A sensor assembly comprising: a capacitive probe ; a resistive element , wherein a capacitance of the capacitive probe and a resistance of the resistive element are indicative of characteristics of an environment; an electronic circuit configured to convert the capacitance and the resistance into optical data, wherein the electronic circuit comprises: a sensor interface circuit configured to provide timing signals indicative of the capacitance and the resistance, wherein the sensor interface circuit comprises: an operational amplifier a first signal path configured to excite the capacitive probe and a reference resistance (R REF ); wherein an output of the reference resistor (R REF ) is connected to an inverting input of the operational amplifier, and the capacitive probe is connected between the output of resistor (R REF ) and the output of the operational amplifier; and a second signal path configured to excite the resistive element and a reference capacitance (C REF ); wherein an output of the resistive element is connected to the inverting input of the operational amplifier, and the reference capacitance (C REF ) is connected between the output of the resistive element and the output of the operational amplifier; wherein the sensor interface circuit is configured to select between the first signal path and the second signal path; and a controller configured to control the sensor interface circuit to select between the first signal path and the second signal path, and to convert the timing signals into the optical data; and an optical interface configured to provide the optical data to an optical link . a capacitive probe ; a resistive element , wherein a capacitance of the capacitive probe and a resistance of the resistive element are indicative of characteristics of an environment; a sensor interface circuit configured to provide timing signals indicative of the capacitance and the resistance, wherein the sensor interface circuit comprises: an operational amplifier a first signal path configured to excite the capacitive probe and a reference resistance (R REF ); wherein an output of the reference resistor (R REF ) is connected to an inverting input of the operational amplifier, and the capacitive probe is connected between the output of resistor (R REF ) and the output of the operational amplifier; and a second signal path configured to excite the resistive element and a reference capacitance (C REF ); wherein an output of the resistive element is connected to the inverting input of the operational amplifier, and the reference capacitance (C REF ) is connected between the output of the resistive element and the output of the operational amplifier; wherein the sensor interface circuit is configured to select between the first signal path and the second signal path; and an operational amplifier a first signal path configured to excite the capacitive probe and a reference resistance (R REF ); wherein an output of the reference resistor (R REF ) is connected to an inverting input of the operational amplifier, and the capacitive probe is connected between the output of resistor (R REF ) and the output of the operational amplifier; and a second signal path configured to excite the resistive element and a reference capacitance (C REF ); wherein an output of the resistive element is connected to the inverting input of the operational amplifier, and the reference capacitance (C REF ) is connected between the output of the resistive element and the output of the operational amplifier; wherein the sensor interface circuit is configured to select between the first signal path and the second signal path; and a controller configured to control the sensor interface circuit to select between the first signal path and the second signal path, and to convert the timing signals into the optical data; and an optical interface configured to provide the optical data to an optical link . <EOS>