Proceedings, 2009 Testing: Academic and Industrial Conference Practice and Research Techniques
Subtitle: TAIC PART 2009 : 4-6 September 2009 : [Cumberland Lodge], Windsor, United Kingdom
By: [IEEE ; sponsored by LDRA, TechExcel]
Contributors: Institute of Electrical and Electronics Engineers; IEEE Computer Society; TechExcel (Firm); LDRA (Firm)
Publisher: IEEE Computer Society; IEEE
Published: 2009
Place of publication: Los Alamitos, Calif; Piscataway, N.J
Language: eng
Number of pages: 210
ISBN-13: 9780769538204
Subjects: Testing; Congresses; Computer software
Other titles: 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques; Practice and Research Techniques; TAIC PART 2009; Testing: Academic and Industrial Conference Practice and Research Techniques; Testing: Academic and Industrial Conference - Practice and Research Techniques, 2009. TAIC PART '09
Notes: Includes bibliographic references and author index..