The Stanford revision and extension of the Binet-Simon scale for measuring intelligence
By: by Lewis M. Terman ... [et al.].
Series: Educational psychology monographs -- no. 18
Publisher: Warwick & York, inc.
Published: 1917
Place of publication: Baltimore
Language: eng
Number of pages: 179
Subjects: Intelligence tests; Stanford-Binet Test
Notes: In a sense a companion volume to The measurement of intelligence, published 1916 -- Pref.

Includes bibliographical references.