Symposium on advances in electron metallography and electron probe microanalysis sponsored by subcommittee XI on electron microstructure of ASTM Committee E-4 on electron metallography, held at Atlantic City, N.J., June 28, 1960 and June 26, 1961.
Series: ASTM special technical publication -- no. 317.
Publisher: American Society for Testing and Materials
Published: 1962
Place of publication: Philadelphia, PA
Language: eng
Number of pages: 207
Subjects: Metallography.; Electron microscopes.
Notes: 16