An apparatus, comprising: an automatic integrated circuit "IC" handler having a change kit , the change kit being configured to adapt to different sizes of integrated circuits and having an optical connector and a plunger , the plunger having an optical connector and being moveably disposable onto an Automatic Test Equipment "ATE" ; and at least one optical filter coupled to at least one optical detector , the at least one optical filter configured to be operatively coupled to the optical connector of the plunger, the at least one optical filter being uniquely associated with at least one wavelength for an optical fiber of an integrated circuit, the at least one optical detector being uniquely associated with at least one channel for the optical fiber of the integrated circuit, the at least one wavelength being uniquely associated with the at least one channel, the ATE configured to receive the integrated circuit having an optical interface, the plunger having a first position and a second position, the plunger being out of contact with the integrated circuit when the plunger is in the first position, the optical connector being operatively coupled to the optical interface of the integrated circuit when the plunger is in the second position. an automatic integrated circuit "IC" handler having a change kit , the change kit being configured to adapt to different sizes of integrated circuits and having an optical connector and a plunger , the plunger having an optical connector and being moveably disposable onto an Automatic Test Equipment "ATE" ; and at least one optical filter coupled to at least one optical detector , the at least one optical filter configured to be operatively coupled to the optical connector of the plunger, the at least one optical filter being uniquely associated with at least one wavelength for an optical fiber of an integrated circuit, the at least one optical detector being uniquely associated with at least one channel for the optical fiber of the integrated circuit, the at least one wavelength being uniquely associated with the at least one channel, a change kit , the change kit being configured to adapt to different sizes of integrated circuits and having an optical connector and a plunger , the plunger having an optical connector and being moveably disposable onto an Automatic Test Equipment "ATE" ; and at least one optical filter coupled to at least one optical detector , the at least one optical filter configured to be operatively coupled to the optical connector of the plunger, the at least one optical filter being uniquely associated with at least one wavelength for an optical fiber of an integrated circuit, the at least one optical detector being uniquely associated with at least one channel for the optical fiber of the integrated circuit, the at least one wavelength being uniquely associated with the at least one channel, the ATE configured to receive the integrated circuit having an optical interface, the plunger having a first position and a second position, the plunger being out of contact with the integrated circuit when the plunger is in the first position, the optical connector being operatively coupled to the optical interface of the integrated circuit when the plunger is in the second position. <EOS>