A charge detection mass spectrometer (CDMS) for simultaneously measuring multiple ions, comprising: an ion source configured to generate and supply a beam of ions, an electrostatic linear ion trap (ELIT) including a pair of coaxially aligned ion mirrors and an elongated charge detection cylinder disposed therebetween and coaxially aligned therewith such that a longitudinal axis of the ELIT passes centrally through each, a first one of the pair of ions mirror defining an ion inlet aperture about the longitudinal axis through which the supplied beam of ions enters the ELIT, at least one voltage source operatively coupled to the pair of ion mirrors and configured to produce voltages for selectively establishing electric fields therein configured to trap within the ELIT a plurality of ions in the entering beam of ions and to cause the plurality of trapped ions to oscillate back and forth between the pair of ion mirrors each time passing through the charge detection cylinder, and characterized by further comprising: means for controlling a trajectory of the beam of ions entering the ion inlet aperture of the ELIT to cause the plurality of ions subsequently trapped within the ELIT to oscillate therein with a corresponding plurality of different planar ion oscillation trajectories angularly offset from one another about the longitudinal axis with each extending along the longitudinal axis and crossing the longitudinal axis in each of the pair of ion mirrors or a corresponding plurality of different cylindrical ion oscillation trajectories radially offset from one another about the longitudinal axis to form a plurality of nested cylindrical trajectories each extending along the longitudinal axis. an ion source configured to generate and supply a beam of ions, an electrostatic linear ion trap (ELIT) including a pair of coaxially aligned ion mirrors and an elongated charge detection cylinder disposed therebetween and coaxially aligned therewith such that a longitudinal axis of the ELIT passes centrally through each, a first one of the pair of ions mirror defining an ion inlet aperture about the longitudinal axis through which the supplied beam of ions enters the ELIT, at least one voltage source operatively coupled to the pair of ion mirrors and configured to produce voltages for selectively establishing electric fields therein configured to trap within the ELIT a plurality of ions in the entering beam of ions and to cause the plurality of trapped ions to oscillate back and forth between the pair of ion mirrors each time passing through the charge detection cylinder, and characterized by further comprising: means for controlling a trajectory of the beam of ions entering the ion inlet aperture of the ELIT to cause the plurality of ions subsequently trapped within the ELIT to oscillate therein with a corresponding plurality of different planar ion oscillation trajectories angularly offset from one another about the longitudinal axis with each extending along the longitudinal axis and crossing the longitudinal axis in each of the pair of ion mirrors or a corresponding plurality of different cylindrical ion oscillation trajectories radially offset from one another about the longitudinal axis to form a plurality of nested cylindrical trajectories each extending along the longitudinal axis. <EOS>