Simulation of tip-sample interaction in the atomic force microscope
By: Brian S. Good and Amitava Banerjea.
Contributors: Banerjea, Amitava.; United States. National Aeronautics and Space Administration.
Series: NASA-TM -- 111699.; NASA technical memorandum -- 111699.
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1994
Place of publication: [Washington, D.C; Springfield, Va
Language: eng
Format: Microform
Subjects: Computerized simulation.; Atomic force microscopy.; Interatomic forces.; Crystal surfaces.; Microscopes.
Other titles: Simulation of tip sample interaction in the atomic force microscope.
Notes: Shipping list no.: 98-0791-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1997] 1 microfiche.