Preparation and certification of SRM's for calibration of spreading resistance probes
By: James R. Ehrstein.
Contributors: United States. National Bureau of Standards.
Series: NBS special publication -- 260-93.; Standard reference materials
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1985
Place of publication: [Gaithersburg, MD]; Washington, D.C
Language: eng
Number of pages: 30
Subjects: Electric resistance -- Measurement.; Silicon -- Electric properties.
Notes: Distributed to depository libraries in microfiche.

"Issued January 1985."

Bibliography: p. 21.

Final.

Microfiche. Washington, D.C. : U.S. G.P.O., 1985. 1 microfiche.