Product Analysis (about 50 out of 68)
name: label: Collection Creator
content: Integrated Circuit Engineering Corporation.
setName: label: See more items in
content: I.C.E. Integrated Circuit Collection
unitdate: label: Date
content: 1966 - 1971
dataSource: label: Archival Repository
content: Archives Center, National Museum of American History
identifier: label: Identifier
content: NMAH.AC.0600, Series 2
objectType: label: Type
content: Archival materials
scopecontent: label: Scope and Contents note
content: This series contains illustrated reports that are aimed at the IC users who need reliable information on component quality for part qualification purposes, and IC manufacturers who need to stay abreast of competitive technologies being offered. The reports are very detailed and include scanning electron micrographs, x-rays, figures, tables, and historgram. A sampling of six reports a year from ICE's growing list (as of 1996, over 500 reports). The reports are aimed at IC users who need reliable information on component quality for part qualification purposes, and IC manufacturers who need to stay abreast of competitive technologies.