14710 Failure Analysis Seminar, Palo Alto, CA
name: label: Collection Creator
content: Integrated Circuit Engineering Corporation.
setName: label: See more items in
content: I.C.E. Integrated Circuit Collection
label: See more items in
content: I.C.E. Integrated Circuit Collection / Series 16: Project Files / 16.1: Project Files (arranged by project number)
container: label: Container
content: Box 165
dataSource: label: Archival Repository
content: Archives Center, National Museum of American History
objectType: label: Type
content: Archival materials