A device for determining the surface topology and associated color of an object , comprising: a 3 D measurement optical path including a light source , a variable imaging optics , and a lens that are arranged to define a depth of focus ; a color measurement optical path including a color image sensor and an optical assembly that are arranged to define a depth of field , wherein the depth of field is larger than the depth of focus , wherein the light source is adapted to provide a structured illumination beam for illuminating the object, wherein the variable imaging optics is arranged to focus the structured illumination beam onto the object and adapted to move a position of a focal plane of through the volume of the object; an extraction mirror disposed within the color measurement optical path and configured to extract a first portion of a monitoring beam coming from the object , wherein the color image sensor is adapted to detect the first portion of the monitoring beam to form color images, wherein the 3 D measurement optical path has a 3 D image sensor disposed therein, the 3 D image sensor is adapted to detect a second portion of the monitoring beam to form 3 D images, characterized in that the depth of field is equal to or smaller than the 3D measurement range of the 3 D image sensor , whereby the color images of the object can be taken such that the structured illumination is not seen in said color images, wherein at least one processor of the device is adapted to control the device such that the light source is controlled such that when the focal plane is outside the 3D measurement range, a light for color measurement is switched on and one or more images are taken for color measurement in a first predetermined duration of time, and the light source is controlled such that when the focal plane is inside the 3D measurement range, a light for 3D measurement is switched on and one or more images are taken for 3D measurement in a second predetermined duration of time. a 3 D measurement optical path including a light source , a variable imaging optics , and a lens that are arranged to define a depth of focus ; a color measurement optical path including a color image sensor and an optical assembly that are arranged to define a depth of field , wherein the depth of field is larger than the depth of focus , wherein the light source is adapted to provide a structured illumination beam for illuminating the object, wherein the variable imaging optics is arranged to focus the structured illumination beam onto the object and adapted to move a position of a focal plane of through the volume of the object; an extraction mirror disposed within the color measurement optical path and configured to extract a first portion of a monitoring beam coming from the object , wherein the color image sensor is adapted to detect the first portion of the monitoring beam to form color images, wherein the 3 D measurement optical path has a 3 D image sensor disposed therein, the 3 D image sensor is adapted to detect a second portion of the monitoring beam to form 3 D images, characterized in that the depth of field is equal to or smaller than the 3D measurement range of the 3 D image sensor , whereby the color images of the object can be taken such that the structured illumination is not seen in said color images, wherein at least one processor of the device is adapted to control the device such that the light source is controlled such that when the focal plane is outside the 3D measurement range, a light for color measurement is switched on and one or more images are taken for color measurement in a first predetermined duration of time, and the light source is controlled such that when the focal plane is inside the 3D measurement range, a light for 3D measurement is switched on and one or more images are taken for 3D measurement in a second predetermined duration of time. <EOS>