Developments in x-ray tomography
Subtitle: 28-29 July 1997, San Diego, California
By: Ulrich Bonse, chair/editor ; sponsored ... by SPIE--The International Society for Optical Engineering.
Contributors: Bonse, U.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series,; v. 3149; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3149.
Publisher: SPIE
Published: 1997
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 266
Subjects: Tomography -- Congresses.; X-rays -- Congresses.; Diagnostic imaging -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.