X rays in materials analysis
Subtitle: novel applications and recent developments : 21-22 August 1986, San Diego, California
By: Thomas W. Rusch, chairman/editor ; cooperating organizations, Institute of Optics/University of Rochester ... [et al.].
Contributors: Rusch, Thomas William.; University of Rochester. Institute of Optics.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE--the International Society for Optical Engineering ;; v. 690
Publisher: SPIE--the International Society for Optical Engineering
Published: 1986
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 156
Subjects: Nondestructive testing -- Congresses.; X-ray spectroscopy -- Congresses.; Materials -- Testing -- Congresses.
Genres: Congresses.
Notes: Includes bibliographies and index.