Method of improving a Transmission Kikuchi Diffraction, TKD, pattern with the steps: Detecting a TKD pattern of a sample in an electron microscope comprising at least one active electron lens focussing an electron beam in z-direction on a sample positioned in distance D Z below the electron lens , the detected TKD pattern comprising a plurality of image points x D , y D ; Mapping each of the image points x D , y D to an image point of an improved TKD pattern with the coordinates x 0 , y 0 by using generalized terms of the form x D = γ ∗ A + (1 ― γ ) ∗ B and y D = γ ∗ C + (1 ― γ ) ∗ D, wherein γ = Z D Z with Z being an extension in the z-direction beyond the sample of a cylindrically symmetric magnetic field B Z of the electron lens with B Z being assumed as having a zero field strength for any z > Z, and wherein A, B, C, D are trigonometric expressions depending on the coordinates x 0 , y 0 , with B and D defining a rotation around a symmetry axis of the magnetic field B Z , and with A and C defining a combined rotation and contraction operation with respect to the symmetry axis of the magnetic field B Z , wherein the trigonometric expression A is of the form x 0 sin φ φ + y 0 1 − cos φ φ , , wherein the trigonometric expression B is of the form x 0 cos φ + y 0 sin φ, wherein the trigonometric expression C is of the form − x 0 1 − cos φ φ + y 0 sin φ φ , wherein the trigonometric expression D is of the form ― x 0 sin φ + y 0 cos φ, wherein the factor φ in each of the trigonometric expressions A, B, C and D is expressed as φ = β √(1 + r 2 /D z 2 ) with r denoting a horizontal distance of an improved image point x 0 , y 0 from the symmetry axis, which further depends on β=(γωD Z )/v with ω being the circular frequency of the magnetic field B Z and with v being the velocity of an electron of the electron beam . Detecting a TKD pattern of a sample in an electron microscope comprising at least one active electron lens focussing an electron beam in z-direction on a sample positioned in distance D Z below the electron lens , the detected TKD pattern comprising a plurality of image points x D , y D ; Mapping each of the image points x D , y D to an image point of an improved TKD pattern with the coordinates x 0 , y 0 by using generalized terms of the form x D = γ ∗ A + (1 ― γ ) ∗ B and y D = γ ∗ C + (1 ― γ ) ∗ D, wherein γ = Z D Z with Z being an extension in the z-direction beyond the sample of a cylindrically symmetric magnetic field B Z of the electron lens with B Z being assumed as having a zero field strength for any z > Z, and wherein A, B, C, D are trigonometric expressions depending on the coordinates x 0 , y 0 , with B and D defining a rotation around a symmetry axis of the magnetic field B Z , and with A and C defining a combined rotation and contraction operation with respect to the symmetry axis of the magnetic field B Z , wherein the trigonometric expression A is of the form x 0 sin φ φ + y 0 1 − cos φ φ , , wherein the trigonometric expression B is of the form x 0 cos φ + y 0 sin φ, wherein the trigonometric expression C is of the form − x 0 1 − cos φ φ + y 0 sin φ φ , wherein the trigonometric expression D is of the form ― x 0 sin φ + y 0 cos φ, wherein the factor φ in each of the trigonometric expressions A, B, C and D is expressed as φ = β √(1 + r 2 /D z 2 ) with r denoting a horizontal distance of an improved image point x 0 , y 0 from the symmetry axis, which further depends on β=(γωD Z )/v with ω being the circular frequency of the magnetic field B Z and with v being the velocity of an electron of the electron beam . <EOS>