Lock-in Thermography
Subtitle: Basics and Use for Functional Diagnostics of Electronic Components (Springer Series in Advanced Microelectronics)
Edition: 1 edition
Publisher: Springer
Published: August 5, 2003
Language: eng
Format: Hardcover
Number of pages: 193
ISBN-13: 9783540434399
Subjects: Applied optics; Materials science; Testing; Physics; Thermography; Electronics - Circuits - General; Technology; Technology & Industrial Arts; Science/Mathematics; Engineering - Electrical & Electronic; General; Technology / Electronics / Microelectronics; Weights & Measures; Thermal properties; Electronic apparatus and appliances; Electronic apparatus and appli; Semiconductors; Science