Proceedings
By: IEEE Workshop on Visualization and Machine Vision ; June 24, 1994 Seattle, Washington ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence [and] IEEE Computer Society Technical Committee on Computer Graphics.
Contributors: IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.; IEEE Computer Society. Technical Committee on Computer Graphics.
Publisher: IEEE Computer Society Press
Published: 1994
Place of publication: Los Alamitos, CA
Language: eng
Number of pages: 110
Subjects: Computer vision -- Congresses.