LSI & boards
Subtitle: digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey
By: sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE.
Contributors: IEEE Computer Society. Test Technology Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: Institute of Electrical and Electronics Engineers; available from IEEE Computer Society Publications Office
Published: 1979
Place of publication: New York, N.Y; Long Beach, Calif
Language: eng
Number of pages: 382
Subjects: Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Large scale integration -- Congresses.; Printed circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references.
"79CH1509-9C."