Defect and impurity engineered semiconductors and devices III
Subtitle: symposium held April 1-5, 2002, San Francisco, California, U.S.A.
By: editors, S. Ashok ... [et al.].
Series: Materials Research Society symposium proceedings -- v. 719; Materials Research Society symposia proceedings -- v. 719.
Publisher: Materials Research Society
Published: 2002
Place of publication: Warrendale, Pa
Language: eng
Number of pages: 493
Subjects: Semiconductors; Congresses; Defects; Impurity distribution
Notes: Includes bibliographical references and indexes.