An epi-illumination Fourier ptychographic imaging system for high resolution imaging of thick samples, the system comprising: a variable illumination source configured to provide radiation sequentially at a plurality of incidence angles; a first polarizer system configured to polarize radiation from the variable illumination source to a first polarization state incident upon a sample ; collection optics configured to receive radiation issuing from the sample , wherein the collection optics are located to the same side of the sample from which the variable illumination source provides radiation; a second polarizer system configured to receive radiation passed through the collection optics and wherein the second polarizer system comprises either: (A) a first polarizer in a first orientation and a second polarizer in a second orientation orthogonal to the first orientation or (B) a polarizer rotatable between a first orientation and a second orientation orthogonal to the first orientation; a radiation detector configured to receive radiation from the second polarizer system , the radiation detector configured to acquire a first sequence of intensity images of the sample through the first polarizer, in option (A), or through the polarizer when in the first orientation, in option (B), and a second sequence of intensity images of the sample through the second polarizer, in option (A), or through the polarizer when in the second orientation, in option (B), wherein each intensity image corresponds to a different incidence angle of the plurality of incidence angles; and a processor configured to determine a sequence of de-scattered surface intensity images from the first sequence of intensity images and the second sequence of intensity images. a variable illumination source configured to provide radiation sequentially at a plurality of incidence angles; a first polarizer system configured to polarize radiation from the variable illumination source to a first polarization state incident upon a sample ; collection optics configured to receive radiation issuing from the sample , wherein the collection optics are located to the same side of the sample from which the variable illumination source provides radiation; a second polarizer system configured to receive radiation passed through the collection optics and wherein the second polarizer system comprises either: (A) a first polarizer in a first orientation and a second polarizer in a second orientation orthogonal to the first orientation or (B) a polarizer rotatable between a first orientation and a second orientation orthogonal to the first orientation; (A) a first polarizer in a first orientation and a second polarizer in a second orientation orthogonal to the first orientation or (B) a polarizer rotatable between a first orientation and a second orientation orthogonal to the first orientation; a radiation detector configured to receive radiation from the second polarizer system , the radiation detector configured to acquire a first sequence of intensity images of the sample through the first polarizer, in option (A), or through the polarizer when in the first orientation, in option (B), and a second sequence of intensity images of the sample through the second polarizer, in option (A), or through the polarizer when in the second orientation, in option (B), wherein each intensity image corresponds to a different incidence angle of the plurality of incidence angles; and a processor configured to determine a sequence of de-scattered surface intensity images from the first sequence of intensity images and the second sequence of intensity images. <EOS>