Fundamentals of powder diffraction and structural characterization of materials
By: by Vitalij K. Pecharsky, Peter Y. Zavalij.
Contributors: Zavalij, Peter Y.
Publisher: Kluwer Academic Publishers
Published: 2003
Place of publication: Boston
Language: eng
Number of pages: 713
Subjects: X-rays -- Diffraction -- Measurement.; Powders -- Optical properties -- Measurement.; X-ray crystallography.
Notes: Includes bibliographical references and index.