Distributed testing of a device-level interface specification for a metrology system
By: John Horst ... [et al.]
Contributors: Horst, John.; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6851
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 2002
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 19
Subjects: Computer software -- Testing; Coordinate measuring machines; Metrology
Notes: "January 2002."

Shipping list no.: 2002-0384-M

Includes bibliographical references (p. 19)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002. 1 microfiche : negative.