Proceedings
By: Microelectronics Measurement Technology Seminar, March 17-18, 1981, San Jose, CA; organized and produced by Benwill Publishing Corporation ; director, Susan Chouinard ; coordinator, Art DeSena.
Contributors: Chouinard, Susan.; DeSena, Art.; Benwill Publishing Corporation.
Publisher: Benwill Pub. Corp.
Published: 1981
Place of publication: Boston, MA (1050 Commonwealth Ave., Boston 02215)
Language: eng
Number of pages: 397
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductor industry -- Quality control -- Congresses.
Notes: Includes bibliographical references.