Faulhaber, Mark Edwin and Smith, Jr., Edmund Haislett. Defect identification with normalizing of gain function in optical-electrical inspection.
odd: label: General
content: U. S. Patent 4,005,281, filed May 14, 1975, and issued January 25, 1977.
name: label: Collection Creator
content: Gerber, H. Joseph, 1924-1996
label: Collection Creator
content: Gerber Scientific Instrument Company (Hartford, Conn.).
setName: label: See more items in
content: Gerber Scientific Instrument Company Records
label: See more items in
content: Gerber Scientific Instrument Company Records / Series 3: Engineering Department Records / 3.2: Dave Logan's Engineering Files
unitdate: label: Date
content: 1975 - 1977
container: label: Container
content: Box 17, Folder 10
dataSource: label: Archival Repository
content: Archives Center, National Museum of American History
objectType: label: Type
content: Archival materials