Design and testing guides for the CMOS and lateral bipolar-on-SOI test library
By: Janet C. Marshall and Mona E. Zaghloul.
Contributors: Zaghloul, M. E.
Series: Semiconductor measurement technology; NIST special publication ;; 400-93
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1994
Place of publication: Gaithersburg, Md; Washington, D.C
Language: eng
Number of pages: 132
Subjects: Integrated circuits -- Very large scale integration -- Computer-aided design.; Metal oxide semiconductors -- Testing.; Silicon-on-insulator technology.
Notes: Includes bibliographical references (p. 17-18).
"Issued September 1994."