An eddy current flaw detection probe configured to perform a flaw detection inspection on an inspection target by generating eddy currents in the inspection target and detecting a change in the eddy currents, the eddy current flaw detection probe comprising: multiple pairs of first coils arranged along a certain direction, the first coils of each pair being arranged in two rows; multiple pairs of second coils arranged along the certain direction, the second coils of each pair being arranged in two rows; wherein the second coils in one pair are arranged in a point symmetry in a center line (L2) therebetween that intersects a center line (L1) of a corresponding pair of the first coils ; and a switching circuit configured to cause the first coils or the second coils in each unit (U) to serve as excitation coils (C1) that generate the eddy currents in the inspection target and cause the other coils among the first coils and the second coils in the unit (U) to serve as detection coils (C2) that detect a change in the eddy currents, the unit (U) being composed of adjacent four of the coils, the four of the coils being arranged in two rows and two columns and composing two of the first coils and two of the second coils , the two of the second coils being arranged in a point symmetry to the two of the first coils , wherein each of the first coils has one end thereof connected to a first common wiring , each of the second coils has one end thereof connected to a second common wiring , and the switching circuit includes a first switching circuit (431, 431A1, 431A2) and a second switching circuit (432, 432A1, 432A2), the first switching circuit (431, 431A1, 431A2) being connected to respective other ends of the first coils and the second coils that are arranged in a first row of the two rows, and the second switching circuit (432, 432A1, 432A2) being connected to respective other ends of the first coils and the second coils that are arranged in a second row of the two rows. multiple pairs of first coils arranged along a certain direction, the first coils of each pair being arranged in two rows; multiple pairs of second coils arranged along the certain direction, the second coils of each pair being arranged in two rows; wherein the second coils in one pair are arranged in a point symmetry in a center line (L2) therebetween that intersects a center line (L1) of a corresponding pair of the first coils ; and a switching circuit configured to cause the first coils or the second coils in each unit (U) to serve as excitation coils (C1) that generate the eddy currents in the inspection target and cause the other coils among the first coils and the second coils in the unit (U) to serve as detection coils (C2) that detect a change in the eddy currents, the unit (U) being composed of adjacent four of the coils, the four of the coils being arranged in two rows and two columns and composing two of the first coils and two of the second coils , the two of the second coils being arranged in a point symmetry to the two of the first coils , wherein each of the first coils has one end thereof connected to a first common wiring , each of the second coils has one end thereof connected to a second common wiring , and the switching circuit includes a first switching circuit (431, 431A1, 431A2) and a second switching circuit (432, 432A1, 432A2), the first switching circuit (431, 431A1, 431A2) being connected to respective other ends of the first coils and the second coils that are arranged in a first row of the two rows, and the second switching circuit (432, 432A1, 432A2) being connected to respective other ends of the first coils and the second coils that are arranged in a second row of the two rows. <EOS>