Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California
By: edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI in cooperation with the IEEE Solid State Circuits Council.
Contributors: Rajsuman, Rochit.; Rajkanan, K.; IEEE Computer Society. Test Technology Technical Committee.; IEEE Computer Society. Technical Committee on VLSI.; IEEE Solid-State Circuits Council.
Publisher: IEEE Computer Society Press
Published: 1995
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 129
Subjects: Semiconductor storage devices -- Testing -- Congresses.; Random access memory -- Congresses.
Notes: Includes bibliographical references and index.
"IEEE catalog number 95TH8065"--T.p. verso.