IDDQ Testing of VLSI Circuits (Frontiers in Electronic Testing Series)
Contributors: Ravi K. Gulati (Editor); Charles F. Hawkins (Editor)
Edition: 1 edition
Publisher: Springer
Published: December 31, 1992
Language: eng
Format: Hardcover
Number of pages: 128
ISBN-13: 9780792393153
Subjects: Applications of Computing; Circuits & components; Metal oxide semiconductors, Complementary; Iddq testing; Testing; Metal Oxide Semiconductors (Mos); Very-Large-Scale Integration (Vlsi); Computers; Computers - General Information; Metal oxide semiconductors, Co; Computer Books: General; Science/Mathematics; Integrated circuits; CAD-CAM - General; Engineering - Electrical & Electronic; Logic Design; Computers / CAD-CAM / General; Computers / Logic Design; Computers : CAD-CAM - General; Technology : Engineering - Electrical & Electronic; Very large scale integration; Computer Bks - General Information
First sentence: It is natural to be skeptical when someone says it is possible to determine the state-of-health of a complex integrated circuit with a few simple tests.