Advanced tomographic methods in materials research and engineering
By: edited by John Banhart.
Contributors: Banhart, John, 1958-
Series: Monographs on the physics and chemistry of materials
Publisher: Oxford University Press
Published: 2008
Place of publication: Oxford; New York
Language: eng
Number of pages: 462
ISBN-13: 9780199213245
Subjects: Materials -- Research.; Tomography -- Industrial applications.; Nondestructive testing.
Notes: Includes bibliographical references and index.