Operating device , comprising: a first microcontroller (C1) having at least a first measurement input (ADC1), which is designed for converting a measurement potential present in each case at the first measurement input (ADC1) into a respectively associated detection result dependent on the respective measurement potential; a voltage source having a supply voltage predefined by two supply potentials (U, GND); a resistor network (W) to which the supply voltage is applied, wherein the first measurement input (ADC1) is electrically conductively connected to a first tap (A1) at the resistor network (W); at least one switching element (S1, S2) which is integrated in the resistor network (W) and whose switching state out of at least two switching states is changed by operation on the part of an operator; wherein the resistor network (W) is designed such that the respective switching state is assigned a different switching potential present at the first measurement input (ADC1), and at least one switching potential differs from the supply potentials (U, GND); a second microcontroller (C2), which is superordinate to the first microcontroller (C1) and is designed to receive the respective detection result of the first microcontroller (C1) and to output it to a superordinate control unit (U); an active component (ES) integrated in the resistor network (W) and controllable by the second microcontroller (C2), in order that the measurement potential present at the first measurement input (ADC1) is put at an interference potential differing from all the switching potentials as a result of influencing of the resistor network (W); wherein the second microcontroller (C2) is designed, in the case where the detection result of the first microcontroller (C1) does not correspond to that of the interference potential during the control of the active component (ES), to suppress a subsequent output of the detection result to the superordinate control unit (U) at least temporarily. a first microcontroller (C1) having at least a first measurement input (ADC1), which is designed for converting a measurement potential present in each case at the first measurement input (ADC1) into a respectively associated detection result dependent on the respective measurement potential; a voltage source having a supply voltage predefined by two supply potentials (U, GND); a resistor network (W) to which the supply voltage is applied, wherein the first measurement input (ADC1) is electrically conductively connected to a first tap (A1) at the resistor network (W); at least one switching element (S1, S2) which is integrated in the resistor network (W) and whose switching state out of at least two switching states is changed by operation on the part of an operator; wherein the resistor network (W) is designed such that the respective switching state is assigned a different switching potential present at the first measurement input (ADC1), and at least one switching potential differs from the supply potentials (U, GND); a second microcontroller (C2), which is superordinate to the first microcontroller (C1) and is designed to receive the respective detection result of the first microcontroller (C1) and to output it to a superordinate control unit (U); an active component (ES) integrated in the resistor network (W) and controllable by the second microcontroller (C2), in order that the measurement potential present at the first measurement input (ADC1) is put at an interference potential differing from all the switching potentials as a result of influencing of the resistor network (W); wherein the second microcontroller (C2) is designed, in the case where the detection result of the first microcontroller (C1) does not correspond to that of the interference potential during the control of the active component (ES), to suppress a subsequent output of the detection result to the superordinate control unit (U) at least temporarily. <EOS>