Beam deflection and scanning technologies
Subtitle: 25 February-1 March, 1991
By: Gerald F. Mashall, Leo Beiser, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, IS&T--the Society for Imaging Science and Technology ; cooperating organizations, Advanced Imaging, Center for Imaging Science/Rochester Institute of Technology, Computer Graphics World.
Contributors: Marshall, Gerald F.; Beiser, Leo.; Society of Photo-optical Instrumentation Engineers.; IS & T--the Society for Imaging Science and Technology.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 1454; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1454.
Publisher: SPIE
Published: 1991
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 465
Subjects: Electrooptical devices -- Congresses.; Scanning systems -- Congresses.; Optical scanners -- Congresses.
Other titles: Computer graphics world
Notes: Includes bibliographical references and index.