A coated cutting tool comprising a substrate and a coating, wherein the coating comprises an inner layer of Ti 1-x Al x N with 0.60 ≤ x ≤ 0.90 an intermediate layer of TiCN and at least one outer layer of 1-9 μm α-Al 2 O 3 , wherein said α-Al2O3 layer exhibits an X-ray diffraction pattern, as measured using CuKα radiation and theta-2theta scan, and the texture coefficient TC(hkl) is defined according to Harris formula TC hkl = I hkl I 0 hkl 1 n ∑ i = 0 n I hkl I 0 hkl − 1 wherein the (hkl) reflections used are (0 2 4), (1 1 6), (3 0 0) and (0 0 12), I(hkl) = measured intensity (peak intensity) of the (hkl) reflection, l0(hkl) = standard intensity according to ICDD's PDF-card No. 00-042-1468, n = number of reflections used in the calculation, wherein 3 < TC(0 0 12) < 4, characterized in that the thickness of said Ti 1-x Al x N layer is 4-14 μm and the thickness of said TiCN layer is 0.05-1 μm, wherein the TC of the intermediate layer of TiCN is > 3, wherein the texture coefficient TC is defined as follows: TC 111 = I 111 I 0 111 1 n ∑ n = 1 n I hkl I 0 hkl − 1 wherein I(hkl) are the intensities of the diffraction reflections measured by X-ray diffraction, I 0 (hkl) are the standard intensities of the diffraction reflections according to the pdf card 00-042-1489, n is the number of reflections used in the calculation, and for the calculation of TC the reflections , , and are used, and wherein the Ti 1-x Al x N layer has a preferred orientation of the crystal growth with respect to the crystallographic plane, characterized by a texture coefficient TC > 3, wherein the texture coefficient TC is defined as follows: TC 111 = I 111 I 0 111 1 n ∑ n = 1 n I hkl I 0 hkl − 1 wherein I(hkl) are the intensities of the diffraction reflections measured by X-ray diffraction, I 0 (hkl) are the standard intensities of the diffraction reflections according to the pdf card 00-046-1200, n is the number of reflections used in the calculation, and for the calculation of TC the reflections , , and are used. wherein said α-Al2O3 layer exhibits an X-ray diffraction pattern, as measured using CuKα radiation and theta-2theta scan, and the texture coefficient TC(hkl) is defined according to Harris formula TC hkl = I hkl I 0 hkl 1 n ∑ i = 0 n I hkl I 0 hkl − 1 wherein the (hkl) reflections used are (0 2 4), (1 1 6), (3 0 0) and (0 0 12), I(hkl) = measured intensity (peak intensity) of the (hkl) reflection, l0(hkl) = standard intensity according to ICDD's PDF-card No. 00-042-1468, n = number of reflections used in the calculation, wherein 3 < TC(0 0 12) < 4, characterized in that the thickness of said Ti 1-x Al x N layer is 4-14 μm and the thickness of said TiCN layer is 0.05-1 μm, wherein the TC of the intermediate layer of TiCN is > 3, wherein the texture coefficient TC is defined as follows: TC 111 = I 111 I 0 111 1 n ∑ n = 1 n I hkl I 0 hkl − 1 wherein I(hkl) are the intensities of the diffraction reflections measured by X-ray diffraction, I 0 (hkl) are the standard intensities of the diffraction reflections according to the pdf card 00-042-1489, n is the number of reflections used in the calculation, and for the calculation of TC the reflections , , and are used, and wherein the Ti 1-x Al x N layer has a preferred orientation of the crystal growth with respect to the crystallographic plane, characterized by a texture coefficient TC > 3, wherein the texture coefficient TC is defined as follows: TC 111 = I 111 I 0 111 1 n ∑ n = 1 n I hkl I 0 hkl − 1 wherein I(hkl) are the intensities of the diffraction reflections measured by X-ray diffraction, I 0 (hkl) are the standard intensities of the diffraction reflections according to the pdf card 00-046-1200, n is the number of reflections used in the calculation, and for the calculation of TC the reflections , , and are used. <EOS>