An optical tomographic device comprising: a light source configured to periodically scan a wavelength of light; a measurement optical system configured to irradiate light from the light source into an inside of a subject and guide reflected light from the inside of the subject ; a reference optical system configured to guide the light from the light source as reference light; a calibration optical system configured to irradiate a first calibration reflecting surface and a second calibration reflecting surface with light from the light source branched from the measurement optical system or the reference optical system , and guide the reflected light reflected by the first and second calibration reflecting surfaces ; a light-receiving element configured to receive the interfering light for measurement of the reflected light guided by the measurement optical system and the reference light guided by the reference optical system , and the interfering light for calibration of the reflected light guided by the calibration optical system and the reference light guided by the reference optical system ; wherein the interfering light for calibration is obtained by using the first and second calibration reflecting surfaces ; characterized by an arithmetic logic unit configured to correct the interfering light for measurement received by the light-receiving element by using an analysis result obtained from the interfering light for calibration received by the light-receiving element , thereby correcting a nonlinearity of wavelength sweeping of the light source , and configured to correct an eye axial length or a plurality of one-dimensional tomograms in a two-dimensional tomogram or a three-dimensional tomogram calculated by using the corrected interfering light for measurement. a light source configured to periodically scan a wavelength of light; a measurement optical system configured to irradiate light from the light source into an inside of a subject and guide reflected light from the inside of the subject ; a reference optical system configured to guide the light from the light source as reference light; a calibration optical system configured to irradiate a first calibration reflecting surface and a second calibration reflecting surface with light from the light source branched from the measurement optical system or the reference optical system , and guide the reflected light reflected by the first and second calibration reflecting surfaces ; a light-receiving element configured to receive the interfering light for measurement of the reflected light guided by the measurement optical system and the reference light guided by the reference optical system , and the interfering light for calibration of the reflected light guided by the calibration optical system and the reference light guided by the reference optical system ; wherein the interfering light for calibration is obtained by using the first and second calibration reflecting surfaces ; characterized by an arithmetic logic unit configured to correct the interfering light for measurement received by the light-receiving element by using an analysis result obtained from the interfering light for calibration received by the light-receiving element , thereby correcting a nonlinearity of wavelength sweeping of the light source , and configured to correct an eye axial length or a plurality of one-dimensional tomograms in a two-dimensional tomogram or a three-dimensional tomogram calculated by using the corrected interfering light for measurement. <EOS>