Design and analysis of multilayer x-ray/XUV microscope
Subtitle: final report
By: David L. Shealy, principal investigator.
Contributors: United States. National Aeronautics and Space Administration.
Series: NASA-CR-184197; NASA contractor report -- NASA CR-187197.
Publisher: University of Alabama at Birmingham, Dept. of Physics ; [Washington, D.C.; National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1990
Place of publication: Birmingham, AL; Springfield, Va
Language: eng
Format: Microform
Subjects: Extreme ultraviolet radiation.; Image resolution.; Mirrors.; Optical microscopes.; Ultraviolet microscopy.; X rays.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 92-0798-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1991] 1 microfiche.