Systematic errors in power measurements made with a dual six-port ANA
By: Cletus A. Hoer
Contributors: National Institute of Standards and Technology (U.S.)
Series: NIST technical note -- 1332
Publisher: Electromagnetic Fields Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Institute of Standards and Technology
Published: 1989
Place of publication: Boulder, CO
Language: eng
Format: Microform
Subjects: Infrared detectors -- Defects; Microwave detectors -- Defects
Notes: Shipping list no.: 91-2966-M

Microfiche. Washington, DC : U.S. G.P.O., 1991. 1 microfiche : negative.