A cutting tool comprising a substrate and a coating provided on the substrate , the coating comprising: a first alumina layer provided on the substrate , a titanium compound layer provided directly on the first alumina layer , and a second alumina layer provided directly on the titanium compound layer , wherein a portion adjacent to the titanium compound layer in the first alumina layer serves as an interface region, a portion that is not the interface region in the first alumina layer serves as a non-interface region, a content of nitrogen in the interface region is 0.2 at% or more and 10.5 at% or less, and a content of nitrogen in the non-interface region is 0 at% or more and 0.15 at% or less; and the titanium compound layer comprises a layer of titanium carbonitride adjacent to the first alumina layer ; wherein the content of nitrogen in the interface region and the content of nitrogen in the non-interface region are atomic ratios to the total of aluminum, oxygen, and nitrogen in the first alumina layer, determined by performing line analysis on a cross-sectioned sample parallel to the direction of the normal to the surface of the substrate by Auger electron spectroscopy; and wherein the interface region of the first alumina layer is a region sandwiched between an interface (S) with the titanium compound layer and a virtual plane (A) parallel to the interface (S) that passes through a point 0.5 μm away from the interface (S) in a thickness direction. the coating comprising: a first alumina layer provided on the substrate , a titanium compound layer provided directly on the first alumina layer , and a second alumina layer provided directly on the titanium compound layer , a first alumina layer provided on the substrate , a titanium compound layer provided directly on the first alumina layer , and a second alumina layer provided directly on the titanium compound layer , wherein a portion adjacent to the titanium compound layer in the first alumina layer serves as an interface region, a portion that is not the interface region in the first alumina layer serves as a non-interface region, a content of nitrogen in the interface region is 0.2 at% or more and 10.5 at% or less, and a content of nitrogen in the non-interface region is 0 at% or more and 0.15 at% or less; and the titanium compound layer comprises a layer of titanium carbonitride adjacent to the first alumina layer ; wherein the content of nitrogen in the interface region and the content of nitrogen in the non-interface region are atomic ratios to the total of aluminum, oxygen, and nitrogen in the first alumina layer, determined by performing line analysis on a cross-sectioned sample parallel to the direction of the normal to the surface of the substrate by Auger electron spectroscopy; and wherein the interface region of the first alumina layer is a region sandwiched between an interface (S) with the titanium compound layer and a virtual plane (A) parallel to the interface (S) that passes through a point 0.5 μm away from the interface (S) in a thickness direction. wherein the content of nitrogen in the interface region and the content of nitrogen in the non-interface region are atomic ratios to the total of aluminum, oxygen, and nitrogen in the first alumina layer, determined by performing line analysis on a cross-sectioned sample parallel to the direction of the normal to the surface of the substrate by Auger electron spectroscopy; and wherein the interface region of the first alumina layer is a region sandwiched between an interface (S) with the titanium compound layer and a virtual plane (A) parallel to the interface (S) that passes through a point 0.5 μm away from the interface (S) in a thickness direction. <EOS>