1997 IEEE International Conference on Microelectronic Test Structures proceedings
Subtitle: March 17-20, 1997, Monterey, California
By: sponsored by the IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: IEEE Service Center
Published: 1997
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 225
Subjects: Integrated circuits -- Testing -- Congresses.; Microelectronics -- Congresses.
Other titles: IEEE International Conference on Microelectronic Test Structures proceedings; International Conference on Microelectronic Test Structures proceedings
Notes: "97CH35914."

"97CB35914"--Spine.

Includes bibliographical references and index.