A radiation detector system comprising: a semiconductor detector having a surface ; plural pixelated anodes disposed on the surface , at least one of the pixelated anodes configured to generate a collected charge signal corresponding to a charge collected by the pixelated anode and to generate a non-collected charge signal corresponding to a charge collected by an adjacent anode to the pixelated anode; and at least one processor operably coupled to the pixelated anodes , the at least one processor comprising a tangible and non-transitory memory having stored thereon instructions configured to direct the at least one processor to: determine a collected value for the collected charge signal in the pixelated anode ; determine a non-collected value for the non-collected charge signal in the pixelated anode corresponding to the charge collected by the adjacent anode ; determine a calibrated value for the charge collected by the adjacent anode using the value for the non-collected charge signal adjusted by a calibration factor; determine a total charge produced by a charge sharing event collected by the pixelated anode and the adjacent anode using the collected value and the calibrated value, and count the charge sharing event as a single event related to one of the pixelated anode or the adjacent anode if the total charge of the charge sharing event determined using the collected value and the calibrated value exceeds a predetermined value. a semiconductor detector having a surface ; plural pixelated anodes disposed on the surface , at least one of the pixelated anodes configured to generate a collected charge signal corresponding to a charge collected by the pixelated anode and to generate a non-collected charge signal corresponding to a charge collected by an adjacent anode to the pixelated anode; and at least one processor operably coupled to the pixelated anodes , the at least one processor comprising a tangible and non-transitory memory having stored thereon instructions configured to direct the at least one processor to: determine a collected value for the collected charge signal in the pixelated anode ; determine a non-collected value for the non-collected charge signal in the pixelated anode corresponding to the charge collected by the adjacent anode ; determine a calibrated value for the charge collected by the adjacent anode using the value for the non-collected charge signal adjusted by a calibration factor; determine a total charge produced by a charge sharing event collected by the pixelated anode and the adjacent anode using the collected value and the calibrated value, and count the charge sharing event as a single event related to one of the pixelated anode or the adjacent anode if the total charge of the charge sharing event determined using the collected value and the calibrated value exceeds a predetermined value. determine a collected value for the collected charge signal in the pixelated anode ; determine a non-collected value for the non-collected charge signal in the pixelated anode corresponding to the charge collected by the adjacent anode ; determine a calibrated value for the charge collected by the adjacent anode using the value for the non-collected charge signal adjusted by a calibration factor; determine a total charge produced by a charge sharing event collected by the pixelated anode and the adjacent anode using the collected value and the calibrated value, and count the charge sharing event as a single event related to one of the pixelated anode or the adjacent anode if the total charge of the charge sharing event determined using the collected value and the calibrated value exceeds a predetermined value. <EOS>