Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Edition: New Ed edition
Publisher: Cambridge University Press
Published: August 22, 2005
Language: eng
Format: Paperback
Number of pages: 456
ISBN-13: 9780521017954
Subjects: Materials science; Science; Technology; Science/Mathematics; Material Science; Microscopes & Microscopy; Physics; Materials--Microscopy; Materials--Microscopy Materials--Microscopy; Science / Microscopes & Microscopy; Science-Physics; Technology / Material Science; Technology-Material Science
First sentence: In a conventional TEM, electrons are emitted from an electron gun and focused by the condenser lens as a beam, which illuminates the specimen.