Physics of failure in electronics
Subtitle: [proceedings]
By: Edited by M. F. Goldberg and Joseph Vaccaro.
Contributors: Goldberg, M. F.; Vaccaro, Joseph.; Rome Air Development Center. Applied Research Laboratory.; IIT Research Institute.
Publisher: Spartan Books
Published: 1963
Place of publication: Baltimore
Language: eng
Number of pages: 255
Subjects: Electronic apparatus and appliances -- Reliability -- Congresses.
Notes: "Sponsored by the Applied Research Laboratory of Rome Air Development Center and the Armour Research Foundation of Illinois Institute of Technology."