Optical radiation measurement with selected detectors and matched electronic circuits between 200 nm and 20 [mu]m
By: George P. Eppeldauer, editor
Contributors: Eppeldauer, George P; National Institute of Standards and Technology (U.S.)
Series: NIST technical note -- 1438
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 2001
Place of publication: Gaithersburg, Md; Washington, D.C
Language: eng
Format: Microform
Number of pages: 115
Subjects: Optical radiometry -- Instruments
Notes: "April 2001."

Shipping list no.: 2001-0361-M

Includes bibliographical references

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2001 2 microfiches : negative