Defect interaction and clustering in semiconductors
By: editor, S. Pizzini.
Contributors: Pizzini, Sergio.
Series: Diffusion and defect data.; v. 85-86
Publisher: Scitec Publications Ltd.
Published: 2002
Place of publication: Uetikon-Zuerich
Language: eng
Number of pages: 418
Subjects: Semiconductors -- Defects.
Notes: Full text available online.
Includes bibliographical references and indexes.