ICMTS 95
Subtitle: proceedings of the 1995 International Conference on Microelectronic Test Structures : March 22-25, 1995, Nara, Japan
By: sponsored by the IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: IEEE Service Center
Published: 1995
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 302
Subjects: Integrated circuits -- Testing -- Congresses.
Other titles: 1995 IEEE International Conference on Microelectronic Test Structures
Notes: "IEEE Catalog Number 95CH3480-1."

Includes bibliographical references and index.