Method for SPIM microscopy using a microscope comprising - an illumination device comprising an illumination light source (L1, L2) and an illumination beam path for illuminating a specimen (P) by way of a light sheet (LB), - a detection device for detecting light emitted by the specimen, comprising an objective (O), - wherein the light sheet (LB) is substantially planar in the focus (FE) of the objective (O) or in a defined plane in the vicinity of the focus (FE) of the imaging objective (O) and the objective (O) has an optical axis which intersects the plane of the light sheet (LB) at an angle that differs from zero, preferably at right angles, and adjustment means are provided for adjusting the illumination beam path at least along the optical axis of the detection objective (O), wherein to measure different specimen planes by way of the light sheet (LB) a relative movement of specimen (P) and focal plane (FE) of the detection is implemented in the direction of the optical axis of the objective (O) and an image stack is recorded, characterized in that - in a first step there is a calibration on the basis of the specimen (P) by virtue of the actual relative position of the light sheet (LB) being measured as a function of the relative position of the specimen (P) in different specimen planes as sampling planes, and a respective adjustment position of the light sheet is ascertained, and - in a second step there is an adjustment of the relative position of the light sheet (LB) in relation to the focal plane (FE) of the detection objective (O) by moving the light sheet (LB) at least in the Z-direction in relation to the specimen (P), at the same time as or following the relative specimen adjustment into a new Z-plane, wherein the specific adjustment position for specimen planes between the sampling planes is interpolated by way of a function. - an illumination device comprising an illumination light source (L1, L2) and an illumination beam path for illuminating a specimen (P) by way of a light sheet (LB), - a detection device for detecting light emitted by the specimen, comprising an objective (O), - wherein the light sheet (LB) is substantially planar in the focus (FE) of the objective (O) or in a defined plane in the vicinity of the focus (FE) of the imaging objective (O) and the objective (O) has an optical axis which intersects the plane of the light sheet (LB) at an angle that differs from zero, preferably at right angles, and adjustment means are provided for adjusting the illumination beam path at least along the optical axis of the detection objective (O), - in a first step there is a calibration on the basis of the specimen (P) by virtue of the actual relative position of the light sheet (LB) being measured as a function of the relative position of the specimen (P) in different specimen planes as sampling planes, and a respective adjustment position of the light sheet is ascertained, and - in a second step there is an adjustment of the relative position of the light sheet (LB) in relation to the focal plane (FE) of the detection objective (O) by moving the light sheet (LB) at least in the Z-direction in relation to the specimen (P), at the same time as or following the relative specimen adjustment into a new Z-plane, wherein the specific adjustment position for specimen planes between the sampling planes is interpolated by way of a function. <EOS>