A two-dimensional force sensor for measuring a first force (Fx) in a first direction (X) and a second force (F Y ) in a second direction (Y) different from the first direction (X), the two-dimensional force sensor comprising: a measurement probe (P); a first resilient structure (H1) oriented in the second direction (Y) and capable of being deformed in the first direction (X) by the first force (F X ) when induced on the measurement probe (P), a first end of the first resilient structure (H1) being arranged for being coupled to a reference point, wherein the first resilient structure (H1) is a resilient plate, or a beam comprising a bending zone; and a second resilient structure (H2) oriented in the first direction (X) and capable of being deformed in the second direction (Y) by the second force (F Y ) when induced on the measurement probe (P), a first end of the second resilient structure (H2) being coupled to a second end of the first resilient structure (H1), and a second end of the second resilient structure (H2) being coupled to the measurement probe (P), wherein the second resilient structure (H2) is a resilient plate, or a beam comprising a bending zone; characterized in that the measurement probe (P) is mounted on an extension device (A) mounted to the second end of the second resilient structure (H2), the extension device (A) being shaped for - in the absence of the first and second forces - positioning the measurement probe (P) at an imaginary cross-section point of a neutral axis of the first resilient structure (H1) and a neutral axis of the second resilient structure (H2), or at a position deviating from that imaginary cross-section point by no more than 20%, preferably no more than 10%, and more preferably no more than 5%, of a length of the extension device (A). a measurement probe (P); a first resilient structure (H1) oriented in the second direction (Y) and capable of being deformed in the first direction (X) by the first force (F X ) when induced on the measurement probe (P), a first end of the first resilient structure (H1) being arranged for being coupled to a reference point, wherein the first resilient structure (H1) is a resilient plate, or a beam comprising a bending zone; and a second resilient structure (H2) oriented in the first direction (X) and capable of being deformed in the second direction (Y) by the second force (F Y ) when induced on the measurement probe (P), a first end of the second resilient structure (H2) being coupled to a second end of the first resilient structure (H1), and a second end of the second resilient structure (H2) being coupled to the measurement probe (P), wherein the second resilient structure (H2) is a resilient plate, or a beam comprising a bending zone; characterized in that the measurement probe (P) is mounted on an extension device (A) mounted to the second end of the second resilient structure (H2), the extension device (A) being shaped for - in the absence of the first and second forces - positioning the measurement probe (P) at an imaginary cross-section point of a neutral axis of the first resilient structure (H1) and a neutral axis of the second resilient structure (H2), or at a position deviating from that imaginary cross-section point by no more than 20%, preferably no more than 10%, and more preferably no more than 5%, of a length of the extension device (A). <EOS>