Secondary ion mass spectrometry, SIMS-III
Subtitle: proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981
By: editors, A. Benninghoven ... [et al.].
Contributors: Benninghoven, A.
Series: Springer series in chemical physics -- 19.; Springer series in chemical physics -- v. 19.
Publisher: Springer-Verlag
Published: 1982
Place of publication: Berlin; New York
Language: eng
Number of pages: 444
Subjects: Mass spectrometry -- Congresses.
Notes: "Third International Conference on Secondary Ion Mass Spectroscopy"--Pref.

Includes bibliographical references and index.