Fifth annual IEEE Semiconductor Thermal and Temperature Measurement Symposium, February 7-9, 1989, Holiday Inn Embarcadero, San Diego, CA, USA.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1989
Place of publication: New York, N.Y
Language: eng
Number of pages: 178
Subjects: Semiconductors -- Thermal properties -- Congresses.; Semiconductors -- Thermal properties -- Bibliography.
Other titles: Semi-therm.
Notes: "Cumulative bibliography of articles on semiconductor thermal and temperature testing, 1989": p. 152-172.

Includes bibliographical references.