A device for determining an elevation profile of a three-dimensional surface of an object , comprising: a light source , which is designed to emit diverging light beams (103-1), a first concave mirror (105, 105-1), which is designed to convert the diverging light (103-1) emitted from the light source into light (103-2) with parallel light beams and reflect it in the direction of the three-dimensional surface of the object , a second concave mirror (105, 105-2), which is designed to convert the light (103-3) reflected by the three-dimensional surface of the object into light with converging light beams (103-4) and to focus the converging light (103-4) onto a detection means , wherein the detection means is designed to detect the light (103-3) reflected by the three-dimensional surface of the object as an offset/deformed light pattern , wherein the offset of the offset light pattern correlates with the elevation profile of the three-dimensional surface of the object , and an evaluation means, which is designed to determine an elevation profile of the three-dimensional surface of the object on the basis of the offset light pattern detected by the detection means , wherein the detection means comprises a triangulation camera with a two-dimensional matrix chip with a number of pixels, wherein the triangulation camera is designed to detect the deformation of the light pattern , wherein the evaluation means is designed to determine an elevation profile, in particular a two-dimensional elevation profile, of the surface of the object on the basis of the detected offset/detected deformation of individual regions of the light pattern . a light source , which is designed to emit diverging light beams (103-1), a first concave mirror (105, 105-1), which is designed to convert the diverging light (103-1) emitted from the light source into light (103-2) with parallel light beams and reflect it in the direction of the three-dimensional surface of the object , a second concave mirror (105, 105-2), which is designed to convert the light (103-3) reflected by the three-dimensional surface of the object into light with converging light beams (103-4) and to focus the converging light (103-4) onto a detection means , wherein the detection means is designed to detect the light (103-3) reflected by the three-dimensional surface of the object as an offset/deformed light pattern , wherein the offset of the offset light pattern correlates with the elevation profile of the three-dimensional surface of the object , and an evaluation means, which is designed to determine an elevation profile of the three-dimensional surface of the object on the basis of the offset light pattern detected by the detection means , wherein the detection means comprises a triangulation camera with a two-dimensional matrix chip with a number of pixels, wherein the triangulation camera is designed to detect the deformation of the light pattern , wherein the evaluation means is designed to determine an elevation profile, in particular a two-dimensional elevation profile, of the surface of the object on the basis of the detected offset/detected deformation of individual regions of the light pattern . <EOS>