Thermographic imaging for high-temperature composite materials
Subtitle: a defect detection study
By: Don J. Roth, James R. Bodis, and Chip Bishop.
Contributors: Bodis, James R.; Bishop, Chip.; United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum -- 106950.
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1995
Place of publication: [Washington, D.C.]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Composite materials.; Fault detection.; Imaging techniques.; Infrared inspection.; Nondestructive tests.; Surface defects.; Thermography.
Other titles: Thermographic imaging for high temperature composite materials.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 96-0245-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.