Reliable Knowledge Discovery
By: edited by Honghua Dai, James N. K. Liu, Evgueni Smirnov
Contributors: Liu, J. N. K. (James N. K.); Smirnov, Evgueni; SpringerLink (Online service)
Publisher: Springer US
Published: 2012
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
ISBN-13: 9781461419037
Subjects: Pattern perception; Computer graphics; Database management; Optical pattern recognition; Data Storage Representation; Artificial Intelligence (incl. Robotics); Artificial intelligence; Computer science