X-Ray Microscopy II
Subtitle: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987
By: edited by David Sayre, Janos Kirz, Malcolm Howells, Harvey Rarback
Contributors: Kirz, Janos; Howells, Malcolm; Rarback, Harvey
Series: Springer Series in Optical Sciences -- 56; Springer Series in Optical Sciences -- 56.
Publisher: Springer Berlin Heidelberg; Imprint: Springer
Published: 1988
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] :
Number of pages: 455
ISBN-13: 9783540392460
Subjects: Physics; Optics, Optoelectronics, Plasmonics and Optical Devices