Data Line Card Bench Test
name: label: Collection Creator
content: National Museum of American History (U.S.). Division of Information, Technology and Society
label: Collection Creator
content: GTE Laboratories Inc.
setName: label: See more items in
content: GTE Burst Switch Collection
label: See more items in
content: GTE Burst Switch Collection / Series 4: Testing Materials
unitdate: label: Date
content: 1986
container: label: Container
content: Box 2
dataSource: label: Archival Repository
content: Archives Center, National Museum of American History
objectType: label: Type
content: Archival materials