Fast probing considerations for on-machine inspection of parts
By: Alice V. Ling, Neil D. Wilkin
Contributors: Wilkin, Neil D; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6415
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1999
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 22
Subjects: Probes (Electronic instruments) -- Calibration; Machining -- Computer programs; Machine parts -- Inspection
Other titles: Fast probing considerations for on machine inspection of parts
Notes: Shipping list no.: 2000-0127-M

"October 1999."

Includes bibliographical references (p. 12)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1999] 1 microfiche : negative.