Digest of papers
Subtitle: 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA
By: sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE
Published: 1991
Place of publication: New York, NY (345 E. 47th St., New York 10017)
Language: eng
Number of pages: 308
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Other titles: Chip-to-system test concerns for the 90's.
Notes: "IEEE catalog number 91TH0353-3"--T.p. verso.

Includes bibliographical references.