Simultaneous determination of specimen composition and thickness using the transmission electron microscope
Subtitle: proefschrift
By: Gerben Boon
Contributors: Technische Universiteit Eindhoven
Publisher: Technische Universiteit Eindhoven
Published: 2000
Place of publication: Eindhoven
Language: eng
Number of pages: 129
Subjects: Thin films; Transmission electron microscopy
Notes: Vita.

Contains summary in English and Dutch.

Thesis (doctoral)--Technische Universiteit Eindhoven, 2000.

Includes bibliographical references.