A soft error that causes the component to reset, lock-up, or otherwise malfunction. SEFI typically occur in complex devices with built-in state/control sections like in modern memories (SDRAM, DRAM, NOR- and NAND-Flash, etc.), all types of processors, FPGA or ASICs, or mixed-signal devices. Two main types of SEFI are distinguished depending on the actions required to restore operability: reset by software or by power cycling. The stored data may or may not be lost. Typically, a particle fluence of 1E7 ions/cm2 is used for SEFI testing.