A test specimen (R) for X-ray inspection systems, a) comprising a preferably monolithic profile block (A) formed from a first material (M A ) and a preferably monolithic counter-block (B), the material (M B ) of which differs in at least one property from the first material (M A ), wherein the profile block (A) and the counter-block (B) extends in a longitudinal direction (X), a transverse direction (Y) extends at right angles thereto and a height direction (Z) extends perpendicularly to the two directions (X, Y), b) wherein the profile block (A) has a number of areas with different thicknesses in the Z-direction (D A1 , D A2 , ...) and wherein the counter-block (B) has a number of areas with different thicknesses in the Z-direction (D B1, D B2 , ...), c) wherein the profile block (A) and the counter-block (B) can be arranged one above the other in a predeterminable test arrangement in the Z-direction in order to jointly form material pairs which can be radiated through in the Z-direction and are different from one another, d) in that the thicknesses of the profile block and of the counter-block are combined with one another in an X-Y matrix, in that in the X direction at least two, preferably all, different thicknesses of the profile block (A) are combined with a thickness of the counter-block (B), while in the Y direction at least two, preferably all, different thicknesses of the counter-block (B) are combined with a thickness of the profile block (A) characterized in that e) the test arrangement forms segments of the same total thickness arranged along diagonals, each with different individual thicknesses (D A , D B ), f) wherein along each diagonal all segments of a diagonal have a respective constant total thickness. a) comprising a preferably monolithic profile block (A) formed from a first material (M A ) and a preferably monolithic counter-block (B), the material (M B ) of which differs in at least one property from the first material (M A ), wherein the profile block (A) and the counter-block (B) extends in a longitudinal direction (X), a transverse direction (Y) extends at right angles thereto and a height direction (Z) extends perpendicularly to the two directions (X, Y), b) wherein the profile block (A) has a number of areas with different thicknesses in the Z-direction (D A1 , D A2 , ...) and wherein the counter-block (B) has a number of areas with different thicknesses in the Z-direction (D B1, D B2 , ...), c) wherein the profile block (A) and the counter-block (B) can be arranged one above the other in a predeterminable test arrangement in the Z-direction in order to jointly form material pairs which can be radiated through in the Z-direction and are different from one another, d) in that the thicknesses of the profile block and of the counter-block are combined with one another in an X-Y matrix, in that in the X direction at least two, preferably all, different thicknesses of the profile block (A) are combined with a thickness of the counter-block (B), while in the Y direction at least two, preferably all, different thicknesses of the counter-block (B) are combined with a thickness of the profile block (A) characterized in that e) the test arrangement forms segments of the same total thickness arranged along diagonals, each with different individual thicknesses (D A , D B ), f) wherein along each diagonal all segments of a diagonal have a respective constant total thickness. <EOS>