A method of scanning a sample with a light beam focused by a microscope objective lens in scanning light microscopy, the method comprising - arranging a first electro-optical deflector in a beam path of the light beam upstream the microscope objective lens ; - rotating a polarization direction of the light beam by means of the first electro-optical deflector between a first polarization direction with which the light beam is deflected by a first polarization beam splitter of the first electro-optical deflector by a first angle in the first spatial direction and a second polarization direction with which the light beam is deflected by the first polarization beam splitter by a second angle in the first spatial direction; - arranging a second electro-optical deflector in the beam path of the light beam upstream the microscope objective lens ; and - rotating the polarization direction of the light beam by means of the second electro-optical deflector between a third polarization direction with which the light beam is deflected by a second polarization beam splitter of the second electro-optical deflector by a third angle in the first spatial direction and a fourth polarization direction with which the light beam is deflected by the second polarization beam splitter by a fourth angle in the first spatial direction; - wherein a second angle difference between the third and the fourth angles in the first spatial direction is at least 1.5-times a first angle difference between the first and the second angles in the first spatial direction, characterized in that arranging the first and second electro-optical deflectors in the beam path of the light beam and rotating the polarization direction of the light beam by means of the first and second electro-optical deflectors are coordinated such that the light beam is tilted about a fixed point in a pupil of the microscope objective lens in the first spatial direction. - arranging a first electro-optical deflector in a beam path of the light beam upstream the microscope objective lens ; - rotating a polarization direction of the light beam by means of the first electro-optical deflector between a first polarization direction with which the light beam is deflected by a first polarization beam splitter of the first electro-optical deflector by a first angle in the first spatial direction and a second polarization direction with which the light beam is deflected by the first polarization beam splitter by a second angle in the first spatial direction; - arranging a second electro-optical deflector in the beam path of the light beam upstream the microscope objective lens ; and - rotating the polarization direction of the light beam by means of the second electro-optical deflector between a third polarization direction with which the light beam is deflected by a second polarization beam splitter of the second electro-optical deflector by a third angle in the first spatial direction and a fourth polarization direction with which the light beam is deflected by the second polarization beam splitter by a fourth angle in the first spatial direction; - wherein a second angle difference between the third and the fourth angles in the first spatial direction is at least 1.5-times a first angle difference between the first and the second angles in the first spatial direction, <EOS>