Method for optimizing the operation of at least one field device among multiple field devices (F1, F2, F3) in an automation engineering installation (A), which are used in different applications, said method comprising the following steps: - Collection of application information (Ai) and device types of the multiple field devices (F1, F2, F3), wherein the application information (Ai) uniquely describes each of the multiple field devices (F1, F2, F3) with regard to its application; - Classification of the application information (Ai) of the multiple field devices (F1, F2, F3) and storage of the classified application information (Ai); - Collection of parameter sets (aP, sP) from each field device among the multiple field devices (F1, F2, F3), wherein the parameter sets (aP, sP) consist of multiple parameters (P1, P2, P3) and wherein a parameter value or a parameter value range is assigned to each parameter (P1, P2, P3) and every field device has at least a current parameter set (aP) and at least a standard parameter set (sP), and storage of the parameter sets (aP, sP); - Comparison of the current parameter set (aP) of each field device (F1, F2, F3) with the respective standard parameter set (sP) for the purpose of determining parameters actually used (P1', P2') of a device type for an application, wherein the parameters actually used (P1', P2') are the parameters of a current parameter set (aP) which have been allocated compared to the respective standard parameter set (sP); - Storage of the parameters actually used (P1', P2') of one of the multiple field devices in an optimum parameter set (oP); - Replacement of the current parameter set (aP) of the field device (F1, F2, F3) with the optimum parameter set (oP). - Operation of the field device (F1) on the basis of the parameters actually used (P1', P2'). - Collection of application information (Ai) and device types of the multiple field devices (F1, F2, F3), wherein the application information (Ai) uniquely describes each of the multiple field devices (F1, F2, F3) with regard to its application; - Classification of the application information (Ai) of the multiple field devices (F1, F2, F3) and storage of the classified application information (Ai); - Collection of parameter sets (aP, sP) from each field device among the multiple field devices (F1, F2, F3), wherein the parameter sets (aP, sP) consist of multiple parameters (P1, P2, P3) and wherein a parameter value or a parameter value range is assigned to each parameter (P1, P2, P3) and every field device has at least a current parameter set (aP) and at least a standard parameter set (sP), and storage of the parameter sets (aP, sP); - Comparison of the current parameter set (aP) of each field device (F1, F2, F3) with the respective standard parameter set (sP) for the purpose of determining parameters actually used (P1', P2') of a device type for an application, wherein the parameters actually used (P1', P2') are the parameters of a current parameter set (aP) which have been allocated compared to the respective standard parameter set (sP); - Storage of the parameters actually used (P1', P2') of one of the multiple field devices in an optimum parameter set (oP); - Replacement of the current parameter set (aP) of the field device (F1, F2, F3) with the optimum parameter set (oP). - Operation of the field device (F1) on the basis of the parameters actually used (P1', P2'). <EOS>