Device for measuring a surface of an object , the device comprising: - at least one light source ; - an optical sensor or a plurality of optical sensors ; and - an interferometric device having a measurement arm and a reference arm, the measurement arm being configured to direct the light coming from the at least one light source towards the surface to be measured of the object via a focusing optical system and to direct the light coming from the surface to be measured towards the optical sensor or the optical sensors ; the measurement device being configured, in a first configuration called interferometry configuration, to illuminate the reference arm and the measurement arm with the at least one light source and to direct the light coming from the measurement arm and from the reference arm towards a first optical sensor out of the optical sensors , so as to form an interference signal; the measurement device being configured, in a second configuration called imaging configuration, to illuminate at least the measurement arm and to direct the light coming from the measurement arm only towards an optical sensor out of the optical sensors , so as to form an image of the surface to be measured; the measurement device also comprising: means for determining a position of the surface to be measured relatively to a conjugate object plane of the first optical sensor based on a measurement of the surface in the imaging configuration, digital processing means configured to use the position of the surface to be measured for correcting for propagation effects of the light between the conjugate plane of the first optical sensor and the surface to produce, from the interference signal, an item of information on the surface to be measured. - at least one light source ; - an optical sensor or a plurality of optical sensors ; and - an interferometric device having a measurement arm and a reference arm, the measurement arm being configured to direct the light coming from the at least one light source towards the surface to be measured of the object via a focusing optical system and to direct the light coming from the surface to be measured towards the optical sensor or the optical sensors ; the measurement device being configured, in a first configuration called interferometry configuration, to illuminate the reference arm and the measurement arm with the at least one light source and to direct the light coming from the measurement arm and from the reference arm towards a first optical sensor out of the optical sensors , so as to form an interference signal; the measurement device being configured, in a second configuration called imaging configuration, to illuminate at least the measurement arm and to direct the light coming from the measurement arm only towards an optical sensor out of the optical sensors , so as to form an image of the surface to be measured; the measurement device also comprising: means for determining a position of the surface to be measured relatively to a conjugate object plane of the first optical sensor based on a measurement of the surface in the imaging configuration, digital processing means configured to use the position of the surface to be measured for correcting for propagation effects of the light between the conjugate plane of the first optical sensor and the surface to produce, from the interference signal, an item of information on the surface to be measured. means for determining a position of the surface to be measured relatively to a conjugate object plane of the first optical sensor based on a measurement of the surface in the imaging configuration, digital processing means configured to use the position of the surface to be measured for correcting for propagation effects of the light between the conjugate plane of the first optical sensor and the surface to produce, from the interference signal, an item of information on the surface to be measured. <EOS>