Uncertainty in artificial intelligence
By: edited  by Laveen N. Kanal and John F. Lemmer.
Contributors: Kanal, Laveen N.; Lemmer, John F.
Series: Machine intelligence and pattern recognition -- v. 4.
Publisher: North-Holland; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co.
Published: 1986
Place of publication: Amsterdam; New York; New York, N.Y., U.S.A
Language: eng
Number of pages: 509
Subjects: Artificial intelligence.; Uncertainty (Information theory)
Notes: Includes bibliographies.