A system test apparatus for a test of an embedded system comprising a plurality of processes and a process control block including run-time execution information about the plurality of processes, wherein the run-time execution information means execution information for all the processes in a system while the system operates, the system test apparatus comprising: means for defining a defect model (step S 150, S 160, S 170), wherein the defect model means the position of memory to be detected depending on the type of detect and test information for discovering and recovering the defect; an insertion module configured to select two or more of a list of processes that are operating in the system while the system operates as test target, and insert a test agent into the process control block ; a hooking module configured to hook a test target to a test code using the test agent inserted into the process control block when an event related to the test target occurs, wherein the hooking module identifies the region of memory to be hooked based on the defect model and information included in the process control block and hooks the identified hooking region to the test code using the test agent inserted into the process control block ; a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked to the test code; a logging module configured to store the pieces of test information collected by the scanning module ; and an analysis apparatus configured to analyze the pieces of collected test information , wherein the test code is defined depending on the type of defect and wherein the type of defect includes a memory defect test, a performance test, and a communication test and wherein the hooking module is configured to change a test position to which the test code is hooked. means for defining a defect model (step S 150, S 160, S 170), wherein the defect model means the position of memory to be detected depending on the type of detect and test information for discovering and recovering the defect; an insertion module configured to select two or more of a list of processes that are operating in the system while the system operates as test target, and insert a test agent into the process control block ; a hooking module configured to hook a test target to a test code using the test agent inserted into the process control block when an event related to the test target occurs, wherein the hooking module identifies the region of memory to be hooked based on the defect model and information included in the process control block and hooks the identified hooking region to the test code using the test agent inserted into the process control block ; a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked to the test code; a logging module configured to store the pieces of test information collected by the scanning module ; and an analysis apparatus configured to analyze the pieces of collected test information , wherein the test code is defined depending on the type of defect and wherein the type of defect includes a memory defect test, a performance test, and a communication test and wherein the hooking module is configured to change a test position to which the test code is hooked. <EOS>