Detection system for detecting defects on specular or semi-specular surfaces of objects to be inspected, suitable for its integration in an industrial production line, the system comprising: - a plurality of light emission means for emitting light onto the objects; - a plurality of cameras for detecting the light reflected by the objects; - a subsystem for control and photogrammetric analysis of information associated with the light emitted by the light emission means and with the light detected by the cameras ; - a supporting structure in which the light emission means and the cameras of the system are arranged; wherein the light emission means are arranged in the system such that the light emitted onto the surface of the objects has a periodic pattern of light and shade, and in that said pattern has relative movement with respect to the objects to be inspected, so as to move across the surface thereof, wherein the system is adapted such that the relative movement between the periodic pattern of light and shade areas and the objects to be inspected, is produced through the movement in one or more directions of the pattern emitted onto the objects to be inspected while said objects remain stationary, and wherein the emitted periodic pattern of light and shade is a checkered pattern, a grating consisting of squares or triangles, or a pattern consisting of dots, straight lines, circles, or crosses, characterized in that , the subsystem for control and analysis of information in turn comprises means for processing and treatment by means of photogrammetric projection of the images captured by the cameras , wherein 3D coordinates of the defects can be obtained from 2D information of possible defects on the nominal surface of the inspected object and wherein the system is adapted to generate the emitted periodic pattern of light and shade areas having a shape adapting to the surface of the objects to be inspected, such that said pattern shape varies depending on the curvature of the inspected surface. - a plurality of light emission means for emitting light onto the objects; - a plurality of cameras for detecting the light reflected by the objects; - a subsystem for control and photogrammetric analysis of information associated with the light emitted by the light emission means and with the light detected by the cameras ; - a supporting structure in which the light emission means and the cameras of the system are arranged; wherein the light emission means are arranged in the system such that the light emitted onto the surface of the objects has a periodic pattern of light and shade, and in that said pattern has relative movement with respect to the objects to be inspected, so as to move across the surface thereof, wherein the system is adapted such that the relative movement between the periodic pattern of light and shade areas and the objects to be inspected, is produced through the movement in one or more directions of the pattern emitted onto the objects to be inspected while said objects remain stationary, and wherein the emitted periodic pattern of light and shade is a checkered pattern, a grating consisting of squares or triangles, or a pattern consisting of dots, straight lines, circles, or crosses, characterized in that , the subsystem for control and analysis of information in turn comprises means for processing and treatment by means of photogrammetric projection of the images captured by the cameras , wherein 3D coordinates of the defects can be obtained from 2D information of possible defects on the nominal surface of the inspected object and wherein the system is adapted to generate the emitted periodic pattern of light and shade areas having a shape adapting to the surface of the objects to be inspected, such that said pattern shape varies depending on the curvature of the inspected surface. <EOS>