Microscope for examining a sample by super-resolution scanning microscopy, comprising - an illumination device for illuminating the sample , - an imaging device comprising a scanner for scanning at least one point or line spot over the sample , for imaging the point or line spot into a stationary diffraction-limited individual image in a detection plane with an imaging scale, - a detector device for capturing the individual image in the detection plane for different scanning positions with a spatial resolution which, taking account of the imaging scale along at least one extent/in at least one dimension, is at least twice as large as a full width at half maximum of the diffraction-limited individual image , - an evaluation device (C) for evaluating a diffraction structure of the individual image for the scanning positions from data of the detector device and for generating an image of the sample with a resolution that has been increased beyond the diffraction limit, wherein - the detector device comprises: - a detector array , which has pixels and is larger than the individual image , characterized by - a non-imaging redistribution element (20-21; 30-34; 30-35), which is disposed upstream of the detector array and which distributes the radiation from the detection plane in non-imaging fashion among the pixels of the detector array , wherein the redistribution element comprises a bundle of optical fibres which has an input arranged in the detection plane and an output at which the optical fibres end at the pixels of the detector array in a geometric arrangement that differs from that of the input , and - elements which are disposed upstream of the bundle of optical fibres in the light direction, which influence the light direction and which assign detection light to the light entry openings of the individual light fibres, wherein the elements which influence the light direction are lenses of a lens array, which are optically assigned to at least some of the individual fibres. - an illumination device for illuminating the sample , - an imaging device comprising a scanner for scanning at least one point or line spot over the sample , for imaging the point or line spot into a stationary diffraction-limited individual image in a detection plane with an imaging scale, - a detector device for capturing the individual image in the detection plane for different scanning positions with a spatial resolution which, taking account of the imaging scale along at least one extent/in at least one dimension, is at least twice as large as a full width at half maximum of the diffraction-limited individual image , - an evaluation device (C) for evaluating a diffraction structure of the individual image for the scanning positions from data of the detector device and for generating an image of the sample with a resolution that has been increased beyond the diffraction limit, wherein - the detector device comprises: - a detector array , which has pixels and is larger than the individual image , characterized by - a non-imaging redistribution element (20-21; 30-34; 30-35), which is disposed upstream of the detector array and which distributes the radiation from the detection plane in non-imaging fashion among the pixels of the detector array , wherein the redistribution element comprises a bundle of optical fibres which has an input arranged in the detection plane and an output at which the optical fibres end at the pixels of the detector array in a geometric arrangement that differs from that of the input , and - elements which are disposed upstream of the bundle of optical fibres in the light direction, which influence the light direction and which assign detection light to the light entry openings of the individual light fibres, wherein the elements which influence the light direction are lenses of a lens array, which are optically assigned to at least some of the individual fibres. <EOS>