Precision landmark location for machine vision and photogrammetry
Subtitle: finding and achieving the maximum possible accuracy
By: José A. Gutierrez, Brian S.R. Armstrong.
Contributors: Armstrong, Brian Stewart Randall.
Publisher: Springer
Published: 2008
Place of publication: London
Language: eng
Number of pages: 162
ISBN-13: 9781846289125; 9781846289132
Subjects: Computer vision; Photogrammetry -- Digital techniques
Notes: Includes bibliographical references (p. [155]-157) and index.