Measurement system for a combined energy dispersive spectroscopy, EDS, and transmission Kikuchi diffraction, TKD, measurement, comprising: a sample holder for positioning a sample in an electron microscope, EM, , the sample holder having a main body with a tapered portion that is terminating in a tip portion configured to receive the sample such that the sample is disposed on a contact plane ; and an aperture extension having an attachment portion comprising a U-shaped metal bar and being mechanically engaged with the main body outside of the tapered portion and the tip portion in that side legs of the U-shaped metal bar are closely fitted to side walls of the main body and an inner leg of the U-shaped metal bar is closely fitted to a top surface of the main body , wherein the attachment portion is configured to fix the aperture extension to the sample holder ; an aperture portion extending laterally over the tip portion in a plane that is plane-parallel to the contact plane and overlapping the tip portion , wherein an extension of the aperture portion parallel to the contact plane is larger than an extension of the tip portion parallel to the contact plane ; and an aperture opening disposed on the aperture portion , having an extension parallel to the contact plane that is larger than the extension of the sample parallel to the contact plane and overlapping the sample . a sample holder for positioning a sample in an electron microscope, EM, , the sample holder having a main body with a tapered portion that is terminating in a tip portion configured to receive the sample such that the sample is disposed on a contact plane ; and an aperture extension having an attachment portion comprising a U-shaped metal bar and being mechanically engaged with the main body outside of the tapered portion and the tip portion in that side legs of the U-shaped metal bar are closely fitted to side walls of the main body and an inner leg of the U-shaped metal bar is closely fitted to a top surface of the main body , wherein the attachment portion is configured to fix the aperture extension to the sample holder ; an aperture portion extending laterally over the tip portion in a plane that is plane-parallel to the contact plane and overlapping the tip portion , wherein an extension of the aperture portion parallel to the contact plane is larger than an extension of the tip portion parallel to the contact plane ; and an aperture opening disposed on the aperture portion , having an extension parallel to the contact plane that is larger than the extension of the sample parallel to the contact plane and overlapping the sample . an attachment portion comprising a U-shaped metal bar and being mechanically engaged with the main body outside of the tapered portion and the tip portion in that side legs of the U-shaped metal bar are closely fitted to side walls of the main body and an inner leg of the U-shaped metal bar is closely fitted to a top surface of the main body , wherein the attachment portion is configured to fix the aperture extension to the sample holder ; an aperture portion extending laterally over the tip portion in a plane that is plane-parallel to the contact plane and overlapping the tip portion , wherein an extension of the aperture portion parallel to the contact plane is larger than an extension of the tip portion parallel to the contact plane ; and an aperture opening disposed on the aperture portion , having an extension parallel to the contact plane that is larger than the extension of the sample parallel to the contact plane and overlapping the sample . <EOS>