A method for testing of a population of monocrystalline components , the method comprising the steps of: obtaining a plurality of component parameters associated with the population of monocrystalline components , wherein the plurality of component parameters comprises; a crystal orientation of each monocrystalline component from the population of monocrystalline components with respect to a coordinate axis common to the population of monocrystalline components , a three-dimensional geometry common to the population of monocrystalline components , and a material common to the population of monocrystalline components , wherein the crystal orientation comprises a crystal angle (A) relative to the coordinate axis ; determining a statistical parameter associated with the population of monocrystalline components based on a statistical distribution of the crystal angle (A) across the population of monocrystalline components ; generating a simulation model of the monocrystalline component representative of the population of monocrystalline components based at least partially on the statistical parameter , the three-dimensional geometry , and the material ; determining at least one probe parameter of an inspection probe arrangement based at least partially on the simulation model and a predetermined region of interest in the three-dimensional geometry , wherein the inspection probe arrangement comprises at least one probe configured to emit ultrasonic waves ; determining anisotropic delay laws based at least partially on the statistical parameter and the least one probe parameter ; and controlling the at least one probe based on the anisotropic delay laws to emit the ultrasonic waves towards the region of interest of at least one monocrystalline component from the population of monocrystalline components in order to test the at least one monocrystalline component for one or more abnormalities . obtaining a plurality of component parameters associated with the population of monocrystalline components , wherein the plurality of component parameters comprises; a crystal orientation of each monocrystalline component from the population of monocrystalline components with respect to a coordinate axis common to the population of monocrystalline components , a three-dimensional geometry common to the population of monocrystalline components , and a material common to the population of monocrystalline components , wherein the crystal orientation comprises a crystal angle (A) relative to the coordinate axis ; determining a statistical parameter associated with the population of monocrystalline components based on a statistical distribution of the crystal angle (A) across the population of monocrystalline components ; generating a simulation model of the monocrystalline component representative of the population of monocrystalline components based at least partially on the statistical parameter , the three-dimensional geometry , and the material ; determining at least one probe parameter of an inspection probe arrangement based at least partially on the simulation model and a predetermined region of interest in the three-dimensional geometry , wherein the inspection probe arrangement comprises at least one probe configured to emit ultrasonic waves ; determining anisotropic delay laws based at least partially on the statistical parameter and the least one probe parameter ; and controlling the at least one probe based on the anisotropic delay laws to emit the ultrasonic waves towards the region of interest of at least one monocrystalline component from the population of monocrystalline components in order to test the at least one monocrystalline component for one or more abnormalities . <EOS>