A method for monitoring a wiring system , the method comprising: measuring a number of responses to signals transmitted in a portion of the wiring system to form a measured signature , comprising: sending a number of test signals through a number of paths in the portion of the wiring system ; and detecting a number of reflected pulses generated by the portion of the wiring system in response to the number of test signals ; retrieving design data for the portion of the wiring system ; identifying a number of expected responses for the signals in the portion of the wiring system using the design data to form a computed signature , comprising: generating a number of expected impedance values for the portion of the wiring system using the design data ; performing a simulation of the number of test signals using the number of expected impedance values to identify the number of expected responses for the computed signature; and comparing the measured signature with the computed signature, wherein the step of comparing the measured signature with the computed signature further comprises: plotting the computed signature and the measured signature on a graph ; identifying a number of areas on the graph where a difference between the computed signature and the measured signature exceeds a specified threshold to form a number of identified areas ; and displaying the graph with the computed signature , the measured signature , and the number of identified areas on a display device . measuring a number of responses to signals transmitted in a portion of the wiring system to form a measured signature , comprising: sending a number of test signals through a number of paths in the portion of the wiring system ; and detecting a number of reflected pulses generated by the portion of the wiring system in response to the number of test signals ; sending a number of test signals through a number of paths in the portion of the wiring system ; and detecting a number of reflected pulses generated by the portion of the wiring system in response to the number of test signals ; retrieving design data for the portion of the wiring system ; identifying a number of expected responses for the signals in the portion of the wiring system using the design data to form a computed signature , comprising: generating a number of expected impedance values for the portion of the wiring system using the design data ; performing a simulation of the number of test signals using the number of expected impedance values to identify the number of expected responses for the computed signature; and generating a number of expected impedance values for the portion of the wiring system using the design data ; performing a simulation of the number of test signals using the number of expected impedance values to identify the number of expected responses for the computed signature; and comparing the measured signature with the computed signature, wherein the step of comparing the measured signature with the computed signature further comprises: plotting the computed signature and the measured signature on a graph ; identifying a number of areas on the graph where a difference between the computed signature and the measured signature exceeds a specified threshold to form a number of identified areas ; and displaying the graph with the computed signature , the measured signature , and the number of identified areas on a display device . plotting the computed signature and the measured signature on a graph ; identifying a number of areas on the graph where a difference between the computed signature and the measured signature exceeds a specified threshold to form a number of identified areas ; and displaying the graph with the computed signature , the measured signature , and the number of identified areas on a display device . <EOS>