Ultrafast Imaging and Spectroscopy
Subtitle: 25-26 August 2013, San Diego, California, United States
By: Zhiwen Liu, editor ; sponsored and published by SPIE
Contributors: Liu, Zhiwen (Professor of Electrical engineering); SPIE (Society)
Series: Proceedings of SPIE -- volume 8845
Publisher: SPIE
Published: 2013
Place of publication: Bellingham, Washington, USA
Language: eng
ISBN-13: 9780819496959
Subjects: Spectrum analysis; Photography, High-speed; Congresses; Microscopy; Imaging systems
Notes: Includes bibliographical references and index.