A measuring apparatus (SC, M, CON) comprising: a plurality of pairs of probes (PR1 1 , PR1 2 , ... PR1 N ) that are each connected to a pair of voltage measurement target locations (T1, AO) on a plurality of measured objects (Cell 1 to Cell N ) that each have an equivalent of an internal capacitance connected in parallel between the pair of voltage measurement target locations (T1, AO); a switch (SC) that is configured to selectively switch to one pair of probes (PR, PR) out of the plurality of pairs of probes (PR1 1 , PR1 2 , ... PR1 N ) according to a selective switching signal (S1); a meter (M) that is configured to measure a voltage (SIN 1 to SIN N ) between the probes (PR, PR) in the pair of probes (PR, PR) that have been selectively switched to according to the selective switching signal (S1); and a controller (CON) that is configured to output the selective switching signal (S1) to the switch (SC), wherein the measuring apparatus (SC, M, CON) is further comprising a plurality of resistance (R21, R22) configurations selectively in series with a switching circuit (SW2), said resistance configurations and switching circuit being connected between each pair of probes (PR), and wherein after a predetermined standby time (TW) has elapsed in a state where the plurality of probes (PR1 1 , PR1 2 , ... PR1 N ) have been connected in a single operation to each pair of voltage measurement target locations (T1, AO) on the plurality of measured objects (Cell 1 to Cell N ), the controller (CON) is configured to output the selective switching signal (S1) without waiting for the standby time (TW) to the switch (SC) to cause the switch to successively selectively switch to each pair of probes (PR, PR) out of the plurality of pairs of probes (PR1 1 , PR1 2 , ... PR1 N ) and is further configured to cause the meter (M) to measure the voltage (SIN 1 to SIN N ) between the probes in the pair of probes (PR, PR) that have been selectively switched to every time selective switching is performed. a plurality of pairs of probes (PR1 1 , PR1 2 , ... PR1 N ) that are each connected to a pair of voltage measurement target locations (T1, AO) on a plurality of measured objects (Cell 1 to Cell N ) that each have an equivalent of an internal capacitance connected in parallel between the pair of voltage measurement target locations (T1, AO); a switch (SC) that is configured to selectively switch to one pair of probes (PR, PR) out of the plurality of pairs of probes (PR1 1 , PR1 2 , ... PR1 N ) according to a selective switching signal (S1); a meter (M) that is configured to measure a voltage (SIN 1 to SIN N ) between the probes (PR, PR) in the pair of probes (PR, PR) that have been selectively switched to according to the selective switching signal (S1); and a controller (CON) that is configured to output the selective switching signal (S1) to the switch (SC), wherein the measuring apparatus (SC, M, CON) is further comprising a plurality of resistance (R21, R22) configurations selectively in series with a switching circuit (SW2), said resistance configurations and switching circuit being connected between each pair of probes (PR), and wherein after a predetermined standby time (TW) has elapsed in a state where the plurality of probes (PR1 1 , PR1 2 , ... PR1 N ) have been connected in a single operation to each pair of voltage measurement target locations (T1, AO) on the plurality of measured objects (Cell 1 to Cell N ), the controller (CON) is configured to output the selective switching signal (S1) without waiting for the standby time (TW) to the switch (SC) to cause the switch to successively selectively switch to each pair of probes (PR, PR) out of the plurality of pairs of probes (PR1 1 , PR1 2 , ... PR1 N ) and is further configured to cause the meter (M) to measure the voltage (SIN 1 to SIN N ) between the probes in the pair of probes (PR, PR) that have been selectively switched to every time selective switching is performed. <EOS>