Conformance test architecture for biometric data interchange formats
Subtitle: version beta 2.0
By: Fernando L. Podio, Dylan Yaga, Mark Jerde
Contributors: Yaga, Dylan; Jerde, Mark; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 7771; NISTIR -- 7771.
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology
Published: 2011
Place of publication: Gaithersburg, Md.]
Language: eng
Format: [electronic resource] :
Number of pages: 30
Subjects: Biometric identification; Computer programs; Standards; Data processing; Internetworking (Telecommunication)
Notes: Title from title screen (viewed on June 22, 2011).

"February 2011."

Includes bibliographical references (p. 30).