1991 proceedings, annual Reliability and Maintainability Symposium
Subtitle: Orlando, Florida, USA, 1991 January 29-31.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1991
Place of publication: New York, N.Y., USA (345 E 47th St., New York 10017)
Language: eng
Number of pages: 623
Subjects: Reliability (Engineering) -- Congresses; Maintainability (Engineering) -- Congresses
Genres: Congresses.
Other titles: 1991 Reliability and Maintainability Symposium.; Theme: product assurance--return on investment.; Product assurance--return on investment.; Reliability and Maintainability Symposium, 1991 proceedings, annual.
Notes: "IEEE catalog number 91CH2966-0"--T.p. verso.

Includes bibliographical references and indexes.

Also available via the World Wide Web with additional title: Reliability and Maintainability Symposium, 1991 proceedings, annual.