A method for identifying a cell, comprising: determining (S11), for a cell under test during a charge and discharge process, a number N of measured values of open circuit voltage (OCV) and a number N of net cumulative throughputs corresponding to the number N of measured values of OCV; obtaining (S12), for an i th target cell, a number N of first state of charge (SOC) values corresponding to the number N of measured values of OCV, according to the number N of measured values of OCV and a first correspondence between an open circuit voltage and a SOC for the i th target cell; determining (S13) a second correspondence between the net cumulative throughputs and the states of charge for the i th target cell, according to the number N of net cumulative throughputs and the number N of first SOC values; obtaining (S14), for the i th target cell, a number N of second SOC values corresponding to the number N of net cumulative throughputs, according to the number N of net cumulative throughputs and the second correspondence; obtaining (S15), for the i th target cell, a number N of calculated values of OCV corresponding to the number N of second SOC values, according to the number N of second SOC values and the first correspondence; obtaining (S16) an OCV mean square error between the cell under test and the i th target cell, based on the number N of measured values of OCV and the number N of calculated values of OCV; determining (S17) that the cell under test is the i th target cell, when the OCV mean square error between the cell under test and the i th target cell is a minimum mean square error among a number M of OCV mean square errors, wherein M represents a total number of target cells, 1≤i ≤M, and both M and N are positive integers greater than 1. determining (S11), for a cell under test during a charge and discharge process, a number N of measured values of open circuit voltage (OCV) and a number N of net cumulative throughputs corresponding to the number N of measured values of OCV; obtaining (S12), for an i th target cell, a number N of first state of charge (SOC) values corresponding to the number N of measured values of OCV, according to the number N of measured values of OCV and a first correspondence between an open circuit voltage and a SOC for the i th target cell; determining (S13) a second correspondence between the net cumulative throughputs and the states of charge for the i th target cell, according to the number N of net cumulative throughputs and the number N of first SOC values; obtaining (S14), for the i th target cell, a number N of second SOC values corresponding to the number N of net cumulative throughputs, according to the number N of net cumulative throughputs and the second correspondence; obtaining (S15), for the i th target cell, a number N of calculated values of OCV corresponding to the number N of second SOC values, according to the number N of second SOC values and the first correspondence; obtaining (S16) an OCV mean square error between the cell under test and the i th target cell, based on the number N of measured values of OCV and the number N of calculated values of OCV; determining (S17) that the cell under test is the i th target cell, when the OCV mean square error between the cell under test and the i th target cell is a minimum mean square error among a number M of OCV mean square errors, wherein M represents a total number of target cells, 1≤i ≤M, and both M and N are positive integers greater than 1. <EOS>