Microcircuit screening effectiveness
Subtitle: technical reliability study
By: prepared by Henry C. Rickers.
Contributors: Reliability Analysis Center (U.S.)
Publisher: Reliability Analysis Center
Published: 1978
Place of publication: Griffiss Air Force Base, N.Y
Language: eng
Number of pages: 104
Subjects: Integrated circuits -- Reliability.; Integrated circuits -- Testing.
Notes: Bibliography: p. 95-99.
"Ordering number TRS-1."