Thin-film and depth-profile analysis
By: edited by H. Oechsner ; with contributions by H.W. Etzkorn ... [et al.].
Contributors: Oechsner, H. 1934-; Etzkorn, H. W.
Series: Topics in current physics ;; 37
Publisher: Springer-Verlag
Published: 1984
Place of publication: Berlin; New York
Language: eng
Subjects: Thin films -- Surfaces.; Surface chemistry.; Sputtering (Physics)
Notes: Includes bibliographical references and index.
Catalogong based on CIP information.