Lock-in Thermography
Subtitle: Basics and Use for Evaluating Electronic Devices and Materials
Publisher: Springer
Published: Jan 09, 2019
Format: hardcover
Number of pages: 321
ISBN-13: 9783319998244
Notes: Source title: Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)