A method for obtaining three-dimensional information associated with at least one sample , the method comprising: receiving at least one first electro-magnetic radiation from a sample arm based on a transversely spectrally dispersed electro-magnetic radiation provided to the at least one sample ; the first electro-magnetic radiation including information identifying at least one portion of the at least one sample ; receiving at least one second electro-magnetic radiation from a reference arm ; generating first interference information based on the first and second electro-magnetic radiations , the first interference information being from a first depth within the at least one sample corresponding to a first path length of the reference arm ; obtaining at least one relative phase between the at least one first electro-magnetic radiation being returned from the at least one sample and the at least one second electro-magnetic radiation returned from the reference arm to determine at least one relative depth location of the at least one portion, changing the reference arm from the first path length to a second path length different from the first path length; generating second interference information based on changing the reference arm from the first path length to the second path length, the second interference information being from a second depth or a third depth within the at least one sample ; determining a surface profile of the at least one sample based on a location of a maximum speckle intensity difference between consecutive frames in an axial direction; and providing the three-dimensional information associated with the at least one sample as a function of the first interference information, the second interference information, and the surface profile. receiving at least one first electro-magnetic radiation from a sample arm based on a transversely spectrally dispersed electro-magnetic radiation provided to the at least one sample ; the first electro-magnetic radiation including information identifying at least one portion of the at least one sample ; receiving at least one second electro-magnetic radiation from a reference arm ; generating first interference information based on the first and second electro-magnetic radiations , the first interference information being from a first depth within the at least one sample corresponding to a first path length of the reference arm ; obtaining at least one relative phase between the at least one first electro-magnetic radiation being returned from the at least one sample and the at least one second electro-magnetic radiation returned from the reference arm to determine at least one relative depth location of the at least one portion, changing the reference arm from the first path length to a second path length different from the first path length; generating second interference information based on changing the reference arm from the first path length to the second path length, the second interference information being from a second depth or a third depth within the at least one sample ; determining a surface profile of the at least one sample based on a location of a maximum speckle intensity difference between consecutive frames in an axial direction; and providing the three-dimensional information associated with the at least one sample as a function of the first interference information, the second interference information, and the surface profile. <EOS>