February 1978
name: label: Collection Creator
content: Integrated Circuit Engineering Corporation.
setName: label: See more items in
content: I.C.E. Integrated Circuit Collection
label: See more items in
content: I.C.E. Integrated Circuit Collection / Series 10: Government/Military
container: label: Container
content: Box 1 (Series 10)
dataSource: label: Archival Repository
content: Archives Center, National Museum of American History
objectType: label: Type
content: Archival materials
scopecontent: label: Scope and Contents note
content: Contents: RADC Product Evaluation Report- PE 68 Device Quality Determination of JANSMH54L93F1; Texas Instruments