Scanning and force microscopies for biomedical applications II
Subtitle: 23-24 January 2000, San Jose, California
By: Shuming Nie, Eiichi Tamiya, Edward S. Yeung, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] IBOS--International Biomedical Optics Society.
Contributors: Tamiya, Eiichi.; Nie, Shuming.; Yeung, Edward S.; Society of Photo-optical Instrumentation Engineers.; International Biomedical Optics Society.
Series: Progress in biomedical optics and imaging ;; v. 1, no. 16; Proceedings of SPIE ;; v. 3922; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3922.
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 246
Subjects: Medical electronics -- Congresses.; Scanning probe microscopy -- Congresses.; Scanning force microscopy -- Congresses.; Nanotechnology -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.