Machine vision systems for inspection and metrology VIII
Subtitle: 21-22 September 1999, Boston, Massachusetts
By: John W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Contributors: Miller, John W. V.; Solomon, Susan Snell.; Batchelor, Bruce G.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE ;; v. 3836; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3836.
Publisher: SPIE
Published: 1999
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 252
Subjects: Computer vision -- Congresses.; Engineering inspection -- Automation -- Congresses.; Optical measurements -- Congresses.; Computer vision -- Industrial applications -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and author index.