A grain-oriented electrical steel sheet including a silicon steel sheet as a base steel sheet, an intermediate layer arranged in contact with the silicon steel sheet, and an insulation coating arranged in contact with the intermediate layer, wherein, when an average value of amplitudes in a wavelength range of 20 to 100 μm among wavelength components obtained by performing Fourier analysis on a measured cross-sectional curve parallel to a sheet width direction of the silicon steel sheet is set as ave-AMP C100 , ave-AMP C100 is 0.0001 to 0.050 μm; wherein the silicon steel sheet contains, as chemical components, by mass%, Si: 0.8% or more and 7.0% or less, Mn: 0 or more and 1.00% or less, Cr: 0 or more and 0.30% or less, Cu: 0 or more and 0.40% or less, P : 0 or more and 0.50% or less, Sn: 0 or more and 0.30% or less, Sb: 0 or more and 0.30% or less, Ni: 0 or more and 1.00% or less, B : 0 or more and 0.008% or less, V : 0 or more and 0.15% or less, Nb: 0 or more and 0.2% or less, Mo: 0 or more and 0.10% or less, Ti: 0 or more and 0.015% or less, Bi: 0 or more and 0.010% or less, Al: 0 or more and 0.005% or less, C : 0 or more and 0.005% or less, N : 0 or more and 0.005% or less, S : 0 or more and 0.005% or less, and Se: 0 or more and 0.005% or less, with the remainder being Fe and impurities; wherein the silicon steel sheet has a texture developed in the <001> orientation; and wherein the intermediate layer is a silicon oxide film, whereby the amplitudes and the texture are determined according to the description. a silicon steel sheet as a base steel sheet, an intermediate layer arranged in contact with the silicon steel sheet, and an insulation coating arranged in contact with the intermediate layer, wherein, when an average value of amplitudes in a wavelength range of 20 to 100 μm among wavelength components obtained by performing Fourier analysis on a measured cross-sectional curve parallel to a sheet width direction of the silicon steel sheet is set as ave-AMP C100 , ave-AMP C100 is 0.0001 to 0.050 μm; wherein the silicon steel sheet contains, as chemical components, by mass%, Si: 0.8% or more and 7.0% or less, Mn: 0 or more and 1.00% or less, Cr: 0 or more and 0.30% or less, Cu: 0 or more and 0.40% or less, P : 0 or more and 0.50% or less, Sn: 0 or more and 0.30% or less, Sb: 0 or more and 0.30% or less, Ni: 0 or more and 1.00% or less, B : 0 or more and 0.008% or less, V : 0 or more and 0.15% or less, Nb: 0 or more and 0.2% or less, Mo: 0 or more and 0.10% or less, Ti: 0 or more and 0.015% or less, Bi: 0 or more and 0.010% or less, Al: 0 or more and 0.005% or less, C : 0 or more and 0.005% or less, N : 0 or more and 0.005% or less, S : 0 or more and 0.005% or less, and Se: 0 or more and 0.005% or less, with the remainder being Fe and impurities; Si: 0.8% or more and 7.0% or less, Mn: 0 or more and 1.00% or less, Cr: 0 or more and 0.30% or less, Cu: 0 or more and 0.40% or less, P : 0 or more and 0.50% or less, Sn: 0 or more and 0.30% or less, Sb: 0 or more and 0.30% or less, Ni: 0 or more and 1.00% or less, B : 0 or more and 0.008% or less, V : 0 or more and 0.15% or less, Nb: 0 or more and 0.2% or less, Mo: 0 or more and 0.10% or less, Ti: 0 or more and 0.015% or less, Bi: 0 or more and 0.010% or less, Al: 0 or more and 0.005% or less, C : 0 or more and 0.005% or less, N : 0 or more and 0.005% or less, S : 0 or more and 0.005% or less, and Se: 0 or more and 0.005% or less, with the remainder being Fe and impurities; wherein the silicon steel sheet has a texture developed in the <001> orientation; and wherein the intermediate layer is a silicon oxide film, whereby the amplitudes and the texture are determined according to the description. <EOS>