IEEE standard test access port and boundary-scan architecture.
Contributors: IEEE Computer Society. Test Technology Standards Committee.; Institute of Electrical and Electronics Engineers.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1993
Place of publication: New York
Language: eng
Notes: Sponsored by the Test Technology Standards Committee.

At head of title: IEEE Std 1149.1-1990 (Includes IEEE Std 1149.1a-1993).