Scanning tunneling microscopy/spectroscopy and related techniques
Subtitle: 12th International Conference STM'03, Eindhoven, The Netherlands, 21-25 July 2003
By: editors, P.M. Koenraad, M. Kemerink ; sponsoring organizations, Eindhoven University of Technology (TU/e) ... [et al.].
Contributors: Koenraad, P. M.; Kemerink, M.; Technische Universiteit Eindhoven.
Series: AIP conference proceedings -- v. 696.; AIP conference proceedings -- no. 696.
Publisher: American Institute of Physics
Published: 2003
Place of publication: Melville, N.Y
Language: eng
Number of pages: 179
Subjects: Scanning tunneling microscopy -- Congresses; Tunneling spectroscopy -- Congresses; Scanning probe microscopy -- Congresses; Nanotechnology -- Congresses
Genres: Congresses.
Other titles: 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques.; Twelfth International Conference on Scanning Tunneling Micrsoscopy/Scectroscopy and Related Techniques.; STM'03.
Description: "The plenary and invited presentations can be found in the printed part of the proceedings, whereas the CD contains all the accepted publications"--Pref.
Notes: At head of title on cover: Proceedings.

Includes bibliographical references and index.

System requirements for accompanying disc: Computer workstation and CD-ROM drive.