1985 Issue 5-5: Overview of Yield Projection Techniques
name: label: Collection Creator
content: Integrated Circuit Engineering Corporation.
setName: label: See more items in
content: I.C.E. Integrated Circuit Collection
label: See more items in
content: I.C.E. Integrated Circuit Collection / Series 9: ICECAP Reports
container: label: Container
content: Box 3 (Series 9), Folder 5
dataSource: label: Archival Repository
content: Archives Center, National Museum of American History
objectType: label: Type
content: Archival materials