Optical Microstructural Characterization of Semiconductors
Subtitle: Symposium Held November 29-December 30, 1999, Boston, Massachusetts, U.S.A (Materials Research Society Symposium Proceedings)
Contributors: M. Selim Unlu (Editor); Javier Piqueras (Editor); Nader M. Kalkhoran (Editor); Takashi Sekiguchi (Editor)
Publisher: Materials Research Society
Published: April 2000
Language: eng
Format: Hardcover
Number of pages: 333
ISBN-13: 9781558994966
Subjects: Condensed Matter Physics; Semiconductor Physics; Science; Technology & Industrial Arts; Science/Mathematics; Electronics - Semiconductors; Electricity; Physics; Congresses; Microstructure; Semiconductors