An International Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense VIII)
Subtitle: September 17-20, 1985, Cambridge, Massachusetts
By: Herbert Kaplan, chairman/editor ; cooperating organizations, American Society for Testing of Materials (ASTM) ... [et al.].
Contributors: Kaplan, Herbert.; American Society for Testing and Materials.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE--the International Society for Optical Engineering -- v. 581.
Publisher: SPIE--the International Society for Optical Engineering
Published: 1986
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 162
Subjects: Thermography -- Congresses.; Infrared technology -- Congresses.; Building -- Testing -- Thermographic methods -- Congresses.; Energy conservation -- Congresses.
Other titles: Thermal infrared sensing for diagnostics and control.; Thermosense VIII.
Notes: Includes bibliographical references and index.