A system for identifying a product ion as suitable for quantification, which product ion does not include an interference, comprising: a separation device configured to perform a separation technique on a first sample; a tandem mass spectrometer configured to analyze the first sample using one or more precursor scans; and a processor in communication with the tandem mass spectrometer that is configured to: receive a first full product ion spectrum for a mass range of an analyte in the first sample from the tandem mass spectrometer , calculate a first set of one or more peak parameters for a monitored product ion in the first full product ion spectrum using a first extracted ion chromatogram window width to thereby calculate peak parameters at high extracted ion chromatogram resolution, calculate a second set of one or more peak parameters for the monitored product ion in the first full product ion spectrum using a second extracted ion chromatogram window width to thereby calculate peak parameters at low extracted ion chromatogram resolution, wherein the first extracted ion chromatogram window width is narrower than the second extracted ion chromatogram window width, such that the second extracted ion chromatogram window width is configured to maximize sensitivity, and the first extracted ion chromatogram window width is configured to recover specificity, and identify the product ion as not including an interference, if the first set of one or more peak parameters and the second set of one or more peak parameters are substantially the same . a separation device configured to perform a separation technique on a first sample; a tandem mass spectrometer configured to analyze the first sample using one or more precursor scans; and a processor in communication with the tandem mass spectrometer that is configured to: receive a first full product ion spectrum for a mass range of an analyte in the first sample from the tandem mass spectrometer , calculate a first set of one or more peak parameters for a monitored product ion in the first full product ion spectrum using a first extracted ion chromatogram window width to thereby calculate peak parameters at high extracted ion chromatogram resolution, calculate a second set of one or more peak parameters for the monitored product ion in the first full product ion spectrum using a second extracted ion chromatogram window width to thereby calculate peak parameters at low extracted ion chromatogram resolution, receive a first full product ion spectrum for a mass range of an analyte in the first sample from the tandem mass spectrometer , calculate a first set of one or more peak parameters for a monitored product ion in the first full product ion spectrum using a first extracted ion chromatogram window width to thereby calculate peak parameters at high extracted ion chromatogram resolution, calculate a second set of one or more peak parameters for the monitored product ion in the first full product ion spectrum using a second extracted ion chromatogram window width to thereby calculate peak parameters at low extracted ion chromatogram resolution, wherein the first extracted ion chromatogram window width is narrower than the second extracted ion chromatogram window width, such that the second extracted ion chromatogram window width is configured to maximize sensitivity, and the first extracted ion chromatogram window width is configured to recover specificity, and identify the product ion as not including an interference, if the first set of one or more peak parameters and the second set of one or more peak parameters are substantially the same . <EOS>