Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Subtitle: 8-11 August 2010, Hangzhou, China
By: Jiubin Tan, Xianfang Wen, editors ; sponsored by International Committee on Measurements and Instrumentation ... [et al.] ; organized by International Committee on Measurements and Instrumentation, Instrumentation Committee of CSM (China), Harbin Institute of Technology ; cooperating organizations, China Jiliang University (China), Hefei University of Technology (China), SPIE
Contributors: Tan, J. (Jiubin); Wen, Xianfang; Hefei gong ye da xue; International Committee on Measurements and Instrumentation; SPIE (Society); Ha'erbin gong ye da xue; Zhongguo ji liang ce shi xue hui. Instrumentation Committee; Zhongguo ji liang da xue
Series: Proceedings of SPIE -- v. 7544; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7544.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819479402
Subjects: Optical measurements; Laser interferometers; Physical measurements; Congresses; Measurement
Other titles: International Symposium on Precision Engineering Measurements and Instrumentation
Notes: Includes bibliographical references and author index.