- Defects -- Measurement -- Equipment and supplies; Strains and stresses -- Measurement -- Equipment and supplies
Other titles: Computer controlled tensile stage for in situ X-ray measurements
Notes: Shipping list no.: 98-0569-M

"December 1997."

Includes bibliographical references (p. 7)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative