Foundations of statistical inference
Subtitle: proceedings of the Shoresh conference 2000
By: Yoel Haitovsky, Hans Rudolf Lerche, Yaacov Ritov (editors).
Contributors: Haitovsky, Yoel.; Lerche, Hans Rudolf.; Ritov, Yaacov, 1951-
Series: Contributions to statistics,
Publisher: Physica-Verlag
Published: 2003
Place of publication: Heidelberg; New York
Language: eng
Number of pages: 230
Subjects: Mathematical statistics -- Congresses; Stochastic processes -- Congresses
Genres: Congresses.
Description: This volume is a compressed survey containing recent results on statistics of stochastic processes and on identification with incomplete observations. It comprises a collection of papers presented at the Shoresh Conference 2000 on the Foundation of Statistical Inference. The papers cover the following areas with high research activity: - Identification with Incomplete Observations, Data Mining, - Bayesian Methods and Modelling, - Testing, Goodness of Fit and Randomness, - Statistics of Stationary Processes.
Notes: Includes bibliographical references.