A microelectromechanical gyroscope comprising - a substrate which defines a device plane and comprises one or more first anchor points and one or more second anchor points , - a first inertial mass and a second inertial mass , wherein the first inertial mass is suspended from the one or more first anchor points by a first suspension structure configured to allow the first inertial mass to oscillate rotationally both in the device plane and out of the device plane, and the second inertial mass is suspended from the one or more second anchor points by a second suspension structure configured to allow the second inertial mass to oscillate rotationally both in the device plane and out of the device plane, and - at least one of the first and second suspension structures comprises one or more suspenders (731, 732, 733, 734, 831, 832 9321, 9322, 10321, 10322, 10323, 10324, 11311, 11312, 11313, 11314, 12321, 12322, 12323, 12324, 13321, 13322, 13323, 13324) coated with piezoelectric transducer structures configured to detect the oscillating motion of the suspended inertial mass out of the device plane, wherein each suspender (731, 732, 733, 734, 831, 832 9321, 9322, 10321, 10322, 10323, 10324, 11311, 11312, 11313, 11314, 12321, 12322, 12323, 12324, 13321, 13322, 13323, 13324) coated with a piezoelectric transducer structure is a spring, and - a synchronization structure which includes a synchronization spring attached to the first inertial mass at a first attachment point and to the second inertial mass at a second attachment point , characterized in that - the synchronization spring is coated with a piezoelectric transducer structure configured to drive the first and the second inertial masses into anti-phase drive oscillation in the device plane. - a substrate which defines a device plane and comprises one or more first anchor points and one or more second anchor points , - a first inertial mass and a second inertial mass , wherein the first inertial mass is suspended from the one or more first anchor points by a first suspension structure configured to allow the first inertial mass to oscillate rotationally both in the device plane and out of the device plane, and the second inertial mass is suspended from the one or more second anchor points by a second suspension structure configured to allow the second inertial mass to oscillate rotationally both in the device plane and out of the device plane, and - at least one of the first and second suspension structures comprises one or more suspenders (731, 732, 733, 734, 831, 832 9321, 9322, 10321, 10322, 10323, 10324, 11311, 11312, 11313, 11314, 12321, 12322, 12323, 12324, 13321, 13322, 13323, 13324) coated with piezoelectric transducer structures configured to detect the oscillating motion of the suspended inertial mass out of the device plane, wherein each suspender (731, 732, 733, 734, 831, 832 9321, 9322, 10321, 10322, 10323, 10324, 11311, 11312, 11313, 11314, 12321, 12322, 12323, 12324, 13321, 13322, 13323, 13324) coated with a piezoelectric transducer structure is a spring, and - a synchronization structure which includes a synchronization spring attached to the first inertial mass at a first attachment point and to the second inertial mass at a second attachment point , - the synchronization spring is coated with a piezoelectric transducer structure configured to drive the first and the second inertial masses into anti-phase drive oscillation in the device plane. <EOS>