Eighth International Congress on X-ray Optics and Microanalysis
By: edited by Donald R. Beaman, Robert E. Ogilvie, and David B. Wittry.
Contributors: Beaman, Donald Robert.; Ogilvie, Robert E.; Wittry, D. B.; Microbeam Analysis Society.
Publisher: Pendell Pub. Co.
Published: 1980
Place of publication: Midland, Mich
Language: eng
Number of pages: 665
Subjects: Microchemistry -- Congresses.; Microradiography -- Congresses.; Probes (Electronic instruments) -- Congresses.; X-rays -- Congresses.
Notes: "Papers presented at the Eighth International Congress on X-ray Optics and Microanalysis, held in Boston, Massachusetts, August 18-24, 1977, and sponsored by the Microbeam Analysis Society."

English or French.

Includes bibliographical references.