Method for magnified imaging of samples, wherein a. at least two slices of a sample, specifically a first slice and at least one further slice, which are present on at least one sample carrier , are imaged in a magnified fashion using a device for magnified imaging of samples, wherein the sample carrier is connected to the device by means of a sample-carrier receptacle, and wherein the position of the imaged sample-carrier regions in relation to the device and the utilized magnification level is captured, b. local coordinate systems specific to the respective slice are defined by means of at least one selected feature contained in the image information of the slices imaged in a magnified fashion, for the at least two slices imaged in a magnified fashion, c. at least one region (selection region, 13) is selected within at least one of the slices imaged in a magnified fashion, wherein the selection region is defined as an image section, and the relative position of this at least one selection region with respect to the local coordinate system defined for the respective first slice and the position thereof in relation to the device are established and the relative position of the local coordinate system and the reference system of the device are related to one another, d. the relative position of this at least one selection region is transferred into the local coordinate system of the at least one further slice imaged in a magnified fashion in order to set at least one corresponding neighbouring region on the further slice, e. the position of the neighbouring region in relation to the device is established, and f. the at least one selection region on the first slice set in advance and/or the at least one corresponding neighbouring region on the further slice are targeted by the device and is/are imaged in a magnified fashion, characterized in that structures artificially introduced into the uncut sample are selected in order to define the local coordinate systems. a. at least two slices of a sample, specifically a first slice and at least one further slice, which are present on at least one sample carrier , are imaged in a magnified fashion using a device for magnified imaging of samples, wherein the sample carrier is connected to the device by means of a sample-carrier receptacle, and wherein the position of the imaged sample-carrier regions in relation to the device and the utilized magnification level is captured, b. local coordinate systems specific to the respective slice are defined by means of at least one selected feature contained in the image information of the slices imaged in a magnified fashion, for the at least two slices imaged in a magnified fashion, c. at least one region (selection region, 13) is selected within at least one of the slices imaged in a magnified fashion, wherein the selection region is defined as an image section, and the relative position of this at least one selection region with respect to the local coordinate system defined for the respective first slice and the position thereof in relation to the device are established and the relative position of the local coordinate system and the reference system of the device are related to one another, d. the relative position of this at least one selection region is transferred into the local coordinate system of the at least one further slice imaged in a magnified fashion in order to set at least one corresponding neighbouring region on the further slice, e. the position of the neighbouring region in relation to the device is established, and f. the at least one selection region on the first slice set in advance and/or the at least one corresponding neighbouring region on the further slice are targeted by the device and is/are imaged in a magnified fashion, <EOS>