An examining apparatus comprising: a group designation acquiring unit configured to acquire designation of a targeted group including a plurality of targeted sensors to be analyzed among a plurality of sensors installed in at least one facility; a sensor data acquiring unit configured to acquire sensor data from each targeted sensor included in the targeted group; a learning unit configured to learn an analysis model by using the sensor data from each targeted sensor included in the targeted group; and an examining unit configured to examine the facility by using the learned analysis model, wherein the learning unit is configured to learn a plurality of types of analysis models by using the sensor data from each targeted sensor included in the targeted group, and characterized in that the examining apparatus further comprises a model selecting unit configured to select at least one analysis model used for examining the facility from among the learned plurality of types of analysis models, wherein the learning unit is configured to learn an analysis model among the plurality of types of analysis models by using the sensor data from all the targeted sensors included in the targeted group, the learning unit is configured to learn a further analysis model among the plurality of types of analysis models by using the sensor data from each targeted sensor, except for some targeted sensors, included in the targeted group, and the model selecting unit is configured to select the further analysis model when sensor data cannot be acquired from the some targeted sensors included in the targeted group. a group designation acquiring unit configured to acquire designation of a targeted group including a plurality of targeted sensors to be analyzed among a plurality of sensors installed in at least one facility; a sensor data acquiring unit configured to acquire sensor data from each targeted sensor included in the targeted group; a learning unit configured to learn an analysis model by using the sensor data from each targeted sensor included in the targeted group; and an examining unit configured to examine the facility by using the learned analysis model, wherein the learning unit is configured to learn a plurality of types of analysis models by using the sensor data from each targeted sensor included in the targeted group, and characterized in that the examining apparatus further comprises a model selecting unit configured to select at least one analysis model used for examining the facility from among the learned plurality of types of analysis models, wherein the learning unit is configured to learn an analysis model among the plurality of types of analysis models by using the sensor data from all the targeted sensors included in the targeted group, the learning unit is configured to learn a further analysis model among the plurality of types of analysis models by using the sensor data from each targeted sensor, except for some targeted sensors, included in the targeted group, and the model selecting unit is configured to select the further analysis model when sensor data cannot be acquired from the some targeted sensors included in the targeted group. <EOS>