A measurement system, including: a plurality of reflective targets; a measurement device, the measurement device including: a light director and a spatial light modulator , wherein the light director is disposed to direct wavelength swept light to the spatial light modulator and the spatial light modulator is disposed to receive light from the light director and to modulate it to form an intensity pattern; an optical element disposed to receive light which formed the intensity pattern and arranged to magnify the intensity pattern into a measurement space; and a detector in the form of a detector photodiode disposed to detect light reflected from the measurement space; wherein the light director is configured to direct light returned from the measurement space to the detector, the returned light including light from a distinct measurement path for each reflective target; wherein the light director is configured to direct to the detector light from a reference path which interferes with light from each of the measurement paths, creating an interference signal; wherein the measurement system is configured to measure distance using the Fourier transform of values acquired from the detector. a plurality of reflective targets; a measurement device, the measurement device including: a light director and a spatial light modulator , wherein the light director is disposed to direct wavelength swept light to the spatial light modulator and the spatial light modulator is disposed to receive light from the light director and to modulate it to form an intensity pattern; an optical element disposed to receive light which formed the intensity pattern and arranged to magnify the intensity pattern into a measurement space; and a detector in the form of a detector photodiode disposed to detect light reflected from the measurement space; wherein the light director is configured to direct light returned from the measurement space to the detector, the returned light including light from a distinct measurement path for each reflective target; wherein the light director is configured to direct to the detector light from a reference path which interferes with light from each of the measurement paths, creating an interference signal; wherein the measurement system is configured to measure distance using the Fourier transform of values acquired from the detector. a light director and a spatial light modulator , wherein the light director is disposed to direct wavelength swept light to the spatial light modulator and the spatial light modulator is disposed to receive light from the light director and to modulate it to form an intensity pattern; an optical element disposed to receive light which formed the intensity pattern and arranged to magnify the intensity pattern into a measurement space; and a detector in the form of a detector photodiode disposed to detect light reflected from the measurement space; wherein the light director is configured to direct light returned from the measurement space to the detector, the returned light including light from a distinct measurement path for each reflective target; wherein the light director is configured to direct to the detector light from a reference path which interferes with light from each of the measurement paths, creating an interference signal; wherein the measurement system is configured to measure distance using the Fourier transform of values acquired from the detector. <EOS>