A system for the automatic grading of a cut/polished stone under test (SUT) comprising: an enclosure , the enclosure including a stage for mounting the cut/polished SUT, the stage comprising a stage rotation axis, the stage being configured to be rotatable about the stage rotation axis by a rotation device; the enclosure further comprising one or more sources of broadband visible (BBV) light, the sources of BBV light being controllable by a programmed controller; an image sensor for capturing a plurality of images of a mounted SUT; one or more sources of ultraviolet (UV) light mounted in the enclosure ; whereby the image sensor is programmed by the programmed controller to capture images of the mounted SUT from one or more selected angles relative to the position of the SUT on the stage rotation axis; the programmed controller being configured: to activate and control the power level of one or more of the one or more sources of BBV light, to activate and control the power level of one or more of the one or more sources of UV light, to rotate the SUT around the stage rotation axis, and to cause the image sensor to capture one or more images of the cut/polished SUT; an image processing device configured to process the one or more images captured by the image sensor and further configured to grade the cut/polished SUT using light indicative parameters from at least a part of the one or more images captured, whereby the image sensor being mounted on an arm , the arm being rotatable around a sensor elevation axis, the sensor elevation axis being normal to the stage rotation axis, the one or more sources of UV light mounted on the arm in the vicinity of the image sensor , and the programmed controller also being configured to rotate the arm around the sensor elevation axis and to activate and control the image sensor to capture images of the mounted SUT from one or more selected angles relative to the sensor elevation axis. the enclosure further comprising one or more sources of broadband visible (BBV) light, the sources of BBV light being controllable by a programmed controller; an image sensor for capturing a plurality of images of a mounted SUT; one or more sources of ultraviolet (UV) light mounted in the enclosure ; whereby the image sensor is programmed by the programmed controller to capture images of the mounted SUT from one or more selected angles relative to the position of the SUT on the stage rotation axis; the programmed controller being configured: to activate and control the power level of one or more of the one or more sources of BBV light, to activate and control the power level of one or more of the one or more sources of UV light, to rotate the SUT around the stage rotation axis, and to cause the image sensor to capture one or more images of the cut/polished SUT; an image processing device configured to process the one or more images captured by the image sensor and further configured to grade the cut/polished SUT using light indicative parameters from at least a part of the one or more images captured, whereby the image sensor being mounted on an arm , the arm being rotatable around a sensor elevation axis, the sensor elevation axis being normal to the stage rotation axis, the one or more sources of UV light mounted on the arm in the vicinity of the image sensor , and the programmed controller also being configured to rotate the arm around the sensor elevation axis and to activate and control the image sensor to capture images of the mounted SUT from one or more selected angles relative to the sensor elevation axis. <EOS>