Counting yields for beta and alpha particle sources
By: Martin J. Berger
Contributors: National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6464
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 2000
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Subjects: Alpha rays; Beta rays
Notes: "January 2000."

Shipping list no.: 2002-0384-M

Includes bibliographical references (p. 14-15)

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002 2 microfiches : negative