Stress-Induced Phenomena in Metallization
Subtitle: Eighth International Workshop on Stress-Induced Phenomena in Metallization (AIP Conference Proceedings / AIP ... Phenomena Metallizat.)
Contributors: Ehrenfried Zschech (Editor); Karen Maex (Editor); Paul S. Ho (Editor); Hisao Kawasaki (Editor); Tomoji Nakamura (Editor)
Edition: 1 edition
Publisher: American Institute of Physics
Published: February 16, 2006
Language: eng
Format: Hardcover
Number of pages: 383
ISBN-13: 9780735403109
Subjects: Metals technology / metallurgy; Optics; Technology; Science; Science/Mathematics; Physics; Material Science; Electronic materials and devices; Science / Physics; device reliability; materials analysis; stress in solder joints; stress-induced phenomena in Cu/low-k on-chip interconnect structures; technology integration; Metallurgy