Prober for verifying and testing electronic semiconductor devices, subsequently referred to as test substrate , comprising the following components: - at least a first verification unit and a second verification unit , - wherein each verification unit comprises a chuck for receiving and holding a test substrate on a receiving surface of the chuck , a probe mount having a probe arrangement containing multiple probes for making electrical contact with a test substrate , and a positioning unit having motorized drives for positioning the chuck and the probe arrangement relative to one another, - wherein at least one verification unit comprises a loading apparatus for manually loading the chuck with a test substrate , - at least a first machine controller for controlling the motorized drives of the first verification unit and a second machine controller for controlling the motorized drives of the second verification unit , - at least a first process controller for controlling the verification process of the first verification unit and a second process controller for controlling the verification process of the second verification unit , wherein at least one process controller comprises a memory unit for storing data of the test substrate and verification sequences, - a charging unit that comprises a handling system for accepting and transferring a test substrate between a test substrate store and either one or the other verification unit in an automated manner, - a module controller for controlling the first and second process controllers and/or the first and second machine controllers and the charging unit , - a user interface having a display apparatus and an input apparatus, and - a switching apparatus for selectively making an electrical connection from the user interface to at least one of the following controllers: first process controller or second process controller or module controller. - at least a first verification unit and a second verification unit , - wherein each verification unit comprises a chuck for receiving and holding a test substrate on a receiving surface of the chuck , a probe mount having a probe arrangement containing multiple probes for making electrical contact with a test substrate , and a positioning unit having motorized drives for positioning the chuck and the probe arrangement relative to one another, - wherein at least one verification unit comprises a loading apparatus for manually loading the chuck with a test substrate , - at least a first machine controller for controlling the motorized drives of the first verification unit and a second machine controller for controlling the motorized drives of the second verification unit , - at least a first process controller for controlling the verification process of the first verification unit and a second process controller for controlling the verification process of the second verification unit , wherein at least one process controller comprises a memory unit for storing data of the test substrate and verification sequences, - a charging unit that comprises a handling system for accepting and transferring a test substrate between a test substrate store and either one or the other verification unit in an automated manner, - a module controller for controlling the first and second process controllers and/or the first and second machine controllers and the charging unit , - a user interface having a display apparatus and an input apparatus, and - a switching apparatus for selectively making an electrical connection from the user interface to at least one of the following controllers: first process controller or second process controller or module controller. <EOS>