A method for non-destructively inspecting a bond line in an adhesive material layer of a composite substrate of a structure that carries loads of a vehicle , for the purpose of detecting anomalies within the adhesive material, said method comprising: positioning a small angle X-ray scattering system proximate to a the composite substrate , said composite substrate comprising an adhesive material layer interposed between a composite substrate first side and a composite substrate second side , said adhesive material layer further comprising a bond line region, with said small angle X-ray scattering system comprising first side small angle X-ray scattering system components positioned on the composite substrate first side, said first side small angle X-ray scattering system components comprising: an X-ray source ; a first pinhole aperture and a second pinhole aperture positioned a predetermined distance from the X-ray source ; a first vacuum chamber positioned proximate to the pinhole aperture and the composite substrate first side; and with said small angle X-ray scattering system comprising second side small angle X-ray scattering system components positioned on the composite substrate second side, said composite substrate second side small angle X-ray scattering system components comprising: a second vacuum chamber positioned proximate to the composite second side, said second vacuum chamber in communication with an X-ray scintillator ; a charged coupled device in communication with the X-ray scintillator, said X-ray scintillator comprising a scintillating layer ; activating the small angle X-ray scattering system to emit an X-ray beam from the X-ray source; detecting scattered X-rays on the scintillating layer; generating imaging signals based on the scattered X-rays impacting the scintillating layer; and sending an imaging signal of the scattered X-rays generated on the scintillating layer to imaging software; generating a bond line image ; and displaying the bond line image on a display . positioning a small angle X-ray scattering system proximate to a the composite substrate , said composite substrate comprising an adhesive material layer interposed between a composite substrate first side and a composite substrate second side , said adhesive material layer further comprising a bond line region, with said small angle X-ray scattering system comprising first side small angle X-ray scattering system components positioned on the composite substrate first side, said first side small angle X-ray scattering system components comprising: an X-ray source ; a first pinhole aperture and a second pinhole aperture positioned a predetermined distance from the X-ray source ; a first vacuum chamber positioned proximate to the pinhole aperture and the composite substrate first side; and an X-ray source ; a first pinhole aperture and a second pinhole aperture positioned a predetermined distance from the X-ray source ; a first vacuum chamber positioned proximate to the pinhole aperture and the composite substrate first side; and a second vacuum chamber positioned proximate to the composite second side, said second vacuum chamber in communication with an X-ray scintillator ; a charged coupled device in communication with the X-ray scintillator, said X-ray scintillator comprising a scintillating layer ; activating the small angle X-ray scattering system to emit an X-ray beam from the X-ray source; detecting scattered X-rays on the scintillating layer; generating imaging signals based on the scattered X-rays impacting the scintillating layer; and sending an imaging signal of the scattered X-rays generated on the scintillating layer to imaging software; generating a bond line image ; and displaying the bond line image on a display . <EOS>