Quality aspects in spatial data mining
By: editors, Alfred Stein, John Shi, Wietske Bijker.
Contributors: Stein, Alfred.; Shi, John.; Bijker, Wietske, 1965-
Publisher: Chapman & Hall/CRC
Published: 2008
Place of publication: Boca Raton, FL
Language: eng
ISBN-13: 9781420069266
Subjects: Geographic information systems.; Spatial analysis (Statistics)
Notes: Includes bibliographical references and index.