System test and diagnosis
By: by William R. Simpson and John W. Sheppard.
Contributors: Sheppard, John W., 1961-
Publisher: Kluwer Academic
Published: 1994
Place of publication: Boston
Language: eng
Number of pages: 382
Subjects: Electronic apparatus and appliances -- Testing; Electronic circuits -- Testing; Fault-tolerant computing; Automatic test equipment
Notes: Includes bibliographical references (p. 361-373) and index.