Röntgenanalyse
By: von Joachim Urlaub.
Edition: 1. Aufl.
Publisher: Siemens-Aktiengesellschaft
Published: 1974
Place of publication: Berlin; München
Language: ger
Subjects: X-rays.; X-rays -- Industrial applications.
Notes: Bibliography: v. 1, p. 212-215.
Includes index.
Table of contents: title: Bd. 1. Röntgenstrahlen und Detektoren.