Curriculum for test technology
Subtitle: M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983
By: IEEE Computer Society Test Technology Committee.
Contributors: IEEE Computer Society. Test Technology Committee.; IEEE Computer Society.; Curriculum for Test Technology Workshop (1983 : University of Minnesota, Minneapolis)
Publisher: IEEE Computer Society Press; Order from IEEE Computer Society
Published: 1983
Place of publication: Silver Spring, MD; Los Angeles, CA
Language: eng
Number of pages: 173
Subjects: Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Testing -- Study and teaching -- Congresses.
Other titles: Test technology.
Notes: Includes bibliographies and index.
Proceedings of the Curriculum for Test Technology Workshop.
"[Sponsored by] the Institute of Electrical and Electronics Engineers, Inc., IEEE Computer Society."
"IEEE catalog number 83CH1978-6."
"IEEE Computer Society order number 520."