Method for the direction-dependent measurement of at least one lighting or radiometric characteristic variable of an optical radiation source , having at least one sensor , wherein the optical radiation source is rotated about a first axis and about a second axis , which is perpendicular to the first axis, during a measurement operation and the at least one sensor is arranged to be spatially fixed and immobile, and wherein the radiation source is moved during the measurement such that the at least one sensor records measurement values that indicate the lighting or radiometric characteristic variable at least approximately on a spherical surface about the radiation centroid of the radiation source , wherein - at least two sensors are provided, which simultaneously provide measurement values during a measurement, - the light from the radiation source is reflected at a planar measurement wall with homogeneous reflection and reflected light is captured by a camera , wherein the reflected light is imaged by an optical unit onto a two-dimensional sensor chip , and wherein the at least two sensors are formed by pixels of the sensor chip , - the radiation source is rotated to individual angle positions such that desired solid-angle regions of the light distribution irradiate the measurement wall and are captured by the sensor chip by way of the optical unit , and - light from the radiation source additionally directly illuminates, through an opening in the reflective measurement wall , a further sensor located in the opening and the signal captured by this sensor is used for calibrating the sensor chip , wherein for calibration purposes the region of the light distribution that is instantaneously incident in the opening during the measurement operation is measured by the further sensor , wherein noted points of the light distribution on the measurement wall are remeasured after ascertainment with the sensor chip of the camera with the further sensor by way of corresponding orientation of the radiation source , and these measurement values are used for the calibration of the sensor chip . - at least two sensors are provided, which simultaneously provide measurement values during a measurement, - the light from the radiation source is reflected at a planar measurement wall with homogeneous reflection and reflected light is captured by a camera , wherein the reflected light is imaged by an optical unit onto a two-dimensional sensor chip , and wherein the at least two sensors are formed by pixels of the sensor chip , - the radiation source is rotated to individual angle positions such that desired solid-angle regions of the light distribution irradiate the measurement wall and are captured by the sensor chip by way of the optical unit , and - light from the radiation source additionally directly illuminates, through an opening in the reflective measurement wall , a further sensor located in the opening and the signal captured by this sensor is used for calibrating the sensor chip , wherein for calibration purposes the region of the light distribution that is instantaneously incident in the opening during the measurement operation is measured by the further sensor , <EOS>