Istfa '93
Subtitle: Proceedings of the 19th International Symposium for Testing and Failure Analysis 15-19 November 1993 Los Angeles, California
Publisher: ASM International
Published: July 1994
Language: eng
Format: Paperback
Number of pages: 400
ISBN-13: 9780871704986
Subjects: Electronic devices & materials; Materials science; Material Science; Microelectronics; Technology & Industrial Arts; Science/Mathematics