Electromigration in ULSI Interconnections
By: Cher Ming Tan
Series: International series on advances in solid state electronics and technology; International series on advances in solid state electronics and technology
Publisher: World Scientific
Published: 2010
Place of publication: Singapore; Hackensack, NJ
Language: eng
Number of pages: 291
ISBN-13: 9789814273329
Subjects: Integrated circuits; Ultra large scale integration; Electrodiffusion
Notes: Includes bibliographical references and index.