The proposed framework can be extended to handle sequential circuits by incorporating state elements such as flip-flops and latches into the netlist representation. This would involve modeling the timing behavior of sequential elements and their interactions with the combinational logic in the circuit. Additionally, the framework can be enhanced to address other types of reliability degradations beyond process variations, such as aging effects and temperature variations. This would require incorporating models for these degradation mechanisms into the delay estimation and approximation algorithms, allowing for a more comprehensive analysis of circuit reliability.