Optical system contamination
Subtitle: effects, measurements, and control 2008 : 13-14 August 2008, San Diego, California, USA
By: Sharon A. Straka, editor ; sponsored and published by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 7069; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7069.
Publisher: SPIE
Published: 2008
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819472892
Notes: Includes bibliographical references and author index.