A solid-state imaging apparatus , comprising: a plurality of high-sensitivity pixels (PD) that are arranged in a matrix , and are configured to perform a photoelectric conversion at a predetermined sensitivity; a plurality of low-sensitivity pixels (K) that are arranged in a matrix in gaps between the plurality of high-sensitivity pixels (PD), and are configured to perform a photoelectric conversion at a lower sensitivity than the predetermined sensitivity; the solid-state imaging apparatus generates, within one vertical scanning period, a plurality of high-sensitivity frames by performing an exposure operation a plurality of times, each having a different exposure time, on the plurality of high-sensitivity pixels, and exposes the plurality of high-sensitivity pixels in parallel with the plurality of low-sensitivity pixels, wherein an exposure time of the plurality of low-sensitivity pixels is longer than an exposure time of the plurality of high-sensitivity pixels, shorter than one vertical synchronization period, and longer than a predetermined flicker cycle, characterized in that the solid-state imaging apparatus further comprises: a signal processor that is configured to generate a pixel signal by (i) detecting a difference signal between a signal from the plurality of high-sensitivity pixels (PD) and a signal from the plurality of low-sensitivity pixels (K), and (ii) correcting the signal from the plurality of high-sensitivity pixels (PD) of at least one of the plurality of high-sensitivity frames by adding the difference signal to the signal from the plurality of high-sensitivity pixels such that the flicker with respect to flicker cycles that are shorter than the predetermined flicker cycle is reduced, and (iii) synthesizing the pixel signal (L) from the plurality of high-sensitivity frames at least one of which is corrected. a plurality of high-sensitivity pixels (PD) that are arranged in a matrix , and are configured to perform a photoelectric conversion at a predetermined sensitivity; a plurality of low-sensitivity pixels (K) that are arranged in a matrix in gaps between the plurality of high-sensitivity pixels (PD), and are configured to perform a photoelectric conversion at a lower sensitivity than the predetermined sensitivity; the solid-state imaging apparatus generates, within one vertical scanning period, a plurality of high-sensitivity frames by performing an exposure operation a plurality of times, each having a different exposure time, on the plurality of high-sensitivity pixels, and exposes the plurality of high-sensitivity pixels in parallel with the plurality of low-sensitivity pixels, wherein an exposure time of the plurality of low-sensitivity pixels is longer than an exposure time of the plurality of high-sensitivity pixels, shorter than one vertical synchronization period, and longer than a predetermined flicker cycle, characterized in that the solid-state imaging apparatus further comprises: a signal processor that is configured to generate a pixel signal by (i) detecting a difference signal between a signal from the plurality of high-sensitivity pixels (PD) and a signal from the plurality of low-sensitivity pixels (K), and (ii) correcting the signal from the plurality of high-sensitivity pixels (PD) of at least one of the plurality of high-sensitivity frames by adding the difference signal to the signal from the plurality of high-sensitivity pixels such that the flicker with respect to flicker cycles that are shorter than the predetermined flicker cycle is reduced, and (iii) synthesizing the pixel signal (L) from the plurality of high-sensitivity frames at least one of which is corrected. <EOS>