A method for high-resolution scanning microscopy of a sample (P), wherein - the sample (P) is illuminated with illumination radiation in such a way that the illumination radiation (B) is focused to a point in or on the sample (P) to form a diffraction-limited illumination spot , - the point is imaged in diffraction-limited fashion into a diffraction image onto a 2D detector having pixels , wherein, owing to its pixels , the 2D detector has a spatial resolution that resolves a diffraction structure of the diffraction image , - the point is displaced relative to the sample (P) into different scanning positions with an increment less than the diameter of the illumination spot , - the 2D detector is read, and an image of the sample (P) is generated from the data of the 2D detector and from the scanning positions assigned to said data, said image having a resolution that is increased beyond a resolution limit for imaging, characterized in that - the pixels of the 2D detector are divided into groups , which include a central group located on an optical axis and a further group that surrounds the central group in ring-shaped fashion, and - a pre-processed raw image is calculated for each group , - the pre-processed raw images are combined and deconvoluted to generate the image of the sample (P), - wherein -- the pre-processed raw images are calculated by a two-dimensional deconvolution being carried out for each group , and/or -- relative displacements of raw image signals contained in the data are calculated, the raw image signals are compensated with respect to displacement and the compensated raw image signals belonging to the same group are added to calculate a pre-processed raw image for this group. - the sample (P) is illuminated with illumination radiation in such a way that the illumination radiation (B) is focused to a point in or on the sample (P) to form a diffraction-limited illumination spot , - the point is imaged in diffraction-limited fashion into a diffraction image onto a 2D detector having pixels , wherein, owing to its pixels , the 2D detector has a spatial resolution that resolves a diffraction structure of the diffraction image , - the point is displaced relative to the sample (P) into different scanning positions with an increment less than the diameter of the illumination spot , - the 2D detector is read, and an image of the sample (P) is generated from the data of the 2D detector and from the scanning positions assigned to said data, said image having a resolution that is increased beyond a resolution limit for imaging, - the pixels of the 2D detector are divided into groups , which include a central group located on an optical axis and a further group that surrounds the central group in ring-shaped fashion, and - a pre-processed raw image is calculated for each group , - the pre-processed raw images are combined and deconvoluted to generate the image of the sample (P), - wherein -- the pre-processed raw images are calculated by a two-dimensional deconvolution being carried out for each group , and/or -- relative displacements of raw image signals contained in the data are calculated, the raw image signals are compensated with respect to displacement and the compensated raw image signals belonging to the same group are added to calculate a pre-processed raw image for this group. -- the pre-processed raw images are calculated by a two-dimensional deconvolution being carried out for each group , and/or -- relative displacements of raw image signals contained in the data are calculated, the raw image signals are compensated with respect to displacement and the compensated raw image signals belonging to the same group are added to calculate a pre-processed raw image for this group. <EOS>