Microstructural characterization of materials
By: David Brandon and Wayne Kaplan.
Contributors: Kaplan, Wayne D.
Edition: 2nd ed.
Series: Quantitative software engineering series
Publisher: John Wiley
Published: 2008
Place of publication: Chichester, England
Language: eng
ISBN-13: 9780470027844; 9780470027851
Subjects: Materials -- Microscopy; Microstructure
Notes: Includes bibliographical references and index.