Noncontact Atomic Force Microscopy
Contributors: S. Morita (Editor); R. Wiesendanger (Editor); E. Meyer (Editor)
Edition: 1 edition
Publisher: Springer
Published: September 17, 2002
Language: eng
Format: Hardcover
Number of pages: 439
ISBN-13: 9783540431176
Subjects: Instruments & instrumentation engineering; Microscopy; Nanotechnology; Microscopy In Biology; Science; Technology & Industrial Arts; Science/Mathematics; Solid State Physics; Astronomy - General; Engineering - General; Technology / Nanotechnology; Microscopes & Microscopy; Atomic force microscopy
First sentence: Since the invention of atomic force microscopy (AFM) in 1986 by G.Binnig and coworkers at Stanford University [1|, AFM has rapidly developed into a powerful and invaluable surface analysis technique on micro- and nanoscales and even on atomic and molecular scales.