A sample analyzer, comprising: a transport part that is configured to sequentially transport first sample containers held in a rack along a transport pathway to a first sample aspiration position at which a sample is aspirated by a nozzle in order to perform continuous measurements of samples in the first sample containers; a setting part in which a second sample container is set, the second sample container accommodating a sample to be measured with priority over measurement of the samples in the first sample containers; wherein the setting part is arranged outside the transport pathway of the transport part ; a nozzle capable of moving for aspirating the sample from a first sample container at the first sample aspiration position and aspirating the sample from the second sample container set in the setting part at a second sample aspiration position ; and a detector that detects components of the sample aspirated by the nozzle and supplied to the detector , characterised in that : the sample analyzer further comprises: a controller that, if a sample aspiration from the second sample container using the nozzle is required while the first sample containers are being sequentially transported to the first sample aspiration position , controls the transport part such that transport of the rack is interrupted and the rack moves, from the first sample aspiration position , to a position distant from the first sample aspiration position , and in that : the controller controls the transport part such that after the nozzle that has aspirated the sample from the second sample container moves above the first sample aspiration position in a state in which the rack is distant from the first sample aspiration position , a first sample container from which a sample is to be aspirated next among the first sample containers is positioned at the first sample aspiration position. a transport part that is configured to sequentially transport first sample containers held in a rack along a transport pathway to a first sample aspiration position at which a sample is aspirated by a nozzle in order to perform continuous measurements of samples in the first sample containers; a setting part in which a second sample container is set, the second sample container accommodating a sample to be measured with priority over measurement of the samples in the first sample containers; wherein the setting part is arranged outside the transport pathway of the transport part ; a nozzle capable of moving for aspirating the sample from a first sample container at the first sample aspiration position and aspirating the sample from the second sample container set in the setting part at a second sample aspiration position ; and a detector that detects components of the sample aspirated by the nozzle and supplied to the detector , characterised in that : the sample analyzer further comprises: a controller that, if a sample aspiration from the second sample container using the nozzle is required while the first sample containers are being sequentially transported to the first sample aspiration position , controls the transport part such that transport of the rack is interrupted and the rack moves, from the first sample aspiration position , to a position distant from the first sample aspiration position , <EOS>