Impact of electron and scanning probe microscopy on materials research
By: edited by David G. Rickerby, Giovanni, Valdrè, Ugo Valdrè.
Contributors: Rickerby, David.G.; Valdrè, Giovanni.; Valdrè, U.
Series: NATO science series -- no. 364
Publisher: Kluwer Academic Publishers
Published: 1999
Place of publication: Dordrecht; Boston
Language: eng
Number of pages: 489
Subjects: Materials -- Microscopy.; Electron microscopy.; Scanning probe microscopy.
Notes: Includes bibliographical references and index.