Eighth International Symposium on Laser Metrology
Subtitle: macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico
By: R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO  TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ...  [et al.] ; published by SPIE--the International Society for Optical Engineering.
Contributors: Rodriguez-Vera, R.; Mendoza-Santoyo, F.; Centro de Investigaciones en Optica (León, Guanajuato, Mexico); International Measurement Confederation. Technical Committee on Measurement of Geometrical Quantities.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE,; v. 5776; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5776.
Publisher: SPIE
Published: 2005
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 852
Subjects: Lasers -- Industrial applications -- Congresses; Laser interferometers -- Congresses; Mensuration -- Congresses; Optical measurements -- Industrial applications -- Congresses
Genres: Congresses.
Other titles: Laser metrology; Macro-, micro, and nano-technologies applied in science, engineering, and industry
Notes: Includes bibliographical references and author index.