A system for detecting micro-vibrations, of one or more objects in a scene , the system comprising: at least one illumination source configured to project light in a structured light pattern on the scene ; a Time-of-Flight (ToF) imaging device comprising: an illumination source configured to project modulated light into the scene ; a ToF sensor , said ToF sensor is configured to: capture a plurality of images, said plurality of images comprising reflections of said modulated light and said structured light pattern from the one or more objects in the scene , and ambient light images of one or more objects in the scene ; and at least one processor configured to: extract depth data of said one or more objects by analyzing the plurality of images; analyze one or more changes in two or more adjacent speckle patterns of at least two of the reflections of said structured light pattern in at least some consecutive images of the plurality of images; and average the one or more changes to the two or more adjacent speckle patterns to identify the micro-vibrations in a micro-radian scale of the one or more objects based on said speckle pattern analysis and said depth data. at least one illumination source configured to project light in a structured light pattern on the scene ; a Time-of-Flight (ToF) imaging device comprising: an illumination source configured to project modulated light into the scene ; a ToF sensor , said ToF sensor is configured to: capture a plurality of images, said plurality of images comprising reflections of said modulated light and said structured light pattern from the one or more objects in the scene , and ambient light images of one or more objects in the scene ; and at least one processor configured to: extract depth data of said one or more objects by analyzing the plurality of images; analyze one or more changes in two or more adjacent speckle patterns of at least two of the reflections of said structured light pattern in at least some consecutive images of the plurality of images; and average the one or more changes to the two or more adjacent speckle patterns to identify the micro-vibrations in a micro-radian scale of the one or more objects based on said speckle pattern analysis and said depth data. an illumination source configured to project modulated light into the scene ; a ToF sensor , said ToF sensor is configured to: capture a plurality of images, said plurality of images comprising reflections of said modulated light and said structured light pattern from the one or more objects in the scene , and ambient light images of one or more objects in the scene ; and at least one processor configured to: extract depth data of said one or more objects by analyzing the plurality of images; analyze one or more changes in two or more adjacent speckle patterns of at least two of the reflections of said structured light pattern in at least some consecutive images of the plurality of images; and average the one or more changes to the two or more adjacent speckle patterns to identify the micro-vibrations in a micro-radian scale of the one or more objects based on said speckle pattern analysis and said depth data. extract depth data of said one or more objects by analyzing the plurality of images; analyze one or more changes in two or more adjacent speckle patterns of at least two of the reflections of said structured light pattern in at least some consecutive images of the plurality of images; and average the one or more changes to the two or more adjacent speckle patterns to identify the micro-vibrations in a micro-radian scale of the one or more objects based on said speckle pattern analysis and said depth data. <EOS>