VLSI Design and Test
Subtitle: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Publisher: Springer
Published: Dec 19, 2013
Format: paperback
Number of pages: 406
ISBN-13: 9783642420252
Notes: Source title: VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings