Data envelopment analysis as a new managerial audit methodology
Subtitle: test and evaluation
By: by H. David Sherman.
Contributors: Sloan School of Management.
Series: Working paper / Alfred P. Sloan School of Management -- 1442-83; Working paper (Sloan School of Management) -- 1442-83.
Publisher: Massachusetts Institute of Technology
Published: 1982
Place of publication: Cambridge, Mass
Language: eng
Number of pages: 25
Subjects: Management science.