Surface and Interface Characterization by Electron Optical Methods
Edition: 1 edition
Publisher: Springer
Published: January 1, 1989
Language: eng
Format: Hardcover
Number of pages: 319
ISBN-13: 9780306430862
Subjects: Physics; Solid State Physics; Science / Physics; Surface Physics; Science; Congresses; Electron Microscopy; Surfaces (Physics); Technique; Transmission electron microsco; Transmission electron microscopy; Science/Mathematics
Notes: Nato a S I Series Series B, Physics