A method for testing a time of an instruction of an adaptor by a testing system, wherein the adaptor is configured to perform quick charging of a battery of a terminal, the method comprising: receiving a clock signal from the adaptor after the testing system is coupled with the adaptor wherein the clock signal comprises a square wave; acquiring a first interrupt of the clock signal, wherein the first interrupt is a first byte of a first instruction for inquiring whether to enable the quick charging or a testing byte sent by the adaptor, the square wave following the first interrupt, and a next interrupt; acquiring a first falling edge and a first rising edge of the first interrupt, a second falling edge of the square wave, and a third falling edge of the next interrupt; and generating a test result of the time of the instruction according to the first falling edge, the first rising edge, the second falling edge, and the third falling edge, wherein generating the test result of the time of the instruction according to the first falling edge, the first rising edge, the second falling edge, and the third falling edge comprises: determining an interrupt duration according to the first falling edge and the first rising edge; determining a transmission duration according to the first falling edge and the second falling edge; determining an interval according to the second falling edge and the third falling edge, wherein the interval is the time between two adjacent bytes; and determining the test result according to the interrupt duration, the transmission duration, and the interval. receiving a clock signal from the adaptor after the testing system is coupled with the adaptor wherein the clock signal comprises a square wave; acquiring a first interrupt of the clock signal, wherein the first interrupt is a first byte of a first instruction for inquiring whether to enable the quick charging or a testing byte sent by the adaptor, the square wave following the first interrupt, and a next interrupt; acquiring a first falling edge and a first rising edge of the first interrupt, a second falling edge of the square wave, and a third falling edge of the next interrupt; and generating a test result of the time of the instruction according to the first falling edge, the first rising edge, the second falling edge, and the third falling edge, wherein generating the test result of the time of the instruction according to the first falling edge, the first rising edge, the second falling edge, and the third falling edge comprises: determining an interrupt duration according to the first falling edge and the first rising edge; determining a transmission duration according to the first falling edge and the second falling edge; determining an interval according to the second falling edge and the third falling edge, wherein the interval is the time between two adjacent bytes; and determining the test result according to the interrupt duration, the transmission duration, and the interval. determining an interrupt duration according to the first falling edge and the first rising edge; determining a transmission duration according to the first falling edge and the second falling edge; determining an interval according to the second falling edge and the third falling edge, wherein the interval is the time between two adjacent bytes; and determining the test result according to the interrupt duration, the transmission duration, and the interval. <EOS>