A grain-oriented electrical steel sheet comprising a chemical composition containing, in mass%, C: 0.01 % to 0.10 % Si: 2 % to 4 %, Mn: 0.01 % to 0.5 %, and optionally one or more selected from the group consisting of Ni: 0.001 % to 0.15 %, Sb: 0.005 % to 0.50 %, Sn: 0.005 % to 0.20 %, P: 0.01 % to 0.08 %, Bi: 0.005 % to 0.05 %, Mo: 0.005 % to 0.10 %, B: 0.0002 % to 0.0025 %, Cu: 0.01 % to 0.2 %, Te: 0.0005 % to 0.010 %, Cr: 0.01 % to 0.2 %, Nb: 0.0010 % to 0.010 %, V: 0.001 % to 0.010 %, Ti: 0.001 % to 0.010 %, and Ta: 0.001 % to 0.010 %, with the balance consisting of Fe and inevitable impurities, and an insulating film formed on a surface of a steel substrate of the grain-oriented electrical steel sheet, and an anchor part, which is defined as a part where the insulating film partially enters into the steel substrate, wherein a depth of the anchor part from the surface of the steel substrate, which is defined as a clearance for the anchor part where a deepest portion of the anchor part and an insulating film-steel substrate interface portion directly above the deepest portion are farthest from each other observed when a cross-section is observed throughout a region of 200 μm in length using an electron microscope with 2000 magnification, is 3.5 μm or less, and a number of neck parts of 5 μm 2 or less in area is 0.06/μm 2 or less and a number of neck parts of 10 μm 2 to 40 μm 2 in area is 0.005/μm 2 or more and 0.011/μm 2 or less, where each neck part is defined as a remaining part of the insulating film with an area of 0.1 μm 2 or more remaining on the surface of the steel substrate observed as a result of peeling the insulating film from the steel substrate in a bend test for the grain-oriented electrical steel sheet using a reflected electron image obtained with an electron microscope. a chemical composition containing, in mass%, C: 0.01 % to 0.10 % Si: 2 % to 4 %, Mn: 0.01 % to 0.5 %, and optionally one or more selected from the group consisting of Ni: 0.001 % to 0.15 %, Sb: 0.005 % to 0.50 %, Sn: 0.005 % to 0.20 %, P: 0.01 % to 0.08 %, Bi: 0.005 % to 0.05 %, Mo: 0.005 % to 0.10 %, B: 0.0002 % to 0.0025 %, Cu: 0.01 % to 0.2 %, Te: 0.0005 % to 0.010 %, Cr: 0.01 % to 0.2 %, Nb: 0.0010 % to 0.010 %, V: 0.001 % to 0.010 %, Ti: 0.001 % to 0.010 %, and Ta: 0.001 % to 0.010 %, with the balance consisting of Fe and inevitable impurities, and an anchor part, which is defined as a part where the insulating film partially enters into the steel substrate, wherein a depth of the anchor part from the surface of the steel substrate, which is defined as a clearance for the anchor part where a deepest portion of the anchor part and an insulating film-steel substrate interface portion directly above the deepest portion are farthest from each other observed when a cross-section is observed throughout a region of 200 μm in length using an electron microscope with 2000 magnification, is 3.5 μm or less, and a number of neck parts of 5 μm 2 or less in area is 0.06/μm 2 or less and a number of neck parts of 10 μm 2 to 40 μm 2 in area is 0.005/μm 2 or more and 0.011/μm 2 or less, where each neck part is defined as a remaining part of the insulating film with an area of 0.1 μm 2 or more remaining on the surface of the steel substrate observed as a result of peeling the insulating film from the steel substrate in a bend test for the grain-oriented electrical steel sheet using a reflected electron image obtained with an electron microscope. <EOS>