A device for measuring scattering of a sample , comprising: - at least one first and one second scattering receiver for receiving scattered radiation of the sample ; and - at least one imaging element via which radiation can get to the sample and from the sample to the scattering receivers , wherein - the first and second scattering receivers are arranged in a common planar or spherically curved surface which is perpendicularly oriented with respect to an optical axis of the imaging element ; - a protective element which is to be arranged on a side of the sample facing the scattering receivers ; - at least one refraction receiver arranged in the surface of the scattering receivers , which is configured to receive radiation specularly reflected on a sample-side boundary surface of the protective element ; and - a radiation source arranged in the surface of the scattering receivers , wherein the first scattering receiver is configured to receive saturated scattered radiation of the sample , and the second scattering receiver is configured and arranged to receive linear scattered radiation of the sample , wherein the first scattering receiver is arranged in such a way that it receives scattering radiation from a larger volume of the sample than the second scattering receiver ; wherein the device includes at least one reference receiver arranged in the surface of the scattering receivers , which is configured to receive radiation reflected on a sensor-side boundary surface of the protective element , and wherein the imaging element includes at least one first and one second lens whose optical axes extend parallel to each other, wherein the radiation source is arranged outside the optical axis of the first lens , and wherein the first lens can be charged with coupling radiation of the radiation source , and the first scattering receiver and the reference receiver can be charged via the first lens and the second scattering receiver and the refraction receiver can be charged via the second lens , or the imaging element includes first, second and third lenses whose optical axes extend parallel to each other, wherein the radiation source is arranged outside the optical axis of the first lens , and wherein the first lens can be charged with coupling radiation of the radiation source , and the first scattering receiver can be charged via the first lens , the second scattering receiver and the refraction receiver via the second lens , and the reference receiver via the third lens . - at least one first and one second scattering receiver for receiving scattered radiation of the sample ; and - at least one imaging element via which radiation can get to the sample and from the sample to the scattering receivers , wherein - the first and second scattering receivers are arranged in a common planar or spherically curved surface which is perpendicularly oriented with respect to an optical axis of the imaging element ; - a protective element which is to be arranged on a side of the sample facing the scattering receivers ; - at least one refraction receiver arranged in the surface of the scattering receivers , which is configured to receive radiation specularly reflected on a sample-side boundary surface of the protective element ; and - a radiation source arranged in the surface of the scattering receivers , <EOS>