Determination of deep impurities in silicon and germanium by infrared photoconductivity
By: W. Robert Thurber
Series: NBS technical note -- 570; NBS technical note -- no. 570
Publisher: U.S. National Bureau of Standards; For sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1971
Place of publication: Washington
Language: eng
Number of pages: 12
Subjects: Germanium -- Analysis; Silicon -- Analysis; Photoconductivity
Notes: Bibliography: p. 11-12