Radiation defects in ion implanted and/or high-energy irradiated MOS structures
By: S. Kaschieva and S.N. Dmitriev
Contributors: Dmitriev, S. N., 1961-
Series: Electrical engineering developments series; Electrical engineering developments series
Publisher: Nova Science Publishers
Published: 2010
Place of publication: New York
Language: eng
Number of pages: 195
ISBN-13: 9781608761883
Subjects: Semiconductor doping; Metal oxide semiconductors; Semiconductors; Effect of radiation on; Ion implantation
Notes: Includes bibliographical references and index.