A laminate structure comprising: a first layer as a substrate; and a second layer being provided on the first layer and comprising a rubber composition including a rubber component, first fine particles for providing a surface with irregularity, and second fine particles for shielding UV-C light, wherein an average particle size of the second fine particles is smaller than an average particle size of the first fine particles, wherein the average particle size of the first fine particles is 1 μm or more and 10 μm or less, wherein the average particle size of the second fine particles is 10 nm or more and 1 μm or less, wherein when performing Raman mapping analysis on a first peak derived from oscillation of the second fine particles in Raman scattering spectrum obtained by Raman scattering measurement of the second layer, the second layer includes a region where an intensity of the first peak is greater in an area where the first fine particles are not present than an area where the first fine particles are present, wherein wherein the first layer comprises TiO 2 fine particles and said second fine particles of said second layer comprise TiO 2 fine particles, wherein a Ti concentration of the first layer is 0.35 mass% or more and 3.0 mass% or less, and wherein a Ti concentration of the second layer is 1.0 mass% or more and 4.4 mass% or less, wherein a Ti concentration of the second layer is higher than the Ti concentration of the first layer, and wherein the the average size of the first and second particles and the Ti concentrations of the first and second layers are measured using the methods as described in the description. a first layer as a substrate; and a second layer being provided on the first layer and comprising a rubber composition including a rubber component, first fine particles for providing a surface with irregularity, and second fine particles for shielding UV-C light, wherein an average particle size of the second fine particles is smaller than an average particle size of the first fine particles, wherein the average particle size of the first fine particles is 1 μm or more and 10 μm or less, wherein the average particle size of the second fine particles is 10 nm or more and 1 μm or less, wherein when performing Raman mapping analysis on a first peak derived from oscillation of the second fine particles in Raman scattering spectrum obtained by Raman scattering measurement of the second layer, the second layer includes a region where an intensity of the first peak is greater in an area where the first fine particles are not present than an area where the first fine particles are present, wherein wherein the first layer comprises TiO 2 fine particles and said second fine particles of said second layer comprise TiO 2 fine particles, wherein a Ti concentration of the first layer is 0.35 mass% or more and 3.0 mass% or less, and wherein a Ti concentration of the second layer is 1.0 mass% or more and 4.4 mass% or less, wherein a Ti concentration of the second layer is higher than the Ti concentration of the first layer, and wherein the the average size of the first and second particles and the Ti concentrations of the first and second layers are measured using the methods as described in the description. <EOS>