A measurement device with automatic optimization capabilities, for measuring a signal, comprising: - at least one signal processing component with a physical detector , said physical detector being configured to physically measure a measurement value assigned to said signal processing component ; - at least one signal processing component without a physical detector ; and - a virtual detector component comprising at least one virtual detector for said at least one signal processing component without physical detector; said virtual detector component being configured to use a model of a signal processing chain from said physical detector to the location of said virtual detector , said model comprising at least one model parameter for said signal processing chain ; said measurement device being configured to adapt said virtual detector component with respect to a measurement type for said signal to be measured; said virtual detector component being configured to use said model and said at least one measurement value; said virtual detector component being configured to determine a virtually determined value based on said model and said at least one measurement value; and said measurement device being configured to use said virtually determined value to determine a setting for said measurement device . - at least one signal processing component with a physical detector , said physical detector being configured to physically measure a measurement value assigned to said signal processing component ; - at least one signal processing component without a physical detector ; and - a virtual detector component comprising at least one virtual detector for said at least one signal processing component without physical detector; said virtual detector component being configured to use a model of a signal processing chain from said physical detector to the location of said virtual detector , said model comprising at least one model parameter for said signal processing chain ; said measurement device being configured to adapt said virtual detector component with respect to a measurement type for said signal to be measured; said virtual detector component being configured to use said model and said at least one measurement value; said virtual detector component being configured to determine a virtually determined value based on said model and said at least one measurement value; and said measurement device being configured to use said virtually determined value to determine a setting for said measurement device . said virtual detector component being configured to use a model of a signal processing chain from said physical detector to the location of said virtual detector , said model comprising at least one model parameter for said signal processing chain ; said measurement device being configured to adapt said virtual detector component with respect to a measurement type for said signal to be measured; said virtual detector component being configured to use said model and said at least one measurement value; said virtual detector component being configured to determine a virtually determined value based on said model and said at least one measurement value; and said measurement device being configured to use said virtually determined value to determine a setting for said measurement device . <EOS>