Oxide Reliability
Subtitle: A Summary of Silicon Oxide Wearout, Breadown, and Reliability (Selected Topics in Electronics and Systems)
Publisher: World Scientific Publishing Company
Published: January 31, 2002
Language: eng
Format: Hardcover
Number of pages: 280
ISBN-13: 9789810248420
Subjects: Materials science; Semi-conductors & super-conductors; Reliability; General; Technology; Technology & Industrial Arts; Science/Mathematics; Electronics - Semiconductors; Engineering - Electrical & Electronic; Material Science; Deterioration; Metal oxide semiconductors; Silicon oxide
First sentence: The metal-oxide-semiconductor (MOS) transistor was invented in 1960 [1, 2].