Automated inspection and measurement
Subtitle: 28-30 October 1986, Cambridge, Massachusetts
By: Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.
Contributors: Chen, Michael J. W.; Thibadeau, Robert.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE--the International Society for Optical Engineering ;; v. 730
Publisher: SPIE--the International Society for Optical Engineering
Published: 1987
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 256
Subjects: Engineering inspection -- Automation -- Congresses.; Quality control -- Optical methods -- Congresses.
Notes: Includes bibliographies and index.