Ion beam surface layer analysis
Subtitle: proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation.  Edited by: James W. Mayer and James F. Ziegler.
Contributors: Mayer, James W., 1930-; Ziegler, James F.; International Business Machines Corporation; National Science Foundation (U.S.)
Publisher: Elsevier Sequoia S.A.
Published: 1974
Place of publication: Lausanne
Language: eng
Number of pages: 463
Subjects: Thin films -- Congresses