Three-dimensional imaging, interaction, and measurement
Subtitle: 24-27 January 2011, San Francisco, California, United States
By: J. Angelo Beraldin ... [et al.], editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE
Contributors: IS & T--the Society for Imaging Science and Technology; SPIE (Society); Electronic Imaging Science and Technology Symposium (2011 : San Francisco, Calif.)
Series: Proceedings of SPIE -- v. 7864; Proceedings IS&T/SPIE Electronic Imaging Science and Technology; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7864.
Publisher: SPIE; IS&T
Published: 2011
Place of publication: Bellingham, Wash; Springfield, Va
Language: eng
ISBN-13: 9780819484017
Subjects: Triangulation; Congresses; Lasers; Measurement; Engineering inspection; Three-dimensional display systems
Notes: Includes bibliographical references and index.