Determination of the density profile at the liquid-vapor interface of cesium using small angle x-ray reflection
By: by Douglas Sluis.
Published: 1983
Language: eng
Format: Microform
Number of pages: 92
Notes: Microfilm. Chicago, Ill. : University of Chicago, Joseph Regenstein Library, Dept. of Photoduplication, 1983. 1 microfilm reel ; 35 mm.
Thesis (Ph. D.)--University of Chicago.