A method of calibrating a structured light sensor, comprising: emitting structured light towards a calibration surface from a light emitter, the structured light comprising a plurality of individual emitted units forming a structured arrangement, the structured light also being modulated for making time-of-flight (TOF) depth calculations; capturing , through an image sensor, a plurality of calibration images of structured light reflected off the calibration surface, the calibration images comprising a plurality of reflected units of structured light, and the calibration images taken at more than one distance from an object in the calibration surface; calculating a time-of-flight distance between the calibration surface and the image sensor for individual images within the plurality of calibration images using time-of-flight distance measurements; detecting a plurality of reflected units within the calibration images; determining x-y coordinates of the reflected units in each image; generating normalized calibration images by normalizing the x-y coordinates of the reflected units in each image to a virtual distance between the calibration surface and the image sensor using the TOF distance between the image sensor and the calibration surface for each image, the normalizing producing disparity corrected units; tracking individual disparity corrected units across multiple images to form a plurality of unit clusters; calculating an average x-y coordinate for units in each cluster; and generating a new reference model that consists of the average x-y coordinate for each clusters of disparity corrected units. emitting structured light towards a calibration surface from a light emitter, the structured light comprising a plurality of individual emitted units forming a structured arrangement, the structured light also being modulated for making time-of-flight (TOF) depth calculations; capturing , through an image sensor, a plurality of calibration images of structured light reflected off the calibration surface, the calibration images comprising a plurality of reflected units of structured light, and the calibration images taken at more than one distance from an object in the calibration surface; calculating a time-of-flight distance between the calibration surface and the image sensor for individual images within the plurality of calibration images using time-of-flight distance measurements; detecting a plurality of reflected units within the calibration images; determining x-y coordinates of the reflected units in each image; generating normalized calibration images by normalizing the x-y coordinates of the reflected units in each image to a virtual distance between the calibration surface and the image sensor using the TOF distance between the image sensor and the calibration surface for each image, the normalizing producing disparity corrected units; tracking individual disparity corrected units across multiple images to form a plurality of unit clusters; calculating an average x-y coordinate for units in each cluster; and generating a new reference model that consists of the average x-y coordinate for each clusters of disparity corrected units. <EOS>