A Computed Tomography imaging detector module of a Computed Tomography imaging system, comprising: at least one detector pixel for detecting radiation traversing an examination region; and self-diagnosing circuitry , including: a microprocessor ; and at least one measurement device , wherein the microprocessor is configured to control the at least one measurement device to measure at least one parameter of the at least one detector pixel, wherein a value of the at least one parameter is indicative of a health state of the imaging system, the self-diagnosing circuitry, further comprising: that the at least one measurement device is a sensor configured to sense detector pixel dark current on an individual detector pixel basis; a trender that is configured to generate a trend for the parameter, wherein the trend is to indicate measurement values for the least one parameter over time, the at least one parameter over time is at least the detector pixel dark current on an individual detector pixel basis; a measurement memory configured to store the measured trend and to store historical data; a logic that is configured to analyze the trend in view of predetermined rules and criteria , the criteria indicating the historical data from the measurement memory and to generate a signal based on a result of the analysis, wherein the signal is to include an estimated service date for at least the imaging detector module based on a result of the analysis. at least one detector pixel for detecting radiation traversing an examination region; and self-diagnosing circuitry , including: a microprocessor ; and at least one measurement device , a microprocessor ; and at least one measurement device , wherein the microprocessor is configured to control the at least one measurement device to measure at least one parameter of the at least one detector pixel, wherein a value of the at least one parameter is indicative of a health state of the imaging system, the self-diagnosing circuitry, further comprising: that the at least one measurement device is a sensor configured to sense detector pixel dark current on an individual detector pixel basis; a trender that is configured to generate a trend for the parameter, wherein the trend is to indicate measurement values for the least one parameter over time, the at least one parameter over time is at least the detector pixel dark current on an individual detector pixel basis; a measurement memory configured to store the measured trend and to store historical data; a logic that is configured to analyze the trend in view of predetermined rules and criteria , the criteria indicating the historical data from the measurement memory and to generate a signal based on a result of the analysis, wherein the signal is to include an estimated service date for at least the imaging detector module based on a result of the analysis. that the at least one measurement device is a sensor configured to sense detector pixel dark current on an individual detector pixel basis; a trender that is configured to generate a trend for the parameter, wherein the trend is to indicate measurement values for the least one parameter over time, the at least one parameter over time is at least the detector pixel dark current on an individual detector pixel basis; a measurement memory configured to store the measured trend and to store historical data; a logic that is configured to analyze the trend in view of predetermined rules and criteria , the criteria indicating the historical data from the measurement memory and to generate a signal based on a result of the analysis, wherein the signal is to include an estimated service date for at least the imaging detector module based on a result of the analysis. <EOS>