Diagnostic Techniques for Semiconductor Materials Processing II
Subtitle: Symposium Held November 27-30, 1995, Boston, Massachusetts, U.S.A (Materials Research Society Symposium Proceedings)
Contributors: Stella W. Pang (Editor); Orest J. Glembocki (Editor); Fred H. Pollak (Editor); Francis G. Celii (Editor); Clivia M. Sotomayor Torres (Editor)
Publisher: Materials Research Society
Published: April 1996
Language: eng
Format: Hardcover
Number of pages: 585
ISBN-13: 9781558993099
Subjects: Technology; Testing Of Materials; Science/Mathematics; Semiconductors; Technology & Industrial Arts; Testing; Electronics - Semiconductors; Congresses