Modeling minority-carrier lifetime techniques that use transient excess-carrier decay
By: Steven W. Johnston, Gregory M. Berman, and Richard K. Ahrenkiel
Contributors: Berman, Gregory M.; Ahrenkiel, Richard K.; National Renewable Energy Laboratory (U.S.); IEEE Photovoltaic Specialists Conference (33rd : 2008 : San Diego, Calif.)
Series: NREL/PO -- 520-43308; NREL/PO -- 520-43308.
Publisher: National Renewable Energy Laboratory
Published: 2008
Place of publication: Golden, Colo
Language: eng
Format: [electronic resource] /
Subjects: Photovoltaic cells; Research; Solar cells; Excess carriers (Solid state physics)
Notes: Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California.

Title from title screen (viewed on July 16, 2012).