A circuit for measuring a resistance, comprising: a resistive element having a resistance to be measured; a sensor circuit to generate a differential voltage (ΔV BE ) dependent on the resistance of the resistive element, the sensor circuit comprising: a first and a second path each including a diode element and an output terminal (VBE1, VBE2), one of the first and second paths including the resistive element ; a reference circuit to generate a differential reference voltage (ΔV BE_REF ), the reference circuit comprising: a first and a second path each including a current source and a diode element , the current sources configured to supply a substantially different current; a first and a second output terminal (VBE3, VBE4), the first output terminal (VBE3) configured to selectively supply a voltage from one of the first and second paths of the reference circuit and the second output terminal (VBE4) configured to selectively supply a voltage from the other one of the first and second paths of the reference circuit; a sigma-delta converter circuit comprising a first stage and a downstream connected second stage , the first stage comprising: a first and a second capacitor (C2P, C1P) and an integration element , the first capacitor (C2P) selectively coupled to one of the output terminals (VBE1, VBE2) of the sensor circuit and the second capacitor (C1P) coupled to one of the first and second output terminals (VBE3, VBE4) of the reference circuit ; and the second stage comprising an output terminal configured to provide a bitstream (BS) dependent on the resistance to be measured. a resistive element having a resistance to be measured; a sensor circuit to generate a differential voltage (ΔV BE ) dependent on the resistance of the resistive element, the sensor circuit comprising: a first and a second path each including a diode element and an output terminal (VBE1, VBE2), one of the first and second paths including the resistive element ; a reference circuit to generate a differential reference voltage (ΔV BE_REF ), the reference circuit comprising: a first and a second path each including a current source and a diode element , the current sources configured to supply a substantially different current; a first and a second output terminal (VBE3, VBE4), the first output terminal (VBE3) configured to selectively supply a voltage from one of the first and second paths of the reference circuit and the second output terminal (VBE4) configured to selectively supply a voltage from the other one of the first and second paths of the reference circuit; a first and a second path each including a current source and a diode element , the current sources configured to supply a substantially different current; a first and a second output terminal (VBE3, VBE4), the first output terminal (VBE3) configured to selectively supply a voltage from one of the first and second paths of the reference circuit and the second output terminal (VBE4) configured to selectively supply a voltage from the other one of the first and second paths of the reference circuit; a sigma-delta converter circuit comprising a first stage and a downstream connected second stage , the first stage comprising: a first and a second capacitor (C2P, C1P) and an integration element , the first capacitor (C2P) selectively coupled to one of the output terminals (VBE1, VBE2) of the sensor circuit and the second capacitor (C1P) coupled to one of the first and second output terminals (VBE3, VBE4) of the reference circuit ; and the second stage comprising an output terminal configured to provide a bitstream (BS) dependent on the resistance to be measured. <EOS>