Nondestructive Evaluation and Reliability of Micro and Nanomaterial Systems (Proceedings of SPIE)
Contributors: Norbert Meyendorf (Editor); George Y. Baaklini (Editor); Bernd Michel (Editor)
Publisher: SPIE Society of Photo-Optical Instrumentation Engi; SPIE
Published: June 30, 2002
Format: Paperback
Number of pages: 238
ISBN-13: 9780819444516
Subjects: Electronics engineering; Materials science; Nanotechnology