A surface plasmon resonance fluorescence analysis method of detecting presence or an amount of a detection object substance by detecting fluorescence that is emitted by a fluorescence material labelling the detection object substance when the fluorescence material is excited by localized light based on a surface plasmon resonance, the surface plasmon resonance fluorescence analysis method comprising: applying excitation light from an excitation light irradiating section to an analysis chip installed in a chip holder , the analysis chip including a prism including an incidence surface and a film formation surface , a metal film disposed on the film formation surface , a capturing body fixed on the metal film , and a channel closure disposed on the film formation surface or the metal film ; detecting fluorescence emitted from the fluorescence material labelling the detection object substance captured by the capturing body; acquiring output information of the excitation light irradiating section by detecting excitation light reflected by the analysis chip , wherein in the acquiring the output information of the excitation light irradiating section , reflection light from the incidence surface or from the incidence surface and a surface adjacent to the incidence surface , wherein the surface adjacent to the incidence surface is the channel closure or a bottom surface of the prism , is detected; and determining whether the excitation light irradiating section is in a normal condition by comparing the output information of the excitation light irradiating section with preliminarily acquired output information that serves as a reference of the excitation light irradiating section , wherein the output information of the excitation light irradiating section is information relating to a power of the excitation light irradiating section and an irradiation direction of excitation light of the excitation light irradiating section . applying excitation light from an excitation light irradiating section to an analysis chip installed in a chip holder , the analysis chip including a prism including an incidence surface and a film formation surface , a metal film disposed on the film formation surface , a capturing body fixed on the metal film , and a channel closure disposed on the film formation surface or the metal film ; detecting fluorescence emitted from the fluorescence material labelling the detection object substance captured by the capturing body; acquiring output information of the excitation light irradiating section by detecting excitation light reflected by the analysis chip , wherein in the acquiring the output information of the excitation light irradiating section , reflection light from the incidence surface or from the incidence surface and a surface adjacent to the incidence surface , wherein the surface adjacent to the incidence surface is the channel closure or a bottom surface of the prism , is detected; and determining whether the excitation light irradiating section is in a normal condition by comparing the output information of the excitation light irradiating section with preliminarily acquired output information that serves as a reference of the excitation light irradiating section , wherein the output information of the excitation light irradiating section is information relating to a power of the excitation light irradiating section and an irradiation direction of excitation light of the excitation light irradiating section . <EOS>