Microscope, comprising - an illumination device , with which a light sheet for illuminating a sample region (P) is generated by means of a scanning mirror , said light sheet having an approximately two-dimensional extent in the direction of an illumination axis (X) of an illumination beam path and in the direction of a transverse axis (Y), which is transverse to the illumination axis (X), - a detection device , with which light is detected that is emitted from the sample region (P) along a detection axis (Z) of a detection beam path, wherein the illumination axis (X) and the detection axis (Z) and also the transverse axis (Y) and the detection axis (Z) enclose a non-zero angle, - with the detection device comprising a detection objective in the detection beam path, wherein - the illumination device comprises means for deflecting illumination light into a further illumination beam path and for generating a further light sheet, wherein the further light sheet has an approximately two-dimensional extent in the direction of the illumination axis (X) and in the direction of the transverse axis (Y), wherein the illumination beam path and the further illumination beam path are made up of substantially identical optical elements and have the same optical path lengths, and wherein the light sheet and the further light sheet are aligned relative to one another such that they illuminate the sample region (P) on the same illumination axis (X) from opposite directions, - wherein the means for deflecting illumination light comprise a switchover element, which switches the illumination light between the illumination beam path and the further illumination beam path and/or shifts the light sheet for the purpose of an adjustment in the direction of the detection axis, - wherein the switchover element in the illumination beam path is arranged in the immediate vicinity of the scanning mirror or is arranged at an equivalent point in the illumination beam path to the scanning mirror. - an illumination device , with which a light sheet for illuminating a sample region (P) is generated by means of a scanning mirror , said light sheet having an approximately two-dimensional extent in the direction of an illumination axis (X) of an illumination beam path and in the direction of a transverse axis (Y), which is transverse to the illumination axis (X), - a detection device , with which light is detected that is emitted from the sample region (P) along a detection axis (Z) of a detection beam path, wherein the illumination axis (X) and the detection axis (Z) and also the transverse axis (Y) and the detection axis (Z) enclose a non-zero angle, - with the detection device comprising a detection objective in the detection beam path, wherein - the illumination device comprises means for deflecting illumination light into a further illumination beam path and for generating a further light sheet, wherein the further light sheet has an approximately two-dimensional extent in the direction of the illumination axis (X) and in the direction of the transverse axis (Y), wherein the illumination beam path and the further illumination beam path are made up of substantially identical optical elements and have the same optical path lengths, and wherein the light sheet and the further light sheet are aligned relative to one another such that they illuminate the sample region (P) on the same illumination axis (X) from opposite directions, - wherein the means for deflecting illumination light comprise a switchover element, which switches the illumination light between the illumination beam path and the further illumination beam path and/or shifts the light sheet for the purpose of an adjustment in the direction of the detection axis, - wherein the switchover element in the illumination beam path is arranged in the immediate vicinity of the scanning mirror or is arranged at an equivalent point in the illumination beam path to the scanning mirror. <EOS>