A broadband hyperspectral imaging spectrophotometer configured to analyze an object (O), said spectrophotometer comprising: an illumination assembly (ES, ES') comprising a source (S, S') for emitting a light beam, said assembly being configured such that the light beam scans line by line the object (O) to be analyzed; a focusing mirror (M2) configured to receive the light beam emitted by the illumination assembly (ES, ES'); a first fold mirror (M1) configured so as to face the focusing mirror (M2) to receive the light beam reflected by the focusing mirror (M2); a rotatably movable flat scanning mirror (M0) configured to receive the light beam reflected by the first fold mirror (M1) and to reflect the light beam towards the object (O) along a line which will be moved on the object (O) via the scanning mirror (M0); the imaging spectrophotometer comprising: two sensors (C1, C2) for measuring a distance between the object (O) and the scanning mirror (M0), the focusing mirror (M2) being movable in translation to adapt the imager to the distance measured by said measurement sensors, the first fold mirror (M1) comprising a front face (M11) oriented towards the focusing mirror (M2) and a rear face (M12) opposite to said front face (M11), said first mirror (M1) comprising a slot (M1-F) configured to allow a beam coming from the object to pass, the imaging spectrophotometer comprising a device (OBT) for blocking a beam disposed in front of the front face (M11) of the first mirror (M1) and in front of the slot (M1-F) of said first mirror, the blocking device comprising a vertical blade wider than the slot, said blade being movable in two positions, an open position in which it prevents a direct parasitic beam coming from the scanning mirror (MO) from passing through said slot, the beam coming from the object passing through said slot, and a closed position preventing the beam coming from the object from going through the slot (M1-F). an illumination assembly (ES, ES') comprising a source (S, S') for emitting a light beam, said assembly being configured such that the light beam scans line by line the object (O) to be analyzed; a focusing mirror (M2) configured to receive the light beam emitted by the illumination assembly (ES, ES'); a first fold mirror (M1) configured so as to face the focusing mirror (M2) to receive the light beam reflected by the focusing mirror (M2); a rotatably movable flat scanning mirror (M0) configured to receive the light beam reflected by the first fold mirror (M1) and to reflect the light beam towards the object (O) along a line which will be moved on the object (O) via the scanning mirror (M0); the imaging spectrophotometer comprising: two sensors (C1, C2) for measuring a distance between the object (O) and the scanning mirror (M0), the focusing mirror (M2) being movable in translation to adapt the imager to the distance measured by said measurement sensors, the first fold mirror (M1) comprising a front face (M11) oriented towards the focusing mirror (M2) and a rear face (M12) opposite to said front face (M11), said first mirror (M1) comprising a slot (M1-F) configured to allow a beam coming from the object to pass, the imaging spectrophotometer comprising a device (OBT) for blocking a beam disposed in front of the front face (M11) of the first mirror (M1) and in front of the slot (M1-F) of said first mirror, the blocking device comprising a vertical blade wider than the slot, said blade being movable in two positions, an open position in which it prevents a direct parasitic beam coming from the scanning mirror (MO) from passing through said slot, the beam coming from the object passing through said slot, and a closed position preventing the beam coming from the object from going through the slot (M1-F). <EOS>