Gamma- and x-ray spectrometry with semiconductor detectors
By: Klaus Debertin and Richard G. Helmer.
Contributors: Helmer, Richard G.
Publisher: North-Holland; Sole distributors for the USA and Canada, Elsevier Science Pub. Co.; North Holland
Published: 1988
Place of publication: Amsterdam; New York; New York, NY, USA
Language: eng
Number of pages: 399
Subjects: Gamma ray spectrometry.; X-ray spectroscopy.; Semiconductors.
Notes: Bibliography: p. 369-382.
Includes indexes.