In-situ electron microscopy at high resolution
By: editor, Florian Banhart.
Contributors: Banhart, Florian.
Publisher: World Scientific
Published: 2008
Place of publication: Hackensack, NJ
Language: eng
Number of pages: 311
ISBN-13: 9789812797339
Subjects: Electron microscopy -- Technique; High resolution electron microscopy
Notes: Includes bibliographical references and index.