Semiconductor reliability
Subtitle: based on the Conference onReliability of Semiconductor Devices, 1961
By: edited by J.E. Shwop and H.J. Sullivan.
Contributors: Sullivan, H J.; Shwop, John E.; United States. Department of Defense. Working Group on Semiconductor Devices.
Publisher: Engineering Pubs
Published: 1961
Place of publication: Elizabeth (N.J.)
Language: eng
Number of pages: 309
Notes: Sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Department of Defense.