Method for the maintenance of a measuring point (M) in a process automation system, said method comprising the following steps: - Recording of the product type (P 1 , P 2 ) of each field device of a multitude of field devices (F 1 , F 2 , F 3 ), wherein the field devices are located in a warehouse , and saving of the product types (P 1 , P 2 ) in a database (DB); - Capturing of device features (GM 1 , GM 2 , GM 3 , GM 4 ) of the multitude of field devices (F 1 , F 2 , F 3 ), wherein the device features (GM 1 , GM 2 , GM 3 , GM 4 ) constitute a discrete representation of the performance characteristics of each of the multiple field devices, and assignment of the various device characteristics (GM 1 , GM 2 , GM 3 , GM 4 ) to the product types (P 1 , P 2 ) saved in the database (DB); - Capturing of the product type (P x ) and the device characteristics (GM x ) of a field device that is located in the measuring point and is to be replaced; - Comparison of the product type (P x ) and the device characteristics (GM x ) of the field device to be replaced with the product types (P 1 , P 2 ) saved in the database (DB) and the assigned device characteristics (GM 1 , GM 2 , GM 3 , GM 4 ); - Calculation of a suitability assessment using a replacement matrix for each of the multiple field devices (F 1 , F 2 , F 3 ), wherein the suitability assessment represents a degree of similarity of the device characteristics (GM 1 , GM 2 , GM 3 , GM 4 , GM x ) and wherein the replacement matrix is a rule for the mutual replacement of different device characteristics (GM 1 , GM 2 , GM 3 , GM 4 , GM x ); and - Disclosure of suitability assessments to a client , wherein the client selects a replacement field device from the multitude of field devices (F 1 , F 2 , F 3 ) on the basis of the suitability assessment, wherein a higher suitability assessment represents a higher degree of similarity of the device characteristics (GM 1 , GM 2 , GM 3 , GM 4 , GM x ). - Recording of the product type (P 1 , P 2 ) of each field device of a multitude of field devices (F 1 , F 2 , F 3 ), wherein the field devices are located in a warehouse , and saving of the product types (P 1 , P 2 ) in a database (DB); - Capturing of device features (GM 1 , GM 2 , GM 3 , GM 4 ) of the multitude of field devices (F 1 , F 2 , F 3 ), wherein the device features (GM 1 , GM 2 , GM 3 , GM 4 ) constitute a discrete representation of the performance characteristics of each of the multiple field devices, and assignment of the various device characteristics (GM 1 , GM 2 , GM 3 , GM 4 ) to the product types (P 1 , P 2 ) saved in the database (DB); - Capturing of the product type (P x ) and the device characteristics (GM x ) of a field device that is located in the measuring point and is to be replaced; - Comparison of the product type (P x ) and the device characteristics (GM x ) of the field device to be replaced with the product types (P 1 , P 2 ) saved in the database (DB) and the assigned device characteristics (GM 1 , GM 2 , GM 3 , GM 4 ); - Calculation of a suitability assessment using a replacement matrix for each of the multiple field devices (F 1 , F 2 , F 3 ), wherein the suitability assessment represents a degree of similarity of the device characteristics (GM 1 , GM 2 , GM 3 , GM 4 , GM x ) and wherein the replacement matrix is a rule for the mutual replacement of different device characteristics (GM 1 , GM 2 , GM 3 , GM 4 , GM x ); and - Disclosure of suitability assessments to a client , wherein the client selects a replacement field device from the multitude of field devices (F 1 , F 2 , F 3 ) on the basis of the suitability assessment, wherein a higher suitability assessment represents a higher degree of similarity of the device characteristics (GM 1 , GM 2 , GM 3 , GM 4 , GM x ). <EOS>