Semiconductor device and failue analysis
Subtitle: using photon emission microscopy
By: Wai Kin Chim.
Publisher: Wiley
Published: 2000
Place of publication: Chichester, [England]; New York
Language: eng
Number of pages: 269
Subjects: Semiconductors -- Failures; Semiconductors -- Testing; Semiconductors -- Microscopy; Photon emission
Notes: Includes bibliographical references and index.