An imaging apparatus , said apparatus comprising: an illumination waveguide , which is configured to propagate one or more light waves by total internal reflection, wherein an evanescent field of the propagated light wave is configured to illuminate an object in close relation to the illumination waveguide ; an array of light-sensitive areas , said array being configured to detect light emitted by the object upon illumination by the evanescent field, wherein the array of light-sensitive areas is arranged on a common substrate with said illumination waveguide ; at least one input waveguide arranged on the common substrate, wherein the at least one input waveguide is configured to input a light wave into the illumination waveguide; a controller , which is configured to control forming of an interference pattern in the illumination waveguide by the one or more light waves being propagated therein, wherein the imaging apparatus comprises an influencing device and the controller is configured to cause the influencing device to tune a phase, intensity, or wavelength of the propagated light wave in the at least one input waveguide , or wherein the controller is configured to control a light source to tune a phase, intensity or wavelength of the light wave coupled into the at least one input waveguide , wherein the interference pattern comprises at least one element of constructive interference for selectively illuminating a portion of the object, the at least one element having a dimension with a size in a range of 100 nm - 10 μm; wherein the controller is configured to sequentially change the position of the interference pattern in relation to the object such that the element is scanned over the object and to synchronize the changing of the interference pattern with the frame rate of the array of light-sensitive areas which is configured to sequentially detect light from different portions of the object. an illumination waveguide , which is configured to propagate one or more light waves by total internal reflection, wherein an evanescent field of the propagated light wave is configured to illuminate an object in close relation to the illumination waveguide ; an array of light-sensitive areas , said array being configured to detect light emitted by the object upon illumination by the evanescent field, wherein the array of light-sensitive areas is arranged on a common substrate with said illumination waveguide ; at least one input waveguide arranged on the common substrate, wherein the at least one input waveguide is configured to input a light wave into the illumination waveguide; a controller , which is configured to control forming of an interference pattern in the illumination waveguide by the one or more light waves being propagated therein, wherein the imaging apparatus comprises an influencing device and the controller is configured to cause the influencing device to tune a phase, intensity, or wavelength of the propagated light wave in the at least one input waveguide , or wherein the controller is configured to control a light source to tune a phase, intensity or wavelength of the light wave coupled into the at least one input waveguide , wherein the interference pattern comprises at least one element of constructive interference for selectively illuminating a portion of the object, the at least one element having a dimension with a size in a range of 100 nm - 10 μm; wherein the controller is configured to sequentially change the position of the interference pattern in relation to the object such that the element is scanned over the object and to synchronize the changing of the interference pattern with the frame rate of the array of light-sensitive areas which is configured to sequentially detect light from different portions of the object. <EOS>