Defect recognition and image processing in semiconductors 1997
Subtitle: proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997
By: edited by J. Donecker and I. Rechneberg.
Contributors: Donecker, J.; Rechenberg, I.
Series: Institute of Physics conference series ;; no. 160
Publisher: Institute of Physics Pub.
Published: 1998
Place of publication: Bristol; Philadelphia
Language: eng
Number of pages: 524
Subjects: Semiconductors -- Defects -- Congresses.; Image processing -- Congresses.
Notes: Includes bibliographical references and indexes.