Apparatus (10; 30; 40; 70 1 ; 70 2 ) for capturing at least partially reflective surfaces , comprising: a detection area arrangement ; a means for illumination configured to emit an illumination pattern towards the at least partially reflective surface so as to project, through reflection via the at least partially reflective surface , a first reflection pattern (22 1 ) and a second reflection pattern (22 2 ) onto the detection area arrangement ; and a capturing unit configured to capture the first reflection pattern (22 1 ) and the second reflection pattern (22 2 ) from the detection area arrangement ; wherein the apparatus is configured to generate the first reflection pattern (22 1 ) during a first time interval and the second reflection pattern (22 2 ) during a second time interval at the detection area arrangement , wherein the first time interval and the second time interval are temporally disjoint; wherein the apparatus is configured to illuminate a surface point (P) of the at least partially reflective surface of an object to be measured at a first point in time (t 1 ) with a first illumination pattern (16 1 ) so as to obtain the first reflection pattern (22 1 ); and to illuminate the surface point (P) at a second point in time (t 2 ), different from the first point in time, with a second illumination pattern (16 2 ) so as to obtain the second reflection pattern (22 2 ); wherein the first reflection pattern (22 1 ) is obtained by using a first relative position between a first illumination source (14 1 ) for generating the first reflection pattern (22 1 ) on the one hand and the detection area arrangement on the other hand, and wherein the second reflection pattern (22 2 ) is obtained by using a second relative position between a second illumination source (14 2 ) for generating the second reflection pattern (22 2 ) on the one hand and the detection area arrangement on the other hand. a detection area arrangement ; a means for illumination configured to emit an illumination pattern towards the at least partially reflective surface so as to project, through reflection via the at least partially reflective surface , a first reflection pattern (22 1 ) and a second reflection pattern (22 2 ) onto the detection area arrangement ; and a capturing unit configured to capture the first reflection pattern (22 1 ) and the second reflection pattern (22 2 ) from the detection area arrangement ; wherein the apparatus is configured to generate the first reflection pattern (22 1 ) during a first time interval and the second reflection pattern (22 2 ) during a second time interval at the detection area arrangement , wherein the first time interval and the second time interval are temporally disjoint; wherein the apparatus is configured to illuminate a surface point (P) of the at least partially reflective surface of an object to be measured at a first point in time (t 1 ) with a first illumination pattern (16 1 ) so as to obtain the first reflection pattern (22 1 ); and to illuminate the surface point (P) at a second point in time (t 2 ), different from the first point in time, with a second illumination pattern (16 2 ) so as to obtain the second reflection pattern (22 2 ); wherein the first reflection pattern (22 1 ) is obtained by using a first relative position between a first illumination source (14 1 ) for generating the first reflection pattern (22 1 ) on the one hand and the detection area arrangement on the other hand, and wherein the second reflection pattern (22 2 ) is obtained by using a second relative position between a second illumination source (14 2 ) for generating the second reflection pattern (22 2 ) on the one hand and the detection area arrangement on the other hand. <EOS>