Defect Recognition and Image Processing in Semiconductors 1995
Subtitle: Proceedings of the Sixth International Conference held in Boulder, Colorado, 3-6 December 1995 (Institute of Physics Conference Series)
Publisher: Taylor & Francis
Published: May 30, 1996
Language: eng
Format: Hardcover
Number of pages: 369
ISBN-13: 9780750303729
Subjects: Condensed matter physics (liquids & solids); Semi-conductors & super-conductors; Image processing; Image Processing (Engineering); Semiconductors; Technology; Science; Science/Mathematics; Electronics - Semiconductors; Engineering - Electrical & Electronic; General; Science / Solid State Physics; Congresses; Defects