An integrated circuit having a supply port , an input port and a ground port comprising a fault detection assembly adapted to detect a disconnected ground port or a floating ground wherein the fault detection assembly comprises: - a first diode connected with one end to the supply port and connected with another end to the input port , the first diode comprising a first diode-connected PMOS transistor , - a second diode connected with one end to the input port and connected with another end to the ground port , the second diode comprising a second diode-connected NMOS transistor , - at least a first fault detection transistor of NMOS type, whose gate is connected to the gate of the second diode-connected NMOS transistor , - one of the drain and the source of the first fault detection NMOS transistor is connected to the input port and the other one of the first fault detection NMOS transistor's drain and source is connected to a first resistor connected to the supply port , wherein the source of the first diode-connected PMOS transistor is connected to the supply port , characterized in that the gate of the first diode-connected PMOS transistor is connected parallel to its source to the supply port via a protection resistor , in that the gate of the second diode-connected transistor is connected parallel to its source to the ground port via an additional protection resistor , and in that a first detection output is connected to a first node that is between the first resistor and the first fault detection NMOS transistor , and to a processor or a logic component of the integrated circuit. - a first diode connected with one end to the supply port and connected with another end to the input port , the first diode comprising a first diode-connected PMOS transistor , - a second diode connected with one end to the input port and connected with another end to the ground port , the second diode comprising a second diode-connected NMOS transistor , - at least a first fault detection transistor of NMOS type, whose gate is connected to the gate of the second diode-connected NMOS transistor , - one of the drain and the source of the first fault detection NMOS transistor is connected to the input port and the other one of the first fault detection NMOS transistor's drain and source is connected to a first resistor connected to the supply port , wherein the source of the first diode-connected PMOS transistor is connected to the supply port , characterized in that the gate of the first diode-connected PMOS transistor is connected parallel to its source to the supply port via a protection resistor , in that the gate of the second diode-connected transistor is connected parallel to its source to the ground port via an additional protection resistor , and in that a first detection output is connected to a first node that is between the first resistor and the first fault detection NMOS transistor , and to a processor or a logic component of the integrated circuit. wherein the source of the first diode-connected PMOS transistor is connected to the supply port , characterized in that the gate of the first diode-connected PMOS transistor is connected parallel to its source to the supply port via a protection resistor , in that the gate of the second diode-connected transistor is connected parallel to its source to the ground port via an additional protection resistor , and in that a first detection output is connected to a first node that is between the first resistor and the first fault detection NMOS transistor , and to a processor or a logic component of the integrated circuit. <EOS>