The Burn In Test has established itself in the semiconductor industry to test assemblies, such as ICs, for their expected lifetime. This type of validation is not only used in the semiconductor industry, but also at the electronics industry level. According to the scientist Arrhenius, there is a correlation or rather a formula, according to which the calendrical aging depends on the temperature. In rough terms, the higher the temperature, the faster the aging.   If a test sample is operated at a high temperature, it is therefore possible to conclude after a shorter period of time what the service life will be under normal conditions. This is the purpose of the burn-in test. It is in the interest of the developer to be able to assess the service life as early as possible in the development cycle. However, the temperature of an aging test cannot be set arbitrarily high, as other destructive effects occur above certain temperatures depending on the test sample.