Characterization of high Tc materials and devices by electron microscopy
By: edited by Nigel D. Browning, Stephen J. Pennycook.
Contributors: Browning, Nigel D.; Pennycook, Stephen J.
Publisher: Cambridge University Press
Published: 2000
Place of publication: Cambridge, UK; New York
Language: eng
Number of pages: 391
Subjects: Electron microscopy -- Technique.; High temperature superconductors.
Notes: Includes bibliographical references.