Optically based methods for process analysis
Subtitle: 23-26 March 1992, Somerset, New Jersey
By: David S. Bomse ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, Fiber Optics Materials Research Program/Rutgers University, New Jersey Commission on Science and Technology.
Contributors: Bomse, David S.; Society of Photo-optical Instrumentation Engineers.; Rutgers University. Fiber Optics Materials Research Program.; New Jersey. Commission on Science and Technology.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 1681; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1681.
Publisher: SPIE
Published: 1992
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 384
Subjects: Chemical process control -- Congresses.; Spectrum analysis -- Congresses.
Notes: Includes bibliographical references and index.