Ultraviolet and X-ray detection, spectroscopy, and polarimetry III
Subtitle: 19-20 July 1999, Denver, Colorado
By: Silvano Fineschi, Bruce E. Woodgate, Randy A. Kimble, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Contributors: Fineschi, Silvano.; Woodgate, Bruce.; Kimble, Randy Alan.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series,; v. 3764; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3764.
Publisher: SPIE
Published: 1999
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 288
Subjects: Polarimetry -- Congresses.; X-ray astronomy -- Instruments -- Congresses.; Ultraviolet astronomy -- Instruments -- Congresses.; Ultraviolet detectors -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.