Testing's changing role
Subtitle: International Test Conference 1983 proceedings, October 18-20, 1983
By: sponsored by The IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.
Contributors: Institute of Electrical and Electronic Engineers. Philadelphia Section; IEEE Computer Society. Test Technology Committee.
Publisher: IEEE Computer Society
Published: 1983
Place of publication: Los Angeles
Language: eng
Number of pages: 806
Subjects: Integrated circuits -- Testing -- Congresses; Electronic digital computers -- Circuits -- Testing -- Congresses
Notes: "IEEE catalog no. 83CH1933-1."

"Computer Society order no. 502."

Includes bibliographical references and index.