A microscope for imaging a sample , comprising: an illumination unit for emitting illumination light onto the sample , a detector for detecting detection light originating from the sample , optics for focusing the illumination light, emitted by the illumination unit , into the sample and for focusing the detection light, originating from the sample , onto the detector , and a scanning unit for scanning the sample with the illumination light, wherein the illumination unit is configured to emit the illumination light in the form of separate illumination light beams onto the scanning unit such that the illumination light beams are simultaneously focused on spatially separated, strip-shaped sample areas (A, B, C) when scanning the sample , the detector is configured to detect the detection light in the form of separate detection light beams , originating from the spatially separated, strip-shaped sample areas (A, B, C) simultaneously and spatially separated from one another, the sample areas (A, B, C), illuminated by the illuminating light beams , are located in several sample planes, the detector comprises several partial detectors , each of which is assigned to one of the sample planes, wherein the respective partial detector detects the detection light beam , originating from the sample plane assigned to this partial detector , and the partial detectors are arranged in a depth of field of detection optics, arranged upstream of the detector, characterized in that the optics simultaneously contains a single objective which forms an illumination objective for focusing the illumination light beams , emitted by the illumination unit into the sample , and a detection objective for focusing the detection light beam , originating from the sample , onto the detector . an illumination unit for emitting illumination light onto the sample , a detector for detecting detection light originating from the sample , optics for focusing the illumination light, emitted by the illumination unit , into the sample and for focusing the detection light, originating from the sample , onto the detector , and a scanning unit for scanning the sample with the illumination light, wherein the illumination unit is configured to emit the illumination light in the form of separate illumination light beams onto the scanning unit such that the illumination light beams are simultaneously focused on spatially separated, strip-shaped sample areas (A, B, C) when scanning the sample , the detector is configured to detect the detection light in the form of separate detection light beams , originating from the spatially separated, strip-shaped sample areas (A, B, C) simultaneously and spatially separated from one another, the sample areas (A, B, C), illuminated by the illuminating light beams , are located in several sample planes, the detector comprises several partial detectors , each of which is assigned to one of the sample planes, wherein the respective partial detector detects the detection light beam , originating from the sample plane assigned to this partial detector , and the partial detectors are arranged in a depth of field of detection optics, arranged upstream of the detector, characterized in that the optics simultaneously contains a single objective which forms an illumination objective for focusing the illumination light beams , emitted by the illumination unit into the sample , and a detection objective for focusing the detection light beam , originating from the sample , onto the detector . <EOS>