A device for measuring the strain of an object independently of temperature variations, comprising: • at least one strain gauge that is attachable directly or indirectly to the object whose strain is to be measured; • a first temperature sensor configured to measure the temperature of the at least one strain gauge ; • read-out electronics configured to measure the change of electrical resistance of the at least one strain gauge , wherein the read-out electronics comprise at least one fixed resistor whose value is relied upon when obtaining the value of the change of electrical resistance of the strain gauge as a result of the measurement, wherein the read-out electronics is configured such that the temperature of the at least one fixed resistor is known and/or obtained by measurement; and • an evaluation unit that is configured to: correct the measured electrical resistance change , and/or a strain of the strain gauge and/or a strain of the object determined from this resistance change , for a first contribution that arises from the temperature of the at least one strain gauge , as well as for a second contribution that arises from the temperature of the fixed resistor , based on the temperature of the strain gauge , the temperature of the fixed resistor , and pre-stored calibration data , wherein either: the at least one fixed resistor is disposed close to the strain gauge , so as to have a temperature similar to that of the strain gauge , or the device further comprises: • a housing that accommodates at least the at least one fixed resistor of the read-out electronics ; and • a second temperature sensor that is configured to measure a temperature inside the housing such that the temperature of the at least one fixed resistor can be inferred; • and/or a cooling element or a heating element that is configured to maintain a known fixed temperature inside the housing . • at least one strain gauge that is attachable directly or indirectly to the object whose strain is to be measured; • a first temperature sensor configured to measure the temperature of the at least one strain gauge ; • read-out electronics configured to measure the change of electrical resistance of the at least one strain gauge , wherein the read-out electronics comprise at least one fixed resistor whose value is relied upon when obtaining the value of the change of electrical resistance of the strain gauge as a result of the measurement, wherein the read-out electronics is configured such that the temperature of the at least one fixed resistor is known and/or obtained by measurement; and • an evaluation unit that is configured to: correct the measured electrical resistance change , and/or a strain of the strain gauge and/or a strain of the object determined from this resistance change , for a first contribution that arises from the temperature of the at least one strain gauge , as well as for a second contribution that arises from the temperature of the fixed resistor , based on the temperature of the strain gauge , the temperature of the fixed resistor , and pre-stored calibration data , wherein either: the at least one fixed resistor is disposed close to the strain gauge , so as to have a temperature similar to that of the strain gauge , • a housing that accommodates at least the at least one fixed resistor of the read-out electronics ; and • a second temperature sensor that is configured to measure a temperature inside the housing such that the temperature of the at least one fixed resistor can be inferred; • and/or a cooling element or a heating element that is configured to maintain a known fixed temperature inside the housing . <EOS>