Method for measuring interfaces of an optical element to be measured , forming part of a plurality of similar optical elements comprising at least one optical element called "reference optical element", the method being implemented by a measurement device comprising: - an imaging channel (VI) configured to produce an illumination beam , and comprising imaging means configured to acquire images of an optical element illuminated by said illumination beam in a field of view of the imaging means ; and - a measurement channel (VM) configured to produce a measurement beam at a determined position with respect to said field of view, and comprising a distance optical sensor configured to produce distance and/or thickness measurements; characterized in that said method comprises the following steps: - relative positioning of the at least one reference optical element and the measurement beam , so as to allow a measurement of interfaces of said at least one reference optical element; - acquisition of an image, called "reference image", of the thus-positioned at least one reference optical element; - positioning of the optical element to be measured with respect to the field of view so as to allow the acquisition of an image, called "measurement image", of said optical element to be measured; - determining a difference of position in the field of view of the optical element to be measured with respect to the at least one reference optical element, based on the reference and measurement images; - adjusting the position of the optical element to be measured in the field of view so as to cancel said difference of position; and - measuring the interfaces of the optical element to be measured by means of the measurement beam , the method being implemented to measure the positions and/or the gaps between the interfaces of an optical element to be measured in the form of an optical assembly with lenses, such as a smartphone objective, the interfaces comprising the surfaces of the lenses. - an imaging channel (VI) configured to produce an illumination beam , and comprising imaging means configured to acquire images of an optical element illuminated by said illumination beam in a field of view of the imaging means ; and - a measurement channel (VM) configured to produce a measurement beam at a determined position with respect to said field of view, and comprising a distance optical sensor configured to produce distance and/or thickness measurements; - relative positioning of the at least one reference optical element and the measurement beam , so as to allow a measurement of interfaces of said at least one reference optical element; - acquisition of an image, called "reference image", of the thus-positioned at least one reference optical element; - positioning of the optical element to be measured with respect to the field of view so as to allow the acquisition of an image, called "measurement image", of said optical element to be measured; - determining a difference of position in the field of view of the optical element to be measured with respect to the at least one reference optical element, based on the reference and measurement images; - adjusting the position of the optical element to be measured in the field of view so as to cancel said difference of position; and - measuring the interfaces of the optical element to be measured by means of the measurement beam , <EOS>