Method for testing a validity of data for a computer-implemented apparatus that comprises at least one digital chip having at least one part that is reconfigurable by means of at least one configuration description (KB), having the steps of: a) providing, during a protected operating phase of the computer-implemented apparatus , a piece of test information (PI) for indicating admissible configuration descriptions (KB) that can be loaded into the reconfigurable part of the digital chip , wherein the test information (PI) is in the form of a whitelist comprising hash values for the valid configuration descriptions (KB), wherein the protected operating phase of the computer-implemented apparatus is in the form of a first protected operating phase for providing the test information (PI) in advance on the computer-implemented apparatus and/or in the form of a second protected operating phase for providing the test information (PI) at runtime of the computer-implemented apparatus and in the form of a third protected operating phase for providing the test information (PI) on the basis of an information packet while the information packet is being installed, and b) testing the validity of a determined configuration description (KB) needing to be loaded into the reconfigurable part of the digital chip , which configuration description is in the form of one of the admissible configuration descriptions (KB) that can be loaded into the reconfigurable part of the digital chip or in the form of an inadmissible determined configuration description (KB) needing to be loaded into the reconfigurable part of the digital chip , by comparing the determined configuration description (KB) needing to be loaded into the reconfigurable part of the digital chip with the test information (PI). a) providing, during a protected operating phase of the computer-implemented apparatus , a piece of test information (PI) for indicating admissible configuration descriptions (KB) that can be loaded into the reconfigurable part of the digital chip , wherein the test information (PI) is in the form of a whitelist comprising hash values for the valid configuration descriptions (KB), wherein the protected operating phase of the computer-implemented apparatus is in the form of a first protected operating phase for providing the test information (PI) in advance on the computer-implemented apparatus and/or in the form of a second protected operating phase for providing the test information (PI) at runtime of the computer-implemented apparatus and in the form of a third protected operating phase for providing the test information (PI) on the basis of an information packet while the information packet is being installed, and b) testing the validity of a determined configuration description (KB) needing to be loaded into the reconfigurable part of the digital chip , which configuration description is in the form of one of the admissible configuration descriptions (KB) that can be loaded into the reconfigurable part of the digital chip or in the form of an inadmissible determined configuration description (KB) needing to be loaded into the reconfigurable part of the digital chip , by comparing the determined configuration description (KB) needing to be loaded into the reconfigurable part of the digital chip with the test information (PI). <EOS>