Scanning tunneling microscopy/spectroscopy and related techniques
Subtitle: 12th international conference, Eindhoven, the Netherlands
By: editors, P.M. Koenraad, M. Kemerink.
Contributors: Koenraad, P. M.; Kemerink, M.; Technische Hogeschool Eindhoven.
Series: AIP conference proceedings -- v. 696; AIP conference proceedings -- no. 696.
Publisher: American Institute of Physics
Published: 2003
Place of publication: Melville, NY
Language: eng
Number of pages: 179
Subjects: Scanning tunneling microscopy -- Congresses.; Tunneling spectroscopy -- Congresses.
Genres: Congresses.
Other titles: International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques
Notes: Sponsoring organizations, Eindhoven University of Technology ... [et al.].

Includes bibliographical references.