Proceedings of the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Contributors: F. Fantini (Editor); M. Vanzi (Editor); N. D. Stojadinovic (Editor); Michael G. Pecht (Editor)
Publisher: Pergamon Pr
Published: October 1, 2002
Language: eng
Format: Paperback
Number of pages: 596
ISBN-13: 9780080441801
Subjects: Electronic devices & materials; Electronics - Microelectronics; Technology; Science/Mathematics