Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France
By: editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
Contributors: Courtois, B.; Wik, T.; Zorian, Yervant.; IEEE Computer Society.; IEEE Computer Society. Technical Committee on VLSI.; IEEE Computer Society. Technical Council on Test Technology.; IEEE Solid-State Circuits Society.
Publisher: IEEE Computer Society
Published: 2002
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 182
Subjects: Semiconductor storage devices -- Testing -- Congresses.; Random access memory -- Congresses.
Genres: Congresses.
Other titles: Memory technology, design and testing
Notes: Includes bibliographical references and index.
"IEEE Computer Society Order Number PR01617"--T.p. verso.
"... 10th anniversary of the Workshop ..."--P. x.
Also available via the World Wide Web.