A method for updating a capacitance reference, being applied to a capacitance detection apparatus, the method comprising: determining (S101), based on a difference value between an n-th frame of raw capacitance data RawData(n) and an (n-M)-th frame of raw capacitance data RawData(n-M) outputted from the capacitance detection apparatus, a feature value Feature(n) corresponding to the n-th frame of raw capacitance data; wherein the feature value Feature(n) corresponding to the n-th frame of raw capacitance data is used for indicating different stages in a process of a conductor approaching or moving away from the capacitance detection apparatus; computing (S102) a difference value between the n-th frame of raw capacitance data RawData(n) and a reference value Ref(n-1) corresponding to an (n-1)-th frame of raw capacitance data outputted from the capacitance detection apparatus, to obtain a capacitance variation Diff(n); and determining (S103a), when the feature value Feature(n) corresponding to the n-th frame of raw capacitance data is less than a first threshold Thr 1 , and the capacitance variation Diff(n) is less than a proximity threshold Thr on , the n-th frame of raw capacitance data RawData(n) or the (n-1)-th frame of raw capacitance data RawData(n-1) as a reference value Ref(n) corresponding to the n-th frame of raw capacitance data; wherein the proximity threshold Thr on is used for determining whether the conductor has approached the capacitance detection apparatus; and the first threshold Thr 1 is used for determining whether there is an additional input from the conductor on the capacitance detection apparatus, wherein n is a positive integer greater than 2, M is a positive integer greater than or equal to 1, and M <n. determining (S101), based on a difference value between an n-th frame of raw capacitance data RawData(n) and an (n-M)-th frame of raw capacitance data RawData(n-M) outputted from the capacitance detection apparatus, a feature value Feature(n) corresponding to the n-th frame of raw capacitance data; wherein the feature value Feature(n) corresponding to the n-th frame of raw capacitance data is used for indicating different stages in a process of a conductor approaching or moving away from the capacitance detection apparatus; computing (S102) a difference value between the n-th frame of raw capacitance data RawData(n) and a reference value Ref(n-1) corresponding to an (n-1)-th frame of raw capacitance data outputted from the capacitance detection apparatus, to obtain a capacitance variation Diff(n); and determining (S103a), when the feature value Feature(n) corresponding to the n-th frame of raw capacitance data is less than a first threshold Thr 1 , and the capacitance variation Diff(n) is less than a proximity threshold Thr on , the n-th frame of raw capacitance data RawData(n) or the (n-1)-th frame of raw capacitance data RawData(n-1) as a reference value Ref(n) corresponding to the n-th frame of raw capacitance data; wherein the proximity threshold Thr on is used for determining whether the conductor has approached the capacitance detection apparatus; and the first threshold Thr 1 is used for determining whether there is an additional input from the conductor on the capacitance detection apparatus, wherein n is a positive integer greater than 2, M is a positive integer greater than or equal to 1, and M <n. <EOS>