Automated optical inspection for industry: theory, technology, and applications II
Subtitle: 16-19 September, 1998, Beijing, China
By: Shenghua Ye, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.].
Contributors: Ye, Shenghua, 1934-; Society of Photo-optical Instrumentation Engineers.; Zhongguo guang xue xue hui.; Chinese Optics & Optoelectronic Manufacturers Association.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 3558; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3558.
Publisher: SPIE
Published: 1998
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 656
Subjects: Engineering inspection -- Automation -- Congresses.; Quality control -- Optical methods -- Automation -- Congresses.; Optical detectors -- Industrial applications -- Congresses.; Optical measurements -- Congresses.
Notes: Includes bibliographical references and author index.