An inspection device configured to inspect an appearance of a target (M), the device comprising: an imaging device configured to image the target (M) from a first direction; an illuminating unit configured to apply light to the target (M) in a first illumination pattern in which light is applied to the target (M) from a first position and in a second illumination pattern in which light is applied to the target (M) from a second position different from the first position; a controller configured to acquire a first inspection image by causing the imaging device to image the target to which light is applied in the first illumination pattern, the controller being configured to acquire a second inspection image by causing the imaging device to image the target to which light is applied in the second illumination pattern, the controller being configured to inspect an appearance of the target (M) based on the first inspection image, the second inspection image, and a reference image provided in advance; and a housing configured to accommodate the imaging device and the illuminating unit , wherein the first position and the second position overlap each other when viewed from the first direction, the illuminating unit applies light to the target disposed in the housing , the target (M) is a mold (M) or a molding pattern, and the controller is configured to eliminate reflection due to a mold release agent from the first inspection image and the second inspection image, and the controller is configured to inspect an appearance of the target (M) based on the first inspection image from which the reflection is eliminated, the second inspection image from which the reflection is eliminated, and the reference image. an imaging device configured to image the target (M) from a first direction; an illuminating unit configured to apply light to the target (M) in a first illumination pattern in which light is applied to the target (M) from a first position and in a second illumination pattern in which light is applied to the target (M) from a second position different from the first position; a controller configured to acquire a first inspection image by causing the imaging device to image the target to which light is applied in the first illumination pattern, the controller being configured to acquire a second inspection image by causing the imaging device to image the target to which light is applied in the second illumination pattern, the controller being configured to inspect an appearance of the target (M) based on the first inspection image, the second inspection image, and a reference image provided in advance; and a housing configured to accommodate the imaging device and the illuminating unit , wherein the first position and the second position overlap each other when viewed from the first direction, the illuminating unit applies light to the target disposed in the housing , the target (M) is a mold (M) or a molding pattern, and the controller is configured to eliminate reflection due to a mold release agent from the first inspection image and the second inspection image, and the controller is configured to inspect an appearance of the target (M) based on the first inspection image from which the reflection is eliminated, the second inspection image from which the reflection is eliminated, and the reference image. <EOS>