Measuring device of the surface topography of a sample comprising: • at least one projector configured to emit a patterned light designed to be projected onto the surface of the sample, • at least one camera configured to observe said patterned light projected onto the surface of the sample and provide measurements of the topography of the sample surface from the captured structured light, • an enclosure designed to receive the sample, • a heating or cooling device configured to apply a temperature ramp to the sample in the enclosure , measuring device characterised in that it comprises: • a first optic device located on the optic axis of the projector between the projector and the sample, the first optic device presenting several different magnifications by means of several distinct first lenses having different magnifications, the first lenses being mounted movable so as to provide different resolutions of the patterned light, a first motor configured to move the first lenses in a plane perpendicular to an optic axis of the projector to define a first active lens located on the optic axis of the projector among the first lenses, • a second optic device located on the optic axis of the camera between the camera and the sample, the second optic device presenting several different magnifications by means of several distinct second lenses, the second lenses being mounted movable so as to provide different resolutions of the camera , a second motor configured to move the second lenses in a plane perpendicular to an optic axis of the camera to define a second active lens located on the optic axis of the camera among the second lenses, • a control circuit connected to the first optic device and to the second optic device and configured to change the active lens among the first lenses and to change the active lens among the second lenses in response to a user instruction, the control circuit being configured to modify the magnifications of the first and second active lenses in the same manner. • at least one projector configured to emit a patterned light designed to be projected onto the surface of the sample, • at least one camera configured to observe said patterned light projected onto the surface of the sample and provide measurements of the topography of the sample surface from the captured structured light, • an enclosure designed to receive the sample, • a heating or cooling device configured to apply a temperature ramp to the sample in the enclosure , • a first optic device located on the optic axis of the projector between the projector and the sample, the first optic device presenting several different magnifications by means of several distinct first lenses having different magnifications, the first lenses being mounted movable so as to provide different resolutions of the patterned light, a first motor configured to move the first lenses in a plane perpendicular to an optic axis of the projector to define a first active lens located on the optic axis of the projector among the first lenses, • a second optic device located on the optic axis of the camera between the camera and the sample, the second optic device presenting several different magnifications by means of several distinct second lenses, the second lenses being mounted movable so as to provide different resolutions of the camera , a second motor configured to move the second lenses in a plane perpendicular to an optic axis of the camera to define a second active lens located on the optic axis of the camera among the second lenses, • a control circuit connected to the first optic device and to the second optic device and configured to change the active lens among the first lenses and to change the active lens among the second lenses in response to a user instruction, the control circuit being configured to modify the magnifications of the first and second active lenses in the same manner. <EOS>