Author: V. V. Estrela
Alternate names: Vania Vieira Estrela; Vania V. Estrela; V. Vieira Estrela
Bio: B.Sc. degree from Federal University of Rio de Janeiro (UFRJ) in Electrical and Computer Engineering (ECE);  M.Sc.  from the Instituto Tecnológico de Aeronáutica (ITA), Sao Jose dos Campos;  M.Sc. degree in ECE at Northwestern University, Evanston, Illinois (IL), USA; and Ph.D.  in ECE from the Illinois Institute of Technology (IIT), Chicago, IL, USA. Taught at: DeVry University;  DePaul University;  Universidade Estadual do Norte Fluminense (UENF), Campos de Goytacazes, Rio de Janeiro (RJ), Brazil; and for the Universidade Estadual da Zona Oeste (UEZO), Rio de Janeiro, RJ, Brazil. Visiting professor at the Polytechnic Institute of Rio de Janeiro (IPRJ)/State University of Rio de Janeiro (UERJ) in Nova Friburgo, RJ. Currently working at Universidade Federal Fluminense (UFF), Niterói, RJ for the Department of Telecommunications. Research interests include signal/image/video processing, inverse problems, computational & mathematical modeling, stochastic models, multimedia, electronic instrumentation, machine learning and remote sensing. Reviewer for the following journals/magazines: IMAVIS (Elsevier); Pattern Recognition (Elsevier); COMPELECENG (Elsevier); ELCVIA;  IET Image Processing; EURASIP Journal on Advances in Signal Processing (JASP) (Springer); International Journal on Computational Science & Applications (IJCSA); Oriental Journal of Computer Science and Technology (OJCST); International Journal  of Ambient Computing and Intelligence (IJACI); and International Journal of Image Processing  (IJIP). Engaged in topics such as technology transfer, STEM education, environmental issues and digital inclusion. Member of IEEE and IASTED. Editor of IJACI,  EURASIP JASP,  IJCSA, IJIP and OJCST.