Convergent Beam Electron Diffraction (Microscopy in Materials Science Series)
Publisher: Taylor & Francis
Published: June 1, 2010
Language: eng
Format: Hardcover
Number of pages: 1100
ISBN-13: 9780750306553
Subjects: Electron Microscopy; Semiconductor Physics; Science; Science/Mathematics; Physics; Science / Physics; Electricity; Electron Microscopes & Microscopy