Physical aspects of electron microscopy and microbeam analysis
By: edited by Benjamin M. Siegel, Donald R. Beaman.
Contributors: Siegel, Benjamin Morton.; Beaman, Donald R.; Electron Microscopy Society of America. Annual Meeting,; Microbeam Analysis Society of America. National Conference,
Series: A Wiley biomedical-health publication
Publisher: Wiley
Published: 1975
Place of publication: New York (etc.)
Language: eng
Notes: Papers read at the 31st Annual Meeting of the Electron Microscopy Society of America and the 8th National Conference of the Microbeam Analysis Society of America, held jointly onAugust 14-17, 1973 in New Orleans.