A method of controlling a supply voltage of a voltage regulator for a sector of an integrated circuit. the method comprising: sending a command from a processor in the integrated circuit to a sector manager to configure a regulator control circuit to a testing mode; translating the command by the sector manager to generate a first plurality of bits; loading the first plurality of bits into registers so as to set the regulator control circuit to the testing mode, the registers comprising a voltage trimming register that receives a first set of bits of the first plurality of bits to maintain a voltage level of a supply voltage of the sector of the integrated circuit and a test control register that receives a second set of bits of the first plurality of bits to enable or disable the testing mode of the regulator control circuit , and wherein the voltage trimming register and the test control register are arranged in a serial chain; and sending , by the regulator control circuit , the supply voltage output of the voltage regulator to a voltage analog-to-digital converter, converting the supply voltage to a digital reading by the voltage analog-to-digital converter; providing the digital reading from the voltage analog-to-digital converter to the processor; processing the digital reading by the processor so as to generate a decision instruction; and sending the decision instruction from the processor to the sector manager, translating the decision instruction to a second plurality of bits by the sector manager; loading the second plurality of bits into the registers; adjusting the voltage level of the supply voltage of the voltage regulator based on a first set of the second plurality of bits received at the voltage trimming register ; and resetting the regulator control circuit to a normal operating mode based on a second set of the second plurality of bits received at the test control register . sending a command from a processor in the integrated circuit to a sector manager to configure a regulator control circuit to a testing mode; translating the command by the sector manager to generate a first plurality of bits; loading the first plurality of bits into registers so as to set the regulator control circuit to the testing mode, the registers comprising a voltage trimming register that receives a first set of bits of the first plurality of bits to maintain a voltage level of a supply voltage of the sector of the integrated circuit and a test control register that receives a second set of bits of the first plurality of bits to enable or disable the testing mode of the regulator control circuit , and wherein the voltage trimming register and the test control register are arranged in a serial chain; and sending , by the regulator control circuit , the supply voltage output of the voltage regulator to a voltage analog-to-digital converter, converting the supply voltage to a digital reading by the voltage analog-to-digital converter; providing the digital reading from the voltage analog-to-digital converter to the processor; processing the digital reading by the processor so as to generate a decision instruction; and sending the decision instruction from the processor to the sector manager, translating the decision instruction to a second plurality of bits by the sector manager; loading the second plurality of bits into the registers; adjusting the voltage level of the supply voltage of the voltage regulator based on a first set of the second plurality of bits received at the voltage trimming register ; and resetting the regulator control circuit to a normal operating mode based on a second set of the second plurality of bits received at the test control register . <EOS>