Proceedings of the 15th Asian Test Symposium
Subtitle: 20-23 November 2006, Fukuoka, Japan
By: sponsored by IEEE Computer Society Test Technology Council (TTTC).
Contributors: IEEE Computer Society Test Technology Council (TTTC)..
Publisher: IEEE Computer Society
Published: 2006
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 451
ISBN-13: 9780769522357; 9780769526287
Subjects: Electronic digital computers -- Circuits -- Testing -- Congresses; Electronic circuits -- Testing -- Congresses; Fault-tolerant computing -- Congresses
Genres: Congresses
Other titles: 15th Asian Test Symposium; Asian Test Symposium; ATS '06
Notes: "IEEE Computer Society Order Number P2628"--T.p. verso.

Proceedings for 1992- cataloged as a serial in LC.

Includes bibliographical references and author index.