A method for correcting, and displaying on a display screen of a test and measurement instrument, current data samples representative of a current signal from a device under test comprising steps of: receiving, by a first acquisition circuitry (82 CH2 ), the current signal by using a current sensor coupled to the device under test and generating the current data samples representative of the current signal from the device under test (operation 202), said current sensor including a non-ideal integrator; receiving, by a second acquisition circuitry (82 CH1 ), a voltage signal corresponding to the current signal from the device under test by using a voltage probe (88 2 ) and generating voltage data samples representative of the voltage signal (operation 202); extracting current fluctuation data samples representative of deviations of the current data samples from a zero ampere level, said deviations caused by the integrator of the current sensor, the current fluctuation data samples corresponding to off-periods of the device under test as derived by detecting corresponding off-periods of the device under test in the voltage data samples (operation 206); interpolating the current fluctuation data samples of the off-periods of the device under test for generating current fluctuation data samples corresponding to on-periods of the device under test (operation 208); subtracting the current fluctuation data samples corresponding to the off-periods and the on-periods of the device under test from the current data samples representing the current signal to generate corrected zero ampere level current data samples (operation 210); and generating a waveform display using the corrected zero ampere level current data samples (operation 212), and displaying the waveform display on the display screen of the test and measurement instrument. receiving, by a first acquisition circuitry (82 CH2 ), the current signal by using a current sensor coupled to the device under test and generating the current data samples representative of the current signal from the device under test (operation 202), said current sensor including a non-ideal integrator; receiving, by a second acquisition circuitry (82 CH1 ), a voltage signal corresponding to the current signal from the device under test by using a voltage probe (88 2 ) and generating voltage data samples representative of the voltage signal (operation 202); extracting current fluctuation data samples representative of deviations of the current data samples from a zero ampere level, said deviations caused by the integrator of the current sensor, the current fluctuation data samples corresponding to off-periods of the device under test as derived by detecting corresponding off-periods of the device under test in the voltage data samples (operation 206); interpolating the current fluctuation data samples of the off-periods of the device under test for generating current fluctuation data samples corresponding to on-periods of the device under test (operation 208); subtracting the current fluctuation data samples corresponding to the off-periods and the on-periods of the device under test from the current data samples representing the current signal to generate corrected zero ampere level current data samples (operation 210); and generating a waveform display using the corrected zero ampere level current data samples (operation 212), and displaying the waveform display on the display screen of the test and measurement instrument. <EOS>