A system for testing comprising an electronic circuit to be tested and an automatic testing equipment, said electronic circuit (10; 10'; 10"; 10"') to be tested comprising a stage configured to supply a driving signal to a load, said stage comprising a pullup switch coupled to the voltage supply (VS) and a pulldown switch coupled to a lower potential than the voltage supply (GND, S), in particular ground, coupled to each other in an output node (G), and a pre-driver stage comprising pre-driver circuits which output is coupled to the control input of respective pullup and pull down switch of the stage configured to supply a driving signal to a load, said electronic circuit (10; 10';1 0"; 10′′′) to be tested comprising circuits for testing the pre-driver stage under the control (SCMD) of the automatic testing equipment (20; 20'; 20"; 20′′′) comprising a test logic module configured to operate a built-in test sequence comprising test commands (PU CMD, PD CMD) for the pre-driver stage under the control of an external test signal (SCMD) issued by the automatic test equipment, the automatic test equipment (20, 20', 20") comprising a test load to be coupled to said output node (G) of the stage configured to supply a driving signal to a load, said system for testing comprising a time measuring unit configured to measure duration of signals at the output (G) of the stage configured to supply a driving signal to a load coupled to a pass fail check module , configured to evaluate if said duration of signals at the output (G) of the stage configured to supply a driving signal to a load satisfies a pass criterion, wherein said time measuring unit is comprised in said electronic circuit to be tested and it started and stopped under the control of commands including commands (PU CMD, PD CMD, SEL) issued by said logic during execution of said bult-in test sequence. said electronic circuit (10; 10'; 10"; 10"') to be tested comprising a stage configured to supply a driving signal to a load, said stage comprising a pullup switch coupled to the voltage supply (VS) and a pulldown switch coupled to a lower potential than the voltage supply (GND, S), in particular ground, coupled to each other in an output node (G), and a pre-driver stage comprising pre-driver circuits which output is coupled to the control input of respective pullup and pull down switch of the stage configured to supply a driving signal to a load, said electronic circuit (10; 10';1 0"; 10′′′) to be tested comprising circuits for testing the pre-driver stage under the control (SCMD) of the automatic testing equipment (20; 20'; 20"; 20′′′) comprising a test logic module configured to operate a built-in test sequence comprising test commands (PU CMD, PD CMD) for the pre-driver stage under the control of an external test signal (SCMD) issued by the automatic test equipment, the automatic test equipment (20, 20', 20") comprising a test load to be coupled to said output node (G) of the stage configured to supply a driving signal to a load, said system for testing comprising a time measuring unit configured to measure duration of signals at the output (G) of the stage configured to supply a driving signal to a load coupled to a pass fail check module , configured to evaluate if said duration of signals at the output (G) of the stage configured to supply a driving signal to a load satisfies a pass criterion, wherein said time measuring unit is comprised in said electronic circuit to be tested and it started and stopped under the control of commands including commands (PU CMD, PD CMD, SEL) issued by said logic during execution of said bult-in test sequence. <EOS>