Microscope, comprising - an illumination device by means of which a light sheet is generated for the purposes of illuminating a sample region (P), the latter having an approximately planar extent in the direction of an illumination axis (X) of an illumination beam path and in the direction of a transverse axis (Y) which is transverse to the illumination axis (X), - a detection device by means of which light is detected, the latter being emitted from the sample region (P) along a detection axis (Z) of a detection beam path, with the illumination axis (X) and the detection axis (Z) and also the transverse axis (Y) and the detection axis (Z) including an angle that differs from zero, - the detection device comprising a detection objective which is arranged in the detection beam path and splitting means for splitting the detection beam path into two partial beam paths , wherein one spatially resolving area detector or is arranged in each of the partial beam paths , the light to be detected being imageable on said area detector, and the splitting means comprising at least one dichroic beam splitter arranged in the beam path at the near infinity in respect of the spatially resolving area detectors , - optical imaging elements and arranged in each of the two partial beam paths , for imaging the light to be detected on the respective area detector and , respectively, characterized in that - the dichroic beam splitter has a thickness of at least 3 mm and - at least one rocking plate for generating a beam offset along two mutually orthogonal directions transverse to the detection axis (Z) is arranged in at least one of the two partial beam paths such that there can be automated superpositions of measurement values read from the two area detectors . - an illumination device by means of which a light sheet is generated for the purposes of illuminating a sample region (P), the latter having an approximately planar extent in the direction of an illumination axis (X) of an illumination beam path and in the direction of a transverse axis (Y) which is transverse to the illumination axis (X), - a detection device by means of which light is detected, the latter being emitted from the sample region (P) along a detection axis (Z) of a detection beam path, with the illumination axis (X) and the detection axis (Z) and also the transverse axis (Y) and the detection axis (Z) including an angle that differs from zero, - the detection device comprising a detection objective which is arranged in the detection beam path and splitting means for splitting the detection beam path into two partial beam paths , wherein one spatially resolving area detector or is arranged in each of the partial beam paths , the light to be detected being imageable on said area detector, and the splitting means comprising at least one dichroic beam splitter arranged in the beam path at the near infinity in respect of the spatially resolving area detectors , - optical imaging elements and arranged in each of the two partial beam paths , for imaging the light to be detected on the respective area detector and , respectively, characterized in that - the dichroic beam splitter has a thickness of at least 3 mm and - at least one rocking plate for generating a beam offset along two mutually orthogonal directions transverse to the detection axis (Z) is arranged in at least one of the two partial beam paths such that there can be automated superpositions of measurement values read from the two area detectors . <EOS>