Scanning electron microscopy
Subtitle: physics of image formation and microanalysis
By: Ludwig Reimer.
Series: Springer series in optical sciences ;; v. 45
Publisher: Springer-Verlag
Published: 1985
Place of publication: Berlin; New York
Language: eng
Number of pages: 457
Subjects: Scanning electron microscopy.
Notes: Bibliography: p. [405]-446.
Includes index.