A non-destructive inspection "NDI" system comprising: a robotic arm ; a storage device proximate said robotic arm ; a processor unit ; and a plurality of NDI probe assemblies disposed within said storage device , each NDI probe assembly comprising at least one transducer operable for NDI of a part and a tool operable as a mechanical interface between said robotic arm and the corresponding said NDI probe assembly , each said NDI probe assembly configured for a specific NDI task, for NDI of a part , said robotic arm operable by the processor unit to select, engage and remove one of said NDI probe assemblies from said storage device for the NDI of at least a portion of the part , wherein each said NDI probe assembly comprises: a holder for the corresponding said transducers ; and an outside magnetic guidance fixture operable via said robotic arm to engage a component upon which an NDI is to be performed and place said transducers in a position for the NDI of a part , wherein said outside magnetic guidance fixture comprises: a first probe assembly half ; a second probe assembly half ; and at least one guide bar for mechanically connecting said probe assembly halves, said second probe assembly half being movable with respect to said first probe assembly half , each said probe assembly half comprising at least one magnet disposed therein, said magnets operable to move said second probe assembly half such that said NDI probe assembly properly engages the portion of the part that is to undergo NDI. a robotic arm ; a storage device proximate said robotic arm ; a processor unit ; and a plurality of NDI probe assemblies disposed within said storage device , each NDI probe assembly comprising at least one transducer operable for NDI of a part and a tool operable as a mechanical interface between said robotic arm and the corresponding said NDI probe assembly , each said NDI probe assembly configured for a specific NDI task, for NDI of a part , said robotic arm operable by the processor unit to select, engage and remove one of said NDI probe assemblies from said storage device for the NDI of at least a portion of the part , wherein each said NDI probe assembly comprises: a holder for the corresponding said transducers ; and an outside magnetic guidance fixture operable via said robotic arm to engage a component upon which an NDI is to be performed and place said transducers in a position for the NDI of a part , wherein said outside magnetic guidance fixture comprises: a first probe assembly half ; a second probe assembly half ; and at least one guide bar for mechanically connecting said probe assembly halves, said second probe assembly half being movable with respect to said first probe assembly half , each said probe assembly half comprising at least one magnet disposed therein, said magnets operable to move said second probe assembly half such that said NDI probe assembly properly engages the portion of the part that is to undergo NDI. a first probe assembly half ; a second probe assembly half ; and at least one guide bar for mechanically connecting said probe assembly halves, said second probe assembly half being movable with respect to said first probe assembly half , each said probe assembly half comprising at least one magnet disposed therein, said magnets operable to move said second probe assembly half such that said NDI probe assembly properly engages the portion of the part that is to undergo NDI. <EOS>