Nondestructive sensing for food safety, quality, and natural resources
Subtitle: 26-27 October, 2004, Philadelphia, Pennsylvania, USA
By: Yud-Ren Chen, Shu-I Tu, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; technical cosponsor IEICE Communications Society (Japan) ; in cooperation with IEICE Electronics Society (Japan).
Contributors: Chen, Y. R. 1940-; Tu, Shu-I.; Society of Photo-optical Instrumentation Engineers.; IEICE Communications Society (Japan); IEICE Electronics Society (Japan); SPIE Digital Library.
Series: SPIE proceedings series ;; v. 5587; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5587.
Publisher: SPIE
Published: 2004
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 270
Subjects: Nondestructive testing -- Congresses.; Food -- Safety measures -- Congresses.; Food quality -- Nondestructive testing -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and author index.
Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2004. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Also available in print.