High resolution electron microscopy of defects in materials
Subtitle: symposium held April 16-18, 1990, San Francisco, California, U.S.A.
By: editors, Robert Sinclair, David J. Smith, Ulrich Dahmen.
Contributors: Sinclair, Robert.; Smith, David J., 1948-; Dahmen, Ulrich.; Materials Research Society.
Series: Materials Research Society symposium proceedings,; v. 183; Materials Research Society symposia proceedings ;; v. 183
Publisher: Materials Research Society; Cambridge University Press
Published: 1990
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 391
Subjects: Materials -- Microscopy -- Congresses.; Materials -- Defects -- Congresses.; High resolution electron microscopy -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and indexes.