Secondary ion mass spectrometry, SIMS-II
Subtitle: proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979
By: editors, A. Benninghoven ... [et al.]. 
Contributors: Benninghoven, A.
Series: Springer series in chemical physics -- 9; Springer series in chemical physics -- v. 9.
Publisher: Springer-Verlag
Published: 1979
Place of publication: New York
Language: eng
Number of pages: 298
Subjects: Secondary ion mass spectrometry -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.