An imaging device comprising: a sensor unit configured to irradiate an object with light and detect the light reflected by the object ; a distance calculation unit configured to calculate a distance to the object on a basis of sensing data of the sensor unit ; a specular reflector located on an opposite side of the sensor unit across the object ; said imaging device being characterized by further comprising: a correction unit configured to correct an error included in the calculated distance, the error being caused by an interference between the light following a first path from the sensor unit toward the object and the light following a second path from the sensor unit , wherein the light on the second path is reflected by the specular reflector and goes toward the object , is reflected by the object and reaches the specular reflector again, is again reflected by the specular reflector and received by the sensor unit , and wherein the correction unit corrects the error based on a model for estimating a phase of the light obtained in case of interference , wherein a difference between the phase estimated by the model and an actually measured phase is minimized to estimate a phase not affected by the interference . a sensor unit configured to irradiate an object with light and detect the light reflected by the object ; a distance calculation unit configured to calculate a distance to the object on a basis of sensing data of the sensor unit ; a specular reflector located on an opposite side of the sensor unit across the object ; said imaging device being characterized by further comprising: a correction unit configured to correct an error included in the calculated distance, the error being caused by an interference between the light following a first path from the sensor unit toward the object and the light following a second path from the sensor unit , wherein the light on the second path is reflected by the specular reflector and goes toward the object , is reflected by the object and reaches the specular reflector again, is again reflected by the specular reflector and received by the sensor unit , and wherein the correction unit corrects the error based on a model for estimating a phase of the light obtained in case of interference , wherein a difference between the phase estimated by the model and an actually measured phase is minimized to estimate a phase not affected by the interference . a correction unit configured to correct an error included in the calculated distance, the error being caused by an interference between the light following a first path from the sensor unit toward the object and the light following a second path from the sensor unit , wherein the light on the second path is reflected by the specular reflector and goes toward the object , is reflected by the object and reaches the specular reflector again, is again reflected by the specular reflector and received by the sensor unit , and wherein the correction unit corrects the error based on a model for estimating a phase of the light obtained in case of interference , wherein a difference between the phase estimated by the model and an actually measured phase is minimized to estimate a phase not affected by the interference . <EOS>