A measurement system for temporal signal measurement of a device under test (DUT) , the measurement system comprising: a reference clock synthesizer configured to generate a master reference clock signal; an optical transmitter unit connected to the reference clock synthesizer and configured to connect to a first end of the device under test (DUT) ; a measurement control system connected to the optical transmitter unit , the measurement control system configured to control the optical transmitter unit to generate a test signal pattern based on a first reference clock signal derived from the master reference clock signal, and to generate an optical signal for passing through the device under test (DUT) based on the test signal pattern; and an optical receiver unit connected to the reference clock synthesizer and configured to connect to a second end of the device under test (DUT) , the optical receiver unit configured to detect the optical signal that passes through the device under test (DUT) and further configured to generate a digital signal based on the optical signal detected and a second reference clock signal derived from the master reference clock signal; wherein the measurement control system is connected to the optical receiver unit ; wherein the measurement control system is further configured to provide an output signal comprising measurement results based on the digital signal; wherein the optical receiver unit comprises an optical detector module configured to detect the optical signal that passes through the device under test (DUT) and configured to generate a response signal, which is an electrical signal, based on the optical signal received. a reference clock synthesizer configured to generate a master reference clock signal; an optical transmitter unit connected to the reference clock synthesizer and configured to connect to a first end of the device under test (DUT) ; a measurement control system connected to the optical transmitter unit , the measurement control system configured to control the optical transmitter unit to generate a test signal pattern based on a first reference clock signal derived from the master reference clock signal, and to generate an optical signal for passing through the device under test (DUT) based on the test signal pattern; and an optical receiver unit connected to the reference clock synthesizer and configured to connect to a second end of the device under test (DUT) , the optical receiver unit configured to detect the optical signal that passes through the device under test (DUT) and further configured to generate a digital signal based on the optical signal detected and a second reference clock signal derived from the master reference clock signal; wherein the measurement control system is connected to the optical receiver unit ; wherein the measurement control system is further configured to provide an output signal comprising measurement results based on the digital signal; wherein the optical receiver unit comprises an optical detector module configured to detect the optical signal that passes through the device under test (DUT) and configured to generate a response signal, which is an electrical signal, based on the optical signal received. <EOS>