System for handling of a sample , the system comprising a sample storage having at least a first sample position (15*), a first magnetic or magnetizable sample holder , a control unit and a gripping apparatus , wherein the sample storage is configured for use in a cold environment at cryogenic temperatures, in particular in a reservoir filled with a cooling liquid, and the first sample position (15*) is configured to receive the first sample holder , which is configured to hold the sample , wherein the first sample position (15*) comprises a first permanent magnet , which is configured to apply a holding force on the first sample holder , characterized in that the gripping apparatus comprises a sample gripper having an electromagnetic gripping device comprising an electromagnetic coil , the electromagnetic gripping device being configured to apply a gripping force on the first sample holder , the control unit is coupled to the electromagnetic coil of the electromagnetic gripping device in that it can control a current through the electromagnetic coil so as to change the gripping force applied on the first sample holder and the control unit is configured to control the current through the electromagnetic coil in a holding mode in that the gripping force generated by the electromagnetic gripping device is set to a holding value such that the first sample holder can be lifted from the first sample position (15*) and/or to control the current through the electromagnetic coil in a release mode in that the gripping force generated by the electromagnetic gripping device is set to a release value such that the first sample holder cannot be lifted from the first sample position (15*) by the sample gripper , wherein the electromagnetic gripping device comprises a permanent magnet and the electromagnetic coil , wherein the electromagnetic coil is configured to enhance or attenuate a magnetic flux of the permanent magnet , and the control unit is configured in that it can control the current through the electromagnetic coil so as to enhance or attenuate the gripping force applied on the sample holder by the permanent magnet . the first sample position (15*) comprises a first permanent magnet , which is configured to apply a holding force on the first sample holder , characterized in that the gripping apparatus comprises a sample gripper having an electromagnetic gripping device comprising an electromagnetic coil , the electromagnetic gripping device being configured to apply a gripping force on the first sample holder , the control unit is coupled to the electromagnetic coil of the electromagnetic gripping device in that it can control a current through the electromagnetic coil so as to change the gripping force applied on the first sample holder and the control unit is configured to control the current through the electromagnetic coil in a holding mode in that the gripping force generated by the electromagnetic gripping device is set to a holding value such that the first sample holder can be lifted from the first sample position (15*) and/or to control the current through the electromagnetic coil in a release mode in that the gripping force generated by the electromagnetic gripping device is set to a release value such that the first sample holder cannot be lifted from the first sample position (15*) by the sample gripper , wherein the electromagnetic gripping device comprises a permanent magnet and the electromagnetic coil , wherein the electromagnetic coil is configured to enhance or attenuate a magnetic flux of the permanent magnet , and the control unit is configured in that it can control the current through the electromagnetic coil so as to enhance or attenuate the gripping force applied on the sample holder by the permanent magnet . <EOS>