An antireflection film comprising: a hard coating layer or an antiglare layer; and a low refractive index layer formed on one side of the hard coating layer or the antiglare layer and including a binder resin, and hollow silica nanoparticles, metal oxide nanoparticles and inorganic nanoparticles dispersed in the binder resin, wherein a first region containing the hollow silica nanoparticles, a second region containing the metal oxide nanoparticles, and a third region containing the inorganic nanoparticles are present in the low reflective index layer, and when polarization ellipticity measured by an ellipsometry method for the second region contained in the low reflective index layer is fitted to a Cauchy model of the following General Formula 1, it satisfies the condition that A is 1.53 to 3.0, B is 0 to 0.1, and C is 0 to 1 ∗ 10 -2 : n λ = A + B λ 2 + C λ 4 wherein, in the above General Formula 1, n(λ) is a refractive index at a wavelength λ, λ is in a range of 300 nm to 1800 nm, and A, B, and C are Cauchy parameters, wherein the inorganic nanoparticles include solid-type silica nanoparticles or antimony-doped tin oxide nanoparticles; the metal oxide nanoparticles are selected from titanium oxide, tin oxide or zinc oxide; the hollow silica nanoparticles are particles having an average diameter of 10 nm to 200 nm; and the average diameter of the respective nanoparticles is obtained by measuring and calculating the diameters of the respective nanoparticles identified by a TEM photograph of the antireflection film. a hard coating layer or an antiglare layer; and a low refractive index layer formed on one side of the hard coating layer or the antiglare layer and including a binder resin, and hollow silica nanoparticles, metal oxide nanoparticles and inorganic nanoparticles dispersed in the binder resin, wherein a first region containing the hollow silica nanoparticles, a second region containing the metal oxide nanoparticles, and a third region containing the inorganic nanoparticles are present in the low reflective index layer, and when polarization ellipticity measured by an ellipsometry method for the second region contained in the low reflective index layer is fitted to a Cauchy model of the following General Formula 1, it satisfies the condition that A is 1.53 to 3.0, B is 0 to 0.1, and C is 0 to 1 ∗ 10 -2 : n λ = A + B λ 2 + C λ 4 wherein, in the above General Formula 1, n(λ) is a refractive index at a wavelength λ, λ is in a range of 300 nm to 1800 nm, and A, B, and C are Cauchy parameters, wherein the inorganic nanoparticles include solid-type silica nanoparticles or antimony-doped tin oxide nanoparticles; the metal oxide nanoparticles are selected from titanium oxide, tin oxide or zinc oxide; the hollow silica nanoparticles are particles having an average diameter of 10 nm to 200 nm; and the average diameter of the respective nanoparticles is obtained by measuring and calculating the diameters of the respective nanoparticles identified by a TEM photograph of the antireflection film. wherein, in the above General Formula 1, n(λ) is a refractive index at a wavelength λ, λ is in a range of 300 nm to 1800 nm, and A, B, and C are Cauchy parameters, wherein the inorganic nanoparticles include solid-type silica nanoparticles or antimony-doped tin oxide nanoparticles; the metal oxide nanoparticles are selected from titanium oxide, tin oxide or zinc oxide; the hollow silica nanoparticles are particles having an average diameter of 10 nm to 200 nm; and the average diameter of the respective nanoparticles is obtained by measuring and calculating the diameters of the respective nanoparticles identified by a TEM photograph of the antireflection film. <EOS>