A contact inspection device configured to perform contact inspection of a test object , the contact inspection device further comprising: plural probes each having a first end to be brought into contact with the test object ; a probe substrate including contact portions in contact with respective second ends of the probes ; a probe head through which the plural probes extend and which is detachably attached to the probe substrate ; the probe head comprising an upper probe head , a lower probe head , and an intermediate retaining member , characterized in that the contact inspection device further comprises plural positioning members which are provided on a surface of the upper probe head facing the probe substrate and through which the plural probes extend, each of the probes having a rotation restricted portion provided on the side of the second end, each of the plural positioning members having rotation restricting portions adapted to engage the rotation restricted portions , wherein, when the plural positioning members are moved relative to each other, in a state where the probe head is removed from the probe substrate , the rotation restricting portions align the probes and switch the probes from a rotation unrestricted state to a rotation restricted state, and wherein the plural positioning members include a first positioning member and a second positioning member , wherein the rotation restricting portions of the first positioning member and the second positioning member have a rectangular shape, wherein the rotation restricted portions have a rectangular shape, and wherein when the first positioning member and the second positioning member are moved relative to each other along a diagonal of the rectangular shape, the rotation restricting portions restrict rotation of the rotation restricted portions . plural probes each having a first end to be brought into contact with the test object ; a probe substrate including contact portions in contact with respective second ends of the probes ; a probe head through which the plural probes extend and which is detachably attached to the probe substrate ; the probe head comprising an upper probe head , a lower probe head , and an intermediate retaining member , characterized in that the contact inspection device further comprises plural positioning members which are provided on a surface of the upper probe head facing the probe substrate and through which the plural probes extend, each of the probes having a rotation restricted portion provided on the side of the second end, each of the plural positioning members having rotation restricting portions adapted to engage the rotation restricted portions , wherein, when the plural positioning members are moved relative to each other, in a state where the probe head is removed from the probe substrate , the rotation restricting portions align the probes and switch the probes from a rotation unrestricted state to a rotation restricted state, and wherein the plural positioning members include a first positioning member and a second positioning member , wherein the rotation restricting portions of the first positioning member and the second positioning member have a rectangular shape, wherein the rotation restricted portions have a rectangular shape, and wherein when the first positioning member and the second positioning member are moved relative to each other along a diagonal of the rectangular shape, the rotation restricting portions restrict rotation of the rotation restricted portions . <EOS>