Optical pattern recognition XX
Subtitle: 16-17 April 2009, Orlando, Florida, United States
By: David P. Casasent, Tien-Hsin Chao, editors ; sponsored and published by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 7340; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7340.
Publisher: SPIE
Published: 2009
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819476067
Subjects: Optical pattern recognition; Congresses
Other titles: Optical pattern recognition twenty; Optical pattern recognition 20
Notes: Includes bibliographical references and author index.