IEEE guide for digital test interchange format (DTIF) application
By: Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.
Contributors: Institute of Electrical and Electronics Engineers.; IEEE Standards Association.; IEEE Standards Board.; IEEE Standards Coordinating Committee 20.
Series: IEEE Std -- 1546-2000.; IEEE std -- 1546-2000.
Publisher: Institute of Electrical and Electronics Engineers
Published: 2001
Place of publication: New York
Language: eng
Number of pages: 32
Subjects: Digital electronics -- Testing -- Standards
Description: "An aid in the understanding and use of digital test interchange format (DTIF) files is provided in this guide. This information will be an aid to users in developing tools such as preprocessors and postprocessors of DTIF data and other utilities."
Notes: "IEEE Std 1546-2000".

"Approved 21 September 2000 IEEE-SA Standards Board".

"23 March 2001"--Cover.

Includes bibliographical references (p. 1).