A method for measuring a sample property (X) by means of a photonic circuit , the method comprising - applying input light (Li) into the photonic circuit and measuring output light (Lo) out of the photonic circuit ; - wherein the photonic circuit comprises at least two photonic sensors configured to interferometrically modulate the output light (Lo) with respect to the input light (Li) according to a respective output signal (S 1 ,S 2 ); - wherein respective signal values (V 1 ,V 2 ) of the respective output signals (S 1 ,S 2 ) periodically recur as a function of a wavelength (λ i ) of the input light (Li) according to a respective wavelength interval (Λ 1 ,Λ 2 ); - wherein a wavelength (λ a ,λ b ) at which the recurring signal values (V 1 ,V 2 ) occur, shifts according to a respective wavelength shift (Δλ 1 ,Δλ 2 ) as a function of change (ΔX) in the sample property (X) to be measured by a corresponding change of effective refractive index for the light through at least a portion of the photonic sensors ; - wherein a relative range of a respective photonic sensor for the sample property (X) is defined by a respective quotient (Λ 1 /Δλ 1 , Λ 2 /Δλ 2 ) of the respective wavelength interval (Λ 1 ,Λ 2 ) over the respective wavelength shift (Δλ 1 ,Δλ 2 ) for a change (ΔX) in the sample property (X); - wherein the at least two photonic sensors comprise a low range sensor providing a first output signal (S1) and a high range sensor providing a second output signal (S 2 ), wherein the high range sensor has a higher relative range for the sample property (X) than the low range sensor ; - wherein the sample property (X) is calculated by combining the output signals (S 1 ,S 2 ) of the at least two photonic sensors , wherein the second output signal (S 2 ) of the high range sensor is used to distinguish between recurring signal values (V 1 ) in the first output signal (S 1 ) of the low range sensor characterized in that the photonic sensors comprise a combination of a multi-path interferometer and a ring resonator, wherein the multi-path interferometer forms the high range sensor and the ring resonator forms the low range sensor . - applying input light (Li) into the photonic circuit and measuring output light (Lo) out of the photonic circuit ; - wherein the photonic circuit comprises at least two photonic sensors configured to interferometrically modulate the output light (Lo) with respect to the input light (Li) according to a respective output signal (S 1 ,S 2 ); - wherein respective signal values (V 1 ,V 2 ) of the respective output signals (S 1 ,S 2 ) periodically recur as a function of a wavelength (λ i ) of the input light (Li) according to a respective wavelength interval (Λ 1 ,Λ 2 ); - wherein a wavelength (λ a ,λ b ) at which the recurring signal values (V 1 ,V 2 ) occur, shifts according to a respective wavelength shift (Δλ 1 ,Δλ 2 ) as a function of change (ΔX) in the sample property (X) to be measured by a corresponding change of effective refractive index for the light through at least a portion of the photonic sensors ; - wherein a relative range of a respective photonic sensor for the sample property (X) is defined by a respective quotient (Λ 1 /Δλ 1 , Λ 2 /Δλ 2 ) of the respective wavelength interval (Λ 1 ,Λ 2 ) over the respective wavelength shift (Δλ 1 ,Δλ 2 ) for a change (ΔX) in the sample property (X); - wherein the at least two photonic sensors comprise a low range sensor providing a first output signal (S1) and a high range sensor providing a second output signal (S 2 ), wherein the high range sensor has a higher relative range for the sample property (X) than the low range sensor ; - wherein the sample property (X) is calculated by combining the output signals (S 1 ,S 2 ) of the at least two photonic sensors , wherein the second output signal (S 2 ) of the high range sensor is used to distinguish between recurring signal values (V 1 ) in the first output signal (S 1 ) of the low range sensor <EOS>