Scanning probe microscopies III
Subtitle: 6-7 February 1995, San Jose, California
By: Mehdi Vaez-Iravani, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Vaez-Iravani, Mehdi.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2384; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2384.
Publisher: SPIE
Published: 1995
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 210
Subjects: Scanning probe microscopy -- Congresses.
Other titles: Scanning probe microscopies three.; Scanning probe microscopies 3.
Notes: Includes bibliographical references and index.