Method for limiting crosstalk in an imaging sensor, this sensor (DET-MF) being provided as a matrix of macropixels (IF11, IF12, ..., IF44) defining an image, each macropixel being formed by a matrix of elementary pixels (λ1, λ2, λ3, ..., λ9) each dedicated to a distinct spectral band, the set of elementary pixels dedicated to the same spectral band forming a sub-image, said image being broken down topologically into at least one fragment, the method comprising the following steps: - measuring the spectral response of each elementary pixel (λ1, λ2, λ3, ..., λ9), - calculating , in a fragment, the average spectral response of each sub-image, - targeting in order to define in said fragment the ideal response of each sub-image, - estimating a series of crosstalk coefficients in order to minimize crosstalk in said fragment, - applying said coefficients to said macropixels in order to correct said sub-images in said fragment and produce a crosstalk-corrected image, the method being characterized in that the following is used: - a photosensitive detector (DET) formed in CMOS technology on a first silicon substrate (SS) and comprising a matrix of pixels with compartments (CP1, CP2, CP3) which each comprise a photosensitive region (PS1, PS2, PS3) at the center thereof, - an array of microlenses (ML1, ML2, ML3) for focusing incident light on the photosensitive regions of the pixels, with one of these microlenses above each compartment of the detector, of a diameter equal to the side of the compartment, and - a filtering module (MF) formed of Fabry-Pérot interference filters (FP1, FP2, FP3), the central wavelength of each filter being constant for a given filter and varying from one filter to another, said filtering module being produced on a second substrate (SUB, SIL) which is mounted so as to rest on said array of microlenses such that the filters face the microlenses, and said filtering module (MF) being glued on its periphery to said detector (DET) by means of a strip of glue (ST), and in that , in the targeting step for determining the ideal spectral response of each sub-image, a Gaussian function is selected for each of them, on which the central wavelength and the full width at half maximum are specified. - measuring the spectral response of each elementary pixel (λ1, λ2, λ3, ..., λ9), - calculating , in a fragment, the average spectral response of each sub-image, - targeting in order to define in said fragment the ideal response of each sub-image, - estimating a series of crosstalk coefficients in order to minimize crosstalk in said fragment, - applying said coefficients to said macropixels in order to correct said sub-images in said fragment and produce a crosstalk-corrected image, - a photosensitive detector (DET) formed in CMOS technology on a first silicon substrate (SS) and comprising a matrix of pixels with compartments (CP1, CP2, CP3) which each comprise a photosensitive region (PS1, PS2, PS3) at the center thereof, - an array of microlenses (ML1, ML2, ML3) for focusing incident light on the photosensitive regions of the pixels, with one of these microlenses above each compartment of the detector, of a diameter equal to the side of the compartment, and - a filtering module (MF) formed of Fabry-Pérot interference filters (FP1, FP2, FP3), the central wavelength of each filter being constant for a given filter and varying from one filter to another, said filtering module being produced on a second substrate (SUB, SIL) which is mounted so as to rest on said array of microlenses such that the filters face the microlenses, and said filtering module (MF) being glued on its periphery to said detector (DET) by means of a strip of glue (ST), and <EOS>