A controller for event input device testing, comprising: a memory ; and a processor configured to execute executable instructions stored in the memory to: cause a first event input device of a group (105-1, 105-2) of event input devices to perform an automated test process according to a predetermined test sequence defining a pre-determined testing order of event input devices included in the group (105-1, 105-2) of event input devices ; determine whether any remaining event input device of the group (105-1, 105-2) of event input devices has detected a hazard event while the first event input device is performing the automated test process; cause, according to the predetermined test sequence, the second event input device to perform an automated test process in response to: the first event input device passing its automated test process; and determining the second event input device has not detected a hazard event during the automated test process of the first event input device ; and determine whether the first event input device has detected a hazard event while the second event input device is performing the automated test process. a memory ; and a processor configured to execute executable instructions stored in the memory to: cause a first event input device of a group (105-1, 105-2) of event input devices to perform an automated test process according to a predetermined test sequence defining a pre-determined testing order of event input devices included in the group (105-1, 105-2) of event input devices ; determine whether any remaining event input device of the group (105-1, 105-2) of event input devices has detected a hazard event while the first event input device is performing the automated test process; cause, according to the predetermined test sequence, the second event input device to perform an automated test process in response to: the first event input device passing its automated test process; and determining the second event input device has not detected a hazard event during the automated test process of the first event input device ; and determine whether the first event input device has detected a hazard event while the second event input device is performing the automated test process. cause a first event input device of a group (105-1, 105-2) of event input devices to perform an automated test process according to a predetermined test sequence defining a pre-determined testing order of event input devices included in the group (105-1, 105-2) of event input devices ; determine whether any remaining event input device of the group (105-1, 105-2) of event input devices has detected a hazard event while the first event input device is performing the automated test process; cause, according to the predetermined test sequence, the second event input device to perform an automated test process in response to: the first event input device passing its automated test process; and determining the second event input device has not detected a hazard event during the automated test process of the first event input device ; and the first event input device passing its automated test process; and determining the second event input device has not detected a hazard event during the automated test process of the first event input device ; and determine whether the first event input device has detected a hazard event while the second event input device is performing the automated test process. <EOS>