A system for the 3D measurement of the shape of a material object , comprising: a light projector for projecting a structured light pattern onto a surface of said object , wherein said light projector comprises a light source , a slide with a slide pattern located on a slide surface, and a projector lens with a projector lens vertex ; a device for capturing an image of said structured light pattern reflected on said object, wherein said device for capturing an image comprises a device lens with a device lens vertex ; and a computing device for determining a measurement relating to the shape of said object using a triangulation algorithm based on a correspondence between points in said slide pattern and said image; wherein said slide pattern comprises a plurality of coded elements , wherein the coded elements include two coded elements represented by regions of different thickness so that their sequence forms a solid line with varying thicknesses of varying lengths, wherein each of said coded elements is assigned to one of at least a first group or a second group, each of which at least said first group and said second group comprising at least two of said coded elements, wherein at least a first meridian and a second meridian are defined on said slide surface, where said first meridian is defined by an intersection between said slide surface and a first plane passing through said projector lens vertex and through said device lens vertex , and said second meridian is defined by an intersection between said slide surface and a second plane passing through said projector lens vertex and through said device lens vertex, and wherein said coded elements of said first group are located along said first meridian and said coded elements of said second group are located along said second meridian. a light projector for projecting a structured light pattern onto a surface of said object , wherein said light projector comprises a light source , a slide with a slide pattern located on a slide surface, and a projector lens with a projector lens vertex ; a device for capturing an image of said structured light pattern reflected on said object, wherein said device for capturing an image comprises a device lens with a device lens vertex ; and a computing device for determining a measurement relating to the shape of said object using a triangulation algorithm based on a correspondence between points in said slide pattern and said image; wherein said slide pattern comprises a plurality of coded elements , wherein the coded elements include two coded elements represented by regions of different thickness so that their sequence forms a solid line with varying thicknesses of varying lengths, wherein each of said coded elements is assigned to one of at least a first group or a second group, each of which at least said first group and said second group comprising at least two of said coded elements, wherein at least a first meridian and a second meridian are defined on said slide surface, where said first meridian is defined by an intersection between said slide surface and a first plane passing through said projector lens vertex and through said device lens vertex , and said second meridian is defined by an intersection between said slide surface and a second plane passing through said projector lens vertex and through said device lens vertex, and wherein said coded elements of said first group are located along said first meridian and said coded elements of said second group are located along said second meridian. <EOS>