A voltage generating circuit that generates a comparison reference voltage having temperature characteristics proportional to output temperature characteristics of a current detecting element (q1, q2) by resistance-dividing a predetermined power supply voltage, the voltage generating circuit comprising: a first resistance voltage dividing circuit , configured by low temperature coefficient resistors (LTC) whose resistance temperature coefficient can be taken to be practically zero being connected in series, that generates a reference voltage by resistance-dividing the power supply voltage; a plurality of second resistance voltage dividing circuits , each configured by a resistor (HR, NR) having a positive or negative resistance temperature coefficient and the low temperature coefficient resistor (LTC) being connected in series, that generates a temperature-dependent divided voltage by resistance-dividing the power supply voltage; an instrumentation amplifier that generates the comparison reference voltage in accordance with a difference between the reference voltage and the divided voltage; and a comparator that, when the divided voltage exceeds a predetermined voltage threshold in accompaniment to a temperature rise, changes the divided voltage generated by the second resistance voltage dividing circuit and applied to the instrumentation amplifier , wherein the second resistance voltage dividing circuit generates a plurality of divided voltages of differing temperature gradients, and the comparator selects a divided voltage with a small temperature gradient from the plurality of divided voltages at a time of normal temperature and applies the selected divided voltage to the instrumentation amplifier , and when the divided voltage with the small temperature gradient exceeds a predetermined voltage threshold, the comparator selects a divided voltage with a large temperature gradient and applies the selected divided voltage to the instrumentation amplifier . a first resistance voltage dividing circuit , configured by low temperature coefficient resistors (LTC) whose resistance temperature coefficient can be taken to be practically zero being connected in series, that generates a reference voltage by resistance-dividing the power supply voltage; a plurality of second resistance voltage dividing circuits , each configured by a resistor (HR, NR) having a positive or negative resistance temperature coefficient and the low temperature coefficient resistor (LTC) being connected in series, that generates a temperature-dependent divided voltage by resistance-dividing the power supply voltage; an instrumentation amplifier that generates the comparison reference voltage in accordance with a difference between the reference voltage and the divided voltage; and a comparator that, when the divided voltage exceeds a predetermined voltage threshold in accompaniment to a temperature rise, changes the divided voltage generated by the second resistance voltage dividing circuit and applied to the instrumentation amplifier , wherein the second resistance voltage dividing circuit generates a plurality of divided voltages of differing temperature gradients, and the comparator selects a divided voltage with a small temperature gradient from the plurality of divided voltages at a time of normal temperature and applies the selected divided voltage to the instrumentation amplifier , and when the divided voltage with the small temperature gradient exceeds a predetermined voltage threshold, the comparator selects a divided voltage with a large temperature gradient and applies the selected divided voltage to the instrumentation amplifier . <EOS>