Sensor comprising a sensor element for measuring a magnetic field, the sensor element comprising - a set of at least two first input ports (I1), - a set of at least two exit ports (E) each of which is connected to one of the first input ports (I1) via a corresponding first beam path (B1), - a set of at least two second input ports each of which is connected to a second beam path (B2), - wherein the first beam paths (B1) extend through a common plane (CP) located inside the sensor element , said plane (CP) comprising a plurality of magneto-optically responsive defect centers, - wherein the second beam paths (B2) also extend through said common plane (CP), but are angled with respect to the first beam paths (B1) such that a plurality of intersections between the first and second beam paths (B2) is defined, and - wherein each intersection forms a sensor pixel (P) located at at least one of said magneto-optically responsive defect centers, wherein the sensor further comprises - a set of detectors each of which is individually assigned to one of said exit ports, - an evaluation unit connected to said set of detectors and configured to evaluate detection signals (DS) of the detectors in order to generate one or more measurement values (M), - a first emitter unit which is capable of generating a first radiation (R1) and activating at least one of the first beam paths (B1) by injecting the first radiation (R1), - a second emitter unit which is capable of generating a second radiation (R2) and activating at least one of the second beam paths (B2) by injecting the second radiation (R2), - a control unit configured to control the first and second emitter unit , and - a microwave generator capable of generating a microwave field at the intersection points of the beam paths (B1, B2). - a set of at least two first input ports (I1), - a set of at least two exit ports (E) each of which is connected to one of the first input ports (I1) via a corresponding first beam path (B1), - a set of at least two second input ports each of which is connected to a second beam path (B2), - wherein the first beam paths (B1) extend through a common plane (CP) located inside the sensor element , said plane (CP) comprising a plurality of magneto-optically responsive defect centers, - wherein the second beam paths (B2) also extend through said common plane (CP), but are angled with respect to the first beam paths (B1) such that a plurality of intersections between the first and second beam paths (B2) is defined, and - wherein each intersection forms a sensor pixel (P) located at at least one of said magneto-optically responsive defect centers, - a set of detectors each of which is individually assigned to one of said exit ports, - an evaluation unit connected to said set of detectors and configured to evaluate detection signals (DS) of the detectors in order to generate one or more measurement values (M), - a first emitter unit which is capable of generating a first radiation (R1) and activating at least one of the first beam paths (B1) by injecting the first radiation (R1), - a second emitter unit which is capable of generating a second radiation (R2) and activating at least one of the second beam paths (B2) by injecting the second radiation (R2), - a control unit configured to control the first and second emitter unit , and - a microwave generator capable of generating a microwave field at the intersection points of the beam paths (B1, B2). <EOS>