Dielectric and conductor-loss characterization and measurements on electronic packaging materials
By: James Baker-Jarvis ... [et al.].
Contributors: Baker-Jarvis, James.; National Institute of Standards and Technology (U.S.)
Series: NIST technical note -- 1520; NIST technical note -- 1520; NIST technical note -- 1520.
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 2001
Place of publication: Boulder, Colo. (325 Broadway, Boulder 80303-3337); Washington, DC
Language: eng
Format: Microform
Number of pages: 152
Subjects: Electronic packaging.; Electronic measurements.
Notes: "July 2001."

Includes bibliographical references (p. 132-150).

Microfiche. [Washington, D.C.] U.S. Govt. Print. Off., [2002]. 2 microfiches : negative.