Development of test structures for characterization of the fabrication and performance of radiation-hardened CCD imagers
Subtitle: annual report for December 1, 1983 to November 30, 1984
By: S. Ruthbert ... [et al.].
Contributors: Ruthberg, Stanley.; United States. National Bureau of Standards.
Series: NBSIR -- 86-3354R.; NBSIR -- 3354R.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards
Published: 1986
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 70
Subjects: Integrated circuits -- Design and construction.; Radiation hardening.
Notes: "This document has been prepared for the use of the Charles Stark Draper Laboratory, Inc."

"June 1986."

Includes bibliographical references (p. 52-53).

Microfiche. Washington, D.C. : U.S. G.P.O., 1986. 1 microfiche : negative.

UPDATED ON OCLC.