An apparatus for determining a first three-dimensional shape of an object located on a reference plane, comprising: one or more first light sources configured to irradiate one or more first pattern lights to the object; a second light source configured to sequentially irradiate one or more second pattern lights having one phase range; a beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights so that a beam of light corresponding to the respective phase of the phase range spreads, and arrives at each point of a partial region of an upper surface of the object; an image sensor configured to capture one or more first reflected lights generated by reflecting the one or more first pattern lights from the object and one or more second reflected lights generated by reflecting the one or more second pattern lights from the partial region, wherein the one or more first reflected lights and the one or more second reflected lights pass through the beam splitter to reach the image sensor ; and a processor that is electrically connected to the one or more first light sources , the second light source and the image sensor , and that is configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights, characterized in that $ each of the one or more second pattern lights is a pattern light generated by phase-shifting a pattern light having a pattern in a first direction or a second direction perpendicular to the first direction by an integer multiple of a preset phase interval, wherein the processor is further configured to determine an angle of the upper surface of the object with respect to the reference plane based on each light amount value of the one or more second reflected lights, and $ determine the first three-dimensional shape by correcting a previously determined second three-dimensional shape using the determined angle of the upper surface. one or more first light sources configured to irradiate one or more first pattern lights to the object; a second light source configured to sequentially irradiate one or more second pattern lights having one phase range; a beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights so that a beam of light corresponding to the respective phase of the phase range spreads, and arrives at each point of a partial region of an upper surface of the object; an image sensor configured to capture one or more first reflected lights generated by reflecting the one or more first pattern lights from the object and one or more second reflected lights generated by reflecting the one or more second pattern lights from the partial region, wherein the one or more first reflected lights and the one or more second reflected lights pass through the beam splitter to reach the image sensor ; and a processor that is electrically connected to the one or more first light sources , the second light source and the image sensor , and that is configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights, characterized in that $ each of the one or more second pattern lights is a pattern light generated by phase-shifting a pattern light having a pattern in a first direction or a second direction perpendicular to the first direction by an integer multiple of a preset phase interval, wherein the processor is further configured to determine an angle of the upper surface of the object with respect to the reference plane based on each light amount value of the one or more second reflected lights, and $ determine the first three-dimensional shape by correcting a previously determined second three-dimensional shape using the determined angle of the upper surface. <EOS>