Embedded digital system reliability and safety analyses
By: prepared by L.M. Kaufman, B.W. Johnson
Contributors: Johnson, B. W; U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering Technology; University of Virginia. Center for Safety-Critical Systems
Series: NUREG/GR -- 0020
Publisher: Division of Engineering Technology, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission
Published: 2001
Place of publication: Washington, DC
Language: eng
Format: Microform
Number of pages: 75
Subjects: Digital control systems -- Reliability; Nuclear power plants -- Instruments -- Reliability; Nuclear power plants -- Instruments -- Safety measures
Notes: "University of Virginia, Department of Electrical Engineering, Center for Safety-Critical Systems."

"Date published: February 2001."

Paper version no longer available for sale by the Supt. of Docs

Shipping list no.: 2001-0340-M

Includes bibliographical references (p. 68-73)

Technical

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [2001] 1 microfiche : negative.

K6907