Lumetrics, Inc. was granted U.S. Patent No. 10,761,021 for "Apparatus And Method for Measurement of Multilayer Structures" on September 1, 2020. The patent covers methods of determining the number of layers in a complex thin-film structure, measuring the thicknesses of the individual layers, and identifying the material composition of the layers. Congratulations to Lumetrics on their new technology and patent!