Optical diagnostics for industrial applications
Subtitle: 22-24 May 2000, Glasgow, Scotland, United Kingdom
By: Neil A. Halliwell, chair/editor ; sponsored by EOS--European Optical Society ... [et al.] ; cooperating organizations, IEE--Institute of Electrical Engineers [and] IMechE--the Institution of Mechanical Engineers (UK).
Contributors: Halliwell, Neil A.; Society of Photo-optical Instrumentation Engineers.; European Optical Society.; Institution of Electrical Engineers.; Institution of Mechanical Engineers (Great Britain)
Series: Proceedings EurOpt series; SPIE proceedings series ;; v. 4076; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4076.
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 302
Subjects: Engineering -- Measurement -- Congresses.; Fluid dynamic measurements -- Congresses.; Optical measurements -- Congresses.; Lasers -- Industrial applications -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.