An apparatus for storing and providing configuration data to an integrated circuit device, the apparatus comprising: a fuse array (336; 1001), disposed on a die , said fuse array comprising: a first plurality of semiconductor fuses; and a second plurality of semiconductor fuses; and a plurality of cores (332; 1002), disposed on said die, wherein each of said plurality of cores is coupled to said fuse array, said each of said plurality of cores comprising: array control , configured to access said first and second pluralities of fuses, and configured to read first states of said first plurality of semiconductor fuses and second states of said second plurality of semiconductor fuses according to contents of a configuration data register ; wherein said contents direct said array control to read said first states and said second states as redundant fuse arrays, each programmed with identical compressed configuration data for said each of said plurality of cores (332; 1002), and wherein said array control comprises elements that logically OR said first and second states to determine whether one or more of blown fuses within said first plurality of semiconductor fuses or said second plurality of semiconductor fuses exhibit growback, wherein: in response to the growback exhibiting in said first plurality of semiconductor fuses, said array control does not access said first plurality of semiconductor fuses, and in response to the growback exhibiting in said second plurality of semiconductor fuses, said array control does not access said second plurality of semiconductor fuses. a fuse array (336; 1001), disposed on a die , said fuse array comprising: a first plurality of semiconductor fuses; and a second plurality of semiconductor fuses; and a first plurality of semiconductor fuses; and a second plurality of semiconductor fuses; and a plurality of cores (332; 1002), disposed on said die, wherein each of said plurality of cores is coupled to said fuse array, said each of said plurality of cores comprising: array control , configured to access said first and second pluralities of fuses, and configured to read first states of said first plurality of semiconductor fuses and second states of said second plurality of semiconductor fuses according to contents of a configuration data register ; wherein said contents direct said array control to read said first states and said second states as redundant fuse arrays, each programmed with identical compressed configuration data for said each of said plurality of cores (332; 1002), and wherein said array control comprises elements that logically OR said first and second states to determine whether one or more of blown fuses within said first plurality of semiconductor fuses or said second plurality of semiconductor fuses exhibit growback, wherein: in response to the growback exhibiting in said first plurality of semiconductor fuses, said array control does not access said first plurality of semiconductor fuses, and in response to the growback exhibiting in said second plurality of semiconductor fuses, said array control does not access said second plurality of semiconductor fuses. in response to the growback exhibiting in said first plurality of semiconductor fuses, said array control does not access said first plurality of semiconductor fuses, and in response to the growback exhibiting in said second plurality of semiconductor fuses, said array control does not access said second plurality of semiconductor fuses. <EOS>