Defects in silicon
Subtitle: proceedings of Symposium B on Science and Technology of Defects in Silicon of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989
By: edited by C.A.J. Ammerlaan, A. Chantre, P. Wagner.
Contributors: Ammerlaan, C. A. J.; Chantre, A.; Wagner, P.; European Materials Research Society. Meeting
Series: European Materials Research Society symposia proceedings ;; v. 9
Publisher: North-Holland; Sole distributors for the USA and Canada, Elsevier Science Pub. Co.
Published: 1989
Place of publication: Amsterdam; New York; New York, NY, USA
Language: eng
Number of pages: 505
Subjects: Silicon -- Defects -- Congresses.; Semiconductors -- Defects -- Congresses.
Notes: Includes bibliographical references and indexes.
"Reprinted from Materials science & engineering, vol. B4 (1/4)"--T.p. verso.