Proceedings
Subtitle: 2001 IEEE International Workshop on Memory Technology, Design, and Testing : August 6-7, 2001, San Jose, California
By: editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
Contributors: Zorian, Yervant.; IEEE Computer Society.; IEEE Computer Society. Technical Committee on VLSI.; IEEE Computer Society. Technical Council on Test Technology.; IEEE Solid-State Circuits Society.
Publisher: IEEE Computer Society
Published: 2001
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 108
Subjects: Semiconductor storage devices -- Testing -- Congresses.; Random access memory -- Congresses.
Genres: Congresses.
Other titles: Records of the IEEE International Workshop on Memory Technology, Design, and Testing 2000
Notes: Includes bibliographical references and index.
"IEEE Computer Society Order Number PR01242"--T.p. verso.
"... the ninth in a series of annual workshops ..."--P. vii.
Also available via the World Wide Web.