Tests, measurements, and characterization of electro-optic devices and systems
Subtitle: 8 September 1989, Boston, Massachusetts
By: Shekhar G. Wadekar, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.].
Contributors: Wadekar, Shekhar G.; Society of Photo-optical Instrumentation Engineers.; New Mexico State University. Applied Optics Laboratory.
Series: SPIE proceedings series -- v. 1180; Proceedings of SPIE--the International Society for Optical Engineering -- v. 1180.
Publisher: SPIE--the International Society for Optical Engineering
Published: 1990
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 196
Subjects: Electrooptical devices -- Congresses.; Electrooptics -- Congresses.
Notes: Includes bibliographical references and index.