Test wafer for thick-film resistor production
date: label: date made
content: ca. 1965-68
notes: label: Location
content: Currently not on view
setName: label: See more items in
content: Work and Industry: Electricity
creditLine: label: Credit Line
content: from Alan W. Postelthwaite
dataSource: label: Data Source
content: National Museum of American History
identifier: label: ID Number
content: 1995.0118.03
label: accession number
content: 1995.0118
label: catalog number
content: 1995.0118.03
objectType: label: Object Name
content: Wafer
label: Object Name
content: Test Wafer
physicalDescription: label: Measurements
content: overall: 1 1/2 in x 1/2 in x 1 mm; 3.81 cm x 1.27 cm x 1/16 in