A system for determining whether an electronic device is located on a stationary or stable surface, comprising: a first motion sensor configured to generate first sensor data indicative of a first type of movement of the electronic device; a first feature detection circuit configured to determine at least one orientation-independent feature based on the first sensor data; and a classifying circuit configured to determine whether or not the electronic device is located on a stationary or stable surface based on the at least one orientation-independent feature, wherein the first sensor data comprises a plurality of samples within an acquisition time window, in particular one of a plurality of acquisition time windows that are consecutive and non-overlapping, and wherein the first feature detection circuit is configured to: determine a norm of each of the plurality of samples of the first sensor data within the acquisition time window; determine , based on the norm of each of the plurality of samples of the first sensor data within the acquisition time window, a mean of the norm within the acquisition time window; and determine a mean-cross value associated with the acquisition time window, wherein the mean-cross value comprises a number of times the norm of the plurality of samples of the first sensor data within the acquisition time window crosses the mean of the norm within the acquisition time window, and wherein the at least one orientation-independent feature comprises the mean-cross value associated with the acquisition time window. a first motion sensor configured to generate first sensor data indicative of a first type of movement of the electronic device; a first feature detection circuit configured to determine at least one orientation-independent feature based on the first sensor data; and a classifying circuit configured to determine whether or not the electronic device is located on a stationary or stable surface based on the at least one orientation-independent feature, wherein the first sensor data comprises a plurality of samples within an acquisition time window, in particular one of a plurality of acquisition time windows that are consecutive and non-overlapping, and wherein the first feature detection circuit is configured to: determine a norm of each of the plurality of samples of the first sensor data within the acquisition time window; determine , based on the norm of each of the plurality of samples of the first sensor data within the acquisition time window, a mean of the norm within the acquisition time window; and determine a mean-cross value associated with the acquisition time window, wherein the mean-cross value comprises a number of times the norm of the plurality of samples of the first sensor data within the acquisition time window crosses the mean of the norm within the acquisition time window, and wherein the at least one orientation-independent feature comprises the mean-cross value associated with the acquisition time window. determine a norm of each of the plurality of samples of the first sensor data within the acquisition time window; determine , based on the norm of each of the plurality of samples of the first sensor data within the acquisition time window, a mean of the norm within the acquisition time window; and determine a mean-cross value associated with the acquisition time window, wherein the mean-cross value comprises a number of times the norm of the plurality of samples of the first sensor data within the acquisition time window crosses the mean of the norm within the acquisition time window, and wherein the at least one orientation-independent feature comprises the mean-cross value associated with the acquisition time window. <EOS>