Degradation mechanisms in III-V compound semiconductor devices and structures
Subtitle: symposium held April 17-18, 1990, San Francisco, California, U.S.A.
By: editors, V. Swaminathan, S.J. Pearton, M.O. Manasreh.
Contributors: Swaminathan, V.; Pearton, S. J.; Manasreh, Mahmoud Omar.; Materials Research Society.
Series: Materials Research Society symposium proceedings,; v 184; Materials Research Society symposia proceedings ;; v. 184.
Publisher: Materials Research Society
Published: 1990
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 269
Subjects: Semiconductors -- Reliability -- Congresses.; Semiconductors -- Failures -- Congresses.
Notes: Includes bibliographical references and indexes.