Optical equipment used for inspecting and addressing a sample (S) placed on an inspected site of a specimen having the inspected site and an address coding site , wherein the optical equipment comprises: - a controller , - actuators , - a processing module , and - an optical device , the optical device comprising: - a light source ; - a sample inspecting device comprising a first objective lens and a first detector , wherein a beam (L1) of the light source is focused on the sample (S) placed on the inspected site by the first objective lens ; and - an address detecting device comprising a second objective lens and a second detector , wherein a beam (L2) of the light source is focused on the address coding site by the second objective lens ; and wherein the actuators are for respectively controlling the movement of the first and second objective lenses on receiving commands from the controller such that the beam (L1) of the light source is focused onto several sampling points (P1, P2) of the inspected site such as to generate several first optical signals (S1), and simultaneously the beam (L2) of the light source is focused onto several address codes (C1, C2) of the address coding site such as to generate several second optical signals (S2), and such that all of relative positions between each sampling point (P1, P2) and its corresponding address code (C1, C2) are the same, and wherein the processing module is adapted to calculate and obtain registered image or signal information of the specimen according to the first and the second optical signals (S1, S2). - a controller , - actuators , - a processing module , and - an optical device , the optical device comprising: - a light source ; - a sample inspecting device comprising a first objective lens and a first detector , wherein a beam (L1) of the light source is focused on the sample (S) placed on the inspected site by the first objective lens ; and - an address detecting device comprising a second objective lens and a second detector , wherein a beam (L2) of the light source is focused on the address coding site by the second objective lens ; and wherein the actuators are for respectively controlling the movement of the first and second objective lenses on receiving commands from the controller such that the beam (L1) of the light source is focused onto several sampling points (P1, P2) of the inspected site such as to generate several first optical signals (S1), and simultaneously the beam (L2) of the light source is focused onto several address codes (C1, C2) of the address coding site such as to generate several second optical signals (S2), and such that all of relative positions between each sampling point (P1, P2) and its corresponding address code (C1, C2) are the same, and wherein the processing module is adapted to calculate and obtain registered image or signal information of the specimen according to the first and the second optical signals (S1, S2). - a light source ; - a sample inspecting device comprising a first objective lens and a first detector , wherein a beam (L1) of the light source is focused on the sample (S) placed on the inspected site by the first objective lens ; and - an address detecting device comprising a second objective lens and a second detector , <EOS>