A method for calculating processing parameters for residual stress control by parameter inversion, characterized by the following steps: (a) for a workpiece to be processed, acquiring a residual stress distribution curve of a processed surface layer, extracting a plurality of characteristic indexes Drs reflecting the residual stress distribution characteristic from the curve and simultaneously acquiring a plurality of processing parameters A i ( i = 1,2,3... n ) corresponding to the characteristic indexes, where i is a serial number of the processing parameter and n is the total number of the processing parameters; (b) presetting initial values a 10 ,a 20 ,.. .a i 0 , ..., a n 0 of the respective processing parameters A i , calculating an initial value H ( a 10 ,a 20 ,.. .a i 0 , ..., a n 0 ) of the characteristic index according to the initial values of the processing parameters, and respectively drawing curves of the characteristic indexes Drs over the respective processing parameters A i to obtain respective fitted curves Drs ( A i ) simultaneously; (c) by combining the initial values and the fitted curves of the characteristic index obtained in the step (b), establishing the following relation formulas (i), (ii) and (iii) to calculate respective characteristic index increments Δ Drs A i and the total characteristic index increment Δ Drs, where i is an arbitrary integer and n is the total number of the processing parameters, Δ Drs A i = Drs A i − H a 10 , a 20 , ... , a i 0 , ... , a n 0 Δ Drs = ∑ i = 1 Δ Drs A i Δ Drs = Drs − H a 10 , a 20 , ... , a i 0 , ... , a n 0 (d) assigning values to the characteristic indexes Drs and the characteristic index increments Δ Drs A i corresponding to the required residual stress and performing inversion calculation in combination with the relation formulas in the step (c) so as to obtain values of the processing parameters A i corresponding to the required residual stress. (a) for a workpiece to be processed, acquiring a residual stress distribution curve of a processed surface layer, extracting a plurality of characteristic indexes Drs reflecting the residual stress distribution characteristic from the curve and simultaneously acquiring a plurality of processing parameters A i ( i = 1,2,3... n ) corresponding to the characteristic indexes, where i is a serial number of the processing parameter and n is the total number of the processing parameters; (b) presetting initial values a 10 ,a 20 ,.. .a i 0 , ..., a n 0 of the respective processing parameters A i , calculating an initial value H ( a 10 ,a 20 ,.. .a i 0 , ..., a n 0 ) of the characteristic index according to the initial values of the processing parameters, and respectively drawing curves of the characteristic indexes Drs over the respective processing parameters A i to obtain respective fitted curves Drs ( A i ) simultaneously; (c) by combining the initial values and the fitted curves of the characteristic index obtained in the step (b), establishing the following relation formulas (i), (ii) and (iii) to calculate respective characteristic index increments Δ Drs A i and the total characteristic index increment Δ Drs, where i is an arbitrary integer and n is the total number of the processing parameters, Δ Drs A i = Drs A i − H a 10 , a 20 , ... , a i 0 , ... , a n 0 Δ Drs = ∑ i = 1 Δ Drs A i Δ Drs = Drs − H a 10 , a 20 , ... , a i 0 , ... , a n 0 (d) assigning values to the characteristic indexes Drs and the characteristic index increments Δ Drs A i corresponding to the required residual stress and performing inversion calculation in combination with the relation formulas in the step (c) so as to obtain values of the processing parameters A i corresponding to the required residual stress. <EOS>