Value analysis tear-down
Subtitle: a new process for product development and innovation
By: Yoshihiko Sato and J. Jerry Kaufman.
Contributors: Kaufman, J. Jerry.
Publisher: Industrial Press; Society of Manufacturing Engineers
Published: 2005
Place of publication: New York
Language: eng
Number of pages: 206
Subjects: Value analysis (Cost control); Industrial productivity.; New products.; Engineering economy.
Notes: Includes bibliographical references and index.