IEEE standard for a mixed-signal test bus
By: Sponsor, Test Technology Technical Committee of the IEEE Computer Society.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers.; IEEE-SA Standards Board.
Series: IEEE Std -- 1149.9-1999.; IEEE std -- 1149.4-1999.
Publisher: Institute of Electrical and Electronics Engineers
Published: 2000
Place of publication: New York, N.Y., USA
Language: eng
Number of pages: 78
Subjects: Printed circuits -- Testing -- Standards; Integrated circuits -- Testing -- Standards
Other titles: Standard for a mixed-signal test bus.
Description: The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.
Notes: "SH94761"--Cover.

"IEEE Std 1149.4-1999."

"Approved 26 June 199, IEEE-SA Standards Board."

"28 March 2000"--Cover.

Includes bibliographical references (p. 5-6).