A surface contamination monitoring system comprising: (a) radiation detector array ; and (b) computing device ; wherein said radiation detector array is configured to monitor radioisotope surface-contamination of a monitored subject ; said computing device is configured to compute a corrected net count rate, CNR, , based upon the net count rate, NCR, output of said radiation detector array , for each of a plurality of zones along said radiation detector array; wherein said corrected net count rate (CNR) comprises a self-shielding correction factor (SSF, SF) which comprises a height value and one or a plurality of thickness values : said height value representing a physical characteristic of said monitored subject ; and each of said one or a plurality of thickness values representing a physical characteristic of said monitored subject , characterized in that said computing device is further configured to compute said corrected net count rate (CNR) for each of a first and a second position, reflecting a body of said monitored subject in a first position and in a second position different from the first position, respectively; and in that said self-shielding correction factor (SSF, SF) is configured to correct for shielding of background radiation by said body of said monitored subject in the corresponding zone and in the corresponding positions. (a) radiation detector array ; and (b) computing device ; wherein said radiation detector array is configured to monitor radioisotope surface-contamination of a monitored subject ; said computing device is configured to compute a corrected net count rate, CNR, , based upon the net count rate, NCR, output of said radiation detector array , for each of a plurality of zones along said radiation detector array; wherein said corrected net count rate (CNR) comprises a self-shielding correction factor (SSF, SF) which comprises a height value and one or a plurality of thickness values : said height value representing a physical characteristic of said monitored subject ; and each of said one or a plurality of thickness values representing a physical characteristic of said monitored subject , characterized in that said computing device is further configured to compute said corrected net count rate (CNR) for each of a first and a second position, reflecting a body of said monitored subject in a first position and in a second position different from the first position, respectively; and in that said self-shielding correction factor (SSF, SF) is configured to correct for shielding of background radiation by said body of said monitored subject in the corresponding zone and in the corresponding positions. said radiation detector array is configured to monitor radioisotope surface-contamination of a monitored subject ; said computing device is configured to compute a corrected net count rate, CNR, , based upon the net count rate, NCR, output of said radiation detector array , for each of a plurality of zones along said radiation detector array; wherein said corrected net count rate (CNR) comprises a self-shielding correction factor (SSF, SF) which comprises a height value and one or a plurality of thickness values : said height value representing a physical characteristic of said monitored subject ; and each of said one or a plurality of thickness values representing a physical characteristic of said monitored subject , characterized in that said computing device is further configured to compute said corrected net count rate (CNR) for each of a first and a second position, reflecting a body of said monitored subject in a first position and in a second position different from the first position, respectively; and in that said self-shielding correction factor (SSF, SF) is configured to correct for shielding of background radiation by said body of said monitored subject in the corresponding zone and in the corresponding positions. <EOS>