Semiconductor Memories
Subtitle: Testing and Reliability
Contributors: Rochit Rajsuman (Editor); Pinaki Mazumder (Editor)
Publisher: Institute of Electrical & Electronics Enginee
Published: May 1998
Language: eng
Format: Paperback
Number of pages: 400
ISBN-13: 9780818677977
Subjects: Circuits & components; Storage media & peripherals; Systems management; Digital Computer Hardware; Semiconductors; Technology; Computers - General Information; Science/Mathematics; Computer Engineering; Electricity; Engineering - Electrical & Electronic; Electronics - Semiconductors