A system (S) to remove at least a portion of an outer layer of a food product (FP), comprising: - a processing device (PD) to remove at least a portion of the outer layer of the food product; - a measurement system (MS) configured to measure a shape or outer contour of the food product, wherein the food product is a cheese, wherein the measurement system is also configured to measure at least one parameter of the food product other than shape or outer contour of the food product, wherein the system is configured to remove at least a portion of the outer layer of the food product with the processing device based on the measured shape or outer contour of the food product and based on the at least one other parameter of the food product, wherein the measurement system (MS) comprises a first measurement device (MD1) to measure the shape or outer contour of the food product, and a second measurement device (MD2) to measure the at least one other parameter of the food product, characterized in that the second measurement device comprises: - a radiation source (RS) to irradiate the food product with a radiation beam (RB); - a radiation sensor (CA1, CA2) to detect radiation coming from the food product as a result of being irradiated by the radiation beam; and - a processor (PR) to determine the at least one parameter other than shape or outer contour (OC) from an output of the radiation sensor. - a processing device (PD) to remove at least a portion of the outer layer of the food product; - a measurement system (MS) configured to measure a shape or outer contour of the food product, wherein the food product is a cheese, wherein the measurement system is also configured to measure at least one parameter of the food product other than shape or outer contour of the food product, wherein the system is configured to remove at least a portion of the outer layer of the food product with the processing device based on the measured shape or outer contour of the food product and based on the at least one other parameter of the food product, wherein the measurement system (MS) comprises a first measurement device (MD1) to measure the shape or outer contour of the food product, and a second measurement device (MD2) to measure the at least one other parameter of the food product, characterized in that the second measurement device comprises: wherein the food product is a cheese, wherein the measurement system is also configured to measure at least one parameter of the food product other than shape or outer contour of the food product, wherein the system is configured to remove at least a portion of the outer layer of the food product with the processing device based on the measured shape or outer contour of the food product and based on the at least one other parameter of the food product, wherein the measurement system (MS) comprises a first measurement device (MD1) to measure the shape or outer contour of the food product, and a second measurement device (MD2) to measure the at least one other parameter of the food product, characterized in that the second measurement device comprises: - a radiation source (RS) to irradiate the food product with a radiation beam (RB); - a radiation sensor (CA1, CA2) to detect radiation coming from the food product as a result of being irradiated by the radiation beam; and - a processor (PR) to determine the at least one parameter other than shape or outer contour (OC) from an output of the radiation sensor. <EOS>