MOS1
Subtitle: a program for two-dimensional analysis of Si MOSFETs
By: Charles L. Wilson and James L. Blue.
Contributors: Blue, J. L.
Series: Semiconductor measurement technology; NBS special publication ;; 400-77
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1985
Place of publication: Gaithersburg, MD; Washington, D.C
Language: eng
Number of pages: 55
Subjects: Metal oxide semiconductor field-effect transistors -- Mathematical models.; Metal oxide semiconductor field-effect transistors -- Data processing.
Notes: Bibliography: p. 38-39.
"Issued April 1985."