An oblique plane microscope for imaging a sample , comprising: a single objective configured to illuminate a plane of the sample with a light sheet and to collect detection light from the illuminated plane , a beam splitting system configured to split the collected detection light into first and second two detection light bundles propagating along first and second optical paths (OP1, OP2), respectively, a first intermediate imaging system configured to generate a first intermediate image of the illuminated plane from the first detection light bundle in a first intermediate image space , said first intermediate imaging system comprising a first objective and a first reflecting element which is positioned in the first intermediate image space and configured to reflect the first detection light bundle back into the first objective , a second intermediate imaging system configured to generate a second intermediate image of the illuminated plane from the second detection light bundle in a second intermediate image space , said second intermediate imaging system comprising a second objective and a second reflecting element which is positioned in the second intermediate image space and configured to reflect the second detection light bundle back into the second objective , and a detection system configured to detect the first and second detection light bundles reflected back into the first and second objectives , respectively, for imaging the sample , characterized by an illumination system configured to emit illumination light onto at least one of the first and second reflecting elements for coupling the illumination light into at least one of the first and second objectives . a single objective configured to illuminate a plane of the sample with a light sheet and to collect detection light from the illuminated plane , a beam splitting system configured to split the collected detection light into first and second two detection light bundles propagating along first and second optical paths (OP1, OP2), respectively, a first intermediate imaging system configured to generate a first intermediate image of the illuminated plane from the first detection light bundle in a first intermediate image space , said first intermediate imaging system comprising a first objective and a first reflecting element which is positioned in the first intermediate image space and configured to reflect the first detection light bundle back into the first objective , a second intermediate imaging system configured to generate a second intermediate image of the illuminated plane from the second detection light bundle in a second intermediate image space , said second intermediate imaging system comprising a second objective and a second reflecting element which is positioned in the second intermediate image space and configured to reflect the second detection light bundle back into the second objective , and a detection system configured to detect the first and second detection light bundles reflected back into the first and second objectives , respectively, for imaging the sample , characterized by an illumination system configured to emit illumination light onto at least one of the first and second reflecting elements for coupling the illumination light into at least one of the first and second objectives . <EOS>