A process controller comprising: at least one optical sensor ; and a control unit ; characterized in that : the at least one optical sensor is integrated into the process controller , wherein the at least one optical sensor includes an optical detector operable to receive a return light profile reflected from an object, and output an electrical signal based on the return light profile, wherein the return light profile is indicative of a condition of the object ; and the control unit is in communication with the at least one optical sensor , wherein the control unit is configured to interpret the electrical signal received to measure the condition of the object and control a controlled device based on the measured condition of the object , wherein the at least one optical sensor further includes an optical source configured to emit a light profile toward the object and the optical detector is configured to receive the return light profile reflected by the object , wherein the control unit measures the condition of the object based on the return light profile from the at least one optical sensor and controls a controlled device based on the determined condition. at least one optical sensor ; and a control unit ; characterized in that : the at least one optical sensor is integrated into the process controller , wherein the at least one optical sensor includes an optical detector operable to receive a return light profile reflected from an object, and output an electrical signal based on the return light profile, wherein the return light profile is indicative of a condition of the object ; and the control unit is in communication with the at least one optical sensor , wherein the control unit is configured to interpret the electrical signal received to measure the condition of the object and control a controlled device based on the measured condition of the object , wherein the at least one optical sensor further includes an optical source configured to emit a light profile toward the object and the optical detector is configured to receive the return light profile reflected by the object , wherein the control unit measures the condition of the object based on the return light profile from the at least one optical sensor and controls a controlled device based on the determined condition. the at least one optical sensor is integrated into the process controller , wherein the at least one optical sensor includes an optical detector operable to receive a return light profile reflected from an object, and output an electrical signal based on the return light profile, wherein the return light profile is indicative of a condition of the object ; and the control unit is in communication with the at least one optical sensor , wherein the control unit is configured to interpret the electrical signal received to measure the condition of the object and control a controlled device based on the measured condition of the object , wherein the at least one optical sensor further includes an optical source configured to emit a light profile toward the object and the optical detector is configured to receive the return light profile reflected by the object , wherein the control unit measures the condition of the object based on the return light profile from the at least one optical sensor and controls a controlled device based on the determined condition. <EOS>