A method for reconstructing absorption and/or scattering properties of a medium, using a reconstruction system comprising at least one radiation source (14, s) capable of illuminating a medium (12, MR, MC) and at least one detector (16, d) capable of receiving a signal emitted by the medium (12, MR, MC), the method being characterized in that it comprises the following steps: - establishing , for at least one source-detector pair (14, s, 16, d), a first distribution (A sd (t); A sd ; A sd (ω)) of a signal received by the corresponding detector (16, d) for a reference medium (MR), the received signal being emitted by the reference medium (MR) subsequent to the illumination of said medium (MR) by the corresponding source (14, s), - determining , for said at least one source-detector pair (14, s, 16, d), a first modelling function (G sd 0 (t) ; G sd 0 ; G sd 0 (ω)) of a light scattering signal between the source (14, s) and the detector (16, d) in the reference medium (MR), - establishing , for said at least one source-detector pair (14, s, 16, d), a second distribution (B sd (t); B sd ; B sd (ω)) of a signal received by the corresponding detector (16, d) for a medium to be characterized (MC), the received signal being emitted by the medium to be characterized (MC) subsequent to the illumination of said medium (MC) by the corresponding source (14, s), - determining , for said at least one source-detector pair (14, s, 16, d), a second modelling function (G sd (t)) of a light scattering signal between the source (14, s) and the detector (16, d) in the medium to be characterized (MC), and - computing a corrected signal (Y sd (t); Y sd ; Y sd (ω)) as a function of the first modelling function (G sd 0 (t); G sd 0 ; G sd 0 (ω)), of the second modelling function (G sd (t); G sd ; G sd (ω)), of the first distribution (A sd (t); A sd ; A sd (ω)) and of the second distribution (B sd (t); B sd , B sd (ω)), the computing step including a comparison operation of the product of the first distribution (A sd (t); A sd ; A sd (ω)) and the second modelling function (G sd (t); G sd ; G sd (ω)) with the product of the second distribution (B sd (t); B s ; B sd (ω)) and the first modelling function (G sd 0 (t) ; G sd 0 ; G sd 0 (ω)). - establishing , for at least one source-detector pair (14, s, 16, d), a first distribution (A sd (t); A sd ; A sd (ω)) of a signal received by the corresponding detector (16, d) for a reference medium (MR), the received signal being emitted by the reference medium (MR) subsequent to the illumination of said medium (MR) by the corresponding source (14, s), - determining , for said at least one source-detector pair (14, s, 16, d), a first modelling function (G sd 0 (t) ; G sd 0 ; G sd 0 (ω)) of a light scattering signal between the source (14, s) and the detector (16, d) in the reference medium (MR), - establishing , for said at least one source-detector pair (14, s, 16, d), a second distribution (B sd (t); B sd ; B sd (ω)) of a signal received by the corresponding detector (16, d) for a medium to be characterized (MC), the received signal being emitted by the medium to be characterized (MC) subsequent to the illumination of said medium (MC) by the corresponding source (14, s), - determining , for said at least one source-detector pair (14, s, 16, d), a second modelling function (G sd (t)) of a light scattering signal between the source (14, s) and the detector (16, d) in the medium to be characterized (MC), and - computing a corrected signal (Y sd (t); Y sd ; Y sd (ω)) as a function of the first modelling function (G sd 0 (t); G sd 0 ; G sd 0 (ω)), of the second modelling function (G sd (t); G sd ; G sd (ω)), of the first distribution (A sd (t); A sd ; A sd (ω)) and of the second distribution (B sd (t); B sd , B sd (ω)), <EOS>