A method for ultrasound testing of components with an ultrasound test device, the method comprising: inducing , by the ultrasound test device, ultrasonic test waves on a first surface of a component , the ultrasonic test waves comprising at least two different ultrasonic test waves being selected from a group consisting of: a surface wave , traveling along the first surface from a first location to a second location; a shear wave , traveling from the first location on the first surface through the component to a second surface opposite to the first surface, and back to the first surface at the second location; and a transverse wave , traveling from a third location on the first surface through the component to the second surface, and back to the first surface at the third location; receiving, by the ultrasound test device, a signal in response to the ultrasonic test waves in the form of a waveform , the signal response comprising a waveform having a plurality of segments corresponding to the different induced waves that are received at different times; selecting, by the ultrasound test device, which segment of the received signal is of interest for further analysis by applying a gate to the received signal, thereby selecting a portion of the waveform ; developing , by the ultrasound test device, a test signature based on the selected portion of the waveform in response to the ultrasonic test waves through the component; characterizing , by the ultrasound test device, an internal feature of the component based on a comparison between the test signature and a baseline signature for the component; and providing , by the ultrasound test device, an indication of the internal feature as characterized. inducing , by the ultrasound test device, ultrasonic test waves on a first surface of a component , the ultrasonic test waves comprising at least two different ultrasonic test waves being selected from a group consisting of: a surface wave , traveling along the first surface from a first location to a second location; a shear wave , traveling from the first location on the first surface through the component to a second surface opposite to the first surface, and back to the first surface at the second location; and a transverse wave , traveling from a third location on the first surface through the component to the second surface, and back to the first surface at the third location; a surface wave , traveling along the first surface from a first location to a second location; a shear wave , traveling from the first location on the first surface through the component to a second surface opposite to the first surface, and back to the first surface at the second location; and a transverse wave , traveling from a third location on the first surface through the component to the second surface, and back to the first surface at the third location; receiving, by the ultrasound test device, a signal in response to the ultrasonic test waves in the form of a waveform , the signal response comprising a waveform having a plurality of segments corresponding to the different induced waves that are received at different times; selecting, by the ultrasound test device, which segment of the received signal is of interest for further analysis by applying a gate to the received signal, thereby selecting a portion of the waveform ; developing , by the ultrasound test device, a test signature based on the selected portion of the waveform in response to the ultrasonic test waves through the component; characterizing , by the ultrasound test device, an internal feature of the component based on a comparison between the test signature and a baseline signature for the component; and <EOS>