Polarimetry and ellipsometry
Subtitle: 20-23 May, 1996, Kazimierz Dolny, Poland
By: Maksymilian Pluta, Tomasz R. Woliński, chairs/editors ; Mariusz Szyjer, co-editor ; organized by, SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland).
Contributors: Pluta, Maksymilian.; Woliński, Tomasz R.; Szyjer, Mariusz.; Society of Photo-optical Instrumentation Engineers. Poland Chapter.; Institute of Applied Optics (Poland); Komitet Badań Naukowych (Poland); Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 3094; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3094.
Publisher: SPIE
Published: 1997
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 374
Subjects: Polarization (Light) -- Congresses.; Polarimetry -- Congresses.; Ellipsometry -- Congresses.
Notes: Includes bibliographical references and index.